AD810ANZ [ADI]
MICROCIRCUIT, LINEAR, VIDEO OPERATIONAL AMPLIFIER WITH DISABLE, MONOLITHIC SILICON; 微型电路，线性，视频运算放大器，具有禁用，单片硅
| 型号： | AD810ANZ |
| 厂家： | 
ADI |
| 描述： | MICROCIRCUIT, LINEAR, VIDEO OPERATIONAL AMPLIFIER WITH DISABLE, MONOLITHIC SILICON |
| 文件： | 总13页 (文件大小：76K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
B
Drawing updated to reflect current requirements. -ro
Drawing updated as part of 5 year review. -rrp
01-10-18
07-04-17
R. MONNIN
Robert M. Heber
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
B
1
B
2
B
3
B
4
B
5
B
6
B
7
B
8
B
9
B
B
B
SHEET
10
11
12
PREPARED BY
RICK C. OFFICER
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
CHECKED BY
STANDARD
MICROCIRCUIT
DRAWING
CHARLES E. BESORE
APPROVED BY
MICHAEL A. FRYE
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
MICROCIRCUIT, LINEAR, VIDEO OPERATIONAL
AMPLIFIER WITH DISABLE, MONOLITHIC
SILICON
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
93-10-29
AMSC N/A
REVISION LEVEL
B
SIZE
A
CAGE CODE
5962-93132
67268
SHEET
1
OF
12
DSCC FORM 2233
APR 97
5962-E279-06
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)
and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962
-
93132
01
M
P
X
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
AD810
Circuit function
Video operational amplifier with disable
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as
follows:
Device class
M
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, non-
JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Q or V
Certification and qualification to MIL-PRF-38535
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
P
Descriptive designator
GDIP1-T8 or CDIP2-T8
Terminals
8
Package style
Dual-in-line
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
2
DSCC FORM 2234
APR 97
1.3 Absolute maximum ratings. 1/
Supply voltage (±V ) ..................................................................... ±18 V dc
S
Common mode input voltage (V ) .............................................. ±V
CM
S
Differential input voltage (V ) ....................................................... ±6 V dc
ID
Power dissipation (P ) .................................................................. 1.3 W 2/
D
Lead temperature range (soldering 60 seconds) ........................... 300°C
Storage temperature range ............................................................ -65°C to +150°C
Thermal resistance, junction-to-case (θ ) .................................... See MIL-STD-1835
JC
Thermal resistance, junction-to ambient (θ ) ............................... 110°C/W
JA
1.4 Recommended operating conditions.
Power supply voltage range (±V ) ................................................. ±2.5 V to ±18 V
S
Ambient operating temperature range (T ) ................................... -55°C to +125°C
A
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
-
Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or
from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
________
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Maximum power dissipation is specified so that T does not exceed +175°C at an ambient temperature of +25°C.
J
Derate above T = +25°C for case P at 9 mW/°C.
A
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
3
DSCC FORM 2234
APR 97
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 85 (see MIL-PRF-38535, appendix A).
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits 1/
Unit
A
Test
Symbol
R = 150 Ω
L
unless otherwise specified
Min
Max
+6
Input offset voltage
Input bias current
1
01
01
01
-6
-15
-5
mV
V
V = ±5 V and ±15 V
S
IO
2,3
+15
+5
1,2,3
µA
-I
+I
V = ±5 V, ±15 V,
S
IB
-10
1.0
+10
V
CM
= 0 V
IB
Open-loop transresistance
1,2,3
1,2,3
1,2,3
MΩ
R
VS
V = ±15 V, V
= ±10 V,
S
OUT
R = 400 Ω
L
0.2
80
72
V = ±5 V, V
= ±2.5 V,
S
OUT
R = 100 Ω
L
Open loop gain
01
01
dB
dB
A
V = ±15 V, V
= ±10 V,
OL
S
OUT
R = 400 Ω
L
V = ±5 V, V
= ±2.5 V,
S
OUT
R = 100 Ω
L
Common mode rejection
ratio
CMRR
50
56
V = ±5 V, V
= ±2.5 V
S
CM
V = ±15 V, V
= ±12 V
S
CM
-0.4
60
0.4
µA/V
dB
CMRR
PSRR
V = ±5 V and ±15 V
S
IB
Power supply rejection
ratio
1,2,3
1,2,3
01
01
V = ±4.5 V to ±18 V
S
-0.3
-2.5
-12
0.3
+2.5
+12
µA/V
V
PSRR
V = ±4.5 V and ±18 V
S
IB
Input common mode
voltage range
CMVR
V = ±5 V
S
V = ±15 V
S
See footnotes at end of table.
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits 1/
Unit
A
Test
Symbol
R = 150 Ω
L
unless otherwise specified
Min
Max
Output voltage swing 2/
1,2,3
1
01
+2.5
+12.5
+12
V
+V
V = ±5 V, R = 150 Ω
S L
OUT
V = ±15 V, R = 400 Ω
S
L
2,3
1,2,3
1
-2.5
-12.5
-12
-V
OUT
V = ±5 V, R = 150 Ω
S L
V = ±15 V, R = 400 Ω
S
L
2,3
1,2,3
1
Output current
01
01
30
mA
mA
I
I
V = ±5 V and ±15 V
S
OUT
Power supply quiescent
current
7.5
8.0
11.0
2.3
2.8
3.5
4.0
75
V = ±5 V
S
Q
V = ±15 V
S
2,3
1
V = ±5 V and ±15 V
S
Power down current
01
mA
I
V = ±5 V
S
DN
V = ±15 V
S
2,3
1
V = ±5 V
S
V = ±15 V
S
Disable pin current 3/
DISABLE pin = 0 V,
01
01
µA
I
LOGIC
V = ±5 V, T = +25°C
S
A
DISABLE pin = 0 V,
V = ±15 V, T = +25°C
400
S
A
Input resistance 3/
4
2.5
MΩ
+R
V = ±15 V, T = +25°C
S A
IN
See footnotes at end of table.
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits 1/
Unit
A
Test
Symbol
R = 150 Ω
L
unless otherwise specified
Min
Max
40
Minimum DISABLE 3/
pin current to disable
Bandwidth at 3 dB 3/
1
4
01
01
10
40
µA
I
V = ±5 V and ±15 V
S
D
BW
MHz
A = +2, R = 715 Ω,
V
FB
V = ±5 V, T = +25°C
S
A
55
13
15
8
A = +2, R = 715 Ω,
V
FB
V = ±15 V, T = +25°C
S
A
Bandwidth at 0.1 dB 3/
BW
4
01
MHz
A = +2, R = 715 Ω,
V
FB
V = ±5 V, T = +25°C
S
A
A = +2, R = 715 Ω,
V
FB
V = ±15 V, T = +25°C
S
A
Full power bandwidth 3/
Slew rate 3/
FPBW
SR
4
4
01
01
MHz
V = ±15 V, V
= 20 V
,
S
OUT
PP
R = 400 Ω, T = +25°C
L
A
500
V/µs
V = ±15 V, R = 400 Ω,
S
L
A = -10, T = +25°C,
V
A
measured at 10% to 90%
points, rising and falling edge
V = ±5 V, R = 150 Ω,
175
S
L
A = -10, T = +25°C,
V
A
measured at 10% to 90%
points, rising and falling edge
Differential gain 3/
DG
4
01
0.05
0.07
%
V
= ±15 V, f = 3.58 MHz,
= +25°C
S
T
A
V
S
= ±5 V, f = 3.58 MHz,
= +25°C
T
A
See footnotes at end of table.
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
7
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits 1/
Unit
A
Test
Symbol
R = 150 Ω
L
unless otherwise specified
Min
Max
Differential phase 3/
DP
4
01
0.07
0.08
Degree
V
= ±15 V, f = 3.58 MHz,
= +25°C
S
T
A
V
S
= ±5 V, f = 3.58 MHz,
= +25°C
T
A
1/ The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum,
is used in this table. Negative current shall be defined as conventional current flow out of a device terminal.
2/ The voltage swing test is defined as useful operating range, but no saturation range.
3/ If not tested, shall be guaranteed to the limits specified in table I herein.
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table II herein.
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
8
DSCC FORM 2234
APR 97
Device type
Case outline
01
P
Terminal
number
1
Terminal symbol
OFFSET NULL
-INPUT
2
3
4
5
6
7
8
+INPUT
-V
S
OFFSET NULL
OUTPUT
+V
S
DISABLE
FIGURE 1. Terminal connections.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-93132
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
9
DSCC FORM 2234
APR 97
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-
883.
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
10
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
Subgroups
Test requirements
Subgroups
(in accordance with
(in accordance with
MIL-STD-883,
MIL-PRF-38535, table III)
method 5005, table I)
Device
Device
class Q
Device
class V
class M
1
1
1
Interim electrical
parameters (see 4.2)
Final electrical
1,2,3,4 1/
1,2,3,4 1/
1,2,3,4 1/
parameters (see 4.2)
1,2,3,4
1,2,3,4
1,2,3,4
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
1
1
1
1
1
1
----
----
----
1/ PDA applies to subgroup 1.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a. End-point electrical parameters shall be as specified in table II herein.
b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25°C ±5°C,
after exposure, to the subgroups specified in table II herein.
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
11
DSCC FORM 2234
APR 97
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor
prepared specification or drawing.
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a system
application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users
and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.
6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43218-3990, or telephone
(614) 692-0547.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to
this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DSCC-VA.
SIZE
STANDARD
5962-93132
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
B
SHEET
12
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 07-04-17
Approved sources of supply for SMD 5962-93132 are listed below for immediate acquisition information only and shall
be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised
to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate
of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next
dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of
supply at http://www.dscc.dla.mil/Programs/Smcr/ .
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
24355
Vendor
similar
PIN 2/
5962-9313201MPA
AD810SQ/883B
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
Vendor CAGE
number
Vendor name
and address
24355
Analog Devices
Route 1 Industrial Park
P.O. Box 9106
Norwood, MA 02062
Point of contact: 804 Woburn Street
Wilmington, MA 01887-3462
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
相关型号：
AD810SQ/883B
IC OP-AMP, 15000 uV OFFSET-MAX, 100 MHz BAND WIDTH, CDIP8, CERDIP-8, Operational Amplifier
ADI
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