SI3443DV-F095 [FAIRCHILD]

Transistor;
SI3443DV-F095
型号: SI3443DV-F095
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Transistor

文件: 总5页 (文件大小:111K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
April 2001  
Si3443DV  
P-Channel 2.5V Specified PowerTrenchMOSFET  
General Description  
Features  
This P-Channel 2ꢀ5V specified MOSFET is produced  
using Fairchild's advanced PowerTrench process that  
has been especially tailored to minimize on-state  
resistance and yet maintain low gate charge for  
superior switching performanceꢀ  
• -4 A, -20 Vꢀ RDS(ON) = 0ꢀ065 @ VGS = -4ꢀ5 V  
RDS(ON) = 0ꢀ100 @ VGS = -2ꢀ5 V  
• Fast switching speedꢀ  
• Low gate charge (7ꢀ2nC typical)ꢀ  
These devices have been designed to offer exceptional  
power dissipation in a very small footprint for  
applications where the larger packages are impracticalꢀ  
• High performance trench technology for extremely  
low RDS(ON)  
• SuperSOTTM-6 package: small footprint (72% smaller  
Applications  
•
Load switch  
than standard SO-8); low profile (1mm thick)ꢀ  
• Battery protection  
• Power management  
S
1
6
5
4
D
D
2
3
G
D
SuperSOT TM-6  
D
Absolute Maximum Ratings TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Ratings  
Units  
VDSS  
VGSS  
ID  
Drain-Source Voltage  
Gate-Source Voltage  
-20  
V
V
A
±8  
Drain Current - Continuous  
Drain Current - Pulsed  
(Note 1)  
-4  
-20  
(Note 1a)  
PD  
Power Dissipation for Single Operation  
(Note 1a)  
(Note 1b)  
1.6  
W
0.8  
TJ, Tstg  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
78  
30  
RθJA  
°C/W  
°C/W  
RθJC  
Package Outlines and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape Width  
Quantity  
.443  
Si3443DV  
7’’  
8mm  
3000 units  
2001 Fairchild Semiconductor Corporation  
Si3443DV, REV A  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain-Source Breakdown Voltage  
-20  
V
VGS = 0 V, ID = -250 µA  
Breakdown Voltage Temperature  
Coefficient  
-16  
BVDSS  
TJ  
ID = -250 µA, Referenced to 25°C  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current  
VDS = -16 V, VGS = 0 V  
-1  
µA  
nA  
nA  
IGSSF  
IGSSR  
Gate-Body Leakage Current, Forward VGS = 8 V, VDS = 0 V  
Gate-Body Leakage Current, Reverse VGS = -8 V, VDS = 0 V  
100  
-100  
On Characteristics (Note 2)  
VGS(th)  
Gate Threshold Voltage  
-0.4  
-10  
-0.7  
2.5  
-1.5  
V
VDS = VGS, ID = -250 µA  
Gate Threshold Voltage  
Temperature Coefficient  
VGS(th)  
TJ  
ID = -250 µA, Referenced to 25°C  
mV/°C  
RDS(on)  
Static Drain-Source  
On-Resistance  
VGS = -4.5 V, ID = -4 A  
0.054 0.065  
0.076 0.105  
0.077 0.100  
V
V
GS = -4.5 V, ID = -4 A, TJ=125°C  
GS = -2.5 V, ID = -3.2 A  
ID(on)  
gFS  
On-State Drain Current  
VGS = -4.5 V, VDS = -5 V  
A
S
Forward Transconductance  
VDS = -5 V, ID = -4 A  
9
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
VDS = -10 V, VGS = 0 V  
f = 1.0 MHz  
640  
180  
90  
pF  
pF  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
VDD = -10 V, ID = -1 A  
11  
19  
20  
30  
42  
55  
10  
ns  
ns  
V
GS = -4.5 V, RGEN = 6 Ω  
26  
ns  
35  
ns  
Qg  
V
DS = -10 V, ID = -4 A  
7.2  
1.7  
1.6  
nC  
nC  
nC  
VGS = -4.5 V,  
Qgs  
Qgd  
Drain-Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
-1.3  
-1.2  
A
V
VSD  
Drain-Source Diode Forward Voltage VGS = 0 V, IS = -1.3 A  
(Note 2)  
-0.75  
Notes:  
1ꢀ RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface  
of the drain pinsꢀ RθJC is guaranteed by design while RθCA is determined by the user's board designꢀ  
a) 78° C/W when mounted on a 1ꢀ0 in2 pad of 2 ozꢀ copperꢀ  
b) 156° C/W when mounted on a minimum pad of 2 ozꢀcopperꢀ  
2ꢀ Pulse Test: Pulse Width 300 µs, Duty Cycle 2ꢀ0%  
Si3443DV, REV A  
Typical Characteristics  
1.6  
1.4  
1.2  
1
20  
VGS = -4.5V  
-3.5V  
-3.0V  
VGS = -2.5V  
15  
-2.5V  
-3.0V  
10  
-3.5V  
-2.0V  
-4.0V  
-4.5V  
5
-1.5V  
0
0.8  
0
1
2
3
4
5
0
4
8
12  
16  
20  
- ID, DRAIN CURRENT (A)  
-VDS, DRAIN-SOURCE VOLTAGE (V)  
Figure 1ꢀ On-Region Characteristicsꢀ  
Figure 2ꢀ On-Resistance Variation  
with Drain Current and Gate Voltageꢀ  
1.5  
1.4  
1.3  
1.2  
1.1  
1
0.25  
0.2  
0.15  
0.1  
0.05  
0
ID = - 4A  
GS = - 4.5V  
ID = -2A  
V
TA = 125oC  
TA = 25oC  
0.9  
0.8  
0.7  
1
2
3
4
5
-50  
-25  
0
25  
50  
75  
100  
125  
150  
-VGS, GATE TO SOURCE VOLTAGE (V)  
TJ, JUNCTION TEMPERATURE (oC)  
Figure 3ꢀ On-Resistance Variation  
with Temperatureꢀ  
Figure 4ꢀ On-Resistance Variation  
with Gate-to-Source Voltageꢀ  
100  
10  
TA = -55oC  
VGS = 0V  
VDS = -5V  
25oC  
125oC  
10  
1
8
6
4
2
0
T
= 125oC  
25oC  
-55oC  
0.1  
0.01  
0.001  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
0.4  
0.8  
1.2  
1.6  
2
2.4  
-VSD, BODY DIODE FORWARD VOLTAGE (V)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5ꢀ Transfer Characteristicsꢀ  
Figure 6ꢀ Body Diode Forward Voltage  
Variation with Source Current  
and Temperatureꢀ  
Si3443DV, REV A  
Typical Characteristics (continued)  
5
1250  
1000  
750  
500  
250  
0
f = 1 MHz  
GS = 0 V  
VDS = -5V  
-10V  
-15V  
ID = -4A  
V
4
3
2
1
0
CISS  
COSS  
CRSS  
0
2
4
6
8
10  
0
5
10  
15  
20  
Qg, GATE CHARGE (nC)  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7ꢀ Gate-Charge Characteristics  
Figure 8ꢀ Capacitance Characteristics  
100  
10  
5
4
3
2
1
SINGLE PULSE  
R
θJA = 156oC/W  
TA = 25oC  
100µs  
RDS(ON) LIMIT  
1ms  
10ms  
100ms  
1s  
DC  
1
VGS= -4.5V  
SINGLE PULSE  
RθJA= 156oC/W  
TA= 25oC  
0.1  
0.01  
0
0.1  
1
10  
100  
0.1  
1
10  
100  
1000  
-VDS, DRAIN-SOURCE VOLTAGE (V)  
SINGLE PULSE TIME (SEC)  
Figure 9ꢀ Maximum Safe Operating Area  
Figure 10ꢀ Single Pulse Maximum  
Power Dissipation  
1
D = 0.5  
0.2  
0.5  
R
(t) = r(t) * R  
θJA  
R
θJA  
= 156°C/W  
θJA  
0.2  
0.1  
0.1  
0.05  
P(pk)  
t
0.05  
1
t
2
0.02  
0.01  
T
- T = P * R  
(t)  
θJA  
J
A
0.02  
0.01  
Duty Cycle, D = t / t  
1
2
Single Pulse  
0.005  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
300  
t
1
, TIME (sec)  
Figure 11ꢀ Transient Thermal Response Curveꢀ  
Thermal characterization performed using the conditions described in Note 1bꢀ  
Transient themal response will change depending on the circuit board designꢀ  
Si3443DV, REV A  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
PACMAN™  
POP™  
PowerTrench  
QFET™  
QS™  
QT Optoelectronics™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
Star* Power™  
Stealth™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
FAST  
FASTr™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MICROWIRE™  
OPTOLOGIC™  
OPTOPLANAR™  
ACEx™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DenseTrench™  
DOME™  
UltraFET  
VCX™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H1  

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