AT30TSE004A-MA5M-T_技术文档

AT30TSE004A

Integrated Temperature Sensor with Serial EEPROM

DATASHEET

Features

 Integrated Temperature Sensor (TS) + 4-Kbit Serial EEPROM

 JEDEC JC42.4 (TSE2004av) DIMM Serial Presence Detect (SPD) + TS

compliant

 Low voltage operation

̶

Optimized for V_CCrange of 1.7V to 3.6V

 2-wire serial interface: I²C Fast Mode Plus (FM+) compatible

̶

100kHz, 400kHz, and 1MHz compatibility

Bus Timeout supported

 Schmitt Trigger, filtered inputs for noise suppression

 Industry standard green (Pb/Halide-free/RoHS compliant) package options

̶

8-pad Ultra Thin DFN (2 x 3 x 0.6mm)

8-pad Very Very Thin DFN (2 x 3 x 0.8mm)

Temperature Sensor Features

 Highly accurate B-grade temp. measurements requiring no external

components

̶

±1.0°C accuracy (maximum) over the +75°C to +95°C range

±2.0°C accuracy (maximum) over the +40°C to +125°C range

±3.0°C accuracy (maximum) over the -20°C to +125°C range

 11-bit ADC temperature-to-digital converter with 0.125°C resolution

 Programmable hysteresis threshold: off, 0°C, 1.5°C, 3°C, and 6°C

 Low operating current

̶

Temperature sensor active ~0.2mA (typical)

Serial EEPROM Features

 Integrates 4-Kbits of Serial EEPROM

̶

Internally organized into four quadrants of 128-bytes each

 Individual Reversible Software Write Protection on all four 128-byte quadrants

 Supports byte and Page Write operations

 Self-timed write cycle (5ms maximum)

 High-reliability

̶

Endurance: 1,000,000 write cycles

Data retention: 100 years

 Low operating current

̶

Serial EEPROM Write ~1.5mA (typical)

Serial EEPROM Read ~0.2mA (typical)

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

Table of Contents

1. Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

2. Pin Descriptions and Pinouts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

3. Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

4. Device Communication . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

4.1

4.2

4.3

4.4

4.5

4.6

Start Condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

Stop Condition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

Acknowledge (ACK) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

No-Acknowledge (NACK) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Standby Mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Device Reset and Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

4.6.1

Power-Up Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

4.7

4.8

Timeout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

2-wire Software Reset. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

5. Device Addressing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

6. Temperature Sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

6.1

Functional Description. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

6.1.1

6.1.2

EVENT Output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

Alarm Window . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

6.2

Register Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

6.2.1

6.2.2

6.2.3

6.2.4

6.2.5

6.2.6

6.2.7

Pointer Register (8-bit Write Only, Address = N/A) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Capability Register (16-bit Read-only, Address = 00h) . . . . . . . . . . . . . . . . . . . . . . . . . . . 14

Configuration Register (16-bit Read/Write, Address = 01h) . . . . . . . . . . . . . . . . . . . . . . . 15

Upper Limit Register (16-bit Read/Write, Address = 02h) . . . . . . . . . . . . . . . . . . . . . . . . . 18

Lower Limit Register (16-bit Read/Write, Address = 03h) . . . . . . . . . . . . . . . . . . . . . . . . . 19

Critical Alarm Register (16-bit Read/Write, Address = 04h) . . . . . . . . . . . . . . . . . . . . . . . 20

Temperature Register (16-bit Read-only, Address = 05h) . . . . . . . . . . . . . . . . . . . . . . . . 21

6.2.7.1

Temperature Register Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22

6.2.8

6.2.9

Manufacturer ID Register (16-bit Read-only, Address = 06h) . . . . . . . . . . . . . . . . . . . . . . 23

Device ID Register (16-bit Read-only, Address = 07h) . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

6.3

6.4

Temperature Sensor Write Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24

Temperature Sensor Read Operations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25

7. Serial EEPROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

7.1

Memory Organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

7.1.1 Set Page Address and Read Page Address Commands . . . . . . . . . . . . . . . . . . . . . . . . . 26

Serial EEPROM Write Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

7.2

7.2.1

7.2.2

7.2.3

7.2.4

Byte Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29

Page Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Acknowledge (ACK) Polling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

Write Cycle Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

7.3

Write Protection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

7.3.1

7.3.2

7.3.3

Set RSWP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

Clear RSWP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

Read RSWP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33

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AT30TSE004A [DATASHEET]

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7.4

Serial EEPROM Read Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

7.4.1

7.4.2

7.4.3

Current Address Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

Random Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

Sequential Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36

8. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

8.1

8.2

8.3

8.4

8.5

Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38

Temperature Sensor Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39

Pin Capacitance⁽¹⁾. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39

9. Ordering Code Detail . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

10. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

11. Part Markings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41

12. Package Drawings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

12.1 8MA2 — 8-pad UDFN. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42

12.2 8MAA — 8-pad WDFN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43

13. Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

3

1.

Description

The Atmel^®AT30TSE004A is a combination Serial EEPROM and temperature sensor device containing 4096-

bits of Serially Electrically Erasable and Programmable Read-Only Memory (EEPROM) organized as 512-bytes

of eight bits each. The Serial EEPROM operation is tailored specifically for DRAM memory modules with Serial

Presence Detect (SPD) to store a module’s vital product data such as the module’s size, speed, voltage, data

width, and timing parameters.

The AT30TSE004A is protocol compatible with the legacy JEDEC TSE2002av specification (2-Kbit) devices

enabling the AT30TSE004A to be utilized in legacy applications without any software changes. The Serial

EEPROM deploys special software commands to allow users to identify and set which half of the memory the

internal address counter is located. This special page addressing method used to select the upper or lower half

of the Serial EEPROM is the key to the legacy compatibility; however, there is one minor exception to the legacy

compatibility as the AT30TSE004A does not support the Permanent Write Protection feature because it was

removed from the JEDEC TSE2004a (DDR4) specification.

In addition, the Serial EEPROM incorporates a Reversible Software Write Protection (RSWP) feature enabling

the ability to selectively write protect any or all of the four 128-byte quadrants. Once the RSWP is set, it can only

be reversed by sending a special software command sequence.

The integrated temperature sensor converts temperatures from -20C to +125C to a digital word and provides

an accuracy of ±1°C (max.) in the temperature range +75C to +95C. The temperature sensor continuously

monitors temperature and updates the data in the Temperature Register at least eight times per second. The

temperature data is latched internally by the device and may be read by software via a bus Master at anytime

(even when the Serial EEPROM is busy writing data to the memory).

The AT30TSE004A incorporates flexible user programmable internal registers to configure the temperature

sensor’s performance and response to over and under temperature conditions. The device contains flexible

programmable high, low, and critical temperature limits. The EVENT pin is an active low output and can be

configured to operate as an Interrupt or as a Comparator output. The Manufacturer and Device ID Registers

provide the ability to confirm the identity of the device. The AT30TSE004A supports the industry standard 2-wire

I²C FM plus (Fast Mode +) serial interface allowing device communication to operate up to 1MHz. A bus timeout

feature is supported for both temperature sensor and Serial EEPROM operations to help prevent system lock-

ups. The AT30TSE004A is available in space saving 8-lead UDFN and WDFN packages.

The UDFN is the recommended and preferred package.

4

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

2.

Pin Descriptions and Pinouts

Table 2-1.

Pin Descriptions

Asserted

State

Symbol

Name and Function

Type

Serial Clock: The SCL pin is used to provide a clock to the device and is used

to control the flow of data to and from the device. Command and input data

present on the SDA pin is always latched in on the rising edge of SCL, while

output data on the SDA pin is always clocked out on the falling edge of SCL.

SCL

—

Input

The SCL pin must either be forced high when the serial bus is idle or pulled-high

using an external pull-up resistor.

Serial Data: The SDA pin is an open-drain bidirectional input/output pin used to

serially transfer data to and from the device.

Input/

Output

SDA

—

The SDA pin must be pulled-high using an external pull-up resistor (not to

exceed 8K in value) and may be wire-ORed with any number of other

open-drain or open-collector pins from other devices on the same bus.

EVENT: The EVENT pin is an open-drain output pin used to indicate when the

temperature goes beyond the user-programmed temperature limits. The EVENT

pin can be operated in one of three different modes; either Interrupt,

Comparator, or Critical Alarm Modes. The ALERT pin must be pulled-high using

an external pull-up resistor for proper operation.

EVENT

Output

Input

Device Address Inputs: The A₀, A₁, and A₂pins are used to select the device

address and corresponds to the three Least-Significant Bits (LSB) of the I²C

FM+ seven bit slave address. These pins can be directly connected to V_CCor

GND in any combination, allowing up to eight devices on the same bus.

A₂, A₁, A₀

—

The A₀pin is also an overvoltage tolerant pin, allowing up to 10V to support the

Reversible Software Write Protection (RSWP) feature (see Section 7.3 “Write

Protection” on page 32).

Device Power Supply: The V_CCpin is used to supply the source voltage to the

device. Operations at invalid V_CCvoltages may produce spurious results and

should not be attempted.

V_CC

—

Power

Ground: The ground reference for the power supply. GND should be connected

to the system ground.

GND

Figure 2-1.

Pinout

UDFN / WDFN

A

1

2

3

4

8

7

6

5

V

0

1

2

CC

EVENT

SCL

SDA

GND

Top View

Note:

UDFN is the recommended and preferred package. The metal pad on the bottom of the UDFN/WDFN

package is not internally connected to a voltage potential. This pad can be a “no connect” or connected to GND.

AT30TSE004A [DATASHEET]

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5

3.

Block Diagram

Serial EEPROM

Temperature Sensor

Selected Resolution

Temp. Range

Accuracy

H.V Pump/Timing

Capability

Configuration

Critical Alarm Trip

Device ID

Output Feature

EVENT Shutdown

Timeout

EEPROM Quadrant 0

SPA = 0, (00h-7Fh)

EEPROM Quadrant 1

SPA = 0, (80h-FFh)

X Address

Decoder

EEPROM Quadrant 2

SPA = 1, (00h-7Fh)

Manufacturer ID

Temperature

EEPROM Quadrant 3

SPA= 1, (80h-FFh)

A/D

Converter

Upper Alarm Trip

Y Address Decoder

Memory

Control Logic

Lower Alarm Trip

Timeout

Band Gap

Temperature

Sensor

Write Protect Circuitry

Pointer

Register

Serial

Control Logic

I²C

Interface

GND

A

SCL SDA

V_CC

EVENT

2

0

1

6

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

4.

Device Communication

The AT30TSE004A operates as a slave device and utilizes a simple 2-wire digital serial interface, compatible

with the I²C Fast Mode Plus (I²C FM+) protocol, to communicate with a host controller, commonly referred to as

the bus Master. The Master initiates and controls all Read and Write operations to the slave devices on the

serial bus, and both the Master and the slave devices can transmit and receive data on the bus.

The serial interface is comprised of just two signal lines: the Serial Clock (SCL) and the Serial Data (SDA). The

SCL pin is used to receive the clock signal from the Master, while the bidirectional SDA pin is used to receive

command and data information from the Master, as well as, to send data back to the Master. Data is always

latched into the AT30TSE004A on the rising edge of SCL and is always output from the device on the falling

edge of SCL. Both the SCL and SDA pin incorporate integrated spike suppression filters and Schmitt Triggers to

minimize the effects of input spikes and bus noise.

All command and data information is transferred with the Most-Significant Bit (MSB) first. During the bus

communication, one data bit is transmitted every clock cycle, and after eight bits (one byte) of data has been

transferred, the receiving device must respond with either an acknowledge (ACK) or a no-acknowledge (NACK)

response bit during a ninth clock cycle (ACK/NACK clock cycle) generated by the Master; therefore, nine clock

cycles are required for every one byte of data transferred. There are no unused clock cycles during any Read or

Write operation so there must not be any interruptions or breaks in the data stream during each data byte

transfer and ACK or NACK clock cycle.

During data transfers, data on the SDA pin must only change while SCL is low, and the data must remain stable

while SCL is high. If data on the SDA pin changes while SCL is high, then either a Start or a Stop condition will

occur. Start and Stop conditions are used to initiate and end all serial bus communication between the Master

and the slave devices.The number of data bytes transferred between a Start and a Stop condition is not limited

and is determined by the Master.

In order for the serial bus to be idle, both the SCL and SDA pins must be in the Logic 1 state at the same time.

4.1

4.2

4.3

Start Condition

A Start condition occurs when there is a high-to-low transition on the SDA pin while the SCL pin is stable in the

Logic 1 state. The Master uses a Start condition to initiate any data transfer sequence, and the Start condition

must precede any command. AT30TSE004A will continuously monitor the SDA and SCL pins for a Start

condition, and the device will not respond unless one is given. Please refer to Figure 4-1 on page 8 for more

details.

Stop Condition

A Stop condition occurs when there is a low-to-high transition on the SDA pin while the SCL pin is stable in the

Logic 1 state. The Master uses the Stop condition to end a data transfer sequence to the AT30TSE004A which

will subsequently return to the idle state. The Master can also utilize a repeated Start condition instead of a Stop

condition to end the current data transfer if the Master will perform another operation. Please refer to Figure 4-1

on page 8 for more details.

Acknowledge (ACK)

After every byte of data is received, AT30TSE004A must acknowledge to the Master that it has successfully

received the data byte by responding with an ACK. This is accomplished by the Master first releasing the SDA

line and providing the ACK/NACK clock cycle (a ninth clock cycle for every byte). During the ACK/NACK clock

cycle, the AT30TSE004A must output a Logic 0 (ACK) for the entire clock cycle such that the SDA line must be

stable in the Logic 0 state during the entire high period of the clock cycle. Please refer to Figure 4-1 on page 8

for more details.

AT30TSE004A [DATASHEET]

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4.4

No-Acknowledge (NACK)

When the AT30TSE004A is transmitting data to the Master, the Master can indicate that it is done receiving data

and wants to end the operation by sending a NACK response to the AT30TSE004A instead of an ACK

response. This is accomplished by the Master outputting a Logic 1 during the ACK/NACK clock cycle, at which

point the AT30TSE004A will release the SDA line so that the Master can then generate a Stop condition.

In addition, the AT30TSE004A can use a NACK to respond to the Master instead of an ACK for certain invalid

operation cases such as an attempt to Write to a read-only register (e.g. an attempt to Write to the Temperature

Register).

Figure 4-1.

Start, Stop, and ACK

SDA

Must Be

Stable

SDA

Must Be

Stable

Acknowledge Window

9

1

2

8

SCL

SDA

Stop

Condition

Acknowledge

Valid

Start

Condition

The transmitting device (Master or Slave) must

release the SDA line at this point to allow the

the receiving device (Master or Slave) to drive

the SDA line low to ACK the previous 8-bit word.

The receiver (Master or Slave)

must release the SDA line at

this point to allow the transmitter

to continue sending new data.

SDA

Change

Allowed

SDA

Change

Allowed

4.5

4.6

Standby Mode

The AT30TSE004A incorporates a low-power Standby Mode which is enabled:



Upon power-up or

After the receipt of the Stop condition and the completion of any internal operations.

Device Reset and Initialization

The AT30TSE004A incorporates an internal Power-On Reset (POR) circuit to help prevent inadvertent

operations during power-up and power-down cycles. On a cold power-up, the supply voltage must rise

monotonically between V

and V

without any ring back to ensure a proper power-up (see Figure

POR(max)

CC(min)

4-2 on page 9). Once the supply voltage has passed the V

threshold, the device’s internal reset process

POR(min)

is initiated. Completion of the internal reset process occurs within the t_INITtime listed in Table 4.6.1 on page 9.

Upon completion of the internal reset process, the device will have the following power-on default conditions:



Temperature sensor starts monitoring temperature continuously.

Pointer Register = 00h

Upper Limit, Lower Limit, and Critical Alarm Registers are set to 0C.

EVENT pin is pulled high by the external pull up resistor.

Operational mode is Comparator.

Hysteresis level is set to 0C.

EVENT pin polarity is set low.

EVENT output is disabled and not asserted.

Serial EEPROM’s SPA = 0.

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Table 6-1 on page 13 shows the power-on register default values. The Upper Limit, Lower Limit, Critical Alarm,

and Configuration Registers should be programmed to their user desired values before the temperature sensor

can properly function. Before selecting the device and issuing protocol, a valid and stable supply voltage must

be applied and no protocol should be issued to the device for the time specified by the t_INITparameter. The

supply voltage must remain stable and valid until the end of the protocol transmission, and for a Serial EEPROM

Write instruction, until the end of the internal write cycle.

Figure 4-2.

Power-Up Timing

Cold

Power-On Reset

Warm

Power-On Reset

V_CC

Device Access

Permitted

t_INIT

V_{CC (min)}

t_POR

V_{POR (max)}

V_{POR (min)}

Do Not Attempt

Device Access

During This Time

t_POFF

Time

4.6.1 Power-Up Conditions

Symbol

t_POR

Parameter

Min

Max

Units

ms

V

Power-on Reset Time

10.0

Power-on Reset Threshold

1.6

v_PON

v_POFF

t_POFF

t_INIT

Power-off Threshold for Warm Power-on Cycle

Warm Power Cycle Off Time

0.9

V

1.0

ms

Time from Power-On to First Command

10.0

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9

4.7

Timeout

The AT30TSE004A supports the industry standard bus Timeout feature on both temperature sensor and Serial

EEPROM operations to help prevent potential system bus hang-ups. The device resets its serial interface and

will stop driving the bus (will let SDA float high) if the SCL pin is held low for more than the minimum Timeout

(t_OUT) specification. The AT30TSE004A will be ready to accept a new Start condition before the maximum t_OUT

has elapsed (see Figure 4-3). This feature does require a minimum SCL clock speed of 10kHz to avoid any

timeout issues.

Figure 4-3.

Timeout

t_TIMEOUT

(MAX)

t_TIMEOUT

(MIN)

SCL

Device will release Bus and

be ready to accept a new

Start Condition within this Time

4.8

2-wire Software Reset

After an interruption in protocol, power loss, or system reset, any 2-wire part can be reset by following these

steps:

1. Create a Start condition.

2. Clock nine cycles.

3. Create another Start condition followed by Stop condition as shown in Figure 4-4.

Figure 4-4.

2-wire Software Reset

Dummy Clock Cycles

3

1

2

8

9

SCL

Start

Condition

Start

Condition

Stop

Condition

SDA

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5.

Device Addressing

The AT30TSE004A is designed to allow the Serial EEPROM and the temperature sensor to operate in parallel

while executing valid command protocol. For example, when the temperature sensor is busy during a

temperature conversion cycle, it is possible to perform any Serial EEPROM operation during this time and vice

versa.

The device requires a 7-bit device address and a Read/Write select bit following a Start condition from the

Master to initiate communication with either the temperature sensor or the Serial EEPROM. The device address

byte is comprised of a 4-bit device type identifier followed by three device address bits (A2, A1,and A0) and a

R/W bit and is clocked by the Master on the SDA pin with the Most Significant Bit first (see Table 5-1).

The AT30TSE004A will respond to three unique device type identifiers. The device type identifier of

‘1010’(Ah) is necessary to select the device for reading or writing. The device type identifier of ‘0110’(6h)

has multiple purposes. First, it is used to access the page address function which determines what the internal

address counter is set to. For more information on accessing the page address function, please refer to Section

7.1.1 “Set Page Address and Read Page Address Commands” on page 26 The device type identifier of

‘0110’(6h) is also used to access the Software Write Protection feature of the device. Information on the

Software Write Protection functionality can be found in Section 7.3 “Write Protection” on page 32.

Table 5-1.

AT30TSE004A Device Address Byte

Bit 7

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0

Function

Device Type Identifier

Device Address

Read/Write

Serial EEPROM

Read/Write

1

0

1

0

1

0

1

A2

A1

A0

R/

W

Serial EEPROM Write

Protection and Page

Address Functions

Temperature Sensor

The software device address bits (A2, A1, and A0) must match their corresponding hard-wired device address

inputs (A₂, A₁and A₀) allowing up to eight devices on the bus at the same time (see Table 5-2). The eighth bit of

the address byte is the R/W operation selection bit. A Read operation is selected if this bit is a Logic 1, and a

Serial EEPROM Write operation is selected if this bit is a Logic 0. Upon a compare of the device address byte,

the AT30TSE004A will output an ACK during the ninth clock cycle; if a compare is not true, the device will output

a NACK during the ninth clock cycle and return the device to the low-power Standby Mode.

Table 5-2.

Device Address Combinations

Software Device Address Bits

Hard-wired Device Address Inputs

A2, A1, A0

0 0 0

A₂

A₁

A₀

GND

V_CC

GND

V_CC

GND

V_CC

0 0 1

0 1 0

GND

V_CC

0 1 1

V_CC

1 0 0

GND

V_CC

GND

V_CC

1 0 1

V_CC

1 1 0

V_CC

GND

V_CC

1 1 1

V_CC

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11

6.

Temperature Sensor

6.1

Functional Description

The temperature sensor consists of a Delta-Sigma Analog to Digital Converter (ADC) with a band gap type

temperature sensor that monitors and updates its temperature measurement at least eight times per second

converting the temperature readings into digital data bits and latching them into the Temperature Register that

can be read via the 2-wire I²C FM+ serial interface.

The device communicates over a 2-wire I²C FM+ interface with a Master consisting of a Serial Clock (SCL) and

a Serial Bidirectional Data Bus (SDA) with clock frequencies up to 1MHz. The Master generates the SCL signal

and is used by the AT30TSE004A to receive and send serial data on the SDA line with the Most Significant Bit

transferred first. A pull-up resistor is required on the SDA pin since it has an open drain configuration.

6.1.1 EVENT Output

The EVENT pin has three operating modes depending on the configuration settings:



Interrupt Mode

Comparator Mode

Critical Alarm (Crit_Alarm) Mode

While in Interrupt Mode, once a temperature reaches a boundary limit, the AT30TSE004A asserts the EVENT

pin. The EVENT pin will remain asserted until the system clears the interrupt by writing a Logic 1 to the EVTCLR

bit five in the Configuration Register. When the temperature drops below specified limits, the device returns

back to either Interrupt or Comparator Mode as programmed in the Configuration Register’s EVTMOD bit zero.

In Comparator Mode, the EVENT pin remains asserted until the error condition that caused the pin to be

asserted no longer exists and the EVENT pin will clear itself. In the Crit_Alarm Mode, when the measured

temperature exceeds Crit_Alarm limit, the EVENT pin will remain asserted until the temperature drops below the

Crit_Alarm limit minus hysteresis (see Figure 6-1 on page 17). All event thresholds use hysteresis as

programmed in the Configuration Register.

6.1.2 Alarm Window

The Alarm Window consists of the Upper Limit Register and Lower Limit Register. The Upper Limit Register

holds the upper temperature trip point and the Lower Limit Register holds the lower temperature trip point. After

the EVENT pin control is enabled, the EVENT output will be triggered upon entering and exiting from this

window.

6.2

Register Descriptions

This section describes all the temperature sensor registers that are used in the AT30TSE004A. The

AT30TSE004A contains several registers that are user accessible and/or programmable and utilized for latching

the temperature readings, storing high, low, and critical temperature limits, configuring the temperature sensor

performance, and reporting temperature sensor status.

These registers include a Capability Register, Configuration Register, Upper Limit Register, Lower Limit

Register, Critical Alarm Register, Temperature Register, Manufacturer Identification Register, and a Device

Identification/Device Revision Register.

The AT30TSE004A utilizes an 8-bit Pointer Register to access the 16-bit registers. Table 6-1 indicates the

Write/Read access capability for each register.

Note:

Reading from a Write-only register will result in reading Logic 0 data, and writing to a Read-only register will have

no impact even though the Write sequence will be acknowledged by the device.

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Table 6-1.

Registers

Register

Address

n/a

Read/Write

Section

6.2.1

6.2.2

6.2.3

6.2.4

6.2.5

6.2.6

6.2.7

6.2.8

6.2.9

N/A

Power-On Default

00h

Pointer Register

W

R

Capability Register

00h

00F7h

0000h

N/A

Configuration Register

Upper Limit Register

Lower Limit Register

Critical Alarm Register

Temperature Register

Manufacturer I.D. Register

Device I.D./Device Revision Register

Reserved ⁽¹⁾

01h

R/W

R

02h

03h

04h

05h

06h

R

1114h

2200h

N/A

07h

R

08h to 0Fh

R/W

Note:

1. Write operations to reserve registers should be avoided as it may cause undesirable results.

6.2.1 Pointer Register (8-bit Write Only, Address = N/A)

The AT30TSE004A utilizes a Pointer Register to select and access all the data registers shown on Table 6-1.

The Pointer Register is an 8-bit Write-only register (see Table 6-2). The power-on default value is 00h which is

the address location for the Capability Register.

Table 6-2.

Pointer Register

Bit 7

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0

Symbol

Pointer Register Value

R/W

W

0

W

0

W

0

W

0

W

0

W

0

W

0

W

0

Default Value

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13

6.2.2 Capability Register (16-bit Read-only, Address = 00h)

This register is a 16-bit read-only register used to specify the functional capabilities of the temperature sensor.

The AT30TSE004A is capable of measuring temperature with ±1C over the active range and ±2C over the

monitor range. The Capability Register functions are described in Table 6-3 and Table 6-4.

Table 6-3.

Capability Register Bit Distribution

Bit 15

Bit 14

Bit 13

Bit 12

Bit 11

Bit 10

Bit 9

Bit 8

Symbol

RFU

Default Value

R/W Access

0

R

0

R

0

R

0

R

0

R

0

R

Bit 6

TMOUT

1

R

Bit 2

RANGE

1

Bit 7

EVSD

1

Bit 5

V_HV

1

Bit 4

Bit 3

Bit 1

SACC

1

Bit 0

ICAP

1

Symbol

TPRES

Default Value

R/W Access

1

0

R

Table 6-4.

Capability Register Bit Description

Symbol Description

Bit

15:8

RFU

Reserved for Future Use and must be Logic 0.

Event Output Status During Shutdown Mode:

1 = The EVENT pin output is deasserted (not driven) when entering Shutdown Mode and will

remain deasserted upon exit from Shutdown Mode until the next temperature measurement

sample is taken. In Interrupt Mode, the EVENT pin maybe asserted when existing Shutdown if

a pending Interrupt has not be cleared.

7

EVSD

TMOUT

Timeout:

6

5

1 = BusTimeout supported within the range 25 to 35ms.

A₀Pin High Voltage:

V

HV

1 = The A₀pin supports a maximum voltage up to 10V.

Temperature Resolution:

4:3

2

TPRES

RANGE

10 =Supports 0.125C (11-bit resolution).

1 = Can read temperatures below 0°C and sets appropriate sign bit.

Supported Accuracy:

1

0

SACC

ICAP

1 = Supports a B-grade accuracy of ±1C over the active range (75C to 95C) and 2C over the

monitor range (40C to 125C).

Interrupt Capability:

1 = Supports Interrupt capabilities.

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6.2.3 Configuration Register (16-bit Read/Write, Address = 01h)

The AT30TSE004A incorporates a 16-bit Configuration Register allowing the user to set key operational

features of the temperature sensor. The Configuration Register functions are described in Table 6-5 and

Table 6-6.

Table 6-5.

Configuration Register Bit Distribution

Bit 15

Bit 14

Bit 13

RFU

0

Bit 12

Bit 11

Bit 10

Bit 9

Bit 8

SHTDWN

0

Symbol

HYSTENB

Default Value

0

Bit 4

EVTSTS

0

Bit 3

EVTOUT

0

Bit 2

CRITEVT

0

Bit 1

EVTPOL

0

Bit 7

Bit 6

Bit 5

EVTCLR

0

Bit 0

Symbol

CRTALML WINLOCK

EVTMOD

0

Default Value

R/W Access

0

R/W

W

R

R/W

Table 6-6.

Configuration Register Bit Description

Symbol Description

Bit

15:11 RFU

Reserved for Future Use and must be Logic 0.

Hysteresis Enable:

00 = 0C Disable hysteresis (Power-on default)

01 = 1.5C Enable hysteresis

10 = 3.0C Enable hysteresis

11 = 6.0C Enable hysteresis

The purpose of these bits is to control the hysteresis applied to the temperature limit trip point

boundaries. The above hysteresis applies to all limits when temperature drops below the user

specified temperature limit trip points.

10:9

HYSTENB

Note:

Hysteresis applies to decreasing temperature only. Once the temperature is above

a given threshold, the temperature must drop below the boundary limit minus

hysteresis in order for a Comparator EVENT to be cleared.

Example:

If these two bits are set to ‘01’ for 1.5C and the Upper Limit is set to 85C, as

temperature rises above 85C, bit 14 of the Temperature Register will be set to a

Logic 1. Bit 14 will remain set until the temperature drops below the threshold

(85C) minus the hysteresis value(83.5C).

Note:

Hysteresis is also applied to the EVENT pin functionality. This bit cannot be

changed if the Crit_Alarm or Alarm Window Lock bits is set.

Shutdown Mode:

0 = The temperature sensor is enabled for continuous conversion (power-on default).

1 = The temperature sensor is disabled.

To save power in Shutdown Mode, the temperature sensor is not active and will not generate

interrupts or update the temperature data. The EVENT pin is deasserted (not driven).

8

SHTDWN

This bit cannot be set to a Logic 1 if either of the Crit_Alarm or Alarm Window Lock bits is set,

however, it can be cleared at any time. The device will respond to protocol commands and the

bus timeout is active when in Shutdown Mode.

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Table 6-6.

Bit

Configuration Register Bit Description (Continued)

Symbol

Description

Crit_Alarm Lock bit:

0 = The Crit_Alarm Register can be updated (power-on default).

1 = The Crit_Alarm Register is locked and cannot be updated.

This bit locks the Critical Alarm Register from being updated.

Once set, it can only be cleared to a Logic 0 by an internal Power-On Reset.

7

CRTALML

Alarm Window Lock bit:

0 = The Upper Limit and Lower Limit Registers can be updated (power-on default).

1 = The Upper and Lower Limit Registers are locked and cannot be updated.

Once set, it can be only be cleared to a Logic 0 by an internal Power-On Reset.

6

5

WINLOCK

EVTCLR

EVENT Clear:

0 = Has no effect (power-on default).

1 = Clears (releases) the active EVENT pin in Interrupt Mode.

This bit will clear the EVENT pin after it has been enabled. This bit is a

write-only bit and will read as a Logic 0 and is ignored when in Comparator Mode.

EVENT Pin Output Status:

4

3

EVTSTS

EVTOUT

0 = The EVENT output is not asserted by the device (power-on default).

1 = The EVENT output is asserted due to a limit or alarm condition.

EVENT Output Control:

0 = The EVENT output is disabled and will not generate interrupts (power-on default).

1 = The EVENT output is enabled.

This bit cannot be altered if the Crit_Alarm or the Alarm Window Lock bits is set.

Critical Temperature only:

0 = The EVENT output is asserted if the measured temperature is above the Upper Limit or

Critical Alarm, or is below the Lower Limit (power-on default).

2

CRITEVT

1 = The EVENT output is asserted only for a Critical Alarm violation when the temperature is

greater then the Crit_Alarm.

This bit cannot be altered if the Alarm Window Lock bit is set.

EVENT Polarity:

0 = The EVENT pin is active low (power-on default).

1 = The EVENT pin is active high.

1

0

EVTPOL

EVTMOD

This bit cannot be altered if the Crit_Alarm or the Alarm Window Lock bit is set.

A pull-up resistor is required on this pin to achieve the Logic 1 state.

EVENT Mode:

0 = The EVENT pin will operate in Comparator Mode (power-on default).

1 = The EVENT pin will operate in Interrupt Mode.

This bit cannot be altered if the Crit_Alarm or the Alarm Window Lock bit is set.

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Figure 6-1.

EVENT Pin Mode Functionality

Crit_Alarm

Upper Limit

Switches to

Comparator

Mode

Measured

Temperature

Lower Limit

Software Resets Interrupt

EVENT Pin in

Interrupt Mode”

(Active Low)

EVENT Pin in

“Comparator

Mode”

(Active Low)

EVENT Pin in

“Crit_Alarm

Only Mode”

(Active High)

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17

6.2.4 Upper Limit Register (16-bit Read/Write, Address = 02h)

The Upper Limit Register holds the user programmed upper temperature boundary trip point in 2’s complement

format (0.125C resolution) that can be utilized to monitor the temperature in an operating window between the

Upper Limit Register and the Lower Limit Register settings (see Table 6-7 and Table 6-9). When the

temperature increases above this trip point, drops below, or is equal to the trip point (minus any hysteresis set),

then the EVENT pin is asserted (if enabled). This register is read-only if the Alarm Window Lock (WINLOCK) bit

six in the Configuration Register is set to a Logic 1.

Table 6-7.

Upper Limit Register Bit Distribution

Bit 15

Bit 14

RFU

0

Bit 13

Bit 12

SIGN

0

Bit 11

Bit 10

Bit 9

Bit 8

Symbol

ALMWINH

Default Value

R/W Access

0

R

0

R

0

R

R/W

Bit 4

R/W

Bit 3

R/W

Bit 2

R/W

Bit 1

R/W

Bit 0

Bit 7

Bit 6

Bit 5

Symbol

ALMWINH

RFU

Default Value

R/W Access

0

R/W

R

Table 6-8.

Upper Limit Register Bit Description

Symbol Description

Bit

15:13 RFU

Reserved for Future Use. Read as Logic 0.

Sign bit:

12

SIGN

0 = The temperature is greater than or equal to 0°C.

1= The temperature is less than 0°C.

Upper Limit temperature bits:

Represented in 2’s complement format.

11:2

0:1

ALMWINH

RFU

Read-only access if Alarm Window is locked (Configuration Register bit 6 high).

R/W access if the Alarm Window is unlocked.

Reserved for Future Use. Read as Logic 0.

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6.2.5 Lower Limit Register (16-bit Read/Write, Address = 03h)

The Lower Limit Register holds the user programmed lower temperature boundary trip point in 2’s complement

format (0.125C resolution) that can be utilized to monitor the temperature in an operating window (see

Table 6-7 and Table 6-9). When the temperature decreases below this trip point minus any hysteresis set or

increases to meet or exceed this trip point, then the EVENT pin is asserted (if enabled).

This register becomes read-only if the Alarm Window Lock (WINLOCK) bit six in the Configuration Register is

set to a Logic 1.

Table 6-9.

Lower Limit Register Bit Distribution

Bit 15

Bit 14

RFU

0

Bit 13

Bit 12

SIGN

0

Bit 11

Bit 10

Bit 9

Bit 8

Symbol

ALMWINL

Default Value

R/W Access

0

R

0

R

0

R

R/W

Bit 4

R/W

Bit 3

R/W

Bit 2

R/W

Bit 1

R/W

Bit 0

Bit 7

Bit 6

Bit 5

Symbol

ALMWINL

RFU

Default Value

R/W Access

0

R/W

R

Table 6-10.

Lower Limit Register Bit Description

Bit

Symbol Description

15:13 RFU

Reserved for Future Use. Read as Logic 0.

Sign bit:

12

SIGN

0 = The temperature is greater than or equal to 0°C.

1 = The temperature is less than 0°C.

Lower Limit temperature bits:

Represented in 2’s complement format.

11:2

0:1

ALMWINL

RFU

Read-only access if Alarm Window is locked (Configuration Register bit 6 high).

R/W access if the Alarm Window is unlocked.

Reserved for Future Use. Read as Logic 0.

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19

6.2.6 Critical Alarm Register (16-bit Read/Write, Address = 04h)

The Critical Alarm Register holds the user programmed Critical Alarm temperature boundary trip point in

2’s complement format (0.125°C resolution) that can be utilized to monitor the temperature (see Table 6-11 and

Table 6-12). When the temperature increases above this trip point, the EVENT pin will be asserted (if enabled).

It will remain asserted until temperature decreases below or equal to the trip point minus any hysteresis set.

This register becomes read-only if the Critical Alarm Lock Bit (CRTALML) bit seven in the Configuration

Register is set to a Logic 1.

Table 6-11.

Critical Alarm Register Bit Distribution

Bit 15

Bit 14

RFU

0

Bit 13

Bit 12

SIGN

0

Bit 11

Bit 10

Bit 9

Bit 8

Symbol

CRITEVT

Default Value

R/W Access

0

R

0

R

0

R

R/W

Bit 4

R/W

Bit 3

R/W

Bit 2

R/W

Bit 1

R/W

Bit 0

Bit 7

Bit 6

Bit 5

Symbol

CRITEVT

RFU

Default Value

R/W Access

0

R/W

R

Table 6-12.

Critical Alarm Register Bit Description

Bit

Symbol Description

15:13 RFU

Reserved for Future Use. Read as Logic 0.

Sign bit:

12

SIGN

0 = The temperature is greater than or equal to 0°C.

1 = The temperature is less than 0°C.

Critical Alarm temperature bits:

Represented in 2’s complement format.

11:2

0:1

CRITEVT

RFU

Read-only access if Alarm Window is locked (Configuration Register bit 6 high).

R/W access if the Alarm Window is unlocked.

Reserved for Future Use. Read as Logic 0.

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6.2.7 Temperature Register (16-bit Read-only, Address = 05h)

The Temperature Register holds the internal temperature measurement data represented in 2’s complement

format allowing for resolution equal to 0.125C (least significant bit). The upper three bits (15, 14, and 13) of the

Temperature Register indicates the trip status of the current temperature and most important, are not affected

by the status of the output of the EVENT pin (see Table 6-13 and Table 6-14).

Table 6-13.

Temperature Register Bit Distribution

Bit 15

Bit 14

Bit 13

Bit 12

SIGN

0

Bit 11

128°C

0

Bit 10

64°C

0

Bit 9

Bit 8

16°C

0

Symbol

CRITHIGH ALMHIGH ALMLOW

32°C

Default Value

R/W Access

0

R

0

R

0

R

0

R

Bit 1

0.125°C

0

R

Bit 7

8°C

0

Bit 6

4°C

0

Bit 5

2°C

0

Bit 4

1°C

0

Bit 3

0.5°C

0

Bit 2

0.25°C

0

Bit 0

RFU

0

Symbol

Default Value

R/W Access

R

Table 6-14.

Temperature Register Bit Description

Bit

Symbol Description

0 = The temperature is less than the Critical Alarm Register setting.

1 = The temperature is greater than or equal to Critical Alarm Register setting.

15

CRITHIGH

ALMHIGH

When this bit is set to a Logic 1, it will automatically clear once the measured temperature

decreases below or is equal to the trip point minus any hysteresis set.

0 = The temperature is below the Upper Limit Register setting.

1 = The temperature is above the Upper Limit Register setting.

14

When the bit is set to a Logic 1, it will automatically clear once the measured temperature

decreases below or is equal to the trip point minus any hysteresis set.

0 = The temperature is above the Lower Limit Register setting.

1 = The temperature is below the Lower Limit Register setting.

13

12

ALMLOW

SIGN

When the bit is set to a Logic 1, it will automatically clear once the measured temperature

increases above or is to equal to the trip point.

Sign bit:

0 = The temperature is greater than or equal to 0°C.

1 = The temperature is less than 0°C.

Temperature bits:

11:1

0

TEMP

RFU

Represented in 2’s complement format.

The encoding of bits B11 through B2 is the same as in the limit and alarm registers.

Reserved for Future Use. Read as Logic 0.

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21

6.2.7.1 Temperature Register Format

This section will clarify the Temperature Register format and temperature bit value assignments utilized for

temperature for the following registers: Upper Limit, Lower Limit, Critical Alarm, and Temperature Registers.

The temperatures expressed in the Upper Limit, Lower Limit, Critical Alarm, and Temperature Registers are

indicated in 2’s complement format. In each of the temperature limit registers, bits 12 through bit two are utilized

for temperature settings, or in the case of the Temperature Register, holds the internal temperature

measurement with bits 12 through bit one allowing 0.125ºC resolution.

Table 6-15 indicates the Temperature Register’s assigned bit values utilized for temperature and shows

examples for the Temperature Register bit values for various temperature readings.

Table 6-15.

Temperature Register Format

Position Bit 12 Bit 11 Bit 10 Bit 9

Bit Value SIGN 128°C 64°C 32°C

Bit 8

Bit 7 Bit 6

8°C 4°C

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0

16°C

2°C

1°C

0.5°C 0.25°C 0.125°C

X

Table 6-16.

Temperature Register Examples

Temperature Register Value Examples

Temperature

+125°C

+99.75°C

+85°C

Binary (Bit 15 – Bit 0)

xxx0 0111 1101 00xx

xxx0 0110 0011 11xx

xxx0 0101 0101 00xx

xxx0 0010 0111 00xx

xxx0 0000 1111 11xx

xxx0 0000 0000 01xx

xxx0 0000 0000 00xx

xxx1 1111 1111 11xx

xxx1 1111 1110 00xx

xxx1 1110 1100 00xx

+39°C

+15.75°C

+0.25°C

0°C

-0.25°C

-1°C

-20°C

22

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6.2.8 Manufacturer ID Register (16-bit Read-only, Address = 06h)

The Manufacturer ID Register contains the PCI SIG number assigned to Atmel (1114h) as shown in Table 6-17.

Table 6-17.

Manufacturer ID Register Bit Distribution

Bit 15

Bit 14

Bit 13

Bit 12

Bit 11

Bit 10

Bit 9

Bit 8

Symbol

Manufacturer ID

Default Value

R/W Access

0

R

0

R

0

R

1

R

0

R

0

R

0

R

1

R

Bit 7

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0

Symbol

Manufacturer ID

Default Value

R/W Access

0

1

0

1

0

R

6.2.9 Device ID Register (16-bit Read-only, Address = 07h)

The upper or high order byte is used to specify the device identification and the low byte is used to specify the

device revision. The Device ID for the AT30TSE004A is 2200h (see Table 6-18).

Table 6-18.

Device ID Register Bit Distribution

Bit 15

Bit 14

Bit 13

Bit 12

Bit 11

Bit 10

Bit 9

Bit 8

Symbol

Device ID

Default Value

R/W Access

0

R

0

R

1

R

0

R

0

R

0

R

1

R

0

R

Bit 7

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0

Symbol

Device Revision

Default Value

R/W Access

0

R

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23

6.3

Temperature Sensor Write Operations

Writing to the Temperature Register of the AT30TSE004A is accomplished through a modified Write operation

for two data bytes. To maintain 2-wire compatibility, the 16-bit registers are accessed through a Pointer Register

requiring the TS Write sequence to include a Pointer Register byte following the device address byte to write the

two data bytes. Figure 6-2 illustrates the entire Write transaction.

Figure 6-2.

SCL

Temperature Sensor Register Write Operation

1

2

0

3

4

5

6

7

8

0

9

0

1

2

3

4

5

6

7

8

9

0

Device Address Byte

A2 A1 A0

Pointer Register Byte

0

1

P7 P6 P5 P4 P3 P2 P1 P0

MSB

SDA

MSB

Start

by

Master

ACK

from

Slave

ACK

from

Slave

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

0

Least Significant Data Byte

Most Significant Data Byte

D15 D14 D13 D12 D11 D10 D9 D8

MSB

0

D7 D6 D5 D4 D3 D2 D1 D0

MSB

Start

by

Master

Stop

by

Master

ACK

from

Slave

ACK

from

Slave

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6.4

Temperature Sensor Read Operations

Reading data from the temperature sensor may be accomplished in one of two ways:



If the location latched in the Pointer Register is correct (for normal operation, it is expected the same

address will be read repeatedly to read the temperature from the Temperature Register), the Register

Pointer Word Read sequence should be utilized as shown in Figure 6-3. To perform a Register Pointer

Word Read, the Master transmits a Start condition followed by a device address byte with the R/W select

bit to a Logic 1. The AT30TSE004A should respond with an ACK and will transmit the most significant

data byte. The Master should send an ACK followed by the device transmitting the least significant data

byte. To end the Read operation, the Master sends a NACK followed by a Stop condition.



If it is desired to Read a Random Register or simply change to read a different register from the

temperature sensor, then the Preset Pointer Register Word Read protocol sequence should be followed

and is shown in Figure 6-4. The Preset Pointer Register Word Read sequence allows the Pointer Register

to be preloaded with the correct register address to gain access to the desired register to be read. To

perform a Preset Pointer Register Word Read, the Master transmits a Start condition followed by a device

address byte (with the R/W select bit to a Logic 0) and a Pointer Register byte to the AT30TSE004A.

Once the device address and Pointer Register bytes are clocked in and acknowledged by the

AT30TSE004A, the Master must generate another Start condition. The Master transmits another device

address byte (with the R/W select bit to a Logic 1) followed by an ACK by the AT30TSE004A and the

device transmitting the most significant data byte. The Master should send a ACK followed by the device

transmitting the least significant data byte. To end the Read operation, the Master should send a NACK

followed by a Stop condition.

Figure 6-3.

Register Pointer Word Read

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

0

1

2

3

4

5

6

7

8

9

1

SCK

Device Address Byte

A2 A1 A0

Most Significant Data Byte

Least Significant Data Byte

0

MSB

0

1

0

D15 D14 D13 D12 D11 D10 D9 D8

MSB

D7 D6 D5 D4 D3 D2 D1 D0

MSB

SDA

Start

by

Master

Stop

by

Master

ACK

from

Slave

ACK

from

Master

NACK

from

Master

Figure 6-4.

Preset Pointer Register Word Read

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

0

SCL

Device Address Byte

A2 A1 A0

Pointer Register Byte

0

MSB

0

1

0

P7 P6 P5 P4 P3 P2 P1 P0

MSB

SDA

Start

by

Master

ACK

from

Slave

ACK

from

Slave

1

0

2

0

3

4

5

6

7

8

1

9

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

1

Least Significant Data Byte

Most Significant Data Byte

Device Address Byte

A2 A1 A0

1

0

D15 D14 D13 D12 D11 D10 D9 D8

MSB

0

D7 D6 D5 D4 D3 D2 D1 D0

MSB

Start

by

Master

Stop

by

Master

ACK

from

Master

NACK

from

Master

ACK

from

Slave

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25

7.

Serial EEPROM

7.1

Memory Organization

To provide the greatest flexibility and backwards compatibility with the previous generations of SPD devices, the

AT30TSE004A memory organization is organized into two independent 2-Kbit memory arrays. Each 2-Kbit

(256-byte) section is internally organized into two independent quadrants of 128 bytes with each quadrant

comprised of eight pages of 16 bytes. Including both memory sections, there are four 128-byte quadrants

totaling 512 bytes. The Memory Array organization details are shown in Section on page 6 and Table 7-1.

7.1.1 Set Page Address and Read Page Address Commands

The AT30TSE004A incorporates an innovative memory addressing technique that utilizes a Set Page Address

(SPA) and Read Page Address (RPA) commands to select and verify the desired half of the memory is enabled

to perform Write and Read operations.

Example:

If SPA = 0, then the first-half or lower 256 bytes of the Serial EEPROM is selected allowing

access to Quadrant 0 and Quadrant 1. Alternately, if SPA = 1, then the second-half or upper 256

bytes of the Serial EEPROM is selected allowing access to Quadrant 2 and Quadrant 3.

Table 7-1.

Set Page Address and Memory Organization

Block

Set Page Address (SPA)

Memory Address Locations

00h to 7Fh

Quadrant 0

Quadrant 1

Quadrant 2

Quadrant 3

0

1

80h to FFh

00h to 7Fh

80h to FFh

Note:

Due to the requirement for the A₀pin to be driven to V_HV, the SPA and the RPA commands are fully supported in a

single DIMM (isolated DIMM) end application or a single DIMM programming station only.

Setting the Set Page Address (SPA) value selects the desired half of the EEPROM for performing Write or Read

operations. This is done by sending the SPA as seen in Figure 7-1. The SPA command sequence requires the

Master to transmit a Start condition followed by sending a control byte of ‘011011*0’ where the ‘*’ in the bit

7 position will dictate which half of the EEPROM is being addressed. A ‘0’ in this position (or 6Ch) is required

to set the page address to the first half of the memory and a ‘1’ (or 6Eh) is necessary to set the page address

to the second half of the memory. After receiving the control byte, the AT30TSE004A should return an ACK and

the Master should follow by sending two data bytes of don’t care values. The AT30TSE004A responds with a

ACK to each of these two data bytes although the JEDEC TSE2004av specification allows for either an ACK or

NACK response. The protocol is completed by the Master sending a Stop condition to end the operation.

Figure 7-1.

Set Page Address (SPA)

1

2

3

4

5

6

7

8

9

0

1

2

3

4

5

6

7

8

9

0

1

2

3

4

5

6

7

8

9

SCL

Control Byte

Address Byte

Data Byte

0

1

0

1

*

0

X

0

SDA

MSB

Start

by

Master

Stop

by

Master

ACK

from

Slave

ACK

from

Slave

ACK

from

Slave

Bit * = 0: Indicates the page address is located in the first half of the memory.

Bit * = 1: Indicates the page address is located in the second half of the memory.

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Reading the state of the SPA can be accomplished via the Read Page Address (RPA) command. The Master

can issue the RPA command to determine if the AT30TSE004A’s internal address counter is located in the first

2-Kbit section or the second 2-Kbit memory section based upon the device’s ACK or NACK response to the

RPA command.

The RPA command sequence requires the Master to transmit a Start condition followed by a control byte of

‘01101101’(6Dh). The device’s current address counter (page address) is located in the first half of the

memory if the AT30TSE004A responds with an ACK to the RPA command. Alternatively, if the device’s

response to the RPA command is a NACK, indicates the page address is located in the second half of the

memory (see Figure 7-2). Following the control byte and the device’s ACK or NACK response, the

AT30TSE004A should transmit two data bytes of don’t care values. The Master should NACK on these two data

bytes followed by the Master sending a Stop condition to end the operation.

After power-up, the SPA is set to zero indicating internal address counter is located in the first half of the

memory. Performing a software reset (see Section 4.8 “2-wire Software Reset” on page 10) will also set the

SPA to zero.

The AT30TSE004A incorporates a Reversible Software Write Protect (RSWP) feature that allows the ability to

selectively write protect data stored in any or all of the four Serial EEPROM 128-byte quadrants. See

Section 7.3 “Write Protection” on page 32 for more information on the RSWP feature.

Figure 7-2.

Read Page Address (RPA)

1

2

1

3

1

4

5

6

1

7

0

8

9

*

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

1

SCL

Control Byte

Most Significant Data Byte

Least Significant Data Byte

0

1

X

SDA

MSB

Start

by

Master

Stop

by

Master

ACK or NACK

from

NACK

from

Master

NACK

from

Master

Slave

Bit * = 0: ACK indicates the device’s internal address counter is located in the first half of the memory.

Bit * = 1: NACK indicates the device’s internal address counter is located in the second half of the memory.

AT30TSE004A [DATASHEET]

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27

7.2

Serial EEPROM Write Operations

The 4-Kbit Serial EEPROM within the AT30TSE004A supports single Byte Write and Page Write operations up to the

maximum page size of 16 bytes in one operation. The only difference between a Byte Write and a Page Write

operation is the amount of data bytes loaded. Regardless of whether a Byte Write or Page Write operation is

performed, the internally self-timed write cycle will take the same amount of time to write the data to the addressed

memory location(s). Temperature sensor operations can be accessed during the write cycle to read the Temperature

Register or perform any other temperature sensor function.

Caution:

All Byte Write and Page Write operations should be preceded by the SPA and or RPA commands to

ensure the internal address counter is located in the desired half of the memory.

If a Byte Write or Page Write operation is attempted to a protected quadrant, then the AT30TSE004A will

respond (ACK or NACK) to the Write operation according to Table 7-2.

Table 7-2.

Serial EEPROM Acknowledge Status When Writing Data or Defining Write Protection

Word

Address

Sent

Word

Address

Response

Quadrant

Status

Instruction

Sent

Instruction

Response

Data Word Data Word

Write

Cycle

Sent

Response

Set RSWP

NACK

ACK

Don’t Care

NACK

ACK

Don’t Care

NACK

No

Write Protected

with Set RSWP

Clear RSWP

Don’t Care

Data

ACK

Yes

Byte Write or

Page Write to

Protected Quadrant

Word

Address

ACK

NACK

No

Set RSWP or

Clear RSWP

ACK

Don’t Care

ACK

Don’t Care

Data

ACK

Yes

Not Protected

Byte Write or

Page Write

Word

Address

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7.2.1 Byte Write

Following the Start condition from the Master, the device type identifier (‘1010’), the device address bits and

the R/W select bit (set to a Logic 0) are clocked onto the bus by the Master (see Figure 7-3). This indicates to

the addressed device that the Master will follow by transmitting a byte with the word address. The

AT30TSE004A will respond with an ACK during the ninth clock cycle. Then the next byte transmitted by the

Master is the 8-bit word address of the byte location to be written into the Serial EEPROM. After receiving an

ACK from the AT30TSE004A, the Master transmits the data word to be programmed followed by an ACK from

the AT30TSE004A. The Master ends the Write sequence with a Stop condition during the 10^thclock cycle to

initiate the internally self-timed write cycle. A Stop condition issued during any other clock cycle during the Write

operation will not trigger the internally self-timed write cycle. Once the write cycle begins, the pre-loaded data

word will be programmed in the amount of time not to exceed the t_WRspecification. The t_WRtime is defined in

more detail in Section 7.2.4 on page 31. During this time, the Master should wait a fixed amount of time set to

the t_WRspecification, or for time sensitive applications, an ACK polling routine can be implemented (see

Figure 7-5 on page 31). All inputs are ignored by the Serial EEPROM during the write cycle and the Serial

EEPROM will not respond until the write cycle is complete. The Serial EEPROM will increment its internal

address counter each time a byte is written.

Note:

The temperature sensor operations can be accessed during the write cycle to read the Temperature Register or

perform any other temperature sensor function.

Figure 7-3.

Byte Write to Serial EEPROM

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

0

1

2

3

4

5

6

7

8

9

0

SCL

Device Address Byte

A2 A1 A0

Word Address Byte

Data Word

1

MSB

0

1

0

A7 A6 A5 A4 A3

MSB

A2 A1 A0

D7 D6 D5 D4 D3 D2 D1 D0

MSB

SDA

Stop

by

Master

Start

by

Master

ACK

from

Slave

ACK

from

Slave

ACK

from

Slave

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29

7.2.2 Page Write

The 4-Kbit Serial EEPROM is capable of writing up to 16 data bytes at a time executing the Page Write protocol

sequence (see Figure 7-4). A partial or full Page Write operation is initiated the same as a Byte Write operation

except that the Master does not send a Stop condition after the first data word is clocked in. Instead, after the

Serial EEPROM has acknowledged receipt of the first data word, the Master can transmit up to fifteen more data

words. The device will respond with an ACK after each data word is received. The lower four bits of the data

word address are internally incremented following the receipt of each data word. The higher data word address

bits are not incremented, retaining the memory page row location. When the internally generated word address

reaches the page boundary, then the following data word is placed at the beginning of the same page. If more

than sixteen data words are transmitted to the Serial EEPROM, the data word address will roll-over and the

previous data will be overwritten. The address roll-over during a Write sequence is from the last byte of the

current page to the first byte of the same page.

The Master ends the Page Write sequence with a Stop condition during the 10th clock cycle to initiate the

internally self-timed write cycle. A Stop condition issued during any other clock cycle during the Write operation

will not trigger the internally self-timed write cycle. Once the write cycle begins, the pre-loaded data words will

be programmed in the amount of time not to exceed the t_WRspecification. All inputs are ignored by the Serial

EEPROM during the write cycle and the Serial EEPROM will not respond until the write cycle is complete. The

t

_WRtime is defined in more detail in Section 7.2.4 on page 31. During this time, the Master should wait a fixed

amount of time set to the t_WRspecification, or for time sensitive applications, an ACK polling routine can be

implemented (see Figure 7-5 on page 31).

Figure 7-4.

Page Write to Serial EEPROM

1

2

0

3

4

5

6

7

8

0

9

0

1

2

3

4

5

6

7

8

9

0

SCL

SDA

Device Address Byte

A2 A1 A0

Word Address Byte

1

MSB

1

0

A7 A6 A5 A4 A3 A2 A1 A0

MSB

Start

by

Master

ACK

from

Slave

ACK

from

Slave

1

2

3

4

5

6

7

8

9

0

1

2

3

4

5

6

7

8

9

0

1

2

3

4

5

6

7

8

9

0

Data Word (n)

Data Word (n+1)

Data Word (n+15)

D7 D6 D5 D4 D3 D2 D1 D0

MSB

D7 D6 D5 D4 D3 D2 D1 D0

MSB

D7 D6 D5 D4 D3 D2 D1 D0

MSB

Stop

by

Master

ACK

from

Slave

ACK

from

Slave

ACK

from

Slave

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7.2.3 Acknowledge (ACK) Polling

An ACK polling routine can be implemented to optimize time sensitive applications that would not prefer waiting

the fixed maximum write cycle time and would prefer to know immediately when the Serial EEPROM write cycle

has completed to start a subsequent operation. Once the internally self timed write cycle has started (the Stop

condition during the 10^thclock cycle at the end of the Write sequence), the Serial EEPROM inputs are disabled

and ACK polling can be initiated (see Figure 7-5). An ACK polling routine involves sending a valid Start

condition followed by the device address byte. While the write cycle is in progress, the device will not respond

with an ACK indicating the Serial EEPROM is busy writing data. Once complete, the device will ACK and the

next device operation can be started.

Note:

The temperature sensor operations can be accessed during the write cycle to read the Temperature Register or

perform any other user desired temperature sensor operation.

Figure 7-5.

Acknowledge Polling Flow Chart

Send Start

Condition

Followed

Send

Stop

Did

the Device

ACK?

Send Any

YES

Continue to

Next Operation

Condition

to Initiate

Write Cycle

Write

by Valid

Protocol

Device Address

Byte

NO

7.2.4 Write Cycle Timing

The length of the self timed write cycle, or t_WR, is defined as the amount of time from a valid Stop condition that

begins the internal write sequence to the Start condition of the first device address byte sent to the

AT30TSE004A that it subsequently responds to with an ACK. Figure 7-6 has been included to show this

measurement.

Figure 7-6.

Write cycle Timing

SCL

8

9

Data Word n

D0

ACK

SDA

First Acknowledge from the device

to a valid device address sequence after

write cycle is initiated. The minumum t_WR

can only be determined through

t_WR

the use of an ACK Polling routine.

Stop

Condition

Start

Condition

Stop

Condition

AT30TSE004A [DATASHEET]

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31

7.3

Write Protection

The AT30TSE004A incorporates a Reversible Software Write Protection (RSWP) feature that allows the ability

to selectively write protect data stored in each of the four independent 128-byte Serial EEPROM quadrants.

Table 7-3 identifies the memory quadrant identifier with its associated quadrant, SPA and memory address

locations.

The AT30TSE004A has three RSWP software commands:



Set RSWP command for setting the RSWP.

Clear RSWP command for resetting all of the quadrants that are software write protected.

Read RSWP command for reading the RSWP status.

Table 7-3.

Serial EEPROM Memory Organization

Memory Quadrant

Identifier

Block

Quadrant 0

SPA

Address Locations

00h to 7Fh

0

1

001

100

101

000

Quadrant 1

Quadrant 2

Quadrant 3

80h to FFh

00h to 7Fh

80h to FFh

7.3.1 Set RSWP

Setting the RSWP is enabled by sending the Set RSWP command, similar to a normal Write command to the

device which programs the Write Protection to the target quadrant. The Set RSWP sequence requires sending

a control byte of ‘0110MMM0’ (where the ‘M’ represents the memory quadrant identifier for the target quadrant

to be write-protected) with the R/W bit set to a Logic 0. In conjunction with sending the protocol, the A₀pin must

be connected to V_HVfor the duration of RSWP sequence (see Figure 7-7 and Section 8.2). The Set RSWP

command acts on a single quadrant only as specified in the Set RSWP command and can only be reversed by

issuing the Clear RSWP command and will unprotect all quadrants in one operation (see Table 7-4).

Example:

If Quadrant 0 and Quadrant 3 are to be write-protected, two separate Set RSWP commands

would be required; however, only one Clear RSWP command is needed to clear and unprotect

both quadrants.

Table 7-4.

Set RSWP and Clear RSWP

Control Byte

Memory Quadrant

A₁

X

Device Type Identifier

Identifier

R/W

Function

A₂

X

A₀

Bit 7

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2 Bit 1

Bit 0

Set RSWP, Quadrant 0

Set RSWP, Quadrant 1

Set RSWP, Quadrant 2

Set RSWP, Quadrant 3

Clear RSWP

0

1

0

1

0

1

0

1

0

X

V_HV

0

1

0

X

Notes: 1. X = Don’t care but recommend to be hard-wired to V_CCor GND.

2. See Section 8.2 for the V_HVvalues.

3. Due to the requirement for the A₀pin to be driven to V_HV, the Set RSWP and Clear RSWP commands are fully

supported in a single DIMM (isolated DIMM) end application or single DIMM programming station only.

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Figure 7-7.

Set RSWP and Clear RSWP

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

SCL

Control Byte

Word Address Byte

Data Word

0

MSB

1

0

M

0

X

MSB

X

0/1

X

MSB

X

0/1

SDA

Start

by

Master

Stop

by

Master

ACK

from

Slave

ACK or NACK

from

ACK or NACK

from

Slave

M = Memory Quadrant Identifier

X = Don’t care

7.3.2 Clear RSWP

Similar to the Set RSWP command, the reversible write protection on all quadrants can be reversed or

unprotected by transmitting the Clear RSWP command. The Clear RSWP sequence requires the Master to

send a Start condition followed by sending a control byte of ‘01100110’ (66h) with the R/W bit set to a Logic 0.

The AT30TSE004A should respond with an ACK. The Master transmits a word address byte and data bytes

with don’t care values. The AT30TSE004A will respond with either an ACK or NACK to both the word address

and data word. In conjunction with sending the protocol, the A₀pin must be connected to V_HVfor the duration of

the Clear RSWP command (see Figure 7-7 and Section 8.2). To end the Clear RSWP sequence, the Master

sends a Stop condition.

Caution:

The write protection of individual quadrants cannot be reversed separately, and executing the Clear

RSWP command will clear the write protection on all four quadrants leaving all quadrants with no

software write protection.

7.3.3 Read RSWP

The Read RSWP command allows the ability to check a quadrant’s write protection status. To find out if the

Software Write Protection has been set to a specific quadrant, the same procedure that was used to set the

quadrant’s write protection can be utilized except that the R/W select bit is set to a Logic 1, and the A₀pin is not

required to have V_HV(see Table 7-6).

The Read RSWP sequence requires sending a control byte of ‘0110MMM1’ (where the ‘M’ represents the

memory quadrant identifier for the quadrant to be read) with the R/W bit set to a Logic 1 (see Figure 7-8).

If the RSWP has not been set, then the AT30TSE004A responds to the control byte with an ACK, and responds

to the word address byte and data word with a NACK. If the RSWP has been set, the AT30TSE004A responds

to all three bytes (control, word address, and data bytes) with a NACK as shown in Table 7-5.

Table 7-5.

Serial EEPROM Acknowledge When Reading Protection Status

Quadrant

Status

Instruction

Sent

Instruction

Response

Word Address

Sent

Word Address

Response

Data Word

Sent

Data Word

Response

Write Protected

Not Protected

Read RSWP

NACK

ACK

Don’t Care

NACK

Don’t Care

NACK

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

33

Table 7-6.

Function

Read RSWP

Control Byte

Memory Quadrant

A₁

X

Device Type Identifier

Identifier

R/W

B0

1

A₂

X

A₀

B7

B6

B5

B4

B3

0

B2

0

B1

1

Read RSWP, Quadrant 0

Read RSWP, Quadrant 1

Read RSWP, Quadrant 2

Read RSWP, Quadrant 3

0, 1

or

V_HV

X

1

0

1

0

1

0

X

1

0

1

X

0

1

Notes: 1. X= Don’t care but recommend to be hard-wired to V_CCor GND.

2. See Section 8.2 for the V_HVvalues.

Figure 7-8.

Read RSWP

1

2

1

3

1

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

1

SCK

Control Byte

Word Address Byte

Data Byte

0

M

1

0/1

X

SDA

MSB

Start

by

Master

Stop

by

Master

ACK or NACK

from

NACK

from

Master

NACK

from

Master

Slave

M = Memory Quadrant Identifier

X = Don’t care

7.4

Serial EEPROM Read Operations

All Read operations are initiated by the Master transmitting a Start bit, a device type identifier of ‘1010’ (Ah),

three software address bits (A2, A1, and A0) that match their corresponding hard-wired address pins (A₂, A₁,

and A₀), and the R/W select bit with a Logic 1 state. In the following clock cycle, the device should respond with

an ACK. The subsequent protocol depends on the type of Read operation desired. There are three Read

operations:



Current Address Read

Random Address Read

Sequential Read

Caution:

All Read operations should be preceded by the SPA and or RPA commands to ensure the desired half of

the memory is selected. The reason this is important, for example, during a Sequential Read operation

on the last byte in the first half of the memory (address FFh) with SPA=0 (indicating first half is selected),

the internal address counter will roll-over to address 00h in the first half of memory as opposed to the first

byte in the second half of the memory. For more information on the SPA and RPA commands, see

Section 7.1.1 “Set Page Address and Read Page Address Commands” on page 26.

34

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

7.4.1 Current Address Read

Following a Start condition, the Master only transmits the device address byte with the R/W select bit set to a

Logic 1 (see Figure 7-9). The AT30TSE004A should respond with an ACK and then serially transmits the data

word addressed by the internal address counter. The internal data word address counter maintains the last

address accessed during the last Read or Write operation, incremented by one. This address stays valid

between operations as long as power to the device is maintained. The address roll-over during a Read is from

the last byte of the last page to the first byte of the first page of the addressed 2-Kbit (depends on the current

SPA setting). To end the command, the Master does not respond with an ACK but does generate a following

Stop condition.

Figure 7-9.

Current Address Read from Serial EEPROM

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

SCL

Device Address Byte

Data Word (n)

1

MSB

0

1

0

A2 A1 A0

1

0

D7 D6 D5 D4 D3 D2 D1 D0

MSB

1

SDA

Start

by

Master

Stop

by

Master

ACK

from

Slave

NACK

from

Master

7.4.2 Random Read

A Random Read operation allows the Master to access any memory location in a random manner and requires

a dummy write sequence to preload the starting data word address. To perform a Random Read, the device

address byte and the word address byte are transmitted to the AT30TSE004A as part of the dummy Write

sequence (see Figure 7-10). Once the device address byte and data word address are clocked in and

acknowledged by the AT30TSE004A, the Master must generate another Start condition. The Master initiates a

Current Address Read by sending another device address byte with the R/W select bit to a Logic 1. The

AT30TSE004A acknowledges the device address byte, increments its internal address counter and serially

clocks out the first data word. The device will continue to transmit sequential data words as long as the Master

continues to ACK each data word. To end the sequence, the Master responds with a NACK and a Stop

condition.

Figure 7-10. Random Read from Serial EEPROM

1

2

3

4

5

6

7

8

9

1

2

3

4

5

6

7

8

9

0

SCL

SDA

Device Address Byte

A2 A1 A0

Word Address Byte

1

MSB

0

1

0

A7 A6 A5 A4 A3 A2 A1 A0

MSB

Start

by

Master

ACK

from

Slave

ACK

from

Slave

Dummy Write

1

2

3

4

5

6

7

8

1

9

1

2

3

4

5

6

7

8

9

1

Data Word (n)

Device Address Byte

A2 A1 A0

1

MSB

0

1

0

D7 D6 D5 D4 D3 D2 D1 D0

MSB

Start

by

Master

Stop

by

Master

ACK

from

Slave

NACK

from

Master

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

35

7.4.3 Sequential Read

A Sequential Read operation is initiated in the same way as a Random Read operation, except after the

AT30TSE004A transmits the first data word, the Master responds with an ACK (instead of a NACK followed by

a Stop condition). As long as the AT34TSE004A receives an ACK, it will continue to increment the data word

address and serially clock out the sequential data words (see Figure 7-11). When the internal address counter is

at the last byte of the last page, the data word address will roll-over to the beginning of the selected 2-Kbit array

(depending on the SPA setting) starting at address zero, and the Sequential Read operation will continue. The

Sequential Read operation is terminated when the Master responds with a NACK followed by a Stop condition.

Figure 7-11. Sequential Read from Serial EEPROM

1

2

0

3

4

5

6

7

8

1

9

0

1

2

3

4

5

6

7

8

9

0

SCL

SDA

Device Address Byte

Data Word (n)

1

MSB

1

0

A2 A1 A0

D7 D6 D5 D4 D3 D2 D1 D0

MSB

Start

by

Master

ACK

from

Slave

ACK

from

Master

1

2

3

4

5

6

7

8

9

0

1

2

3

4

5

6

7

8

9

0

1

2

3

4

5

6

7

8

9

1

Data Word (n+1)

Data Word (n+2)

Data Word (n+x)

D7 D6 D5 D4 D3 D2 D1 D0

MSB

D7 D6 D5 D4 D3 D2 D1 D0

MSB

D7 D6 D5 D4 D3 D2 D1 D0

MSB

Stop

by

Master

ACK

from

Master

ACK

from

Master

NACK

from

Master

36

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

8.

Electrical Specifications

8.1

Absolute Maximum Ratings*

*Notice: Stresses beyond those listed under “Absolute Maximum

Ratings” may cause permanent damage to the device.

Functional operation of the device at these ratings or any

other conditions beyond those indicated in the operational

sections of this specification is not implied. Exposure to

absolute maximum rating conditions for extended periods

may affect device reliability. Voltage extremes referenced in

the “Absolute Maximum Ratings” are intended to

accommodate short duration undershoot/overshoot

conditions and does not imply or guarantee functional

device operation at these levels for any extended period of

time.

Temperature under Bias. . . . . . . -40°C to +125°C

Storage Temperature . . . . . . . . -65°C to +150°C

Supply voltage

with respect to ground . . . . . . . . . .-0.5V to +4.3V

A₀Pin . . . . . . . . . . . . . . . . . . . . .-0.5V to +12.0V

All other input voltages

with respect to ground . . . . . .-0.5V to V_CC+ 0.5V

EVENT Pin . . . . . . . . . . . . . .-0.5V to V_CC+ 0.3V

Pull-up voltages applied to the EVENT Pin that exceed the

“Absolute Maximum Ratings” may forward bias the ESD

protection circuitry. Doing so may result in improper device

function and may corrupt temperature measurements.

All other output voltages

with respect to ground . . . . . .-0.5V to V_CC+ 0.5V

8.2

DC Characteristics

Applicable over recommended operating range: T_AI= -20°C to +125°C, V_CC= 1.7V to 3.6V (unless otherwise noted).

Symbol

V_CC1

Parameter

Test Condition

Min

1.7

2.2

Typ

Max

3.6

Units

Supply Voltage

V

V_CC2

3.6

I_CC1

I_CC2

I_CC3

Supply Current⁽²⁾

Temp Sensor

V_CC= 3.6V

Read at 100kHz

0.4

1.5

0.2

1.0

3.0

0.5

mA

Write at 100kHz

EE Inactive

V_CC= 1.7V

V_IN= V_CCor V_SS

1.6

0.1

3.0

4.0

μA

V

I_SB

Standby Current⁽³⁾

V_CC= 3.6V

I_LI

Input Leakage Current

Output Leakage Current

Input Low Level⁽¹⁾

V_IN= V_CCor V_SS

2.0

I_LO

V_IL

V_OUT= V_CCor V_SS

2.0

-0.5

0.3 * V_CC

V_IH

Input High Level⁽¹⁾

0.7 * Vcc

Vcc + 0.5

0.4

V

V_OL1

V_OL2

V_CC> 2V

I_OL= 3mA

Low-Level Output Voltage

Open-Drain

V_CC≤ 2V

I_OL= 2mA

0.2 * V_CC

V

V_OL= 0.4V

V_OL= 0.6V

V_OL= 0.4V

Freq ≤ 400kHz

Freq > 400kHz

3.0

6.0

mA

I_OL

Low-Level Output Current

A₀Pin High Voltage

20.0

V_HV

V_HV- V_CC≥ 4.8V

7

10

V

V_HYST1

V_HYST2

Notes: 1.

Input Hysteresis (SDA, SCL) V_CC< 2V

0.10 * V_CC

0.05 * V_CC

Input Hysteresis (SDA, SCL) V_CC≥ 2V

V

_ILmin and V_IHmax are reference only and are not tested.

2. TS in Shutdown mode.

3. Serial EEPROM inactive, TS in Shutdown mode.

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

37

8.3

AC Characteristics

Applicable over recommended operating range: T_AI= -20°C to +125°C, V_CC= 1.7V to 3.6V, CL = 1 TTL Gate and 100μF

(unless otherwise noted).

V_CC< 2.2V

100kHz

V_CC≥ 2.2V

400kHz 1000kHz

Symbol

f_SCL

Parameter

Min

10⁽²⁾

4700

4000

Max

Min

Max

Min

Max

Units

kHz

ns

Clock Frequency, SCL

Clock Pulse Width Low

Clock Pulse Width High

Noise Suppression Time

100

10⁽²⁾

1300

600

400

10⁽²⁾

500

260

1000

t_LOW

t_HIGH

t_I

ns

50

ns

Time the bus must be free before a

new transmission can start⁽¹⁾

t_BUF

4700

1300

500

ns

t_HD.STA

t_SU.STA

t_HD.DI

t_SU.DAT

t_R

Start Hold Time

4000

4700

0

600

0

260

0

ns

ms

Start Set-up Time

Data In Hold Time

Data In Set-up Time

Inputs Rise Time⁽¹⁾

Inputs Fall Time⁽¹⁾

Stop Set-up Time

Data Out Hold Time

Write Cycle Time

Timeout Time

250

100

20

50

1000

300

120

t_F

20

t_SU.STO

t_HD.DAT

t_WR

4000

200

600

200

260

0

3450

5

900

5

350

5

t_OUT

25

35

25

35

25

35

EEPROM

Write Endurance

Write

Cycles

25°C, Page Mode⁽¹⁾

1,000,000

Notes: 1. This parameter is ensured by characterization only.

2. The minimum frequency is specified at 10kHz to avoid activating the timeout feature.

Figure 8-1.

SCL: Serial Clock

SDA: Serial Data I/O

t_HIGH

t_F

t_R

t_LOW

SCL

SDA

t_SU.STA

t_HD.STA

t_HD.DAT

t_SU.DAT

t_SU.STO

t_BUF

38

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

8.4

Temperature Sensor Characteristics

Applicable over recommended operating range: T_AI= -20°C to +125°C, V_CC= 1.7V to 3.6V (unless otherwise noted).

Freq. ≤ 400kHz

Freq. > 400kHz

Symbol Parameter

Test Condition

Min

Typ

±0.5

±1.0

±2.0

75.0

0.125

Max

Min

Typ

±0.5

±1.0

±2.0

75.0

0.125

Max

Units

°C

+75°C < Ta < +95°C

+40°C < Ta < +125°C

-20°C < Ta < +125°C

±1.0

±2.0

±1.0

±2.0

TS Accuracy

T_ACC

°C

(B-grade)

±3.0

°C

T_CONV

T_RES

TS Conversion Time

TS Resolution

125.0

ms

°C

8.5

Pin Capacitance⁽¹⁾

Applicable over recommended operating range from T_A= +25°C, f = 1MHz, V_CC= 1.7V – 3.6V.

Symbol Test condition

Max

8

Units

pF

Conditions

C

Input/Output Capacitance (SDA, EVENT)

V

= 0V

I/O

Input Capacitance (A₀, A₁, A₂, SCL)

6

pF

V

IN

Note:

1. This parameter is ensured by characterization only.

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

39

9.

Ordering Code Detail

A T 3 0 T S E 0 0 4 A - M A 5 M - T

Atmel Designator

Product Family

Shipping Carrier Option

B = Bulk (Tubes)

T

= Tape and Reel

Voltage Option

M = 1.7V to 3.6V

30TSE = Digital Temperature Sensor

with Integrated EEPROM

Sensor Type

Device Grade

5

= Green, NiPdAu Lead Finish

Temperature Range

(-20°C to +125°C)

Device Density

4 = 4-kilobit

Package Option

MA = 8-lead, 2.0 x 3.0 x 0.6mm (UDFN)

MAA = 8-lead, 2.0 x 3.0 x 0.8mm (WDFN)

Device Revision

10. Ordering Information

Operating

Voltage

Operational

Ordering Code⁽¹⁾

Package Lead Finish

Max. Frequency

Range

AT30TSE004A-MA5M-T⁽²⁾

AT30TSE004A-MAA5M-T⁽²⁾

8MA2

8MAA

NiPdAu

1.7V to 3.6V

1000kHz

–20C to 125C

Notes: 1. Consistent with the general semiconductor market trend, Atmel will supply devices with either gold or copper

bond wires to increase manufacturing flexibility and ensure a long-term continuity of supply. There is no

difference in product quality, reliability, or performance between the two variations.

2. T = Tape and Reel



UDFN and WDFN= 5,000 per reel

Package Type

8MA2

8MAA

8-lead, 2.0 x 3.0 x 0.6mm, Thermally Enhanced Plastic Ultra Thin Dual Flat No Lead (UDFN)

8-lead, 2.0 x 3.0 x 0.8mm, Thermally Enhanced Plastic Very Very Thin Dual Flat No Lead (WDFN)

40

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

11. Part Markings

AT30TSE004A: Package Marking Information

8-lead UDFN

2.0 x 3.0 mm Body

8-lead WDFN

2.0 x 3.0 mm Body

T8A

5M@

YXX

5M@

YXX

Note 1:

Designates pin 1

Note 2: Package drawings are not to scale

Catalog Number Truncation

AT30TSE004A

Truncation Code ###: T8A

Date Codes

Voltages

Y = Year

2: 2012

3: 2013

4: 2014

5: 2015

M = Month

WW = Work Week of Assembly

% = Minimum Voltage

M: 1.7V min

6: 2016

7: 2017

8: 2018

9: 2019

A: January

B: February

...

02: Week 2

04: Week 4

...

L: December

52: Week 52

Country of Assembly

Lot Number

AAA...A = Atmel Wafer Lot Number

Grade/Lead Finish Material

@ = Country of Assembly

5: Industrial

(-20°C to 125°C)

NiPdAu

Trace Code

Atmel Truncation

XX = Trace Code (Atmel Lot Numbers Correspond to Code)

Example: AA, AB.... YZ, ZZ

AT: Atmel

ATM: Atmel

ATML: Atmel

3/8/13

TITLE

DRAWING NO.

REV.

30TSE004ASM, AT30TSE004A Package Marking Information

30TSE004A

A

Package Mark Contact:

DL-CSO-Assy_eng@atmel.com

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

41

12. Package Drawings

12.1 8MA2 — 8-pad UDFN

E

1

8

7

6

5

Pin 1 ID

2

3

4

D

C

TOP VIEW

E2

SIDE VIEW

A2

A

A1

b (8x)

8

1

2

3

4

COMMON DIMENSIONS

(Unit of Measure = mm)

7

6

5

Pin#1 ID

D2

MIN

0.50

MAX

0.60

NOM

0.55

NOTE

SYMBOL

A

A1

A2

D

0.0

-

0.02

-

0.05

0.55

2.10

1.60

3.10

1.40

0.30

e (6x)

L (8x)

BOTTOM VIEW

K

1.90

1.40

2.90

1.20

0.18

2.00

D2

E

1.50

3.00

Notes:

1. This drawing is for general information only. Refer to

Drawing MO-229, for proper dimensions, tolerances,

datums, etc.

E2

b

1.30

0.25

3

2. The Pin #1 ID is a laser-marked feature on Top View.

3. Dimensions b applies to metallized terminal and is

measured between 0.15 mm and 0.30 mm from the

terminal tip. If the terminal has the optional radius on

the other end of the terminal, the dimension should

not be measured in that radius area.

C

1.52 REF

0.35

L

0.30

0.20

0.40

-

e

0.50 BSC

-

K

4. The Pin #1 ID on the Bottom View is an orientation

feature on the thermal pad.

11/26/14

TITLE

DRAWING NO.

REV.

GPC

8MA2, 8-pad 2 x 3 x 0.6mm Body, Thermally

YNZ

8MA2

G

Package Drawing Contact:

packagedrawings@atmel.com

Enhanced Plastic Ultra Thin Dual Flat No-Lead

Package (UDFN)

42

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

12.2 8MAA — 8-pad WDFN

TOP VIEW

BOTTOM VIEW

A

D2

b

(8X)

Pin 1

Index

Area

E2

E

Pin 1 ID

L (8X)

D

e (6X)

A2

A1

1.50 REF.

A3

COMMON DIMENSIONS

(Unit of Measure = mm)

SIDE VIEW

MIN

0.70

MAX

0.80

NOM

0.75

NOTE

SYMBOL

A

A1

A2

A3

D

0.00

0.45

0.02

0.55

2.0 REF

2.00

-

0.05

0.65

1.90

1.20

2.90

1.20

0.18

0.30

2.10

1.60

3.10

1.60

0.30

0.45

D2

E

3.00

-

Notes:

1. This drawing is for general information only. Refer to JEDEC

Drawing MO-229, WCED-3, for proper dimensions,

E2

b

tolerances, datums, etc.

0.25

–

2

2. Dimension b applies to metallized terminal and is measured

between 0.15 mm and 0.30 mm from the terminal tip. If the

terminal has the optional radius on the other end of the terminal,

the dimension should not be measured in that radius area.

3. Soldering the large thermal pad is optional, but not recommended.

No electrical connection is accomplished to the device through

this pad, so if soldered it should be tied to ground

L

e

0.50 BSC

09/11/12

TITLE

DRAWING NO.

REV.

GPC

8MAA, 8-pad 2.0 x 3.0mm Body, 0.50mm Pitch

Very, Very Thin Dual No Lead Package

(WDFN) (Sawn)

YRV

8MAA

A

Package Drawing Contact:

packagedrawings@atmel.com

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

43

13. Revision History

Doc. Rev.

Date

Comments

Updated the Set Page Address and Read Page Address Commands, AC Characteristics

table, and the 8MA2 package drawing.

8868D

10/2015

8868C

8868B

8868A

12/2013

07/2013

04/2013

Updated Section, “Power-up Conditions” and Figure, “Power-up Timing”.

Updated the Absolute Maximum Ratings.

Initial document release.

FunctionZZ_Summary Notes

44

AT30TSE004A [DATASHEET]

Atmel-8868D-DTS-AT30TSE004A-Datasheet_102015

X X

X X X X

Atmel Corporation

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T: (+1)(408) 441.0311

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型号：	AT30TSE004A-MA5M-T
厂家：	MICROCHIP
描述：	SENSOR TEMPERATURE I2C 8UDFN 输出元件传感器换能器
文件：	总45页 (文件大小：1414K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

AT30TSE004A-MA5M-T [MICROCHIP]

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