5962-89710023A_技术文档

REVISIONS

LTR

A

DESCRIPTION

DATE _(YR-MO-DA)

91-10-18

APPROVED

M. A. Frye

Changes in accordance with NOR 5962-R008-92

B

Changes in footnotes at the end of table I. Editorial changes

throughout.

92-10-29

THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.

REV

SHEET

REV

SHEET

B

1

B

2

B

3

B

4

B

5

B

6

B

7

B

8

B

9

B

REV STATUS

OF SHEETS

REV

10

11

12

SHEET

PREPARED BY

Rick C. Officer

PMIC N/A

DEFENSE ELECTRONICS SUPPLY CENTER

DAYTON, OHIO 45444

STANDARDIZED

CHECKED BY

Charles E. Besore

MILITARY

DRAWING

MICROCIRCUIT, LINEAR, CMOS LATCHED

8- AND 16-CHANNEL ANALOG

MULTIPLEXERS, MONOLITHIC SILICON

THIS DRAWING IS

AVAILABLE

FOR USE BY ALL

DEPARTMENTS

APPROVED BY

Michael A. Frye

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DRAWING APPROVAL DATE

90-08-08

SIZE

CAGE CODE

67268

5962-89710

A

REVISION LEVEL

B

AMSC N/A

SHEET

1

OF

12

DESC FORM 193

JUL 91

5962-E660-92

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

1. SCOPE

1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883,

"Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices".

1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown in the following example:

5962-89710

01

X

Drawing number

Device type

(see 1.2.1)

Case outline

(see 1.2.2)

Lead finish

(see 1.2.3)

1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows:

Device type

Generic number

Circuit function

01

02

ADG526A

ADG527A

CMOS 16-channel multiplexer latched

CMOS 8-channel multiplexer latched

1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter

Descriptive designator

Terminals

Package style

Dual-in-line

X

3

GDIP1-T28 or CDIP2-T28

CQCC1-N28

28

Square leadless chip carrier

1.2.3 Lead finish. The lead finish shall be as specified in MIL-M-38510. Finish letter "X" shall not be marked on the microcircuit

or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and

interchangeable without preference.

1.3 Absolute maximum ratings.

Supply voltage (V ) to V

DD

SS

. . . . . . .4.4. .V.d. c. . . . . . . . . . . . . . . . . . .

Supply voltage (V ) to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 V dc

DD

V

to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -25 V dc

SS

Analog inputs: 1/

Voltage at S or D . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V

-2.0 V dc to V

+2.0 V dc or

SS

DD

20 mA, whichever occurs first

20 mA

Continuous current, S or D

Pulsed current, S or D (1.0 ms duration, 10% duty cycle) . . . . . . . 40 mA

DC input voltages 1/ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V -4.0 V dc to V

+4.0 V dc or

20 mA, whichever occurs first

SS DD

Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65 C to +150 C

Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . . . . . . +300 C

Power dissipation to +75 C (P ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 470 mW 2/

D

Thermal resistance, junction-to-case (

):

JC

Cases X and 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See MIL-STD-1835

Junction temperature (T ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175 C

J

1.4 Recommended operating conditions.

Supply voltage to ground (V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -15 V dc

SS

Supply voltage to ground (V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . +15 V dc

DD

Ambient operating temperature range (T ) . . . . . . . . . . . . . . . . . . . . -55 C to +125 C

A

1/ Overvoltage at A, EN, WR, RS, S, or D will be clamped by diodes. Current should be limited to the maximum rating above.

2/ Derate above T = +75 C at 6.0 mW/ C.

A

SIZE

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5962-89710

A

DEFENSE ELECTRONICS SUPPLY CENTER

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REVISION LEVEL

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SHEET

2

DESC FORM 193A

JUL 91

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and bulletin. Unless otherwise specified, the following specification, standards, and

bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the

solicitation, form a part of this drawing to the extent specified herein.

SPECIFICATION

MILITARY

MIL-M-38510 - Microcircuits, General Specification for.

STANDARDS

MILITARY

MIL-STD-883 - Test Methods and Procedures for Microelectronics.

MIL-STD-1835 - Microcircuit Case Outlines.

BULLETIN

MILITARY

MIL-BUL-103 - List of Standardized Military Drawings (SMD's).

(Copies of the specification, standards, and bulletin required by manufacturers in connection with specific acquisition functions

should be obtained from the contracting activity or as directed by the contracting activity.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of

this drawing shall take precedence.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, "Provisions for the

use of MIL-STD-883 in conjunction with compliant non-JAN devices" and as specified herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in

MIL-M-38510 and herein.

3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.2 Truth tables. The truth tables shall be as specified on figure 2.

3.2.3 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.

3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as

specified in table I and apply over the full ambient operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests

for each subgroup are described in table I.

3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the PIN listed in

1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-BUL-103 (see 6.6 herein).

SIZE

STANDARDIZED

5962-89710

A

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DEFENSE ELECTRONICS SUPPLY CENTER

REVISION LEVEL

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3

DESC FORM 193A

JUL 91

TABLE I. Electrical performance characteristics.

Test

Symbol

Conditions 1/

-55 C +125 C

unless otherwise specified

Device

type

Group A

subgroups

Limits

Min

Unit

T

A

Max

Dual supply

Analog signal

range

V

T

= +25 C 2/

= 14.25 V,

01,02

4

1

-15

+15

300

V

ANALOG

A

Drain-source

"ON"

resistance

R

V

I

DS(ON)

DD

SS

= -14.25 V,

= 1.0 mA, V = 5.0 V

DS

D

V

= V + (I

DS

x R

)

ON

S

D

V

I

= 14.25 V,

= -14.25 V,

01,02

2,3

400

DD

SS

= 1.0 mA, V = 5.0 V

DS

D

V

= V + (I

x R

)

S

D

DS

ON

V

I

= 10.8 V,

= -10.8 V,

1

450

600

DD

SS

= 1.0 mA, V = 5.0 V

DS

D

V

= V + (I

x R )

2,3

S

D

DS

ON

Source "OFF"

leakage

I

3/

01,02

01

1

1.0

50

nA

S(OFF)

current

2,3

1

Drain "OFF"

leakage

current

I

3/

1.0

200

1.0

100

1.0

200

1.0

100

25

D(OFF)

2,3

1

02

2,3

1

Drain "ON"

leakage

current

I

01

nA

D(ON)

2,3

1

02

2,3

Differential

"OFF" output

leakage

I

02

DIFF(OFF)

See footnotes at end of table.

SIZE

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A

DEFENSE ELECTRONICS SUPPLY CENTER

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REVISION LEVEL

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DESC FORM 193A

JUL 91

TABLE I. Electrical performance characteristics - Continued.

Test

Symbol

Conditions 1/

-55 C +125 C

unless otherwise specified

Device

type

Group A

subgroups

Limits

Min

Unit

T

A

Max

Dual supply - Continued

High level

I

V

= 16.5 V, V

= -16.5 V,

01,02

1,2,3

9

1.0

1.5

0.2

µA

mA

ns

INH

DD

SS

input current

= 16.5 V

IN

Low level

input current

I

V

= 16.5 V, V

= 0 V

INL

DD

IN

Supply current

Delay time

I

V

= 16.5 V, V

= 2.4/15 V, V

= -16.5 V,

= 0.8/0 V

INL

DD

INH

I

V

= 16.5 V, V

= -16.5 V,

= 0.8/0 V

INL

SS

DD

INH

SS

= 2.4/15 V, V

t

V = ±10 V,

1

25

10

OPEN

See figure 3

4/

10,11

9

Enable delay

time

t

See figure 3

4/

01,02

300

400

ns

ON/

OFF

(EN)

10,11

Single supply

Analog signal

range

V

T

= +25 C 2/

A

SS

01,02

4

0

+15

V

ANALOG

V

= 0 V

Drain-source

"ON"

resistance

R

V

I

= 10.8 V,

= 0 V,

= 0.5 mA, V = 5.0 V

1

700

1000

1.0

DS(ON)

DD

SS

DS

D

V

= V + (I

DS

* R )

ON

2,3

1

S

D

Source "OFF"

leakage

current

I

5/

01,02

nA

S(OFF)

2,3

50

See footnotes at end of table.

SIZE

STANDARDIZED

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A

DEFENSE ELECTRONICS SUPPLY CENTER

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REVISION LEVEL

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5

DESC FORM 193A

JUL 91

TABLE I. Electrical performance characteristics - Continued.

Test

Symbol

Conditions 1/

-55 C +125 C

unless otherwise specified

Device

types

Group A

Limits

Min

Unit

nA

T

subgroups

A

Max

Single supply - continued

Drain "OFF"

leakage

current

I

5/

01

02

01

02

1

1.0

200

1.0

D(OFF)

2,3

1

2,3

1

100

1.0

Drain "ON"

leakage

current

I

5/

nA

D(ON)

2,3

1

200

1.0

2,3

100

25

Differential

"OFF" output

leakage

I

nA

DIFF(OFF)

High level

I

V

= 16.5 V, V

= 0 V,

01,02

1,2,3

1.0

1.5

µA

mA

ns

INH

DD

SS

input current

V

= 16.5 V

IN

Low level

input current

I

V

= 16.5 V, V

= 0 V

INL

DD

IN

Supply current

Delay time

I

V

= 16.5 V, V

DD

= 2.4/15 V, V

= 0.8/0 V

INH

INL

t

V = 10/0 V, V = 0 V

See figure 3 4/

9

25

10

OPEN

1

SS

10,11

9

Enable delay

time

t

See figure 3, V = 0 V

SS

450

600

ns

ON/

4/

OFF

(EN)

10,11

1/ Unless otherwise specified, V

and 0.8 V).

= +15 V, V

= -15 V and logic inputs are at desired logic levels (2.4 V

SS

DD

2/ This parameter is tested initially and after any process or changes which may affect it.

3/ V = 16.5 V, V = -16.5 V, V = +10 V/-10 V, V = -10 V/+10 V, V = 0.8 V, V = 2.4 V.

INH

DD

SS

D

S

INL

4/ Figure 3 refers to type 01 devices. For 02 devices the test circuits are functionally identical, but there are

some DUT pin name changes.

5/ V

= 16.5 V, V

= 0 V, V = +10 V/-10 V, V = 0 V/+10 V, V

= 0.8 V, V

= 2.4 V.

DD

SS

D

S

INL

INH

SIZE

STANDARDIZED

MILITARY DRAWING

5962-89710

A

DEFENSE ELECTRONICS SUPPLY CENTER

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REVISION LEVEL

B

SHEET

6

DESC FORM 193A

JUL 91

Device types

01

02

Case outlines

Terminal number

X and 3

Terminal symbol

1

V

DD

2

NC

RS

S16

S15

S14

S13

S12

S11

S10

S9

DB

3

RS

4

S8B

S7B

S6B

S5B

S4B

S3B

S2B

S1B

GND

WR

NC

5

6

7

8

9

10

11

12

13

14

15

16

17

18

19

20

21

22

23

24

25

26

27

28

GND

WR

A3

A2

A1

A0

EN

S1

EN

S1A

S2A

S3A

S4A

S5A

S6A

S7A

S8A

S2

S3

S4

S5

S6

S7

S8

V

D

V

SS

DA

NC = No connection

FIGURE 1. Terminal connections.

SIZE

STANDARDIZED

MILITARY DRAWING

5962-89710

A

DEFENSE ELECTRONICS SUPPLY CENTER

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REVISION LEVEL

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7

DESC FORM 193A

JUL 91

Device type 01

ON SWITCH

A3

A2

A1

A0

EN WR

X

RS

X

0

1

X

0

1

0

1

X

0

1

0

1

0

1

0

1

X

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

Retains previous switch condition

None (address and enable latches cleared)

X

0

1

X

0

None

1

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16

Device type 02

A2

A1

A0

EN WR

X

RS

ON SWITCH

X

0

1

X

0

1

0

1

X

0

1

0

1

0

1

0

1

0

1

Retains previous switch condition

X

0

1

X

0

None (address and enable latches cleared)

None

1

2

3

4

5

6

7

8

X = Do not care

= signal is switching from low to high

FIGURE 2. Truth tables.

SIZE

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8

DESC FORM 193A

JUL 91

BREAK-BEFORE-MAKE DELAY, t

FIGURE 3. Test circuits.

OPEN

SIZE

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A

DEFENSE ELECTRONICS SUPPLY CENTER

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REVISION LEVEL

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9

DESC FORM 193A

JUL 91

ENABLE t

/t time

ON OFF

FIGURE 3. Test circuits - Continued.

SIZE

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A

DEFENSE ELECTRONICS SUPPLY CENTER

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REVISION LEVEL

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10

DESC FORM 193A

JUL 91

3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an

approved source of supply in MIL-BUL-103 (see 6.6 herein). The certificate of compliance submitted to DESC-EC prior to listing as

an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-STD-883 (see 3.1 herein)

and the requirements herein.

3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with

each lot of microcircuits delivered to this drawing.

3.8 Notification of change. Notification of change to DESC-EC shall be required in accordance with MIL-STD-883 (see 3.1

herein).

3.9 Verification and review. DESC, DESC's agent, and the acquiring activity retain the option to review the manufacturer's facility

and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer.

4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the

extent specified in MIL-STD-883 (see 3.1 herein).

4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices

prior to quality conformance inspection. The following additional criteria shall apply:

a.

Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

test method 1015 of MIL-STD-883.

(2)

T = +125 C, minimum.

A

b.

Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests

prior to burn-in are optional at the discretion of the manufacturer.

4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883

including groups A, B, C, and D inspections. The following additional criteria shall apply.

4.3.1 Group A inspection.

a.

b.

Tests shall be as specified in table II herein.

Subgroup 4 (analog signal range) shall be measured only for the initial test and after process or design changes which

may affect analog signal range.

c.

d.

Subgroups 5 and 6 shall be omitted.

Subgroups 7 and 8 testing shall be sufficient to verify the truth table.

4.3.2 Groups C and D inspections.

a.

b.

End-point electrical parameters shall be as specified in table II herein.

Steady-state life test conditions, method 1005 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

test method 1005 of MIL-STD-883.

(2)

T = +125 C, minimum.

A

(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

SIZE

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DESC FORM 193A

JUL 91

TABLE II. Electrical test requirements.

MIL-STD-883 test requirements

Subgroups

(in accordance with

method 5005, table I)

Interim electrical parameters

(method 5004)

1

Final electrical test parameters

(method 5004)

1*,2,3,7,8,9

Group A test requirements

(method 5005)

1,2,3,4,7,8,

9,10**,11**

Groups C and D end-point

electrical parameters

(method 5005)

1

* PDA applies to subgroup 1.

** Subgroups 10 and 11, if not tested, shall be guaranteed to the

limits specified in table I.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38510.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and

qualified military devices that will perform the required function are not available for Original Equipment Manufacturer (OEM)

application. When a military specification exists and the product covered by this drawing has been qualified for listing on

QPL-38510, the device specified herein will be inactivated and will not be used for new design. The QPL-38510 product shall be

the preferred item for all applications.

6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared

specification or drawing.

6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the

individual documents. This coordination will be accomplished in accordance with MIL-STD-481 using DD Form 1693, Engineering

Change Proposal (Short Form).

6.4 Record of users. Military and industrial users shall inform Defense Electronics Supply Center when a system application

requires configuration control and the applicable SMD. DESC will maintain a record of users and this list will be used for

coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should

contact DESC-EC, telephone (513) 296-6047.

6.5 Comments. Comments on this drawing should be directed to DESC-EC, Dayton, Ohio 45444, or telephone (513)

296-5377.

6.6 Approved sources of supply. Approved sources of supply are listed in MIL-BUL-103. The vendors listed in MIL-BUL-103

have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DESC-EC.

SIZE

STANDARDIZED

5962-89710

A

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DESC FORM 193A

JUL 91

STANDARDIZED MILITARY DRAWING SOURCE APPROVAL BULLETIN

DATE: 92-10-29

Approved sources of supply for SMD 89710 are listed below for immediate acquisition only and shall be added to MIL-BUL-103

during the next revision. MIL-BUL-103 will be revised to include the addition or deletion of sources. The vendors listed below have

agreed to this drawing and a certificate of compliance has been submitted to and accepted by DESC-EC. This bulletin is

superseded by the next dated revision of MIL-BUL-103.

Standardized

military drawing

Vendor

CAGE

number

Vendor

similar

PIN 1/

5962-8971001XX

5962-89710013X

5962-8971002XX

5962-89710023X

24355 ADG526ATQ/883B

24355

ADG526ATE/883B

ADG527ATQ/883B

ADG527ATE/883B

1/ Caution. Do not use this number for item

acquisition. Items acquired to this number

may not satisfy the performance requirements

of this drawing.

Vendor CAGE

Vendor name

and address

number

24355

Analog Devices

Route 1 Industrial Park

P.O. Box 9106

Norwood, MA 02062

Point of contact: 181 Ballardvale Street

Wilmington, MA 01887-1024

The information contained herein is disseminated for convenience only and

the Government assumes no liability whatsoever for any inaccuracies in this

information bulletin.


型号：	5962-89710023A
厂家：	ADI
描述：	IC 8-CHANNEL, DIFFERENTIAL MULTIPLEXER, CQCC28, CERAMIC, LCC-28, Multiplexer or Switch
文件：	总13页 (文件大小：116K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

5962-89710023A [ADI]

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