FDS3890L86Z [FAIRCHILD]

Power Field-Effect Transistor, 4.7A I(D), 80V, 0.044ohm, 2-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, SO-8;
FDS3890L86Z
型号: FDS3890L86Z
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Power Field-Effect Transistor, 4.7A I(D), 80V, 0.044ohm, 2-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, SO-8

开关 脉冲 光电二极管 晶体管
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中文:  中文翻译
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February 2001  
FDS3890  
80V N-Channel Dual PowerTrench MOSFET  
General Description  
Features  
This N-Channel MOSFET has been designed  
specifically to improve the overall efficiency of DC/DC  
converters using either synchronous or conventional  
switching PWM controllers.  
4.7 A, 80 V.  
RDS(ON) = 44 m@ VGS = 10 V  
DS(ON) = 50 m@ VGS = 6 V  
R
Fast switching speed  
These MOSFETs feature faster switching and lower  
gate charge than other MOSFETs with comparable  
RDS(ON) specifications. The result is a MOSFET that is  
easy and safer to drive (even at very high frequencies),  
and DC/DC power supply designs with higher overall  
efficiency.  
High performance trench technology for extremely  
low RDS(ON)  
High power and current handling capability  
D1  
D1  
5
6
7
8
4
3
2
1
D2  
Q1  
Q2  
D2  
G1  
S1  
SO-8  
G2  
S2  
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
80  
V
V
A
VGSS  
Gate-Source Voltage  
± 20  
ID  
Drain Current – Continuous  
– Pulsed  
(Note 1a)  
4.7  
20  
Power Dissipation for Dual Operation  
Power Dissipation for Single Operation  
2
1.6  
PD  
W
(Note 1a)  
(Note 1b)  
(Note 1c)  
1.0  
0.9  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +175  
°C  
Thermal Characteristics  
°C/W  
°C/W  
Thermal Resistance, Junction-to-Ambient  
(Note 1a)  
(Note 1)  
78  
40  
RθJA  
Thermal Resistance, Junction-to-Case  
RθJC  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
FDS3890  
FDS3890  
13’’  
12mm  
2500 units  
FDS3890 Rev B(W)  
2001 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Drain-Source Avalanche Ratings (Note 2)  
WDSS  
IAR  
Single Pulse Drain-Source  
Avalanche Energy  
Maximum Drain-Source Avalanche  
Current  
VDD = 40 V, ID = 4.7 A  
175  
4.7  
mJ  
A
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage  
80  
V
VGS = 0 V, ID = 250 µA  
BVDSS  
TJ  
Breakdown Voltage Temperature  
Coefficient  
86  
ID = 250 µA, Referenced to 25°C  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VDS = 64 V,  
VGS = 20 V,  
VGS = –20 V  
VGS = 0 V  
VDS = 0 V  
VDS = 0 V  
1
µA  
nA  
nA  
IGSSF  
IGSSR  
100  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
2
2.3  
–6  
4
V
VDS = VGS, ID = 250 µA  
VGS(th)  
TJ  
Gate Threshold Voltage  
Temperature Coefficient  
ID = 250 µA, Referenced to 25°C  
mV/°C  
mΩ  
RDS(on)  
Static Drain–Source  
On–Resistance  
VGS = 10 V,  
VGS = 6.0 V,  
ID = 4.7 A  
ID = 4.4 A  
34  
37  
60  
44  
50  
82  
VGS = 10 V, ID = 4.7 A, TJ = 125°C  
ID(on)  
gFS  
On–State Drain Current  
VGS = 10 V,  
VDS = 10 V,  
VDS = 5 V  
ID = 4.7 A  
20  
A
S
Forward Transconductance  
24  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
1180  
171  
50  
pF  
pF  
pF  
VDS = 40 V,  
f = 1.0 MHz  
V GS = 0 V,  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
11  
8
20  
16  
50  
25  
35  
ns  
ns  
VDD =40 V,  
VGS = 10 V,  
ID = 1 A,  
RGEN = 6 Ω  
26  
12  
25  
4.5  
5.8  
ns  
ns  
Qg  
Qgs  
Qgd  
nC  
nC  
nC  
V
V
DS = 40 V,  
GS = 10 V  
ID = 4.7 A,  
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
1.3  
1.2  
A
V
Drain–Source Diode Forward  
VSD  
V
GS = 0 V, IS = 1.3 A  
(Note 2)  
0.74  
Voltage  
Notes:  
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a) 78°C/W when  
mounted on a 1in2  
pad of 2 oz copper  
b) 125°C/W when  
mounted on a .04 in2  
pad of 2 oz copper  
c) 135°C/W when mounted on a  
minimum pad.  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%  
FDS3890 Rev B(W)  
Typical Characteristics  
2
1.8  
1.6  
1.4  
1.2  
1
20  
VGS = 10V 5.0V  
4.0V  
16  
12  
8
VGS = 4.0V  
4.5V  
5.0V  
6.0V  
10V  
3.5V  
4
0.8  
0
0
4
8
12  
16  
20  
0
1
2
3
4
175  
5
ID, DRAIN CURRENT (A)  
VDS, DRAIN-SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
0.1  
2.2  
ID = 2.4 A  
ID = 4.7A  
VGS = 10V  
1.8  
1.4  
1
0.075  
0.05  
0.025  
0
TA = 125oC  
TA = 25oC  
0.6  
0.2  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
2
4
6
8
10  
TJ, JUNCTION TEMPERATURE (oC)  
V
GS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
100  
20  
16  
12  
8
VGS = 0V  
VDS = 5V  
10  
1
TA = 125oC  
25oC  
25oC  
-55oC  
0.1  
TA = 125oC  
0.01  
0.001  
4
-55oC  
0
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
1
2
3
4
V
SD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDS3890 Rev B(W)  
Typical Characteristics  
10  
2000  
1500  
1000  
500  
0
f = 1MHz  
VGS = 0 V  
ID = 4.7A  
VDS = 10V  
8
20V  
40V  
CISS  
6
4
2
0
COSS  
CRSS  
0
6
12  
18  
24  
30  
0
20  
40  
60  
80  
Qg, GATE CHARGE (nC)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
40  
30  
20  
10  
0
SINGLE PULSE  
RθJA = 135°C/W  
TA = 25°C  
RDS(ON) LIMIT  
100  
s
µ
10  
1
1ms  
10ms  
100ms  
1s  
10s  
DC  
VGS = 10V  
SINGLE PULSE  
RθJA = 135oC/W  
0.1  
0.01  
T
A = 25oC  
0.1  
1
10  
100  
0.01  
0.1  
1
10  
100  
VDS, DRAIN-SOURCE VOLTAGE (V)  
t1, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RθJA(t) = r(t) + RθJA  
0.2  
RθJA = 135°C/W  
0.1  
0.1  
0.05  
P(pk)  
0.02  
0.01  
t1  
0.01  
t2  
SINGLE PULSE  
TJ - TA = P * RθJA(t)  
Duty Cycle, D = t1 / t2  
0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1c.  
Transient thermal response will change depending on the circuit board design.  
FDS3890 Rev B(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
OPTOPLANAR™  
PACMAN™  
POP™  
PowerTrench  
QFET™  
QS™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
FAST  
FASTr™  
FRFET™  
GlobalOptoisolator™  
GTO™  
ACEx™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DenseTrench™  
DOME™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MICROWIRE™  
OPTOLOGIC™  
QT Optoelectronics™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
Stealth™  
UltraFET  
VCX™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H2  

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