FDP16N50U [FAIRCHILD]

N-Channel UniFETTM Ultra FRFET MOSFET; N沟道UniFETTM超FRFET MOSFET
FDP16N50U
型号: FDP16N50U
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

N-Channel UniFETTM Ultra FRFET MOSFET
N沟道UniFETTM超FRFET MOSFET

文件: 总9页 (文件大小:826K)
中文:  中文翻译
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April 2013  
FDP16N50U / FDPF16N50UT  
N-Channel UniFETTM Ultra FRFETTM MOSFET  
500 V, 15 A, 480 m  
Features  
Description  
R
DS(on) = 370 m( Typ.) @ VGS = 10 V, ID = 7.5 A  
UniFETTM MOSFET is Fairchild Semiconductor®’s high voltage MOSFET  
family based on planar stripe and DMOS technology. This MOSFET is  
tailored to reduce on-state resistance, and to provide better switching  
performance and higher avalanche energy strength. UniFET Ultra  
FRFETTM MOSFET has much superior body diode reverse recovery  
performance. Its trr is less than 50nsec and the reverse dv/dt immunity is  
20V/nsec while normal planar MOSFETs have over 200nsec and 4.5V/  
nsec respectively. Therefore UniFET Ultra FRFET MOSFET can remove  
additional component and improve system reliability in certain  
applications that require performance improvement of the MOSFET’s  
body diode. This device family is suitable for switching power converter  
applications such as power factor correction (PFC), flat panel display  
(FPD) TV power, ATX and electronic lamp ballasts.  
Low Gate Charge (Typ. 32 nC)  
Low Crss (Typ. 20 pF)  
100% Avalanche Tested  
Improved dv/dt Capability  
RoHS Compliant  
Applications  
• LCD/LED/PDP TV  
• Lighting  
• Uninterruptible Power Supply  
D
G
D
S
G
D
G
S
TO-220F  
TO-220  
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted*  
Symbol  
VDSS  
VGSS  
Parameter  
FDP16N50U FDPF16N50UT Unit  
Drain to Source Voltage  
Gate to Source Voltage  
500  
±30  
V
V
-Continuous (TC = 25oC)  
-Continuous (TC = 100oC)  
- Pulsed  
15  
9
15*  
9*  
ID  
Drain Current  
A
IDM  
Drain Current  
(Note 1)  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
60  
60*  
A
mJ  
A
EAS  
IAR  
Single Pulsed Avalanche Energy  
Avalanche Current  
610  
15  
EAR  
dv/dt  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
20  
mJ  
V/ns  
W
W/oC  
oC  
20  
(TC = 25oC)  
- Derate above 25oC  
200  
38.5  
0.3  
PD  
Power Dissipation  
1.59  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
300  
Maximum Lead Temperature for Soldering Purpose,  
1/8” from Case for 5 Seconds  
oC  
*Drain current limited by maximum junction temperature  
Thermal Characteristics  
Symbol  
Parameter  
FDP16N50U FDPF16N50UT Unit  
RJC  
RCS  
RJA  
Thermal Resistance, Junction to Case, Max.  
Thermal Resistance, Junction to Ambient, Typ.  
Thermal Resistance, Junction to Ambient, Max.  
0.63  
0.5  
3.3  
-
oC/W  
62.5  
62.5  
1
www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
Package Marking and Ordering Information TC = 25oC unless otherwise noted  
Device Marking  
FDP16N50U  
Device  
Package  
TO-220  
Reel Size  
Tape Width  
Quantity  
FDP16N50U  
FDPF16N50UT  
-
-
-
-
50  
50  
FDPF16N50UT  
TO-220F  
Electrical Characteristics  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250A, VGS = 0V, TJ = 25oC  
500  
-
-
-
-
V
BVDSS  
TJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250A, Referenced to 25oC  
0.5  
V/oC  
V
DS = 500V, VGS = 0V  
-
-
-
-
-
-
25  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Body Leakage Current  
A  
VDS = 400V, TC = 125oC  
250  
VGS = ±30V, VDS = 0V  
±100  
nA  
On Characteristics  
VGS(th)  
RDS(on)  
gFS  
Gate Threshold Voltage  
VGS = VDS, ID = 250A  
VGS = 10V, ID = 7.5A  
VDS = 40V, ID = 7.5A  
3.0  
-
-
5.0  
0.48  
-
V
S
Static Drain to Source On Resistance  
Forward Transconductance  
0.37  
23  
(Note 4)  
-
Dynamic Characteristics  
Ciss  
Input Capacitance  
-
-
-
-
-
1495  
235  
20  
1945  
310  
30  
pF  
pF  
pF  
nC  
nC  
VDS = 25V, VGS = 0V  
f = 1MHz  
Coss  
Crss  
Qg(tot)  
Qgs  
Output Capacitance  
Reverse Transfer Capacitance  
Total Gate Charge at 10V  
Gate to Source Gate Charge  
32  
45  
VDS = 400V, ID = 15A  
VGS = 10V  
8.5  
-
Qgd  
Gate to Drain “Miller” Charge  
-
14  
-
nC  
(Note 4, 5)  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
-
-
-
-
40  
150  
65  
90  
ns  
ns  
ns  
ns  
VDD = 250V, ID = 15A  
310  
140  
170  
R
G = 25  
80  
(Note 4, 5)  
Drain-Source Diode Characteristics  
IS  
Maximum Continuous Drain to Source Diode Forward Current  
Maximum Pulsed Drain to Source Diode Forward Current  
-
-
-
-
-
-
-
15  
60  
1.6  
-
A
A
ISM  
VSD  
trr  
Drain to Source Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0V, ISD = 15A  
-
V
65  
0.1  
ns  
C  
VGS = 0V, ISD = 15A  
dIF/dt = 100A/s  
(Note 4)  
Qrr  
Reverse Recovery Charge  
-
Notes:  
1. Repetitive Rating: Pulse width limited by maximum junction temperature  
2. L = 5.5mH, I = 15A, V = 50V, R = 25, Starting T = 25C  
AS  
DD  
G
J
3. I 16A, di/dt 200A/s, V BV  
, Starting T = 25C  
SD  
DD  
DSS  
J
4. Pulse Test: Pulse width 300s, Duty Cycle 2%  
5. Essentially Independent of Operating Temperature Typical Characteristics  
www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
2
Typical Performance Characteristics  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
VGS  
2
10  
Top:  
15.0V  
10.0V  
8.0V  
7.0V  
6.5V  
6.0V  
1
10  
Bottom: 5.5V  
o
1
10  
150 C  
o
0
10  
25 C  
* Notes :  
1. 250s Pulse Test  
* Notes :  
-1  
10  
1. VDS = 40V  
2. 250s Pulse Test  
o
2. TC = 25 C  
0
10  
-1  
10  
0
10  
1
10  
2
4
6
8
10  
12  
V , Drain-Source Voltage [V]  
V , Gate-SourceVoltage[V]  
DS  
GS  
Figure 3. On-Resistance Variation vs.  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current  
and Temperature  
0.6  
0.5  
VGS = 10V  
1
10  
0.4  
0.3  
0.2  
V
GS = 20V  
o
150 C  
o
25 C  
* Notes :  
1. VGS = 0V  
o
* Note: T = 25 C  
2. 250s Pulse Test  
J
0
10  
0
5
10  
15  
20  
25  
30  
35  
40  
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4  
ID, Drain Current [A]  
V , Source-Drain voltage [V]  
SD  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
4000  
12  
Ciss = Cgs + Cgd (Cds = shorted)  
C
oss = Cds + C  
gd  
C
rss = C  
gd  
V
DS = 100V  
DS = 250V  
DS = 400V  
10  
8
3000  
2000  
1000  
0
V
C
oss  
V
C
iss  
6
* Note :  
1. VGS = 0 V  
4
C
rss  
2. f =1MHz  
2
* Note: ID= 15A  
30  
-1  
0
1
10  
10  
10  
0
V , Drain-Source Voltage [V]  
0
10  
20  
40  
DS  
www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
3
Typical Performance Characteristics (Continued)  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. Maximum Safe Operating Area  
- FDPF16N50UT  
1.2  
1.1  
1.0  
2
10  
10 s  
100 s  
1 ms  
10 ms  
100 ms  
DC  
1
10  
Operation in This Area  
is Limited by R DS(on)  
0
10  
* Notes :  
1. VGS = 0 V  
0.9  
0.8  
-1  
* Notes :  
10  
1. T = 25 oC  
2. ID= 250A  
C
2. T = 150 oC  
J
3. SinglePulse  
-2  
10  
-100  
-50  
0
50  
100  
150  
200  
0
10  
1
10  
2
10  
T, Junction Temperature [oC]  
J
V , Drain-Source Voltage [V]  
DS  
Figure 9. Maximum Drain Current  
vs. Case Temperature - FDPF16N50UT  
15  
10  
5
0
25  
50  
75  
100  
125  
150  
TC, Case Temperature [oC]  
Figure 10. Transient Thermal Response Curve - FDPF16N50UT  
D=0.5  
100  
0.2  
0.1  
0.05  
PDM  
10-1  
t1  
0.02  
0.01  
t2  
* Notes :  
o
1. ZJC(t) = 3.3 C/W Max.  
2. Duty Factor, D=t1/t2  
3. TJM - TC = PDM * ZJC(t)  
10-2  
10-5  
single pulse  
10-4  
10-3  
10-2  
10-1  
100  
101  
t
Square Wave Pulse Duration [sec]  
www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
4
Gate Charge Test Circuit & Waveform  
Resistive Switching Test Circuit & Waveforms  
Unclamped Inductive Switching Test Circuit & Waveforms  
www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
5
Peak Diode Recovery dv/dt Test Circuit & Waveforms  
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www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
6
Mechanical Dimensions  
TO-220B03  
Dimensions in Millimeters  
www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
7
Mechanical Dimensions  
TO-220M03  
Dimensions in Millimeters  
www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
6
TRADEMARKS  
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not  
intended to be an exhaustive list of all such trademarks.  
2Cool™  
AccuPower™  
AX-CAP *  
BitSiC™  
Build it Now™  
CorePLUS™  
CorePOWER™  
CROSSVOLT™  
CTL™  
Current Transfer Logic™  
DEUXPEED  
Dual Cool™  
EcoSPARK  
EfficentMax™  
ESBC™  
FPS™  
F-PFS™  
FRFET  
Global Power Resource  
Green Bridge™  
Green FPS™  
Green FPS™ e-Series™  
Gmax™  
GTO™  
IntelliMAX™  
ISOPLANAR™  
Sync-Lock™  
®*  
®
tm  
®
®
®
PowerTrench  
PowerXS™  
Programmable Active Droop™  
QFET  
QS™  
Quiet Series™  
RapidConfigure™  
SM  
TinyBoost™  
TinyBuck™  
TinyCalc™  
®
®
TinyLogic  
TINYOPTO™  
TinyPower™  
TinyPWM™  
TinyWire™  
®
Marking Small Speakers Sound Louder Saving our world, 1mW/W/kW at a time™  
®
TranSiC  
®
and Better™  
MegaBuck™  
MICROCOUPLER™  
MicroFET™  
MicroPak™  
MicroPak2™  
MillerDrive™  
MotionMax™  
mWSaver™  
OptoHiT™  
SignalWise™  
SmartMax™  
TriFault Detect™  
TRUECURRENT *  
μSerDes™  
®
SMART START™  
Solutions for Your Success™  
®
®
SPM  
®
STEALTH™  
SuperFET  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
Fairchild  
®
®
UHC  
®
Fairchild Semiconductor  
FACT Quiet Series™  
Ultra FRFET™  
UniFET™  
VCX™  
VisualMax™  
VoltagePlus™  
XS™  
®
FACT  
FAST  
®
®
®
OPTOLOGIC  
OPTOPLANAR  
SupreMOS  
SyncFET™  
FastvCore™  
FETBench™  
®
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE  
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY  
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.  
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY  
THEREIN, WHICH COVERS THESE PRODUCTS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE  
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used here in:  
1. Life support devices or systems are devices or systems which, (a) are  
intended for surgical implant into the body or (b) support or sustain life,  
and (c) whose failure to perform when properly used in accordance with  
instructions for use provided in the labeling, can be reasonably  
expected to result in a significant injury of the user.  
2. A critical component in any component of a life support, device, or  
system whose failure to perform can be reasonably expected to cause  
the failure of the life support device or system, or to affect its safety or  
effectiveness.  
ANTI-COUNTERFEITING POLICY  
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website,  
www.Fairchildsemi.com, under Sales Support.  
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their  
parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed  
application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the  
proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild  
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committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Datasheet contains the design specifications for product development. Specifications  
may change in any manner without notice.  
Advance Information  
Formative / In Design  
Datasheet contains preliminary data; supplementary data will be published at a later  
date. Fairchild Semiconductor reserves the right to make changes at any time without  
notice to improve design.  
Preliminary  
First Production  
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to  
make changes at any time without notice to improve the design.  
No Identification Needed  
Obsolete  
Full Production  
Datasheet contains specifications on a product that is discontinued by Fairchild  
Semiconductor. The datasheet is for reference information only.  
Not In Production  
Rev. I64  
www.fairchildsemi.com  
©2009 Fairchild Semiconductor Corporation  
FDP16N50U / FDPF16N50UT Rev. C0  
9

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