IS61LV256-12J [ICSI]

32K X 8 LOW VOLTAGE CMOS STATIC RAM; 32K ×8低压CMOS静态RAM
IS61LV256-12J
型号: IS61LV256-12J
厂家: INTEGRATED CIRCUIT SOLUTION INC    INTEGRATED CIRCUIT SOLUTION INC
描述:

32K X 8 LOW VOLTAGE CMOS STATIC RAM
32K ×8低压CMOS静态RAM

文件: 总8页 (文件大小:121K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
IS61LV256  
32K x 8 LOW VOLTAGE  
CMOS STATIC RAM  
ꢀEATURES  
DESCRIPTION  
The ICSI IS61LV256 is a very high-speed, low power,  
32,768-word by 8-bit static RAM. It is fabricated using ICSI's  
high-performance CMOS technology. This highly reliable pro-  
cess coupled with innovative circuit design techniques, yields  
access times as fast as 8 ns maximum.  
• High-speed access times:  
-- 8, 10, 12, 15, 20 ns  
• Automatic power-down when chip is deselected  
• CMOS low power operation  
-- 345 mW (max.) operating  
When CE is HIGH (deselected), the device assumes a standby  
mode at which the power dissipation is reduced to  
50 µW (typical) with CMOS input levels.  
-- 7 mW (max.) CMOS standby  
• TTL compatible interface levels  
• Single 3.3V power supply  
Easy memory expansion is provided by using an active LOW  
Chip Enable (CE). The active LOW Write Enable (WE) controls  
both writing and reading of the memory.  
• ꢀully static operation: no clock or refresh  
required  
• Three-state outputs  
The IS61LV256 is available in the JEDEC standard 28-pin,  
300mil SOJ and the 8*13.4mm TSOP-1 package.  
ꢀUNCTIONAL BLOCK DIAGRAM  
256 X 1024  
MEMORY ARRAY  
A0-A14  
DECODER  
VCC  
GND  
I/O  
DATA  
COLUMN I/O  
I/O0-I/O7  
CIRCUIT  
CE  
CONTROL  
CIRCUIT  
OE  
WE  
ICSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors  
which may appear in this publication. © Copyright 2000, Integrated Circuit Solution Inc.  
Integrated Circuit Solution Inc.  
SR004-0D  
1
IS61LV256  
PIN CONꢀIGURATION  
28-Pin SOJ  
PIN CONꢀIGURATION  
8x13.4mm TSOP-1  
A14  
A12  
A7  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
VCC  
WE  
A13  
A8  
OE  
A11  
A9  
22  
23  
24  
25  
26  
27  
28  
1
21  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
10  
9
A10  
CE  
2
3
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
GND  
I/O2  
I/O1  
I/O0  
A0  
A6  
4
A8  
A5  
5
A9  
A13  
WE  
VCC  
A14  
A12  
A7  
A6  
A5  
A4  
A3  
A4  
6
A11  
OE  
A3  
7
A2  
8
A10  
CE  
2
A1  
9
3
A0  
10  
11  
12  
13  
14  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
4
I/O0  
I/O1  
I/O2  
GND  
5
6
A1  
A2  
7
8
TRUTH TABLE  
PIN DESCRIPTIONS  
Mode  
WE CE  
OE  
I/O Operation Vcc Current  
A0-A14  
CE  
Address Inputs  
Not Selected  
(Power-down)  
X
H
X
High-Z  
ISB1, ISB2  
Chip Enable Input  
Output Enable Input  
Write Enable Input  
Input/Output  
OE  
Output Disabled  
Read  
H
H
L
L
L
L
H
L
High-Z  
DOUT  
DIN  
ICC  
ICC  
ICC  
WE  
I/O0-I/O7  
Vcc  
Write  
X
Power  
GND  
Ground  
ABSOLUTE MAXIMUM RATINGS(1)  
Symbol Parameter  
Value  
Unit  
V
VCC  
Power Supply Voltage Relative to GND  
Terminal Voltage with Respect to GND  
Temperature Under Bias  
–0.5 to +4.6  
–0.5 to +4.6  
VTERM  
TBIAS  
V
Com.  
Ind.  
–10 to +85  
–45 to +90  
°C  
TSTG  
PD  
Storage Temperature  
Power Dissipation  
DC Output Current  
–65 to +150  
°C  
W
1
IOUT  
±20  
mA  
Notes:  
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent  
damage to the device. This is a stress rating only and functional operation of the device at these or any  
other conditions above those indicated in the operational sections of this specification is not implied.  
Exposure to absolute maximum rating conditions for extended periods may affect reliability.  
2
Integrated Circuit Solution Inc.  
SR004-0D  
IS61LV256  
OPERATING RANGE  
Range  
Ambient Temperature  
Speed  
VCC  
Commercial  
0°C to +70°C  
8, 10, 12  
15, 20  
3.3V, +10%, –5%  
3.3V ± 10%  
Industrial  
–40°C to +85°C  
All  
3.3V + 10%, –5%  
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)  
Symbol Parameter  
Test Conditions  
Min.  
2.4  
Max.  
—
Unit  
V
VOH  
VOL  
VIH  
VIL  
ILI  
Output HIGH Voltage  
VCC = Min., IOH = –4.0 mA  
VCC = Min., IOL = 8.0 mA  
Output LOW Voltage  
Input HIGH Voltage  
Input LOW Voltage(1)  
Input Leakage  
—
0.4  
V
2.2  
VCC + 0.3  
0.8  
V
–0.3  
V
GND VIN VCC  
Com.  
Ind.  
–1  
–5  
1
5
µA  
ILO  
Output Leakage  
GND VOUT VCC, Outputs Disabled  
Com.  
Ind.  
–1  
–5  
1
5
µA  
Notes:  
1. VIL (min.) = –0.3V (DC); VIL (min.) = –2.0V (pulse width 2.0 ns).  
VIH (max.) = VCC + 0.5V (DC); VIH (max.) = Vcc + 2.0V (pulse width 2.0 ns).  
2. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.  
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)  
-8 ns  
-10 ns  
-12 ns  
-15 ns  
-20 ns  
Sym. Parameter  
Test Conditions  
Min. Max.  
Min. Max.  
Min. Max.  
Min. Max.  
Min. Max.  
Unit  
I
CC  
Vcc Dynamic Operating  
Supply Current  
V
CC = Max., CE = VIL  
Com.  
Ind.  
—
—
120  
130  
—
—
110  
120  
—
—
100  
110  
—
—
90  
—
—
80  
90  
mA  
IOUT = 0 mA, f = fMAX  
100  
I
SB  
1
TTL Standby Current  
(TTL Inputs)  
V
CC = Max.,  
Com.  
Ind.  
—
—
25  
30  
—
—
25  
30  
—
—
25  
30  
—
—
25  
30  
—
—
25  
30  
mA  
mA  
VIN = VIH or VIL  
CE  
VIH, f = 0  
ISB  
2
CMOS Standby  
V
CC = Max.,  
CE CC – 0.2V,  
IN > VCC – 0.2V, or  
0.2V, f = 0  
Com.  
Ind.  
—
—
2
5
—
—
2
5
—
—
2
5
—
—
2
5
—
—
2
5
Current (CMOS Inputs)  
V  
V
V
IN  
Notes:  
1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.  
CAPACITANCE(1,2)  
Symbol  
CIN  
Parameter  
Conditions  
VIN = 0V  
Max.  
Unit  
pꢀ  
Input Capacitance  
Output Capacitance  
6
5
COUT  
VOUT = 0V  
pꢀ  
Notes:  
1. Tested initially and after any design or process changes that may affect these parameters.  
2. Test conditions: TA = 25°C, f = 1 MHz, Vcc = 3.3V.  
Integrated Circuit Solution Inc.  
SR004-0D  
3
IS61LV256  
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)  
-8 ns  
-10 ns  
-12 ns  
-15 ns  
-20 ns  
Symbol Parameter  
Min. Max.  
Min. Max.  
Min. Max.  
Min. Max.  
Min. Max.  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tRC  
Read Cycle Time  
8
—
2
—
8
10  
—
2
—
10  
—
10  
5
12  
—
2
—
12  
—
12  
6
15  
—
2
—
15  
—
15  
7
20  
—
2
—
20  
—
20  
8
tAA  
Address Access Time  
Output Hold Time  
CE Access Time  
tOHA  
tACE  
tDOE  
tLZOE  
—
8
—
—
0
—
—
0
—
—
0
—
—
0
—
—
0
OE Access Time  
4
(2)  
(2)  
OE to Low-Z Output  
OE to High-Z Output  
CE to Low-Z Output  
CE to High-Z Output  
CE to Power-Up  
—
4
—
5
—
5
—
6
—
6
tHZOE  
—
3
—
3
—
3
—
3
—
3
(2)  
tLZCE  
tHZCE  
—
4
—
5
—
6
—
7
—
7
(2)  
—
0
—
0
—
0
—
0
—
0
(3)  
tPU  
—
8
—
10  
—
12  
—
15  
—
20  
(4)  
tPD  
CE to Power-Down  
—
—
—
—
—
Notes:  
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse  
levels of 0 to 3.0V and output loading specified in ꢀigure 1.  
2. Tested with the load in ꢀigure 2. Transition is measured ±200 mV from steady-state voltage. Not 100%  
tested.  
3. Not 100% tested.  
AC TEST CONDITIONS  
Parameter  
Unit  
0V to 3.0V  
3 ns  
Input Pulse Level  
Input Rise and ꢀall Times  
Input and Output Timing  
and Reference Levels  
1.5V  
Output Load  
See ꢀigures 1 and 2  
AC TEST LOADS  
319 Ω  
319 Ω  
3.3V  
3.3V  
OUTPUT  
OUTPUT  
353 Ω  
353 Ω  
30 pF  
Including  
jig and  
5 pF  
Including  
jig and  
scope  
scope  
'igure 1.  
'igure 2.  
4
Integrated Circuit Solution Inc.  
SR004-0D  
IS61LV256  
AC WAVEꢀORMS  
READ CYCLE NO. 1(1,2)  
t
RC  
ADDRESS  
t
AA  
t
OHA  
t
OHA  
DATA VALID  
DOUT  
PREVIOUS DATA VALID  
READ CYCLE NO. 2(1,3)  
t
RC  
ADDRESS  
OE  
t
AA  
t
OHA  
t
HZOE  
t
DOE  
t
t
LZOE  
ACE  
CE  
t
HZCE  
t
LZCE  
HIGH-Z  
DOUT  
DATA VALID  
Notes:  
1. WE is HIGH for a Read Cycle.  
2. The device is continuously selected. OE, CE = VIL.  
3. Address is valid prior to or coincident with CE LOW transitions.  
Integrated Circuit Solution Inc.  
SR004-0D  
5
IS61LV256  
WRITE CYCLE SWITCHING CHARACTERISTICS(1,2) (Over Operating Range)  
-8 ns  
-10 ns  
-12 ns  
-15 ns  
-20 ns  
Symbol Parameter  
Min. Max.  
Min. Max.  
Min. Max.  
Min. Max.  
Min. Max.  
Unit  
ns  
tWC  
tSCE  
tAW  
Write Cycle Time  
8
7
7
—
—
—
10  
8
—
—
—
12  
8
—
—
—
15  
10  
10  
—
—
—
20  
12  
12  
—
—
—
CE to Write End  
ns  
Address Setup Time  
to Write End  
8
8
ns  
tHA  
Address Hold  
0
—
0
—
0
—
0
—
0
—
ns  
from Write End  
tSA  
Address Setup Time  
0
7
—
—
—
—
—
3.5  
—
0
10  
7
—
—
—
—
—
4
0
12  
8
—
—
—
—
—
6
0
15  
10  
7
—
—
—
—
—
7
0
20  
12  
10  
0
—
—
—
—
—
7
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tPWE1  
tPWE2  
tSD  
WE Pulse Width(OE High)  
WE Pulse Width(OE Low)  
Data Setup to Write End  
Data Hold from Write End  
WE LOW to High-Z Output  
WE HIGH to Low-Z Output  
6.5  
4.5  
0
5
6
tHD  
0
0
0
(3)  
tHZWE  
—
0
—
0
—
0
—
0
—
0
(3)  
tLZWE  
—
—
—
—
Notes:  
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse  
levels of 0 to 3.0V and output loading specified in ꢀigure 1.  
2. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid  
states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and  
Hold timing are referenced to the rising or falling edge of the signal that terminates the Write.  
3. Tested with the load in ꢀigure 2. Transition is measured ±500 mV from steady-state voltage. Not 100%  
tested.  
AC WAVEꢀORMS  
WRITE CYCLE NO. 1(CE Controlled, OE is HIGH or LOW) (1 )  
t
WC  
VALID ADDRESS  
SCE  
ADDRESS  
CE  
t
SA  
t
t
HA  
t
AW  
t
t
PWE1  
PWE2  
WE  
t
HZWE  
t
LZWE  
HIGH-Z  
DATA UNDEFINED  
DOUT  
t
SD  
t
HD  
DATAIN VALID  
DIN  
6
Integrated Circuit Solution Inc.  
SR004-0D  
IS61LV256  
WRITE CYCLE NO. 2(WE Controlled, OE is HIGH During Write Cycle) (1,2)  
t
WC  
ADDRESS  
OE  
VALID ADDRESS  
t
HA  
LOW  
CE  
t
AW  
t
PWE1  
WE  
t
SA  
t
HZWE  
t
LZWE  
HIGH-Z  
DATA UNDEFINED  
DOUT  
t
SD  
t
HD  
DATAIN VALID  
DIN  
WRITE CYCLE NO. 3(WE Controlled, OE is LOW During Write Cycle) (1)  
t
WC  
ADDRESS  
VALID ADDRESS  
t
HA  
LOW  
LOW  
OE  
CE  
t
t
AW  
t
PWE2  
WE  
t
SA  
HZWE  
t
LZWE  
HIGH-Z  
DATA UNDEFINED  
DOUT  
t
SD  
t
HD  
DATAIN VALID  
DIN  
Notes:  
1. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write,  
but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling  
edge of the signal that terminates the Write.  
2. I/O will assume the High-Z state if OE > VIH.  
Integrated Circuit Solution Inc.  
SR004-0D  
7
IS61LV256  
ORDERING INꢀORMATION  
ORDERING INꢀORMATION  
Commercial Range: 0°C to +70°C  
Industrial Range: –40°C to +85°C  
Speed (ns) Order Part No.  
Package  
Speed (ns)  
Order Part No.  
Package  
8
IS61LV256-8T  
IS61LV256-8J  
8*13.4mm TSOP-1  
300mil SOJ  
8
IS61LV256-8TI  
IS61LV256-8JI  
8*13.4mm TSOP-1  
300mil SOJ  
10  
12  
15  
20  
IS61LV256-10T  
IS61LV256-10J  
8*13.4mm TSOP-1  
300mil SOJ  
10  
12  
15  
20  
IS61LV256-10TI  
IS61LV256-10JI  
8*13.4mm TSOP-1  
300mil SOJ  
IS61LV256-12T  
IS61LV256-12J  
8*13.4mm TSOP-1  
300mil SOJ  
IS61LV256-12TI  
IS61LV256-12JI  
8*13.4mm TSOP-1  
300mil SOJ  
IS61LV256-15T  
IS61LV256-15J  
8*13.4mm TSOP-1  
300mil SOJ  
IS61LV256-15TI  
IS61LV256-15JI  
8*13.4mm TSOP-1  
300mil SOJ  
IS61LV256-15T  
IS61LV256-20J  
8*13.4mm TSOP-1  
300mil SOJ  
IS61LV256-20TI  
IS61LV256-20JI  
8*13.4mm TSOP-1  
300mil SOJ  
Integrated Circuit Solution Inc.  
HEADQUARTER:  
NO.2, TECHNOLOGY RD. V, SCIENCE-BASED INDUSTRIAL PARK,  
HSIN-CHU, TAIWAN, R.O.C.  
TEL: 886-3-5780333  
"ax: 886-3-5783000  
BRANCH O""ICE:  
7", NO. 106, SEC. 1, HSIN-TAI 5TH ROAD,  
HSICHIH TAIPEI COUNTY, TAIWAN, R.O.C.  
TEL: 886-2-26962140  
"AX: 886-2-26962252  
http://www.icsi.com.tw  
8
Integrated Circuit Solution Inc.  
SR004-0D  

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