AT30TSE002B [ATMEL]
Integrated Temperature Sensor with Serial Electrically-erasable and Programmable Read-only Memory; 集成温度传感器,带有串行电可擦除和可编程只读存储器![AT30TSE002B](http://pdffile.icpdf.com/pdf1/p00130/img/icpdf/AT30T_720838_icpdf.jpg)
型号: | AT30TSE002B |
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描述: | Integrated Temperature Sensor with Serial Electrically-erasable and Programmable Read-only Memory |
文件: | 总34页 (文件大小:441K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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Features
• Integrated Temperature Sensor (TS) + 2Kbit Serial EEPROM
• Jedec (JC42.4) SO-DIMM SPD + TS compliant
• Standard voltage operation
Optimized for voltage range: 2.7V to 3.6V
• 100khz and 400khz Compatibility
• Two-wire Serial Interface: I2C/SMBus™ compatible
SMBus Timeout supported
Integrated
Temperature
Sensor with Serial
Electrically-erasable
and Programmable
Read-only Memory
• Schmitt Trigger, filtered inputs for Noise Suppression
• Industry Standard Green (Pb/Halide-free/RoHS Compliant) Package Options
8-pad Very Very Thin DFN (2 x 3 x 0.8mm)
Serial EEPROM Features
• Permanent and Reversible Software Write Protection for the First-half of the Array
Software Procedure to Verify Write Protect Status
• Internally organized as one block of 256-bytes (256 x 8)
• Supports Byte and Page Write operation
Write 1-, 2-, 3-, up to 16-bytes at a time
Atmel AT30TSE002B
Preliminary
• Self-timed Write cycle (5ms max)
• High-reliability
Endurance: 1 Million Write Cycles
Data Retention: 100 years
• Low Operating current
EEPROM Write ~1.5mA (typ.)
EEPROM Read ~ 0.2mA (typ.)
Temperature Sensor Features
• 11-bit ADC Temp-to-Digital Converter with 0.125°C resolution
• Programmable hysteresis threshold: off, 0°C, 1.5°C, 3°C, 6 °C
• B-grade Accuracy
±1°C (max.) for +75°C to +95°C
±2°C (max.) for +40°C to +125°C
±3°C (max.) for -20°C to +125°C
• Low Operating current
Temperature Sensor Active ~ 0.2mA (typ.)
8711D–SEEPR–8/10
Table 0-1. Pin Configuration
Pin Name
A0, A1, A2
SDA
Description
8-WDFN
Address Inputs
Serial Data
Serial Clock Input
EVENT
VCC
EVENT
SCL
A0
8
7
6
5
1
2
3
4
A1
SCL
A2
SDA
GND
Temperature Alert
GND
Bottom View
Ground
VCC
Power Supply
Description
Atmel® AT30TSE002B is a combination serial EEPROM and temperature sensor device containing 2048-bits of
serially electrically-erasable and programmable read only memory (EEPROM) organized as 256-bytes of 8-bits
each and could be used to store memory module and vendor information. The EEPROM operation is tailored
specifically for DRAM Memory Modules Serial Presence Detect (SPD). The first 128-bytes of the memory
incorporate a permanent and a reversible software write protection (WP) feature. Once the permanent software
WP is enabled, by sending a special command, it cannot be reversed. However, once the reversible software WP
is enabled, it can be reversed by sending a special command.
The integrated temperature sensor converts temperatures from -20°C to +125°C to a digital word and provides an
accuracy of ±1°C (max.) in the temperature range +75°C to +95°C. The temperature sensor continuously
monitors temperature and updates data in the temperature register at least eight times per second. Temperature
data is latched internally by the device and may be read by software via a microcontroller at anytime. The
AT30TSE002B has flexible user programmable internal registers to configure the temperature sensor
performance and response to over temperature conditions. The device contains programmable high, low, and
EVENT
critical temperature limits. The device
pin is configured as active low and can be configured to operate as
an interrupt or as a comparator output. Manufacturer and Device ID registers provide the ability to confirm the
identity of the device. The AT30TSE002B supports the industry standard 2-wire I2C/ SMBus serial Interface to
include time out feature to help prevent system lock-ups.
2
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
1.
Absolute Maximum Ratings
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage
to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification are not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
Operating Temperature................ - 40°C to +125°C
Storage Temperature ................. - 65°C to + 150°C
Voltage on Any Pin
with Respect to Ground ......................- 1.0 V +5.0V
Pin A0 ..................................................- 1.0 V +12V
Maximum Operating Voltage............................ 4.3V
DC Output Current........................................ 5.0mA
Figure 1-1.
Block Diagram
Temperature Sensor
Serial EEPROM
H.V. Pump/Timing
Selected Resolution
Temp. Range
Capability
Configuration
Critical Alarm Trip
Device ID
Accuracy
Output Features
EVENT Shutdown
SMBus
EEPROM Write
Protected Section
(00h-7Fh)
X Address
Decoder
EEPROM
Second half
(80h-FFh)
Manufacturer ID
Temperature
Upper Alarm Trip
Lower Alarm Trip
A / D
Converter
Y Address Decoder
Memory
Control Logic
SMBus Timeout
Band Gap
Temperature
Sensor
Write Protect Circuitry
Pointer
Register
Serial
Control Logic
I2C / SMBus
Interface
Vcc
GND
SCLK
A1
A2
SDA
EVENT
A0
3
8711D–SEEPR–8/10
2.
Pin Description
Atmel® AT30TSE002B requires no external components for operation except for pull-up resistors on SCL, SDA,
and
EVENT pins. In order to provide effective noise protection and filtering, it is recommended that a decoupling
capacitor of 0.1µF be used and is located as close as possible to the device between VCC and ground pins.
SERIAL CLOCK (SCL): The SCL input is used to positive edge clock data into each EEPROM device and
negative edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for serial data transfer. This pin is open drain driven and may
be wire-ORed with any number of other open-drain or open collector devices.
Device Addresses (A2, A1, A0): The A2, A1, and A0 pins are device address inputs that are hardwired (directly
to GND or to VCC) for compatibility with two-wire devices. When the pins are hardwired, as many as eight devices
may be addressed on a single bus system. A device is selected when a corresponding hardware and software
match is true. If these pins are left floating, the A2, A1, and A0 pins will be internally pulled to GND. However,
Atmel recommends always connecting the address pins to a known state by direct connection to ground or VCC
but if using a pull-up resistor, Atmel recommends using 10k ohm or less.
The A0 pin is also overvoltage tolerant, allowing up to 10V for software write protection functionality. (See
Section 4 through Section 7)
EVENT
EVENT
Temperature Alert Output (
): The
pin outputs a signal when the temperature goes beyond the user-
programmed temperature limits and be configured in one of three modes; either Interrupt, comparator or critical
alarm modes.
EVENT
The
pin is an open-drain output and requires a pull-up resistor for proper operation (see Section 8).
Table 2-1. Pin Capacitance(1)
Applicable over recommended operating range from TA = 25°C, f = 100 kHz, VCC = +3.0V
Symbol
Test Condition
Max
8
Units
pF
Conditions
VI/O = 0V
EVENT
Input/Output Capacitance (SDA),
CI/O
Input Capacitance (A0, A1, A2, SCL)
6
pF
CIN
VIN = 0V
Note:
1. This parameter is ensured by characterization only
4
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
Table 2-2. DC Characteristics
Applicable over recommended operating range:
TAI = –20°C to +125°C, VCC = +2.7v to +3.6V (unless otherwise noted)
Symbol Parameter
Test Condition
Min
Typ
Max
Units
Supply Voltage
2.7
3.6
V
VCC1
Supply Current
EEPROM READ VCC = 3.6V (2)
100kHz
0.4
1.5
0.2
1.0
3.0
0.5
mA
mA
mA
ICC
EEPROM WRITE VCC = 3.6V (2)
Temp. Sensor VCC = 3.6V
100kHz
ICC
ICC
EEPROM inactive
EEPROM inactive, Temp.
Sensor shutdown
0.2
0.5
mA
ICC
Timeout active VCC = 3.6V
Standby Current VCC =3.6V(3)
Input Leakage Current
Output Leakage Current
Input Low Level(1)
1.6
0.1
0.1
4.0
2.0
uA
uA
uA
V
ISB
ILI
Vin = VHV = or VSS
Vin = VHV = or VSS
Vin = VHV = or VSS
2.0
ILO
VIL
VIH
VOL
-0.6
VHV x 0.3
VHV + 0.5
0.4
Input High Level(1)
V
V
HV x0.7
V
Output Low level VCC = 3.0V
IOL = 2.1mA
Pin = A0;
High Voltage Input A0
7
10
V
V
VHV
VHV - VCC ≥ 4.8V
0.05 x
VCC
Input Hysteresis (SDA, SCL)
VHYST
Temp. Sensor Conversion Time
Temp. Sensor Resolution
75
125
mS
°C
TCONV
TRES
0.25
Temperature Sensor Accuracy
+75°C < Ta < +95°C
-1.0
-2.0
-3.0
±0.5
±1
+1.0
+2.0
+3.0
125
°C
°C
TACCUR
TACCUR
TACCUR
TCONV
TRES
+40°C < Ta < +125°C
-20°C < Ta < +125°C
±2
°C
Temp. Sensor Conversion Time
Temp. Sensor Resolution
75
mS
°C
0.25
Note:
1. VIL min and VIH max are reference only and are not tested
2. Sensor in Shutdown Mode
3. EEPROM inactive, sensor in shutdown mode
5
8711D–SEEPR–8/10
Table 2-3. AC Characteristics
Applicable over recommended operating range:
TAI = –20°C to +125°C, VCC = +2.7v to +3.6V, CL = 1 TTL Gate and 100µF (unless otherwise noted)
Symbol
FSCL
Parameter
Min
10(2)
4.7
Max
Min
10(2)
1.2
Max
Units
kHz
us
Clock Frequency, SCL
Clock Pulse Width Low
Clock Pulse Width High
Noise Suppression Time(1)
100
400
TLOW
THIGH
TI
4.0
0.6
us
100
50
ns
Time the bus must be free before a new
transmission can start(1)
TBUF
4.7
1.2
us
THD.STA
TSU.STA
THD.DI
TSU.DAT
TR
Start Hold Time
4.0
4.7
0
0.6
0.6
0.0
100
us
us
us
ns
us
ns
us
ns
ms
ms
Start Set-up Time
Data In Hold Time
Data In Set-up Time
Inputs Rise Time(1)
Inputs Fall Time(1)
Stop Set-up Time
Data Out Hold Time
Write Cycle Time
SMBus Timeout Time
200
1.0
0.3
300
300
TF
TSU.STO
THD.DAT
TWR
4.7
0.6
200
3450
5
200
900
5
TOUT
25
35
25
35
EEPROM
Write
cycles
25°C, Page Mode
1 Million
Endurance(1)
Note:
1. This parameter is ensured by characterization only
2. The minimum frequency is specified at 10Khz to avoid activating the timeout feature
6
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
3.
4.
Memory Organization
Atmel® AT30TSE002B, 2K Serial EEPROM: The 2K memory is internally organized with 16 pages of 16-bytes
each. Random word addressing requires an 8-bit data word address.
Device Operation
CLOCK and DATA TRANSITIONS: The SDA pin is normally pulled high with an external device. Data on the
SDA pin may change only during SCL low time periods. (see Figure 4-4) Data changes during SCL high periods
will indicate a start or stop condition as defined below.
START CONDITION: A high-to-low transition of SDA with SCL high is a start condition which must precede any
other command (see Figure 4-5).
STOP CONDITION: A low-to-high transition of SDA with SCL high is a stop condition. After a read sequence,
the stop command will place the device in a standby power mode (see Figure 4-5).
ACKNOWLEDGE: All addresses and data words are serially transmitted to and from the EEPROM in 8-bit
words. The device sends a zero to acknowledge that it has received each word. This happens during the ninth
clock cycle.
STANDBY MODE: The AT30TSE002B features a low-power standby mode which is enabled:
a) Upon power-up
b) After the receipt of the STOP bit and the completion of any internal operations. The temperature sensor must
be disabled by the user for low-power standby mode.
Two-Wire Software Reset: After an interruption in protocol, power loss or system reset, any two-wire part can
be reset by following these steps:
a) Create a start bit condition
b) Clock nine cycles
c) Create another start bit followed by stop bit condition as shown below. The device is ready for next
communication after the above steps have been completed.
Figure 4-1.
Two-Wire Software Reset
Start Bit
Start Bit
Stop Bit
Dummy Clock Cycles
1
2
3
8
9
SCL
SDA
7
8711D–SEEPR–8/10
Figure 4-2.
Bus Timing SCL: Serial Clock SDA: Serial Data I/O
tHIGH
tLOW
SCL
tBUF
tHD:STA
tSU:STO
SDA IN
tSU:STA
tSU:DAT
tHD:DI
SDA
input
SDA
change
STOP
condition
START
condition
SCL
tHD:DAT
SDA OUT
Data Valid
Figure 4-3.
SCL
Write Cycle Timing SCL: Serial Clock SDA: Serial Data I/O
tSU:STA
tSU:STO
SDA OUT
tW
START
condition
STOP
condition
Write
cycle
8
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
Figure 4-4.
Data Validity
Figure 4-5.
Start and Stop Condition
Figure 4-6.
Output Acknowledge
9
8711D–SEEPR–8/10
5.
Device Addressing
Atmel® AT30TSE002B device requires an 8-bit device address word following a start condition to enable the chip
to access either the Temperature Sensor or EEPROM functions (See Table 5-1).
Table 5-1. Control/Device Address Word
Control / Device Address Word
Device
Device ID
B6
Device Address Bits
R/W
B0
B7
1
B5
1
B4
0
A2
A1
A0
EEPROM
0
0
1
Temperature Sensor
0
1
1
X
X
X
X
EEPROM Write Protection
0
1
0
Note:
X = User Selectable
The EEPROM device address word consists of a mandatory one-zero sequence for the first four most significant
bits (‘1010’) for normal read and write operations, a ‘0110’ for writing to the EEPROM write protect register and
‘0011’ for Temperature Sensor operations. The next three bits are the A2, A1 and A0 device address bits for the
AT30TSE002B device. These three bits must match their corresponding hard-wired input pins. The eighth bit of
the device address is the read/write operation select bit. A read operation is initiated if this bit is high and an
EEPROM write operation is selected if this bit is low. Upon a compare of the device address, the device will
output a zero, called an Acknowledge (ACK). If a compare is not made, the chip will not ACK and will return to a
standby state. The EEPROM will not ACK if the write protect register has been programmed and the control code
is ‘0110’.
6.
EEPROM Write Operations
BYTE WRITE: A write operation requires an 8-bit data word address following the device address word and ACK.
Upon receipt of this address, the EEPROM will again respond with an ACK and then clock in the first 8-bit data
word. Following receipt of the 8-bit data word, the EEPROM will output an ACK and the addressing device, such
as a microcontroller, must terminate the write sequence with a stop condition. At this time the EEPROM enters an
internally timed write cycle, tWR, to the nonvolatile memory. All inputs are disabled during this write cycle and the
EEPROM will not respond until the write is complete (see Figure 11-2 and Figure 11-3).
The device will acknowledge a write command, but not write the data, if the software write protection has been
enabled. The write cycle time must be observed even when the write protection is enabled.
PAGE WRITE: The 2K EEPROM device is capable of 16-byte page write. A page write is initiated the same as a
byte write, but the microcontroller does not send a stop condition after the first data word is clocked in. Instead,
after the EEPROM acknowledges receipt of the first data word, the microcontroller can transmit up to fifteen more
data words. The EEPROM will respond with a zero after each data word received. The microcontroller must
terminate the page write sequence with a stop condition (see Figure 11-3). The data word address lower four bits
are internally incremented following the receipt of each data word. The higher data word address bits are not
incremented, retaining the memory page row location. When the word address, internally generated, reaches the
page boundary, the following byte is placed at the beginning of the same page. If more than sixteen data words
are transmitted to the EEPROM, the data word address will “roll over” and previous data will be overwritten. The
address “roll over” during write is from the last byte of the current page to the first byte of the same page. The
device will acknowledge a write command, but not write the data, if the software write protection has been
enabled. The write cycle time must be observed even when the write protection is enabled.
10
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
ACKNOWLEDGE (ACK) POLLING: Once the internally-timed write cycle has started and the EEPROM inputs
are disabled, ACK polling can be initiated. This involves sending a start condition followed by the device address
word. The read/write bit is representative of the operation desired. Only if the internal write cycle has completed
will the EEPROM respond with a zero allowing the read or write sequence to continue.
7.
EEPROM Write Protection
The device supports permanent and reversible software write protection and, once enabled, write protects the
first-half of the array (00H - 7FH).
PERMANENT SOFTWARE WRITE PROTECTION: The software write protection is enabled by sending a
command similar to a normal write command; to the device which programs the permanent write protect register.
The write protect register is programmed by sending a write command with the device address of ‘0110’ with the
address and data bit being don’t cares (see Table 9-16 and Table 10-1). Once the software write protection has
been enabled, the device will no longer acknowledge the ‘0110’ control byte. The software write protection cannot
be reversed even if the device is powered down. The write cycle time must be observed.
REVERSIBLE SOFTWARE WRITE PROTECTION: The reversible software write protection is enabled by
sending a command, similar to a normal write command; to the device which programs the reversible write protect
register. The write protect register is programmed by sending a write command ‘01100010’ with pins A2 and A1
tied to ground or no connect and pin A0 connected to VHV (see Figure 10-6 and Table 10-1). The reversible write
protection can be reversed by sending a command ‘01100110’ with pin A2 tied to ground or no connect, pin A1
tied to VCC and pin A0 tied to VHV (see Figure 10-6 and Table 10-2).
8.
Temperature Sensor Functional Description
Atmel® AT30TSE002B consists of a Delta-Sigma Analog to Digital Converter (ADC) with a band gap type
temperature sensor that monitors and updates its own temperature reading at least eight times per second
converting the readings into digital data bits and latching them into a temperature register that can be read via 2-
wire I2C/SMBus serial interface. The device communicates over a 2-wire I2C/SMBus interface with the bus master
or controller consisting of a serial clock (SCL) and serial bidirectional data bus (SDA) with clock frequencies up to
400Khz. The bus master or controller generates the SCL signal and is used by the AT30TSE002B to receive and
send serial data on the SDA line with the most significant bit transferred first. A pull-up resistor is required on the
SDA pin since it is in an open drain configuration.
EVENT
8.1.
Output
EVENT
The
pin has three operating modes depending on configuration settings. They are Interrupt, Comparator,
and Critical Alarm (Crit_Alarm) modes.
EVENT
In the Interrupt mode, once a temperature reaches a boundary limit, the AT30TSE002B asserts the
pin. The
EVENT
pin will remain asserted until software clears the interrupt by writing a “1” to the EVTCLR bit five in the
configuration register. When the temperature drops below specified limits, the device returns back to either
interrupt or comparator mode as programmed in the configuration register’s EVTMOD bit zero.
In the comparator mode, the EVENT pin remains asserted until the error condition that caused the pin to be
EVENT
asserted no longer exists and the
pin will clear itself. In the Crit_Alarm mode, when the measured
EVENT
temperature exceeds Crit_Alarm trip limit, the
pin will remain asserted until the temperature drops below
Crit_Alarm limit minus hysteresis (See Figure 9-1). All event thresholds use hysteresis as programmed in the
configuration register.
11
8711D–SEEPR–8/10
8.2. Alarm Window
The alarm window consists of the Upper Alarm Trip Register and Lower Alarm Trip Register. The Upper Alarm
Trip Register holds the upper temperature trip point and the Lower Alarm Trip Register holds the lower
EVENT
EVENT
temperature trip point. After the
exiting from this window.
pin control is enabled, the
output will be triggered upon entering and
8.3. Temperature Sensor Power-on Default
The Atmel® AT30TSE002B has an internal Power-on Reset (POR) circuit. When the supply voltage drops below
the POR threshold, the device will reset to the following power-on default conditions:
• Sensor starts monitoring temperature continuously
• Address Pointer Register = 00h
• Upper / Lower Alarm Trip registers and Crit_Alarm registers are set to 0°C
•
EVENT register cleared and pulled high by external pull up resistor
• Operational mode is Comparator
EVENT hysteresis is 0°C
•
• SMBus register =00h
8.4. Device Initialization
The AT30TSE002B Temperature Sensor has programmable registers that, upon device power-on, are initialized
EVENT
to ‘0’. Table 9-1 shows the power-on register default values. The
output is defaulted to deasserted state and
comparator mode. Please note the Upper Alarm Trip, Lower Alarm Trip, Critical Alarm Trip registers and
Configuration registers need to be programmed to desired values before temperature sensor can properly
function.
8.5. SMBus Timeout
The AT30TSE002B supports the SMBus timeout feature for temperature sensor operations if enabled via setting
the SMBus register (see Section 9.10). This feature helps prevent potential system bus hang-ups by resetting the
serial interface if SCL stays low for a time specified by the tOUT parameter. This requires a minimum SCL clock
speed of 10Khz as specified in the SMBus specification to avoid any timeout issues.
12
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
9.
Register Descriptions
This section describes all the temperature sensor registers that are used in Atmel® AT30TSE002B. The
AT30TSE002B has several registers that are user accessible and or programmable and used for latching
temperature readings, storing high and low temperature limits, configuring the hysteresis threshold and reporting
status.
These registers include the Capability Register, Upper Alarm Trip Register, Lower Alarm Trip Register, Critical
Alarm Trip Register, Temperature Register, Manufacturer Identification Register, Device Identification Register
and SMBus Register. The AT30TSE002B uses an 8-bit Pointer Register to access these registers and all other
registers contain 16-bits.
The below, Table 9-1, indicates the Write / Read access capability of each register. Reading from a write only
register will result in reading ‘0’ data and writing to read only register will have no impact even though the write
sequence was acknowledged by the device.
Table 9-1. Register Summary
Registers
Power up Default
Register data (hex)
Address (hex)
Read / Write
W
Register Name
Address Pointer
Capability
Section
9.1
n/a
00h
00h
R
9.2
00D7h
0000h
0000h
0000h
0000h
n/a
01h
R / W
R / W
R / W
R / W
R
Configuration
9.3
02h
Upper Alarm Trip
Lower Alarm Trip
Critical Alarm Trip
Temperature Data
Manufacturer I.D.
Device I.D. / Device Revision
Reserved (1)
9.4
03h
9.5
04h
9.6
05h
9.7
06h
R
9.8
001Fh
8201h
0000h
0000h
0000h
07h
R
9.9
08h to 21h
22h
R / W
R / W
R / W
n/a
SMBus Timeout
Reserved (1)
9.10
n/a
23h to FFh
Note:
1. Write operations to reserve registers should be avoided as it may cause undesirable results
9.1. Address Pointer Register
The AT30TSE002B uses a Pointer Register to select and access the 16-bit data registers shown in
Table 9-1. The Pointer Register is an 8-bit write only register (See Table 9-2). The power on default value is 00h
which is the address location for the capability register.
Table 9-2. Address Pointer Register
Bit
7
6
5
4
3
2
1
0
Symbol
R / W
Pointer Bits
W
0
W
0
W
0
W
0
W
0
W
0
W
0
W
0
Default Value
13
8711D–SEEPR–8/10
9.2. Capability Register (16-bit Read only, Address = 00h)
The Atmel® AT30TSE002B is capable of measuring temperature with ±1°C over the active range and ±2°C over
the monitor range. This register is a 16-bit read-only register used to specify the capabilities of the temperature
sensor. The Capability Register functions are described in Table 9-3 and Table 9-4.
Table 9-3. Capability Register Bit Distribution
Bit
15
14
13
12
11
10
9
8
Symbol
RFU
Default Value
R / W access
0
0
0
0
0
0
0
0
R
R
R
R
R
R
R
R
Bit
7
EVSD
1
6
5
VHV
1
4
3
2
1
SACC
1
0
ICAP
1
Symbol
TMOUT
TPRES
RANGE
Default Value
R / W access
1
1
0
1
R
R
R
R
R
R
R
R
Table 9-4. Capability Register Bit Description
Bit
15:8
7
Symbol
RFU
Description
Reserved for Future Use and must be '0'
Event Output Status During Shutdown Mode
EVSD
EVENT
1 = The
pin output is deasserted (not driven) when entering shutdown mode and will
resume status update immediately upon exiting shutdown.
In addition, the EVTSTS bit in the configuration register will be cleared when entering
shutdown mode and will resume status update immediately upon exiting shutdown.
6
TMOUT
VHV
Bus Timeout
1 = Supported within the SMBus compatible range 25 to 35mS (power-up default)
5
High Voltage Support for A0 pin
1 = A0 Pin supports a voltage up to 10 volts (power up default)
4:3
TPRES
Temperature resolution
'10' – supports 0.125°C
2
1
RANGE
SACC
'1' – Can read temperatures below 0°C and sets appropriate sign bit
Supported Accuracy. '1' – Supports B grade accuracy of ± 1°C over the active range (75°C
to 95°C) and 2°C over the monitor range (40°C to 125°C )
0
ICAP
Interrupt Capability. '1' – has alarm and critical trip interrupt capability
14
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
9.3. Configuration Register (16-bit Read/Write, Address = 01h)
The Atmel® AT30TSE002B contains a 16-bit Configuration Register allowing the user to set key operational
features of the Temperature Sensor. The Configuration Register functions are described in Table 9-5 and
Table 9-6.
Table 9-5. Configuration Register Bit Distribution
Bit
15
14
13
RFU
0
12
11
10
HYSTENB
9
8
SHTDWN
0
Symbol
Default Value
R / W access
0
0
0
0
0
0
R
R
R
R
R
R/W
R/W
R/W
Bit
7
6
5
4
3
2
1
0
Symbol
CRTALML WINLOCK EVTCLR EVTSTS EVTOUT CRITEVT EVTPOL EVTMOD
Default Value
R / W access
0
0
0
0
0
0
0
0
R/W
R/W
W
R
R/W
R/W
R/W
R/W
Table 9-6. Configuration Register Bit Description
Bit
15:11
10:9
Symbol
RFU
HYSTENB
Description
Reserved for Future Use and must be '0'.
Hysteresis Enable
’00’ = 0°C Disable hysteresis (default power-on condition)
'01' = 1.5°C Enable hysteresis
‘10’ = 3.0°C Enable hysteresis
‘11’ = 6.0°C Enable hysteresis
The purpose of these bits is to control the hysteresis applied to the alarm trip point boundaries.
The above hysteresis applies to all limits when temperature drops below the user specified
alarm trip points. Please note that hysteresis applies to decreasing temperature only. Once
ambient temperature is above a given threshold, it must drop below the boundary limit minus
hysteresis in order for a comparator EVENT to be cleared. For example, if these bits are set to
‘01’ for 1.5°C and the Upper Alarm Trip limit is set to 85°C, as temperature rises above 85°C,
bit 14 of temperature register will be set to a ‘1’. Bit 14 will remain set until the ambient
temperature drops below the threshold (85°C) minus the hysteresis value or 83.5°C. Note that
EVENT
hysteresis is also applied to the
pin functionality. When either of the Crit_Alarm Trip or
Alarm Window lock bits is set, this bit cannot be altered until unlocked.
8
SHTDWN
Shutdown Mode
0 = Temperature sensor enabled for continuous conversion (power-on default)
1 = Temperature sensor disabled
In Shutdown mode, the temperature sensor is not active and will not generate interrupts or
EVENT
update temperature data. The
pin is deasserted (not driven)
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered
until unlocked
15
8711D–SEEPR–8/10
Bit
Symbol
Description
7
CRTALML
Crit_Alarm Trip Lock bit
Locks the Critical Alarm Trip register from being updated
0 = Crit_Alarm Trip register can be updated (Power-on default)
1 = Crit_Alarm Trip register is locked and cannot be updated
Once set, it can be only be cleared to ‘0’ by internal power on reset (POR) which occurs when
the device is powered off and then powered on
6
5
WINLOCK
EVTCLR
Alarm Window Lock bit
0 = Upper and Lower Alarm Trip Registers can be updated (Power-on default)
1 = Upper and Lower Alarm Trip Registers are locked and cannot be updated
Once set, it can be only be cleared to ‘0’ by internal power on reset (POR) when device is
powered off then powered on
EVENT
Clear. This bit is a Write only bit and will read ‘0’
EVENT
This bit can clear the
pin after it has been enabled and is self clearing
0 = has no effect (power-on default)
1 = clears (releases) the active EVENT pin in interrupt mode. This bit is ignored when in
comparator mode
4
3
EVTSTS
EVTOUT
EVENT
Pin Output Status
EVENT
EVENT
0 = The
1 = The
Output is not asserted by the device. (Power-on default)
Output is asserted due to an alarm trip condition
Please note this bit will be cleared when entering shutdown mode and will resume status
update immediately upon exiting shutdown
EVENT
Output Control
EVENT
This bit, when set, prevents the
pin from generating an interrupt
EVENT
EVENT
0 = The
1 = The
output is disabled and will not generate interrupts (Power-on default)
output is enabled
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered
until unlocked
2
1
CRITEVT
EVTPOL
Critical Temperature only
EVENT
0 = The
output is asserted for the Upper, Lower and Critical Alarms (Power-on default)
EVENT
1 = The
output is asserted for only Critical Alarm when ambient temperature > Crit_Alarm
trip boundary
When the Alarm Window lock bit is set, this bit cannot be altered until unlocked
EVENT
Polarity
0 = Active LOW. (Power-on default)
A pull-up resistor is required on this pin to set inactive state
1 = Active HIGH
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered
until unlocked
0
EVTMOD
EVENT
Mode
EVENT
EVENT
0 = The
1 = The
pin will operate in Comparator mode. (Power-on default)
pin will operate in Interrupt mode
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered
until unlocked
16
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
EVENT
Figure 9-1.
Pin Mode Functionality
Crit_Alarm
Upper Alarm
Measured
Temperature
Lower Alarm
Switches to
Compa rator
Mode
Software Resets Inter rupt
EVENT pin in “Interrupt Mode”
(active low)
EVENT pin in “Comparator
Mode” (active low)
9.4. Upper Alarm Trip Register (16-bit Read/Write, Address = 02h)
The Upper Alarm Trip Register holds the user programmed upper temperature boundary trip point in 11-bit two’s
complement format (0.25°C resolution) that can be used to monitor ambient temperature in an operating window
(See Table 9-7 and Table 9-8). When the temperature increases above this trip point, or drops below or is equal
EVENT
to the trip point (minus any hysteresis set), then the
pin is asserted (if enabled). This register becomes read
only if the Alarm Window Lock bit (WINLOCK) bit six in the configuration register is set to a ‘1’.
Table 9-7. Upper Alarm Trip Register Bit Distribution
Bit
15
14
RFU
0
13
12
SIGN
0
11
10
ALMWINH
9
8
Symbol
Default Value
R / W access
0
0
0
0
0
0
R
R
R
R/W
R/W
R/W
R/W
R/W
Bit
7
6
5
4
3
2
1
0
Symbol
ALMWINH
RFU
Default Value
R / W access
0
0
0
0
0
0
0
0
R/W
R/W
R/W
R/W
R/W
R/W
R
R
17
8711D–SEEPR–8/10
Table 9-8. Upper Alarm Trip Register Bit Description
Bit
Symbol
RFU
Description
15:13
12
Reserved for future use. Read as ‘0’
SIGN
Sign bit
0 = Ambient temperature is greater than or equal to 0°C
1= Ambient temperature is less than 0°C
11:2
0:1
ALMWINH
RFU
Upper Alarm Trip temperature bits
Represented in two’s complement format
Reserved for future use. Read as ‘0’
9.5. Lower Alarm Trip Register (16-bit Read/Write, Address = 03h)
The Lower Alarm Trip Register holds the user programmed lower temperature boundary trip point in 11-bit two’s
complement format (0.25°C resolution) that can be used to monitor ambient temperature in an operating window
(See Table 9-9 and Table 9-10). When temperature decreases below this trip point minus any hysteresis set or
EVENT
increases to meet or exceed this trip point, then the
pin is asserted (if enabled).
This register becomes read only if the Alarm Window Lock bit (WINLOCK) bit six in the Configuration register is
set to a ‘1’.
Table 9-9. Lower Alarm Trip Register Bit Distribution
Bit
15
14
RFU
0
13
12
SIGN
0
11
10
ALMWINL
9
8
Symbol
Default Value
R / W access
0
0
0
0
0
0
R
R
R
R/W
R/W
R/W
R/W
R/W
Bit
7
6
5
4
3
2
1
0
Symbol
ALMWINL
RFU
Default Value
R / W access
0
0
0
0
0
0
0
0
R/W
R/W
R/W
R/W
R/W
R/W
R
R
Table 9-10. Lower Alarm Trip Register Bit Description
Bit
Symbol
RFU
Description
15:13
12
Reserved for future use. Read as ‘0’
Sign bit
SIGN
0 = Ambient temperature is greater than or equal to 0°C
1= Ambient temperature is less than 0°C
11:2
0:1
ALMWINL
RFU
Lower Alarm Trip temperature bits
Represented in two’s complement format
Reserved for future use. Read as ‘0’
18
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
9.6. Critical Alarm Trip Register (16-bit Read/Write, Address = 04h)
The Critical Alarm Trip Register holds the user programmed Critical Alarm temperature boundary trip point in
11-bit two’s complement format (0.25°C resolution) that can be used to monitor ambient temperature (See
Table 9-11 and Table 9-12). When the temperature increases above this trip point, the EVENT pin will be asserted
(if enabled). It will remain asserted until temperature decreases below or equal to the trip point minus any
hysteresis set. This register becomes read only if the Critical Alarm Trip Lock Bit (CRTALML) bit seven in the
configuration register is set to a ‘1’.
Table 9-11. Critical Alarm Trip Register Bit Distribution
Bit
15
14
RFU
0
13
12
SIGN
0
11
10
9
8
Symbol
CRITEVT
Default Value
R / W access
0
0
0
0
0
0
R
R
R
R/W
R/W
R/W
R/W
R/W
Bit
7
6
5
4
3
2
1
0
Symbol
CRITEVT
RFU
Default Value
R / W access
0
0
0
0
0
0
0
0
R/W
R/W
R/W
R/W
R/W
R/W
R
R
Table 9-12. Critical Alarm Trip Register Bit Description
Bit
Symbol
RFU
Description
15:13
12
Reserved for future use. Read as ‘0’
Sign bit
SIGN
0 = Ambient temperature is greater than or equal to 0°C
1= Ambient temperature is less than 0°C
11:2
0:1
CRITEVT
RFU
Critical Alarm Trip temperature bits
Represented in two’s complement format
Reserved for future use. Read as ‘0’
19
8711D–SEEPR–8/10
9.7. Temperature Register (16-bit Read only, Address = 05h)
The Temperature Register holds the internal temperature measurement data represented in 11-bit 2’s
complement word format allowing for resolution equal to 0.125°C (least significant bit). The upper three bits (15,
14, 13) of the temperature register indicates the trip status of the current temperature and most important, are not
EVENT
affected by the status of the output of the
pin (See Table 9-13 and Table 9-14).
Table 9-13. Temperature Register Bit Distribution
Bit
15
14
13
12
SIGN
0
11
128°C
0
10
64°C
0
9
32°C
0
8
16°C
0
Symbol
CRITHIGH ALMHIGH ALMLOW
Default Value
R / W access
0
0
0
R
R
R
R
R
R
R
R
Bit
7
8°C
0
6
4°C
0
5
2°C
0
4
1°C
0
3
0.5°C
0
2
1
0
RFU
0
Symbol
0.25°C
0.125°C
Default Value
R / W access
0
0
R
R
R
R
R
R
R
R
Table 9-14. Temperature Register Bit Description
Bit
Symbol
Description
15
CRITHIGH
0 = Ambient temperature is less than the Critical Alarm Trip Register setting
1 = Ambient temperature is greater than or equal to Critical Alarm Trip Register setting
When this bit is set ‘1’, it will automatically clear once the measured temperature decreases
below or is equal to the trip point minus any hysteresis set
14
13
ALMHIGH
ALMLOW
0 = Ambient temperature is below the Upper Alarm Trip register setting
1 = Ambient temperature is above the Upper Alarm Trip register setting
When the bit is set ‘1’, it will automatically clear once the measured temperature decreases
below or is equal to the trip point minus any hysteresis set
0 = Ambient temperature is above the Lower Alarm Trip register setting
1 = Ambient temperature is below the Lower Alarm Trip register setting
When the bit is set ‘1’, it will automatically clear once the measured temperature increases above
or is to equal to the trip point
12
11:1
0
SIGN
TEMP
RFU
Sign Bit
0 = Ambient temperature is greater than or equal to 0°C
1 = Ambient temperature is less than 0°C
Ambient Temperature Bits
Represented in two’s complement format
The encoding of bits B11 through B2 is the same as in the Alarm Trip registers
Reserved for future use. Read as ‘0’
20
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
9.7.1. Temperature Register Format
This section will clarify the temperature register format and temperature bit value assignments used for
temperature for the following registers: Upper Alarm Trip, Lower Alarm Trip, Critical Alarm Trip and Temperature
Data. The temperatures expressed in the Upper Alarm Trip, Lower Alarm Trip, Critical Alarm Trip and
Temperature Data Registers are indicated in two’s complement format. In each of the trip registers, bits 12
through bit two are used for temperature settings, or in the case of the temperature register, holds the internal
temperature measurement with bits 12 through bit one allowing 0.125ºC resolution.
Table 9-15indicates the temperature register’s assigned bit values used for temperature. Table 9-16 below shows
examples for temperature register bit values for various temperature readings.
Table 9-15. Temperature Register Format
Bit Position
12
11
10
9
8
7
6
5
4
3
2
1
0
Bit Value
SIGN 128°C 64°C
32°C
16°C
8°C
4°C
2°C
1°C
0.5°C 0.25°C 0.125°C
X
Table 9-16. Temperature Register Examples
Temperature Register Value Examples
Temperature
+125°C
+99.75°C
+85°C
Binary (Bit15 – Bit0)
xxx0 0111 1101 00xx
xxx0 0110 0011 11xx
xxx0 0101 0101 00xx
xxx0 0010 0111 00xx
xxx0 0000 1111 11xx
xxx0 0000 0000 01xx
xxx0 0000 0000 00xx
xxx1 1111 1111 11xx
xxx1 1111 1110 00xx
xxx1 1110 1100 00xx
+39°C
+15.75°C
+0.25°C
0°C
-0.25°C
-1°C
-20°C
21
8711D–SEEPR–8/10
9.8. Manufacturer ID Register (16-bit Read only, Address = 06h)
This register is used to identity the manufacturer of the product. The manufacturer ID for the Atmel®
AT30TSE002B is 001Fh (See Table 9-17).
Table 9-17. Manufacturer ID Register Bit Distribution
Bit
15
14
13
12
11
10
9
8
Symbol
Manufacturer ID
Default Value
R / W access
0
0
0
0
0
0
0
0
R
R
R
R
R
R
R
R
Bit
7
6
5
4
3
2
1
0
Symbol
Manufacturer ID
Default Value
R / W access
0
0
0
1
1
1
1
1
R
R
R
R
R
R
R
R
9.9. Device ID Register (16-bit Read only, Address = 07h)
The upper or high order byte is used to specify the device identification and the other byte is used to specify
device revision. The device ID for the AT30TSE002B is 8201h (See Table 9-18).
Table 9-18. Device ID Register Bit Distribution
Bit
15
14
13
12
11
10
9
8
Symbol
Device ID
Default Value
R / W access
1
0
0
0
0
0
1
0
R
R
R
R
R
R
R
R
Bit
7
6
5
4
3
2
1
0
Symbol
Device Revision
Default Value
R / W access
0
0
0
0
0
0
0
1
R
R
R
R
R
R
R
R
22
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
9.10. SMBus Register (16-bit Write / Read only, Address = 22h)
The SMBus Register allows the user to enable or disable the SMBus time out feature (See Table 9-19 and Table
9-20).
Table 9-19. SMBus Register Bit Distribution
Bit
15
14
13
12
11
10
9
8
Symbol
RFU
Default Value
R / W access
0
0
0
0
0
0
0
0
R
R
R
R
R
R
R
R
Bit
7
SMBOUT
0
6
5
4
3
RFU
0
2
1
0
Symbol
Default Value
R / W access
0
0
0
0
0
0
R/W
R
R
R
R
R
R
R
Table 9-20. SMBus Register Bit Distribution
Bit
15:8
7
Symbol
RFU
Description
Reserved for future use. Read as ‘0’
SMBOUT
SMBus Timeout
0 = SMBus timeout is enabled
1 = SMBus timeout is disabled
When enabled, timeout is active for temperature sensor operations
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered
until unlocked
6:0
RFU
Reserved for future use. Read as ‘0’
23
8711D–SEEPR–8/10
10. TS Write Operations
Writing to the Atmel® AT30TSE002B Temperature register set is accomplished through a modified write operation
for two data bytes. To maintain two-wire compatibility, the 16-bit register is accessed through a pointer register,
requiring the write sequence to include an address pointer in addition to the device address. This indicates the
storage location for the next two bytes received. Figure 10-2 shows an entire write transaction on the bus.
Figure 10-1.
TS Register Write Operation
W
R
S
T
A
R
T
S
T
O
P
DEVICE
ADDRESS
REGISTER
I
DATA
MSB
DATA
LSB
POINTER
T
E
0
0
1
1 A2 A1 A0
R A
/ C
A
C
K
A
C
K
A
C
K
W
K
10.1. TS Read Operations
Reading data from the TS may be accomplished in one of two ways:
a) If the location latched in the pointer register is correct (for normal operation it is expected the same address
will be read repeatedly for temperature), the read sequence may consist of a device address from the bus
master followed by two bytes of data from the device; or
b) The pointer register is loaded with the correct register address, and the data is read. The sequence to preset
the pointer register is shown in Figure 10-2 and the preset pointer read is shown in Figure 10-3. If it is desired
to read random address each cycle, the complete Pointer Write, Word Read sequence is shown in
Figure 10-4.
The data byte has the most significant bit first. At the end of a read, this device can accept either Acknowledge
(Ack) or No Acknowledge (No Ack) from the Master (No Acknowledge is typically used as a signal for the slave
that the Master has read its last byte).
Figure 10-2.
Write to Pointer Register
W
S
T
A
R
T
R
S
T
O
P
DEVICE
ADDRESS
REGISTER
I
POINTER
T
E
0
0
1
1
A2 A1 A0
A
C
K
A
C
K
R
/
W
Figure 10-3.
Preset Pointer Register Word Read
R
S
T
A
R
T
S
T
O
P
A
C
K
DEVICE
DATA
MSB
DATA
LSB
E
A
D
ADDRESS
0
0
1
1
A2 A1 A0
R
/
A
C
N
O
A
C
K
W K
24
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
Figure 10-4.
Two-Wire Pointer Write Register Word Read
S
T
A
R
T
W
R
I
T
E
S
T
A
R
T
R
E
A
D
S
T
O
P
DEVICE
ADDRESS
REGISTER
POINTER
DEVICE
ADDRESS
DATA
MSB
DATA
LSB
A
C
K
0
0
1
1 A2 A1A0
0 0 1 1 A2 A1 A0
R A
/ C
W K
A
C
K
R A
/ C
W K
N
O
A
C
K
Figure 10-5.
SDA LINE
Setting Permanent Write Protect Register (PSWP)
S
CONTROL
BYTE
WORD
T
A
R
T
S
T
O
P
ADDRESS
DATA
0 1 1 0 A2 A1 A0 0
A
C
K
A
C
K
A
C
K
= Don't Care
Figure 10-6.
Setting Reversible Write Protect Register (RSWP)
S
CONTROL
BYTE
WORD
T
A
R
T
S
T
ADDRESS
DATA
O
P
SDA LINE
0 1 1 0 0 0 1 0
A
C
K
A
C
K
A
C
K
= Don't Care
Figure 10-7.
Clearing Reversible Write Protect Register (RSWP)
S
CONTROL
BYTE
WORD
ADDRESS
T
A
R
T
S
T
DATA
O
P
SDA LINE
0 1 1 0 0 1 1 0
A
C
K
A
C
K
A
C
K
= Don't Care
25
8711D–SEEPR–8/10
Table 10-1. EEPROM Write Protection
Pin
A1
A1
0
Preamble
RW
B0
0
Command
A2
A0
A0
B7
0
B6
1
B5
1
B4
0
B3
A2
0
B2
A1
0
B1
A0
1
Set PSWP
Set RSWP
Clear RSWP
A2
0
VHV
VHV
0
1
1
0
0
0
1
0
1
1
0
0
1
1
0
Table 10-2. VHV
VHV
Min
Max
Units
7
10
V
Table 10-3. EEPROM Software Write Protection
Permanent
Write Protect
Register PSWP Register RSWP
Reversible
Write Protect Acknowledgement
R/W
Bit
Command
1010
from Device
Action from Device
R
X
Programmed
X
X
X
ACK
1010
W
W
W
ACK
Can write to second Half (80H - FFH) only
Can write to second Half (80H - FFH) only
Can write to full array
1010
Programmed
Not Programmed
ACK
Not
Programmed
ACK
1010
R
R
Programmed
X
X
X
X
No ACK
ACK
STOP - Indicates permanent write protect
register is programmed
Read PSWP
Read PSWP
Set PSWP
Set PSWP
Not
Programmed
Read out data don't care. Indicates PSWP
register is not programmed
W
W
Programmed
No ACK
ACK
STOP - Indicates permanent write protect
register is programmed
Not
Programmed
Program permanent write protect register
(irreversible)
R
R
X
X
X
X
Programmed
Not Programmed
Programmed
No ACK
ACK
STOP - Indicates reversible write protect
register is programmed
Read RSWP
Read RSWP
Set RSWP
Read out data don't care. Indicates RSWP
register is not programmed
W
W
No ACK
ACK
STOP - Indicates reversible write protect
register is programmed
Not Programmed
Program reversible write protect register
(reversible)
Set RSWP
W
W
Programmed
X
X
No ACK
ACK
STOP - Indicates permanent write protect
register is programmed
Clear RSWP
Clear RSWP
Not
Programmed
Clear (unprogram) reversible write protect
register (reversible)
26
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
11. EEPROM Read Operations
Read operations are initiated the same way as write operations with the exception that the read/write select bit in
the device address word is set to one. There are three read operations: current address read, random address
read and sequential read.
CURRENT ADDRESS READ: The internal data word address counter maintains the last address accessed
during the last read or write operation, incremented by one. This address stays valid between operations as long
as the chip power is maintained. The address “roll over” during read is from the last byte of the last memory page
to the first byte of the first page.
Once the device address with the read/write select bit set to one is clocked in and acknowledged by the
EEPROM, the current address data word is serially clocked out. To end the command, the microcontroller does
not respond with an input zero but does generate a following stop condition (see Figure 11-4).
RANDOM READ: A random read requires a “dummy” byte write sequence to load in the data word address.
Once the device address word and data word address are clocked in and acknowledged by the EEPROM, the
microcontroller must generate another start condition. The microcontroller now initiates a current address read by
sending a device address with the read/write select bit high. The EEPROM acknowledges the device address and
serially clocks out the data word. To end the command, the microcontroller does not respond with a zero but does
generate a following stop condition (see Figure 11-5).
SEQUENTIAL READ: Sequential reads are initiated by either a current address read or a random address read.
After the microcontroller receives a data word, it responds with an ACK. As long as the EEPROM receives an
ACK, it will continue to increment the data word address and serially clock out sequential data words. When the
memory address limit is reached, the data word address will “roll over” and the sequential read will continue. The
sequential read operation is terminated when the microcontroller does not respond with a zero but does generate
a following stop condition (see Figure 11-6).
PERMANENT WRITE PROTECT REGISTER (PSWP) STATUS: To find out if the register has been
programmed, the same procedure is used as to program the register except that the R/W bit is set to one. If the
device sends an acknowledge, then the permanent write protect register has not been programmed. Otherwise, it
has been programmed and the device is permanently write protected at the first half of the array.
Table 11-1. PSWP Status
Pin
A1
A1
Preamble
RW
B0
1
Command
Read PSWP
A2
A0
B7
B6
B5
B4
B3
B2
B1
A2
A0
0
1
1
0
A2
A1
A0
REVERSIBLE WRITE PROTECT REGISTER (RSWP) STATUS: To find out if the register has been
programmed, the same procedure is used as to program the register except that the R/W bit is set to one. If the
device sends an acknowledge, then the reversible write protect register has not been programmed. Otherwise, it
has been programmed and the device is write protected (reversible) at the first half of the array.
Figure 11-1.
EEPROM Device Address
1
0
1
0
A2 A1 A0 R/W
LSB
MSB
27
8711D–SEEPR–8/10
Figure 11-2.
EEPROM Byte Write
Figure 11-3.
EEPROM Page Write
Figure 11-4.
EEPROM Current Address Read
28
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
Figure 11-5.
EEPROM Random Read
Figure 11-6.
EEPROM Sequential Read
29
8711D–SEEPR–8/10
12. Ordering Information
12.1. Ordering Code Detail
A T 3 0 T S E 0 0 2 B - M A H - T
Atmel Designator
Product Family
Shipping Carrier Option
B = Bulk (tubes)
T = Tape and reel
Device Grade
H = Green, NiPdAu lead finish
Memory Type
Temperature range -20°C to +125°C
E = EEPROM
Package Option
MA = 8-pad, 2 x 3 x 0.8mm (WDFN)
Sensor Type
Device Density
2 = 2-kilobit
Device Revision
12.2. Green Package Options (Pb/Halide-free/RoHS Compliant)
Ordering Code
Package Lead Finish Operating Voltage
8M2 NiPdAu 2.7V to 3.6V
Max. Freq. (KHz)
Operational range
–20°C to 125°C
AT30TSE002B-MAH-T
400
Note:
1. The shipping carrier option code is not marked on the devices
Package Type
8M2 8-pad, 2 x 3 x 0.8mm, Thermally Enhanced Plastic Very Very Thin Dual Flat No Lead Package (WDFN)
30
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
WDFN Marking
TOP MARK
|---|---|---|
T
2
B
|---|---|---|
H
@
|---|---|---|
Y
X
X
|---|---|---|
*
|
Pin 1 Indicator (Dot)
Y = YEAR OF ASSEMBLY
XX = ATMEL LOT NUMBER TO COORESPOND WITH
TRACE CODE LOG BOOK.
(e.g. XX = AA, AB, AC,...AX, AY, AZ)
Y = SEAL YEAR
8: 2008
9: 2009
0: 2010
1: 2011
2: 2012
3: 2013
4: 2014
5: 2015
31
8711D–SEEPR–8/10
13. Package Drawings
8M2 – WDFN
COMMON DIMENSIONS
(Unit of Measure – mm)
SYMBOL
MIN
NOM
2.00 BSC
3.00 BSC
1.40
MAX
NOTE
D
E
1.35
1.25
0.70
0.0
1.45
1.35
0.80
0.05
D2
E2
A
1.30
0.75
0.02
A1
A3
L
0.20 REF
0.40
0.35
0.18
0.45
0.30
0.50 BSC
0.25
e
2
b
Notes
1. This drawing is for general information only. Refer to JEDEC Drawing MO-229, WCED-3, for proper dimensions,
tolerances, datums, etc
2. Dimensions b applies to metallized terminal and is measured between 0.15mm and 0.30mm from the terminal tip. If
the terminal has the optional radius on the other end of the terminal, the dimensions should not be measured in that
radius area
3. Soldering the large thermal pad is optional, but not recommended. No electrical connection is accomplished to the
device through this pad, so if soldered it should be tied to ground
6/12/09
DRAWING NO. REV.
8M2
TITLE
GPC
8M2, 8-lead 2.0x3.0mm Body, 0.50mm Pitch,
WDFN, Very Very Thin, Dual No Lead Package
(Sawn)
Package Drawing Contact
packagedrawings@atmel.com
YDL
A
32
Atmel AT30TSE002B [Preliminary]
8711D−SEEPR−8/10
Temperature Sensor with Serial EEPROM
14. Revision History
Doc. Rev.
Date
Comments
8711D
08/2010
R to R / W for 22h in Register Summary table
Correct cross references in EEPROM Write Operations
8711C
8711B
8711A
07/2010
05/2010
04/2010
Section 12.2, change part number to -MAH-T from -MA-T
Add statement in Section 2 before Serial Clock definition
Initial document release
33
8711D–SEEPR–8/10
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8711D–SEEPR–8/10
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