AT45DB321C-RI [ATMEL]
32 MEGABIT 2.7 VOLT DATAFLASH; 32兆位2.7伏的DataFlash型号: | AT45DB321C-RI |
厂家: | ATMEL |
描述: | 32 MEGABIT 2.7 VOLT DATAFLASH |
文件: | 总37页 (文件大小:613K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Features
• Single 2.7 - 3.6V Supply
• RapidS™ Serial Interface: 40 MHz Maximum Clock Frequency
(SPI Modes 0 and 3 Compatible for Frequencies Up to 33 MHz)
• Page Program
– 8192 Pages (528 Bytes/Page)
• Automated Erase Operations
– Page Erase 528 Bytes
– Block Erase 4,224 Bytes
• Two 528-byte SRAM Data Buffers – Allows Receiving of Data
while Reprogramming the Flash Array
• Continuous Read Capability through Entire Array
– Ideal for Code Shadowing Applications
• Low-power Dissipation
– 10 mA Active Read Current Typical – Serial Interface
– 8 µA CMOS Standby Current Typical
• Hardware and Software Data Protection Features
– Individual Sector Locking
32-megabit
2.7 volt
DataFlash®
• Security: 128-byte Security Register
– 64-byte User Programmable Space
– Unique 64-byte Device Identifier
• JEDEC Standard Manufacturer and Device ID Read
• 100,000 Program/Erase Cycles per Page
• Data Retention – 20 years
AT45DB321C
Preliminary
• Commercial and Industrial Temperature Ranges
• Green (Pb/Halide-free) Packaging Options
Description
The AT45DB321C is an SPI compatible, serial-interface Flash memory ideally suited
for a wide variety of digital voice-, image-, program code- and data-
storage applications. The AT45DB321C supports a 4-wire serial interface known as
RapidS for applications requiring very high speed operations.
Pin Configurations
TSOP Top View – Type 1
Pin Name
Function
RDY/BUSY
RESET
WP
1
28
27
26
25
24
23
22
21
20
19
18
17
16
15
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
2
CS
Chip Select
Serial Clock
Serial Input
Serial Output
3
NC
4
NC
5
SCK
SI
VCC
GND
NC
6
7
8
NC
9
SO
NC
10
11
12
13
14
CS
SCK
SI
Hardware Page
Write Protect Pin
WP
SO
RESET
Chip Reset
CASON – Top View
through Package
CBGA Top View
through Package
RDY/BUSY Ready/Busy
1
2
3
4
5
DataFlash Card(1)
Top View through Package
SI
SCK
1
2
3
4
8
7
6
5
SO
GND
VCC
WP
RESET
CS
A
B
C
D
E
NC
NC
NC
NC
7
6 5 4 3 2 1
NC SCK GND VCC NC
NC
NC
NC
CS RDY/BSY WP NC
SO
NC
SI RESET NC
NC
NC NC
3387B–DFLSH–9/04
Note:
1. See AT45DCB004 Datasheet
Its 34,603,008 bits of memory are organized as 8192 pages of 528 bytes each. In addi-
tion to the 33-megabit main memory, the AT45DB321C also contains two SRAM
buffers of 528 bytes each.
The buffers allow the receiving of data while a page in the main page Memory is being
reprogrammed, as well as writing a continuous data stream. EEPROM emulation (bit or
byte alterability) is easily handled with a self-contained three step read-modify-write
operation. Unlike conventional Flash memories that are accessed randomly with multi-
ple address lines and a parallel interface, the DataFlash uses a RapidS serial interface
to sequentially access its data. The simple sequential access dramatically reduces
active pin count, facilitates hardware layout, increases system reliability, minimizes
switching noise, and reduces package size. The device is optimized for use in many
commercial and industrial applications where high-density, low-pin count, low-voltage
and low-power are essential. The device operates at clock frequencies up to 40 MHz
with a typical active read current consumption of 10 mA.
To allow for simple in-system reprogrammability, the AT45DB321C does not require
high input voltages for programming. The device operates from a single power supply,
2.7V to 3.6V, for both the program and read operations. The AT45DB321C is enabled
through the chip select pin (CS) and accessed via a three-wire interface consisting of
the Serial Input (SI), Serial Output (SO), and the Serial Clock (SCK).
All programming and erase cycles are self-timed.
Block Diagram
WP
FLASH MEMORY ARRAY
PAGE (528 BYTES)
BUFFER 1 (528 BYTES)
BUFFER 2 (528 BYTES)
SCK
CS
I/O INTERFACE
RESET
VCC
GND
RDY/BUSY
SI
SO
Memory Array
To provide optimal flexibility, the memory array of the AT45DB321C is divided into three
levels of granularity comprising of sectors, blocks, and pages. The “Memory Architec-
ture Diagram” illustrates the breakdown of each level and details the number of pages
per sector and block. All program operations to the DataFlash occur on a page by page
basis. The erase operations can be performed at the block or page level.
2
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Memory Architecture Diagram
SECTOR ARCHITECTURE
BLOCK ARCHITECTURE
PAGE ARCHITECTURE
BLOCK 0
BLOCK 1
BLOCK 2
8 Pages
PAGE 0
PAGE 1
SECTOR 0a
SECTOR 0a = 8 Pages
4224 bytes (4K + 128)
SECTOR 0b = 504 Pages
266,112 bytes (252K + 8064)
PAGE 6
PAGE 7
PAGE 8
PAGE 9
BLOCK 62
BLOCK 63
BLOCK 64
BLOCK 65
SECTOR 1 = 512 Pages
270,336 bytes (256K + 8K)
SECTOR 2 = 512 Pages
270,336 bytes (256K + 8K)
PAGE 14
PAGE 15
PAGE 16
PAGE 17
PAGE 18
BLOCK 126
BLOCK 127
BLOCK 128
BLOCK 129
SECTOR 14 = 512 Pages
270,336 bytes (256K + 8K)
PAGE 8189
PAGE 8190
PAGE 8191
SECTOR 15 = 512 Pages
270,336 bytes (256K + 8K)
BLOCK 1022
BLOCK 1023
Block = 4224 bytes
(4K + 128)
Page = 528 bytes
(512 + 16)
Device Operation
The device operation is controlled by instructions from the host processor. The list of
instructions and their associated opcodes are contained in Tables 1 through 4. A valid
instruction starts with the falling edge of CS followed by the appropriate 8-bit opcode
and the desired buffer or main memory address location. While the CS pin is low, tog-
gling the SCK pin controls the loading of the opcode and the desired buffer or main
memory address location through the SI (serial input) pin. All instructions, addresses,
and data are transferred with the most significant bit (MSB) first.
Buffer addressing is referenced in the datasheet using the terminology BFA9-BFA0 to
denote the 10 address bits required to designate a byte address within a buffer. Main
memory addressing is referenced using the terminology PA12-PA0 and BA9-BA0,
where PA12-PA0 denotes the 13 address bits required to designate a page address and
BA9-BA0 denotes the 10 address bits required to designate a byte address within the
page.
Read Commands
By specifying the appropriate opcode, data can be read from the main memory or from
either one of the two SRAM data buffers. The DataFlash supports RapidS protocol for
Mode 0 and Mode 3. Please refer to the “Detailed Bit-level Read Timing” diagrams in
this datasheet for details on the clock cycle sequences for each mode.
CONTINUOUS ARRAY READ: By supplying an initial starting address for the main
memory array, the Continuous Array Read command can be utilized to sequentially
read a continuous stream of data from the device by simply providing a clock signal; no
additional addressing information or control signals need to be provided. The DataFlash
incorporates an internal address counter that will automatically increment on every clock
cycle, allowing one continuous read operation without the need of additional address
sequences. To perform a continuous read, an opcode of E8H must be clocked into the
device. The opcode is followed by three address bytes (which comprises 24-bit page
and byte address sequence) and 32 don’t care clock cycles. The first bit of the 24-bit
address sequence is reserved for upward and downward compatibility to larger and
3
3387B–DFLSH–9/04
smaller density devices (see the notes under “Command Sequence for Read/Write
Operations (except Status Register Read)” on page 22. The next 13 bits (PA12-PA0) of
the 24-bit address sequence specify which page of the main memory array to read, and
the last 10 bits (BA9-BA0) of the 24-bit address sequence specify the starting byte
address within the page. The 32 don’t care clock cycles that follow the four address
bytes are needed to initialize the read operation. Following the don’t care clock cycles,
additional clock pulses on the SCK pin will result in data being output on the SO (serial
output) pin.
The CS pin must remain low during the loading of the opcode, the address bytes, the
don’t care bytes, and the reading of data. When the end of a page in main memory is
reached during a Continuous Array Read, the device will continue reading at the begin-
ning of the next page with no delays incurred during the page boundary crossover (the
crossover from the end of one page to the beginning of the next page). When the last bit
in the main memory array has been read, the device will continue reading back at the
beginning of the first page of memory. As with crossing over page boundaries, no delays
will be incurred when wrapping around from the end of the array to the beginning of the
array.
A low-to-high transition on the CS pin will terminate the read operation and tri-state the
output pin (SO). The maximum SCK frequency allowable for the Continuous Array Read
is defined by the fCAR specification. The Continuous Array Read bypasses both data
buffers and leaves the contents of the buffers unchanged.
MAIN MEMORY PAGE READ: A main memory page read allows the user to read data
directly from any one of the 8192 pages in the main memory, bypassing both of the data
buffers and leaving the contents of the buffers unchanged. To start a page read, an
opcode of D2H must be clocked into the device. The opcode is followed by three
address bytes (which comprise 24-bit page and byte address sequence) and 32 don’t
care clock cycles. The first bit of the 24-bit address sequence is a reserved bit, the next
13 bits (PA12-PA0) of the 24-bit address sequence specify the page in main memory to
be read, and the last 10 bits (BA9-BA0) of the 24-bit address sequence specify the start-
ing byte address within that page. The 32 don’t care clock cycles that follow the three
address bytes are sent to initialize the read operation. Following the don’t care bytes,
additional pulses on SCK result in data being output on the SO (serial output) pin. The
CS pin must remain low during the loading of the opcode, the address bytes, the don’t
care bytes, and the reading of data. When the end of a page in main memory is
reached, the device will continue reading back at the beginning of the same page. A
low-to-high transition on the CS pin will terminate the read operation and tri-state the
output pin (SO). The maximum SCK frequency allowable for the Main Memory Page
Read is defined by the fSCK specification. The Main Memory Page Read bypasses both
data buffers and leaves the contents of the buffers unchanged.
BUFFER READ: Data can be read from either one of the two buffers, using different
opcodes to specify which buffer to read from. An opcode of D4H is used to read data
from buffer 1, and an opcode of D6H is used to read data from buffer 2. To perform a
buffer read, the opcode must be clocked into the device followed by three address bytes
comprised of 14 don’t care bits and 10 buffer address bits (BFA9-BFA0). Following the
three address bytes, an additional don’t care byte must be clocked in to initialize the
read operation. Since the buffer size is 528 bytes, 10 buffer address bits are required to
specify the first byte of data to be read from the buffer. The CS pin must remain low dur-
ing the loading of the opcode, the address bytes, the don’t care bytes, and the reading
of data. When the end of a buffer is reached, the device will continue reading back at the
beginning of the buffer. A low-to-high transition on the CS pin will terminate the read
operation and tri-state the output pin (SO).
4
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Program and Erase
Commands
BUFFER WRITE: Data can be clocked in from the SI pin into either buffer 1 or buffer 2.
To load data into either buffer, a 1-byte opcode, 84H for buffer 1 or 87H for buffer 2,
must be clocked into the device, followed by three address bytes comprised of 14 don’t
care bits and 10 buffer address bits (BFA9-BFA0). The 10 buffer address bits specify
the first byte in the buffer to be written. After the last address byte has been clocked into
the device, data can then be clocked in on subsequent clock cycles. If the end of the
data buffer is reached, the device will wrap around back to the beginning of the buffer.
Data will continue to be loaded into the buffer until a low-to-high transition is detected on
the CS pin.
BUFFER TO MAIN MEMORY PAGE PROGRAM WITH BUILT-IN ERASE: Data written
into either buffer 1 or buffer 2 can be programmed into the main memory. To start the
operation, an 8-bit opcode, 83H for buffer 1 or 86H for buffer 2, must be clocked into the
device followed by three address bytes consisting of one reserved bit, 13 page address
bits (PA12-PA0) that specify the page in the main memory to be written and 10 don’t
care bits. When a low-to-high transition occurs on the CS pin, the part will first erase the
selected page in main memory (the erased state is a logic 1) and then program the data
stored in the buffer into the specified page in main memory. Both the erase and the pro-
gramming of the page are internally self-timed and should take place in a maximum time
of tEP. During this time, the status register and the RDY/BUSY pin will indicate that the
part is busy.
BUFFER TO MAIN MEMORY PAGE PROGRAM WITHOUT BUILT-IN ERASE: A previ-
ously-erased page within main memory can be programmed with the contents of either
buffer 1 or buffer 2. To start the operation, an 8-bit opcode, 88H for buffer 1 or 89H for
buffer 2, must be clocked into the device followed by three address bytes consisting of
one reserved bit, 13 page address bits (PA12-PA0) that specify the page in the main
memory to be written and 10 don’t care bits. When a low-to-high transition occurs on the
CS pin, the part will program the data stored in the buffer into the specified page in the
main memory. It is necessary that the page in main memory that is being programmed
has been previously erased using one of the erase commands (Page Erase or Block
Erase). The programming of the page is internally self-timed and should take place in a
maximum time of tP. During this time, the status register and the RDY/BUSY pin will indi-
cate that the part is busy.
PAGE ERASE: The Page Erase command can be used to individually erase any page
in the main memory array allowing the Buffer to Main Memory Page Program without
Built-in Erase command to be utilized at a later time. To perform a page erase, an
opcode of 81H must be loaded into the device, followed by three address bytes com-
prised of one reserved bit, 13 page address bits (PA12-PA0) that specify the page in the
main memory to be erased and 10 don’t care bits. When a low-to-high transition occurs
on the CS pin, the part will erase the selected page (the erased state is a logic 1). The
erase operation is internally self-timed and should take place in a maximum time of tPE.
During this time, the status register and the RDY/BUSY pin will indicate that the part is
busy.
BLOCK ERASE: A block of eight pages can be erased at one time. This command is
useful when large amounts of data has to be written into the device. This will avoid using
multiple Page Erase Commands. To perform a block erase, an opcode of 50H must be
loaded into the device, followed by three address bytes comprised of one reserved bit,
10 page address bits (PA12-PA3) and 13 don’t care bits. The 10 page address bits are
used to specify which block of eight pages is to be erased. When a low-to-high transition
occurs on the CS pin, the part will erase the selected block of eight pages. The erase
operation is internally self-timed and should take place in a maximum time of tBE. During
this time, the status register and the RDY/BUSY pin will indicate that the part is busy.
5
3387B–DFLSH–9/04
Block Erase Addressing
PA12
PA11
PA10
PA9
PA8
0
PA7
0
PA6
0
PA5
0
PA4
0
PA3
0
PA2
X
PA1
X
PA0
X
Block
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
2
3
0
0
0
0
0
0
1
X
X
X
0
0
0
0
0
1
0
X
X
X
0
0
0
0
0
1
1
X
X
X
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
1
1
0
1
0
1
X
X
X
X
X
X
X
X
X
X
X
X
1020
1021
1022
1023
MAIN MEMORY PAGE PROGRAM THROUGH BUFFER: This operation is a combina-
tion of the Buffer Write and Buffer to Main Memory Page Program with Built-in Erase
operations. Data is first clocked into buffer 1 or buffer 2 from the input pin (SI) and then
programmed into a specified page in the main memory. To initiate the operation, an 8-bit
opcode, 82H for buffer 1 or 85H for buffer 2, must first be clocked into the device, fol-
lowed by three address bytes. The address bytes are comprised of one reserved bit, 13
page address bits (PA12-PA0) that select the page in the main memory where data is to
be written, and 10 buffer address bits (BFA9-BFA0) that select the first byte in the buffer
to be written. After all address bytes are clocked in, the part will take data from the input
pins and store it in the specified data buffer. If the end of the buffer is reached, the
device will wrap around back to the beginning of the buffer. When there is a low-to-high
transition on the CS pin, the part will first erase the selected page in main memory to all
1s and then program the data stored in the buffer into that memory page. Both the erase
and the programming of the page are internally self-timed and should take place in a
maximum time of tEP. During this time, the status register and the RDY/BUSY pin will
indicate that the part is busy.
Additional Commands
MAIN MEMORY PAGE TO BUFFER TRANSFER: A page of data can be transferred
from the main memory to either buffer 1 or buffer 2. To start the operation, a 1-byte
opcode, 53H for buffer 1 and 55H for buffer 2, must be clocked into the device, followed
by three address bytes comprised of one reserved bit, 13 page address bits (PA12-
PA0), which specify the page in main memory that is to be transferred, and 10 don’t care
bits. The CS pin must be low while toggling the SCK pin to load the opcode and the
address bytes from the input pin (SI). The transfer of the page of data from the main
memory to the buffer will begin when the CS pin transitions from a low to a high state.
During the transfer of a page of data (tXFR), the status register can be read or the
RDY/BUSY can be monitored to determine whether the transfer has been completed.
AUTO PAGE REWRITE: This mode is only needed if multiple bytes within a page or
multiple pages of data are modified in a random fashion. This mode is a combination of
two operations: Main Memory Page to Buffer Transfer and Buffer to Main Memory Page
Program with Built-in Erase. A page of data is first transferred from the main memory to
buffer 1 or buffer 2, and then the same data (from buffer 1 or buffer 2) is programmed
back into its original page of main memory. To start the rewrite operation, a 1-byte
opcode, 58H for buffer 1 or 59H for buffer 2, must be clocked into the device, followed
by three address bytes comprised of one reserved bit, 13 page address bits (PA12-PA0)
6
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
that specify the page in main memory to be rewritten and 10 don’t care bits. When a low-
to-high transition occurs on the CS pin, the part will first transfer data from the page in
main memory to a buffer and then program the data from the buffer back into same
page of main memory. The operation is internally self-timed and should take place in a
maximum time of tEP. During this time, the status register and the RDY/BUSY pin will
indicate that the part is busy.
If a sector is programmed or reprogrammed sequentially page by page, then the pro-
gramming algorithm shown in Figure 1 on page 29 is recommended. Otherwise, if
multiple bytes in a page or several pages are programmed randomly in a sector, then
the programming algorithm shown in Figure 2 on page 30 is recommended. Each page
within a sector must be updated/rewritten at least once within every 10,000 cumulative
page erase/program operations in that sector.
STATUS REGISTER READ: The status register can be used to determine the device’s
ready/busy status, or whether the sector protection has been enabled. To read the sta-
tus register, an opcode of D7H must be loaded into the device. After the opcode and
optional dummy byte is clocked in, the 1-byte status register will be clocked out on the
output pin (SO), starting with the next clock cycle. For applications over 25 MHz, the
opcode must be always followed with a dummy (don’t care) byte. The data in the status
register, starting with the MSB (bit 7), will be clocked out on the SO pin during the next
eight clock cycles.
The most-significant bits of the status register will contain device information, while the
remaining least-significant bit is reversed for future use and will have undefined value.
After the one byte of the status register has been clocked out, the sequence will repeat
itself (as long as CS remains low and SCK is being toggled). The data in the status reg-
ister is constantly updated, so each repeating sequence will output new data.
Ready/busy status is indicated using bit 7 of the status register. If bit 7 is a 1, then the
device is not busy and is ready to accept the next command. If bit 7 is a 0, then the
device is in a busy state. There are many operations that can cause the device to be in
a busy state: Main Memory Page to Buffer Transfer, Buffer to Main Memory Page Pro-
gram with Built-in Erase, Buffer to Main Memory Page Program without Built-in Erase,
Page Erase, Block Erase, Main Memory Page Program, and Auto Page Rewrite.
Bit 1 in the Status Register is used to provide information to the user whether or not the
sector protection has been enabled or disabled, either by software-controlled method or
hardware-controlled method. A logic 1 indicates that sector protection has been enabled
and logic 0 indicates that sector protection has been disabled.
The device density is indicated using bits 5, 4, 3, and 2 of the status register. For the
AT45DB321C, the four bits are 1,1, 0, 1. The decimal value of these four binary bits
does not equate to the device density; the four bits represent a combinational code
relating to differing densities of DataFlash devices. The device density is not the same
as the density code indicated in the JEDEC device ID information. The device density is
provided only for backward compatibility.
Status Register Format
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
RDY/BUSY
X
1
1
0
1
Protect
X
7
3387B–DFLSH–9/04
Sector Protection
Two protection methods, hardware and software controlled, are provided. The selection
of which sectors to be protected/unprotected from program and erase operations is
defined in the Sector Protection Register.
SOFTWARE SECTOR PROTECTION: Sectors specified for protection in the Sector
Protection Register can be protected from program and erase operations by issuing the
Enable Sector Protection command. To enable the sector protection using the software
controlled method, the CS pin must first be asserted as it would be with any other com-
mand. Once the CS pin has been asserted, the appropriate 4-byte command sequence
must be clocked in via the input pin (SI). After the last bit of the command sequence has
been clocked in, the CS pin must be deasserted after which the sector protection will be
enabled.
Command
Byte 1
3DH
Byte 2
2AH
Byte 3
7FH
Byte 4
A9H
Enable Sector Protection
Disable Sector Protection
Read Sector Protection Register
3DH
2AH
7FH
9AH
32H
00H
00H
00H
To disable the sector protection using the software controlled method, the CS pin must
first be asserted as it would be with any other command. Once the CS pin has been
asserted, the appropriate 4-byte sequence for the Disable Sector Protection command
must be clocked in via the input pin (SI). After the last bit of the command sequence has
been clocked in, the CS pin must be deasserted after which the sector protection will be
disabled. The Disable Sector Protection command is ignored while the WP pin is
asserted.
Software Sector Protection is useful in applications in which the WP pin is not or cannot
be controlled by a host processor. In such instances, the WP pin may be left floating (the
WP pin is pulled high internally) and sector protection can be controlled using the soft-
ware commands.
If the device is power cycled, then the Software Sector Protection will be disabled. Once
the device is powered up, the Enable Sector Protection command should be reissued if
sector protection is desired and if the WP pin is not used. The RESET pin has no effect
on the Software Sector Protection.
HARDWARE SECTOR PROTECTION: Sectors specified for protection in Sector Pro-
tection Register can be protected from program and erase operations by utilizing the
Write Protection (WP) pin. The protection can be enabled by asserting the WP pin and
keeping the pin in its asserted state. Any sector specified for protection cannot be
erased or reprogrammed as long as the WP pin is asserted. The protection can be dis-
abled by deasserting the WP pin high. A filter is provided on the WP pin to help protect
against spurious noise on the WP pin. Hardware Sector Protection will provide continu-
ous protection, based on the contents of the Sector Protection Register, in an
application where WP is always driven low. Please read the description of the WP pin on
page 13 for more information.
SECTOR PROTECTION REGISTER: Sector Protection Register is a nonvolatile regis-
ter that contains 16 bytes of data, as shown below:
Sector Number
Protected
0 (0a, 0b)
1 to 15
FFH
See Below
Unprotected
00H
8
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Sector 0 (0a, 0b):
0b
(Page 8-255)
Bit 4, 5
0b
(Page 256-511)
Bit 2, 3
0a
–
Data
Value
Bit 6, 7
Bit 0, 1
00
Sectors 0a, 0b
Unprotected
00
00
00
00H
Protect Sector 0a
11
00
00
11
00
00
00
00
C0H
30H
Protect Sector 0b
(Page 8-255)
Protect Sector 0b
(Page 256-511)
00
11
00
11
11
11
00
00
0CH
FCH
Protect Sectors 0a,
0b (Page 8-255), 0b
(Page 256-511)(1)
Protect Sectors 0a,
0b (Page 8-255)
11
11
00
00
F0H
Note:
1. Default value for devices shipped from Atmel.
2. When protecting or unprotecting sector 0b (pages 8-511), we recommend protecting
or unprotecting the entire sector 0b simultaneously.
ERASING THE SECTOR PROTECTION REGISTER: To erase the Sector Protection
Register, the CS pin must first be asserted. Once the CS pin has been asserted, the
4-byte erase command sequence must be clocked in via the SI (serial input) pin. After
the last bit of the command sequence has been clocked in, the CS pin must be deas-
serted to initiate the internally self-timed erase cycle (tPE). The Ready/Busy status will
indicate that the device is busy during the erase cycle. The erased state of each bit (of a
byte) in the Sector Protection Register indicates that the corresponding sector is flagged
for protection. The RESET pin is disabled during this erase cycle to prevent incomplete
erasure of the Sector Protection Register.
Command
Byte 1
Byte 2
Byte 3
Byte 4
Erase Sector Protection Register
3DH
2AH
7FH
CFH
PROGRAMMING THE SECTOR PROTECTION REGISTER: To program the Sector
Protection Register, the CS pin must first be asserted. Once the CS pin has been
asserted, the 4-byte command sequence must be clocked in via the SI (serial input) pin.
After the last bit of the command sequence has been clocked in, the data for the con-
tents of the Sector Protection Register must be clocked in. The first byte corresponds to
sector 0 (0a, 0b), the second byte corresponds to Sector 1 and the last byte (byte 16)
corresponds to Sector 15. After the last bit of data has been clocked in, the CS pin must
be deasserted to initiate the internally self-timed program cycle (tP). The Ready/Busy
status will indicate that the device is busy during the program cycle. The RESET pin is
disabled during this program cycle to prevent incomplete programming of the sector pro-
tection register.
Command
Byte 1
Byte 2
Byte 3
Byte 4
Program Sector Protection Register
3DH
2AH
7FH
FCH
READING THE SECTOR PROTECTION REGISTER: To read the Sector Protection
Register, the CS pin must first be asserted. Once the CS pin has been asserted, a
4-byte command sequence 32H, 00H, 00H, 00H and 32 don’t care clock cycles must be
clocked in via the SI (serial input) pin. The 32 don’t care clock cycles are required to ini-
9
3387B–DFLSH–9/04
tialize the read operation. After the 32 don’t care clock cycles, any additional clock
pulses on the SCK pin will result in data being output on the SO (serial output) pin. The
read will begin with Byte_1 of the Sector Protection Register for Sector_0, followed with
Byte_2 for Sector_1. The read operation will continue until Byte_16 for Sector_15 is
read. Once the last byte is read a low-to-high transition on the CS pin is required to ter-
minate the read operation.
Command
Byte 1
Byte 2
Byte 3
Byte 4
Read Sector Protection Register
32H
00H
00H
00H
VARIOUS ASPECTS ABOUT THE SECTOR PROTECTION REGISTER: Due to the
sharing of the internal circuitry, the contents of the buffer 1 will get modified during the
erase and programming of Sector Protection Register. If the device is powered down
during erasing or programming the sector protection register, then the contents of the
Sector Protection Register cannot be guaranteed. The Sector Protection Register can
be erased or reprogrammed with the sector protection enabled or disabled. Being able
to reprogram the Sector Protection Register with the sector protection enabled allows
the user to temporarily disable the sector protection to an individual sector rather than
disabling the sector protection completely.
The Sector Protection Register is subject to the same endurance characteristics as the
main memory array. Users are encouraged to carefully evaluate the number of times the
Sector Protection Register will be modified during the course of the applications’ life
cycle. If the application requires that the Sector Protection Register be modified more
than the specified endurance of the DataFlash because the application needs to tempo-
rarily unprotect individual sectors (sector protection remains enabled while the Sector
Protection Register is reprogrammed), then the application will need to limit this prac-
tice. Instead, a combination of temporarily unprotecting individual sectors along with
disabling sector protection completely will need to be implemented by the application to
ensure that the endurance limits of the device are not exceeded.
10
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Manufacturer and Device ID Read
This instruction conforms to the JEDEC standard and allows the user to read the Manufacturer ID, Device ID, and Extended
Device Information. A 1-byte opcode, 9FH, must be clocked into the device while the CS pin is low. After the opcode is
clocked in, the Manufacturer ID, 2 bytes of Device ID and Extended Device Information will be clocked out on the SO pin.
The fourth byte of the sequence output is the Extended Device Information String Length byte. This byte is used to signify
how many bytes of Extended Device Information will be output.
Manufacturer and Device ID Information
Byte 1 – Manufacturer ID
JEDEC Assigned Code
Hex
Value
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
1FH
0
0
0
1
1
1
1
1
Manufacturer ID
1FH = Atmel
Byte 2 – Device ID (Part 1)
Family Code
Hex
Density Code
Value
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
Family Code
Density Code
001 = DataFlash
00111 = 32-Mbit
27H
0
0
1
0
0
1
1
1
Byte 3 – Device ID (Part 2)
MLC Code
Hex
Product Version Code
Value
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
MLC Code
000 = 1-bit/Cell Technology
00000 = Initial Version
00H
0
0
0
0
0
0
0
0
Product Version
Byte 4 – Extended Device Information String Length
Byte Count
Hex
Value
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
00H
0
0
0
0
0
0
0
0
Byte Count
00H = 0 Bytes of Information
CS
9FH
SI
Opcode
1FH
27H
00H
00H
Data
Data
SO
Manufacturer ID
Byte n
Device ID
Byte 1
Device ID
Byte 2
Extended
Device
Extended
Device
Information
Byte x
Extended
Device
Information
Byte x + 1
Information
String Length
This information
would only be output
if the Extended Device
Information String Length
value was something
other than 00H.
Each transition represents
8 bits and 8 clock cycles
Note:
Based on JEDEC publication 106 (JEP106), Manufacturer ID data can be comprised of any number of bytes. Some manufacturers may have
Manufacturer ID codes that are two, three or even four bytes long with the first byte(s) in the sequence being 7FH. A system should detect code
7FH as a “Continuation Code” and continue to read Manufacturer ID bytes. The first non-7FH byte would signify the last byte of Manufacturer ID
data. For Atmel (and some other manufacturers), the Manufacturer ID data is comprised of only one byte.
11
3387B–DFLSH–9/04
Security Register
The AT45DB321C contains a specialized register that can be used for security pur-
poses in system design. The Security Register is a unique 128-byte register that is
divided into two portions. The first 64 bytes (byte 0 to byte 63) of this page are allocated
as a one-time user programmable space. Once these 64 bytes have been programmed,
they should not be reprogrammed. The remaining 64 bytes of this page (byte 64 to byte
127) are factory programmed by Atmel and will contain a unique number for each
device. The factory programmed data is fixed and cannot be changed.
The Security Register can be read by clocking in opcode 77H to the device followed by
three address bytes (which are comprised of 14 don’t care bits plus 10 address bits) and
32 don’t care clock cycles. See the opcode table on page 17.
To program the first 64 bytes of the Security Register, a two step sequence must be
used. The first step requires that the user loads the desired data into Buffer 1 by using
the Buffer 1 Write operation (opcode 84H – see Buffer Write description on page 5). The
user should specify the starting buffer address as location zero and should write a full
64 bytes of information into the buffer. Otherwise, the first 64 bytes of the buffer may
contain data that was previously stored in the buffer. It is not necessary to fill the remain-
ing 464 bytes (byte locations 64 through 127) of the buffer with data. After the Buffer 1
Write operation has been completed, the Security Register can be subsequently pro-
grammed by reselecting the device and clocking in opcode 9AH into the device followed
by three don’t care bytes (24 clock cycles). After the final don’t care clock cycle has
been completed, a low-to-high transition on the CS pin will cause the device to initiate
an internally self-timed program operation in which the contents of Buffer 1 will be pro-
grammed into the Security Register. Only the first 64 bytes of data in Buffer 1 will be
programmed into the Security Register; the remaining 464 bytes of the buffer will be
ignored. The Security Register program operation should take place in a maximum time
of tP.
Operation Mode
Summary
The modes described can be separated into two groups – modes that make use of the
Flash memory array (Group A) and modes that do not make use of the Flash memory
array (Group B).
Group A modes consist of:
1. Main Memory Page Read
2. Continuous Array Read
3. Main Memory Page to Buffer 1 (or 2) Transfer
4. Buffer 1 (or 2) to Main Memory Page Program with Built-in Erase
5. Buffer 1 (or 2) to Main Memory Page Program without Built-in Erase
6. Main Memory Page Program through Buffer 1 (or 2)
7. Page Erase
8. Block Erase
9. Auto Page Rewrite
Group B modes consist of:
1. Buffer 1 (or 2) Read
2. Buffer 1 (or 2) Write
3. Status Register Read
4. Manufacturer and Device ID Read
If a Group A mode is in progress (not fully completed), then another mode in Group A
should not be started. However, during this time in which a Group A mode is in
12
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
progress, modes in Group B can be started, except the first two Group A commands
(Memory Array Read Commands).
This gives the DataFlash the ability to virtually accommodate a continuous data stream.
While data is being programmed into main memory from buffer 1, data can be loaded
into buffer 2 (or vice versa). See application note AN-4 (“Using Atmel’s Serial
DataFlash”) for more details.
Pin Descriptions
SERIAL INPUT (SI): The SI pin is an input-only pin and is used to shift data serially into
the device. The SI pin is used for all data input, including opcodes and address
sequences.
SERIAL OUTPUT (SO): The SO pin is an output-only pin and is used to shift data seri-
ally out from the device.
SERIAL CLOCK (SCK): The SCK pin is an input-only pin and is used to control the flow
of data to and from the DataFlash. Data is always clocked into the device on the rising
edge of SCK and clocked out of the device on the falling edge of SCK.
CHIP SELECT (CS): The DataFlash is selected when the CS pin is low. When the
device is not selected, data will not be accepted on the input pin (SI), and the output pin
(SO) will remain in a high impedance state. A high-to-low transition on the CS pin is
required to start an operation, and a low-to-high transition on the CS pin is required to
end an operation or to start an internally self-timed operation.
WRITE PROTECT (WP): The WP pin is used to control the Hardware Sector Protection.
Hardware Sector Protection is enabled by asserting the WP pin and keeping the pin in
it’s asserted state. Disabling Hardware Sector Protection is accomplished by simply
deasserting the WP pin. The WP pin will override the software controlled sector protec-
tion method but only for protecting the sectors. For example, if the sectors were not
previously protected by the Enable Sector Protection command, then simply asserting
the WP pin for the minimum specified time (tWPE) would enable the sector protection.
When the WP pin is deasserted; however, the sector protection would no longer be
enabled as long as the Enable Sector Protection command was not issued while the WP
pin was asserted. If the Enable Sector Protection command was issued before or while
the WP pin was asserted, then simply deasserting the WP pin would not disable the sec-
tor protection. In this case, the Disable Sector Protection command would need to be
issued while the WP pin is deasserted to disable the sector protection. The Disable Sec-
tor Protection command is also ignored whenever the WP pin is asserted.
To ensure backwards compatibility with previous generations of DataFlash, the function
of the WP pin has not changed. Therefore, when the WP pin is asserted, certain sectors
in the memory array will be protected, and when the WP pin is deasserted, the memory
array will be unprotected provided the Enable Sector Protection command hasn’t been
issued. New devices are shipped from Atmel with the contents of the Sector Protection
Register pre-programmed so that sectors 0a and 0b are specified for protection while
the remaining sectors are not flagged for protection. The user can reprogram the Sector
Protection Register to change which sectors will be protected by the WP pin.
The table below details the sector protection status for various scenarios of the WP pin,
the Enable Sector Protection command, and the Disable Sector Protection command.
1
2
3
WP
13
3387B–DFLSH–9/04
Time
Period
WP Pin
Enable Sector Protection Command
Disable Sector Protection Command
Sector Protection Status
High
High
High
Command Not Issued Previously
x
Disabled
Enabled
Disabled
1
2
3
Command Issued
–
–
Command Issued
Low
x
x
Enabled
High
High
High
Command Issued during Period 1 or 2
Not Issued Yet
Command Issued
–
Enabled
Disabled
Enabled
–
Issue Command
RESET: A low state on the reset pin (RESET) will terminate the operation in progress
and reset the internal state machine to an idle state. The device will remain in the reset
condition as long as a low level is present on the RESET pin. Normal operation can
resume once the RESET pin is brought back to a high level.
The device incorporates an internal power-on reset circuit, so there are no restrictions
on the RESET pin during power-on sequences. The RESET pin is also internally pulled
high; therefore, in low pin count applications, connection of the RESET pin is not neces-
sary if this pin and feature will not be utilized. However, it is recommended that the
RESET pin be driven high externally whenever possible.
READY/BUSY: This open drain output pin will be driven low when the device is busy in
an internally self-timed operation. This pin, which is normally in a high state (through
an external pull-up resistor), will be pulled low during programming/erase operations,
and page-to-buffer transfers.
The busy status indicates that the Flash memory array and one of the buffers cannot be
accessed; read and write operations to the other buffer can still be performed. During
Page Erase and Block Erase, read and write operations can be performed to both
buffers.
14
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Power-on/Reset State When power is first applied to the device, or when recovering from a reset condition, the
device will default to Mode 3. In addition, the output pin (SO) will be in a high impedance
state, and a high-to-low transition on the CS pin will be required to start a valid instruc-
tion. The mode (Mode 3 or Mode 0) will be automatically selected on every falling edge
of CS by sampling the inactive clock state. After power is applied and VCC is at the mini-
mum datasheet value, the system should wait 20 ms before an operational mode
(DataFlash) is started.
System
Considerations
The RapidS serial interface is controlled by the serial clock SCK, serial input SI and chip
select CS pins. These signals must rise and fall monotonically and be free from noise.
Excessive noise or ringing on these pins can be misinterpreted as multiple edges and
cause improper operation of the device. The PC board traces must be kept to a mini-
mum distance or appropriately terminated to ensure proper operation. If necessary,
decoupling capacitors can be added on these pins to provide filtering against noise
glitches.
As system complexity continues to increase, voltage regulation is becoming more
important. A key element of any voltage regulation scheme is its current sourcing capa-
bility. Like all Flash memories, the peak current for DataFlash occur during the
programming and erase operation. The regulator needs to supply this peak current
requirement. An under specified regulator can cause current starvation. Besides
increasing system noise, current starvation during programming or erase can lead to
improper operation and possible data corruption.
For applications that require random modifications of data within a sector, please refer
to “Auto Page Rewrite” on page 6.
It is recommended that the RDY/BUSY bit of status register or the RDY/BUSY pin be
monitored in order to minimize the erase and programming time.
Atmel C generation DataFlash utilizes a sophisticated adaptive algorithm during erase
and programming to maximize the endurance over the life of the device. The algorithm
uses a verification mechanism to check if the memory cells have been erased or pro-
grammed successfully. If the memory cells were not erased or programmed, the
algorithm loops back and erases or programs the memory cells again. The process will
continue until the device is erased or programmed successfully.
The erase and programming operations are internally self-timed and fixed timing is not
recommended.
15
3387B–DFLSH–9/04
Table 1. Read Commands
Command
SCK Mode
Opcode
E8H
68H
RapidS Mode 0 or 3
Continuous Array Read
Main Memory Page Read
Buffer 1 Read
Inactive Clock Polarity Low or High
RapidS Mode 0 or 3
D2H
52H
Inactive Clock Polarity Low or High
RapidS Mode 0 or 3
D4H
54H
Inactive Clock Polarity Low or High
RapidS Mode 0 or 3
D6H
56H
Buffer 2 Read
Inactive Clock Polarity Low or High
RapidS Mode 0 or 3
D7H
57H
Status Register Read
Inactive Clock Polarity Low or High
RapidS Mode 0 or 3
Manufacturer and Device ID
9FH
Note:
1. Legacy Opcodes 52H, 54H, 56H, 57H, and 68H are still supported for reasons of backward compatibility only and are not
recommended for new designs. The inactive clock polarity high or low modes will not be supported in the future products.
Table 2. Program and Erase Commands
Command
SCK Mode
Opcode
84H
87H
83H
86H
88H
89H
81H
50H
82H
85H
Buffer 1 Write
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Buffer 2 Write
Buffer 1 to Main Memory Page Program with Built-in Erase
Buffer 2 to Main Memory Page Program with Built-in Erase
Buffer 1 to Main Memory Page Program without Built-in Erase
Buffer 2 to Main Memory Page Program without Built-in Erase
Page Erase
Block Erase
Main Memory Page Program Through Buffer 1
Main Memory Page Program Through Buffer 2
Table 3. Additional Commands
Command
SCK Mode
Opcode
Main Memory Page to Buffer 1 Transfer
Main Memory Page to Buffer 2 Transfer
Auto Page Rewrite Through Buffer 1(1)
Auto Page Rewrite Through Buffer 2(1)
Security Register Program(2)
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
Mode 0, Mode 3
53H
55H
58H
59H
9AH
77H
Security Register Read
Notes: 1. This command should be used for applications requiring a high number of random page writes within a sector. See “Auto
Page Rewrite” on page 6.
2. The Security Register Program command utilizes data stored in Buffer 1. Therefore, this command must be used in conjunc-
tion with the Buffer 1 write command. See the Security Register description on page 12 for details.
16
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Table 4. Detailed Bit-level Addressing Sequence
Address Byte
Address Byte
Address Byte
Additional
Don’t Care
Bytes
Opcode
50H
52H
53H
54H
55H
56H
57H
58H
59H
68H
77H
81H
82H
83H
84H
85H
86H
87H
88H
89H
9AH
9FH
D2H
D4H
D6H
D7H
E8H
Opcode
Required
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
0
0
0
0
0
0
0
0
0
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
0
1
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
0
0
0
0
0
0
0
0
1
1
1
0
0
0
0
0
0
0
0
1
1
1
1
0
0
0
0
1
0
0
0
1
1
1
1
0
0
0
1
0
0
0
1
1
1
1
0
0
0
1
0
1
1
1
0
0
1
1
0
0
1
1
0
0
0
1
0
1
1
0
0
1
1
0
0
1
1
1
0
1
1
0
0
0
1
0
1
0
1
0
1
0
1
1
0
1
0
1
0
1
0
1
0
1
0
0
0
1
0
r
r
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
x
P
P
x
x
P
P
x
x
P
P
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
N/A
4 Bytes
N/A
1 Byte
N/A
1 Byte
N/A
N/A
N/A
4 Bytes
4
r
x
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
x
B
B
B
B
B
B
B
B
B
B
N/A
N/A
N/A
r
r
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
r
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
x
r
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
4
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
r
x
r
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
r
x
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
r
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A
N/A
N/A
r
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
x
x
1
x
x
x
x
x
x
x
x
x
x
x
x
x
1
N/A
N/A
N/A
1/0
r
P
P
P
P
P
P
P
P
P
P
P
P
P
B
B
B
B
B
B
B
B
B
B
4
Note:
r = Reserved Bit, P = Page Address Bit, B = Byte/Buffer Address Bit, x = Don’t Care
17
3387B–DFLSH–9/04
Absolute Maximum Ratings*
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
Temperature under Bias ................................ -55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground.............................-0.6V to VCC + 0.6V
DC and AC Operating Range
AT45DB321C
0°C to 70°C
-40°C to 85°C
2.7V to 3.6V
Com.
Operating Temperature (Case)
Ind.
V
CC Power Supply(1)
Note:
1. After power is applied and VCC is at the minimum specified datasheet value, the system should wait 20 ms before an opera-
tional mode is started.
DC Characteristics
Symbol
Parameter
Condition
Min
Typ
Max
Units
CS, RESET, WP = VIH, all
inputs at CMOS levels
ISB
Standby Current
8
30
µA
Active Current, Read
Operation, Serial Interface
f = 20 MHz; IOUT = 0 mA;
VCC = 3.6V
(1)
ICC1
10
45
35
35
15
65
50
50
mA
mA
mA
mA
Active Current, Program
Operation, Page Program
ICC2
ICC3
ICC4
VCC = 3.6V
Active Current, Page Erase
Operation
VCC = 3.6V
Active Current, Block Erase
Operation
VCC = 3.6V
ILI
Input Load Current
Output Leakage Current
Input Low Voltage
VIN = CMOS levels
VI/O = CMOS levels
1
1
µA
µA
V
ILO
VIL
VIH
VOL
VOH
VCC x 0.3
Input High Voltage
Output Low Voltage
Output High Voltage
VCC x 0.7
V
IOL = 1.6 mA; VCC = 2.7V
IOH = -100 µA
0.4
V
VCC - 0.2V
V
Notes: 1. ICC1 during a buffer read is 30 mA maximum.
18
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
AC Characteristics – Serial Interface
Symbol
Parameter
Min
Typ
Max
40
Units
MHz
MHz
ns
(1)
fSCK
SCK Frequency
(1)
fCAR
SCK Frequency for Continuous Array Read
SCK High Time
40
tWH
tWL
tCS
tCSS
tCSH
tCSB
tSU
tH
10
10
SCK Low Time
ns
Minimum CS High Time
CS Setup Time
250
250
250
ns
ns
CS Hold Time
ns
CS High to RDY/BUSY Low
Data In Setup Time
150
ns
3
6
0
ns
Data In Hold Time
ns
tHO
tDIS
tV
Output Hold Time
ns
Output Disable Time
Output Valid
10
12
ns
ns
tXFR
Page to Buffer Transfer Time
Page Erase and Programming Time
Page Programming Time
Page Erase Time
250
50
µs
(2)
tEP
20
ms
ms
ms
ms
µs
(2)
tP
14
(2)
tPE
10
30
40
(2)
tBE
Block Erase Time
60
tRST
tREC
tWPE
tWPD
RESET Pulse Width
RESET Recovery Time
WP Low to Protection Enabled
WP High to Protection Disabled
10
1
1
1
µs
µs
µs
Note:
1. Maximum specified frequency for SPI compatibility is 33 MHz.
2. Value are based on device characterization, not 100% tested in production.
19
3387B–DFLSH–9/04
Input Test Waveforms and Measurement Levels
3.0V
AC
AC
1.5V
DRIVING
LEVELS
MEASUREMENT
LEVEL
0V
tR, tF < 2 ns (10% to 90%)
Output Test Load
AC Waveforms
DEVICE
UNDER
TEST
30 pF
Four different timing waveforms are shown below. Waveform 1 shows the SCK signal
being low when CS makes a high-to-low transition, and waveform 2 shows the SCK sig-
nal being high when CS makes a high-to-low transition. In both cases, output SO
becomes valid while the SCK signal is still low (SCK low time is specified as tWL). Timing
waveforms 1 and 2 conform to RapidS serial interface but for frequencies up to 33 MHz
and are compatible with SPI Mode 0 and SPI Mode 3 respectively. Waveforms 1 and 2
are also compatible with inactive clock polarity low and inactive clock polarity high, since
the maximum specified frequency in that case is 33 MHz.
Waveform 3 and waveform 4 illustrate general timing diagram for RapidS serial inter-
face. These are similar to waveform 1 and waveform 2, except that output SO is not
restricted to become valid during the tWL period. These timing waveforms are valid over
the full frequency range (maximum frequency = 40 MHz) of the RapidS serial case.
20
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Waveform 1 – SPI Mode 0 Compatible (for Frequencies up to 33 MHz)
tCS
CS
SCK
SO
tCSS
tWH
tWL
tCSH
tV
tHO
tDIS
HIGH IMPEDANCE
tSU
HIGH IMPEDANCE
VALID OUT
tH
SI
VALID IN
Waveform 2 – SPI Mode 3 Compatible (for Frequencies up to 33 MHz)
tCS
CS
tCSS
tWL
tWH
tCSH
SCK
SO
tV
tHO
tDIS
HIGH Z
HIGH IMPEDANCE
VALID OUT
tH
tSU
VALID IN
SI
Waveform 3 – RapidS Mode 0 (for all Frequencies)
tCS
CS
tCSS
tWH
tWL
tCSH
SCK
SO
SI
tV
tHO
VALID OUT
tDIS
HIGH IMPEDANCE
tSU
HIGH IMPEDANCE
tH
VALID IN
Waveform 4 – RapidS Mode 3 (for all Frequencies)
tCS
CS
tCSS
tWL
tWH
tCSH
SCK
SO
tV
tHO
tDIS
HIGH Z
HIGH IMPEDANCE
VALID OUT
tH
tSU
VALID IN
SI
21
3387B–DFLSH–9/04
Reset Timing
CS
tREC
tCSS
SCK
RESET
SO
tRST
HIGH IMPEDANCE
HIGH IMPEDANCE
SI
Note:
The CS signal should be in the high state before the RESET signal is deasserted.
Command Sequence for Read/Write Operations (except Status Register Read)
SI
CMD
8 bits
8 bits
8 bits
MSB
r X X X X X X X
X X X X X X X X
X X X X X X X X
LSB
Reserved for
larger densities
Page Address
(PA12-PA0)
Byte/Buffer Address
(BA9-BA0/BFA9-BFA0)
Notes: 1. “r” designates bits reserved for larger densities.
2. It is recommended that “r” be a logical “0” for densities of 32M bits or smaller.
3. For densities larger than 32M bits, the “r” bit becomes the most significant Page Address bit for the appropriate density.
22
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Write Operations
The following block diagram and waveforms illustrate the various write sequences
available.
FLASH MEMORY ARRAY
PAGE (528 BYTES)
BUFFER 1 TO
MAIN MEMORY
PAGE PROGRAM
MAIN MEMORY
PAGE PROGRAM
THROUGH BUFFER 2
BUFFER 2 TO
MAIN MEMORY
PAGE PROGRAM
BUFFER 1 (528 BYTES)
BUFFER 2 (528 BYTES)
MAIN MEMORY PAGE
PROGRAM THROUGH
BUFFER 1
BUFFER 1
WRITE
BUFFER 2
WRITE
I/O INTERFACE
SI
Main Memory Page Program through Buffers
· Completes writing into selected buffer
· Starts self-timed erase/program operation
CS
BFA7-0
r, PA12-6
PA5-0, BFA9-8
SI
CMD
n
n+1
Last Byte
Buffer Write
· Completes writing into selected buffer
CS
SI
CMD
X
X···X, BFA9-8
BFA7-0
n
n+1
Last Byte
Buffer to Main Memory Page Program (Data from Buffer Programmed into Flash Page)
Starts self-timed erase/program operation
CS
SI
CMD
r , PA12-6
PA5-0, XX
X
n = 1st byte write
Each transition represents
8 bits and 8 clock cycles
n+1 = 2nd byte write
23
3387B–DFLSH–9/04
Read Operations
The following block diagram and waveforms illustrate the various read sequences
available.
FLASH MEMORY ARRAY
PAGE (528 BYTES)
MAIN MEMORY
MAIN MEMORY
PAGE TO
BUFFER 2
PAGE TO
BUFFER 1
BUFFER 1 (528 BYTES)
BUFFER 2 (528 BYTES)
BUFFER 1
READ
MAIN MEMORY
PAGE READ
BUFFER 2
READ
I/O INTERFACE
SO
Main Memory Page Read
CS
SI
CMD
r , PA12-6
PA5-0, BA9-8
BA7-0
X
X
X
X
n
n+1
SO
Main Memory Page to Buffer Transfer (Data from Flash Page Read into Buffer)
Starts reading page data into buffer
CS
SI
CMD
r , PA12-6
PA5-0, XX
X
SO
Buffer Read
CS
CMD
X
X···X, BFA9-8
BFA7-0
X
SI
SO
n
n+1
n = 1st byte read
Each transition represents
8 bits and 8 clock cycles
n+1 = 2nd byte read
24
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Detailed Bit-level Read Timing – RapidS Serial Interface Mode 0
Continuous Array Read (Opcode: E8H)
CS
SCK
1
1
2
1
62
X
63
X
64
X
65
66
67
tSU
SI
tV
DATA OUT
LSB
MSB
HIGH IMPEDANCE
SO
D
7
D
6
D
5
D
2
D
1
D
0
D
7
D
6
D
5
BIT 4223
OF
PAGE n
BIT 0
OF
PAGE n+1
Main Memory Page Read (Opcode: D2H)
CS
SCK
1
1
2
3
4
5
0
60
61
62
X
63
X
64
X
65
66
67
tSU
COMMAND OPCODE
SI
1
0
1
X
X
tV
DATA OUT
HIGH IMPEDANCE
D
7
D
6
D
5
D
4
SO
MSB
Buffer Read (Opcode: D4H or D6H)
CS
SCK
1
1
2
3
4
5
0
36
X
37
X
38
X
39
X
40
X
41
42
43
t
SU
COMMAND OPCODE
SI
1
0
1
t
V
DATA OUT
HIGH IMPEDANCE
D
7
D
6
D
5
D
4
SO
MSB
25
3387B–DFLSH–9/04
Detailed Bit-level Read Timing – RapidS Serial Interface Mode 0 (Continued)
Status Register Read (Opcode: D7H)
CS
SCK
1
1
2
1
3
4
5
6
7
1
8
1
9
10
11
12
15
16
tSU
COMMAND OPCODE
SI
0
1
0
1
tV
STATUS REGISTER OUTPUT
tV
HIGH IMPEDANCE
D
7
D
6
D
5
D
4
SO
D
1
D
D
7
MSB
0
LSB
MSB
DON’T CARE BYTE FOR
FREQ. OVER 25 MHz
Manufacturer and Device ID Read (Opcode: 9FH)
CS
SCK
1
1
2
3
4
5
6
7
1
8
9
10
11
12
16
17
18
tSU
COMMAND OPCODE
SI
0 -
0
1
1
1
1
tV
PRODUCT ID OUTPUT
HIGH IMPEDANCE
0
0
0
1
SO
1
0
0
MSB
LSB MSB
MANUFACTURER ID
26
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Detailed Bit-level Read Timing – RapidS Serial Interface Mode 3
Continuous Array Read (Opcode: E8H)
CS
SCK
1
2
63
64
65
66
67
tSU
SI
1
1
X
X
X
tV
DATA OUT
LSB
MSB
HIGH IMPEDANCE
SO
D
7
D
6
D
5
D
2
D
1
D
0
D
7
D
6
D
5
BIT 4223
OF
PAGE n
BIT 0
OF
PAGE n+1
Main Memory Page Read (Opcode: D2H)
CS
SCK
1
2
3
4
5
61
62
63
64
65
66
67
68
t
SU
COMMAND OPCODE
SI
1
1
0
1
0
X
X
X
X
X
t
V
DATA OUT
HIGH IMPEDANCE
SO
D
7
D
6
D
5
D
4
MSB
Buffer Read (Opcode: D4H or D6H)
CS
SCK
1
2
3
4
5
37
38
39
40
41
42
43
44
tSU
COMMAND OPCODE
SI
1
1
0
1
0
X
X
X
X
X
tV
DATA OUT
HIGH IMPEDANCE
SO
D
7
D
6
D
5
D
4
MSB
27
3387B–DFLSH–9/04
Detailed Bit-level Read Timing – RapidS Serial Interface Mode 3 (Continued)
Status Register Read (Opcode: D7H)
CS
SCK
1
2
3
4
5
6
7
8
9
10
11
12
17
18
tSU
COMMAND OPCODE
SI
1
1
0
1
0
1
1
1
tV
STATUS REGISTER OUTPUT
tV
HIGH IMPEDANCE
SO
D
D
6
D
5
D
4
D
D
MSB
D
6
7
0
LSB
7
MSB
DON’T CARE BYTE FOR
FREQ. OVER 25 MHz
Manufacturer and Device ID Read (Opcode: 9FH)
CS
SCK
1
2
3
4
5
6
7
8
9
10
11
12
17
18
t
SU
COMMAND OPCODE
SI
1
0
0
1
1
1
1
1
t
V
PRODUCT ID OUTPUT
HIGH IMPEDANCE
SO
0
0
0
1
1
0
0
MSB
LSB
MSB
MANUFACTURER ID
28
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Auto Page Rewrite Flowchart
Figure 1. Algorithm for Programming or Reprogramming of the Entire Array Sequentially
START
provide address
and data
BUFFER WRITE
(84H, 87H)
MAIN MEMORY PAGE PROGRAM
THROUGH BUFFER
(82H, 85H)
BUFFER TO MAIN
MEMORY PAGE PROGRAM
(83H, 86H)
END
Notes: 1. This type of algorithm is used for applications in which the entire array is programmed sequentially, filling the array page-by-
page.
2. A page can be written using either a Main Memory Page Program operation or a Buffer Write operation followed by a Buffer
to Main Memory Page Program operation.
3. The algorithm above shows the programming of a single page. The algorithm will be repeated sequentially for each page
within the entire array.
29
3387B–DFLSH–9/04
Auto Page Rewrite Flowchart (Continued)
Figure 2. Algorithm for Randomly Modifying Data
START
provide address of
page to modify
MAIN MEMORY PAGE
If planning to modify multiple
bytes currently stored within
a page of the Flash array
TO BUFFER TRANSFER
(53H, 55H)
BUFFER WRITE
(84H, 87H)
MAIN MEMORY PAGE PROGRAM
THROUGH BUFFER
(82H, 85H)
BUFFER TO MAIN
MEMORY PAGE PROGRAM
(83H, 86H)
AUTO PAGE REWRITE(2)
(58H, 59H)
INCREMENT PAGE
ADDRESS POINTER(2)
END
Notes: 1. To preserve data integrity, each page of a DataFlash sector must be updated/rewritten at least once within every 10,000
cumulative page erase and program operations.
2. A Page Address Pointer must be maintained to indicate which page is to be rewritten. The Auto Page Rewrite command
must use the address specified by the Page Address Pointer.
3. Other algorithms can be used to rewrite portions of the Flash array. Low-power applications may choose to wait until 10,000
cumulative page erase and program operations have accumulated before rewriting all pages of the sector. See application
note AN-4 (“Using Atmel’s Serial DataFlash”) for more details.
30
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Sector Addressing
PA12
PA11
PA10
PA9
PA8
PA7
PA6
PA5
PA4
PA3
PA2 - PA0
Sector
0
0
0
0
•
0
0
0
0
•
0
0
0
1
•
0
0
1
0
•
0
X
X
X
•
0
X
X
X
•
0
X
X
X
•
0
X
X
X
•
0
X
X
X
•
0
X
X
X
•
X
X
X
X
•
0a
0b
1
2
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
1
1
1
1
1
1
1
1
0
0
1
1
0
1
0
1
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
12
13
14
15
31
3387B–DFLSH–9/04
Ordering Information
ICC (mA)
fSCK
(MHz)
Active
Standby
Ordering Code
Package
Operation Range
AT45DB321C-CC
AT45DB321C-CNC
AT45DB321C-TC
24C1
8CN3
28T
Commercial
40
15
0.03
(0°C to 70°C)
AT45DB321C-CI
AT45DB321C-TI
24C1
28T
Industrial
40
15
0.03
(-40°C to 85°C)
Green Package Options (Pb /Halide-free)
ICC (mA)
fSCK
(MHz)
Active
Standby
Ordering Code
Package
Operation Range
AT45DB321C-CNU
AT45DB321C-TU
8CN3
28T
Industrial
40
15
0.03
(-40°C to 85°C)
Legacy Package Options(1)
ICC (mA)
fSCK
(MHz)
Active
Standby
Ordering Code
Package
Operation Range
Commercial
40
15
0.03
AT45DB321C-RC
28R
(0°C to 70°C)
Industrial
40
15
0.03
AT45DB321C-RI
28R
(-40°C to 85°C)
Note:
1. Not recommended for new designs.
Package Type
24C3
24-ball (5 x 5 Array), 1.0 mm Pitch, 6 x 8 x 1.2 mm, Plastic Chip-scale Ball Grid Array (CBGA)
8-pad (6 mm x 8 mm) Chip Array Small Outline No Lead Package (CASON)
28-lead, Plastic Thin Small Outline Package (TSOP)
8CN3
28T
28R
28-lead, 0.330” Wide, Plastic Gull Wing Small Outline Package (SOIC)
32
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
Packaging Information
24C3 – CBGA
E
A1 Ball ID
D
A1
Top View
A
1.00 REF
E1
Side View
A1 Ball Corner
e
2.00 REF
A
B
C
D
E
COMMON DIMENSIONS
(Unit of Measure = mm)
D1
MIN
MAX
NOM
6.00
NOTE
SYMBOL
E
5.90
6.10
E1
D
4.0 TYP
8.00
e
7.90
8.10
D1
A
4.0 TYP
–
5
4
3
2
1
–
1.20
–
Øb
A1
e
0.25
–
Bottom View
1.00 BSC
0.40 TYP
b
9/10/04
DRAWING NO. REV.
24C3
TITLE
2325 Orchard Parkway
San Jose, CA 95131
24C3, 24-ball (5 x 5 Array), 1.0 mm Pitch, 6 x 8 x 1.20 mm,
Chip-scale Ball Grid Array Package (CBGA)
A
R
33
3387B–DFLSH–9/04
8CN3 – CASON
Marked Pin1 Indentifier
E
A
D
A1
Top View
Side View
Pin1 Pad Corner
L1
0.10 mm
TYP
8
1
e
7
2
3
COMMON DIMENSIONS
(Unit of Measure = mm)
6
5
MIN
MAX
1.0
NOM
NOTE
SYMBOL
b
A
4
A1
b
0.17
0.21
0.41 TYP
8.00
0.25
4
e1
L
D
7.90
5.90
8.10
6.10
Bottom View
E
6.00
e
1.27 BSC
1.095 REF
0.67 TYP
0.97
e1
L
4
4
L1
0.92
1.02
Notes: 1. All dimensions and tolerance conform to ASME Y 14.5M, 1994.
2. The surface finish of the package shall be EDM Charmille #24-27.
3. Unless otherwise specified tolerance: Decimal ±0.05, Angular ±2o.
4. Metal Pad Dimensions.
7/10/03
DRAWING NO. REV.
8CN3
TITLE
2325 Orchard Parkway
San Jose, CA 95131
8CN3, 8-pad (6 x 8 x 1.0 mm Body), Lead Pitch 1.27 mm,
Chip Array Small Outline No Lead Package (CASON)
B
R
34
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
AT45DB321C [Preliminary]
28T – TSOP, Type I
PIN 1
0º ~ 5º
c
Pin 1 Identifier Area
D1
D
L
b
L1
e
A2
E
GAGE PLANE
A
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
MIN
–
MAX
1.20
0.15
1.05
13.60
NOM
–
NOTE
SYMBOL
A
A1
A2
D
0.05
0.90
13.20
11.70
7.90
0.50
–
1.00
Notes:
1. This package conforms to JEDEC reference MO-183.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
13.40
11.80
8.00
D1
E
11.90 Note 2
8.10
0.70
Note 2
L
0.60
L1
b
0.25 BASIC
0.22
0.17
0.10
0.27
0.21
c
–
e
0.55 BASIC
12/06/02
DRAWING NO. REV.
28T
TITLE
2325 Orchard Parkway
San Jose, CA 95131
28T, 28-lead (8 x 13.4 mm) Plastic Thin Small Outline
Package, Type I (TSOP)
C
R
35
3387B–DFLSH–9/04
28R – SOIC
B
E
E
1
PIN 1
e
D
A
A
1
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
MAX
NOM
NOTE
SYMBOL
0º ~ 8º
A
2.39
0.050
18.00
11.70
8.59
–
2.79
C
A1
D
E
–
0.356
–
18.50 Note 1
L
–
12.50
E1
B
–
8.79
0.508
0.305
1.27
Note 1
0.356
0.203
0.94
–
C
L
–
–
Note: 1. Dimensions D and E1 do not include mold Flash
or protrusion. Mold Flash or protrusion shall not exceed
0.25 mm (0.010").
e
1.27 TYP
5/18/2004
TITLE
DRAWING NO. REV.
2325 Orchard Parkway
San Jose, CA 95131
28R, 28-lead, 0.330" Body Width,
Plastic Gull Wing Small Outline (SOIC)
28R
R
C
36
AT45DB321C [Preliminary]
3387B–DFLSH–9/04
Atmel Corporation
Atmel Operations
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 487-2600
Memory
RF/Automotive
Theresienstrasse 2
Postfach 3535
74025 Heilbronn, Germany
Tel: (49) 71-31-67-0
Fax: (49) 71-31-67-2340
2325 Orchard Parkway
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