CEB740G [CET]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
CEB740G
型号: CEB740G
厂家: CHINO-EXCEL TECHNOLOGY    CHINO-EXCEL TECHNOLOGY
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总4页 (文件大小:414K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CEP740G/CEB740G  
CEF740G  
N-Channel Enhancement Mode Field Effect Transistor  
PRELIMINARY  
FEATURES  
Type  
VDSS  
400V  
400V  
400V  
RDS(ON)  
0.55  
0.55Ω  
0.55Ω  
ID  
@VGS  
10V  
CEP740G  
CEB740G  
CEF740G  
10A  
10A  
10A e  
10V  
10V  
D
Super high dense cell design for extremely low RDS(ON)  
.
High power and current handing capability.  
Lead free product is acquired.  
G
S
CEB SERIES  
TO-263(DD-PAK)  
CEP SERIES  
TO-220  
CEF SERIES  
TO-220F  
ABSOLUTE MAXIMUM RATINGS T = 25 C unless otherwise noted  
c
Limit  
Parameter  
Symbol  
Units  
TO-220/263  
TO-220F  
Drain-Source Voltage  
VDS  
VGS  
ID  
400  
V
V
Gate-Source Voltage  
±30  
10  
40  
10 e  
40 e  
40  
Drain Current-Continuous  
Drain Current-Pulsed a  
A
f
IDM  
A
Maximum Power Dissipation @ TC = 25 C  
- Derate above 25 C  
125  
1.0  
W
PD  
0.32  
W/ C  
C
Operating and Store Temperature Range  
TJ,Tstg  
-55 to 150  
Thermal Characteristics  
Parameter  
Symbol  
RθJC  
Limit  
Units  
C/W  
C/W  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
1.0  
3.1  
65  
RθJA  
62.5  
This is preliminary information on a new product in development now .  
Details are subject to change without notice .  
Rev 1. 2007.Nov.  
http://www.cetsemi.com  
1
CEP740G/CEB740G  
CEF740G  
Electrical Characteristics T = 25 C unless otherwise noted  
c
Parameter  
Off Characteristics  
Symbol  
Test Condition  
Min  
Typ  
Max  
Units  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate Body Leakage Current, Forward  
Gate Body Leakage Current, Reverse  
On Characteristics b  
BVDSS  
IDSS  
VGS = 0V, ID = 250µA  
VDS = 400V, VGS = 0V  
VGS = 30V, VDS = 0V  
VGS = -30V, VDS = 0V  
400  
V
50  
µA  
nA  
nA  
IGSSF  
IGSSR  
100  
-100  
Gate Threshold Voltage  
Static Drain-Source  
VGS(th)  
RDS(on)  
gFS  
VGS = VDS, ID = 250µA  
VGS = 10V, ID = 6A  
2
4
V
m  
S
450  
6
550  
On-Resistance  
Forward Transconductance  
Dynamic Characteristics c  
Input Capacitance  
VDS = 50V, ID = 6A  
Ciss  
Coss  
Crss  
1245  
190  
25  
pF  
pF  
pF  
VDS = 25V, VGS = 0V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics c  
Turn-On Delay Time  
td(on)  
tr  
td(off)  
tf  
20  
9
40  
18  
ns  
ns  
VDD = 200V, ID = 10A,  
VGS = 10V, RGEN = 9.1Ω  
Turn-On Rise Time  
Turn-Off Delay Time  
50  
8
100  
16  
ns  
Turn-Off Fall Time  
ns  
Total Gate Charge  
Qg  
35.6  
6.7  
12  
47.3  
nC  
nC  
nC  
VDS = 320V, ID = 10A,  
VGS = 10V  
Gate-Source Charge  
Qgs  
Qgd  
Gate-Drain Charge  
Drain-Source Diode Characteristics and Maximun Ratings  
f
Drain-Source Diode Forward Current  
Drain-Source Diode Forward Voltage b  
IS  
10  
2
A
V
VSD  
VGS = 0V, IS = 10A  
Notes :  
a.Repetitive Rating : Pulse width limited by maximum junction temperature .  
b.Pulse Test : Pulse Width < 300µs, Duty Cycle < 2% .  
c.Guaranteed by design, not subject to production testing.  
d.Limited only by maximum temperature allowed .  
e.Pulse width limited by safe operating area .  
f.Full package I  
= 5.5A .  
S(max)  
2
CEP740G/CEB740G  
CEF740G  
6
5
4
3
2
1
0
18  
15  
12  
9
VGS=10,8,7,6V  
6
V
GS=5V  
25 C  
3
0
TJ=125C  
-55 C  
5
0
1
2
3
4
5
6
1
2
3
4
6
VDS, Drain-to-Source Voltage (V)  
VGS, Gate-to-Source Voltage (V)  
Figure 1. Output Characteristics  
Figure 2. Transfer Characteristics  
2.6  
2.2  
1.8  
1.4  
1.0  
0.6  
0.2  
2400  
2000  
1600  
1200  
800  
400  
0
ID=6A  
VGS=10V  
C
iss  
C
oss  
C
rss  
0
5
10  
15  
20  
25  
-100  
-50  
0
50  
100  
150  
200  
VDS, Drain-to-Source Voltage (V)  
TJ, Junction Temperature( C)  
Figure 3. Capacitance  
Figure 4. On-Resistance Variation  
with Temperature  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
VDS=VGS  
ID=250µA  
V
GS=0V  
101  
100  
10-1  
-50 -25  
0
25 50 75 100 125 150  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
TJ, Junction Temperature( C)  
VSD, Body Diode Forward Voltage (V)  
Figure 5. Gate Threshold Variation  
with Temperature  
Figure 6. Body Diode Forward Voltage  
Variation with Source Current  
3
CEP740G/CEB740G  
CEF740G  
102  
10  
8
VDS=320V  
ID=10A  
RDS(ON)Limit  
100µs  
101  
1ms  
6
10ms  
DC  
4
100  
2
TC=25 C  
TJ=150 C  
Single Pulse  
10-1  
0
100  
101  
102  
103  
0
10  
20  
30  
40  
Qg, Total Gate Charge (nC)  
VDS, Drain-Source Voltage (V)  
Figure 7. Gate Charge  
Figure 8. Maximum Safe  
Operating Area  
VDD  
on  
t
toff  
d(off)  
t
r
t
d(on)  
OUT  
RL  
t
f
t
VIN  
90%  
10%  
90%  
D
OUT  
V
V
VGS  
10%  
INVERTED  
RGEN  
G
90%  
50%  
50%  
S
IN  
V
10%  
PULSE WIDTH  
Figure 10. Switching Waveforms  
Figure 9. Switching Test Circuit  
100  
D=0.5  
0.2  
0.1  
10-1  
0.05  
0.02  
0.01  
PDM  
t1  
t2  
Single Pulse  
10-2  
1. Rθ JC (t)=r (t) * Rθ JC  
2. Rθ JC=See Datasheet  
3. TJM-TC = P* Rθ JC (t)  
4. Duty Cycle, D=t1/t2  
10-3  
10-2  
10-1  
100  
101  
102  
103  
104  
Square Wave Pulse Duration (msec)  
Figure 11. Normalized Thermal Transient Impedance Curve  
4

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