IPD110N12N3G [INFINEON]

OptiMOSTM3Power-Transistor;
IPD110N12N3G
型号: IPD110N12N3G
厂家: Infineon    Infineon
描述:

OptiMOSTM3Power-Transistor

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中文:  中文翻译
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IPD110N12N3 G  
IPS110N12N3 G  
OptiMOSTM3Power-Transistor  
Features  
Product Summary  
V DS  
120  
11  
V
• N-channel, normal level  
R DS(on),max  
I D  
mΩ  
• Excellent gate charge x R DS(on) product (FOM)  
• Very low on-resistance R DS(on)  
75  
A
• 175 °C operating temperature  
• Pb-free lead plating; RoHS compliant; halogen free  
• Qualified according to JEDEC1) for target application  
• Ideal for high-frequency switching and synchronous rectification  
Type  
IPS110N12N3 G  
IPD110N12N3 G  
Package  
Marking  
PG-TO251-3  
110N12N  
PG-TO252-3  
110N12N  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
I D  
T C=25 °C  
Continuous drain current  
75  
54  
A
T C=100 °C  
Pulsed drain current2)  
I D,pulse  
E AS  
T C=25 °C  
300  
I D=75 A, R GS=25 Ω  
Avalanche energy, single pulse  
120  
mJ  
V
Gate source voltage3)  
V GS  
±20  
P tot  
T C=25 °C  
Power dissipation  
136  
W
°C  
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-55 ... 175  
55/175/56  
1)J-STD20 and JESD22  
2) see figure 3  
3)  
T
jmax  
=150°C and duty cycle D=0.01 for Vgs<-5V  
Rev. 2.2  
page 1  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
Values  
Parameter  
Symbol Conditions  
Unit  
min.  
typ.  
max.  
Thermal characteristics  
R thJC  
Thermal resistance, junction - case  
-
-
-
-
-
-
1.1  
75  
50  
K/W  
R thJA  
minimal footprint  
Thermal resistance, junction -  
ambient  
6 cm2 cooling area4)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V (BR)DSS V GS=0 V, I D=1 mA  
Drain-source breakdown voltage  
Gate threshold voltage  
120  
2
-
-
V
V GS(th)  
V DS=V GS, I D=83 µA  
3
4
V DS=100 V, V GS=0 V,  
T j=25 °C  
I DSS  
Zero gate voltage drain current  
-
0.1  
1
µA  
V
DS=100 V, V GS=0 V,  
-
-
10  
1
100  
T j=125 °C  
I GSS  
V GS=20 V, V DS=0 V  
Gate-source leakage current  
Drain-source on-state resistance  
Gate resistance  
100 nA  
R DS(on) V GS=10 V, I D=75 A  
-
9.2  
1.5  
83  
11  
-
mΩ  
Ω
R G  
-
|V DS|>2|I D|R DS(on)max  
,
g fs  
Transconductance  
42  
-
S
I D=75 A  
2
4) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 2.2  
page 2  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
Values  
Parameter  
Symbol Conditions  
Unit  
min.  
typ.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
-
-
-
-
-
-
-
3240  
408  
22  
4310 pF  
V GS=0 V, V DS=60 V,  
f =1 MHz  
C oss  
C rss  
t d(on)  
t r  
543  
-
16  
-
-
-
-
ns  
16  
V
DD=60 V, V GS=10 V,  
I D=75 A, R G=1.6 Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
24  
8
Gate Charge Characteristics5)  
Gate to source charge  
Gate to drain charge  
Switching charge  
Q gs  
-
-
-
-
-
-
18  
12  
20  
49  
5.6  
56  
-
-
nC  
Q gd  
V DD=60 V, I D=75 A,  
GS=0 to 10 V  
Q sw  
Q g  
-
V
Gate charge total  
65  
-
V plateau  
Q oss  
Gate plateau voltage  
Output charge  
V
V DD=60 V, V GS=0 V  
75  
nC  
Reverse Diode  
I S  
Diode continous forward current  
Diode pulse current  
-
-
-
-
75  
A
T C=25 °C  
I S,pulse  
300  
V GS=0 V, I F=75 A,  
T j=25 °C  
V SD  
Diode forward voltage  
-
1
1.2  
V
t rr  
Reverse recovery time  
-
-
90  
ns  
V R=60 V, I F=I S,  
di F/dt =100 A/µs  
Q rr  
Reverse recovery charge  
249  
nC  
5) See figure 16 for gate charge parameter definition  
Rev. 2.2  
page 3  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
1 Power dissipation  
2 Drain current  
P
tot=f(T C)  
I D=f(T C); V GS10 V  
140  
120  
100  
80  
80  
70  
60  
50  
40  
30  
20  
10  
0
60  
40  
20  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T C [°C]  
T C [°C]  
3 Safe operating area  
I D=f(V DS); T C=25 °C; D =0  
parameter: t p  
4 Max. transient thermal impedance  
Z thJC=f(t p)  
parameter: D =t p/T  
103  
101  
1 µs  
10 µs  
102  
100 µs  
100  
1 ms  
0.5  
DC  
101  
10 ms  
0.2  
0.1  
10-1  
0.05  
0.02  
100  
0.01  
single pulse  
10-1  
10-2  
10-1  
100  
101  
V DS [V]  
102  
103  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
t p [s]  
Rev. 2.2  
page 4  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
5 Typ. output characteristics  
I D=f(V DS); T j=25 °C  
6 Typ. drain-source on resistance  
R DS(on)=f(I D); T j=25 °C  
parameter: V GS  
parameter: V GS  
250  
30  
10 V  
8 V  
5 V  
4.5 V  
7 V  
25  
20  
15  
10  
5
200  
150  
5.5 V  
6.5 V  
6 V  
100  
6 V  
10 V  
5.5 V  
50  
5 V  
4.5 V  
0
0
0
1
2
3
4
5
0
20  
40  
60  
80  
V DS [V]  
ID [A]  
7 Typ. transfer characteristics  
I D=f(V GS); |V DS|>2|I D|R DS(on)max  
parameter: T j  
8 Typ. forward transconductance  
g fs=f(I D); T j=25 °C  
200  
150  
100  
100  
80  
60  
40  
20  
0
175 °C  
50  
25 °C  
0
0
2
4
6
8
0
20  
40  
60  
80  
V GS [V]  
ID [A]  
Rev. 2.2  
page 5  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
V GS(th)=f(T j); V GS=V DS  
parameter: I D  
R
DS(on)=f(T j); I D=75 A; V GS=10 V  
25  
4
3.5  
3
20  
830 µA  
83 µA  
2.5  
15  
98 %  
2
1.5  
1
typ  
10  
5
0.5  
0
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
T j [°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I F=f(V SD  
C =f(V DS); V GS=0 V; f =1 MHz  
)
parameter: T j  
104  
103  
Ciss  
25 °C  
175 °C  
175 °C, 98%  
103  
102  
101  
102  
Coss  
25 °C, 98%  
101  
Crss  
100  
0
0
20  
40  
60  
80  
100  
0.5  
1
1.5  
2
V DS [V]  
V SD [V]  
Rev. 2.2  
page 6  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
13 Avalanche characteristics  
AS=f(t AV); R GS=25 Ω  
14 Typ. gate charge  
GS=f(Q gate); I D=67 A pulsed  
V
I
parameter: T j(start)  
parameter: V DD  
103  
10  
96 V  
60 V  
8
6
4
2
102  
24 V  
25 °C  
100 °C  
150 °C  
101  
100  
100  
0
0
101  
102  
103  
10  
20  
30  
40  
50  
t AV [µs]  
Q gate [nC]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V
BR(DSS)=f(T j); I D=1 mA  
135  
130  
125  
120  
115  
110  
105  
V GS  
Q g  
V gs(th)  
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
-60  
-20  
20  
60  
100  
140  
180  
T j [°C]  
Rev. 2.2  
page 7  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
PG-TO-251SL : Outline  
Rev. 2.2  
page 8  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
PG-TO252-3: Outline  
Rev. 2.2  
page 9  
2009-07-09  
IPD110N12N3 G  
IPS110N12N3 G  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2009 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev. 2.2  
page 10  
2009-07-09  

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