CEP655N [CET]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
CEP655N
型号: CEP655N
厂家: CHINO-EXCEL TECHNOLOGY    CHINO-EXCEL TECHNOLOGY
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总4页 (文件大小:106K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CEP655N/CEB655N  
CEI655N/CEF655N  
PRELIMINARY  
N-Channel Enhancement Mode Field Effect Transistor  
FEATURES  
Type  
VDSS  
150V  
150V  
150V  
150V  
RDS(ON)  
0.153  
0.153Ω  
0.153Ω  
0.153Ω  
ID  
@VGS  
10V  
CEP655N  
CEB655N  
CEI655N  
CEF655N  
15A  
15A  
15A  
15A d  
10V  
10V  
10V  
D
Super high dense cell design for extremely low RDS(ON)  
High power and current handing capability.  
Lead free product is acquired.  
.
TO-220 & TO-263 & TO-262 package & TO-220F full-pak for through hole.  
G
S
CEB SERIES  
TO-263(DD-PAK)  
CEI SERIES  
TO-262(I2-PAK)  
CEP SERIES  
TO-220  
CEF SERIES  
TO-220F  
ABSOLUTE MAXIMUM RATINGS T = 25 C unless otherwise noted  
c
Limit  
Parameter  
Symbol  
Units  
TO-220/263/262 TO-220F  
150  
Drain-Source Voltage  
VDS  
VGS  
ID  
V
V
Gate-Source Voltage  
±25  
15  
60  
15 d  
60 d  
39  
Drain Current-Continuous  
Drain Current-Pulsed a  
A
e
IDM  
A
Maximum Power Dissipation @ TC = 25 C  
- Derate above 25 C  
83  
W
PD  
0.56  
0.26  
W/ C  
C
Operating and Store Temperature Range  
TJ,Tstg  
-55 to 175  
Thermal Characteristics  
Parameter  
Symbol  
RθJC  
Limit  
Units  
C/W  
C/W  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
1.8  
3.8  
65  
RθJA  
62.5  
This is preliminary information on a new product in development now .  
Details are subject to change without notice .  
Rev 1. 2005.June  
http://www.cetsemi.com  
1
CEP655N/CEB655N  
CEI655N/CEF655N  
Electrical Characteristics T = 25 C unless otherwise noted  
c
4
Parameter  
Off Characteristics  
Symbol  
Test Condition  
Min  
Typ  
Max  
Units  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate Body Leakage Current, Forward  
Gate Body Leakage Current, Reverse  
On Characteristics b  
BVDSS  
IDSS  
VGS = 0V, ID = 250µA  
VDS = 150V, VGS = 0V  
VGS = 25V, VDS = 0V  
VGS = -25V, VDS = 0V  
150  
V
1
µA  
nA  
nA  
IGSSF  
IGSSR  
100  
-100  
Gate Threshold Voltage  
Static Drain-Source  
VGS(th)  
RDS(on)  
gFS  
VGS = VDS, ID = 250µA  
VGS = 10V, ID = 8.2A  
2
4
V
mΩ  
S
118  
5
153  
On-Resistance  
Forward Transconductance  
Dynamic Characteristics c  
Input Capacitance  
VDS = 40V, ID = 8.2A  
Ciss  
Coss  
Crss  
750  
175  
70  
pF  
pF  
pF  
VDS = 25V, VGS = 0V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics c  
Turn-On Delay Time  
td(on)  
tr  
td(off)  
tf  
17  
48  
40  
46  
26  
6
35  
100  
80  
ns  
ns  
VDD = 75V, ID = 15A,  
VGS = 10V, RGEN = 25Ω  
Turn-On Rise Time  
Turn-Off Delay Time  
ns  
Turn-Off Fall Time  
90  
ns  
Total Gate Charge  
Qg  
34  
nC  
nC  
nC  
VDS = 120V, ID = 15A,  
VGS = 10V  
Gate-Source Charge  
Qgs  
Qgd  
Gate-Drain Charge  
12.5  
Drain-Source Diode Characteristics and Maximun Ratings  
f
Drain-Source Diode Forward Current  
Drain-Source Diode Forward Voltage b  
IS  
15  
A
V
VSD  
VGS = 0V, IS = 15A g  
1.5  
Notes :  
a.Repetitive Rating : Pulse width limited by maximum junction temperature .  
b.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2% .  
c.Guaranteed by design, not subject to production testing.  
d.Limited only by maximum temperature allowed .  
e .Pulse width limited by safe operating area .  
f .Full package I  
= 10A .  
S(max)  
g.Full package V test condition I = 10A .  
SD  
S
2
CEP655N/CEB655N  
CEI655N/CEF655N  
50  
30  
24  
18  
12  
6
VGS=10,8,6,4V  
25 C  
40  
30  
20  
-55 C  
TJ=125 C  
10  
0
0
0
1
2
3
4
5
1
2
3
4
5
6
7
VDS, Drain-to-Source Voltage (V)  
VGS, Gate-to-Source Voltage (V)  
Figure 1. Output Characteristics  
Figure 2. Transfer Characteristics  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
1200  
1000  
800  
600  
400  
200  
0
ID=8.2A  
VGS=10V  
C
iss  
C
oss  
C
rss  
-100  
-50  
0
50  
100  
150  
200  
0
5
10  
15  
20  
25  
VDS, Drain-to-Source Voltage (V)  
TJ, Junction Temperature( C)  
Figure 3. Capacitance  
Figure 4. On-Resistance Variation  
with Temperature  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
VDS=VGS  
ID=250µA  
V
GS=0V  
101  
100  
10-1  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
-50 -25  
0
25 50 75 100 125 150  
TJ, Junction Temperature( C)  
VSD, Body Diode Forward Voltage (V)  
Figure 5. Gate Threshold Variation  
with Temperature  
Figure 6. Body Diode Forward Voltage  
Variation with Source Current  
3
CEP655N/CEB655N  
CEI655N/CEF655N  
102  
10  
8
RDS(ON)Limit  
VDS=120V  
ID=15A  
4
100ms  
101  
1ms  
6
10ms  
DC  
4
100  
2
TC=25 C  
TJ=175 C  
Single Pulse  
10-1  
0
100  
101  
102  
103  
0
6
12  
18  
24  
30  
Qg, Total Gate Charge (nC)  
VDS, Drain-Source Voltage (V)  
Figure 7. Gate Charge  
Figure 8. Maximum Safe  
Operating Area  
VDD  
on  
t
toff  
d(off)  
t
r
t
d(on)  
OUT  
RL  
t
f
t
VIN  
90%  
10%  
90%  
D
OUT  
V
V
VGS  
10%  
INVERTED  
RGEN  
G
90%  
50%  
50%  
S
IN  
V
10%  
PULSE WIDTH  
Figure 10. Switching Waveforms  
Figure 9. Switching Test Circuit  
100  
D=0.5  
0.2  
10-1  
0.1  
PDM  
0.05  
t1  
t2  
0.02  
0.01  
1. RθJC (t)=r (t) * RθJC  
2. RθJC=See Datasheet  
3. TJM-TC = P* RθJC (t)  
4. Duty Cycle, D=t1/t2  
Single Pulse  
10-2  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
Square Wave Pulse Duration (sec)  
Figure 11. Normalized Thermal Transient Impedance Curve  
4

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