FQD16N25CTF_12 [FAIRCHILD]

250V N-Channel MOSFET; 250V N沟道MOSFET
FQD16N25CTF_12
型号: FQD16N25CTF_12
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

250V N-Channel MOSFET
250V N沟道MOSFET

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中文:  中文翻译
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September 2012  
®
QFET  
FQD16N25C  
250V N-Channel MOSFET  
tm  
Features  
Description  
16A, 250V, RDS(on) = 0.27Ω @VGS = 10 V  
Low gate charge ( typical 41 nC)  
Low Crss ( typical 68 pF)  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
RoHS compliant  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These devices are well suited for high  
efficiency switching DC/DC converters, switch mode power  
supplies, DC-AC converters for uninterrupted power supplies  
and motor controls.  
D
D
G
D-PAK  
FQD Series  
G
S
S
Absolute Maximum Ratings  
Symbol  
Parameter  
FQD16N25C  
Units  
V
VDSS  
ID  
Drain-Source Voltage  
250  
16  
Drain Current  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
- Pulsed  
A
10.1  
64  
A
(Note 1)  
IDM  
Drain Current  
A
VGSS  
EAS  
IAR  
Gate-Source Voltage  
± 30  
432  
V
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
16  
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
Power Dissipation (TC = 25°C)  
160  
mJ  
V/ns  
W
5.5  
160  
- Derate above 25°C  
1.28  
-55 to +150  
W/°C  
°C  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
Maximum lead temperature for soldering purposes,  
1/8" from case for 5 seconds  
300  
°C  
Thermal Characteristics  
Symbol  
Parameter  
FQD16N25C  
Units  
°C/W  
RθJC  
RθJA  
Thermal Resistance, Junction-to-Case  
0.78  
110  
Thermal Resistance, Junction-to-Ambient  
°C/W  
©2012 Fairchild Semiconductor Corporation  
FQD16N25C Rev. C0  
1
www.fairchildsemi.com  
Package Marking and Ordering Information  
Device Marking  
FQD16N25C  
Device  
Package  
D-PAK  
Reel Size  
380mm  
Tape Width  
16mm  
Quantity  
2,500  
FQD16N25CTM  
FQD16N25CTF  
FQD16N25C  
D-PAK  
380mm  
16mm  
2,000  
Electrical Characteristics  
T
= 25°C unless otherwise noted  
C
Symbol  
Parameter  
Test Conditions  
Min  
Typ Max Units  
Off Characteristics  
BVDSS  
Drain-Source Breakdown Voltage  
VGS = 0 V, ID = 250 μA  
250  
--  
--  
--  
V
ΔBVDSS  
ΔTJ  
/
Breakdown Voltage Temperature Coefficient ID = 250 μA, Referenced to 25°C  
--  
0.31  
V/°C  
IDSS  
Zero Gate Voltage Drain Current  
VDS = 250 V, VGS = 0 V  
VDS = 200 V, TC = 125°C  
VGS = 30 V, VDS = 0 V  
VGS = -30 V, VDS = 0 V  
--  
--  
--  
--  
--  
--  
--  
--  
10  
μA  
μA  
nA  
nA  
100  
100  
-100  
IGSSF  
IGSSR  
Gate-Body Leakage Current, Forward  
Gate-Body Leakage Current, Reverse  
On Characteristics  
VGS(th)  
RDS(on)  
gFS  
Gate Threshold Voltage  
VDS = VGS, ID = 250 μA  
2.0  
--  
--  
4.0  
0.27  
--  
V
Ω
S
Static Drain-Source On-Resistance  
Forward Transconductance  
VGS = 10 V, ID = 8A  
0.22  
10.5  
VDS = 40 V, ID =8 A  
(Note 4)  
--  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
VDS = 25 V, VGS = 0 V,  
f = 1.0 MHz  
--  
--  
--  
830  
170  
68  
1080  
220  
89  
pF  
pF  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics  
td(on) Turn-On Delay Time  
tr  
td(off)  
tf  
VDD = 125 V, ID = 16A,  
RG = 25 Ω  
--  
--  
--  
--  
--  
--  
--  
ns  
ns  
15  
130  
135  
105  
41  
40  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
270  
280  
220  
ns  
(Note 4, 5)  
ns  
Qg  
VDS = 200 V, ID = 16A,  
VGS = 10 V  
nC  
nC  
nC  
53.5  
--  
Qgs  
Qgd  
5.6  
(Note 4, 5)  
--  
22.7  
Drain-Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
Maximum Pulsed Drain-Source Diode Forward Current  
--  
--  
--  
--  
--  
--  
--  
16  
64  
1.5  
--  
A
A
ISM  
VSD  
trr  
Drain-Source Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0 V, IS = 16 A  
--  
V
VGS = 0 V, IS = 16 A,  
260  
2.47  
ns  
dIF / dt = 100 A/μs  
(Note 4)  
Qrr  
Reverse Recovery Charge  
--  
μC  
NOTES:  
1. Repetitive Rating : Pulse width limited by maximum junction temperature  
2. L = 2.7mH, I = 16A, V = 50V, R = 25 Ω, Starting T = 25°C  
AS  
DD  
G
J
3. I 16A, di/dt 300A/μs, V BV Starting T = 25°C  
DSS, J  
SD  
DD  
4. Pulse Test : Pulse width 300μs, Duty cycle 2%  
5. Essentially independent of operating temperature  
2
www.fairchildsemi.com  
FQD16N25C Rev. C0  
Typical Performance Characteristics  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
VGS  
Top :  
15.0 V  
10.0 V  
8.0 V  
7.0 V  
6.5 V  
6.0 V  
5.5 V  
5.0 V  
101  
101  
150oC  
Bottom : 4.5 V  
25oC  
-55oC  
100  
100  
Notes :  
1. 250s Pulse Test  
2. TC = 25  
Notes :  
1. VDS = 40V  
2. 250s Pulse Test  
-1  
-1  
10  
10  
-1  
100  
101  
2
4
6
8
10  
10  
VGS, Gate-Source Voltage [V]  
VDS, Drain-Source Voltage [V]  
Figure 3. On-Resistance Variation vs.  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current  
and Temperatue  
1.5  
101  
1.0  
VGS = 10V  
100  
0.5  
150  
25∩  
VGS = 20V  
Notes :  
1. VGS = 0V  
Note : T = 25  
2. 250s Pulse Test  
J
-1  
0.0  
10  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
1.8  
0
10  
20  
30  
40  
50  
VSD, Source-Drain voltage [V]  
ID, Drain Current [A]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
3000  
12  
C
C
C
iss = Cgs + Cgd (Cds = shorted)  
oss = Cds + Cgd  
rss = Cgd  
VDS = 50V  
2500  
2000  
1500  
1000  
500  
10  
VDS = 125V  
VDS = 200V  
8
C
iss  
6
4
C
oss  
C
rss  
Notes :  
1. VGS = 0 V  
2. f = 1 MHz  
2
Note : ID = 15.6A  
0
10  
0
-1  
100  
101  
0
10  
20  
30  
40  
50  
QG, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
3
www.fairchildsemi.com  
FQD16N25C Rev. C0  
Typical Performance Characteristics (Continued)  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On-Resistance Variation  
vs. Temperature  
1.2  
1.1  
1.0  
3.0  
2.5  
2.0  
1.5  
1.0  
Notes :  
1. VGS = 0 V  
0.9  
Notes :  
1. VGS = 10 V  
2. ID = 8.9 A  
0.5  
2. ID = 250 A  
0.0  
-100  
0.8  
-100  
-50  
0
50  
100  
150  
200  
-50  
0
50  
100  
150  
200  
TJ, Junction Temperature [oC]  
T, Junction Temperature [oC]  
J
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs. Case Temperature  
20  
15  
10  
5
Operation in This Area  
is Limited by R DS(on)  
102  
10 μs  
100 μs  
1ms  
101  
100  
10-1  
10ms  
100ms  
DC  
* Notes :  
1. TC = 25 o  
2. TJ = 150 o  
3. Single Pulse  
C
C
0
25  
50  
75  
100  
125  
150  
100  
101  
102  
TC, Case Temperature [oC]  
VDS, Drain-SourceVoltage[V]  
Figure 11. Transient Thermal Response Curve  
100  
D=0.5  
0.2  
10-1  
0.1  
0.05  
PDM  
0.02  
0.01  
t1  
t2  
* Notes :  
1. Z? (t) = 0.78 0C/W Max.  
10-2  
JC  
single pulse  
2. Duty Factor, D=t1/t2  
3. TJM - TC = PDM * Z? (t)  
JC  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
t1, Square Wave Pulse Duration [sec]  
4
www.fairchildsemi.com  
FQD16N25C Rev. C0  
Gate Charge Test Circuit & Waveform  
Resistive Switching Test Circuit & Waveforms  
Unclamped Inductive Switching Test Circuit & Waveforms  
5
www.fairchildsemi.com  
FQD16N25C Rev. C0  
Peak Diode Recovery dv/dt Test Circuit & Waveforms  
6
www.fairchildsemi.com  
FQD16N25C Rev. C0  
Mechanical Dimensions  
D-PAK  
Dimensions in Millimeters  
7
www.fairchildsemi.com  
FQD16N25C Rev. C0  
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Rev. I61  
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8
FQD16N25C Rev. C0  

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