AT45DB321C-RI [ATMEL]

32 MEGABIT 2.7 VOLT DATAFLASH; 32兆位2.7伏的DataFlash
AT45DB321C-RI
型号: AT45DB321C-RI
厂家: ATMEL    ATMEL
描述:

32 MEGABIT 2.7 VOLT DATAFLASH
32兆位2.7伏的DataFlash

文件: 总37页 (文件大小:613K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Features  
Single 2.7 - 3.6V Supply  
RapidSSerial Interface: 40 MHz Maximum Clock Frequency  
(SPI Modes 0 and 3 Compatible for Frequencies Up to 33 MHz)  
Page Program  
– 8192 Pages (528 Bytes/Page)  
Automated Erase Operations  
– Page Erase 528 Bytes  
– Block Erase 4,224 Bytes  
Two 528-byte SRAM Data Buffers – Allows Receiving of Data  
while Reprogramming the Flash Array  
Continuous Read Capability through Entire Array  
– Ideal for Code Shadowing Applications  
Low-power Dissipation  
– 10 mA Active Read Current Typical – Serial Interface  
– 8 µA CMOS Standby Current Typical  
Hardware and Software Data Protection Features  
– Individual Sector Locking  
32-megabit  
2.7 volt  
DataFlash®  
Security: 128-byte Security Register  
– 64-byte User Programmable Space  
– Unique 64-byte Device Identifier  
JEDEC Standard Manufacturer and Device ID Read  
100,000 Program/Erase Cycles per Page  
Data Retention – 20 years  
AT45DB321C  
Preliminary  
Commercial and Industrial Temperature Ranges  
Green (Pb/Halide-free) Packaging Options  
Description  
The AT45DB321C is an SPI compatible, serial-interface Flash memory ideally suited  
for a wide variety of digital voice-, image-, program code- and data-  
storage applications. The AT45DB321C supports a 4-wire serial interface known as  
RapidS for applications requiring very high speed operations.  
Pin Configurations  
TSOP Top View – Type 1  
Pin Name  
Function  
RDY/BUSY  
RESET  
WP  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
2
CS  
Chip Select  
Serial Clock  
Serial Input  
Serial Output  
3
NC  
4
NC  
5
SCK  
SI  
VCC  
GND  
NC  
6
7
8
NC  
9
SO  
NC  
10  
11  
12  
13  
14  
CS  
SCK  
SI  
Hardware Page  
Write Protect Pin  
WP  
SO  
RESET  
Chip Reset  
CASON – Top View  
through Package  
CBGA Top View  
through Package  
RDY/BUSY Ready/Busy  
1
2
3
4
5
DataFlash Card(1)  
Top View through Package  
SI  
SCK  
1
2
3
4
8
7
6
5
SO  
GND  
VCC  
WP  
RESET  
CS  
A
B
C
D
E
NC  
NC  
NC  
NC  
7
6 5 4 3 2 1  
NC SCK GND VCC NC  
NC  
NC  
NC  
CS RDY/BSY WP NC  
SO  
NC  
SI RESET NC  
NC  
NC NC  
3387B–DFLSH–9/04  
Note:  
1. See AT45DCB004 Datasheet  
Its 34,603,008 bits of memory are organized as 8192 pages of 528 bytes each. In addi-  
tion to the 33-megabit main memory, the AT45DB321C also contains two SRAM  
buffers of 528 bytes each.  
The buffers allow the receiving of data while a page in the main page Memory is being  
reprogrammed, as well as writing a continuous data stream. EEPROM emulation (bit or  
byte alterability) is easily handled with a self-contained three step read-modify-write  
operation. Unlike conventional Flash memories that are accessed randomly with multi-  
ple address lines and a parallel interface, the DataFlash uses a RapidS serial interface  
to sequentially access its data. The simple sequential access dramatically reduces  
active pin count, facilitates hardware layout, increases system reliability, minimizes  
switching noise, and reduces package size. The device is optimized for use in many  
commercial and industrial applications where high-density, low-pin count, low-voltage  
and low-power are essential. The device operates at clock frequencies up to 40 MHz  
with a typical active read current consumption of 10 mA.  
To allow for simple in-system reprogrammability, the AT45DB321C does not require  
high input voltages for programming. The device operates from a single power supply,  
2.7V to 3.6V, for both the program and read operations. The AT45DB321C is enabled  
through the chip select pin (CS) and accessed via a three-wire interface consisting of  
the Serial Input (SI), Serial Output (SO), and the Serial Clock (SCK).  
All programming and erase cycles are self-timed.  
Block Diagram  
WP  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
SCK  
CS  
I/O INTERFACE  
RESET  
VCC  
GND  
RDY/BUSY  
SI  
SO  
Memory Array  
To provide optimal flexibility, the memory array of the AT45DB321C is divided into three  
levels of granularity comprising of sectors, blocks, and pages. The “Memory Architec-  
ture Diagram” illustrates the breakdown of each level and details the number of pages  
per sector and block. All program operations to the DataFlash occur on a page by page  
basis. The erase operations can be performed at the block or page level.  
2
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Memory Architecture Diagram  
SECTOR ARCHITECTURE  
BLOCK ARCHITECTURE  
PAGE ARCHITECTURE  
BLOCK 0  
BLOCK 1  
BLOCK 2  
8 Pages  
PAGE 0  
PAGE 1  
SECTOR 0a  
SECTOR 0a = 8 Pages  
4224 bytes (4K + 128)  
SECTOR 0b = 504 Pages  
266,112 bytes (252K + 8064)  
PAGE 6  
PAGE 7  
PAGE 8  
PAGE 9  
BLOCK 62  
BLOCK 63  
BLOCK 64  
BLOCK 65  
SECTOR 1 = 512 Pages  
270,336 bytes (256K + 8K)  
SECTOR 2 = 512 Pages  
270,336 bytes (256K + 8K)  
PAGE 14  
PAGE 15  
PAGE 16  
PAGE 17  
PAGE 18  
BLOCK 126  
BLOCK 127  
BLOCK 128  
BLOCK 129  
SECTOR 14 = 512 Pages  
270,336 bytes (256K + 8K)  
PAGE 8189  
PAGE 8190  
PAGE 8191  
SECTOR 15 = 512 Pages  
270,336 bytes (256K + 8K)  
BLOCK 1022  
BLOCK 1023  
Block = 4224 bytes  
(4K + 128)  
Page = 528 bytes  
(512 + 16)  
Device Operation  
The device operation is controlled by instructions from the host processor. The list of  
instructions and their associated opcodes are contained in Tables 1 through 4. A valid  
instruction starts with the falling edge of CS followed by the appropriate 8-bit opcode  
and the desired buffer or main memory address location. While the CS pin is low, tog-  
gling the SCK pin controls the loading of the opcode and the desired buffer or main  
memory address location through the SI (serial input) pin. All instructions, addresses,  
and data are transferred with the most significant bit (MSB) first.  
Buffer addressing is referenced in the datasheet using the terminology BFA9-BFA0 to  
denote the 10 address bits required to designate a byte address within a buffer. Main  
memory addressing is referenced using the terminology PA12-PA0 and BA9-BA0,  
where PA12-PA0 denotes the 13 address bits required to designate a page address and  
BA9-BA0 denotes the 10 address bits required to designate a byte address within the  
page.  
Read Commands  
By specifying the appropriate opcode, data can be read from the main memory or from  
either one of the two SRAM data buffers. The DataFlash supports RapidS protocol for  
Mode 0 and Mode 3. Please refer to the “Detailed Bit-level Read Timing” diagrams in  
this datasheet for details on the clock cycle sequences for each mode.  
CONTINUOUS ARRAY READ: By supplying an initial starting address for the main  
memory array, the Continuous Array Read command can be utilized to sequentially  
read a continuous stream of data from the device by simply providing a clock signal; no  
additional addressing information or control signals need to be provided. The DataFlash  
incorporates an internal address counter that will automatically increment on every clock  
cycle, allowing one continuous read operation without the need of additional address  
sequences. To perform a continuous read, an opcode of E8H must be clocked into the  
device. The opcode is followed by three address bytes (which comprises 24-bit page  
and byte address sequence) and 32 don’t care clock cycles. The first bit of the 24-bit  
address sequence is reserved for upward and downward compatibility to larger and  
3
3387B–DFLSH–9/04  
smaller density devices (see the notes under “Command Sequence for Read/Write  
Operations (except Status Register Read)” on page 22. The next 13 bits (PA12-PA0) of  
the 24-bit address sequence specify which page of the main memory array to read, and  
the last 10 bits (BA9-BA0) of the 24-bit address sequence specify the starting byte  
address within the page. The 32 don’t care clock cycles that follow the four address  
bytes are needed to initialize the read operation. Following the don’t care clock cycles,  
additional clock pulses on the SCK pin will result in data being output on the SO (serial  
output) pin.  
The CS pin must remain low during the loading of the opcode, the address bytes, the  
don’t care bytes, and the reading of data. When the end of a page in main memory is  
reached during a Continuous Array Read, the device will continue reading at the begin-  
ning of the next page with no delays incurred during the page boundary crossover (the  
crossover from the end of one page to the beginning of the next page). When the last bit  
in the main memory array has been read, the device will continue reading back at the  
beginning of the first page of memory. As with crossing over page boundaries, no delays  
will be incurred when wrapping around from the end of the array to the beginning of the  
array.  
A low-to-high transition on the CS pin will terminate the read operation and tri-state the  
output pin (SO). The maximum SCK frequency allowable for the Continuous Array Read  
is defined by the fCAR specification. The Continuous Array Read bypasses both data  
buffers and leaves the contents of the buffers unchanged.  
MAIN MEMORY PAGE READ: A main memory page read allows the user to read data  
directly from any one of the 8192 pages in the main memory, bypassing both of the data  
buffers and leaving the contents of the buffers unchanged. To start a page read, an  
opcode of D2H must be clocked into the device. The opcode is followed by three  
address bytes (which comprise 24-bit page and byte address sequence) and 32 don’t  
care clock cycles. The first bit of the 24-bit address sequence is a reserved bit, the next  
13 bits (PA12-PA0) of the 24-bit address sequence specify the page in main memory to  
be read, and the last 10 bits (BA9-BA0) of the 24-bit address sequence specify the start-  
ing byte address within that page. The 32 don’t care clock cycles that follow the three  
address bytes are sent to initialize the read operation. Following the don’t care bytes,  
additional pulses on SCK result in data being output on the SO (serial output) pin. The  
CS pin must remain low during the loading of the opcode, the address bytes, the don’t  
care bytes, and the reading of data. When the end of a page in main memory is  
reached, the device will continue reading back at the beginning of the same page. A  
low-to-high transition on the CS pin will terminate the read operation and tri-state the  
output pin (SO). The maximum SCK frequency allowable for the Main Memory Page  
Read is defined by the fSCK specification. The Main Memory Page Read bypasses both  
data buffers and leaves the contents of the buffers unchanged.  
BUFFER READ: Data can be read from either one of the two buffers, using different  
opcodes to specify which buffer to read from. An opcode of D4H is used to read data  
from buffer 1, and an opcode of D6H is used to read data from buffer 2. To perform a  
buffer read, the opcode must be clocked into the device followed by three address bytes  
comprised of 14 don’t care bits and 10 buffer address bits (BFA9-BFA0). Following the  
three address bytes, an additional don’t care byte must be clocked in to initialize the  
read operation. Since the buffer size is 528 bytes, 10 buffer address bits are required to  
specify the first byte of data to be read from the buffer. The CS pin must remain low dur-  
ing the loading of the opcode, the address bytes, the don’t care bytes, and the reading  
of data. When the end of a buffer is reached, the device will continue reading back at the  
beginning of the buffer. A low-to-high transition on the CS pin will terminate the read  
operation and tri-state the output pin (SO).  
4
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Program and Erase  
Commands  
BUFFER WRITE: Data can be clocked in from the SI pin into either buffer 1 or buffer 2.  
To load data into either buffer, a 1-byte opcode, 84H for buffer 1 or 87H for buffer 2,  
must be clocked into the device, followed by three address bytes comprised of 14 don’t  
care bits and 10 buffer address bits (BFA9-BFA0). The 10 buffer address bits specify  
the first byte in the buffer to be written. After the last address byte has been clocked into  
the device, data can then be clocked in on subsequent clock cycles. If the end of the  
data buffer is reached, the device will wrap around back to the beginning of the buffer.  
Data will continue to be loaded into the buffer until a low-to-high transition is detected on  
the CS pin.  
BUFFER TO MAIN MEMORY PAGE PROGRAM WITH BUILT-IN ERASE: Data written  
into either buffer 1 or buffer 2 can be programmed into the main memory. To start the  
operation, an 8-bit opcode, 83H for buffer 1 or 86H for buffer 2, must be clocked into the  
device followed by three address bytes consisting of one reserved bit, 13 page address  
bits (PA12-PA0) that specify the page in the main memory to be written and 10 don’t  
care bits. When a low-to-high transition occurs on the CS pin, the part will first erase the  
selected page in main memory (the erased state is a logic 1) and then program the data  
stored in the buffer into the specified page in main memory. Both the erase and the pro-  
gramming of the page are internally self-timed and should take place in a maximum time  
of tEP. During this time, the status register and the RDY/BUSY pin will indicate that the  
part is busy.  
BUFFER TO MAIN MEMORY PAGE PROGRAM WITHOUT BUILT-IN ERASE: A previ-  
ously-erased page within main memory can be programmed with the contents of either  
buffer 1 or buffer 2. To start the operation, an 8-bit opcode, 88H for buffer 1 or 89H for  
buffer 2, must be clocked into the device followed by three address bytes consisting of  
one reserved bit, 13 page address bits (PA12-PA0) that specify the page in the main  
memory to be written and 10 don’t care bits. When a low-to-high transition occurs on the  
CS pin, the part will program the data stored in the buffer into the specified page in the  
main memory. It is necessary that the page in main memory that is being programmed  
has been previously erased using one of the erase commands (Page Erase or Block  
Erase). The programming of the page is internally self-timed and should take place in a  
maximum time of tP. During this time, the status register and the RDY/BUSY pin will indi-  
cate that the part is busy.  
PAGE ERASE: The Page Erase command can be used to individually erase any page  
in the main memory array allowing the Buffer to Main Memory Page Program without  
Built-in Erase command to be utilized at a later time. To perform a page erase, an  
opcode of 81H must be loaded into the device, followed by three address bytes com-  
prised of one reserved bit, 13 page address bits (PA12-PA0) that specify the page in the  
main memory to be erased and 10 don’t care bits. When a low-to-high transition occurs  
on the CS pin, the part will erase the selected page (the erased state is a logic 1). The  
erase operation is internally self-timed and should take place in a maximum time of tPE.  
During this time, the status register and the RDY/BUSY pin will indicate that the part is  
busy.  
BLOCK ERASE: A block of eight pages can be erased at one time. This command is  
useful when large amounts of data has to be written into the device. This will avoid using  
multiple Page Erase Commands. To perform a block erase, an opcode of 50H must be  
loaded into the device, followed by three address bytes comprised of one reserved bit,  
10 page address bits (PA12-PA3) and 13 don’t care bits. The 10 page address bits are  
used to specify which block of eight pages is to be erased. When a low-to-high transition  
occurs on the CS pin, the part will erase the selected block of eight pages. The erase  
operation is internally self-timed and should take place in a maximum time of tBE. During  
this time, the status register and the RDY/BUSY pin will indicate that the part is busy.  
5
3387B–DFLSH–9/04  
Block Erase Addressing  
PA12  
PA11  
PA10  
PA9  
PA8  
0
PA7  
0
PA6  
0
PA5  
0
PA4  
0
PA3  
0
PA2  
X
PA1  
X
PA0  
X
Block  
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
2
3
0
0
0
0
0
0
1
X
X
X
0
0
0
0
0
1
0
X
X
X
0
0
0
0
0
1
1
X
X
X
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
1
1
0
1
0
1
X
X
X
X
X
X
X
X
X
X
X
X
1020  
1021  
1022  
1023  
MAIN MEMORY PAGE PROGRAM THROUGH BUFFER: This operation is a combina-  
tion of the Buffer Write and Buffer to Main Memory Page Program with Built-in Erase  
operations. Data is first clocked into buffer 1 or buffer 2 from the input pin (SI) and then  
programmed into a specified page in the main memory. To initiate the operation, an 8-bit  
opcode, 82H for buffer 1 or 85H for buffer 2, must first be clocked into the device, fol-  
lowed by three address bytes. The address bytes are comprised of one reserved bit, 13  
page address bits (PA12-PA0) that select the page in the main memory where data is to  
be written, and 10 buffer address bits (BFA9-BFA0) that select the first byte in the buffer  
to be written. After all address bytes are clocked in, the part will take data from the input  
pins and store it in the specified data buffer. If the end of the buffer is reached, the  
device will wrap around back to the beginning of the buffer. When there is a low-to-high  
transition on the CS pin, the part will first erase the selected page in main memory to all  
1s and then program the data stored in the buffer into that memory page. Both the erase  
and the programming of the page are internally self-timed and should take place in a  
maximum time of tEP. During this time, the status register and the RDY/BUSY pin will  
indicate that the part is busy.  
Additional Commands  
MAIN MEMORY PAGE TO BUFFER TRANSFER: A page of data can be transferred  
from the main memory to either buffer 1 or buffer 2. To start the operation, a 1-byte  
opcode, 53H for buffer 1 and 55H for buffer 2, must be clocked into the device, followed  
by three address bytes comprised of one reserved bit, 13 page address bits (PA12-  
PA0), which specify the page in main memory that is to be transferred, and 10 don’t care  
bits. The CS pin must be low while toggling the SCK pin to load the opcode and the  
address bytes from the input pin (SI). The transfer of the page of data from the main  
memory to the buffer will begin when the CS pin transitions from a low to a high state.  
During the transfer of a page of data (tXFR), the status register can be read or the  
RDY/BUSY can be monitored to determine whether the transfer has been completed.  
AUTO PAGE REWRITE: This mode is only needed if multiple bytes within a page or  
multiple pages of data are modified in a random fashion. This mode is a combination of  
two operations: Main Memory Page to Buffer Transfer and Buffer to Main Memory Page  
Program with Built-in Erase. A page of data is first transferred from the main memory to  
buffer 1 or buffer 2, and then the same data (from buffer 1 or buffer 2) is programmed  
back into its original page of main memory. To start the rewrite operation, a 1-byte  
opcode, 58H for buffer 1 or 59H for buffer 2, must be clocked into the device, followed  
by three address bytes comprised of one reserved bit, 13 page address bits (PA12-PA0)  
6
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
that specify the page in main memory to be rewritten and 10 don’t care bits. When a low-  
to-high transition occurs on the CS pin, the part will first transfer data from the page in  
main memory to a buffer and then program the data from the buffer back into same  
page of main memory. The operation is internally self-timed and should take place in a  
maximum time of tEP. During this time, the status register and the RDY/BUSY pin will  
indicate that the part is busy.  
If a sector is programmed or reprogrammed sequentially page by page, then the pro-  
gramming algorithm shown in Figure 1 on page 29 is recommended. Otherwise, if  
multiple bytes in a page or several pages are programmed randomly in a sector, then  
the programming algorithm shown in Figure 2 on page 30 is recommended. Each page  
within a sector must be updated/rewritten at least once within every 10,000 cumulative  
page erase/program operations in that sector.  
STATUS REGISTER READ: The status register can be used to determine the device’s  
ready/busy status, or whether the sector protection has been enabled. To read the sta-  
tus register, an opcode of D7H must be loaded into the device. After the opcode and  
optional dummy byte is clocked in, the 1-byte status register will be clocked out on the  
output pin (SO), starting with the next clock cycle. For applications over 25 MHz, the  
opcode must be always followed with a dummy (don’t care) byte. The data in the status  
register, starting with the MSB (bit 7), will be clocked out on the SO pin during the next  
eight clock cycles.  
The most-significant bits of the status register will contain device information, while the  
remaining least-significant bit is reversed for future use and will have undefined value.  
After the one byte of the status register has been clocked out, the sequence will repeat  
itself (as long as CS remains low and SCK is being toggled). The data in the status reg-  
ister is constantly updated, so each repeating sequence will output new data.  
Ready/busy status is indicated using bit 7 of the status register. If bit 7 is a 1, then the  
device is not busy and is ready to accept the next command. If bit 7 is a 0, then the  
device is in a busy state. There are many operations that can cause the device to be in  
a busy state: Main Memory Page to Buffer Transfer, Buffer to Main Memory Page Pro-  
gram with Built-in Erase, Buffer to Main Memory Page Program without Built-in Erase,  
Page Erase, Block Erase, Main Memory Page Program, and Auto Page Rewrite.  
Bit 1 in the Status Register is used to provide information to the user whether or not the  
sector protection has been enabled or disabled, either by software-controlled method or  
hardware-controlled method. A logic 1 indicates that sector protection has been enabled  
and logic 0 indicates that sector protection has been disabled.  
The device density is indicated using bits 5, 4, 3, and 2 of the status register. For the  
AT45DB321C, the four bits are 1,1, 0, 1. The decimal value of these four binary bits  
does not equate to the device density; the four bits represent a combinational code  
relating to differing densities of DataFlash devices. The device density is not the same  
as the density code indicated in the JEDEC device ID information. The device density is  
provided only for backward compatibility.  
Status Register Format  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
RDY/BUSY  
X
1
1
0
1
Protect  
X
7
3387B–DFLSH–9/04  
Sector Protection  
Two protection methods, hardware and software controlled, are provided. The selection  
of which sectors to be protected/unprotected from program and erase operations is  
defined in the Sector Protection Register.  
SOFTWARE SECTOR PROTECTION: Sectors specified for protection in the Sector  
Protection Register can be protected from program and erase operations by issuing the  
Enable Sector Protection command. To enable the sector protection using the software  
controlled method, the CS pin must first be asserted as it would be with any other com-  
mand. Once the CS pin has been asserted, the appropriate 4-byte command sequence  
must be clocked in via the input pin (SI). After the last bit of the command sequence has  
been clocked in, the CS pin must be deasserted after which the sector protection will be  
enabled.  
Command  
Byte 1  
3DH  
Byte 2  
2AH  
Byte 3  
7FH  
Byte 4  
A9H  
Enable Sector Protection  
Disable Sector Protection  
Read Sector Protection Register  
3DH  
2AH  
7FH  
9AH  
32H  
00H  
00H  
00H  
To disable the sector protection using the software controlled method, the CS pin must  
first be asserted as it would be with any other command. Once the CS pin has been  
asserted, the appropriate 4-byte sequence for the Disable Sector Protection command  
must be clocked in via the input pin (SI). After the last bit of the command sequence has  
been clocked in, the CS pin must be deasserted after which the sector protection will be  
disabled. The Disable Sector Protection command is ignored while the WP pin is  
asserted.  
Software Sector Protection is useful in applications in which the WP pin is not or cannot  
be controlled by a host processor. In such instances, the WP pin may be left floating (the  
WP pin is pulled high internally) and sector protection can be controlled using the soft-  
ware commands.  
If the device is power cycled, then the Software Sector Protection will be disabled. Once  
the device is powered up, the Enable Sector Protection command should be reissued if  
sector protection is desired and if the WP pin is not used. The RESET pin has no effect  
on the Software Sector Protection.  
HARDWARE SECTOR PROTECTION: Sectors specified for protection in Sector Pro-  
tection Register can be protected from program and erase operations by utilizing the  
Write Protection (WP) pin. The protection can be enabled by asserting the WP pin and  
keeping the pin in its asserted state. Any sector specified for protection cannot be  
erased or reprogrammed as long as the WP pin is asserted. The protection can be dis-  
abled by deasserting the WP pin high. A filter is provided on the WP pin to help protect  
against spurious noise on the WP pin. Hardware Sector Protection will provide continu-  
ous protection, based on the contents of the Sector Protection Register, in an  
application where WP is always driven low. Please read the description of the WP pin on  
page 13 for more information.  
SECTOR PROTECTION REGISTER: Sector Protection Register is a nonvolatile regis-  
ter that contains 16 bytes of data, as shown below:  
Sector Number  
Protected  
0 (0a, 0b)  
1 to 15  
FFH  
See Below  
Unprotected  
00H  
8
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Sector 0 (0a, 0b):  
0b  
(Page 8-255)  
Bit 4, 5  
0b  
(Page 256-511)  
Bit 2, 3  
0a  
Data  
Value  
Bit 6, 7  
Bit 0, 1  
00  
Sectors 0a, 0b  
Unprotected  
00  
00  
00  
00H  
Protect Sector 0a  
11  
00  
00  
11  
00  
00  
00  
00  
C0H  
30H  
Protect Sector 0b  
(Page 8-255)  
Protect Sector 0b  
(Page 256-511)  
00  
11  
00  
11  
11  
11  
00  
00  
0CH  
FCH  
Protect Sectors 0a,  
0b (Page 8-255), 0b  
(Page 256-511)(1)  
Protect Sectors 0a,  
0b (Page 8-255)  
11  
11  
00  
00  
F0H  
Note:  
1. Default value for devices shipped from Atmel.  
2. When protecting or unprotecting sector 0b (pages 8-511), we recommend protecting  
or unprotecting the entire sector 0b simultaneously.  
ERASING THE SECTOR PROTECTION REGISTER: To erase the Sector Protection  
Register, the CS pin must first be asserted. Once the CS pin has been asserted, the  
4-byte erase command sequence must be clocked in via the SI (serial input) pin. After  
the last bit of the command sequence has been clocked in, the CS pin must be deas-  
serted to initiate the internally self-timed erase cycle (tPE). The Ready/Busy status will  
indicate that the device is busy during the erase cycle. The erased state of each bit (of a  
byte) in the Sector Protection Register indicates that the corresponding sector is flagged  
for protection. The RESET pin is disabled during this erase cycle to prevent incomplete  
erasure of the Sector Protection Register.  
Command  
Byte 1  
Byte 2  
Byte 3  
Byte 4  
Erase Sector Protection Register  
3DH  
2AH  
7FH  
CFH  
PROGRAMMING THE SECTOR PROTECTION REGISTER: To program the Sector  
Protection Register, the CS pin must first be asserted. Once the CS pin has been  
asserted, the 4-byte command sequence must be clocked in via the SI (serial input) pin.  
After the last bit of the command sequence has been clocked in, the data for the con-  
tents of the Sector Protection Register must be clocked in. The first byte corresponds to  
sector 0 (0a, 0b), the second byte corresponds to Sector 1 and the last byte (byte 16)  
corresponds to Sector 15. After the last bit of data has been clocked in, the CS pin must  
be deasserted to initiate the internally self-timed program cycle (tP). The Ready/Busy  
status will indicate that the device is busy during the program cycle. The RESET pin is  
disabled during this program cycle to prevent incomplete programming of the sector pro-  
tection register.  
Command  
Byte 1  
Byte 2  
Byte 3  
Byte 4  
Program Sector Protection Register  
3DH  
2AH  
7FH  
FCH  
READING THE SECTOR PROTECTION REGISTER: To read the Sector Protection  
Register, the CS pin must first be asserted. Once the CS pin has been asserted, a  
4-byte command sequence 32H, 00H, 00H, 00H and 32 don’t care clock cycles must be  
clocked in via the SI (serial input) pin. The 32 don’t care clock cycles are required to ini-  
9
3387B–DFLSH–9/04  
tialize the read operation. After the 32 don’t care clock cycles, any additional clock  
pulses on the SCK pin will result in data being output on the SO (serial output) pin. The  
read will begin with Byte_1 of the Sector Protection Register for Sector_0, followed with  
Byte_2 for Sector_1. The read operation will continue until Byte_16 for Sector_15 is  
read. Once the last byte is read a low-to-high transition on the CS pin is required to ter-  
minate the read operation.  
Command  
Byte 1  
Byte 2  
Byte 3  
Byte 4  
Read Sector Protection Register  
32H  
00H  
00H  
00H  
VARIOUS ASPECTS ABOUT THE SECTOR PROTECTION REGISTER: Due to the  
sharing of the internal circuitry, the contents of the buffer 1 will get modified during the  
erase and programming of Sector Protection Register. If the device is powered down  
during erasing or programming the sector protection register, then the contents of the  
Sector Protection Register cannot be guaranteed. The Sector Protection Register can  
be erased or reprogrammed with the sector protection enabled or disabled. Being able  
to reprogram the Sector Protection Register with the sector protection enabled allows  
the user to temporarily disable the sector protection to an individual sector rather than  
disabling the sector protection completely.  
The Sector Protection Register is subject to the same endurance characteristics as the  
main memory array. Users are encouraged to carefully evaluate the number of times the  
Sector Protection Register will be modified during the course of the applications’ life  
cycle. If the application requires that the Sector Protection Register be modified more  
than the specified endurance of the DataFlash because the application needs to tempo-  
rarily unprotect individual sectors (sector protection remains enabled while the Sector  
Protection Register is reprogrammed), then the application will need to limit this prac-  
tice. Instead, a combination of temporarily unprotecting individual sectors along with  
disabling sector protection completely will need to be implemented by the application to  
ensure that the endurance limits of the device are not exceeded.  
10  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Manufacturer and Device ID Read  
This instruction conforms to the JEDEC standard and allows the user to read the Manufacturer ID, Device ID, and Extended  
Device Information. A 1-byte opcode, 9FH, must be clocked into the device while the CS pin is low. After the opcode is  
clocked in, the Manufacturer ID, 2 bytes of Device ID and Extended Device Information will be clocked out on the SO pin.  
The fourth byte of the sequence output is the Extended Device Information String Length byte. This byte is used to signify  
how many bytes of Extended Device Information will be output.  
Manufacturer and Device ID Information  
Byte 1 – Manufacturer ID  
JEDEC Assigned Code  
Hex  
Value  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
1FH  
0
0
0
1
1
1
1
1
Manufacturer ID  
1FH = Atmel  
Byte 2 – Device ID (Part 1)  
Family Code  
Hex  
Density Code  
Value  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
Family Code  
Density Code  
001 = DataFlash  
00111 = 32-Mbit  
27H  
0
0
1
0
0
1
1
1
Byte 3 – Device ID (Part 2)  
MLC Code  
Hex  
Product Version Code  
Value  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
MLC Code  
000 = 1-bit/Cell Technology  
00000 = Initial Version  
00H  
0
0
0
0
0
0
0
0
Product Version  
Byte 4 – Extended Device Information String Length  
Byte Count  
Hex  
Value  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
00H  
0
0
0
0
0
0
0
0
Byte Count  
00H = 0 Bytes of Information  
CS  
9FH  
SI  
Opcode  
1FH  
27H  
00H  
00H  
Data  
Data  
SO  
Manufacturer ID  
Byte n  
Device ID  
Byte 1  
Device ID  
Byte 2  
Extended  
Device  
Extended  
Device  
Information  
Byte x  
Extended  
Device  
Information  
Byte x + 1  
Information  
String Length  
This information  
would only be output  
if the Extended Device  
Information String Length  
value was something  
other than 00H.  
Each transition represents  
8 bits and 8 clock cycles  
Note:  
Based on JEDEC publication 106 (JEP106), Manufacturer ID data can be comprised of any number of bytes. Some manufacturers may have  
Manufacturer ID codes that are two, three or even four bytes long with the first byte(s) in the sequence being 7FH. A system should detect code  
7FH as a “Continuation Code” and continue to read Manufacturer ID bytes. The first non-7FH byte would signify the last byte of Manufacturer ID  
data. For Atmel (and some other manufacturers), the Manufacturer ID data is comprised of only one byte.  
11  
3387B–DFLSH–9/04  
Security Register  
The AT45DB321C contains a specialized register that can be used for security pur-  
poses in system design. The Security Register is a unique 128-byte register that is  
divided into two portions. The first 64 bytes (byte 0 to byte 63) of this page are allocated  
as a one-time user programmable space. Once these 64 bytes have been programmed,  
they should not be reprogrammed. The remaining 64 bytes of this page (byte 64 to byte  
127) are factory programmed by Atmel and will contain a unique number for each  
device. The factory programmed data is fixed and cannot be changed.  
The Security Register can be read by clocking in opcode 77H to the device followed by  
three address bytes (which are comprised of 14 don’t care bits plus 10 address bits) and  
32 don’t care clock cycles. See the opcode table on page 17.  
To program the first 64 bytes of the Security Register, a two step sequence must be  
used. The first step requires that the user loads the desired data into Buffer 1 by using  
the Buffer 1 Write operation (opcode 84H – see Buffer Write description on page 5). The  
user should specify the starting buffer address as location zero and should write a full  
64 bytes of information into the buffer. Otherwise, the first 64 bytes of the buffer may  
contain data that was previously stored in the buffer. It is not necessary to fill the remain-  
ing 464 bytes (byte locations 64 through 127) of the buffer with data. After the Buffer 1  
Write operation has been completed, the Security Register can be subsequently pro-  
grammed by reselecting the device and clocking in opcode 9AH into the device followed  
by three don’t care bytes (24 clock cycles). After the final don’t care clock cycle has  
been completed, a low-to-high transition on the CS pin will cause the device to initiate  
an internally self-timed program operation in which the contents of Buffer 1 will be pro-  
grammed into the Security Register. Only the first 64 bytes of data in Buffer 1 will be  
programmed into the Security Register; the remaining 464 bytes of the buffer will be  
ignored. The Security Register program operation should take place in a maximum time  
of tP.  
Operation Mode  
Summary  
The modes described can be separated into two groups – modes that make use of the  
Flash memory array (Group A) and modes that do not make use of the Flash memory  
array (Group B).  
Group A modes consist of:  
1. Main Memory Page Read  
2. Continuous Array Read  
3. Main Memory Page to Buffer 1 (or 2) Transfer  
4. Buffer 1 (or 2) to Main Memory Page Program with Built-in Erase  
5. Buffer 1 (or 2) to Main Memory Page Program without Built-in Erase  
6. Main Memory Page Program through Buffer 1 (or 2)  
7. Page Erase  
8. Block Erase  
9. Auto Page Rewrite  
Group B modes consist of:  
1. Buffer 1 (or 2) Read  
2. Buffer 1 (or 2) Write  
3. Status Register Read  
4. Manufacturer and Device ID Read  
If a Group A mode is in progress (not fully completed), then another mode in Group A  
should not be started. However, during this time in which a Group A mode is in  
12  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
progress, modes in Group B can be started, except the first two Group A commands  
(Memory Array Read Commands).  
This gives the DataFlash the ability to virtually accommodate a continuous data stream.  
While data is being programmed into main memory from buffer 1, data can be loaded  
into buffer 2 (or vice versa). See application note AN-4 (“Using Atmel’s Serial  
DataFlash”) for more details.  
Pin Descriptions  
SERIAL INPUT (SI): The SI pin is an input-only pin and is used to shift data serially into  
the device. The SI pin is used for all data input, including opcodes and address  
sequences.  
SERIAL OUTPUT (SO): The SO pin is an output-only pin and is used to shift data seri-  
ally out from the device.  
SERIAL CLOCK (SCK): The SCK pin is an input-only pin and is used to control the flow  
of data to and from the DataFlash. Data is always clocked into the device on the rising  
edge of SCK and clocked out of the device on the falling edge of SCK.  
CHIP SELECT (CS): The DataFlash is selected when the CS pin is low. When the  
device is not selected, data will not be accepted on the input pin (SI), and the output pin  
(SO) will remain in a high impedance state. A high-to-low transition on the CS pin is  
required to start an operation, and a low-to-high transition on the CS pin is required to  
end an operation or to start an internally self-timed operation.  
WRITE PROTECT (WP): The WP pin is used to control the Hardware Sector Protection.  
Hardware Sector Protection is enabled by asserting the WP pin and keeping the pin in  
it’s asserted state. Disabling Hardware Sector Protection is accomplished by simply  
deasserting the WP pin. The WP pin will override the software controlled sector protec-  
tion method but only for protecting the sectors. For example, if the sectors were not  
previously protected by the Enable Sector Protection command, then simply asserting  
the WP pin for the minimum specified time (tWPE) would enable the sector protection.  
When the WP pin is deasserted; however, the sector protection would no longer be  
enabled as long as the Enable Sector Protection command was not issued while the WP  
pin was asserted. If the Enable Sector Protection command was issued before or while  
the WP pin was asserted, then simply deasserting the WP pin would not disable the sec-  
tor protection. In this case, the Disable Sector Protection command would need to be  
issued while the WP pin is deasserted to disable the sector protection. The Disable Sec-  
tor Protection command is also ignored whenever the WP pin is asserted.  
To ensure backwards compatibility with previous generations of DataFlash, the function  
of the WP pin has not changed. Therefore, when the WP pin is asserted, certain sectors  
in the memory array will be protected, and when the WP pin is deasserted, the memory  
array will be unprotected provided the Enable Sector Protection command hasn’t been  
issued. New devices are shipped from Atmel with the contents of the Sector Protection  
Register pre-programmed so that sectors 0a and 0b are specified for protection while  
the remaining sectors are not flagged for protection. The user can reprogram the Sector  
Protection Register to change which sectors will be protected by the WP pin.  
The table below details the sector protection status for various scenarios of the WP pin,  
the Enable Sector Protection command, and the Disable Sector Protection command.  
1
2
3
WP  
13  
3387B–DFLSH–9/04  
Time  
Period  
WP Pin  
Enable Sector Protection Command  
Disable Sector Protection Command  
Sector Protection Status  
High  
High  
High  
Command Not Issued Previously  
x
Disabled  
Enabled  
Disabled  
1
2
3
Command Issued  
Command Issued  
Low  
x
x
Enabled  
High  
High  
High  
Command Issued during Period 1 or 2  
Not Issued Yet  
Command Issued  
Enabled  
Disabled  
Enabled  
Issue Command  
RESET: A low state on the reset pin (RESET) will terminate the operation in progress  
and reset the internal state machine to an idle state. The device will remain in the reset  
condition as long as a low level is present on the RESET pin. Normal operation can  
resume once the RESET pin is brought back to a high level.  
The device incorporates an internal power-on reset circuit, so there are no restrictions  
on the RESET pin during power-on sequences. The RESET pin is also internally pulled  
high; therefore, in low pin count applications, connection of the RESET pin is not neces-  
sary if this pin and feature will not be utilized. However, it is recommended that the  
RESET pin be driven high externally whenever possible.  
READY/BUSY: This open drain output pin will be driven low when the device is busy in  
an internally self-timed operation. This pin, which is normally in a high state (through  
an external pull-up resistor), will be pulled low during programming/erase operations,  
and page-to-buffer transfers.  
The busy status indicates that the Flash memory array and one of the buffers cannot be  
accessed; read and write operations to the other buffer can still be performed. During  
Page Erase and Block Erase, read and write operations can be performed to both  
buffers.  
14  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Power-on/Reset State When power is first applied to the device, or when recovering from a reset condition, the  
device will default to Mode 3. In addition, the output pin (SO) will be in a high impedance  
state, and a high-to-low transition on the CS pin will be required to start a valid instruc-  
tion. The mode (Mode 3 or Mode 0) will be automatically selected on every falling edge  
of CS by sampling the inactive clock state. After power is applied and VCC is at the mini-  
mum datasheet value, the system should wait 20 ms before an operational mode  
(DataFlash) is started.  
System  
Considerations  
The RapidS serial interface is controlled by the serial clock SCK, serial input SI and chip  
select CS pins. These signals must rise and fall monotonically and be free from noise.  
Excessive noise or ringing on these pins can be misinterpreted as multiple edges and  
cause improper operation of the device. The PC board traces must be kept to a mini-  
mum distance or appropriately terminated to ensure proper operation. If necessary,  
decoupling capacitors can be added on these pins to provide filtering against noise  
glitches.  
As system complexity continues to increase, voltage regulation is becoming more  
important. A key element of any voltage regulation scheme is its current sourcing capa-  
bility. Like all Flash memories, the peak current for DataFlash occur during the  
programming and erase operation. The regulator needs to supply this peak current  
requirement. An under specified regulator can cause current starvation. Besides  
increasing system noise, current starvation during programming or erase can lead to  
improper operation and possible data corruption.  
For applications that require random modifications of data within a sector, please refer  
to “Auto Page Rewrite” on page 6.  
It is recommended that the RDY/BUSY bit of status register or the RDY/BUSY pin be  
monitored in order to minimize the erase and programming time.  
Atmel C generation DataFlash utilizes a sophisticated adaptive algorithm during erase  
and programming to maximize the endurance over the life of the device. The algorithm  
uses a verification mechanism to check if the memory cells have been erased or pro-  
grammed successfully. If the memory cells were not erased or programmed, the  
algorithm loops back and erases or programs the memory cells again. The process will  
continue until the device is erased or programmed successfully.  
The erase and programming operations are internally self-timed and fixed timing is not  
recommended.  
15  
3387B–DFLSH–9/04  
Table 1. Read Commands  
Command  
SCK Mode  
Opcode  
E8H  
68H  
RapidS Mode 0 or 3  
Continuous Array Read  
Main Memory Page Read  
Buffer 1 Read  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
D2H  
52H  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
D4H  
54H  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
D6H  
56H  
Buffer 2 Read  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
D7H  
57H  
Status Register Read  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
Manufacturer and Device ID  
9FH  
Note:  
1. Legacy Opcodes 52H, 54H, 56H, 57H, and 68H are still supported for reasons of backward compatibility only and are not  
recommended for new designs. The inactive clock polarity high or low modes will not be supported in the future products.  
Table 2. Program and Erase Commands  
Command  
SCK Mode  
Opcode  
84H  
87H  
83H  
86H  
88H  
89H  
81H  
50H  
82H  
85H  
Buffer 1 Write  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Buffer 2 Write  
Buffer 1 to Main Memory Page Program with Built-in Erase  
Buffer 2 to Main Memory Page Program with Built-in Erase  
Buffer 1 to Main Memory Page Program without Built-in Erase  
Buffer 2 to Main Memory Page Program without Built-in Erase  
Page Erase  
Block Erase  
Main Memory Page Program Through Buffer 1  
Main Memory Page Program Through Buffer 2  
Table 3. Additional Commands  
Command  
SCK Mode  
Opcode  
Main Memory Page to Buffer 1 Transfer  
Main Memory Page to Buffer 2 Transfer  
Auto Page Rewrite Through Buffer 1(1)  
Auto Page Rewrite Through Buffer 2(1)  
Security Register Program(2)  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
53H  
55H  
58H  
59H  
9AH  
77H  
Security Register Read  
Notes: 1. This command should be used for applications requiring a high number of random page writes within a sector. See “Auto  
Page Rewrite” on page 6.  
2. The Security Register Program command utilizes data stored in Buffer 1. Therefore, this command must be used in conjunc-  
tion with the Buffer 1 write command. See the Security Register description on page 12 for details.  
16  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Table 4. Detailed Bit-level Addressing Sequence  
Address Byte  
Address Byte  
Address Byte  
Additional  
Don’t Care  
Bytes  
Opcode  
50H  
52H  
53H  
54H  
55H  
56H  
57H  
58H  
59H  
68H  
77H  
81H  
82H  
83H  
84H  
85H  
86H  
87H  
88H  
89H  
9AH  
9FH  
D2H  
D4H  
D6H  
D7H  
E8H  
Opcode  
Required  
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
0
0
0
0
0
0
0
0
0
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
0
1
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
0
0
0
0
0
0
0
0
1
1
1
0
0
0
0
0
0
0
0
1
1
1
1
0
0
0
0
1
0
0
0
1
1
1
1
0
0
0
1
0
0
0
1
1
1
1
0
0
0
1
0
1
1
1
0
0
1
1
0
0
1
1
0
0
0
1
0
1
1
0
0
1
1
0
0
1
1
1
0
1
1
0
0
0
1
0
1
0
1
0
1
0
1
1
0
1
0
1
0
1
0
1
0
1
0
0
0
1
0
r
r
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
x
P
P
x
x
P
P
x
x
P
P
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
N/A  
4 Bytes  
N/A  
1 Byte  
N/A  
1 Byte  
N/A  
N/A  
N/A  
4 Bytes  
4
r
x
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
x
B
B
B
B
B
B
B
B
B
B
N/A  
N/A  
N/A  
r
r
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
r
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
x
r
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
4
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
r
x
r
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
r
x
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
r
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A  
N/A  
N/A  
r
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
x
x
1
x
x
x
x
x
x
x
x
x
x
x
x
x
1
N/A  
N/A  
N/A  
1/0  
r
P
P
P
P
P
P
P
P
P
P
P
P
P
B
B
B
B
B
B
B
B
B
B
4
Note:  
r = Reserved Bit, P = Page Address Bit, B = Byte/Buffer Address Bit, x = Don’t Care  
17  
3387B–DFLSH–9/04  
Absolute Maximum Ratings*  
*NOTICE:  
Stresses beyond those listed under “Absolute  
Maximum Ratings” may cause permanent dam-  
age to the device. This is a stress rating only and  
functional operation of the device at these or any  
other conditions beyond those indicated in the  
operational sections of this specification is not  
implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device  
reliability.  
Temperature under Bias ................................ -55°C to +125°C  
Storage Temperature..................................... -65°C to +150°C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground...................................-0.6V to +6.25V  
All Output Voltages  
with Respect to Ground.............................-0.6V to VCC + 0.6V  
DC and AC Operating Range  
AT45DB321C  
0°C to 70°C  
-40°C to 85°C  
2.7V to 3.6V  
Com.  
Operating Temperature (Case)  
Ind.  
V
CC Power Supply(1)  
Note:  
1. After power is applied and VCC is at the minimum specified datasheet value, the system should wait 20 ms before an opera-  
tional mode is started.  
DC Characteristics  
Symbol  
Parameter  
Condition  
Min  
Typ  
Max  
Units  
CS, RESET, WP = VIH, all  
inputs at CMOS levels  
ISB  
Standby Current  
8
30  
µA  
Active Current, Read  
Operation, Serial Interface  
f = 20 MHz; IOUT = 0 mA;  
VCC = 3.6V  
(1)  
ICC1  
10  
45  
35  
35  
15  
65  
50  
50  
mA  
mA  
mA  
mA  
Active Current, Program  
Operation, Page Program  
ICC2  
ICC3  
ICC4  
VCC = 3.6V  
Active Current, Page Erase  
Operation  
VCC = 3.6V  
Active Current, Block Erase  
Operation  
VCC = 3.6V  
ILI  
Input Load Current  
Output Leakage Current  
Input Low Voltage  
VIN = CMOS levels  
VI/O = CMOS levels  
1
1
µA  
µA  
V
ILO  
VIL  
VIH  
VOL  
VOH  
VCC x 0.3  
Input High Voltage  
Output Low Voltage  
Output High Voltage  
VCC x 0.7  
V
IOL = 1.6 mA; VCC = 2.7V  
IOH = -100 µA  
0.4  
V
VCC - 0.2V  
V
Notes: 1. ICC1 during a buffer read is 30 mA maximum.  
18  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
AC Characteristics – Serial Interface  
Symbol  
Parameter  
Min  
Typ  
Max  
40  
Units  
MHz  
MHz  
ns  
(1)  
fSCK  
SCK Frequency  
(1)  
fCAR  
SCK Frequency for Continuous Array Read  
SCK High Time  
40  
tWH  
tWL  
tCS  
tCSS  
tCSH  
tCSB  
tSU  
tH  
10  
10  
SCK Low Time  
ns  
Minimum CS High Time  
CS Setup Time  
250  
250  
250  
ns  
ns  
CS Hold Time  
ns  
CS High to RDY/BUSY Low  
Data In Setup Time  
150  
ns  
3
6
0
ns  
Data In Hold Time  
ns  
tHO  
tDIS  
tV  
Output Hold Time  
ns  
Output Disable Time  
Output Valid  
10  
12  
ns  
ns  
tXFR  
Page to Buffer Transfer Time  
Page Erase and Programming Time  
Page Programming Time  
Page Erase Time  
250  
50  
µs  
(2)  
tEP  
20  
ms  
ms  
ms  
ms  
µs  
(2)  
tP  
14  
(2)  
tPE  
10  
30  
40  
(2)  
tBE  
Block Erase Time  
60  
tRST  
tREC  
tWPE  
tWPD  
RESET Pulse Width  
RESET Recovery Time  
WP Low to Protection Enabled  
WP High to Protection Disabled  
10  
1
1
1
µs  
µs  
µs  
Note:  
1. Maximum specified frequency for SPI compatibility is 33 MHz.  
2. Value are based on device characterization, not 100% tested in production.  
19  
3387B–DFLSH–9/04  
Input Test Waveforms and Measurement Levels  
3.0V  
AC  
AC  
1.5V  
DRIVING  
LEVELS  
MEASUREMENT  
LEVEL  
0V  
tR, tF < 2 ns (10% to 90%)  
Output Test Load  
AC Waveforms  
DEVICE  
UNDER  
TEST  
30 pF  
Four different timing waveforms are shown below. Waveform 1 shows the SCK signal  
being low when CS makes a high-to-low transition, and waveform 2 shows the SCK sig-  
nal being high when CS makes a high-to-low transition. In both cases, output SO  
becomes valid while the SCK signal is still low (SCK low time is specified as tWL). Timing  
waveforms 1 and 2 conform to RapidS serial interface but for frequencies up to 33 MHz  
and are compatible with SPI Mode 0 and SPI Mode 3 respectively. Waveforms 1 and 2  
are also compatible with inactive clock polarity low and inactive clock polarity high, since  
the maximum specified frequency in that case is 33 MHz.  
Waveform 3 and waveform 4 illustrate general timing diagram for RapidS serial inter-  
face. These are similar to waveform 1 and waveform 2, except that output SO is not  
restricted to become valid during the tWL period. These timing waveforms are valid over  
the full frequency range (maximum frequency = 40 MHz) of the RapidS serial case.  
20  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Waveform 1 – SPI Mode 0 Compatible (for Frequencies up to 33 MHz)  
tCS  
CS  
SCK  
SO  
tCSS  
tWH  
tWL  
tCSH  
tV  
tHO  
tDIS  
HIGH IMPEDANCE  
tSU  
HIGH IMPEDANCE  
VALID OUT  
tH  
SI  
VALID IN  
Waveform 2 – SPI Mode 3 Compatible (for Frequencies up to 33 MHz)  
tCS  
CS  
tCSS  
tWL  
tWH  
tCSH  
SCK  
SO  
tV  
tHO  
tDIS  
HIGH Z  
HIGH IMPEDANCE  
VALID OUT  
tH  
tSU  
VALID IN  
SI  
Waveform 3 – RapidS Mode 0 (for all Frequencies)  
tCS  
CS  
tCSS  
tWH  
tWL  
tCSH  
SCK  
SO  
SI  
tV  
tHO  
VALID OUT  
tDIS  
HIGH IMPEDANCE  
tSU  
HIGH IMPEDANCE  
tH  
VALID IN  
Waveform 4 – RapidS Mode 3 (for all Frequencies)  
tCS  
CS  
tCSS  
tWL  
tWH  
tCSH  
SCK  
SO  
tV  
tHO  
tDIS  
HIGH Z  
HIGH IMPEDANCE  
VALID OUT  
tH  
tSU  
VALID IN  
SI  
21  
3387B–DFLSH–9/04  
Reset Timing  
CS  
tREC  
tCSS  
SCK  
RESET  
SO  
tRST  
HIGH IMPEDANCE  
HIGH IMPEDANCE  
SI  
Note:  
The CS signal should be in the high state before the RESET signal is deasserted.  
Command Sequence for Read/Write Operations (except Status Register Read)  
SI  
CMD  
8 bits  
8 bits  
8 bits  
MSB  
r X X X X X X X  
X X X X X X X X  
X X X X X X X X  
LSB  
Reserved for  
larger densities  
Page Address  
(PA12-PA0)  
Byte/Buffer Address  
(BA9-BA0/BFA9-BFA0)  
Notes: 1. “r” designates bits reserved for larger densities.  
2. It is recommended that “r” be a logical “0” for densities of 32M bits or smaller.  
3. For densities larger than 32M bits, the “r” bit becomes the most significant Page Address bit for the appropriate density.  
22  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Write Operations  
The following block diagram and waveforms illustrate the various write sequences  
available.  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
BUFFER 1 TO  
MAIN MEMORY  
PAGE PROGRAM  
MAIN MEMORY  
PAGE PROGRAM  
THROUGH BUFFER 2  
BUFFER 2 TO  
MAIN MEMORY  
PAGE PROGRAM  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
MAIN MEMORY PAGE  
PROGRAM THROUGH  
BUFFER 1  
BUFFER 1  
WRITE  
BUFFER 2  
WRITE  
I/O INTERFACE  
SI  
Main Memory Page Program through Buffers  
· Completes writing into selected buffer  
· Starts self-timed erase/program operation  
CS  
BFA7-0  
r, PA12-6  
PA5-0, BFA9-8  
SI  
CMD  
n
n+1  
Last Byte  
Buffer Write  
· Completes writing into selected buffer  
CS  
SI  
CMD  
X
X···X, BFA9-8  
BFA7-0  
n
n+1  
Last Byte  
Buffer to Main Memory Page Program (Data from Buffer Programmed into Flash Page)  
Starts self-timed erase/program operation  
CS  
SI  
CMD  
r , PA12-6  
PA5-0, XX  
X
n = 1st byte write  
Each transition represents  
8 bits and 8 clock cycles  
n+1 = 2nd byte write  
23  
3387B–DFLSH–9/04  
Read Operations  
The following block diagram and waveforms illustrate the various read sequences  
available.  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
MAIN MEMORY  
MAIN MEMORY  
PAGE TO  
BUFFER 2  
PAGE TO  
BUFFER 1  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
BUFFER 1  
READ  
MAIN MEMORY  
PAGE READ  
BUFFER 2  
READ  
I/O INTERFACE  
SO  
Main Memory Page Read  
CS  
SI  
CMD  
r , PA12-6  
PA5-0, BA9-8  
BA7-0  
X
X
X
X
n
n+1  
SO  
Main Memory Page to Buffer Transfer (Data from Flash Page Read into Buffer)  
Starts reading page data into buffer  
CS  
SI  
CMD  
r , PA12-6  
PA5-0, XX  
X
SO  
Buffer Read  
CS  
CMD  
X
X···X, BFA9-8  
BFA7-0  
X
SI  
SO  
n
n+1  
n = 1st byte read  
Each transition represents  
8 bits and 8 clock cycles  
n+1 = 2nd byte read  
24  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Detailed Bit-level Read Timing – RapidS Serial Interface Mode 0  
Continuous Array Read (Opcode: E8H)  
CS  
SCK  
1
1
2
1
62  
X
63  
X
64  
X
65  
66  
67  
tSU  
SI  
tV  
DATA OUT  
LSB  
MSB  
HIGH IMPEDANCE  
SO  
D
7
D
6
D
5
D
2
D
1
D
0
D
7
D
6
D
5
BIT 4223  
OF  
PAGE n  
BIT 0  
OF  
PAGE n+1  
Main Memory Page Read (Opcode: D2H)  
CS  
SCK  
1
1
2
3
4
5
0
60  
61  
62  
X
63  
X
64  
X
65  
66  
67  
tSU  
COMMAND OPCODE  
SI  
1
0
1
X
X
tV  
DATA OUT  
HIGH IMPEDANCE  
D
7
D
6
D
5
D
4
SO  
MSB  
Buffer Read (Opcode: D4H or D6H)  
CS  
SCK  
1
1
2
3
4
5
0
36  
X
37  
X
38  
X
39  
X
40  
X
41  
42  
43  
t
SU  
COMMAND OPCODE  
SI  
1
0
1
t
V
DATA OUT  
HIGH IMPEDANCE  
D
7
D
6
D
5
D
4
SO  
MSB  
25  
3387B–DFLSH–9/04  
Detailed Bit-level Read Timing – RapidS Serial Interface Mode 0 (Continued)  
Status Register Read (Opcode: D7H)  
CS  
SCK  
1
1
2
1
3
4
5
6
7
1
8
1
9
10  
11  
12  
15  
16  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
tV  
STATUS REGISTER OUTPUT  
tV  
HIGH IMPEDANCE  
D
7
D
6
D
5
D
4
SO  
D
1
D
D
7
MSB  
0
LSB  
MSB  
DON’T CARE BYTE FOR  
FREQ. OVER 25 MHz  
Manufacturer and Device ID Read (Opcode: 9FH)  
CS  
SCK  
1
1
2
3
4
5
6
7
1
8
9
10  
11  
12  
16  
17  
18  
tSU  
COMMAND OPCODE  
SI  
0 -  
0
1
1
1
1
tV  
PRODUCT ID OUTPUT  
HIGH IMPEDANCE  
0
0
0
1
SO  
1
0
0
MSB  
LSB MSB  
MANUFACTURER ID  
26  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Detailed Bit-level Read Timing – RapidS Serial Interface Mode 3  
Continuous Array Read (Opcode: E8H)  
CS  
SCK  
1
2
63  
64  
65  
66  
67  
tSU  
SI  
1
1
X
X
X
tV  
DATA OUT  
LSB  
MSB  
HIGH IMPEDANCE  
SO  
D
7
D
6
D
5
D
2
D
1
D
0
D
7
D
6
D
5
BIT 4223  
OF  
PAGE n  
BIT 0  
OF  
PAGE n+1  
Main Memory Page Read (Opcode: D2H)  
CS  
SCK  
1
2
3
4
5
61  
62  
63  
64  
65  
66  
67  
68  
t
SU  
COMMAND OPCODE  
SI  
1
1
0
1
0
X
X
X
X
X
t
V
DATA OUT  
HIGH IMPEDANCE  
SO  
D
7
D
6
D
5
D
4
MSB  
Buffer Read (Opcode: D4H or D6H)  
CS  
SCK  
1
2
3
4
5
37  
38  
39  
40  
41  
42  
43  
44  
tSU  
COMMAND OPCODE  
SI  
1
1
0
1
0
X
X
X
X
X
tV  
DATA OUT  
HIGH IMPEDANCE  
SO  
D
7
D
6
D
5
D
4
MSB  
27  
3387B–DFLSH–9/04  
Detailed Bit-level Read Timing – RapidS Serial Interface Mode 3 (Continued)  
Status Register Read (Opcode: D7H)  
CS  
SCK  
1
2
3
4
5
6
7
8
9
10  
11  
12  
17  
18  
tSU  
COMMAND OPCODE  
SI  
1
1
0
1
0
1
1
1
tV  
STATUS REGISTER OUTPUT  
tV  
HIGH IMPEDANCE  
SO  
D
D
6
D
5
D
4
D
D
MSB  
D
6
7
0
LSB  
7
MSB  
DON’T CARE BYTE FOR  
FREQ. OVER 25 MHz  
Manufacturer and Device ID Read (Opcode: 9FH)  
CS  
SCK  
1
2
3
4
5
6
7
8
9
10  
11  
12  
17  
18  
t
SU  
COMMAND OPCODE  
SI  
1
0
0
1
1
1
1
1
t
V
PRODUCT ID OUTPUT  
HIGH IMPEDANCE  
SO  
0
0
0
1
1
0
0
MSB  
LSB  
MSB  
MANUFACTURER ID  
28  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Auto Page Rewrite Flowchart  
Figure 1. Algorithm for Programming or Reprogramming of the Entire Array Sequentially  
START  
provide address  
and data  
BUFFER WRITE  
(84H, 87H)  
MAIN MEMORY PAGE PROGRAM  
THROUGH BUFFER  
(82H, 85H)  
BUFFER TO MAIN  
MEMORY PAGE PROGRAM  
(83H, 86H)  
END  
Notes: 1. This type of algorithm is used for applications in which the entire array is programmed sequentially, filling the array page-by-  
page.  
2. A page can be written using either a Main Memory Page Program operation or a Buffer Write operation followed by a Buffer  
to Main Memory Page Program operation.  
3. The algorithm above shows the programming of a single page. The algorithm will be repeated sequentially for each page  
within the entire array.  
29  
3387B–DFLSH–9/04  
Auto Page Rewrite Flowchart (Continued)  
Figure 2. Algorithm for Randomly Modifying Data  
START  
provide address of  
page to modify  
MAIN MEMORY PAGE  
If planning to modify multiple  
bytes currently stored within  
a page of the Flash array  
TO BUFFER TRANSFER  
(53H, 55H)  
BUFFER WRITE  
(84H, 87H)  
MAIN MEMORY PAGE PROGRAM  
THROUGH BUFFER  
(82H, 85H)  
BUFFER TO MAIN  
MEMORY PAGE PROGRAM  
(83H, 86H)  
AUTO PAGE REWRITE(2)  
(58H, 59H)  
INCREMENT PAGE  
ADDRESS POINTER(2)  
END  
Notes: 1. To preserve data integrity, each page of a DataFlash sector must be updated/rewritten at least once within every 10,000  
cumulative page erase and program operations.  
2. A Page Address Pointer must be maintained to indicate which page is to be rewritten. The Auto Page Rewrite command  
must use the address specified by the Page Address Pointer.  
3. Other algorithms can be used to rewrite portions of the Flash array. Low-power applications may choose to wait until 10,000  
cumulative page erase and program operations have accumulated before rewriting all pages of the sector. See application  
note AN-4 (“Using Atmel’s Serial DataFlash”) for more details.  
30  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Sector Addressing  
PA12  
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2 - PA0  
Sector  
0
0
0
0
0
0
0
0
0
0
0
1
0
0
1
0
0
X
X
X
0
X
X
X
0
X
X
X
0
X
X
X
0
X
X
X
0
X
X
X
X
X
X
X
0a  
0b  
1
2
1
1
1
1
1
1
1
1
0
0
1
1
0
1
0
1
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
12  
13  
14  
15  
31  
3387B–DFLSH–9/04  
Ordering Information  
ICC (mA)  
fSCK  
(MHz)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
AT45DB321C-CC  
AT45DB321C-CNC  
AT45DB321C-TC  
24C1  
8CN3  
28T  
Commercial  
40  
15  
0.03  
(0°C to 70°C)  
AT45DB321C-CI  
AT45DB321C-TI  
24C1  
28T  
Industrial  
40  
15  
0.03  
(-40°C to 85°C)  
Green Package Options (Pb /Halide-free)  
ICC (mA)  
fSCK  
(MHz)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
AT45DB321C-CNU  
AT45DB321C-TU  
8CN3  
28T  
Industrial  
40  
15  
0.03  
(-40°C to 85°C)  
Legacy Package Options(1)  
ICC (mA)  
fSCK  
(MHz)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
Commercial  
40  
15  
0.03  
AT45DB321C-RC  
28R  
(0°C to 70°C)  
Industrial  
40  
15  
0.03  
AT45DB321C-RI  
28R  
(-40°C to 85°C)  
Note:  
1. Not recommended for new designs.  
Package Type  
24C3  
24-ball (5 x 5 Array), 1.0 mm Pitch, 6 x 8 x 1.2 mm, Plastic Chip-scale Ball Grid Array (CBGA)  
8-pad (6 mm x 8 mm) Chip Array Small Outline No Lead Package (CASON)  
28-lead, Plastic Thin Small Outline Package (TSOP)  
8CN3  
28T  
28R  
28-lead, 0.330” Wide, Plastic Gull Wing Small Outline Package (SOIC)  
32  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
Packaging Information  
24C3 – CBGA  
E
A1 Ball ID  
D
A1  
Top View  
A
1.00 REF  
E1  
Side View  
A1 Ball Corner  
e
2.00 REF  
A
B
C
D
E
COMMON DIMENSIONS  
(Unit of Measure = mm)  
D1  
MIN  
MAX  
NOM  
6.00  
NOTE  
SYMBOL  
E
5.90  
6.10  
E1  
D
4.0 TYP  
8.00  
e
7.90  
8.10  
D1  
A
4.0 TYP  
5
4
3
2
1
1.20  
Øb  
A1  
e
0.25  
Bottom View  
1.00 BSC  
0.40 TYP  
b
9/10/04  
DRAWING NO. REV.  
24C3  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
24C3, 24-ball (5 x 5 Array), 1.0 mm Pitch, 6 x 8 x 1.20 mm,  
Chip-scale Ball Grid Array Package (CBGA)  
A
R
33  
3387B–DFLSH–9/04  
8CN3 – CASON  
Marked Pin1 Indentifier  
E
A
D
A1  
Top View  
Side View  
Pin1 Pad Corner  
L1  
0.10 mm  
TYP  
8
1
e
7
2
3
COMMON DIMENSIONS  
(Unit of Measure = mm)  
6
5
MIN  
MAX  
1.0  
NOM  
NOTE  
SYMBOL  
b
A
4
A1  
b
0.17  
0.21  
0.41 TYP  
8.00  
0.25  
4
e1  
L
D
7.90  
5.90  
8.10  
6.10  
Bottom View  
E
6.00  
e
1.27 BSC  
1.095 REF  
0.67 TYP  
0.97  
e1  
L
4
4
L1  
0.92  
1.02  
Notes: 1. All dimensions and tolerance conform to ASME Y 14.5M, 1994.  
2. The surface finish of the package shall be EDM Charmille #24-27.  
3. Unless otherwise specified tolerance: Decimal ±0.05, Angular ±2o.  
4. Metal Pad Dimensions.  
7/10/03  
DRAWING NO. REV.  
8CN3  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
8CN3, 8-pad (6 x 8 x 1.0 mm Body), Lead Pitch 1.27 mm,  
Chip Array Small Outline No Lead Package (CASON)  
B
R
34  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
AT45DB321C [Preliminary]  
28T – TSOP, Type I  
PIN 1  
0º ~ 5º  
c
Pin 1 Identifier Area  
D1  
D
L
b
L1  
e
A2  
E
GAGE PLANE  
A
SEATING PLANE  
COMMON DIMENSIONS  
(Unit of Measure = mm)  
A1  
MIN  
MAX  
1.20  
0.15  
1.05  
13.60  
NOM  
NOTE  
SYMBOL  
A
A1  
A2  
D
0.05  
0.90  
13.20  
11.70  
7.90  
0.50  
1.00  
Notes:  
1. This package conforms to JEDEC reference MO-183.  
2. Dimensions D1 and E do not include mold protrusion. Allowable  
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.  
3. Lead coplanarity is 0.10 mm maximum.  
13.40  
11.80  
8.00  
D1  
E
11.90 Note 2  
8.10  
0.70  
Note 2  
L
0.60  
L1  
b
0.25 BASIC  
0.22  
0.17  
0.10  
0.27  
0.21  
c
e
0.55 BASIC  
12/06/02  
DRAWING NO. REV.  
28T  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
28T, 28-lead (8 x 13.4 mm) Plastic Thin Small Outline  
Package, Type I (TSOP)  
C
R
35  
3387B–DFLSH–9/04  
28R – SOIC  
B
E
E
1
PIN 1  
e
D
A
A
1
COMMON DIMENSIONS  
(Unit of Measure = mm)  
MIN  
MAX  
NOM  
NOTE  
SYMBOL  
~ 8º  
A
2.39  
0.050  
18.00  
11.70  
8.59  
2.79  
C
A1  
D
E
0.356  
18.50 Note 1  
L
12.50  
E1  
B
8.79  
0.508  
0.305  
1.27  
Note 1  
0.356  
0.203  
0.94  
C
L
Note: 1. Dimensions D and E1 do not include mold Flash  
or protrusion. Mold Flash or protrusion shall not exceed  
0.25 mm (0.010").  
e
1.27 TYP  
5/18/2004  
TITLE  
DRAWING NO. REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
28R, 28-lead, 0.330" Body Width,  
Plastic Gull Wing Small Outline (SOIC)  
28R  
R
C
36  
AT45DB321C [Preliminary]  
3387B–DFLSH–9/04  
Atmel Corporation  
Atmel Operations  
2325 Orchard Parkway  
San Jose, CA 95131, USA  
Tel: 1(408) 441-0311  
Fax: 1(408) 487-2600  
Memory  
RF/Automotive  
Theresienstrasse 2  
Postfach 3535  
74025 Heilbronn, Germany  
Tel: (49) 71-31-67-0  
Fax: (49) 71-31-67-2340  
2325 Orchard Parkway  
San Jose, CA 95131, USA  
Tel: 1(408) 441-0311  
Fax: 1(408) 436-4314  
Regional Headquarters  
Microcontrollers  
2325 Orchard Parkway  
San Jose, CA 95131, USA  
Tel: 1(408) 441-0311  
Fax: 1(408) 436-4314  
1150 East Cheyenne Mtn. Blvd.  
Colorado Springs, CO 80906, USA  
Tel: 1(719) 576-3300  
Europe  
Atmel Sarl  
Route des Arsenaux 41  
Case Postale 80  
CH-1705 Fribourg  
Switzerland  
Tel: (41) 26-426-5555  
Fax: (41) 26-426-5500  
Fax: 1(719) 540-1759  
Biometrics/Imaging/Hi-Rel MPU/  
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Avenue de Rochepleine  
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Tel: (33) 2-40-18-18-18  
Fax: (33) 2-40-18-19-60  
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38521 Saint-Egreve Cedex, France  
Tel: (33) 4-76-58-30-00  
Fax: (33) 4-76-58-34-80  
Asia  
Room 1219  
Chinachem Golden Plaza  
77 Mody Road Tsimshatsui  
East Kowloon  
Hong Kong  
Tel: (852) 2721-9778  
Fax: (852) 2722-1369  
ASIC/ASSP/Smart Cards  
Zone Industrielle  
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Tel: (33) 4-42-53-60-00  
Fax: (33) 4-42-53-60-01  
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Colorado Springs, CO 80906, USA  
Tel: 1(719) 576-3300  
Japan  
9F, Tonetsu Shinkawa Bldg.  
1-24-8 Shinkawa  
Chuo-ku, Tokyo 104-0033  
Japan  
Tel: (81) 3-3523-3551  
Fax: (81) 3-3523-7581  
Fax: 1(719) 540-1759  
Scottish Enterprise Technology Park  
Maxwell Building  
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Tel: (44) 1355-803-000  
Fax: (44) 1355-242-743  
Literature Requests  
www.atmel.com/literature  
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© Atmel Corporation 2004. All rights reserved. Atmel®, logo and combinations thereof, and DataFlash® are registered trademarks, and  
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Printed on recycled paper.  
3387B–DFLSH–9/04  
/xM  

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