AUIRFS4010-7TRR [INFINEON]

Power Field-Effect Transistor, 190A I(D), 100V, 0.004ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, ROHS COMPLIANT, D2PAK-7;
AUIRFS4010-7TRR
型号: AUIRFS4010-7TRR
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 190A I(D), 100V, 0.004ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, ROHS COMPLIANT, D2PAK-7

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AUTOMOTIVE GRADE  
AUIRFS4010-7P  
HEXFET® Power MOSFET  
Features  
D
S
VDSS  
RDS(on) typ.  
max. 4.0m  
100V  
Advanced Process Technology  
Ultra Low On-Resistance  
3.3m  
Ω
EnhanceddV/dTanddI/dTcapability  
175°COperatingTemperature  
Fast Switching  
Repetitive Avalanche Allowed up to Tjmax  
Lead-Free,RoHSCompliant  
AutomotiveQualified*  
G
Ω
ID  
190A  
D
Description  
Specifically designed for Automotive applications, this HEXFET®  
PowerMOSFETutilizesthelatestprocessingtechniquestoachieve  
extremely low on-resistance per silicon area. Additional features of  
thisdesign area175°Cjunctionoperatingtemperature,fastswitching  
speed and improved repetitive avalanche rating . These features  
combinetomakethisdesignanextremelyefficientandreliabledevice  
for use in Automotive applications and a wide variety of other  
applications.  
S
S
S
S
S
G
D2Pak 7 Pin  
AUIRFS4010-7P  
G
D
S
Gate  
Drain  
Source  
Standard Pack  
Form  
Tube  
Base Part Number  
AUIRFS4010-7P  
Package Type  
Orderable Part Number  
Quantity  
50  
800  
800  
AUIRFS4010-7P  
AUIRFS4010-7TRL  
AUIRFS4010-7TRR  
D2Pak- 7 Pin  
Tape and Reel Left  
Tape and Reel Right  
Absolute Maximum Ratings  
Stressesbeyondthoselistedunder“AbsoluteMaximumRatings”maycausepermanentdamagetothedevice.Thesearestressratingsonly;  
andfunctionaloperationofthedeviceattheseoranyotherconditionbeyondthoseindicatedinthespecificationsisnotimplied.Exposureto  
absolute-maximum-ratedconditionsforextendedperiodsmayaffectdevicereliability.Thethermalresistanceandpowerdissipationratings  
are measured under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified.  
Parameter  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
Max.  
190  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
130  
A
740  
PD @TC = 25°C  
W
380  
Maximum Power Dissipation  
Linear Derating Factor  
2.5  
W/°C  
V
VGS  
EAS  
IAR  
± 20  
330  
Gate-to-Source Voltage  
mJ  
A
Single Pulse Avalanche Energy (Thermally Limited)  
Avalanche Current  
See Fig. 14, 15, 22a, 22b  
EAR  
mJ  
Repetitive Avalanche Energy  
Peak Diode Recovery  
26  
dv/dt  
TJ  
V/ns  
-55 to + 175  
Operating Junction and  
TSTG  
°C  
Storage Temperature Range  
Soldering Temperature, for 10 seconds (1.6mm from case)  
300  
Thermal Resistance  
Parameter  
Typ.  
–––  
Max.  
0.40  
40  
Units  
Rθ  
Junction-to-Case  
JC  
JA  
°C/W  
Rθ  
–––  
Junction-to-Ambient (PCB Mount)  
HEXFET® is a registered trademark of International Rectifier.  
*Qualification standards can be found at http://www.irf.com/  
1
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March 10, 2014  
AUIRFS4010-7P  
Static Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Drain-to-Source Breakdown Voltage  
Breakdown Voltage Temp. Coefficient  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
Min. Typ. Max. Units  
100 ––– –––  
––– 0.11 ––– V/°C Reference to 25°C, ID = 5mA  
Conditions  
VGS = 0V, ID = 250μA  
V(BR)DSS  
V
V
/ T  
(BR)DSS Δ  
Δ
J
RDS(on)  
VGS(th)  
gfs  
–––  
2.0  
3.3  
4.0  
4.0  
VGS = 10V, ID = 110A  
VDS = VGS, ID = 250μA  
VDS = 25V, ID = 110A  
m
V
Ω
–––  
Forward Transconductance  
210 ––– –––  
S
RG  
IDSS  
–––  
––– –––  
Internal Gate Resistance  
Drain-to-Source Leakage Current  
2.1  
–––  
20  
Ω
V
V
V
V
DS = 100V, VGS = 0V  
DS = 100V, VGS = 0V, TJ = 125°C  
GS = 20V  
μA  
––– ––– 250  
––– ––– 100  
––– ––– -100  
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
nA  
GS = -20V  
Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Total Gate Charge  
Min. Typ. Max. Units  
––– 150 230  
Conditions  
Qg  
ID = 110A  
DS = 50V  
Qgs  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Total Gate Charge Sync. (Qg - Qgd)  
Turn-On Delay Time  
Rise Time  
–––  
–––  
36  
48  
–––  
–––  
V
nC  
ns  
Qgd  
VGS = 10V  
Qsync  
––– 102 –––  
ID = 110A, VDS =0V, VGS = 10V  
VDD = 65V  
td(on)  
–––  
–––  
19  
56  
–––  
–––  
tr  
ID = 110A  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
––– 100 –––  
––– 48 –––  
R = 2.7  
Ω
G
VGS = 10V  
Ciss  
Input Capacitance  
––– 9830 –––  
––– 650 –––  
––– 260 –––  
––– 730 –––  
––– 740 –––  
VGS = 0V  
Coss  
Output Capacitance  
Reverse Transfer Capacitance  
V
DS = 50V  
ƒ = 1.0MHz  
GS = 0V, VDS = 0V to 80V  
Crss  
pF  
Coss eff. (ER)  
Coss eff. (TR)  
V
Effective Output Capacitance (Energy Related)  
Effective Output Capacitance (Time Related)  
VGS = 0V, VDS = 0V to 80V  
Diode Characteristics  
Parameter  
Min. Typ. Max. Units  
Conditions  
D
S
IS  
Continuous Source Current  
MOSFET symbol  
––– ––– 186  
A
(Body Diode)  
Pulsed Source Current  
(Body Diode)  
showing the  
integral reverse  
G
ISM  
––– ––– 740  
p-n junction diode.  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
––– –––  
1.3  
–––  
–––  
V
TJ = 25°C, IS = 110A, VGS = 0V  
TJ = 25°C  
TJ = 125°C  
TJ = 25°C  
TJ = 125°C  
TJ = 25°C  
VR = 85V,  
IF = 110A  
di/dt = 100A/μs  
–––  
–––  
60  
67  
ns  
Qrr  
Reverse Recovery Charge  
––– 150 –––  
––– 180 –––  
nC  
A
IRRM  
ton  
Reverse Recovery Current  
Forward Turn-On Time  
–––  
4.7  
–––  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Repetitive rating; pulse width limited by max. junction temperature.  
‚ Limited by TJmax, starting TJ = 25°C, L = 0.052mH  
RG = 25Ω, IAS = 110A, VGS =10V. Part not recommended for use  
above this value .  
Coss eff. (TR) is a fixed capacitance that gives the same charging time  
as Coss while VDS is rising from 0 to 80% VDSS  
† Coss eff. (ER) is a fixed capacitance that gives the same energy as  
Coss while VDS is rising from 0 to 80% VDSS  
.
.
ƒ ISD 110A, di/dt 1310A/μs, VDD V(BR)DSS, TJ 175°C.  
„ Pulse width 400μs; duty cycle 2%.  
‡ When mounted on 1" square PCB (FR-4 or G-10 Material). For recom-  
mended footprint and soldering techniques refer to application note #AN-994.  
ˆ Rθ is measured at TJ approximately 90°C.  
‰ RθJC value shown is at time zero.  
2
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March 10, 2014  
AUIRFS4010-7P  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
10V  
8.0V  
7.0V  
5.0V  
4.5V  
4.3V  
4.0V  
VGS  
15V  
10V  
8.0V  
7.0V  
5.0V  
4.5V  
4.3V  
4.0V  
TOP  
TOP  
BOTTOM  
BOTTOM  
1
60μs PULSE WIDTH  
Tj = 25°C  
4.0V  
V
4.0V  
60μs PULSE WIDTH  
Tj = 175°C  
0.1  
0.1  
1
10  
100  
0.1  
1
10  
100  
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1000  
100  
10  
2.5  
2.0  
1.5  
1.0  
0.5  
I
= 110A  
= 10V  
D
V
GS  
T
= 175°C  
J
T
= 25°C  
= 50V  
J
1
V
DS  
60μs PULSE WIDTH  
0.1  
2
3
4
5
6
7
-60 -40 -20 0 20 40 60 80 100120140160180  
, Junction Temperature (°C)  
T
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 4. Normalized On-Resistance vs. Temperature  
Fig 3. Typical Transfer Characteristics  
14.0  
100000  
10000  
1000  
V
C
= 0V,  
f = 1 MHZ  
GS  
I = 110A  
D
= C + C , C SHORTED  
iss  
gs gd ds  
12.0  
C
= C  
V
V
= 80V  
= 50V  
rss  
gd  
DS  
DS  
C
= C + C  
oss  
ds  
gd  
10.0  
8.0  
6.0  
4.0  
2.0  
0.0  
C
iss  
C
C
oss  
rss  
100  
1
10  
100  
1000  
0
25 50 75 100 125 150 175 200 225  
V
, Drain-to-Source Voltage (V)  
Q , Total Gate Charge (nC)  
G
DS  
Fig 5. Typical Capacitance vs. Drain-to-Source Voltage  
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Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage  
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March 10, 2014  
AUIRFS4010-7P  
1000  
100  
10  
1000  
100  
10  
100μsec  
1msec  
10msec  
T
= 175°C  
J
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
1
T
= 25°C  
J
DC  
0.1  
0.01  
Tc = 25°C  
Tj = 175°C  
Single Pulse  
1
V
= 0V  
GS  
0.1  
1
10  
100  
0.1  
0.0  
0.5  
1.0  
1.5  
V
, Drain-to-Source Voltage (V)  
DS  
V
, Source-to-Drain Voltage (V)  
SD  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
200  
180  
160  
140  
120  
100  
80  
125  
120  
115  
110  
105  
100  
95  
Id = 5mA  
60  
40  
20  
0
25  
50  
75  
100  
125  
150  
175  
-60 -40 -20 0 20 40 60 80 100120140160180  
T
, Case Temperature (°C)  
T
, Temperature ( °C )  
C
J
Fig 9. Maximum Drain Current vs.  
Fig 10. Drain-to-Source Breakdown Voltage  
Case Temperature  
6.0  
5.0  
4.0  
3.0  
2.0  
1.0  
0.0  
1400  
I
D
1200  
1000  
800  
600  
400  
200  
0
TOP  
21A  
38A  
BOTTOM 110A  
0
10 20 30 40 50 60 70 80 90 100 110  
Drain-to-Source Voltage (V)  
25  
50  
75  
100  
125  
150  
175  
Starting T , Junction Temperature (°C)  
J
V
DS,  
Fig 11. Typical COSS Stored Energy  
Fig 12. Maximum Avalanche Energy vs. DrainCurrent  
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4
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AUIRFS4010-7P  
1
0.1  
D = 0.50  
0.20  
0.10  
0.05  
R1  
R1  
R2  
R2  
R3  
R3  
R4  
R4  
Ri (°C/W) τi (sec)  
0.02  
0.01  
0.01  
0.02001  
0.05145  
0.19436  
0.13433  
0.000025  
0.000094  
0.002047  
0.012818  
τ
τ
J τJ  
τ
Cτ  
1τ1  
Ci= τi/Ri  
τ
τ
τ
2 τ2  
3τ3  
4τ4  
0.001  
0.0001  
SINGLE PULSE  
( THERMAL RESPONSE )  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthjc + Tc  
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
t
, Rectangular Pulse Duration (sec)  
1
Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
1000  
100  
10  
Duty Cycle = Single Pulse  
Allowed avalanche Current vs avalanche  
pulsewidth, tav, assuming ΔTj = 150°C and  
Tstart =25°C (Single Pulse)  
0.01  
0.05  
0.10  
1
Allowed avalanche Current vs avalanche  
pulsewidth, tav, assuming ΔΤ j = 25°C and  
Tstart = 150°C.  
0.1  
1.0E-06  
1.0E-05  
1.0E-04  
1.0E-03  
1.0E-02  
1.0E-01  
tav (sec)  
Fig 14. Typical Avalanche Current vs.Pulsewidth  
400  
Notes on Repetitive Avalanche Curves , Figures 14, 15:  
(For further info, see AN-1005 at www.irf.com)  
1. Avalanche failures assumption:  
Purely a thermal phenomenon and failure occurs at a temperature far in  
excess of Tjmax. This is validated for every part type.  
2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded.  
3. Equation below based on circuit and waveforms shown in Figures 22a,22b.  
4. PD (ave) = Average power dissipation per single avalanche pulse.  
5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase  
during avalanche).  
6. Iav = Allowable avalanche current.  
7. ΔT = Allowable rise in junction temperature, not to exceed Tjmax (assumed as  
25°C in Figure 14, 15).  
tav = Average time in avalanche.  
D = Duty cycle in avalanche = tav ·f  
TOP  
BOTTOM 1.0% Duty Cycle  
= 110A  
Single Pulse  
350  
300  
250  
200  
150  
100  
50  
I
D
ZthJC(D, tav) = Transient thermal resistance, see Figures 13)  
0
PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC  
25  
50  
75  
100  
125  
150  
175  
Iav = 2DT/ [1.3·BV·Zth]  
EAS (AR) = PD (ave)·tav  
Starting T , Junction Temperature (°C)  
J
Fig 15. Maximum Avalanche Energy vs. Temperature  
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AUIRFS4010-7P  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
30  
25  
20  
15  
10  
5
I
= 74A  
= 85V  
F
V
R
T = 25°C  
J
T = 125°C  
J
I
I
I
= 250μA  
= 1.0mA  
= 1.0A  
D
D
D
0
-75 -50 -25  
0
25 50 75 100 125 150 175  
, Temperature ( °C )  
0
200  
400  
600  
800  
1000  
T
di /dt (A/μs)  
J
F
Fig. 17 - Typical Recovery Current vs. dif/dt  
Fig 16. Threshold Voltage vs. Temperature  
30  
25  
20  
15  
10  
5
1000  
900  
800  
700  
600  
500  
400  
300  
200  
100  
I
= 110A  
= 85V  
I = 74A  
F
F
V
V
= 85V  
R
R
T = 25°C  
T = 25°C  
J
J
T = 125°C  
J
T = 125°C  
J
0
0
200  
400  
600  
800  
1000  
0
200  
400  
600  
800  
1000  
di /dt (A/μs)  
di /dt (A/μs)  
F
F
Fig. 18 - Typical Recovery Current vs. dif/dt  
Fig. 19 - Typical Stored Charge vs. dif/dt  
1000  
I
= 110A  
= 85V  
F
900  
800  
700  
600  
500  
400  
300  
200  
V
R
T = 25°C  
J
T = 125°C  
J
0
200  
400  
600  
800  
1000  
di /dt (A/μs)  
F
Fig. 20 - Typical Stored Charge vs. dif/dt  
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March 10, 2014  
AUIRFS4010-7P  
Driver Gate Drive  
P.W.  
P.W.  
Period  
D.U.T  
Period  
D =  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
‚
-
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
di/dt  
-
+
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
VDD  
Re-Applied  
Voltage  
dv/dt controlled by RG  
Driver same type as D.U.T.  
RG  
+
-
Body Diode  
Inductor Current  
Forward Drop  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
I
SD  
Ripple  
5%  
* VGS = 5V for Logic Level Devices  
Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel  
HEXFET® Power MOSFETs  
V
(BR)DSS  
15V  
t
p
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
V
2
GS  
Ω
0.01  
t
p
I
AS  
Fig 22b. Unclamped Inductive Waveforms  
Fig 22a. Unclamped Inductive Test Circuit  
RD  
VDS  
V
DS  
90%  
VGS  
D.U.T.  
RG  
+
VDD  
-
VGS  
10%  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 23a. Switching Time Test Circuit  
Fig 23b. Switching Time Waveforms  
Id  
Current Regulator  
Same Type as D.U.T.  
Vds  
Vgs  
50KΩ  
.2μF  
12V  
.3μF  
+
V
DS  
D.U.T.  
-
Vgs(th)  
V
GS  
3mA  
I
I
D
G
Qgs1  
Qgs2  
Qgd  
Qgodr  
Current Sampling Resistors  
Fig 24a. Gate Charge Test Circuit  
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Fig 24b. Gate Charge Waveform  
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March 10, 2014  
AUIRFS4010-7P  
D2Pak - 7 Pin Package Outline  
Dimensions are shown in millimeters (inches)  
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/  
8
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AUIRFS4010-7P  
D2Pak - 7 Pin Part Marking Information  
PartNumber  
AUFS4010-7P  
Date Code  
Y= Year  
WW= Work Week  
A= Automotive, Lead Free  
IR Logo  
YWWA  
XX or XX  
Lot Code  
D2Pak - 7 Pin Tape and Reel  
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/  
9
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AUIRFS4010-7P  
Qualification Information†  
Automotive  
††  
(per AEC-Q101)  
Comments:  
This part  
number(s) passed  
Qualification Level  
Automotive qualification. IR’s Industrial and  
Consumer qualification level is granted by  
extension of the higher Automotive level.  
Moisture Sensitivity Level  
MSL1  
Class M4(+/- 800V )†††  
7L-D2 PAK  
Machine Model  
(per AEC-Q101-002)  
Class H3A(+/- 6000V )†††  
(per AEC-Q101-001)  
ESD  
Human Body Model  
Class C5(+/- 2000V )†††  
(per AEC-Q101-005)  
Charged Device Model  
Yes  
RoHS Compliant  
Qualification standards can be found at International Rectifier’s web site: http://www.irf.com/product-info/reliability  
†† Exceptions (if any) to AEC-Q101 requirements are noted in the qualification report.  
††† Highest passing voltage  
10  
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March 10, 2014  
AUIRFS4010-7P  
IMPORTANTNOTICE  
Unless specifically designated for the automotive market, International Rectifier Corporation and its subsidiaries (IR)  
reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products  
and services at any time and to discontinue any product or services without notice. Part numbers designated with the “AU”  
prefix follow automotive industry and / or customer specific requirements with regards to product discontinuance and  
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11  
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Submit Datasheet Feedback  
March 10, 2014  
AUIRFS4010-7P  
Revision History  
Date  
Comments  
Updated fig.8 SOA curve on page 5  
3/10/2014  
Updated data sheet with new IR corporate template  
12  
www.irf.com © 2014 International Rectifier  
Submit Datasheet Feedback  
March 10, 2014  

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