A63L83361E-7.5 [AMICC]

256K X 36 Bit Synchronous High Speed SRAM with Burst Counter and Flow-through Data Output; 256K X 36位同步高速SRAM突发计数器和流过的数据输出
A63L83361E-7.5
型号: A63L83361E-7.5
厂家: AMIC TECHNOLOGY    AMIC TECHNOLOGY
描述:

256K X 36 Bit Synchronous High Speed SRAM with Burst Counter and Flow-through Data Output
256K X 36位同步高速SRAM突发计数器和流过的数据输出

计数器 存储 静态存储器
文件: 总16页 (文件大小:263K)
中文:  中文翻译
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A63L83361  
256K X 36 Bit Synchronous High Speed SRAM with  
Burst Counter and Flow-through Data Output  
Preliminary  
Document Title  
256K X 36 Bit Synchronous High Speed SRAM with Burst Counter and Flow-  
through Data Output  
Revision History  
Rev. No. History  
Issue Date  
Remark  
0.0  
Initial issue  
July 14, 2005  
Preliminary  
PRELIMINARY (July, 2005, Version 0.0)  
AMIC Technology, Corp.  
A63L83361  
256K X 36 Bit Synchronous High Speed SRAM with  
Burst Counter and Flow-through Data Output  
Preliminary  
Features  
Fast access times: 6.5/7.5/8.0 ns(153/133/117 MHz)  
Single 3.3V±5% power supply  
Synchronous burst function  
Individual Byte Write control and Global Write  
Three separate chip enables allow wide range of  
options for CE control, address pipelining  
Selectable BURST mode  
SLEEP mode (ZZ pin) provided  
Available in 100-pin LQFP package  
Industrial operating temperature range: -45°C to  
+125°C for -I series  
General Description  
The A63L83361 is a high-speed SRAM containing 9M bits  
of bit synchronous memory, organized as 256K words by  
36 bits.  
The A63L83361 combines advanced synchronous  
peripheral circuitry, 2-bit burst control, input registers,  
output buffer and a 256K X 36 SRAM core to provide a  
wide range of data RAM applications.  
The positive edge triggered single clock input (CLK)  
controls all synchronous inputs passing through the  
registers. Synchronous inputs include all addresses (A0 -  
A17), all data inputs (I/O1 - I/O36 ), active LOW chip  
Burst operations can be initiated with either the address  
status processor ( ADSP ) or address status controller  
( ADSC ) input pin. Subsequent burst sequence burst  
addresses can be internally generated by the A63L83361  
and controlled by the burst advance ( ADV ) pin. Write  
cycles are internally self-timed and synchronous with the  
rising edge of the clock (CLK).  
This feature simplifies the write interface. Individual Byte  
enables allow individual bytes to be written. BW1 controls  
I/O1 - I/O9, BW2 controls I/O10 - I/O18, BW3 controls  
I/O19 - I/O27, and BW4 controls I/O28 - I/O36, all on the  
enable ( CE ), two additional chip enables (CE2, CE2 ),  
burst control inputs ( ADSC , ADSP , ADV ), byte write  
enables ( BWE , BW1, BW2 , BW3 , BW4 ) and Global  
Write ( GW ). Asynchronous inputs include output enable  
condition that BWE is LOW. GW LOW causes all bytes  
to be written.  
( OE ), clock (CLK), BURST mode (MODE) and SLEEP  
mode (ZZ).  
PRELIMINARY  
(July, 2005, Version 0.0)  
1
AMIC Technology, Corp.  
A63L83361  
Pin Configuration  
I/O19  
I/O20  
1
80  
79  
I/O18  
2
I/O17  
I/O16  
VCCQ  
GNDQ  
I/O15  
I/O14  
I/O13  
I/O12  
GNDQ  
VCCQ  
I/O11  
I/O10  
GND  
NC  
I/O21  
3
78  
77  
4
VCCQ  
GNDQ  
I/O22  
5
76  
75  
74  
6
7
I/O23  
I/O24  
8
73  
72  
9
I/O25  
GNDQ  
VCCQ  
I/O26  
10  
11  
12  
13  
14  
15  
16  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
I/O27  
NC  
VCC  
NC  
A63L83361E  
VCC  
ZZ  
GND  
I/O28  
17  
18  
I/O8  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
I/O7  
I/O29  
VCCQ  
GNDQ  
VCCQ  
GNDQ  
I/O6  
I/O30  
I/O31  
I/O5  
I/O4  
I/O32  
I/O33  
I/O3  
GNDQ  
GNDQ  
VCCQ  
I/O2  
VCCQ  
I/O34  
I/O35  
I/O36  
I/O1  
I/O9  
PRELIMINARY (July, 2005, Version 0.0)  
2
AMIC Technology, Corp.  
A63L83361  
Block Diagram  
ZZ  
MODE  
LOGIC  
MODE  
ADV  
CLK  
LOGIC  
BURST  
LOGIC  
ADDRESS  
COUNTER  
CLR  
CLK  
ADSC  
ADSP  
ADDRESS  
REGISTERS  
A0-A17  
18  
9
BYTE1  
WRITE  
DRIVER  
9
9
9
9
9
9
BYTE2  
WRITE  
DRIVER  
GW  
BWE  
BW1  
BW2  
BW3  
BW4  
256KX9X4  
MEMORY  
ARRAY  
OUTPUT  
BUFFER  
BYTE  
WRITE  
ENABLE  
LOGIC  
36  
BYTE3  
WRITE  
DRIVER  
BYTE4  
WRITE  
DRIVER  
9
36  
4
DATA-IN  
REGISTERS  
4
CHIP  
ENABLE  
LOGIC  
CE  
CE2  
CE2  
OUTPUT  
ENABLE  
LOGIC  
OE  
I/O1 - I/O36  
PRELIMINARY (July, 2005, Version 0.0)  
3
AMIC Technology, Corp.  
A63L83361  
Pin Description  
Pin No.  
Symbol  
Description  
32 – 37 , 43 - 50, 81, 82,  
99, 100  
A0 - A17  
Address Inputs  
89  
CLK  
BWE , BW1 - BW4  
GW  
Clock  
87, 93 - 96  
Byte Write Enables  
Global Write  
88  
86  
Output Enable  
OE  
92, 97, 98  
Chip Enables  
CE2 ,CE2, CE  
ADV  
83  
84  
85  
31  
Burst Address Advance  
Processor Address Status  
Controller Address Status  
ADSP  
ADSC  
MODE  
Burst Mode: HIGH or NC (Interleaved burst)  
LOW (Linear burst)  
64  
ZZ  
Asynchronous Power-Down (Snooze): HIGH (Sleep)  
LOW or NC (Wake up)  
1,2, 3, 6 - 9, 12, 13, 18,  
19, 22 - 25, 28, 29,30,51,  
52, 53,  
I/O1- I/O36  
Data Inputs/Outputs  
56 - 59, 62, 63, 68, 69, 72  
- 75, 78, 79,80  
1, 14, 16, 30, 38, 39, 42,  
43, 51, 66, 80  
NC  
No Connection  
15, 41, 65, 91  
17, 40, 67, 90  
VCC  
GND  
Power Supply  
Ground  
4, 11, 20, 27,  
54, 61, 70, 77  
VCCQ  
Isolated Output Buffer Supply  
5, 10, 21, 26,  
55, 60, 71, 76  
GNDQ  
Isolated Output Buffer Ground  
PRELIMINARY (July, 2005, Version 0.0)  
4
AMIC Technology, Corp.  
A63L83361  
Synchronous Truth Table (See Notes 1 Through 5)  
Address  
I/O  
Operation  
Operation  
CE2  
CLK  
ADSC  
CE2  
WRITE  
CE  
ADV  
OE  
ADSP  
Used  
Deselected Cycle,  
Power-down  
NONE  
H
X
X
X
L
X
X
X
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
L-H  
High-Z  
High-Z  
High-Z  
High-Z  
High-Z  
Dout  
Deselected Cycle,  
Power-down  
NONE  
NONE  
NONE  
NONE  
External  
External  
External  
External  
External  
Next  
L
L
X
H
X
H
L
L
X
L
L
L
X
X
L
X
X
X
X
X
X
X
X
X
L
X
X
X
X
X
X
L
X
X
X
X
L
Deselected Cycle,  
Power-down  
Deselected Cycle,  
Power-down  
L
H
H
L
Deselected Cycle,  
Power-down  
L
X
H
H
H
H
H
X
X
X
X
X
X
X
X
X
X
X
X
L
READ Cycle,  
Begin Burst  
L
X
X
L
READ Cycle,  
Begin Burst  
L
L
L
H
X
L
High-Z  
Din  
WRITE Cycle,  
Begin Burst  
L
L
H
H
H
H
H
X
X
H
X
H
H
X
X
H
X
READ Cycle,  
Begin Burst  
L
L
L
H
H
H
H
H
H
L
Dout  
READ Cycle,  
Begin Burst  
L
L
L
H
L
High-Z  
Dout  
READ Cycle,  
Continue Burst  
READ Cycle,  
Continue Burst  
READ Cycle,  
Continue Burst  
READ Cycle,  
Continue Burst  
WRITE Cycle,  
Continue Burst  
WRITE Cycle,  
Continue Burst  
READ Cycle,  
Suspend Burst  
READ Cycle,  
Suspend Burst  
READ Cycle,  
Suspend Burst  
READ Cycle,  
Suspend Burst  
WRITE Cycle,  
Suspend Burst  
WRITE Cycle,  
Suspend Burst  
X
X
H
H
X
H
X
X
H
H
X
H
X
X
X
X
X
X
X
X
X
X
X
X
H
H
H
H
H
H
H
H
H
H
H
H
Next  
L
H
L
High-Z  
Dout  
Next  
L
Next  
L
H
X
X
L
High-Z  
Din  
Next  
L
Next  
L
L
Din  
Current  
Current  
Current  
Current  
Current  
Current  
H
H
H
H
H
H
H
H
H
H
L
Dout  
H
L
High-Z  
Dout  
H
X
X
High-Z  
Din  
L
Din  
PRELIMINARY (July, 2005, Version 0.0)  
5
AMIC Technology, Corp.  
A63L83361  
Notes: 1. X = "Disregard", H = Logic High, L = Logic Low.  
2. WRITE = L means:  
1) Any BWx (BW1,BW2 ,BW3 , or BW4 ) and BWE are low or  
2) GW is low.  
3. All inputs except OE must be synchronized with setup and hold times around the rising edge (L-H) of CLK.  
4. For write cycles that follow read cycles, OE must be HIGH before the input data request setup time and held  
HIGH throughout the input data hold time.  
5. ADSP LOW always initiates an internal Read at the L-H edge of CLK. A Write is performed by setting one or  
more byte write enable signals and BWE LOW or GW LOW for the subsequent L-H edge of CLK. Refer to  
the Write timing diagram for clarification.  
Write Truth Table  
Operation  
GW  
H
BWE  
BW1  
BW2  
X
BW3  
X
BW4  
X
READ  
READ  
H
L
L
L
X
X
H
L
H
H
H
H
WRITE Byte 1  
WRITE all bytes  
WRITE all bytes  
H
H
H
H
H
L
L
L
L
L
X
X
X
X
PRELIMINARY (July, 2005, Version 0.0)  
6
AMIC Technology, Corp.  
A63L83361  
Linear Burst Address Table (MODE = LOW)  
First Address (External)  
X . . . X00  
Second Address (Internal)  
Third Address (Internal)  
X . . . X10  
Fourth Address (Internal)  
X . . . X11  
X . . . X01  
X . . . X10  
X . . . X11  
X . . . X00  
X . . . X01  
X . . . X11  
X . . . X00  
X . . . X10  
X . . . X00  
X . . . X01  
X . . . X11  
X . . . X01  
X . . . X10  
Interleaved Burst Address Table (MODE = HIGH or NC)  
First Address (External)  
X . . . X00  
Second Address (Internal)  
X . . . X01  
Third Address (Internal)  
X . . . X10  
Fourth Address (Internal)  
X . . . X11  
X . . . X01  
X . . . X00  
X . . . X11  
X . . . X10  
X . . . X10  
X . . . X11  
X . . . X00  
X . . . X01  
X . . . X11  
X . . . X10  
X . . . X01  
X . . . X00  
Absolute Maximum Ratings*  
VCC & VCCQ Supply Voltages  
VCC for all devices . . ….. . . . . . . . . . . . . . . . . . . . +3.3V  
VCCQ for all devices . . ….. . . . . . . . . . . . . . . . . . . +3.3V  
Operating ranges define those limits between which the  
functionally of the device is guaranteed.  
Power Supply Voltage (VCC) . . . . . . . . . . -0.5V to +4.6V  
Voltage Relative to GND for any Pin Except VCC (Vin,  
Vout) . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VCC +0.5V  
Power Dissipation (PD) . . . . . . . . . . . . . . . . . . . . . . . . 2W  
Storage Temperature (Tbias) . . . . . . . . . . -65°C to 150 °C  
Storage Temperature (Tstg) . . . . . . . . . . . -55°C to 125°C  
*Comments  
Stresses above those listed under "Absolute Maximum  
Ratings" may cause permanent damage to this device.  
These are stress ratings only. Functional operation of  
this device at these or any other conditions above those  
indicated in the operational sections of this specification  
is not implied or intended. Exposure to the absolute  
maximum rating conditions for extended periods may  
affect device reliability.  
Operating Ranges  
Ambient Temperature  
Commercial (C) Devices . . . . . . . . . . . . . . . 0°C to +70°C  
Industrial (I) Devices . . . . . . . . . . . . . . . -45°C to +125°C  
Recommended DC Operating Conditions  
(0°C TA 70°C, VCC, VCCQ = 3.3V+5% or 3.3V-5%, unless otherwise noted)  
Symbol  
VCC  
VCCQ  
GND  
VIH  
Parameter  
Supply Voltage (Operating Voltage Range)  
Isolated Input Buffer Supply  
Supply Voltage to GND  
Min.  
3.135  
3.135  
0.0  
Typ.  
Max.  
3.465  
3.465  
0.0  
Unit  
V
Note  
3.3  
3.3  
V
-
-
-
-
V
Input High Voltage  
2
VCC+0.3  
VCC+0.3  
0.8  
V
1, 2  
1, 2  
VIHQ  
Input High Voltage (I/O Pins)  
Input Low Voltage  
2
V
VIL  
-0.3  
V
PRELIMINARY (July, 2005, Version 0.0)  
7
AMIC Technology, Corp.  
A63L83361  
DC Electrical Characteristics  
(0°C TA 70°C, VCC, VCCQ = 3.3V+5% or 3.3V-5%, unless otherwise noted)  
Symbol  
ILI⏐  
Parameter  
Min.  
Max.  
±2.0  
±2.0  
Unit  
µA  
Test Conditions  
Note  
Input Leakage Current  
Output Leakage Current  
-
-
All inputs VIN = GND to VCC  
OE = VIH, Vout = GND to VCC  
ILO⏐  
µA  
Device selected; VCC = max.  
Iout = 0mA, all inputs = VIH or VIL  
Cycle time = tKC min.  
ICC1  
Supply Current  
Standby Current  
-
-
300  
30  
mA  
mA  
3, 11  
Device deselected; VCC = max.  
All inputs are fixed.  
All inputs VCC - 0.2V  
or GND + 0.2V  
ISB1  
11  
Cycle time = tKC min.  
ISB2  
VOL  
VOH  
-
-
15  
1.0  
-
mA  
V
ZZ VCC - 0.2V  
IOL = 8 mA  
Output Low Voltage  
Output High Voltage  
1.6  
V
IOH = -4 mA  
Capacitance  
Symbol  
CIN  
Parameter  
Input Capacitance  
Input/Output Capacitance  
Typ.  
Max.  
Unit  
pF  
Conditions  
3
4
4
5
TA = 25 C; f = 1MHz  
VCC = 3.3V  
CI/O  
pF  
* These parameters are sampled and not 100% tested.  
PRELIMINARY (July, 2005, Version 0.0)  
8
AMIC Technology, Corp.  
A63L83361  
AC Characteristics (0°C TA 70°C, VCC = 3.3V+5% or 3.3V-5%)  
-6.5  
-7.5  
-8.5  
Symbol  
Parameter  
Unit  
Note  
Min.  
7.5  
2.5  
2.5  
-
Max. Min. Max. Min. Max.  
TKC  
TKH  
Clock Cycle Time  
-
-
8.5  
2.8  
2.8  
-
-
-
10  
3.0  
3.0  
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Clock High Time  
TKL  
Clock Low Time  
-
-
-
TKQ  
Clock to Output Valid  
Clock to Output Invalid  
Clock to Output in Low-Z  
Clock to Output in High-Z  
OE to Output Valid  
6.5  
-
7.5  
-
8.5  
-
tKQX  
tKQLZ  
tKQHZ  
tOEQ  
tOELZ  
tOEHZ  
3.0  
2.5  
-
3.0  
2.5  
-
3.0  
2.5  
-
-
-
-
5, 6  
5, 6  
8
3.5  
3.5  
-
3.5  
3.5  
-
5.0  
5.0  
-
-
-
-
0
0
0
5, 6  
5, 6  
OE to Output in Low-Z  
OE to Output in High-Z  
-
3.5  
-
3.5  
-
5.0  
Setup Times  
TAS  
tADSS  
tADVS  
tWS  
Address  
1.5  
1.5  
1.5  
1.5  
-
-
-
-
2.0  
2.0  
2.0  
2.0  
-
-
-
-
2.0  
2.0  
2.0  
2.0  
-
-
-
-
ns  
ns  
ns  
ns  
7, 9  
7, 9  
7, 9  
7, 9  
Address Status ( ADSC , ADSP )  
Address Advance ( ADV )  
Write Signals  
(BW1, BW2 , BW3 , BW4 , BWE , GW )  
TDS  
tCES  
Data-in  
1.5  
1.5  
-
-
1.5  
2.0  
-
-
2.0  
2.0  
-
-
ns  
ns  
7, 9  
7, 9  
Chip Enable ( CE , CE2, CE2 )  
Hold Times  
TAH  
Address  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
ns  
ns  
ns  
ns  
7, 9  
7, 9  
7, 9  
7, 9  
tADSH  
tAAH  
Address Status ( ADSC , ADSP )  
Address Advance ( ADV )  
tWH  
Write Signal  
(BW1, BW2 , BW3 ,BW4 , BWE , GW )  
TDH  
tCEH  
Data-in  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
ns  
ns  
7, 9  
7, 9  
Chip Enable ( CE , CE2, CE2 )  
PRELIMINARY (July, 2005, Version 0.0)  
9
AMIC Technology, Corp.  
A63L83361  
Notes:  
1. All voltages refer to GND.  
2. Overshoot: VIH +2V for t tKC/2.  
Undershoot: VIL -0.7V for t tKC/2.  
Power-up: VIH +2 and VCC 1.7V  
for t 200ms  
3. ICC1 is given with no output current. ICC1 increases with greater output loading and faster cycle times.  
4. Test conditions assume the output loading shown in Figure 1, unless otherwise specified.  
5. For output loading, CL = 5pF, as shown in Figure 2. Transition is measured ±150mV from steady state voltage.  
6. At any given temperature and voltage condition, tKQHZ is less than tKQLZ and tOEHZ is less than tQELZ.  
7. A WRITE cycle is defined by at least one Byte Write enable LOW and ADSP HIGH for the required setup and hold  
times. A READ cycle is defined by all byte write enables HIGH and ( ADSC or ADV LOW) or ADSP LOW for the  
required setup and hold times.  
8. OE has no effect when a Byte Write enable is sampled LOW.  
9. This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK  
when either ADSP or ADSC is LOW and the chip is enabled. All other synchronous inputs must meet the setup and  
hold times with stable logic levels for all rising edges of clock (CLK) when the chip is enabled. Chip enable must be  
valid at each rising edge of CLK when either ADSP or ADSC is LOW to remain enabled.  
10. The load used for VOH, VOL testing is shown in Figure 2. AC load current is higher than the given DC values.  
AC I/O curves are available upon request.  
11. "Device Deselected" means device is in POWER-DOWN mode, as defined in the truth table. "Device Selected" means  
device is active (not in POWER-DOWN mode).  
12. MODE pin has an internal pulled-up, and ZZ pin has an internal pulled-down. All of then exhibit an input leakage  
current of 10µA.  
13. Snooze (ZZ) input is recommended that users plan for four clock cycles to go into SLEEP mode and four clocks to  
emerge from SLEEP mode to ensure no data is lost.  
PRELIMINARY (July, 2005, Version 0.0)  
10  
AMIC Technology, Corp.  
A63L83361  
Timing Waveforms  
t
KC  
CLK  
t
KH  
tKL  
t
ADSS  
t
ADSH  
ADSP  
ADSC  
Deselect cycle  
t
ADSS  
tADSH  
t
AS  
tAH  
A1  
A2  
A3  
ADDRESS  
t
WS  
tWH  
GW,BWE  
BW1-BW4  
t
CES  
t
CEH  
Deselect with CE  
CE  
(NOTE 2)  
t
ADVS  
tADVH  
ADV  
OE  
ADV suspends burst  
(NOTE 3)  
t
KQ  
t
OELZ  
tKQHZ  
t
OEQ  
t
OEHZ  
t
KQX  
t
KQX  
t
KQLZ  
High-Z  
Q(A1)  
Q(A2)  
Q(A2+1)  
Q(A2+2)  
Q(A2+3)  
DOUT  
Q(A3)  
t
KQ  
(NOTE *1)  
Single READ  
BURST READ  
Don't Care  
Undefined  
Read Timing  
Notes: 1. QA(2) refers to output from address A2. Q(A2+1) refers to output from the next internal burst address following A2.  
2. CE and CE2 have timing identical to CE . On this diagram, when CE is LOW, CE2 is LOW and CE2 is HIGH.  
When CE is HIGH, CE2 is HIGH and CE2 is LOW.  
3. Timing is shown assuming that the device was not enabled before entering into this sequence. OE does not  
cause Q to be driven until after the following clock rising edge.  
PRELIMINARY (July, 2005, Version 0.0)  
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AMIC Technology, Corp.  
A63L83361  
Timing Waveforms (continued)  
t
KC  
CLK  
ADSP  
t
KH  
tKL  
t
ADSS  
tADSH  
ADSC extends burst  
t
ADSS  
tADSH  
t
ADSH  
t
ADSS  
ADSC  
t
AS  
tAH  
A1  
A2  
A3  
ADDRESS  
BYTE WRITE signals are ignored  
t
WS  
t
WH  
for first cycle when ADSP initiates burst  
BWE,BW1-BW4  
(NOTE 5)  
t
WS  
tWH  
GW  
t
CES  
tCEH  
CE  
(NOTE 2)  
t
ADVS  
t
ADVH  
ADV  
(NOTE 4)  
ADV suspends burst  
OE  
(NOTE 3)  
t
DS  
tDH  
D(A3+2)  
High-Z  
D(A1)  
D(A2)  
D(A2+1)  
D(A2+1)  
D(A2+2)  
D(A2+3)  
D(A3)  
D(A3+1)  
DIN  
t
OEHZ  
(NOTE 1)  
DOUT  
BURST READ  
Single WRITE  
Extended BURST WRITE  
Don't Care  
Undefined  
Write Timing  
Notes: 1. D(A2) refers to output from address A2. D(A2+1) refers to output from the internal burst address immediately  
following A2.  
2. Timing for CE2 and CE2 is identical to that for CE . As shown in the above diagram, when CE is LOW, CE2  
is LOW and CE2 is HIGH. When CE is HIGH, CE2 is HIGH and CE2 is LOW.  
3. OE must be HIGH before the input data setup, and held HIGH throughout the data hold period. This prevents  
input/output data contention for the period prior to the time Byte Write enable inputs are sampled.  
4. ADV must be HIGH to permit a Write to the loaded address.  
5. Byte Write enables are decided by means of a Write truth table.  
PRELIMINARY (July, 2005, Version 0.0)  
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AMIC Technology, Corp.  
A63L83361  
Timing Waveforms (continued)  
tKC  
CLK  
ADSP  
t
KH  
tKL  
tADSS  
tADSH  
ADSC  
tAS  
tAH  
A1  
A2  
A3  
A4  
A5  
A6  
ADDRESS  
tWS  
tWH  
GW,BWE,  
BW1-BW4  
(NOTE 3)  
tCES  
tCEH  
CE  
(NOTE 2)  
ADV  
OE  
tDS  
tDH  
t
KQ  
t
OELZ  
High-Z  
D(A3)  
D(A6)  
DIN  
D(A5)  
tOEHZ  
t
KQ  
(NOTE 1)  
Q(A4+1)  
DOUT  
Q(A1)  
Q(A2)  
Q(A4)  
Q(A4+2)  
Q(A4+3)  
Back-to-Back  
WRITEs  
Back-to-Back READs  
Single WRITE  
BURST READ  
Don't Care  
Undefined  
Read/Write Timing  
Notes: 1. Q(A4) refers to output from address A4. Q(A4+1) refers to output from the next internal burst address following A4.  
2. CE2 and CE2 have timing identical to CE . On this diagram, when CE is LOW, CE is LOW and CE2 is HIGH,  
When CE is HIGH, CE2 is HIGH and CE2 is LOW.  
3. The data bus (Q) remains in High-Z following a WRITE cycle unless an ADSP , ADSC , or ADV cycle is  
performed.  
4. Byte Write enables are decided by means of a Write truth table.  
5. Back-to-back READs may be controlled by either ADSP or ADSC  
PRELIMINARY (July, 2005, Version 0.0)  
13  
AMIC Technology, Corp.  
A63L83361  
AC Test Conditions  
Input Pulse Levels  
GND to 3V  
1 ns  
Input Rise and Fall Times  
Input Timing Reference Levels  
Output Reference Levels  
Output Load  
1.5V  
VccQ/2  
See Figures 1 and 2  
Figure 1. Output Load Equivalent Figure  
2. Output Load Equivalent  
VCCQ/2  
50Ω  
Q
RL=50  
ZO=50Ω  
Q
5pF  
VT=0.75V  
Ordering Information  
Part No.  
A63L83361E-6.5  
A63L83361E-6.5F  
A63L83361E-7.5  
A63L83361E-7.5F  
A63L83361E-8  
Access Times (ns)  
Frequency (MHz)  
Package  
6.5  
6.5  
7.5  
7.5  
8
153  
153  
133  
133  
117  
117  
100L LQFP  
100L Pb-Free LQFP  
100L LQFP  
100L Pb-Free LQFP  
100L LQFP  
A63L83361E-8F  
8
100L Pb-Free LQFP  
PRELIMINARY (July, 2005, Version 0.0)  
14  
AMIC Technology, Corp.  
A63L83361  
Package Information  
LQFP 100L Outline Dimensions  
unit: inches/mm  
H
E
A
2
A1  
E
y
80  
51  
81  
50  
31  
100  
1
30  
b
c
e
θ
Dimensions in inches  
Dimensions in mm  
Symbol  
Min.  
0.002  
0.053  
0.011  
0.005  
0.860  
0.783  
0.624  
0.547  
Nom.  
-
Max.  
-
Min.  
0.05  
Nom.  
-
Max.  
-
A1  
A2  
b
0.055  
0.013  
-
0.057  
0.015  
0.008  
0.872  
0.791  
0.636  
0.555  
1.35  
1.40  
1.45  
0.37  
0.20  
22.15  
20.10  
16.15  
14.10  
0.27  
0.32  
c
0.12  
-
HE  
E
0.866  
0.787  
0.630  
0.551  
0.026 BSC  
0.024  
0.039 REF  
-
23.35  
19.90  
15.85  
13.90  
22.00  
20.00  
16.00  
14.00  
0.65 BSC  
0.60  
HD  
D
e
L
0.018  
0.030  
0.45  
0.75  
L1  
y
1.00 REF  
-
-
0.004  
-
0.1  
θ
0°  
3.5°  
7°  
0°  
3.5°  
7°  
Notes:  
1. Dimensions D and E do not include mold protrusion.  
2. Dimensions b does not include dambar protrusion.  
Total in excess of the b dimension at maximum material condition.  
Dambar cannot be located on the lower radius of the foot.  
PRELIMINARY (July, 2005, Version 0.0)  
15  
AMIC Technology, Corp.  

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