AON7506 [AOS]

30V N-Channel AlphaMOS; 30V N通道AlphaMOS
AON7506
型号: AON7506
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

30V N-Channel AlphaMOS
30V N通道AlphaMOS

文件: 总6页 (文件大小:330K)
中文:  中文翻译
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AON7506  
30V N-Channel AlphaMOS  
General Description  
Product Summary  
VDS  
30V  
• Latest Trench Power AlphaMOS (αMOS LV) technology  
• Very Low RDS(ON) at 4.5V VGS  
• Low Gate Charge  
• High Current Capability  
• RoHS and Halogen-Free Compliant  
ID (at VGS=10V)  
RDS(ON) (at VGS=10V)  
RDS(ON) (at VGS=4.5V)  
12A  
< 9.8m  
< 15.8 mΩ  
Application  
100% UIS Tested  
100% Rg Tested  
• DC/DC Converters in Computing, Servers, and POL  
• Isolated DC/DC Converters in Telecom and Industrial  
DFN 3x3 EP  
D
Top View  
Top View  
Bottom View  
1
8
2
3
7
6
4
5
G
S
Pin 1  
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
VDS  
Maximum  
Units  
Drain-Source Voltage  
Gate-Source Voltage  
30  
±20  
12  
V
V
VGS  
TC=25°C  
Continuous Drain  
Current G  
ID  
TC=100°C  
9.4  
A
Pulsed Drain Current C  
IDM  
48  
TA=25°C  
TA=70°C  
12  
Continuous Drain  
CurrentG  
IDSM  
A
10.5  
Avalanche Current C  
IAS  
20  
A
mJ  
V
Avalanche energy L=0.05mH C  
EAS  
10  
VDS Spike  
100ns  
VSPIKE  
36  
TC=25°C  
TC=100°C  
TA=25°C  
TA=70°C  
20.5  
PD  
W
Power Dissipation B  
Power Dissipation A  
8
3.1  
2
PDSM  
W
°C  
Junction and Storage Temperature Range  
TJ, TSTG  
-55 to 150  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
30  
60  
5
Max  
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Ambient A D  
Maximum Junction-to-Case  
t
10s  
40  
75  
6
RθJA  
Steady-State  
Steady-State  
RθJC  
Rev0 : July 2012  
www.aosmd.com  
Page 1 of 6  
AON7506  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
30  
V
VDS=30V, VGS=0V  
1
IDSS  
Zero Gate Voltage Drain Current  
µA  
5
TJ=55°C  
VDS=0V, VGS=±20V  
VDS=VGS, ID=250µA  
VGS=10V, ID=12A  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
±100  
2.3  
nA  
V
VGS(th)  
1.3  
1.8  
8
9.8  
mΩ  
RDS(ON)  
Static Drain-Source On-Resistance  
TJ=125°C  
11  
13.5  
15.8  
VGS=4.5V, ID=10A  
VDS=5V, ID=12A  
IS=1A,VGS=0V  
13  
mΩ  
S
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
45  
0.73  
1
V
Maximum Body-Diode Continuous Current G  
12  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
542  
233  
31  
pF  
pF  
pF  
VGS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
VGS=0V, VDS=0V, f=1MHz  
1
2
3
SWITCHING PARAMETERS  
Qg(10V) Total Gate Charge  
9
12.2  
5.8  
nC  
nC  
nC  
nC  
ns  
Qg(4.5V) Total Gate Charge  
4.3  
2.2  
1.7  
4
VGS=10V, VDS=15V, ID=12A  
Qgs  
Qgd  
tD(on)  
tr  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
VGS=10V, VDS=15V, RL=1.25,  
RGEN=3Ω  
3.5  
18  
3
ns  
tD(off)  
tf  
ns  
ns  
trr  
IF=12A, dI/dt=500A/µs  
IF=12A, dI/dt=500A/µs  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
9.7  
ns  
Qrr  
nC  
11.5  
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The  
Power dissipation PDSM is based on R θJA t 10s value and the maximum allowed junction temperature of 150°C. The value in any given  
application depends on the user's specific board design.  
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C. Single pulse width limited by junction temperature TJ(MAX)=150°C.  
D. The RθJA is the sum of the thermal impedance from junction to case RθJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming  
a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.  
G. The maximum current rating is package limited.  
H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev0 : July 2012  
www.aosmd.com  
Page 2 of 6  
AON7506  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
50  
40  
30  
20  
10  
0
50  
40  
30  
20  
10  
0
10V  
VDS=5V  
4.5V  
6V  
4V  
3.5V  
125°C  
25°C  
VGS=3V  
4
0
1
2
3
4
5
6
0
1
2
3
5
VGS(Volts)  
VDS (Volts)  
Fig 1: On-Region Characteristics (Note E)  
Figure 2: Transfer Characteristics (Note E)  
16  
14  
12  
10  
8
1.6  
VGS=4.5V  
VGS=10V  
ID=12A  
1.4  
1.2  
1
VGS=4.5V
VGS=10V  
ID=10A  
6
4
0.8  
0
3
6
9
12  
15  
0
25  
50  
75  
100  
125  
150  
175  
ID (A)  
Temperature (°C)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage (Note E)  
Figure 4: On-Resistance vs. JunctionTemperature  
(Note E)  
25  
20  
15  
10  
5
1.0E+01  
ID=12A  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
125°C  
125°C  
25°C  
25°C  
0
2
4
6
8
10  
0.0  
0.2  
0.4  
VSD (Volts)  
Figure 6: Body-Diode Characteristics (Note E)  
0.6  
0.8  
1.0  
1.2  
VGS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
(Note E)  
Rev0: July 2012  
www.aosmd.com  
Page 3 of 6  
AON7506  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
800  
VDS=15V  
ID=12A  
8
Ciss  
600  
400  
200  
0
6
Coss  
4
2
Crss  
0
0
2
4
6
8
10  
0
5
10  
15  
20  
25  
30  
Qg (nC)  
VDS (Volts)  
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
150  
100  
50  
100.0  
10.0  
1.0  
TJ(Max)=150°C  
TC=25°C  
10µs  
RDS(ON)  
limited  
100µs  
1ms  
100ms  
DC  
TJ(Max)=150°C  
TC=25°C  
0.1  
0.0  
0
0.01  
0.1  
1
10  
100  
0.0001  
0.001  
0.01  
0.1  
1
10  
VDS (Volts)  
Pulse Width (s)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
Figure 10: Single Pulse Power Rating Junction-to-Case  
(Note F)  
10  
1
D=Ton/T  
TJ,PK=TC+PDM.ZθJC.RθJC  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
RθJC=6°C/W  
PD  
0.1  
Single Pulse  
Ton  
T
0.01  
1E-05  
0.0001  
0.001  
0.01  
Pulse Width (s)  
0.1  
1
10  
100  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Rev0: July 2012  
www.aosmd.com  
Page 4 of 6  
AON7506  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
20  
15  
10  
5
30  
25  
20  
15  
10  
5
0
0
0
25  
50  
75  
100  
125  
150  
0
25  
50  
TCASE (°C)  
Figure 13: Current De-rating (Note F)  
75  
100  
125  
150  
TCASE (°C)  
Figure 12: Power De-rating (Note F)  
10000  
1000  
100  
10  
TA=25°C  
1
1E-05  
0.001  
0.1  
Pulse Width (s)  
Figure 14: Single Pulse Power Rating Junction-to-Ambient (Note H)  
10  
1000  
10  
1
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
D=Ton/T  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJA=75°C/W  
0.1  
PD  
0.01  
Single Pulse  
0.01  
Ton  
T
0.001  
1E-05  
0.0001  
0.001  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 15: Normalized Maximum Transient Thermal Impedance (Note H)  
Rev0: July 2012  
www.aosmd.com  
Page 5 of 6  
AON7506  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
td(on)  
t
r
td(off)  
t
f
ton  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
EAR= 1/2 LIA2R  
BVDSS  
Vds  
Id  
Vgs  
Vds  
+
Vgs  
Vdd  
I AR  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode Recovery Test Circuit & Waveforms  
Qrr = - Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
trr  
L
Isd  
I F  
Isd  
Vgs  
dI/dt  
I RM  
+
Vdd  
VDC  
Vdd  
-
Vds  
Rev0: July 2011  
www.aosmd.com  
Page 6 of 6  

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