AT45DB321C-TL [ATMEL]

Flash, 32MX1, PDSO28, 8 X 13.40 MM, PLASTIC, MO-183, TSOP1-28;
AT45DB321C-TL
型号: AT45DB321C-TL
厂家: ATMEL    ATMEL
描述:

Flash, 32MX1, PDSO28, 8 X 13.40 MM, PLASTIC, MO-183, TSOP1-28

光电二极管
文件: 总40页 (文件大小:716K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Features  
Single 2.7 - 3.6V Supply  
RapidSSerial Interface: 40 MHz Maximum Clock Frequency  
(SPI Modes 0 and 3 Compatible for Frequencies Up to 33 MHz)  
Page Program  
– 8192 Pages (528 Bytes/Page)  
Automated Erase Operations  
– Page Erase 528 Bytes  
– Block Erase 4,224 Bytes  
32-megabit  
2.7 volt  
Two 528-byte SRAM Data Buffers – Allows Receiving of Data  
while Reprogramming the Flash Array  
Continuous Read Capability through Entire Array  
– Ideal for Code Shadowing Applications  
Low-power Dissipation  
DataFlash®  
– 10 mA Active Read Current Typical  
– 6 µA Standby Current Typical  
AT45DB321C  
Hardware and Software Data Protection Features  
– Individual Sector Locking  
Security: 128-byte Security Register  
– 64-byte User Programmable Space  
– Unique 64-byte Device Identifier  
For New  
Designs Use  
AT45DB321D  
JEDEC Standard Manufacturer and Device ID Read  
100,000 Program/Erase Cycles per Page Minimum  
Data Retention – 20 years  
Commercial and Industrial Temperature Ranges  
Green (Pb/Halide-free/RoHS Compliant) Packaging Options  
1. Description  
The AT45DB321C is an SPI compatible, serial-interface Flash memory ideally suited  
for a wide variety of digital voice-, image-, program code- and data-  
storage applications. The AT45DB321C supports a 4-wire serial interface known as  
RapidS for applications requiring very high speed operations.  
Its 34,603,008 bits of memory are organized as 8192 pages of 528 bytes each. In  
addition to the 33-megabit main memory, the AT45DB321C also contains two SRAM  
buffers of 528 bytes each.  
The buffers allow the receiving of data while a page in the main page Memory is being  
reprogrammed, as well as writing a continuous data stream. EEPROM emulation (bit  
or byte alterability) is easily handled with a self-contained three step read-modify-write  
operation. Unlike conventional Flash memories that are accessed randomly with mul-  
tiple address lines and a parallel interface, the DataFlash uses a RapidS serial  
interface to sequentially access its data. The simple sequential access dramatically  
reduces active pin count, facilitates hardware layout, increases system reliability, min-  
imizes switching noise, and reduces package size. The device is optimized for use in  
many commercial and industrial applications where high-density, low-pin count, low-  
voltage and low-power are essential. The device operates at clock frequencies up to  
40 MHz with a typical active read current consumption of 10 mA.  
3387M–DFLASH–2/08  
To allow for simple in-system reprogrammability, the AT45DB321C does not require high input  
voltages for programming. The device operates from a single power supply, 2.7V to 3.6V, for  
both the program and read operations. The AT45DB321C is enabled through the chip select pin  
(CS) and accessed via a three-wire interface consisting of the Serial Input (SI), Serial Output  
(SO), and the Serial Clock (SCK).  
All programming and erase cycles are self-timed.  
2. Pin Configurations and Packages  
Table 2-1.  
Pin Name  
CS  
Pin Configurations  
Function  
Chip Select  
SCK  
Serial Clock  
SI  
Serial Input  
SO  
Serial Output  
Hardware Page Write Protect Pin  
Chip Reset  
WP  
RESET  
RDY/BUSY  
Ready/Busy  
Figure 2-1. TSOP Top View – Type 1  
Figure 2-2. CBGA Top View  
Figure 2-3. SOIC Top View  
through Package  
RDY/BUSY  
RESET  
WP  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
NC  
GND  
NC  
NC  
CS  
SCK  
SI  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
VCC  
NC  
2
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
1
2
3
4
5
2
3
3
NC  
NC  
4
4
WP  
NC  
5
5
RESET  
RDY/BUSY  
NC  
VCC  
GND  
NC  
6
A
B
C
D
E
7
6
NC  
NC  
NC  
NC  
8
SO  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
7
NC  
9
8
NC  
NC SCK GND VCC NC  
NC  
10  
11  
12  
13  
14  
9
NC  
CS  
NC  
NC  
NC  
CS RDY/BSY WP NC  
10  
11  
12  
13  
14  
NC  
SCK  
SI  
NC  
SO  
NC  
SI RESET NC  
NC  
NC NC  
NC  
SO  
NC  
NC  
Figure 2-4. DataFlash Card(1) Top View  
Figure 2-5. CASON – Top View  
through Package  
through Package  
SI  
SCK  
1
2
3
4
8
7
6
5
SO  
7
6 5 4 3 2 1  
GND  
VCC  
WP  
RESET  
CS  
Note:  
1. See AT45DCB004C Datasheet  
2
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
3. Block Diagram  
WP  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
SCK  
CS  
I/O INTERFACE  
RESET  
VCC  
GND  
RDY/BUSY  
SI  
SO  
4. Memory Array  
To provide optimal flexibility, the memory array of the AT45DB321C is divided into three levels of  
granularity comprising of sectors, blocks, and pages. The “Memory Architecture Diagram” illus-  
trates the breakdown of each level and details the number of pages per sector and block. All  
program operations to the DataFlash occur on a page by page basis. The erase operations can  
be performed at the block or page level.  
Figure 4-1. Memory Architecture Diagram  
SECTOR ARCHITECTURE  
BLOCK ARCHITECTURE  
PAGE ARCHITECTURE  
BLOCK 0  
BLOCK 1  
BLOCK 2  
8 Pages  
PAGE 0  
PAGE 1  
SECTOR 0a  
SECTOR 0a = 8 Pages  
4224 bytes (4K + 128)  
SECTOR 0b = 504 Pages  
266,112 bytes (252K + 8064)  
PAGE 6  
PAGE 7  
PAGE 8  
PAGE 9  
BLOCK 62  
BLOCK 63  
BLOCK 64  
BLOCK 65  
SECTOR 1 = 512 Pages  
270,336 bytes (256K + 8K)  
SECTOR 2 = 512 Pages  
270,336 bytes (256K + 8K)  
PAGE 14  
PAGE 15  
PAGE 16  
PAGE 17  
PAGE 18  
BLOCK 126  
BLOCK 127  
BLOCK 128  
BLOCK 129  
SECTOR 14 = 512 Pages  
270,336 bytes (256K + 8K)  
PAGE 8189  
PAGE 8190  
PAGE 8191  
SECTOR 15 = 512 Pages  
270,336 bytes (256K + 8K)  
BLOCK 1022  
BLOCK 1023  
Block = 4224 bytes  
(4K + 128)  
Page = 528 bytes  
(512 + 16)  
3
3387M–DFLASH–2/08  
5. Device Operation  
The device operation is controlled by instructions from the host processor. The list of instructions  
and their associated opcodes are contained in Tables 1 through 4. A valid instruction starts with  
the falling edge of CS followed by the appropriate 8-bit opcode and the desired buffer or main  
memory address location. While the CS pin is low, toggling the SCK pin controls the loading of  
the opcode and the desired buffer or main memory address location through the SI (serial input)  
pin. All instructions, addresses, and data are transferred with the most significant bit (MSB) first.  
Buffer addressing is referenced in the datasheet using the terminology BFA9-BFA0 to denote  
the 10 address bits required to designate a byte address within a buffer. Main memory address-  
ing is referenced using the terminology PA12-PA0 and BA9-BA0, where PA12-PA0 denotes the  
13 address bits required to designate a page address and BA9-BA0 denotes the 10 address bits  
required to designate a byte address within the page.  
5.1  
Read Commands  
By specifying the appropriate opcode, data can be read from the main memory or from either  
one of the two SRAM data buffers. The DataFlash supports RapidS protocol for Mode 0 and  
Mode 3. Please refer to the “Detailed Bit-level Read Timing” diagrams in this datasheet for  
details on the clock cycle sequences for each mode.  
5.1.1  
Continuous Array Read  
By supplying an initial starting address for the main memory array, the Continuous Array Read  
command can be utilized to sequentially read a continuous stream of data from the device by  
simply providing a clock signal; no additional addressing information or control signals need to  
be provided. The DataFlash incorporates an internal address counter that will automatically  
increment on every clock cycle, allowing one continuous read operation without the need of  
additional address sequences. To perform a continuous read, an opcode of E8H must be  
clocked into the device. The opcode is followed by three address bytes (which comprises 24-bit  
page and byte address sequence) and 32 don’t care clock cycles. The first bit of the 24-bit  
address sequence is reserved for upward and downward compatibility to larger and smaller den-  
sity devices (see the notes under Section 13.6 on page 25. The next 13 bits (PA12-PA0) of the  
24-bit address sequence specify which page of the main memory array to read, and the last  
10 bits (BA9-BA0) of the 24-bit address sequence specify the starting byte address within the  
page. The 32 don’t care clock cycles that follow the four address bytes are needed to initialize  
the read operation. Following the don’t care clock cycles, additional clock pulses on the SCK pin  
will result in data being output on the SO (serial output) pin.  
The CS pin must remain low during the loading of the opcode, the address bytes, the don’t care  
bytes, and the reading of data. When the end of a page in main memory is reached during a  
Continuous Array Read, the device will continue reading at the beginning of the next page with  
no delays incurred during the page boundary crossover (the crossover from the end of one page  
to the beginning of the next page). When the last bit in the main memory array has been read,  
the device will continue reading back at the beginning of the first page of memory. As with cross-  
ing over page boundaries, no delays will be incurred when wrapping around from the end of the  
array to the beginning of the array.  
A low-to-high transition on the CS pin will terminate the read operation and tristate the output pin  
(SO). The maximum SCK frequency allowable for the Continuous Array Read is defined by the  
f
CAR specification. The Continuous Array Read bypasses both data buffers and leaves the con-  
tents of the buffers unchanged.  
4
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
5.1.2  
Main Memory Page Read  
A main memory page read allows the user to read data directly from any one of the 8192 pages  
in the main memory, bypassing both of the data buffers and leaving the contents of the buffers  
unchanged. To start a page read, an opcode of D2H must be clocked into the device. The  
opcode is followed by three address bytes (which comprise 24-bit page and byte address  
sequence) and 32 don’t care clock cycles. The first bit of the 24-bit address sequence is a  
reserved bit, the next 13 bits (PA12-PA0) of the 24-bit address sequence specify the page in  
main memory to be read, and the last 10 bits (BA9-BA0) of the 24-bit address sequence specify  
the starting byte address within that page. The 32 don’t care clock cycles that follow the three  
address bytes are sent to initialize the read operation. Following the don’t care bytes, additional  
pulses on SCK result in data being output on the SO (serial output) pin. The CS pin must remain  
low during the loading of the opcode, the address bytes, the don’t care bytes, and the reading of  
data. When the end of a page in main memory is reached, the device will continue reading back  
at the beginning of the same page. A low-to-high transition on the CS pin will terminate the read  
operation and tristate the output pin (SO). The maximum SCK frequency allowable for the Main  
Memory Page Read is defined by the fSCK specification. The Main Memory Page Read bypasses  
both data buffers and leaves the contents of the buffers unchanged.  
5.1.3  
Buffer Read  
Data can be read from either one of the two buffers, using different opcodes to specify which  
buffer to read from. An opcode of D4H is used to read data from buffer 1, and an opcode of D6H  
is used to read data from buffer 2. To perform a buffer read, the opcode must be clocked into the  
device followed by three address bytes comprised of 14 don’t care bits and 10 buffer address  
bits (BFA9-BFA0). Following the three address bytes, an additional don’t care byte must be  
clocked in to initialize the read operation. Since the buffer size is 528 bytes, 10 buffer address  
bits are required to specify the first byte of data to be read from the buffer. The CS pin must  
remain low during the loading of the opcode, the address bytes, the don’t care bytes, and the  
reading of data. When the end of a buffer is reached, the device will continue reading back at the  
beginning of the buffer. A low-to-high transition on the CS pin will terminate the read operation  
and tristate the output pin (SO).  
5.2  
Program and Erase Commands  
5.2.1  
Buffer Write  
Data can be clocked in from the SI pin into either buffer 1 or buffer 2. To load data into either  
buffer, a 1-byte opcode, 84H for buffer 1 or 87H for buffer 2, must be clocked into the device, fol-  
lowed by three address bytes comprised of 14 don’t care bits and 10 buffer address bits (BFA9-  
BFA0). The 10 buffer address bits specify the first byte in the buffer to be written. After the last  
address byte has been clocked into the device, data can then be clocked in on subsequent clock  
cycles. If the end of the data buffer is reached, the device will wrap around back to the beginning  
of the buffer. Data will continue to be loaded into the buffer until a low-to-high transition is  
detected on the CS pin.  
5
3387M–DFLASH–2/08  
5.2.2  
Buffer to Main Memory Page Program with Built-in Erase:  
Data written into either buffer 1 or buffer 2 can be programmed into the main memory. To start  
the operation, an 8-bit opcode, 83H for buffer 1 or 86H for buffer 2, must be clocked into the  
device followed by three address bytes consisting of one reserved bit, 13 page address bits  
(PA12-PA0) that specify the page in the main memory to be written and 10 don’t care bits. When  
a low-to-high transition occurs on the CS pin, the part will first erase the selected page in main  
memory (the erased state is a logic 1) and then program the data stored in the buffer into the  
specified page in main memory. Both the erase and the programming of the page are internally  
self-timed and should take place in a maximum time of tEP. During this time, the status register  
and the RDY/BUSY pin will indicate that the part is busy.  
5.2.3  
Buffer to Main Memory Page Program without Built-in Erase  
A previously-erased page within main memory can be programmed with the contents of either  
buffer 1 or buffer 2. To start the operation, an 8-bit opcode, 88H for buffer 1 or 89H for buffer 2,  
must be clocked into the device followed by three address bytes consisting of one reserved bit,  
13 page address bits (PA12-PA0) that specify the page in the main memory to be written and 10  
don’t care bits. When a low-to-high transition occurs on the CS pin, the part will program the  
data stored in the buffer into the specified page in the main memory. It is necessary that the  
page in main memory that is being programmed has been previously erased using one of the  
erase commands (Page Erase or Block Erase). The programming of the page is internally self-  
timed and should take place in a maximum time of tP. During this time, the status register and  
the RDY/BUSY pin will indicate that the part is busy.  
5.2.4  
Page Erase  
The Page Erase command can be used to individually erase any page in the main memory array  
allowing the Buffer to Main Memory Page Program without Built-in Erase command to be utilized  
at a later time. To perform a page erase, an opcode of 81H must be loaded into the device, fol-  
lowed by three address bytes comprised of one reserved bit, 13 page address bits (PA12-PA0)  
that specify the page in the main memory to be erased and 10 don’t care bits. When a low-to-  
high transition occurs on the CS pin, the part will erase the selected page (the erased state is a  
logic 1). The erase operation is internally self-timed and should take place in a maximum time of  
tPE. During this time, the status register and the RDY/BUSY pin will indicate that the part is busy.  
5.2.5  
Block Erase  
A block of eight pages can be erased at one time. This command is useful when large amounts  
of data has to be written into the device. This will avoid using multiple Page Erase Commands.  
To perform a block erase, an opcode of 50H must be loaded into the device, followed by three  
address bytes comprised of one reserved bit, 10 page address bits (PA12-PA3) and 13 don’t  
care bits. The 10 page address bits are used to specify which block of eight pages is to be  
erased. When a low-to-high transition occurs on the CS pin, the part will erase the selected  
block of eight pages. The erase operation is internally self-timed and should take place in a max-  
imum time of tBE. During this time, the status register and the RDY/BUSY pin will indicate that  
the part is busy.  
6
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
Table 5-1.  
Block Erase Addressing  
PA12  
PA11  
PA10  
PA9  
0
PA8  
0
PA7  
0
PA6  
0
PA5  
0
PA4  
0
PA3  
0
PA2  
X
PA1  
X
PA0  
X
Block  
0
0
0
0
0
0
0
0
0
0
0
0
0
1
2
3
0
0
0
0
0
0
1
X
X
X
0
0
0
0
0
1
0
X
X
X
0
0
0
0
0
1
1
X
X
X
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
1
1
0
1
0
1
X
X
X
X
X
X
X
X
X
X
X
X
1020  
1021  
1022  
1023  
5.2.6  
Main Memory Page Program Through Buffer  
This operation is a combination of the Buffer Write and Buffer to Main Memory Page Program  
with Built-in Erase operations. Data is first clocked into buffer 1 or buffer 2 from the input pin (SI)  
and then programmed into a specified page in the main memory. To initiate the operation, an  
8-bit opcode, 82H for buffer 1 or 85H for buffer 2, must first be clocked into the device, followed  
by three address bytes. The address bytes are comprised of one reserved bit, 13 page address  
bits (PA12-PA0) that select the page in the main memory where data is to be written, and  
10 buffer address bits (BFA9-BFA0) that select the first byte in the buffer to be written. After all  
address bytes are clocked in, the part will take data from the input pins and store it in the speci-  
fied data buffer. If the end of the buffer is reached, the device will wrap around back to the  
beginning of the buffer. When there is a low-to-high transition on the CS pin, the part will first  
erase the selected page in main memory to all 1s and then program the data stored in the buffer  
into that memory page. Both the erase and the programming of the page are internally self-timed  
and should take place in a maximum time of tEP. During this time, the status register and the  
RDY/BUSY pin will indicate that the part is busy.  
5.3  
Additional Commands  
5.3.1  
Main Memory Page to Buffer Transfer  
A page of data can be transferred from the main memory to either buffer 1 or buffer 2. To start  
the operation, a 1-byte opcode, 53H for buffer 1 and 55H for buffer 2, must be clocked into the  
device, followed by three address bytes comprised of one reserved bit, 13 page address bits  
(PA12- PA0), which specify the page in main memory that is to be transferred, and 10 don’t care  
bits. The CS pin must be low while toggling the SCK pin to load the opcode and the address  
bytes from the input pin (SI). The transfer of the page of data from the main memory to the buffer  
will begin when the CS pin transitions from a low to a high state. During the transfer of a page of  
data (tXFR), the status register can be read to determine whether the transfer has been com-  
pleted or not.  
7
3387M–DFLASH–2/08  
5.3.2  
Main Memory Page to Buffer Compare  
A page of data in main memory can be compared to the data in buffer 1 or buffer 2. To initiate  
the operation, an 8-bit opcode, 60H for buffer 1 and 61H for buffer 2, must be followed by  
24 address bits consisting of one reserved bit, 13 address bits (PA12 - PA0) which specify the  
page in the main memory that is to be compared to the buffer, and ten don’t care bits. The CS  
pin must be low while toggling the SCK pin to load the opcode, the address bits, and the don’t  
care bits from the SI pin. On the low-to-high transition of the CS pin, the 528 bytes in the  
selected main memory page will be compared with the 528 bytes in buffer 1 or buffer 2. During  
this time (tXFR), the status register will indicate that the part is busy. On completion of the com-  
pare operation, bit 6 of the status register is updated with the result of the compare.  
5.3.3  
Auto Page Rewrite  
This mode is only needed if multiple bytes within a page or multiple pages of data are modified in  
a random fashion. This mode is a combination of two operations: Main Memory Page to Buffer  
Transfer and Buffer to Main Memory Page Program with Built-in Erase. A page of data is first  
transferred from the main memory to buffer 1 or buffer 2, and then the same data (from buffer 1  
or buffer 2) is programmed back into its original page of main memory. To start the rewrite oper-  
ation, a 1-byte opcode, 58H for buffer 1 or 59H for buffer 2, must be clocked into the device,  
followed by three address bytes comprised of one reserved bit, 13 page address bits  
(PA12-PA0) that specify the page in main memory to be rewritten and 10 don’t care bits. When a  
low-to-high transition occurs on the CS pin, the part will first transfer data from the page in main  
memory to a buffer and then program the data from the buffer back into same page of main  
memory. The operation is internally self-timed and should take place in a maximum time of tEP.  
During this time, the status register and the RDY/BUSY pin will indicate that the part is busy.  
If a sector is programmed or reprogrammed sequentially page by page, then the programming  
algorithm shown in Figure 15-1 on page 31 is recommended. Otherwise, if multiple bytes in a  
page or several pages are programmed randomly in a sector, then the programming algorithm  
shown in Figure 15-2 on page 32 is recommended. Each page within a sector must be  
updated/rewritten at least once within every 10,000 cumulative page erase/program operations  
in that sector.  
5.3.4  
Status Register Read  
The status register can be used to determine the device’s ready/busy status, the result of a Main  
Memory Page to Buffer Compare operation, or whether the sector protection has been enabled.  
To read the status register, an opcode of D7H must be loaded into the device. After the opcode  
and optional dummy byte is clocked in, the 1-byte status register will be clocked out on the out-  
put pin (SO), starting with the next clock cycle. For applications over 25 MHz, the opcode must  
be always followed with a dummy (don’t care) byte. The data in the status register, starting with  
the MSB (bit 7), will be clocked out on the SO pin during the next eight clock cycles.  
The most-significant bits of the status register will contain device information, while the remain-  
ing least-significant bit is reversed for future use and will have undefined value. After the one  
byte of the status register has been clocked out, the sequence will repeat itself (as long as CS  
remains low and SCK is being toggled). The data in the status register is constantly updated, so  
each repeating sequence will output new data.  
Ready/busy status is indicated using bit 7 of the status register. If bit 7 is a 1, then the device is  
not busy and is ready to accept the next command. If bit 7 is a 0, then the device is in a busy  
state. There are many operations that can cause the device to be in a busy state: Main Memory  
Page to Buffer Transfer, Buffer to Main Memory Page Program with Built-in Erase, Buffer to  
8
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
Main Memory Page Program without Built-in Erase, Page Erase, Block Erase, Main Memory  
Page Program, and Auto Page Rewrite.  
Bit 1 in the Status Register is used to provide information to the user whether or not the sector  
protection has been enabled or disabled, either by software-controlled method or hardware-con-  
trolled method. A logic 1 indicates that sector protection has been enabled and logic 0 indicates  
that sector protection has been disabled.  
The device density is indicated using bits 5, 4, 3, and 2 of the status register. For the  
AT45DB321C, the four bits are 1,1, 0, 1. The decimal value of these four binary bits does not  
equate to the device density; the four bits represent a combinational code relating to differing  
densities of DataFlash devices. The device density is not the same as the density code indicated  
in the JEDEC device ID information. The device density is provided only for backward  
compatibility.  
The result of the most recent Main Memory Page to Buffer Compare operation is indicated using  
bit 6 of the status register. If bit 6 is a 0, then the data in the main memory page matches the  
data in the buffer. If bit 6 is a 1, then at least one bit of the data in the main memory page does  
not match the data in the buffer.  
Table 5-2.  
Bit 7  
Status Register Format  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
RDY/BUSY  
COMP  
1
1
0
1
Protect  
X
6. Sector Protection  
Two protection methods, hardware and software controlled, are provided. The selection of which  
sectors to be protected/unprotected from program and erase operations is defined in the Sector  
Protection Register.  
6.1  
Software Sector Protection  
Sectors specified for protection in the Sector Protection Register can be protected from program  
and erase operations by issuing the Enable Sector Protection command. To enable the sector  
protection using the software controlled method, the CS pin must first be asserted as it would be  
with any other command. Once the CS pin has been asserted, the appropriate 4-byte command  
sequence must be clocked in via the input pin (SI). After the last bit of the command sequence  
has been clocked in, the CS pin must be deasserted after which the sector protection will be  
enabled.  
Command  
Byte 1  
3DH  
Byte 2  
2AH  
Byte 3  
7FH  
Byte 4  
A9H  
Enable Sector Protection  
Disable Sector Protection  
Read Sector Protection Register  
3DH  
2AH  
7FH  
9AH  
32H  
00H  
00H  
00H  
To disable the sector protection using the software controlled method, the CS pin must first be  
asserted as it would be with any other command. Once the CS pin has been asserted, the  
appropriate 4-byte sequence for the Disable Sector Protection command must be clocked in via  
the input pin (SI). After the last bit of the command sequence has been clocked in, the CS pin  
must be deasserted after which the sector protection will be disabled. The Disable Sector Pro-  
tection command is ignored while the WP pin is asserted.  
9
3387M–DFLASH–2/08  
Software Sector Protection is useful in applications in which the WP pin is not or cannot be con-  
trolled by a host processor. In such instances, the WP pin may be left floating (the WP pin is  
pulled high internally) and sector protection can be controlled using the software commands.  
If the device is power cycled, then the Software Sector Protection will be disabled. Once the  
device is powered up, the Enable Sector Protection command should be reissued if sector pro-  
tection is desired and if the WP pin is not used. The RESET pin has no effect on the Software  
Sector Protection.  
6.2  
Hardware Sector Protection  
Sectors specified for protection in Sector Protection Register can be protected from program  
and erase operations by utilizing the Write Protection (WP) pin. The protection can be enabled  
by asserting the WP pin and keeping the pin in its asserted state. Any sector specified for pro-  
tection cannot be erased or reprogrammed as long as the WP pin is asserted. The protection  
can be disabled by deasserting the WP pin high. A filter is provided on the WP pin to help protect  
against spurious noise on the WP pin. Hardware Sector Protection will provide continuous pro-  
tection, based on the contents of the Sector Protection Register, in an application where WP is  
always driven low. Please read “Write Protect (WP)” on page 15 for more information.  
6.3  
Sector Protection Register  
Sector Protection Register is a nonvolatile register that contains 16 bytes of data, as shown  
below:  
Sector Number  
Protected  
0 (0a, 0b)  
1 to 15  
FFH  
See Below  
Unprotected  
00H  
Table 6-1.  
Sector 0 (0a, 0b):  
0a  
0b  
(Page 0-7)  
(Page 8-511)  
Data  
Value  
Bit 6, 7  
Bit 4, 5  
Bit 2, 3  
Bit 0, 1  
Sectors 0a, 0b  
Unprotected  
00  
00  
00  
11  
11  
00  
00  
11  
11  
00  
00  
00  
00  
00H  
C0H  
3CH  
FCH  
Protect Sector 0a  
(Page 0-7)  
11  
00  
11  
Protect Sector 0b  
(Page 8-511)  
Protect Sectors 0a, 0b  
(Page 0-511)  
Note:  
1. Default value for devices shipped from Atmel is 00H.  
10  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
6.3.1  
Erasing the Sector Protection Register  
To erase the Sector Protection Register, the CS pin must first be asserted. Once the CS pin has  
been asserted, the 4-byte erase command sequence must be clocked in via the SI (serial input)  
pin. After the last bit of the command sequence has been clocked in, the CS pin must be deas-  
serted to initiate the internally self-timed erase cycle (tPE). The Ready/Busy status will indicate  
that the device is busy during the erase cycle. The erased state of each bit (of a byte) in the Sec-  
tor Protection Register indicates that the corresponding sector is flagged for protection. The  
RESET pin is disabled during this erase cycle to prevent incomplete erasure of the Sector Pro-  
tection Register.  
Command  
Byte 1  
Byte 2  
Byte 3  
Byte 4  
Erase Sector Protection Register  
3DH  
2AH  
7FH  
CFH  
6.3.2  
Programming the Sector Protection Register  
To program the Sector Protection Register, the CS pin must first be asserted. Once the CS pin  
has been asserted, the 4-byte command sequence must be clocked in via the SI (serial input)  
pin. After the last bit of the command sequence has been clocked in, the data for the contents of  
the Sector Protection Register must be clocked in. The first byte corresponds to sector 0 (0a,  
0b), the second byte corresponds to Sector 1 and the last byte (byte 16) corresponds to Sector  
15. After the last bit of data has been clocked in, the CS pin must be deasserted to initiate the  
internally self-timed program cycle (tP). The Ready/Busy status will indicate that the device is  
busy during the program cycle. The RESET pin is disabled during this program cycle to prevent  
incomplete programming of the sector protection register.  
Command  
Byte 1  
Byte 2  
Byte 3  
Byte 4  
Program Sector Protection Register  
3DH  
2AH  
7FH  
FCH  
6.3.3  
Reading the Sector Protection Register  
To read the Sector Protection Register, the CS pin must first be asserted. Once the CS pin has  
been asserted, a 4-byte command sequence 32H, 00H, 00H, 00H and 32 don’t care clock cycles  
must be clocked in via the SI (serial input) pin. The 32 don’t care clock cycles are required to ini-  
tialize the read operation. After the 32 don’t care clock cycles, any additional clock pulses on the  
SCK pin will result in data being output on the SO (serial output) pin. The read will begin with  
Byte_1 of the Sector Protection Register for Sector_0, followed with Byte_2 for Sector_1. The  
read operation will continue until Byte_16 for Sector_15 is read. Once the last byte is read a low-  
to-high transition on the CS pin is required to terminate the read operation.  
Command  
Byte 1  
Byte 2  
Byte 3  
Byte 4  
Read Sector Protection Register  
32H  
00H  
00H  
00H  
Note:  
Next generation devices of the “D” family will not require the 32 don’t care clock cycles.  
11  
3387M–DFLASH–2/08  
6.3.4  
Various Aspects About the Sector Protection Register  
Due to the sharing of the internal circuitry, the contents of the buffer 1 will get modified during the  
erase and programming of Sector Protection Register. If the device is powered down during  
erasing or programming the sector protection register, then the contents of the Sector Protection  
Register cannot be guaranteed. The Sector Protection Register can be erased or reprogrammed  
with the sector protection enabled or disabled. Being able to reprogram the Sector Protection  
Register with the sector protection enabled allows the user to temporarily disable the sector pro-  
tection to an individual sector rather than disabling the sector protection completely.  
The Sector Protection Register is subject to the same endurance characteristics as the main  
memory array. Users are encouraged to carefully evaluate the number of times the Sector Pro-  
tection Register will be modified during the course of the applications’ life cycle. If the application  
requires that the Sector Protection Register be modified more than the specified endurance of  
the DataFlash because the application needs to temporarily unprotect individual sectors (sector  
protection remains enabled while the Sector Protection Register is reprogrammed), then the  
application will need to limit this practice. Instead, a combination of temporarily unprotecting indi-  
vidual sectors along with disabling sector protection completely will need to be implemented by  
the application to ensure that the endurance limits of the device are not exceeded.  
12  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
7. Manufacturer and Device ID Read  
This instruction conforms to the JEDEC standard and allows the user to read the Manufacturer ID, Device ID, and  
Extended Device Information. A 1-byte opcode, 9FH, must be clocked into the device while the CS pin is low. After the  
opcode is clocked in, the Manufacturer ID, 2 bytes of Device ID and Extended Device Information will be clocked out on the  
SO pin. The fourth byte of the sequence output is the Extended Device Information String Length byte. This byte is used to  
signify how many bytes of Extended Device Information will be output.  
7.1  
Manufacturer and Device ID Information  
7.1.1  
Byte 1 – Manufacturer ID  
JEDEC Assigned Code  
Hex  
Value  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
1FH  
0
0
0
1
1
1
1
1
Manufacturer ID  
1FH = Atmel  
7.1.2  
Byte 2 – Device ID (Part 1)  
Family Code  
Density Code  
Hex  
Family Code  
Density Code  
001 = DataFlash  
00111 = 32-Mbit  
Value  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
27H  
0
0
1
0
0
1
1
1
7.1.3  
Byte 3 – Device ID (Part 2)  
MLC Code  
Product Version Code  
Hex  
MLC Code  
000 = 1-bit/Cell Technology  
00000 = Initial Version  
Value  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
00H  
0
0
0
0
0
0
0
0
Product Version  
7.1.4  
Byte 4 – Extended Device Information String Length  
Byte Count  
Hex  
Value  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
00H  
0
0
0
0
0
0
0
0
Byte Count  
00H = 0 Bytes of Information  
CS  
9FH  
Opcode  
SI  
1FH  
27H  
00H  
00H  
Data  
Data  
SO  
Manufacturer ID  
Byte n  
Device ID  
Byte 1  
Device ID  
Byte 2  
Extended  
Device  
Information  
String Length  
Extended  
Device  
Information  
Byte x  
Extended  
Device  
Information  
Byte x + 1  
This information  
would only be output  
if the Extended Device  
Information String Length  
value was something  
other than 00H.  
Each transition represents  
8 bits and 8 clock cycles  
Note:  
Based on JEDEC publication 106 (JEP106), Manufacturer ID data can be comprised of any number of bytes. Some manufacturers may have  
Manufacturer ID codes that are two, three or even four bytes long with the first byte(s) in the sequence being 7FH. A system should detect code  
7FH as a “Continuation Code” and continue to read Manufacturer ID bytes. The first non-7FH byte would signify the last byte of Manufacturer ID  
data. For Atmel (and some other manufacturers), the Manufacturer ID data is comprised of only one byte.  
13  
3387M–DFLASH–2/08  
7.2  
Security Register  
The AT45DB321C contains a specialized register that can be used for security purposes in sys-  
tem design. The Security Register is a unique 128-byte register that is divided into two portions.  
The first 64 bytes (byte 0 to byte 63) of this page are allocated as a one-time user programmable  
space. Once these 64 bytes have been programmed, they should not be reprogrammed. The  
remaining 64 bytes of this page (byte 64 to byte 127) are factory programmed by Atmel and will  
contain a unique number for each device. The factory programmed data is fixed and cannot be  
changed.  
The Security Register can be read by clocking in a 4-byte sequence 77H, 00H, 00H, 00H to the  
device followed by 32 don’t care clock cycles. See the opcode Table 9-4 on page 20.  
Note:  
Next generation devices of the “D” family will not require the 32 don’t care clock cycles.  
To program the first 64 bytes of the Security Register, a two step sequence must be used. The  
first step requires that the user loads the desired data into Buffer 1 by using the Buffer 1 Write  
operation (opcode 84H – “Buffer Write” on page 5). The user should specify the starting buffer  
address as location zero and should write a full 64 bytes of information into the buffer. Other-  
wise, the first 64 bytes of the buffer may contain data that was previously stored in the buffer. It  
is not necessary to fill the remaining 464 bytes (byte locations 64 through 527) of the buffer with  
data. After the Buffer 1 Write operation has been completed, the Security Register can be sub-  
sequently programmed by reselecting the device and clocking in opcode 9AH into the device  
followed by three don’t care bytes (24 clock cycles). After the final don’t care clock cycle has  
been completed, a low-to-high transition on the CS pin will cause the device to initiate an inter-  
nally self-timed program operation in which the contents of Buffer 1 will be programmed into the  
Security Register. Only the first 64 bytes of data in Buffer 1 will be programmed into the Security  
Register; the remaining 464 bytes of the buffer will be ignored. The Security Register program  
operation should take place in a maximum time of tP.  
7.3  
Operation Mode Summary  
The modes described can be separated into two groups – modes that make use of the Flash  
memory array (Group A) and modes that do not make use of the Flash memory array (Group B).  
Group A modes consist of:  
1. Main Memory Page Read  
2. Continuous Array Read  
3. Main Memory Page to Buffer 1 (or 2) Transfer  
4. Main Memory Page to Buffer 1 (or 2) Compare  
5. Buffer 1 (or 2) to Main Memory Page Program with Built-in Erase  
6. Buffer 1 (or 2) to Main Memory Page Program without Built-in Erase  
7. Main Memory Page Program through Buffer 1 (or 2)  
8. Page Erase  
9. Block Erase  
10. Auto Page Rewrite  
Group B modes consist of:  
1. Buffer 1 (or 2) Read  
2. Buffer 1 (or 2) Write  
3. Status Register Read  
4. Manufacturer and Device ID Read  
14  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
If a Group A mode is in progress (not fully completed), then another mode in Group A should not  
be started. However, during this time in which a Group A mode is in progress, modes in Group B  
can be started, except the first two Group A commands (Memory Array Read Commands).  
This gives the DataFlash the ability to virtually accommodate a continuous data stream. While  
data is being programmed into main memory from buffer 1, data can be loaded into buffer 2 (or  
vice versa). See application note AN-4 (“Using Atmel’s Serial DataFlash”) for more details.  
7.4  
Pin Descriptions  
7.4.1  
Serial Input (SI)  
The SI pin is an input-only pin and is used to shift data serially into the device. The SI pin is used  
for all data input, including opcodes and address sequences.  
7.4.2  
7.4.3  
Serial Output (SO)  
The SO pin is an output-only pin and is used to shift data serially out from the device.  
Serial Clock (SCK)  
The SCK pin is an input-only pin and is used to control the flow of data to and from the  
DataFlash. Data is always clocked into the device on the rising edge of SCK and clocked out of  
the device on the falling edge of SCK.  
7.4.4  
7.4.5  
Chip Select (CS)  
The DataFlash is selected when the CS pin is low. When the device is not selected, data will not  
be accepted on the input pin (SI), and the output pin (SO) will remain in a high impedance state.  
A high-to-low transition on the CS pin is required to start an operation, and a low-to-high transi-  
tion on the CS pin is required to end an operation or to start an internally self-timed operation.  
Write Protect (WP)  
The WP pin is used to control the Hardware Sector Protection. Hardware Sector Protection is  
enabled by asserting the WP pin and keeping the pin in it’s asserted state. Disabling Hardware  
Sector Protection is accomplished by simply deasserting the WP pin. The WP pin will override  
the software controlled sector protection method but only for protecting the sectors. For exam-  
ple, if the sectors were not previously protected by the Enable Sector Protection command, then  
simply asserting the WP pin for the minimum specified time (tWPE) would enable the sector pro-  
tection. When the WP pin is deasserted; however, the sector protection would no longer be  
enabled as long as the Enable Sector Protection command was not issued while the WP pin was  
asserted. If the Enable Sector Protection command was issued before or while the WP pin was  
asserted, then simply deasserting the WP pin would not disable the sector protection. In this  
case, the Disable Sector Protection command would need to be issued while the WP pin is  
deasserted to disable the sector protection. The Disable Sector Protection command is also  
ignored whenever the WP pin is asserted.  
To ensure backwards compatibility with previous generations of DataFlash, the function of the  
WP pin has not changed. Therefore, when the WP pin is asserted, certain sectors in the memory  
array will be protected, and when the WP pin is deasserted, the memory array will be unpro-  
tected provided the Enable Sector Protection command hasn’t been issued. New devices are  
shipped from Atmel with the contents of the Sector Protection Register pre-programmed with  
“00H” (unprotect). The user can reprogram the Sector Protection Register to change which sec-  
tors will be protected by the WP pin.  
15  
3387M–DFLASH–2/08  
The table below details the sector protection status for various scenarios of the WP pin, the  
Enable Sector Protection command, and the Disable Sector Protection command.  
1
2
3
WP  
Time  
Period  
WP Pin  
Enable Sector Protection Command  
Disable Sector Protection Command  
Sector Protection Status  
High  
High  
High  
Command Not Issued Previously  
x
Disabled  
Enabled  
Disabled  
1
2
3
Command Issued  
Command Issued  
Low  
x
x
Enabled  
High  
High  
High  
Command Issued during Period 1 or 2  
Not Issued Yet  
Command Issued  
Enabled  
Disabled  
Enabled  
Issue Command  
7.4.6  
RESET  
A low state on the reset pin (RESET) will terminate the operation in progress and reset the inter-  
nal state machine to an idle state. The device will remain in the reset condition as long as a low  
level is present on the RESET pin. Normal operation can resume once the RESET pin is brought  
back to a high level.  
The device incorporates an internal power-on reset circuit, so there are no restrictions on the  
RESET pin during power-on sequences. The RESET pin is also internally pulled high; therefore,  
in low pin count applications, connection of the RESET pin is not necessary if this pin and fea-  
ture will not be utilized. However, it is recommended that the RESET pin be driven high  
externally whenever possible.  
7.4.7  
READY/BUSY  
This open drain output pin will be driven low when the device is busy in an internally self-timed  
operation. This pin, which is normally in a high state (through an external pull-up resistor), will be  
pulled low during programming/erase operations, and page-to-buffer transfers.  
The busy status indicates that the Flash memory array and one of the buffers cannot be  
accessed; read and write operations to the other buffer can still be performed. During Page  
Erase and Block Erase, read and write operations can be performed to both buffers.  
16  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
8. Power-on/Reset State  
When power is first applied to the device, or when recovering from a reset condition, the device  
will default to Mode 3. In addition, the output pin (SO) will be in a high impedance state, and a  
high-to-low transition on the CS pin will be required to start a valid instruction. The mode (Mode  
3 or Mode 0) will be automatically selected on every falling edge of CS by sampling the inactive  
clock state. After power is applied and VCC is at the minimum datasheet value, the system  
should wait 20 ms before an operational mode (DataFlash) is started.  
9. System Considerations  
The RapidS serial interface is controlled by the serial clock SCK, serial input SI and chip select  
CS pins. These signals must rise and fall monotonically and be free from noise. Excessive noise  
or ringing on these pins can be misinterpreted as multiple edges and cause improper operation  
of the device. The PC board traces must be kept to a minimum distance or appropriately termi-  
nated to ensure proper operation. If necessary, decoupling capacitors can be added on these  
pins to provide filtering against noise glitches.  
As system complexity continues to increase, voltage regulation is becoming more important.  
A key element of any voltage regulation scheme is its current sourcing capability. Like all Flash  
memories, the peak current for DataFlash occur during the programming and erase operation.  
The regulator needs to supply this peak current requirement. An under specified regulator can  
cause current starvation. Besides increasing system noise, current starvation during program-  
ming or erase can lead to improper operation and possible data corruption.  
For applications that require random modifications of data within a sector, please refer to “Auto  
Page Rewrite” on page 8.  
Atmel C generation DataFlash utilizes a sophisticated adaptive algorithm during erase and pro-  
gramming to maximize the endurance over the life of the device. The algorithm uses a  
verification mechanism to check if the memory cells have been erased or programmed success-  
fully. If the memory cells were not erased or programmed completely, the algorithm erases or  
programs the memory cells again. The process will continue until the device is erased or pro-  
grammed successfully.  
In order to optimize the erase and programming time, fixed timing should not be used.  
Instead, the RDY/BUSY bit of the status register or the RDY/BUSY pin should be  
monitored.  
17  
3387M–DFLASH–2/08  
Table 9-1.  
Command  
Read Commands  
SCK Mode  
Opcode  
E8H  
68H  
RapidS Mode 0 or 3  
Continuous Array Read  
Main Memory Page Read  
Buffer 1 Read  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
D2H  
52H  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
D4H  
54H  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
D6H  
56H  
Buffer 2 Read  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
D7H  
57H  
Status Register Read  
Inactive Clock Polarity Low or High  
RapidS Mode 0 or 3  
Manufacturer and Device ID  
9FH  
Note:  
1. Legacy Opcodes 52H, 54H, 56H, 57H, and 68H are still supported for reasons of backward compatibility only and are not  
recommended for new designs. The inactive clock polarity high or low modes will not be supported in the future products.  
Table 9-2.  
Command  
Program and Erase Commands  
SCK Mode  
Opcode  
84H  
87H  
83H  
86H  
88H  
89H  
81H  
50H  
82H  
85H  
Buffer 1 Write  
Buffer 2 Write  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Buffer 1 to Main Memory Page Program with Built-in Erase  
Buffer 2 to Main Memory Page Program with Built-in Erase  
Buffer 1 to Main Memory Page Program without Built-in Erase  
Buffer 2 to Main Memory Page Program without Built-in Erase  
Page Erase  
Block Erase  
Main Memory Page Program Through Buffer 1  
Main Memory Page Program Through Buffer 2  
18  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
Table 9-3.  
Command  
Additional Commands  
SCK Mode  
Opcode  
53H  
Main Memory Page to Buffer 1 Transfer  
Main Memory Page to Buffer 2 Transfer  
Main Memory Page to Buffer 1 Compare  
Main Memory Page to Buffer 2 Compare  
Auto Page Rewrite Through Buffer 1(1)  
Auto Page Rewrite Through Buffer 2(1)  
Security Register Program(2)  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
Mode 0, Mode 3  
55H  
60H  
61H  
58H  
59H  
9AH  
77H  
Security Register Read  
Notes: 1. This command should be used for applications requiring a high number of random page writes within a sector. See “Auto  
Page Rewrite” on page 8.  
2. The Security Register Program command utilizes data stored in Buffer 1. Therefore, this command must be used in conjunc-  
tion with the Buffer 1 write command. See “Security Register” on page 14 for details.  
19  
3387M–DFLASH–2/08  
Table 9-4.  
Detailed Bit-level Addressing Sequence  
Address Byte  
Address Byte  
Address Byte  
Additional  
Don’t Care  
Bytes  
Opcode  
50H  
52H  
53H  
54H  
55H  
56H  
57H  
58H  
59H  
60H  
61H  
68H  
77H  
81H  
82H  
83H  
84H  
85H  
86H  
87H  
88H  
89H  
9AH  
9FH  
D2H  
D4H  
D6H  
D7H  
E8H  
Opcode  
Required  
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
0
0
0
0
0
0
0
0
0
1
1
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
0
0
0
1
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
0
0
0
0
0
0
0
0
1
1
0
0
1
0
0
0
0
0
0
0
0
1
1
1
1
0
0
0
0
1
0
0
0
1
1
1
1
0
0
0
0
0
1
0
0
0
1
1
1
1
0
0
0
1
0
1
1
1
0
0
1
1
0
0
1
1
0
0
0
0
0
1
0
1
1
0
0
1
1
0
0
1
1
1
0
1
1
0
0
0
1
0
1
0
1
0
1
0
1
0
1
1
0
1
0
1
0
1
0
1
0
1
0
0
0
1
0
r
r
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
x
P
P
x
x
P
P
x
x
P
P
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
x
B
x
N/A  
4 Bytes  
N/A  
1 Byte  
N/A  
1 Byte  
N/A  
N/A  
N/A  
N/A  
N/A  
4 Bytes  
4
r
x
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
x
B
B
B
B
B
B
B
B
B
B
N/A  
N/A  
N/A  
r
r
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
P
P
P
P
P
0
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
r
x
x
x
x
x
x
x
x
x
x
r
x
x
x
x
x
x
x
x
x
x
r
B
0
x
B
0
x
B
0
x
B
0
x
B
0
x
B
0
x
B
0
x
B
0
x
B
0
x
B
0
x
0
r
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
P
P
P
x
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
4
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
r
x
r
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
B
B
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
r
x
r
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
B
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
P
P
x
r
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
N/A  
N/A  
N/A  
r
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
P
x
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
B
x
x
1
x
x
x
x
x
x
x
x
x
x
x
x
x
1
N/A  
N/A  
N/A  
1/0  
r
P
P
P
P
P
P
P
P
P
P
P
P
P
B
B
B
B
B
B
B
B
B
B
4
Note:  
r = Reserved Bit, P = Page Address Bit, B = Byte/Buffer Address Bit, x = Don’t Care  
20  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
10. Electrical Specifications  
Table 10-1. Absolute Maximum Ratings*  
*NOTICE:  
Stresses beyond those listed under “Absolute  
Maximum Ratings” may cause permanent dam-  
age to the device. This is a stress rating only and  
functional operation of the device at these or any  
other conditions beyond those indicated in the  
operational sections of this specification is not  
implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device  
reliability.  
Temperature under Bias ............................... -55°C to +125°C  
Storage Temperature.................................... -65°C to +150°C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground...................................-0.6V to +6.25V  
All Output Voltages  
with Respect to Ground.............................-0.6V to VCC + 0.6V  
Table 10-2. DC and AC Operating Range  
AT45DB321C  
0°C to 70° C  
-40° C to 85° C  
2.7V to 3.6V  
Com.  
Operating Temperature (Case)  
Ind.  
V
CC Power Supply(1)  
Note:  
1. After power is applied and VCC is at the minimum specified datasheet value, the system should wait 20 ms before an opera-  
tional mode is started.  
Table 10-3. DC Characteristics  
Symbol  
Parameter  
Condition  
Min  
Typ  
Max  
Units  
CS, RESET, WP = VIH, all  
inputs at CMOS levels  
(1)  
ISB  
Standby Current  
6
15  
µA  
Active Current, Read  
Operation, Serial Interface  
f = 20 MHz; IOUT = 0 mA;  
VCC = 3.6V  
(2)(3)  
ICC1  
10  
35  
30  
30  
15  
50  
40  
40  
mA  
mA  
mA  
mA  
Active Current, Program  
Operation, Page Program  
ICC2  
ICC3  
ICC4  
VCC = 3.6V  
Active Current, Page Erase  
Operation  
V
CC = 3.6V  
CC = 3.6V  
Active Current, Block Erase  
Operation  
V
ILI  
Input Load Current  
Output Leakage Current  
Input Low Voltage  
VIN = CMOS levels  
VI/O = CMOS levels  
1
1
µA  
µA  
V
ILO  
VIL  
VIH  
VOL  
VOH  
VCC x 0.3  
Input High Voltage  
Output Low Voltage  
Output High Voltage  
VCC x 0.7  
V
IOL = 1.6 mA; VCC = 2.7V  
IOH = -100 µA  
0.4  
V
VCC - 0.2V  
V
Notes: 1. ISB maximum specification limit is tested at 3.3V and 70° C.  
2. ICC1 during a buffer read is 30 mA maximum.  
3. ICC1 changes typically by 300 µA per 1 MHz change in clock frequency.  
4. All inputs are 5 volts tolerant.  
21  
3387M–DFLASH–2/08  
Table 10-4. AC Characteristics – Serial Interface  
Symbol  
Parameter  
Min  
Typ  
Max  
40  
Units  
MHz  
MHz  
ns  
(1)  
fSCK  
SCK Frequency  
(1)  
fCAR  
SCK Frequency for Continuous Array Read  
SCK High Time  
40  
tWH  
tWL  
tCS  
tCSS  
tCSH  
tCSB  
tSU  
tH  
10  
10  
SCK Low Time  
ns  
Minimum CS High Time  
CS Setup Time  
250  
100  
250  
ns  
ns  
CS Hold Time  
ns  
CS High to RDY/BUSY Low  
Data In Setup Time  
150  
ns  
3
6
0
ns  
Data In Hold Time  
ns  
tHO  
tDIS  
tV  
Output Hold Time  
ns  
Output Disable Time  
Output Valid  
10  
12  
ns  
ns  
tXFR  
Page to Buffer Transfer/Compare Time  
Page Erase and Programming Time  
Page Programming Time  
Page Erase Time  
350  
50  
µs  
(2)(3)  
tEP  
16  
8
ms  
ms  
ms  
ms  
µs  
(2)(3)  
tP  
15  
(2)(3)  
tPE  
8
35  
(2)(3)  
tBE  
Block Erase Time  
20  
100  
tRST  
tREC  
tWPE  
tWPD  
RESET Pulse Width  
RESET Recovery Time  
WP Low to Protection Enabled  
WP High to Protection Disabled  
10  
1
1
1
µs  
µs  
µs  
Note:  
1. Maximum specified frequency for SPI compatibility is 33 MHz.  
2. The device uses an adaptive algorithm during program and erase operations. Use the RDY/BUSY bit of the status register or  
the RDY/BUSY pin to determine whether the program or erase operation has completed. Fixed timing should not be used.  
3. Value are based on device characterization, not 100% tested in production.  
22  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
11. Input Test Waveforms and Measurement Levels  
3.0V  
AC  
AC  
1.5V  
DRIVING  
LEVELS  
MEASUREMENT  
LEVEL  
0V  
tR, tF < 2 ns (10% to 90%)  
12. Output Test Load  
DEVICE  
UNDER  
TEST  
30 pF  
13. AC Waveforms  
Four different timing waveforms are shown below. Waveform 1 shows the SCK signal being low  
when CS makes a high-to-low transition, and waveform 2 shows the SCK signal being high  
when CS makes a high-to-low transition. In both cases, output SO becomes valid while the SCK  
signal is still low (SCK low time is specified as tWL). Timing waveforms 1 and 2 conform to Rap-  
idS serial interface but for frequencies up to 33 MHz and are compatible with SPI Mode 0 and  
SPI Mode 3 respectively. Waveforms 1 and 2 are also compatible with inactive clock polarity low  
and inactive clock polarity high, since the maximum specified frequency in that case is 33 MHz.  
Waveform 3 and waveform 4 illustrate general timing diagram for RapidS serial interface. These  
are similar to waveform 1 and waveform 2, except that output SO is not restricted to become  
valid during the tWL period. These timing waveforms are valid over the full frequency range (max-  
imum frequency = 40 MHz) of the RapidS serial case.  
13.1 Waveform 1 – SPI Mode 0 Compatible (for Frequencies up to 33 MHz)  
tCS  
CS  
tCSS  
tWH  
tWL  
tCSH  
SCK  
SO  
SI  
tV  
tHO  
tDIS  
HIGH IMPEDANCE  
HIGH IMPEDANCE  
VALID OUT  
tSU  
tH  
VALID IN  
23  
3387M–DFLASH–2/08  
13.2 Waveform 2 – SPI Mode 3 Compatible (for Frequencies up to 33 MHz)  
tCS  
CS  
tCSS  
tWL  
tWH  
tCSH  
SCK  
SO  
tV  
tHO  
tDIS  
HIGH Z  
HIGH IMPEDANCE  
VALID OUT  
tSU  
tH  
VALID IN  
SI  
13.3 Waveform 3 – RapidS Mode 0 (for all Frequencies)  
tCS  
CS  
tCSS  
tWH  
tWL  
tCSH  
SCK  
SO  
SI  
tV  
tHO  
VALID OUT  
tDIS  
HIGH IMPEDANCE  
HIGH IMPEDANCE  
tSU  
tH  
VALID IN  
13.4 Waveform 4 – RapidS Mode 3 (for all Frequencies)  
tCS  
CS  
tCSS  
tWL  
tWH  
tCSH  
SCK  
SO  
tV  
tHO  
tDIS  
HIGH Z  
HIGH IMPEDANCE  
VALID OUT  
tSU  
tH  
VALID IN  
SI  
24  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
13.5 Reset Timing  
CS  
tREC  
tCSS  
SCK  
RESET  
SO  
tRST  
HIGH IMPEDANCE  
HIGH IMPEDANCE  
SI  
Note:  
The CS signal should be in the high state before the RESET signal is deasserted.  
13.6 Command Sequence for Read/Write Operations (except Status Register Read)  
SI  
CMD  
8 bits  
8 bits  
8 bits  
MSB  
r X X X X X X X  
X X X X X X X X  
X X X X X X X X  
LSB  
Reserved for  
larger densities  
Page Address  
(PA12-PA0)  
Byte/Buffer Address  
(BA9-BA0/BFA9-BFA0)  
Notes: 1. “r” designates bits reserved for larger densities.  
2. It is recommended that “r” be a logical “0” for densities of 32M bits or smaller.  
3. For densities larger than 32M bits, the “r” bit becomes the most significant Page Address bit for the appropriate density.  
25  
3387M–DFLASH–2/08  
14. Write Operations  
The following block diagram and waveforms illustrate the various write sequences available.  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
BUFFER 1 TO  
MAIN MEMORY  
PAGE PROGRAM  
MAIN MEMORY  
PAGE PROGRAM  
THROUGH BUFFER 2  
BUFFER 2 TO  
MAIN MEMORY  
PAGE PROGRAM  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
MAIN MEMORY PAGE  
PROGRAM THROUGH  
BUFFER 1  
BUFFER 1  
BUFFER 2  
WRITE  
WRITE  
I/O INTERFACE  
SI  
14.1 Main Memory Page Program through Buffers  
· Completes writing into selected buffer  
· Starts self-timed erase/program operation  
CS  
BFA7-0  
r, PA12-6  
PA5-0, BFA9-8  
SI  
CMD  
n
n+1  
Last Byte  
14.2 Buffer Write  
· Completes writing into selected buffer  
CS  
SI  
CMD  
X
X···X, BFA9-8  
BFA7-0  
n
n+1  
Last Byte  
14.3 Buffer to Main Memory Page Program (Data from Buffer Programmed into Flash Page)  
Starts self-timed erase/program operation  
CS  
SI  
CMD  
r , PA12-6  
PA5-0, XX  
X
n = 1st byte write  
Each transition represents  
8 bits and 8 clock cycles  
n+1 = 2nd byte write  
26  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
15. Read Operations  
The following block diagram and waveforms illustrate the various read sequences available.  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
MAIN MEMORY  
PAGE TO  
MAIN MEMORY  
PAGE TO  
BUFFER 1  
BUFFER 2  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
BUFFER 1  
READ  
MAIN MEMORY  
PAGE READ  
BUFFER 2  
READ  
I/O INTERFACE  
SO  
15.1 Main Memory Page Read  
CS  
SI  
CMD  
r , PA12-6  
PA5-0, BA9-8  
BA7-0  
X
X
X
X
n
n+1  
SO  
15.2 Main Memory Page to Buffer Transfer (Data from Flash Page Read into Buffer)  
Starts reading page data into buffer  
CS  
SI  
CMD  
r , PA12-6  
PA5-0, XX  
X
SO  
15.3 Buffer Read  
CS  
CMD  
X
X···X, BFA9-8  
BFA7-0  
X
SI  
SO  
n
n+1  
n = 1st byte read  
Each transition represents  
8 bits and 8 clock cycles  
n+1 = 2nd byte read  
27  
3387M–DFLASH–2/08  
15.4 Detailed Bit-level Read Timing – RapidS Serial Interface Mode 0  
15.4.1  
Continuous Array Read (Opcode: E8H)  
CS  
SCK  
1
1
2
1
62  
X
63  
X
64  
X
65  
66  
67  
t
SU  
SI  
t
V
DATA OUT  
LSB  
MSB  
HIGH IMPEDANCE  
SO  
D
D
D
D
D
D
D
D
D
5
7
6
5
2
1
0
7
6
BIT 4223  
OF  
PAGE n  
BIT 0  
OF  
PAGE n+1  
15.4.2  
Main Memory Page Read (Opcode: D2H)  
CS  
SCK  
1
1
2
3
4
5
0
60  
61  
62  
X
63  
X
64  
X
65  
66  
67  
tSU  
COMMAND OPCODE  
SI  
1
0
1
X
X
tV  
DATA OUT  
HIGH IMPEDANCE  
D
D
D
D
4
SO  
7
6
5
MSB  
15.4.3  
Buffer Read (Opcode: D4H or D6H)  
CS  
SCK  
1
1
2
3
4
5
0
36  
X
37  
X
38  
39  
X
40  
X
41  
42  
43  
t
SU  
COMMAND OPCODE  
SI  
1
0
1
X
t
V
DATA OUT  
HIGH IMPEDANCE  
D
7
D
D
D
4
SO  
6
5
MSB  
28  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
15.4.4  
Status Register Read (Opcode: D7H)  
CS  
SCK  
1
1
2
1
3
4
5
6
7
1
8
9
10  
11  
12  
15  
16  
t
SU  
COMMAND OPCODE  
SI  
0
1
0
1
1
t
V
t
V
STATUS REGISTER OUTPUT  
HIGH IMPEDANCE  
D
D
D
D
4
SO  
D
D
LSB  
D
7
MSB  
7
6
5
1
0
MSB  
DON’T CARE BYTE FOR  
FREQ. OVER 25 MHz  
15.4.5  
Manufacturer and Device ID Read (Opcode: 9FH)  
CS  
SCK  
1
1
2
3
4
5
6
7
1
8
9
10  
11  
12  
16  
17  
18  
tSU  
COMMAND OPCODE  
SI  
0 -  
0
1
1
1
1
tV  
PRODUCT ID OUTPUT  
HIGH IMPEDANCE  
0
0
0
1
SO  
1
0
0
MSB  
LSB MSB  
MANUFACTURER ID  
15.5 Detailed Bit-level Read Timing – RapidS Serial Interface Mode 3  
15.5.1  
Continuous Array Read (Opcode: E8H)  
CS  
SCK  
1
2
63  
64  
65  
66  
67  
tSU  
SI  
1
1
X
X
X
tV  
DATA OUT  
LSB  
MSB  
HIGH IMPEDANCE  
SO  
D
D
D
D
D
D
D
D
D
5
7
6
5
2
1
0
7
6
BIT 4223  
OF  
PAGE n  
BIT 0  
OF  
PAGE n+1  
29  
3387M–DFLASH–2/08  
15.5.2  
15.5.3  
15.5.4  
Main Memory Page Read (Opcode: D2H)  
CS  
SCK  
1
2
3
4
5
61  
62  
63  
64  
65  
66  
67  
68  
t
SU  
COMMAND OPCODE  
SI  
1
1
0
1
0
X
X
X
X
X
t
V
DATA OUT  
HIGH IMPEDANCE  
SO  
D
MSB  
D
D
D
4
7
6
5
Buffer Read (Opcode: D4H or D6H)  
CS  
SCK  
1
2
3
4
5
37  
38  
39  
40  
41  
42  
43  
44  
t
SU  
COMMAND OPCODE  
SI  
1
1
0
1
0
X
X
X
X
X
t
V
DATA OUT  
HIGH IMPEDANCE  
SO  
D
D
D
D
4
7
6
5
MSB  
Status Register Read (Opcode: D7H)  
CS  
SCK  
1
2
3
4
5
6
7
8
9
10  
11  
12  
17  
18  
t
SU  
COMMAND OPCODE  
SI  
1
1
0
1
0
1
1
1
t
V
t
V
STATUS REGISTER OUTPUT  
HIGH IMPEDANCE  
SO  
D
MSB  
D
D
D
D
LSB  
D
MSB  
D
6
7
6
5
4
0
7
DON’T CARE BYTE FOR  
FREQ. OVER 25 MHz  
30  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
15.5.5  
Manufacturer and Device ID Read (Opcode: 9FH)  
CS  
SCK  
1
2
3
4
5
6
7
8
9
10  
11  
12  
17  
18  
tSU  
COMMAND OPCODE  
SI  
1
0
0
1
1
1
1
1
tV  
PRODUCT ID OUTPUT  
HIGH IMPEDANCE  
SO  
0
MSB  
0
0
1
1
LSB  
0
MSB  
0
MANUFACTURER ID  
15.6 Auto Page Rewrite Flowchart  
Figure 15-1. Algorithm for Programming or Reprogramming of the Entire Array Sequentially  
START  
provide address  
and data  
BUFFER WRITE  
(84H, 87H)  
MAIN MEMORY PAGE PROGRAM  
THROUGH BUFFER  
(82H, 85H)  
BUFFER TO MAIN  
MEMORY PAGE PROGRAM  
(83H, 86H)  
END  
Notes: 1. This type of algorithm is used for applications in which the entire array is programmed sequentially, filling the array page-by-  
page.  
2. A page can be written using either a Main Memory Page Program operation or a Buffer Write operation followed by a Buffer  
to Main Memory Page Program operation.  
3. The algorithm above shows the programming of a single page. The algorithm will be repeated sequentially for each page  
within the entire array.  
31  
3387M–DFLASH–2/08  
Figure 15-2. Algorithm for Randomly Modifying Data  
START  
provide address of  
page to modify  
MAIN MEMORY PAGE  
If planning to modify multiple  
bytes currently stored within  
a page of the Flash array  
TO BUFFER TRANSFER  
(53H, 55H)  
BUFFER WRITE  
(84H, 87H)  
MAIN MEMORY PAGE PROGRAM  
THROUGH BUFFER  
(82H, 85H)  
BUFFER TO MAIN  
MEMORY PAGE PROGRAM  
(83H, 86H)  
AUTO PAGE REWRITE(2)  
(58H, 59H)  
INCREMENT PAGE  
ADDRESS POINTER(2)  
END  
Notes: 1. To preserve data integrity, each page of a DataFlash sector must be updated/rewritten at least once within every 10,000  
cumulative page erase and program operations.  
2. A Page Address Pointer must be maintained to indicate which page is to be rewritten. The Auto Page Rewrite command  
must use the address specified by the Page Address Pointer.  
3. Other algorithms can be used to rewrite portions of the Flash array. Low-power applications may choose to wait until 10,000  
cumulative page erase and program operations have accumulated before rewriting all pages of the sector. See application  
note AN-4 (“Using Atmel’s Serial DataFlash”) for more details.  
32  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
16. Sector Addressing  
PA12  
PA11  
PA10  
PA9  
0
PA8  
0
PA7  
0
PA6  
0
PA5  
0
PA4  
0
PA3  
0
PA2 - PA0  
Sector  
0
0
0
0
0
0
0
0
0
0
0
1
X
X
X
X
0a  
0b  
1
0
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
1
0
2
1
1
1
1
1
1
1
1
0
0
1
1
0
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
12  
13  
14  
15  
1
0
1
33  
3387M–DFLASH–2/08  
17. Ordering Information  
ICC (mA)  
fSCK  
(MHz)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
AT45DB321C-CC  
AT45DB321C-CNC  
AT45DB321C-TC  
24C3  
8CN3  
28T  
Commercial  
40  
40  
15  
0.015  
(0°C to 70° C)  
AT45DB321C-CI  
AT45DB321C-TI  
24C3  
28T  
Industrial  
15  
0.015  
(-40° C to 85°C)  
18. Green Package Options (Pb /Halide-free/RoHS Compliant)  
ICC (mA)  
fSCK  
(MHz)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
AT45DB321C-CU  
AT45DB321C-CNU  
AT45DB321C-TU  
24C3  
8CN3  
28T  
Industrial  
40  
15  
0.015  
(-40° C to 85°C)  
19. Legacy Package Options(1)  
ICC (mA)  
fSCK  
(MHz)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
Commercial  
40  
40  
15  
0.015  
AT45DB321C-RC  
28R  
(0°C to 70° C)  
Industrial  
15  
0.015  
AT45DB321C-RU  
28R  
(-40° C to 85°C)  
Note:  
1. Not recommended for new designs.  
Package Type  
24C3  
24-ball (5 x 5 Array), 1.0 mm Pitch, 6 x 8 x 1.2 mm, Plastic Chip-scale Ball Grid Array (CBGA)  
8-pad (6 mm x 8 mm) Chip Array Small Outline No Lead Package (CASON)  
28-lead, Plastic Thin Small Outline Package (TSOP)  
8CN3  
28T  
28R  
28-lead, 0.330” Wide, Plastic Gull Wing Small Outline Package (SOIC)  
34  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
20. Packaging Information  
20.1 24C3 – CBGA  
E
A1 Ball ID  
D
A1  
Top View  
A
1.00 REF  
E1  
Side View  
A1 Ball Corner  
e
2.00 REF  
A
B
C
D
E
COMMON DIMENSIONS  
(Unit of Measure = mm)  
D1  
MIN  
MAX  
NOM  
6.00  
NOTE  
SYMBOL  
E
5.90  
6.10  
E1  
D
4.0 TYP  
8.00  
e
7.90  
8.10  
D1  
A
4.0 TYP  
5
4
3
2
1
1.20  
Øb  
A1  
e
0.25  
Bottom View  
1.00 BSC  
0.40 TYP  
b
9/10/04  
DRAWING NO. REV.  
24C3  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
24C3, 24-ball (5 x 5 Array), 1.0 mm Pitch, 6 x 8 x 1.20 mm,  
Chip-scale Ball Grid Array Package (CBGA)  
A
R
35  
3387M–DFLASH–2/08  
20.2 8CN3 – CASON  
Marked Pin1 Indentifier  
E
A
D
A1  
Top View  
Side View  
Pin1 Pad Corner  
L1  
0.10 mm  
TYP  
8
1
e
7
2
3
COMMON DIMENSIONS  
(Unit of Measure = mm)  
6
5
MIN  
MAX  
1.0  
NOM  
NOTE  
SYMBOL  
b
A
4
A1  
b
0.17  
0.21  
0.41 TYP  
8.00  
0.25  
4
e1  
L
D
7.90  
5.90  
8.10  
6.10  
Bottom View  
E
6.00  
e
1.27 BSC  
1.095 REF  
0.67 TYP  
0.97  
e1  
L
4
4
L1  
0.92  
1.02  
Notes: 1. All dimensions and tolerance conform to ASME Y 14.5M, 1994.  
2. The surface finish of the package shall be EDM Charmille #24-27.  
3. Unless otherwise specified tolerance: Decimal 0.05, Angular 2o.  
4. Metal Pad Dimensions.  
7/10/03  
DRAWING NO. REV.  
8CN3  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
8CN3, 8-pad (6 x 8 x 1.0 mm Body), Lead Pitch 1.27 mm,  
Chip Array Small Outline No Lead Package (CASON)  
B
R
36  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
20.3 28T – TSOP, Type I  
PIN 1  
0º ~ 5º  
c
Pin 1 Identifier Area  
D1  
D
L
b
L1  
e
A2  
E
GAGE PLANE  
A
SEATING PLANE  
COMMON DIMENSIONS  
(Unit of Measure = mm)  
A1  
MIN  
MAX  
1.20  
0.15  
1.05  
13.60  
NOM  
NOTE  
SYMBOL  
A
A1  
A2  
D
0.05  
0.90  
13.20  
11.70  
7.90  
0.50  
1.00  
Notes:  
1. This package conforms to JEDEC reference MO-183.  
2. Dimensions D1 and E do not include mold protrusion. Allowable  
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.  
3. Lead coplanarity is 0.10 mm maximum.  
13.40  
11.80  
8.00  
D1  
E
11.90 Note 2  
8.10  
Note 2  
L
0.60  
0.70  
L1  
b
0.25 BASIC  
0.22  
0.17  
0.10  
0.27  
0.21  
c
e
0.55 BASIC  
12/06/02  
DRAWING NO. REV.  
28T  
TITLE  
2325 Orchard Parkway  
San Jose, CA 95131  
28T, 28-lead (8 x 13.4 mm) Plastic Thin Small Outline  
Package, Type I (TSOP)  
C
R
37  
3387M–DFLASH–2/08  
20.4 28R – SOIC  
B
E
E
1
PIN 1  
e
D
A
A
1
COMMON DIMENSIONS  
(Unit of Measure = mm)  
MIN  
2.39  
MAX  
2.79  
NOM  
NOTE  
SYMBOL  
0º ~ 8º  
A
C
A1  
D
E
0.050  
18.00  
11.70  
8.59  
0.356  
18.50  
12.50  
8.79  
Note 1  
Note 1  
L
E1  
B
0.356  
0.203  
0.94  
0.508  
0.305  
1.27  
C
L
Note: 1. Dimensions D and E1 do not include mold Flash  
or protrusion. Mold Flash or protrusion shall not exceed  
0.25 mm (0.010").  
e
1.27 TYP  
5/18/2004  
TITLE  
DRAWING NO.  
REV.  
2325 Orchard Parkway  
San Jose, CA 95131  
28R, 28-lead, 0.330" Body Width,  
Plastic Gull Wing Small Outline (SOIC)  
28R  
R
C
38  
AT45DB321C  
3387M–DFLASH–2/08  
AT45DB321C  
21. Revision History  
Revision Level – Release Date History  
L – June 2006  
Added 28-lead SOIC pinout diagram on page 2.  
Moved to Mature Products.  
M – February 2008  
39  
3387M–DFLASH–2/08  
Headquarters  
International  
Atmel Corporation  
2325 Orchard Parkway  
San Jose, CA 95131  
USA  
Tel: 1(408) 441-0311  
Fax: 1(408) 487-2600  
Atmel Asia  
Room 1219  
Chinachem Golden Plaza  
77 Mody Road Tsimshatsui  
East Kowloon  
Hong Kong  
Tel: (852) 2721-9778  
Fax: (852) 2722-1369  
Atmel Europe  
Le Krebs  
Atmel Japan  
9F, Tonetsu Shinkawa Bldg.  
1-24-8 Shinkawa  
Chuo-ku, Tokyo 104-0033  
Japan  
Tel: (81) 3-3523-3551  
Fax: (81) 3-3523-7581  
8, Rue Jean-Pierre Timbaud  
BP 309  
78054 Saint-Quentin-en-  
Yvelines Cedex  
France  
Tel: (33) 1-30-60-70-00  
Fax: (33) 1-30-60-71-11  
Product Contact  
Web Site  
Technical Support  
Sales Contact  
www.atmel.com  
Enter Product Line E-mail  
www.atmel.com/contacts  
Literature Requests  
www.atmel.com/literature  
Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any  
intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN ATMELS TERMS AND CONDI-  
TIONS OF SALE LOCATED ON ATMELS WEB SITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY  
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representations or warranties with respect to the accuracy or completeness of the contents of this document and reserves the right to make changes to specifications  
and product descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided  
otherwise, Atmel products are not suitable for, and shall not be used in, automotive applications. Atmel’s products are not intended, authorized, or warranted for use  
as components in applications intended to support or sustain life.  
© 2008 Atmel Corporation. All rights reserved. Atmel®, logo and combinations thereof, Everywhere You Are® and DataFlash® are registered  
trademarks, and RapidSand others are the trademarks of Atmel Corporation or its subsidiaries. Other terms and product names may be trade-  
marks of others.  
3387M–DFLASH–2/08  

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