IPB120N06S402ATMA2 [INFINEON]

Power Field-Effect Transistor, 120A I(D), 60V, 0.0024ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, GREEN, PLASTIC, TO-263, 3 PIN;
IPB120N06S402ATMA2
型号: IPB120N06S402ATMA2
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 120A I(D), 60V, 0.0024ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, GREEN, PLASTIC, TO-263, 3 PIN

脉冲 晶体管
文件: 总9页 (文件大小:172K)
中文:  中文翻译
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IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
OptiMOS®-T2 Power-Transistor  
Product Summary  
VDS  
60  
2.4  
120  
V
R
DS(on),max (SMD version)  
m  
A
I D  
Features  
PG-TO263-3-2  
PG-TO262-3-1  
PG-TO220-3-1  
• N-channel - Enhancement mode  
• AEC qualified  
• MSL1 up to 260°C peak reflow  
• 175°C operating temperature  
• Green Product (RoHS compliant)  
• 100% Avalanche tested  
Type  
Package  
Marking  
4N0602  
4N0602  
4N0602  
IPB120N06S4-02  
IPI120N06S4-02  
IPP120N06S4-02  
PG-TO263-3-2  
PG-TO262-3-1  
PG-TO220-3-1  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
Continuous drain current1)  
I D  
T C=25°C, VGS=10V  
120  
120  
A
T C=100°C, VGS=10V2)  
Pulsed drain current2)  
I D,pulse  
EAS  
T C=25°C  
I D=60A  
480  
560  
120  
±20  
188  
Avalanche energy, single pulse2)  
Avalanche current, single pulse  
Gate source voltage  
mJ  
A
I AS  
VGS  
V
Ptot  
T C=25°C  
Power dissipation  
W
T j, T stg  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
-55 ... +175  
55/175/56  
°C  
Rev. 1.2  
page 1  
2009-07-01  
IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Thermal characteristics2)  
R thJC  
R thJA  
R thJA  
Thermal resistance, junction - case  
-
-
-
-
0.8  
62  
K/W  
Thermal resistance, junction -  
ambient, leaded  
SMD version, device on PCB  
minimal footprint  
-
-
-
-
62  
40  
6 cm2 cooling area3)  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V(BR)DSS  
VGS(th)  
I DSS  
V
V
V
GS=0V, I D= 1mA  
DS=VGS, I D=140µA  
DS=60V, VGS=0V  
Drain-source breakdown voltage  
Gate threshold voltage  
60  
2.0  
-
-
-
4.0  
1
V
3.0  
0.01  
Zero gate voltage drain current  
µA  
V
DS=60V, VGS=0V,  
-
10  
200  
T j=125°C2)  
I GSS  
V
V
GS=20V, VDS=0V  
GS=10V, I D=100A  
Gate-source leakage current  
-
-
-
100 nA  
R DS(on)  
Drain-source on-state resistance  
2.4  
2.8  
mΩ  
V
GS=10V, I D=100A,  
-
2.0  
2.4  
SMD version  
Rev. 1.2  
page 2  
2009-07-01  
IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Dynamic characteristics2)  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t r  
-
-
-
-
-
-
-
12120 15750 pF  
V
GS=0V, VDS=25V,  
2980  
110  
25  
3870  
f =1MHz  
220  
-
-
-
-
ns  
5
V
DD=30V, VGS=10V,  
I D=120A, R G=3.5Ω  
t d(off)  
t f  
Turn-off delay time  
Fall time  
50  
10  
Gate Charge Characteristics2)  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
63  
15  
85  
30  
195  
-
nC  
Q gd  
V
V
DD=48V, I D=120A,  
GS=0 to 10V  
Q g  
150  
5.2  
Vplateau  
Gate plateau voltage  
V
A
Reverse Diode  
Diode continous forward current2)  
Diode pulse current2)  
I S  
-
-
-
-
120  
480  
T C=25°C  
I S,pulse  
V
GS=0V, I F=100A,  
VSD  
Diode forward voltage  
Reverse recovery time2)  
Reverse recovery charge2)  
-
-
-
0.9  
190  
170  
1.3  
V
T j=25°C  
VR=30V, I F=50A,  
diF/dt =100A/µs  
t rr  
-
-
ns  
nC  
Q rr  
1) Current is limited by bondwire; with an R thJC = 0.8K/W the chip is able to carry 206A at 25°C.  
2) Defined by design. Not subject to production test.  
3) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 1.2  
page 3  
2009-07-01  
IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
1 Power dissipation  
2 Drain current  
P
tot = f(T C); VGS 6 V  
I D = f(T C); VGS 6 V; SMD  
200  
175  
150  
125  
100  
75  
140  
120  
100  
80  
60  
40  
50  
20  
25  
0
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T
C [°C]  
T
C [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
thJC = f(t p)  
I D = f(VDS); T C = 25 °C; D = 0; SMD  
parameter: t p  
Z
parameter: D =t p/T  
100  
1000  
1 µs  
0.5  
10 µs  
100 µs  
10-1  
1 ms  
100  
0.1  
0.05  
0.01  
10-2  
10  
1
single pulse  
10-3  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
0.1  
1
10  
100  
t p [s]  
V
DS [V]  
Rev. 1.2  
page 4  
2009-07-01  
IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
5 Typ. output characteristics  
I D = f(VDS); T j = 25 °C; SMD  
parameter: VGS  
6 Typ. drain-source on-state resistance  
DS(on) = f(I D); T j = 25 °C; SMD  
R
parameter: VGS  
480  
10 V  
8 V  
7 V  
6 V  
6.5 V  
5.5 V  
9
6.5 V  
420  
360  
300  
240  
180  
120  
60  
7
5
3
6 V  
5.5 V  
7 V  
8 V  
10 V  
0
1
0
0
1
2
3
4
120  
240  
D [A]  
360  
480  
V
DS [V]  
I
7 Typ. transfer characteristics  
I D = f(VGS); VDS = 6V  
parameter: T j  
8 Typ. drain-source on-state resistance  
R
DS(on) = f(T j); I D = 100 A; VGS = 10 V; SMD  
480  
420  
360  
300  
240  
180  
4
3.5  
3
2.5  
2
175 °C  
120  
25 °C  
1.5  
1
60  
-55 °C  
0
3
4
5
6
7
-60  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
GS [V]  
Rev. 1.2  
page 5  
2009-07-01  
IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
9 Typ. gate threshold voltage  
GS(th) = f(T j); VGS = VDS  
10 Typ. capacitances  
V
C = f(VDS); VGS = 0 V; f = 1 MHz  
parameter: I D  
4
105  
3.5  
3
Ciss  
104  
103  
102  
1400 µA  
Coss  
140 µA  
2.5  
2
Crss  
101  
1.5  
-60  
0
5
10  
15  
20  
25  
30  
-20  
20  
60  
T j [°C]  
100  
140  
180  
V
DS [V]  
11 Typical forward diode characteristicis  
12 Avalanche characteristics  
A S= f(t AV  
IF = f(VSD)  
I
)
parameter: T j  
parameter: Tj(start)  
103  
1000  
102  
100  
10  
25 °C  
100 °C  
150 °C  
25 °C  
175 °C  
101  
100  
1
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
0.1  
1
10  
100  
1000  
V
SD [V]  
t
AV [µs]  
Rev. 1.2  
page 6  
2009-07-01  
IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
13 Avalanche energy  
AS = f(T j)  
14 Drain-source breakdown voltage  
BR(DSS) = f(T j); I D = 1 mA  
E
V
parameter: I D  
66  
64  
62  
60  
58  
56  
600  
500  
400  
300  
200  
100  
60 A  
0
-55  
-15  
25  
65  
105  
145  
25  
75  
125  
175  
T j [°C]  
T j [°C]  
15 Typ. gate charge  
GS = f(Q gate); I D = 120 A pulsed  
16 Gate charge waveforms  
V
parameter: VDD  
10  
9
8
7
6
5
4
3
2
1
V GS  
12 V  
48 V  
Q g  
V gs(th)  
Q g(th)  
Q sw  
Q gd  
Q gate  
Q gs  
0
0
40  
80  
120  
160  
Q
gate [nC]  
Rev. 1.2  
page 7  
2009-07-01  
IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© Infineon Technologies AG 2009  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies hereby  
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties  
of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances.  
For information on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be implanted  
in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.  
Rev. 1.2  
page 8  
2009-07-01  
IPB120N06S4-02  
IPI120N06S4-02, IPP120N06S4-02  
Revision History  
Version  
Date  
Changes  
Update of RthJC and related  
parameters from 0.6K/W to  
Revision 1.1  
Revision 1.2  
22.08.2008 0.8K/W  
01.07.2009 Update of SOA diagram  
Rev. 1.2  
page 9  
2009-07-01  

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