TSL2571 [AMSCO]

LIGHT-TO-DIGITAL CONVERTER; 光 - 数字转换器
TSL2571
型号: TSL2571
厂家: AMS(艾迈斯)    AMS(艾迈斯)
描述:

LIGHT-TO-DIGITAL CONVERTER
光 - 数字转换器

转换器
文件: 总25页 (文件大小:706K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TAOS Inc.  
is now  
ams AG  
The technical content of this TAOS datasheet is still valid.  
Contact information:  
Headquarters:  
ams AG  
Tobelbaderstrasse 30  
8141 Unterpremstaetten, Austria  
Tel: +43 (0) 3136 500 0  
e-Mail: ams_sales@ams.com  
Please visit our website at www.ams.com  
TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
r
r
TAOS117A − FEBRUARY 2011  
PACKAGE FN  
DUAL FLAT NO-LEAD  
(TOP VIEW)  
Features  
D Ambient Light Sensing (ALS)  
− Approximates Human Eye Response  
− Programmable Analog Gain  
6 SDA  
5 INT  
4 NC  
VDD  
1
− Programmable Integration Time  
− Programmable Interrupt Function with  
Upper and Lower Threshold  
SCL 2  
GND 3  
− Resolution Up to 16 Bits  
− Very High Sensitivity — Operates Well  
Behind Darkened Glass  
− Up to 1,000,000:1 Dynamic Range  
Applications  
D Programmable Wait Timer  
− Programmable from 2.72 ms  
to > 8 Seconds  
D Display Management  
D Backlight Control  
− Wait State — 65 mA Typical Current  
D Portable Device Power Optimization  
D Cell Phones, PDA, GPS  
D Notebooks and Monitors  
D LCD TVs  
2
D I C Interface Compatible  
2
− Up to 400 kHz (I C Fast Mode)  
− Dedicated Interrupt Pin  
D Small 2 mm 2 mm ODFN Package  
D Sleep Mode — 2.5 mA Typical Current  
Description  
The TSL2571 family of devices provides ambient light sensi(ALS) that approximates human eye response  
to light intensity under a variety of liging onditions and ough a variety of attenuation materials. While useful  
for general purpose light sensing, he device is particularly useful for display management with the purpose of  
extending battery life and proving optimum viewing n diverse lighting conditions. Display panel and keyboard  
backlighting can account for u30 to 40 percent of otal platform power. The ALS features are ideal for use  
in notebook PCs, LCD monitors, flat-panel teles, and cell phones.  
Functional Block Diagram  
Interrupt  
INT  
GND  
Wait Control  
Upper Limit  
Lower Limit  
CH0  
ADC  
CH0  
Data  
V
DD  
SCL  
SDA  
ALS Control  
CH0  
CH1  
ADC  
CH1  
Data  
CH1  
Copyright E 2011, TAOS Inc.  
The LUMENOLOGY r Company  
Texas Advarnced Optoelectronic Solutions Inc.  
1001 Klein Road S Suite 300 S Plano, TX 75074 S (972) 673-0759  
www.taosinc.com  
1
TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
Detailed Description  
The TSL2571 light-to-digital device includes on-chip photodiodes, integrating amplifiers, ADCs, accumulators,  
2
clocks, buffers, comparators, a state machine, and an I C interface. The device combines one photodiode  
(CH0), which is responsive to both visible and infrared light, and one photodiode (CH1), which is responsive  
primarily to infrared light. Two integrating ADCs simultaneously convert the amplified photodiode currents into  
a digital value providing up to 16 bits of resolution. Upon completion of the conversion cycle, the conversion  
result is transferred to the data registers. This digital output can be read by a microprocessor through which the  
illuminance (ambient light level) in lux is derived using an empirical formula to approximate the human eye  
response.  
2
Communication to the device is accomplished through a fast (up to 400 kHz), two-wire I C serial bus for eas
connection to a microcontroller or embedded controller. The digital output of the device is inherently more  
immune to noise when compared to an analog interface.  
The device provides a separate pin for level-style interrupts. When interrupts are enabled and a pre-st value  
is exceeded, the interrupt pin is asserted and remains asserted until cleared by the controlling firmware. The  
interrupt feature simplifies and improves system efficiency by eliminating the need to poll a sensor for a light  
intensity value. An interrupt is generated when the value of an ALS conversion exceeds eithean upper or lower  
threshold. In addition, a programmable interrupt persistence feature allows the user to determine how many  
consecutive exceeded thresholds are necessary to trigger an interrupt. Interrupt threholds and persistence  
settings are configured independently.  
Copyright E 2011, TAOS Inc.  
The LUMENOLOGY r Company  
r
r
2
www.taosinc.com  
TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
Terminal Functions  
TERMINAL  
TYPE  
DESCRIPTION  
Power supply ground. All voltages are referenced to GND.  
NAME  
GND  
INT  
NO.  
3
5
O
Interrupt — open drain (active low).  
NC  
4
Do not connect.  
2
2
SCL  
SDA  
2
I
I C serial clock input terminal — clock signal for I C serial data.  
2
2
6
I/O  
I C serial data I/O terminal — serial data I/O for I C .  
Supply voltage.  
V
1
DD  
Available Options  
DEVICE  
TSL25711  
TSL25713  
ADDRESS  
PACKAGE − LEADS  
INTERFACE DESCRIPTION  
ORDERING NUMBER  
TSL25711FN  
2
0x39  
0x39  
0x29  
0x29  
FN−6  
FN−6  
FN−6  
FN−6  
I C Vbus = V Interface  
DD  
2
I C Vbus = 1.8 V Interface  
TSL25713FN  
TSL25715  
C Vbus = V Interface  
TSL25715FN  
DD  
2
TSL25717  
I C b= 1.8 V Interface  
TSL25717FN  
Contact TAOS for availability.  
Absolute Maximum Ratings over operating free-air temperaure range (unless otherwise noted)†  
Supply voltage, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.8 V  
DD  
Digital output voltage range, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 V to 3.8 V  
O
Digital output current, I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −1 mA to 20 mA  
O
Storage temperature range, T  
ESD tolerance, human body mel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2000 V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 85°C  
stg  
Stresses beyond those listed under “absolutmaximum ratings” use permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditioyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditionfor extended periods may affect device reliability.  
NOTE 1: All voltages are with respect to GND.  
Recommended Operating Condins  
MIN NOM  
MAX  
3.6  
UNIT  
V
Supply voltage, V  
2.6  
3
DD  
Operating free-air temperature, T  
−30  
70  
°C  
A
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The LUMENOLOGY r Company  
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3
TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
Operating Characteristics, VDD = 3 V, TA = 25C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
175  
65  
MAX  
UNIT  
Active  
Wait mode  
250  
I
Supply current  
μA  
DD  
2
Sleep mode — no I C activity  
3 mA sink current  
2.5  
4
0.4  
0.6  
5
0
0
V
I
INT, SDA output low voltage  
V
OL  
6 mA sink current  
Leakage current, SDA, SCL, INT pins  
−5  
μA  
LEAK  
TSL25711, TSL25715  
TSL25713, TSL25717  
TSL25711, TSL25715  
TSL25713, TSL25717  
0.7 V  
DD  
V
SCL, SDA input high voltage  
SCL, SDA input low voltage  
V
V
IH  
IL  
1.25  
0.3 V  
DD  
V
0.54  
ALS Characteristics, VDD = 3 V, TA = 25C, Gain = 16, AEN = 1 (unless otherwise noted)  
(Notes 1 ,2, 3)  
PARAMETER  
TEST CONDITIONS  
CHANNEL  
CH0  
MIN  
TYP  
MAX  
5
UNIT  
0
E = 0, AGAIN = 120×,  
e
Dark ADC count value  
counts  
ATIME = 0xDB (100 ms)  
CH1  
1
5
ADC integration time step size  
ADC Number of integration steps  
ADC counts per step  
ATIME = 0xFF  
258  
1
2.72  
2.9  
256  
ms  
steps  
ATIME = 0xFF  
ATIME = 0xC0  
0
1024 counts  
65535 counts  
6000  
ADC count value  
0
2
C0  
CH1  
CH0  
CH1  
4000  
5000  
790  
λ = 625 nm, 11.6 μW/cm ,  
p
ATIME = 0F6 (27 ms) See note 2.  
ADC count value  
counts  
6000  
2
4000  
5000  
2800  
λ = 850 m, E = 219.7 μW/cm ,  
p
e
ATIM= 0xF6 (27 ms) See o3.  
λ 625 nm, ATIME = 0xF6 27 ms) See note 2.  
10.8  
41  
15.8  
56  
20.8  
%
p
ADC count value ratio: CH1/CH0  
Irradiance responsivity  
λ 850 nm, ATIME (27 ms) See note 3.  
68  
CH0  
29.1  
4.6  
λ = 625 nm, ATIME = 6 (27 ms)  
p
counts/  
See note 2.  
CH1  
CH0  
CH1  
(μW/  
R
e
22.8  
12.7  
2
λ = 80 nm, ATIME = 0xF6 (27 ms)  
p
cm )  
See note .  
8×  
16×  
12×  
−10  
10  
Gain scaling, relative to 1× gain  
−10  
−10  
10  
10  
%
setting  
NOTES: 1. Optical measurements are mde using small-angle incident radiation from light-emitting diode optical sources. Visible 625 nm LEDs  
and infrared 850 nm LEDare sed for final product testing for compatibility with high-volume production.  
2. The 625 nm irradiancE is upplied by an AlInGaP light-emitting diode with the following typical characteristics: peak wavelength  
e
λp = 625 nm and spectrl halfwidth Δλ½ = 20 nm.  
3. The 850 nm rdiane E is supplied by a GaAs light-emitting diode with the following typical characteristics: peak wavelength  
e
λp = 850 nm anspectral halfwidth Δλ½ = 42 nm.  
Copyright E 2011, TAOS Inc.  
The LUMENOLOGY r Company  
r
r
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www.taosinc.com  
 
TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
Wait Characteristics, VDD = 3 V, TA = 25C, WEN = 1 (unless otherwise noted)  
PARAMETER  
Wait step size  
Wait number of integration steps  
TEST CONDITIONS  
WTIME = 0xFF  
CHANNEL  
MIN  
2.58  
1
TYP  
MAX  
2.9  
UNIT  
ms  
2.72  
256  
steps  
AC Electrical Characteristics, VDD = 3 V, TA = 25C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
0
TYP  
MAX  
UNIT  
kHz  
μ
2
f
t
Clock frequency (I C only)  
400  
(SCL)  
(BUF)  
Bus free time between start and stop condition  
1.3  
Hold time after (repeated) start condition. After  
this period, the first clock is generated.  
t
0.6  
s  
(HDSTA)  
t
t
t
t
t
t
t
t
Repeated start condition setup time  
Stop condition setup time  
Data hold time  
0.6  
0.6  
μs  
μs  
μs  
ns  
μs  
μs  
ns  
ns  
pF  
(SUSTA)  
(SUSTO)  
(HDDAT)  
(SUDAT)  
(LOW)  
(HIGH)  
F
Data setup time  
10  
1.3  
0.6  
SCL clock low period  
SCL clock high period  
Clock/data fall time  
300  
300  
10  
Clock/data rise time  
Input pin capacitance  
R
C
i
Specified by design and characterization; not production tested.  
PARAMETER MEASUREMENT INFORMATION  
t
t
(R)  
(LOW)  
V
IH  
SCL  
SDA  
V
IL  
t
t
t
(HDSTA)  
(HIGH)  
(SUSTA)  
t
t
t
(SUSTO)  
t
(BUF)  
(HDDA
(SUDAT)  
V
V
IH  
IL  
P
S
S
P
Stop  
Condition  
Stt  
Condtion  
Start  
Stop  
t
(LOWSEXT)  
SCL  
SCL  
ACK  
ACK  
t
t
t
(LOWMEXT)  
(LOWMEXT)  
(LOWMEXT)  
SCL  
SDA  
Figure 1. Timing Diagrams  
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TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
TYPICAL CHARACTERISTICS  
SPECTRAL RESPONSIVITY  
NORMALIZED IDD  
vs.  
VDD and TEMPERATURE  
110%  
108%  
106%  
104%  
102%  
1
0.8  
0.6  
0.4  
0.2  
Ch 0  
75C  
50C  
25C  
100%  
98%  
96%  
4%  
92%  
0C  
Ch 1  
0
2.7  
2.8  
2.9  
3
3.1  
3.2  
3.3  
300 400 500 600 700 800 900 1000 1100  
V
— V  
λ − Wavelength − nm  
DD  
Figure 2  
Figure 3  
NORMALIZED RESPONSIVITY  
vs.  
ANGULAR DICEMENT  
1.0  
0.8  
0.6  
0.4  
0.2  
0
-Q  
−30  
+Q  
30  
90  
−90  
−60  
0
60  
Q − Angular Displacement − °  
Figure 4  
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TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
PRINCIPLES OF OPERATION  
System State Machine  
The device provides control of ALS and power management functionality through an internal state machine  
(Figure 5). After a power-on-reset, the device is in the sleep mode. As soon as the PON bit is set, the device  
will move to the start state. It will then continue through the Wait and ALS states. If these states are enabled,  
the device will execute each function. If the PON bit is set to 0, the state machine will continue until all  
conversions are completed and then go into a low power sleep mode.  
Sleep  
PON = 1 (r0:b0)  
PON = 0 (r0:b0)  
Start  
Wait  
ALS  
Figure 5. Simpd State Diagram  
NOTE: In this document, the nomenclature uses thbit field name in talic followed by the register number and  
bit number to allow the user to easily identify the register and bit hat controls the function. For example, the  
power on (PON) is in register 0, bit 0. This rpresented as ON (0:b0).  
Photodiodes  
Conventional silicon detectors espond strongly to inrarelight, which the human eye does not see. This can  
lead to significant error when thfrared content of the ambient light is high (such as with incandescent lighting)  
due to the difference between the silicon detesponse and the brightness perceived by the human eye.  
This problem is overcome through the usof two photodiodes. The channel 0 photodiode, referred to as the  
CH0 channel, is sensitive to both visible and inrared light, while the channel 1 photodiode, referred to as CH1,  
is sensitive primarily to infrared lighTwo integrating ADCs convert the photodiode currents to digital outputs.  
The ADC digital outputs from the two hannels are used in a formula to obtain a value that approximates the  
human eye response in units olu
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TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
ALS Operation  
The ALS engine contains ALS gain control (AGAIN) and two integrating analog-to-digital converters (ADC) for  
the Channel 0 and Channel 1 photodiodes. The ALS integration time (ATIME) impacts both the resolution and  
the sensitivity of the ALS reading. Integration of both channels occurs simultaneously and upon completion of  
the conversion cycle, the results are transferred to the data registers (C0DATA and C1DATA). This data is also  
referred to as channel count. The transfers are double-buffered to ensure data integrity.  
ATIME(r1)  
2.72 ms to 696 ms  
C0DATAH(r0x15), C0DATA(r0x14)  
C1DATAH(r0x17), C1DATA(r0x16)  
CH0  
ALS  
CH0  
Data  
ALS Control  
CH0  
CH1  
ADC  
CH1  
Data  
CH1  
AGAIN(r0x0F, b1:0)  
1, 8, 16, 120Gain  
Figure 6. ALS Operation  
The registers for programming the integration and wait mes are a 2’s compliment values. The actual time can  
be calculated as follows:  
ATIME = 256 − Integratn Time / 2.72 ms  
Inversely, the time can be calculated from the register value fows:  
Integration Time = 272 ms × (256 − ATIME)  
In order to reject 50/60-Hz ripple trongly present in luorescent lighting, the integration time needs to  
be programmed in multiples of 10 .3 ms or the hcyle time. Both frequencies can be rejected with a  
programmed value of 50 ms (ATIME = 0xED) or ms of 50 ms (i.e. 100, 150, 200, 400, 600).  
The registers for programming the AGAIN hold a two-bit value representing a gain of 1×, 8×, 16×, or 120×. The  
gain, in terms of amount of gain, will be represented by the value AGAINx, i.e. AGAINx = 1, 8, 16, or 120.  
Lux Equation  
The lux calculation is a function of Cchannel count (C0DATA), CH1 channel count (C1DATA), ALS gain  
(AGAINx), and ALS integration ime n milliseconds (ATIME_ms). If an aperture, glass/plastic, or a light pipe  
attenuates the light equally aross the spectrum (300 nm to 1100 nm), then a scaling factor referred to as glass  
attenuation (GA) can be used o compensate for attenuation. For a device in open air with no aperture or  
glass/plastic above the evice, GA = 1. If it is not spectrally flat, then a custom lux equation with new coefficients  
should be generated. (See TAOS application note).  
Counts per Lux (CPL) needs to be calculated only when ATIME or AGAIN is changed, otherwise it remains a  
constant. Thfirssegment of the equation (Lux1) covers fluorescent and incandescent light. The second  
segment (Lux2) covers dimmed incandescent light. The final lux is the maximum of Lux1, Lux2, or 0.  
PL = (ATIME_ms × AGAINx) / (GA × 53)  
Lux1 = (C0DATA − 2 × C1DATA) / CPL  
Lux2 = (0.6 × C0DATA − C1DATA) / CPL  
Lux = MAX(Lux1, Lux2, 0)  
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TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
Interrupts  
The interrupt feature simplifies and improves system efficiency by eliminating the need to poll the sensor for  
light intensity values outside of a user-defined range. While the interrupt function is always enabled and it’s  
status is available in the status register (0x13), the output of the interrupt state can be enabled using the ALS  
interrupt enable (AIEN) field in the enable register (0x00).  
Two 16-bit interrupt threshold registers allow the user to set limits below and above a desired light level range.  
An interrupt can be generated when the ALS CH0 data (C0DATA) falls outside of the desired light level  
range, as determined by the values in the ALS interrupt low threshold registers (AILTx) and ALS interrupt hig
threshold registers (AIHTx). It is important to note that the low threshold value must be less than the high  
threshold value for proper operation.  
To further control when an interrupt occurs, the device provides a persistence filter. The persistence flteallows  
the user to specify the number of consecutive out-of-range ALS occurrences before an interrupt s gerated.  
The persistence register (0x0C) allows the user to set the ALS persistence (APERS) value. See the persistence  
register for details on the persistence filter values. Once the persistence filter generates an interrupt, it will  
continue until a special function interrupt clear command is received (see command regiter).  
AIHTH(r07), AIHT(r06)  
APERS(r0x0C3:0)  
Upper Limi
ALS Perstene  
CH0  
ADC  
CH0  
Data  
LoweLimit  
CH0  
AILTH(r05), AILTL(r0
Figre 7. Programmable Interrupt  
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TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
State Diagram  
Figure 8 shows a more detailed flow for the state machine. The device starts in the sleep mode. The PON bit  
is written to enable the device. A 2.72-ms delay will occur before entering the start state.  
If the WEN bit is set, the state machine will then cycle through the wait state. If the WLONG bit is set, the wait  
cycles are extended by 12× over normal operation. When the wait counter terminates, the state machine will  
step to the ALS state.  
The AEN should always be set. In this case, a minimum of 1 integration time step should be programmed. The  
ALS state machine will continue until it reaches the terminal count at which point the data will be latched in  
the ALS register and the interrupt set, if enabled.  
1 to 256 steps  
Sleep  
Step: 2.72 ms  
Time: 2.72 ms − 696 ms  
120 Hz Minimum − 8 ms  
100 Hz Minimum − 10 ms  
PON = 1  
PON = 0  
Start  
ALS  
LS  
Check  
ALS  
Delay  
AEN = 1  
Wait  
Check  
2.72 ms  
WEN = 1  
Wait  
WLONG = 0  
1 to 256 steps  
Step: 2.72 ms  
WLNG = 1  
o 256 steps  
p: 32.64 ms  
Time: 2.72 ms − 696 ms  
Minimum − 2.72 ms  
Time: 32.64 ms − 8.35 s  
Minimum − 32.64 ms  
Figure . Expanded State Diagram  
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TSL2571  
LIGHT-TO-DIGITAL CONVERTER  
TAOS117A − FEBRUARY 2011  
I2C Protocol  
2
Interface and control are accomplished through an I C serial compatible interface (standard or fast mode) to  
a set of registers that provide access to device control functions and output data. The devices support the 7-bit  
2
I C addressing protocol.  
2
The I C standard provides for three types of bus transaction: read, write, and a combined protocol (Figure 17).  
During a write operation, the first byte written is a command byte followed by data. In a combined protocol, the  
first byte written is the command byte followed by reading a series of bytes. If a read command is issued, the  
register address from the previous command will be used for data access. Likewise, if the MSB of the comman
is not set, the device will write a series of bytes at the address stored in the last valid command with a register  
address. The command byte contains either control information or a 5-bit register address. The control  
commands can also be used to clear interrupts.  
2
2
The I C bus protocol was developed by Philips (now NXP). For a complete description of the I C protoclease  
2
review the NXP I C design specification at http://www.i2c−bus.org/references/.  
A
N
P
R
S
S
W
Acknowledge (0)  
Not Acknowledged (1)  
Stop Condition  
Read (1)  
Start Condition  
Repeated Start Condition  
Write (0)  
... Continuation of protocol  
Master-to-Slave  
Slave-to-Master  
1
7
1
1
8
1
8
1
1
...  
...  
S
Slave Address  
W
A
Command Code  
Data Byte  
A
P
2
I C Write Protocol  
1
7
1
1
1
8
1
1
S
Slave Address  
R
A
Data  
A
Data  
A
P
2
I C Read Protocol  
1
7
1
1
8
1
1
7
1
1
S
Slave Addres  
W
A
Command Code  
A
S
Slave Address  
R
A
8
1
8
1
1
...  
Data  
A
Data  
A
P
2
I C Read Protocol — Combined Format  
2
Figure 9. I C Protocols  
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Register Set  
The device is controlled and monitored by data registers and a command register accessed through the serial  
interface. These registers provide for a variety of control functions and can be read to determine results of the  
ADC conversions. The register set is summarized in Table 1.  
Table 1. Register Address  
ADDRESS  
−−  
RESISTER NAME  
COMMAND  
ENABLE  
ATIME  
R/W  
W
REGISTER FUNCTION  
Specifies register address  
RESET VALUE  
0x00  
0x00  
0xFF  
0xFF  
0x0  
x0
0x00  
0x00  
0x00  
0x00  
0x00  
ID  
0x00  
0x01  
0x03  
0x04  
0x05  
0x06  
0x07  
0x0C  
0x0D  
0x0F  
0x12  
0x13  
0x14  
0x15  
0x16  
0x17  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R/W  
R
Enables states and interrupts  
ALS ADC time  
WTIME  
Wait time  
AILTL  
ALS interrupt low threshold low byte  
ALS interrupt low threshold high byte  
ALS interrupt high threshold low byte  
ALS interrupt high threshold high byte  
Interrupt persistence filters  
Configuration  
AILTH  
AIHTL  
AIHTH  
PERS  
CONFIG  
CONTROL  
ID  
Control register  
Device ID  
STATUS  
C0DATA  
C0DATAH  
C1DATA  
C1DATAH  
R
Device status  
0x00  
0x00  
0x00  
0x00  
0x00  
R
CH0 ADC low data rester  
CH0 ADC high data register  
CH1 ADC odaa register  
CH1 ADhigh data register  
R
R
R
2
The mechanics of accessing a specc register depends n the specific protocol used. See the section on I C  
protocols on the previous pages. general, the CMAND register is written first to specify the specific  
control/status register for following read/write opera
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Command Register  
The command registers specifies the address of the target register for future write and read operations.  
Table 2. Command Register  
7
6
5
4
3
2
ADD  
1
0
COMMAND  
− −  
COMMAND  
TYPE  
FIELD  
COMMAND  
TYPE  
BITS  
7
DESCRIPTION  
Select Command Register. Must write as 1 when addressing COMMAND register.  
Selects type of transaction to follow in subsequent data transfers:  
6:5  
FIELD VALUE  
DESCRIPTION  
00  
01  
10  
11  
Repeated byte protocol transaction  
Auto-increment protocol transaction  
Reserved — Do not use  
Special function — See description belw  
Transaction type 00 will repeatedly read thsame register with each ta acess.  
Transaction type 01 will provide an aut-increment function to read succssive register bytes.  
ADD  
4:0  
Address register/special function field. Dependg on the transacion type, see above, this field either  
specifies a special function command or elecs the specific contrtats-register for following write and  
read transactions. The field valisted below apply only to special function commands:  
FIELD VALUE  
00000  
DESRIPTION  
Nrml — no action  
S interrupt clear  
00110  
other  
eserved — do not write  
ALS interrupt cler — lears any pendinLS iterupt. This special function is self clearing.  
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Enable Register (0x00)  
The ENABLE register is used to power the device on/off, enable functions, and interrupts.  
Table 3. Enable Register  
7
6
5
4
3
2
1
0
Address  
0x00  
Reserved  
AIEN  
WEN  
Reserved  
AEN  
PON  
ENABLE  
FIELD  
Reserved  
AIEN  
BITS  
7:5  
4
DESCRIPTION  
Reserved. Write as 0.  
ALS interrupt mask. When asserted, permits ALS interrupts to be generated.  
Wait enable. This bit activates the wait feature. Writing a 1 activates the wait timer. Writing a 0 disables
wait timer.  
WEN  
3
Reserved  
AEN  
2
1
Reserved. Write as 0.  
ALS Enable. Writing a 1 activates the ALS. Writing a 0 disables the ALS.  
Power ON. This bit activates the internal oscillator to permit the timers and ADC hannls to perate.  
Writing a 1 activates the oscillator. Writing a 0 disables the oscillator.  
1
PON  
0
NOTE 1: A minimum interval of 2.72 ms must pass after PON is asserted befe ALn be initiated. This requed time is enforced by the  
hardware in cases where the firmware does not provide it.  
ALS Timing Register (0x01)  
The ALS timing register controls the internal itegrtion time of the ALS ADCs in 2.72-ms increments.  
Tabl4. ALS Timing Rister  
FIELD  
BITS  
DSCRIPTION  
INTEG_CYCLS  
ATIME  
7:0  
VALUE  
0xFF  
0xF6  
TIME  
MAX COUNT  
1024  
2.72 ms  
27.2 ms  
101 ms  
174 ms  
696 ms  
1
37  
64  
256  
10240  
0xDB  
0xC0  
0x00  
37888  
65535  
65535  
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Wait Time Register (0x03)  
Wait time is set 2.72 ms increments unless the WLONG bit is asserted in which case the wait times are 12×  
longer. WTIME is programmed as a 2’s complement number.  
Table 5. Wait Time Register  
FIELD  
BITS  
DESCRIPTION  
TIME (WLONG = 0)  
WTIME  
7:0  
REGISTER VALUE  
WAIT TIME  
TIME (WLONG = 1)  
0.032 sec  
0xFF  
0xB6  
0x00  
1
2.72 ms  
201 ms  
696 ms  
74  
2.4 sec  
256  
8.3 sec  
NOTE: The Wait Time Register should be configured before AEN is asserted.  
ALS Interrupt Threshold Registers (0x04 − 0x07)  
The ALS interrupt threshold registers provides the values to be used as the high and low trigger points for the  
comparison function for interrupt generation. If C0DATA crosses below the low threshold specified, or above  
the higher threshold, an interrupt is asserted on the interrupt pin.  
Table 6. ALS Interrupt Threshold Registers  
REGISTER  
AILTL  
ADDRESS  
0x04  
BITS  
7:0  
DSCRIPTION  
ALS low theshold lower byte  
ALS low threshold upper byt
ALS high threshold loyte  
ALS high threshuppr byte  
AILTH  
0x05  
7:0  
AIHTL  
0x06  
7:0  
AIHTH  
0x07  
7:
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Persistence Register (0x0C)  
The persistence register controls the filtering interrupt capabilities of the device. Configurable filtering is  
provided to allow interrupts to be generated after each ADC integration cycle or if the ADC integration has  
produced a result that is outside of the values specified by threshold register for some specified amount of time.  
ALS interrupts are generated using C0DATA.  
Table 7. Persistence Register  
7
6
5
4
3
2
1
0
Address  
0x0C  
PERS  
FIELD  
Reserved  
APERS  
BITS  
7:4  
DESCRIPTION  
Reserved  
APERS  
Reserved  
Interrupt persistence. Controls rate of interrupt to the host processor.  
3:0  
FIELD VALUE  
0000  
0001  
0010  
0011  
MEANING  
INTERRUPT PERSISTENCE FUNCTON  
Every ALS cycle generates an interrupt  
Every  
1
1 value outside of threshold range  
2 consecute valus out of range  
3 consecue valueout of range  
5 cecutive values out of range  
10 cutie values out of ge  
15 conecutive values out rang
20 consecutive values oof rage  
2consecutive valout orange  
30 consecute vals ot of range  
35 consecutive alues out of range  
40 conscutivvalues out of range  
45 consective values out of range  
5cutive values out of range  
55 consecutive values out of range  
6consecutive values out of range  
2
3
0100  
0101  
0110  
5
10  
15  
20  
25  
30  
5  
40  
45  
50  
55  
60  
0111  
1000  
1001  
1010  
1011  
1100  
1101  
1110  
1111  
Configuration Register (0x0D)  
The configuration register sets he wait long time.  
Table 8. Configuration Register  
7
5
4
3
2
1
0
Address  
0x0D  
CONFIG  
FIELD  
WLONG  
Reserved  
Reserved  
BTS  
DESCRIPTION  
Reserved  
WOG  
Reserved  
7:2  
Reserved. Write as 0.  
Wait Long. When asserted, the wait cycles are increased by a factor 12× from that programmed in the  
1
0
WTIME register.  
Reserved. Write as 0.  
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Control Register (0x0F)  
The Control register provides eight bits of miscellaneous control to the analog block. These bits typically control  
functions such as gain settings and/or diode selection.  
Table 9. Control Register  
7
6
5
4
3
2
1
0
Address  
0x0F  
CONTROL  
Reserved  
AGAIN  
FIELD  
Reserved  
AGAIN  
BITS  
7:2  
DESCRIPTION  
Reserved. Write bits as 0  
ALS Gain Control.  
FIELD VALUE  
1:0  
ALS GAIN VALUE  
00  
01  
10  
11  
1× gain  
8× gain  
16× gain  
120× gain  
ID Register (0x12)  
The ID Register provides the value for the part nuber. The ID registeis a read-only register.  
Table 10. ID Register  
7
6
5
4
3
2
1
0
Address  
0x12  
ID  
ID  
FIELD  
BITS  
DESCRIPTION  
0x04 = TSL25711 & TSL25715  
0x0D = TSL25713 & TSL25717  
ID  
7:0  
Part number identification  
Status Register (0x13)  
The Status Register provides the rnal status of the device. This register is read only.  
Table 11. Status Register  
7
6
5
4
3
2
1
0
Address  
0x13  
STATUS  
FIELD  
Rserved  
AINT  
Reserved  
AVALID  
BIT  
75  
4
DESCRIPTION  
Reserved  
AINT  
Reserved. Write as 0.  
ALS Interrupt. Indicates that the device is asserting an ALS interrupt.  
Reserved.  
eserve
ALID  
3:1  
0
ALS Valid. Indicates that the ALS CH0 / CH1 channels have completed an integration cycle.  
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ADC Channel Data Registers (0x14 − 0x17)  
ALS data is stored as two 16−bit values. To ensure the data is read correctly, a two−byte read I2C transaction  
should be used with auto increment protocol bits set in the command register. With this operation, when the  
lower byte register is read, the upper eight bits are stored in a shadow register, which is read by a subsequent  
read to the upper byte. The upper register will read the correct value even if additional ADC integration cycles  
end between the reading of the lower and upper registers.  
Table 12. ADC Channel Data Registers  
REGISTER  
C0DATA  
ADDRESS  
0x14  
BITS  
7:0  
DESCRIPTION  
ALS CH0 data low byte  
C0DATAH  
C1DATA  
0x15  
7:0  
ALS CH0 data high byte  
ALS CH1 data low byte  
ALS CH1 data high byte  
0x16  
7:0  
C1DATAH  
0x17  
7:0  
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APPLICATION INFORMATION: HARDWARE  
Typical Hardware Application  
A typical hardware application circuit is shown in Figure 10. A 1-μF low-ESR decoupling capacitor should be  
placed as close as possible to the V pin.  
DD  
V
V
BUS  
DD  
V
DD  
R
P
R
P
R
PI  
1 mF  
TSL2571  
INT  
SCL  
SDA  
GND  
Figure 10. Typical Application Hardware Circuit  
2
2
V
BUS  
in Figure 10 refers to the I C bus voltage, which is either V or 1.8 V. Be re to apply the specified I C  
DD  
bus voltage shown in the Available Options table for te specic device being used
2
The I C signals and the Interrupt are open-drain outputs and require pull-up resistors. The pull-up resistor (R )  
P
2
2
value is a function of the I C bus speed, the I C bltage, and the pacitive load. The TAOS EVM running  
at 400 kbps, uses 1.5-kΩ resistors. A 10-kΩ pull-uresistor (R ) can bused for the interrupt line.  
PI  
PCB Pad Layout  
Suggested PCB pad layout guidelins fr the Dual FlaNo-ad (FN) surface mount package are shown in  
Figure 11.  
2500  
Note: Pads can be  
extended further if hand  
soldering is needed.  
1000  
1000  
400  
650  
650  
1700  
400  
NOTES: A. All linear imensions are in micrometers.  
B. Thidrawinis subject to change without notice.  
Figure 11. Suggested FN Package PCB Layout  
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MECHANICAL DATA  
PACKAGE FN  
Dual Flat No-Lead  
TOP VIEW  
466 10  
PIN OUT  
TOP VIEW  
PIN 1  
VDD  
1
SCL 2  
GND 3  
6 SDA  
5 INT  
4 NC  
466  
10  
2000 100  
2000  
100  
Photodiode Array Area  
END VIEW  
SIDE VIEW  
295  
Nomina
650 50  
203 8  
650  
300  
50  
BOTTOM VIEW  
C of Photodiode Array Area  
C
L of Solder Cntats  
L(Note B)  
20 Nomina
140 Nominal  
C
L of Solder Contacts  
of Photodiode Array Area (Note B)  
C
L
PIN 1  
Pb  
750 150  
Lead Free  
NOTES: A. All linear imesions are in micrometers. Dimension tolerance is 20 μm unless otherwise noted.  
B. This centered within the package within a tolerance of 3 mils.  
. Paage top surface is molded with an electrically nonconductive clear plastic compound having an index of refraction of 1.55.  
. Contct finish is copper alloy A194 with pre-plated NiPdAu lead finish.  
E. This package contains no lead (Pb).  
F. This drawing is subject to change without notice.  
Figure 12. Package FN — Dual Flat No-Lead Packaging Configuration  
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MECHANICAL DATA  
TOP VIEW  
2.00 0.05  
1.75  
1.50  
4.00  
4.00  
B
+ 0.30  
8.00  
− 0.10  
3.50 0.05  
1.00  
0.25  
B
A
A
DETAIL A  
DETAIL B  
5Max  
5Max  
0.254  
2.18 0.05  
2.18 0.05  
0.02  
0.83 0.05  
B
o
A
o
K
o
NOTES: A. Alineadimensions are in millimeters. Dimension tolerance is 0.10 mm unless otherwise noted.  
B. The imensions on this drawing are for illustrative purposes only. Dimensions of an actual carrier may vary slightly.  
C. Symbs on drawing A , B , and K are defined in ANSI EIA Standard 481−B 2001.  
o
o
o
DEah reel is 178 millimeters in diameter and contains 3500 parts.  
E. TAOS packaging tape and reel conform to the requirements of EIA Standard 481−B.  
F. In accordance with EIA standard, device pin 1 is located next to the sprocket holes in the tape.  
G. This drawing is subject to change without notice.  
Figure 13. Package FN Carrier Tape  
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MANUFACTURING INFORMATION  
The FN package has been tested and has demonstrated an ability to be reflow soldered to a PCB substrate.  
The solder reflow profile describes the expected maximum heat exposure of components during the solder  
reflow process of product on a PCB. Temperature is measured on top of component. The components should  
be limited to a maximum of three passes through this solder reflow profile.  
Table 13. Solder Reflow Profile  
PARAMETER  
Average temperature gradient in preheating  
Soak time  
REFERENCE  
DEVICE  
2.5°C/sec  
t
2 to 3 minutes  
Max 60 sec  
Max 50 sec  
Max 10 sec  
260°C  
soak  
Time above 217°C (T1)  
t
1
Time above 230°C (T2)  
t
2
Time above T  
−10°C (T3)  
t
peak  
3
Peak temperature in reflow  
T
peak  
Temperature gradient in cooling  
Max −5°C/se
Not to scale — for reference only  
T
peak  
T
3
T
T
2
1
Time (sec)  
t
t
t
3
2
1
t
soak  
Figure 14. Solder Reflow Profile Graph  
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MANUFACTURING INFORMATION  
Moisture Sensitivity  
Optical characteristics of the device can be adversely affected during the soldering process by the release and  
vaporization of moisture that has been previously absorbed into the package. To ensure the package contains  
the smallest amount of absorbed moisture possible, each device is dry-baked prior to being packed for shipping.  
Devices are packed in a sealed aluminized envelope called a moisture barrier bag with silica gel to protect them  
from ambient moisture during shipping, handling, and storage before use.  
The FN package has been assigned a moisture sensitivity level of MSL 3 and the devices should be stored under  
the following conditions:  
Temperature Range  
Relative Humidity  
Total Time  
5°C to 50°C  
60% maximum  
12 months from the date code on the aluminized envelope — if unened  
168 hours or fewer  
Opened Time  
Rebaking will be required if the devices have been stored unopened for more than 12 months or if the aluminized  
envelope has been open for more than 168 hours. If rebaking is required, it should e doe at 50°C for 12 hours.  
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TAOS117A − FEBRUARY 2011  
PRODUCTION DATA — information in this document is current at publication date. Products conform to  
specifications in accordance with the terms of Texas Advanced Optoelectronic Solutions, Inc. standard  
warranty. Production processing does not necessarily include testing of all parameters.  
LEAD-FREE (Pb-FREE) and GREEN STATEMENT  
Pb-Free (RoHS) TAOS’ terms Lead-Free or Pb-Free mean semiconductor products that are compatible with the current  
RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous  
materials. Where designed to be soldered at high temperatures, TAOS Pb-Free products are suitable for use in specified  
lead-free processes.  
Green (RoHS & no Sb/Br) TAOS defines Green to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and  
Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material).  
Important Information and Disclaimer The information provided in this statement represents TAOS’ knowlege and  
belief as of the date that it is provided. TAOS bases its knowledge and belief on information provided by third parties,  
and makes no representation or warranty as to the accuracy of such information. Efforts are underway better integrate  
information from third parties. TAOS has taken and continues to take reasonable steps to proide epresentative  
and accurate information but may not have conducted destructive testing or chemical analysis on comng materials and  
chemicals. TAOS and TAOS suppliers consider certain information to be proprietary, and thCAS numbers and other  
limited information may not be available for release.  
NOCE  
Texas Advanced Optoelectronic Solutions, Inc. (TAOS) reservs the right to make chages to the products contained in this  
document to improve performance or for any other purpose, or to discontinue tem without notice. Customers are advised  
to contact TAOS to obtain the latest product information before placing orders r designing TAOS products into systems.  
TAOS assumes no responsibility for the use f ay products or cicuits scibed in this document or customer product  
design, conveys no license, either expressed oimplied, under any paent or other right, and makes no representation that  
the circuits are free of patent infringement. TAOS further makes no aim as to the suitability of its products for any particular  
purpose, nor does TAOS assume any liility arising out of the se of any product or circuit, and specifically disclaims any  
and all liability, including without limitatconsequential oncidntal damages.  
TEXAS ADVANCED OPTOELECTRONIC SOLUTIONS, IC. PRODUCTS ARE NOT DESIGNED OR INTENDED FOR  
USE IN CRITICAL APPLICATIONS IN WHICH TE FILURE OR MALFUNCTION OF THE TAOS PRODUCT MAY  
RESULT IN PERSONAL INJURY OR DEATH. USE OF TAOS PRODUCTS IN LIFE SUPPORT SYSTEMS IS EXPRESSLY  
UNAUTHORIZED AND ANY SUCH USE BY CUSTOMER IS COMPLETELY AT THE CUSTOMER’S RISK.  
LUMENOLOGY, TAOS, the TAOS logo, and Ts Advanced Optoelectronic Solutions are registered trademarks of Texas Advanced  
Optoelectronic Solutions Incorpoated
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