2SK3140 [HITACHI]

Silicon N Channel MOS FET High Speed Power Switching; 硅N沟道MOS FET高速电源开关
2SK3140
型号: 2SK3140
厂家: HITACHI SEMICONDUCTOR    HITACHI SEMICONDUCTOR
描述:

Silicon N Channel MOS FET High Speed Power Switching
硅N沟道MOS FET高速电源开关

晶体 开关 晶体管 脉冲 电源开关 局域网
文件: 总10页 (文件大小:49K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2SK3140  
Silicon N Channel MOS FET  
High Speed Power Switching  
ADE-208-767C (Z)  
4th. Edition  
February 1999  
Features  
Low on-resistance  
RDS(on) = 6 mtyp.  
Low drive current  
4 V gate drive device can be driven from 5 V source  
Outline  
TO–220CFM  
D
G
1
2
3
1. Gate  
2. Drain  
3. Source  
S
2SK3140  
Absolute Maximum Ratings (Ta = 25°C)  
Item  
Symbol  
VDSS  
Ratings  
Unit  
V
Drain to source voltage  
Gate to source voltage  
Drain current  
60  
VGSS  
ID  
ID(pulse)  
±20  
V
60  
A
Note 1  
Drain peak current  
240  
A
Body-drain diode reverse drain current IDR  
60  
A
Note 3  
Note 3  
Avalanche current  
Avalanche energy  
Channel dissipation  
Channel temperature  
Storage temperature  
IAP  
50  
A
EAR  
214  
mJ  
W
°C  
°C  
Pch Note 2  
35  
Tch  
150  
Tstg  
–55 to +150  
Note: 1. PW 10 µs, duty cycle 1%  
2. Value at Tc = 25°C  
3. Value at Tch = 25°C, Rg 50 Ω  
2
2SK3140  
Electrical Characteristics (Ta = 25°C)  
Item  
Symbol  
Min  
Typ  
Max  
Unit Test Conditions  
Drain to source breakdown  
voltage  
V(BR)DSS  
60  
V
ID = 10 mA, VGS = 0  
Gate to source leak current  
IGSS  
IDSS  
±0.1  
µA  
µA  
VGS = ±20 V, VDS = 0  
Zero gate voltege drain  
current  
10  
VDS = 60 V, VGS = 0  
Gate to source cutoff voltage VGS(off)  
Static drain to source on state RDS(on)  
resistance  
1.0  
45  
2.5  
7.5  
12  
V
ID = 1 mA, VDS = 10 V Note 1  
ID = 30 A, VGS = 10 V Note 1  
ID = 30 A, VGS = 4 V Note 1  
ID = 30 A, VDS = 10 V Note 1  
VDS = 10 V  
6.0  
8.0  
75  
mΩ  
mΩ  
S
Forward transfer admittance |yfs|  
Input capacitance  
Output capacitance  
Ciss  
7100  
1000  
280  
125  
25  
pF  
pF  
pF  
nc  
nc  
nc  
ns  
ns  
ns  
ns  
V
Coss  
VGS = 0  
Reverse transfer capacitance Crss  
f = 1 MHz  
Total gate charge  
Gate to source charge  
Gate to drain charge  
Turn-on delay time  
Rise time  
Qg  
Qgs  
Qgd  
td(on)  
tr  
VDD = 25 V  
VGS = 10 V  
25  
ID = 60 A  
60  
VGS = 10 V, ID = 30 A  
RL = 1Ω  
250  
540  
320  
1.0  
Turn-off delay time  
Fall time  
td(off)  
tf  
Body–drain diode forward  
voltage  
VDF  
IF = 60 A, VGS = 0  
Body–drain diode reverse  
recovery time  
trr  
80  
ns  
IF = 60 A, VGS = 0  
diF/ dt = 50 A/ µs  
Note: 1. Pulse test  
3
2SK3140  
Main Characteristics  
Power vs. Temperature Derating  
Maximum Safe Operation Area  
40  
30  
20  
10  
1000  
300  
100  
30  
10  
3
Operation in  
this area is  
limited by R  
DS(on)  
1
0.3  
0.1  
Ta = 25°C  
0
3
Drain to Source Voltage  
30  
50  
100  
150  
200  
0.1 0.3  
1
10  
100  
V
(V)  
DS  
Case Temperature Tc (°C)  
Typical Output Characteristics  
Typical Transfer Characteristics  
100  
80  
60  
40  
20  
100  
80  
60  
40  
20  
V
= 10 V  
GS  
5 V  
4 V  
Pulse Test  
3.5 V  
V
= 10 V  
DS  
Pulse Test  
3 V  
25°C  
75°C  
2.5 V  
8
Tc = –25°C  
4 5  
0
0
1
2
3
2
4
6
10  
Gate to Source Voltage  
V
(V)  
GS  
Drain to Source Voltage  
V
(V)  
DS  
4
2SK3140  
Drain to Source Saturation Voltage vs.  
Gate to Source Voltage  
Static Drain to Source on State Resistance  
vs. Drain Current  
2.0  
1.6  
1.2  
0.8  
0.4  
100  
Pulse Test  
Pulse Test  
50  
20  
10  
5
V
GS  
= 4 V  
10 V  
I
= 50 A  
20 A  
D
2
1
10 A  
12  
200  
100  
0
4
8
16  
20  
20  
5
10  
50  
(A)  
1
2
Gate to Source Voltage  
V
(V)  
GS  
Drain Current  
I
D
Forward Transfer Admittance vs.  
Drain Current  
Static Drain to Source on State Resistance  
vs. Temperature  
500  
20  
Pulse Test  
V
= 10 V  
DS  
200  
100  
50  
Pulse Test  
16  
12  
8
20 A  
Tc = –25 °C  
I
= 50 A  
D
10 A  
20  
10  
5
4 V  
25 °C  
75 °C  
10, 20, 50 A  
V
= 10 V  
50  
2
1
GS  
4
0
0.5  
0.1 0.3  
–50  
0
100  
150  
200  
1
3
10  
30  
100  
Case Temperature Tc (°C)  
Drain Current I  
(A)  
D
5
2SK3140  
Body–Drain Diode Reverse  
Recovery Time  
Typical Capacitance vs.  
Drain to Source Voltage  
30000  
10000  
1000  
500  
V
GS  
= 0  
f = 1 MHz  
Ciss  
200  
100  
50  
3000  
1000  
Coss  
Crss  
300  
100  
20  
10  
di / dt = 50 A / µs  
V
= 0, Ta = 25 °C  
GS  
0.1 0.3  
1
3
10  
30  
(A)  
100  
0
10  
20  
30  
40  
50  
Reverse Drain Current  
I
DR  
Drain to Source Voltage V  
(V)  
DS  
Dynamic Input Characteristics  
= 60 A  
Switching Characteristics  
1000  
500  
100  
80  
60  
40  
20  
20  
t
I
d(off)  
D
V
V
GS  
16  
12  
8
t
f
200  
100  
50  
V
DD  
= 50 V  
25 V  
t
r
10 V  
DS  
t
d(on)  
V
= 50 V  
25 V  
4
0
DD  
20  
10  
V
= 10 V, V  
= 30 V  
DD  
GS  
PW = 5 µs, duty < 1 %  
10 V  
10 20 50 100  
2
5
0
1
0.5  
80  
160  
240  
320  
400  
0.1 0.2  
Gate Charge Qg (nc)  
Drain Current  
I
(A)  
D
6
2SK3140  
Maximum Avalanche Energy vs.  
Channel Temperature Derating  
Reverse Drain Current vs.  
Source to Drain Voltage  
250  
200  
150  
100  
100  
80  
60  
40  
20  
I
= 50 A  
AP  
10 V  
V
= 25 V  
DD  
5 V  
duty < 0.1 %  
Rg > 50  
V
= 0, –5 V  
GS  
50  
0
Pulse Test  
1.6 2.0  
0
0.4  
0.8  
1.2  
25  
50  
75  
100  
125  
150  
Channel Temperature Tch (°C)  
Source to Drain Voltage  
V
(V)  
SDF  
Avalanche Test Circuit  
Avalanche Waveform  
V
DSS  
1
2
2
E
=
• L • I  
AP  
AR  
V
– V  
DD  
DSS  
L
V
DS  
Monitor  
I
AP  
V
(BR)DSS  
Monitor  
I
AP  
Rg  
V
V
DD  
D. U. T  
DS  
I
D
Vin  
15 V  
50Ω  
V
DD  
0
7
2SK3140  
Normalized Transient Thermal Impedance vs. Pulse Width  
3
Tc = 25°C  
1
D = 1  
0.5  
0.3  
0.1  
θ
θ
γ
θ
ch – c(t) = s (t) • ch – c  
ch – c = 3.57°C/ W, Tc = 25°C  
PW  
T
P
DM  
D =  
0.03  
0.01  
PW  
T
10 µ  
100 µ  
1 m  
10 m  
100 m  
1
10  
Pulse Width PW (S)  
Switching Time Test Circuit  
Waveform  
Vout  
Monitor  
Vin Monitor  
D.U.T.  
90%  
R
L
10%  
10%  
90%  
Vin  
V
DD  
Vin  
10 V  
Vout  
10%  
50  
= 30 V  
90%  
td(off)  
td(on)  
t
f
tr  
8
2SK3140  
Package Dimensions  
Unit: mm  
2.7 ± 0.2  
10.0 ± 0.3  
φ
3.2 ± 0.2  
1.0 ± 0.2  
4.5 ± 0.3  
2.5 ± 0.2  
1.15 ± 0.2  
0.6 ± 0.1  
2.54 ± 0.5  
2.54 ± 0.5  
0.7 ± 0.1  
TO–220CFM  
Hitachi Code  
EIAJ  
JEDEC  
9
2SK3140  
Cautions  
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright,  
trademark, or other intellectual property rights for information contained in this document. Hitachi bears no  
responsibility for problems that may arise with third party’s rights, including intellectual property rights, in  
connection with use of the information contained in this document.  
2. Products and product specifications may be subject to change without notice. Confirm that you have  
received the latest product standards or specifications before final design, purchase or use.  
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact  
Hitachi’s sales office before using the product in an application that demands especially high quality and  
reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury,  
such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment  
or medical equipment for life support.  
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for  
maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and  
other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed  
ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in  
semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating  
Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the  
Hitachi product.  
5. This product is not designed to be radiation resistant.  
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without  
written approval from Hitachi.  
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.  
Hitachi, Ltd.  
Semiconductor & IC Div.  
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan  
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109  
URL  
NorthAmerica  
Europe  
: http:semiconductor.hitachi.com/  
: http://www.hitachi-eu.com/hel/ecg  
Asia (Singapore)  
Asia (Taiwan)  
: http://www.has.hitachi.com.sg/grp3/sicd/index.htm  
: http://www.hitachi.com.tw/E/Product/SICD_Frame.htm  
Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm  
Japan  
: http://www.hitachi.co.jp/Sicd/indx.htm  
For further information write to:  
Hitachi Semiconductor  
(America) Inc.  
Hitachi Europe GmbH  
Hitachi Asia (Hong Kong) Ltd.  
Group III (Electronic Components)  
7/F., North Tower, World Finance Centre,  
Harbour City, Canton Road, Tsim Sha Tsui,  
Kowloon, Hong Kong  
Tel: <852> (2) 735 9218  
Fax: <852> (2) 730 0281  
Hitachi Asia Pte. Ltd.  
16 Collyer Quay #20-00  
Hitachi Tower  
Singapore 049318  
Tel: 535-2100  
Electronic components Group  
Dornacher Straße 3  
D-85622 Feldkirchen, Munich  
Germany  
Tel: <49> (89) 9 9180-0  
Fax: <49> (89) 9 29 30 00  
179 East Tasman Drive,  
San Jose,CA 95134  
Tel: <1> (408) 433-1990  
Fax: <1>(408) 433-0223  
Fax: 535-1533  
Hitachi Asia Ltd.  
Taipei Branch Office  
3F, Hung Kuo Building. No.167,  
Tun-Hwa North Road, Taipei (105)  
Tel: <886> (2) 2718-3666  
Fax: <886> (2) 2718-8180  
Telex: 40815 HITEC HX  
Hitachi Europe Ltd.  
Electronic Components Group.  
Whitebrook Park  
Lower Cookham Road  
Maidenhead  
Berkshire SL6 8YA, United Kingdom  
Tel: <44> (1628) 585000  
Fax: <44> (1628) 778322  
Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.  
10  

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