AN4999 [ETC]

Turn-on of thyristors in parallel ; 导通并联晶闸管\n
AN4999
型号: AN4999
厂家: ETC    ETC
描述:

Turn-on of thyristors in parallel
导通并联晶闸管\n

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AN4999  
Turn-On Performance Of Thyristors In Parallel  
Application Note  
Replaces September 2000 version, AN4999-4.0  
AN4999-4.1 July 2002  
The selection of thyristors for connection in parallel in high power  
circuits follows many of the same rules as used for rectifier  
diodes. The basic problem is to ensure that the devices share  
the load current as evenly as possible. The sharing calculations  
have to take account of the need to operate over a range of  
currents and device heatsink temperatures and with devices with  
different on-state characteristics. In the discussion below it is  
assumed that the diodes and thyristors are used in a mains  
rectification role, typically at 50 or 60Hz.  
device. Unfortunately, reactors are bulky and often expensive  
so designers usually prefer hard parallelingi.e. direct connection  
to the common busbars without reactors. However, even short  
busbars have some inductance and this has to be taken into  
account.  
BASIC REQUIREMENTS FOR PARALLELING  
The basic rules for paralleling rectifier diodes and thyristors in  
the continuous current operating mode are given in standard  
power electronics textbooks and elsewhere. Because devices  
must always be initially selected for continuous operation the  
essential rules are re-stated here.  
For thyristors, this brings the additional problem of needing to  
trigger into conduction every mains cycle. Variations in turn-on  
times can cause late firing of some of the paralleled group,  
effectively reducing the average current in those thyristors.  
Another problem arises when one thyristor turns on much faster  
than the rest, hogging all the current and thus preventing the  
turn-on of the remainder.  
Stage 1 - On-state voltage banding  
Fig 1 shows the idealised on-state characteristics at room  
temperature of 2 rectifier diodes connected in parallel.Assuming  
zero impedance in the interconnection the voltage across each  
device will be the same. At V2 the current in device (1) is I1 and  
in (2) is I2. The total load current Iload is (I1 + I2). Clearly, this  
current mis-sharing could overload one device and underload  
the other. The ideal solution is to have devices with identical  
characteristics but production tolerances do not allow this.  
However, special selections can match device Vf values into  
defined bands. A band width at normal operating current of  
200mV is typical but a width as low as 50mV is possible if lower  
yield and higher cost is acceptable.  
The well known solution to paralleling problems both at turn-on  
and in the fully-on state is to use reactors in series with each  
IC  
Device 1 Device 2  
Tj = 25˚C  
I1  
Note that matching is usually done at room temperature,  
approximately 20 to 25˚C.  
Stage 2 - Heatsinking  
The shape of the Vf characteristic varies with junction  
temperature so that the close Vf banding described above has  
no value if operating junction temperatures are not near-  
equalised. The major determinant here is the heatsink  
performance. Every effort should be made to ensure that the  
heatsink temperature is the same for each device. If possible,  
mount all the devices on the same heatsink close to each other.  
Mounting more than 2 devices in a vertical column of air-natural  
cooled fins can sometimes cause problems.  
I2  
V2  
VF  
Fig 2 shows the Vf curves for a particular device at two junction  
temperatures. Notice that at low currents, below the crossover’  
point, Vf decreases with increase in temperature and above the  
Fig. 1 Idealised on-state characteristics at room  
temperature of two rectifier diodes in parallel  
1/6  
www.dynexsemi.com  
AN4999 Application Note  
2000  
Measured under pulse conditions  
1800  
1
2
3
4
1600  
1400  
1200  
1000  
800  
600  
400  
200  
0
1: Tj = 25˚C min  
2: Tj = 125˚C min  
3: Tj = 25˚C max  
4: Tj = 125˚C max  
0
0.5  
1.0  
1.5  
2
Instantaneous on-state voltage, VT - (V)  
Fig. 2 Thyristor limit on-state characteristics  
Fig. 3 Thyristor cylindrical arrangement  
Anode terminal  
Copper busbar  
A
Copper strips  
Gate trigger  
connections  
Clamp  
K
Cathode terminal  
Copper busbar  
Fig. 4 Typical busbar arrangement - 3 clamped thyristors in parallel (heatsink not shown)  
2/6  
www.dynexsemi.com  
AN4999 Application Note  
crossover point the reverse is true. The maximum and minimum  
of the production spread are shown.  
Gate pulse length has some effect on sharing performance  
but only when the thyristor load current source is low voltage.  
This is particularly true for amplifying gate devices. For example,  
a thyristor switching a 50Hz, 10V rms ac current source is unlikely  
to switch on until about 700us from voltage zero.  
Thus, at low currents without good control, the hotter devices  
will tend to become even hotter . Fortunately, at high currents  
the opposite is true and a self sharing effect takes over.  
t0 t1 t2  
Stage 3 - Busbar connections  
The least considered part of the paralleling exercise is usually  
the interconnections. Unless the conductors linking each device  
to the common power connections are of equal lengths the  
devices will not share. All this in spite of the careful parallel  
banding in stage 1, above. Fig 3 shows diagramatically a  
cylindrical arrangement with equal length connections and,  
clearly, this is not easy to achieve for high current devices. More  
typical is the non-symmetrical arrangement of Fig 4. If tightly  
banded devices are used in such an arrangement poor current  
sharing is the most likely result! Some positions in the connection  
will be seen to be current hoggersand others current shunners.  
Finger voltage  
Device B  
Low voltage supply  
Thyristor forward voltage  
When more than 2 devices are paralleled, experience has shown  
that it is better to have devices spread across a fairly wide Vf  
band. 200mV is about right. The user then fits high Vf devices  
into current hoggerpositions and low Vf ones into current  
shunnerpositions. This approach usually gives a satisfactory  
result.  
Finger voltage  
Device B  
Low voltage supply  
Thyristor forward voltage  
THYRISTORS - CURRENT SHARING AT TURN-ON  
All the procedures described above are also essential for good  
sharing of thyristors at turn-on.The additional requirement is for  
thyristors to turn on as near together in time as possible,  
otherwise the average current in a late turning on thyristor is  
less than in the other (normal speed) devices. Note that turn-on  
problems only occur in a minimum of situations and only for  
some device types.  
Unequal conduction due to delay time variations and gate  
drive performance:  
Even if all the thyristor gates are triggered at the same time,  
variations in delay time will lead to variations in turn-on time.  
Experience has shown that, provided high gate currents are  
used, delay time differences are small for a particular thyristor  
type. Selection on delay time is only necessary for sensitive  
applications.  
Finger voltage points  
At low gate drives the devices turn on adequately but there are  
significant variations in the delay times. As gate currents are  
increased the delay time variations become smaller until an  
optimum gate current is reached where there are no further  
reductions. Similar comments apply regarding gate current rise  
time where further reductions in rise time have no effect.  
On-state voltage Device Device  
V
A
B
Happily, a high current, fast rising gate pulse also gives a good  
thyristor di/dt rating.  
Fig. 5 Finger voltages  
3/6  
www.dynexsemi.com  
AN4999 Application Note  
The other extreme condition is where one thyristor in the  
paralleled batch has an exceptionally low spike voltage. This  
device turns on early and can hog all the current.  
Anode  
Generally, the lower the supply voltage the worse are the  
paralleling problems.  
Pilot  
thyristor  
Main  
thyristor  
In practice, a small increase in busbar inductance in series with  
each thyristor can usually overcome the turn-on problem.  
Gate  
DEVICE SELECTION  
How can devices be selected to overcome paralleling problems?  
The easy solution is to include large series reactors so that mis-  
sharing is negligable, even with unselected devices.  
Cathode  
If this is not possible the following procedures should be adopted:  
Fig. 6  
Maximum effort should be made to equalise busbar lengths.  
This will help both steady state and turn-on sharing.  
This corresponds to about 3V anode to cathode which is the  
minimum needed for turn on of a large thyristor. Clearly, a gate  
pulse width of 10 to 15us is OK for a switched load of several  
hundred volts but a 1ms pulse is needed for a 10V source.  
Ensure that as near as possible the device case temperatures  
are equalised.  
Ensure that a high gate drive current is used (similar to that  
recommended for good di/dt rating).  
Unequal conduction due to transient on-state voltage  
variations:  
Finally, determine the equipment operating current at which  
current sharing is most important. Usually, this is the full load  
operating current but sometimes overload current is more  
important.  
As indicated above, thyristors need a minimum anode to cathode  
voltage to turn on. This is indicated by the well known thyristor  
switching characteristic, Fig 5. The minimum value is sometimes  
known as the finger voltage’  
At this stage a preliminary choice of thyristor should be made  
for continuous operation, assuming a mis-sharing of current  
between devices of, say, 15%:  
It is clear that a group of thyristors connected in parallel with  
different finger voltages and different delay times could present  
a problem for turning on.  
Define mis-sharing factor, ‘m’ as:  
m = (Imax - Imin) x 100%  
Imax  
The problem is sometimes worse when amplifying gate devices  
are used. The amplifying gate thyristor is effectively a main  
thyristor, darlington driven by a pilot thyristor connected between  
anode and gate, Fig 6.  
Where Imax is the current flowing in the highest current device  
and Imin is the current flowing in the lowest current device.  
From the thyristor supplier determine the available Vf  
selections for paralleling at the Tj and current you require.  
Calculation procedures can then be used which input device  
maximum and minimum Vf curves and the device busbar  
connection inductance to determine steady state mis-sharing  
factor.  
When an amplifying gate thyristor is triggered current initially  
flows in the pilot thyristor until enough current is flowing to trigger  
the main device. Then the circuit current transfers to the main  
thyristor. Usually, the initial voltage across the pilot thyristor must  
reach a minimum level to initiate transfer. This minimum level  
appears as a spikeon the Vf waveform. Fig 7 is an example of  
a high spike voltage. Spikevoltage values can vary across a  
batch of devices.  
Finally consider turn-on mis-sharing due to turn-on spike  
voltage variations. This is unusual unless very short busbar  
lengths are used.Also, the problem only affects a few device  
types but if a problem is likely it should be mentioned to the  
supplier in case a selection is needed.  
In a paralleled system, if one of the thyristors has a high spike  
voltage it may be late to turn on and so conduct for only part of  
the half sine wave period. The consequence is a low average  
current. In the worse case the device may fail altogether to turn  
on.  
4/6  
www.dynexsemi.com  
AN4999 Application Note  
CONCLUSION  
can usually be overcome by using slightly longer than normal  
busbars. As a final resort a supplier can select to eliminate  
extreme values of spike voltage. Use of high output gate drive  
is also important.  
The possibility of turn-on mis-sharing of large thyristors in  
parallel is sometimes forgotten. However, if a problem exists it  
Fig. 7 Example of high spike voltage  
5/6  
www.dynexsemi.com  
POWER ASSEMBLY CAPABILITY  
The Power Assembly group was set up to provide a support service for those customers requiring more than the basic  
semiconductor, and has developed a flexible range of heatsink and clamping systems in line with advances in device voltages  
and current capability of our semiconductors.  
We offer an extensive range of air and liquid cooled assemblies covering the full range of circuit designs in general use today.  
The Assembly group offers high quality engineering support dedicated to designing new units to satisfy the growing needs of  
our customers.  
Using the latest CAD methods our team of design and applications engineers aim to provide the Power Assembly Complete  
Solution (PACs).  
HEATSINKS  
The Power Assembly group has its own proprietary range of extruded aluminium heatsinks which have been designed to  
optimise the performance of Dynex semiconductors. Data with respect to air natural, forced air and liquid cooling (with flow  
rates) is available on request.  
For further information on device clamps, heatsinks and assemblies, please contact your nearest sales representative or  
Customer Services.  
http://www.dynexsemi.com  
e-mail: power_solutions@dynexsemi.com  
HEADQUARTERS OPERATIONS  
CUSTOMER SERVICE  
Tel: +44 (0)1522 502753 / 502901. Fax: +44 (0)1522 500020  
DYNEX SEMICONDUCTOR LTD  
Doddington Road, Lincoln.  
SALES OFFICES  
Lincolnshire. LN6 3LF. United Kingdom.  
Tel: +44-(0)1522-500500  
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Germany, Northern Europe, Spain & Rest Of World: Tel: +44 (0)1522 502753 / 502901.  
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North America: Tel: (613) 723-7035. Fax: (613) 723-1518. Toll Free: 1.888.33.DYNEX (39639) /  
Tel: (949) 733-3005. Fax: (949) 733-2986.  
These offices are supported by Representatives and Distributors in many countries world-wide.  
© Dynex Semiconductor 2002 TECHNICAL DOCUMENTATION – NOT FOR RESALE. PRODUCED IN  
UNITED KINGDOM  
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