5962-89710023A [ADI]
IC 8-CHANNEL, DIFFERENTIAL MULTIPLEXER, CQCC28, CERAMIC, LCC-28, Multiplexer or Switch;![5962-89710023A](http://pdffile.icpdf.com/pdf2/p00229/img/icpdf/5962-8971002_1341446_icpdf.jpg)
型号: | 5962-89710023A |
厂家: | ![]() |
描述: | IC 8-CHANNEL, DIFFERENTIAL MULTIPLEXER, CQCC28, CERAMIC, LCC-28, Multiplexer or Switch |
文件: | 总13页 (文件大小:116K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
REVISIONS
LTR
A
DESCRIPTION
DATE (YR-MO-DA)
91-10-18
APPROVED
M. A. Frye
M. A. Frye
Changes in accordance with NOR 5962-R008-92
B
Changes in footnotes at the end of table I. Editorial changes
throughout.
92-10-29
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
B
1
B
2
B
3
B
4
B
5
B
6
B
7
B
8
B
9
B
B
B
REV STATUS
OF SHEETS
REV
10
11
12
SHEET
PREPARED BY
Rick C. Officer
PMIC N/A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
STANDARDIZED
CHECKED BY
Charles E. Besore
MILITARY
DRAWING
MICROCIRCUIT, LINEAR, CMOS LATCHED
8- AND 16-CHANNEL ANALOG
MULTIPLEXERS, MONOLITHIC SILICON
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
APPROVED BY
Michael A. Frye
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
90-08-08
SIZE
CAGE CODE
67268
5962-89710
A
REVISION LEVEL
B
AMSC N/A
SHEET
1
OF
12
DESC FORM 193
JUL 91
5962-E660-92
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1. SCOPE
1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883,
"Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices".
1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown in the following example:
5962-89710
01
X
X
Drawing number
Device type
(see 1.2.1)
Case outline
(see 1.2.2)
Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows:
Device type
Generic number
Circuit function
01
02
ADG526A
ADG527A
CMOS 16-channel multiplexer latched
CMOS 8-channel multiplexer latched
1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
Dual-in-line
X
3
GDIP1-T28 or CDIP2-T28
CQCC1-N28
28
28
Square leadless chip carrier
1.2.3 Lead finish. The lead finish shall be as specified in MIL-M-38510. Finish letter "X" shall not be marked on the microcircuit
or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and
interchangeable without preference.
1.3 Absolute maximum ratings.
Supply voltage (V ) to V
DD
SS
. . . . . . .4.4. .V.d. c. . . . . . . . . . . . . . . . . . .
Supply voltage (V ) to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 V dc
DD
V
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -25 V dc
SS
Analog inputs: 1/
Voltage at S or D . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
-2.0 V dc to V
+2.0 V dc or
SS
DD
20 mA, whichever occurs first
20 mA
Continuous current, S or D
Pulsed current, S or D (1.0 ms duration, 10% duty cycle) . . . . . . . 40 mA
DC input voltages 1/ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V -4.0 V dc to V
+4.0 V dc or
20 mA, whichever occurs first
SS DD
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65 C to +150 C
Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . . . . . . +300 C
Power dissipation to +75 C (P ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 470 mW 2/
D
Thermal resistance, junction-to-case (
):
JC
Cases X and 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See MIL-STD-1835
Junction temperature (T ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175 C
J
1.4 Recommended operating conditions.
Supply voltage to ground (V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -15 V dc
SS
Supply voltage to ground (V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . +15 V dc
DD
Ambient operating temperature range (T ) . . . . . . . . . . . . . . . . . . . . -55 C to +125 C
A
1/ Overvoltage at A, EN, WR, RS, S, or D will be clamped by diodes. Current should be limited to the maximum rating above.
2/ Derate above T = +75 C at 6.0 mW/ C.
A
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
B
SHEET
2
DESC FORM 193A
JUL 91
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and bulletin. Unless otherwise specified, the following specification, standards, and
bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the
solicitation, form a part of this drawing to the extent specified herein.
SPECIFICATION
MILITARY
MIL-M-38510 - Microcircuits, General Specification for.
STANDARDS
MILITARY
MIL-STD-883 - Test Methods and Procedures for Microelectronics.
MIL-STD-1835 - Microcircuit Case Outlines.
BULLETIN
MILITARY
MIL-BUL-103 - List of Standardized Military Drawings (SMD's).
(Copies of the specification, standards, and bulletin required by manufacturers in connection with specific acquisition functions
should be obtained from the contracting activity or as directed by the contracting activity.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing shall take precedence.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, "Provisions for the
use of MIL-STD-883 in conjunction with compliant non-JAN devices" and as specified herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-M-38510 and herein.
3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.2 Truth tables. The truth tables shall be as specified on figure 2.
3.2.3 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as
specified in table I and apply over the full ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests
for each subgroup are described in table I.
3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the PIN listed in
1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-BUL-103 (see 6.6 herein).
SIZE
STANDARDIZED
5962-89710
A
MILITARY DRAWING
DEFENSE ELECTRONICS SUPPLY CENTER
REVISION LEVEL
B
SHEET
DAYTON, OHIO 45444
3
DESC FORM 193A
JUL 91
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55 C +125 C
unless otherwise specified
Device
type
Group A
subgroups
Limits
Min
Unit
T
A
Max
Dual supply
Analog signal
range
V
T
= +25 C 2/
= 14.25 V,
01,02
01,02
4
1
-15
+15
300
V
ANALOG
A
Drain-source
"ON"
resistance
R
V
V
I
DS(ON)
DD
SS
= -14.25 V,
= 1.0 mA, V = 5.0 V
DS
D
V
= V + (I
DS
x R
)
ON
S
D
V
V
I
= 14.25 V,
= -14.25 V,
01,02
01,02
2,3
400
DD
SS
= 1.0 mA, V = 5.0 V
DS
D
V
= V + (I
x R
)
S
D
DS
ON
V
V
I
= 10.8 V,
= -10.8 V,
1
450
600
DD
SS
= 1.0 mA, V = 5.0 V
DS
D
V
= V + (I
x R )
2,3
S
D
DS
ON
Source "OFF"
leakage
I
3/
01,02
01
1
1.0
50
nA
nA
S(OFF)
current
2,3
1
Drain "OFF"
leakage
current
I
3/
3/
3/
1.0
200
1.0
100
1.0
200
1.0
100
25
D(OFF)
2,3
1
02
2,3
1
Drain "ON"
leakage
current
I
01
nA
nA
D(ON)
2,3
1
02
2,3
2,3
Differential
"OFF" output
leakage
I
02
DIFF(OFF)
See footnotes at end of table.
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
B
SHEET
4
DESC FORM 193A
JUL 91
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-55 C +125 C
unless otherwise specified
Device
type
Group A
subgroups
Limits
Min
Unit
T
A
Max
Dual supply - Continued
High level
I
V
V
= 16.5 V, V
= -16.5 V,
= -16.5 V,
01,02
01,02
01,02
01,02
01,02
1,2,3
1,2,3
1,2,3
1,2,3
9
1.0
1.0
1.5
0.2
µA
µA
mA
mA
ns
INH
DD
SS
SS
SS
input current
= 16.5 V
IN
Low level
input current
I
V
V
= 16.5 V, V
= 0 V
INL
DD
IN
Supply current
Supply current
Delay time
I
V
V
= 16.5 V, V
= 2.4/15 V, V
= -16.5 V,
= 0.8/0 V
INL
DD
DD
INH
I
V
V
= 16.5 V, V
= -16.5 V,
= 0.8/0 V
INL
SS
DD
INH
SS
= 2.4/15 V, V
t
V = ±10 V,
1
25
10
OPEN
See figure 3
4/
10,11
9
Enable delay
time
t
t
See figure 3
4/
01,02
300
400
ns
ON/
OFF
(EN)
10,11
Single supply
Analog signal
range
V
T
= +25 C 2/
A
SS
01,02
01,02
4
0
+15
V
ANALOG
V
= 0 V
Drain-source
"ON"
resistance
R
V
V
I
= 10.8 V,
= 0 V,
= 0.5 mA, V = 5.0 V
1
700
1000
1.0
DS(ON)
DD
SS
DS
D
V
= V + (I
DS
* R )
ON
2,3
1
S
D
Source "OFF"
leakage
current
I
5/
01,02
nA
S(OFF)
2,3
50
See footnotes at end of table.
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
B
SHEET
5
DESC FORM 193A
JUL 91
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-55 C +125 C
unless otherwise specified
Device
types
Group A
Limits
Min
Unit
nA
T
subgroups
A
Max
Single supply - continued
Drain "OFF"
leakage
current
I
5/
01
02
01
02
02
1
1.0
200
1.0
D(OFF)
2,3
1
2,3
1
100
1.0
Drain "ON"
leakage
current
I
5/
5/
nA
D(ON)
2,3
1
200
1.0
2,3
2,3
100
25
Differential
"OFF" output
leakage
I
nA
DIFF(OFF)
High level
I
V
= 16.5 V, V
= 0 V,
= 0 V,
= 0 V,
01,02
01,02
01,02
01,02
01,02
1,2,3
1,2,3
1,2,3
1.0
1.0
1.5
µA
µA
mA
ns
INH
DD
SS
SS
SS
input current
V
= 16.5 V
IN
Low level
input current
I
V
V
= 16.5 V, V
= 0 V
INL
DD
IN
Supply current
Delay time
I
V
V
= 16.5 V, V
DD
DD
= 2.4/15 V, V
= 0.8/0 V
INH
INL
t
V = 10/0 V, V = 0 V
See figure 3 4/
9
25
10
OPEN
1
SS
10,11
9
Enable delay
time
t
t
See figure 3, V = 0 V
SS
450
600
ns
ON/
4/
OFF
(EN)
10,11
1/ Unless otherwise specified, V
and 0.8 V).
= +15 V, V
= -15 V and logic inputs are at desired logic levels (2.4 V
SS
DD
2/ This parameter is tested initially and after any process or changes which may affect it.
3/ V = 16.5 V, V = -16.5 V, V = +10 V/-10 V, V = -10 V/+10 V, V = 0.8 V, V = 2.4 V.
INH
DD
SS
D
S
INL
4/ Figure 3 refers to type 01 devices. For 02 devices the test circuits are functionally identical, but there are
some DUT pin name changes.
5/ V
= 16.5 V, V
= 0 V, V = +10 V/-10 V, V = 0 V/+10 V, V
= 0.8 V, V
= 2.4 V.
DD
SS
D
S
INL
INH
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
B
SHEET
6
DESC FORM 193A
JUL 91
Device types
01
02
Case outlines
Terminal number
X and 3
X and 3
Terminal symbol
1
V
V
DD
DD
2
NC
RS
S16
S15
S14
S13
S12
S11
S10
S9
DB
3
RS
4
S8B
S7B
S6B
S5B
S4B
S3B
S2B
S1B
GND
WR
NC
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
GND
WR
A3
A2
A2
A1
A1
A0
A0
EN
S1
EN
S1A
S2A
S3A
S4A
S5A
S6A
S7A
S8A
S2
S3
S4
S5
S6
S7
S8
V
D
V
SS
SS
DA
NC = No connection
FIGURE 1. Terminal connections.
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
B
SHEET
7
DESC FORM 193A
JUL 91
Device type 01
ON SWITCH
A3
A2
A1
A0
EN WR
X
RS
X
X
X
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
X
X
X
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
X
X
X
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
X
X
X
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
1
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
Retains previous switch condition
None (address and enable latches cleared)
X
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
X
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
None
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Device type 02
A2
A1
A0
EN WR
X
RS
ON SWITCH
X
X
X
0
0
0
0
1
1
1
1
X
X
X
0
0
1
1
0
0
1
1
X
X
X
0
1
0
1
0
1
0
1
1
0
1
1
1
1
1
1
1
1
1
Retains previous switch condition
X
0
1
1
1
1
1
1
1
1
X
0
0
0
0
0
0
0
0
0
None (address and enable latches cleared)
None
1
2
3
4
5
6
7
8
X = Do not care
= signal is switching from low to high
FIGURE 2. Truth tables.
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
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B
8
DESC FORM 193A
JUL 91
BREAK-BEFORE-MAKE DELAY, t
FIGURE 3. Test circuits.
OPEN
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
B
SHEET
9
DESC FORM 193A
JUL 91
ENABLE t
/t time
ON OFF
FIGURE 3. Test circuits - Continued.
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
B
SHEET
10
DESC FORM 193A
JUL 91
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-BUL-103 (see 6.6 herein). The certificate of compliance submitted to DESC-EC prior to listing as
an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-STD-883 (see 3.1 herein)
and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with
each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DESC-EC shall be required in accordance with MIL-STD-883 (see 3.1
herein).
3.9 Verification and review. DESC, DESC's agent, and the acquiring activity retain the option to review the manufacturer's facility
and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the
extent specified in MIL-STD-883 (see 3.1 herein).
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
(2)
T = +125 C, minimum.
A
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests
prior to burn-in are optional at the discretion of the manufacturer.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883
including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a.
b.
Tests shall be as specified in table II herein.
Subgroup 4 (analog signal range) shall be measured only for the initial test and after process or design changes which
may affect analog signal range.
c.
d.
Subgroups 5 and 6 shall be omitted.
Subgroups 7 and 8 testing shall be sufficient to verify the truth table.
4.3.2 Groups C and D inspections.
a.
b.
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1005 of MIL-STD-883.
(2)
T = +125 C, minimum.
A
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89710
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
B
SHEET
11
DESC FORM 193A
JUL 91
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Subgroups
(in accordance with
method 5005, table I)
Interim electrical parameters
(method 5004)
1
Final electrical test parameters
(method 5004)
1*,2,3,7,8,9
Group A test requirements
(method 5005)
1,2,3,4,7,8,
9,10**,11**
Groups C and D end-point
electrical parameters
(method 5005)
1
* PDA applies to subgroup 1.
** Subgroups 10 and 11, if not tested, shall be guaranteed to the
limits specified in table I.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38510.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and
qualified military devices that will perform the required function are not available for Original Equipment Manufacturer (OEM)
application. When a military specification exists and the product covered by this drawing has been qualified for listing on
QPL-38510, the device specified herein will be inactivated and will not be used for new design. The QPL-38510 product shall be
the preferred item for all applications.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared
specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the
individual documents. This coordination will be accomplished in accordance with MIL-STD-481 using DD Form 1693, Engineering
Change Proposal (Short Form).
6.4 Record of users. Military and industrial users shall inform Defense Electronics Supply Center when a system application
requires configuration control and the applicable SMD. DESC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should
contact DESC-EC, telephone (513) 296-6047.
6.5 Comments. Comments on this drawing should be directed to DESC-EC, Dayton, Ohio 45444, or telephone (513)
296-5377.
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-BUL-103. The vendors listed in MIL-BUL-103
have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DESC-EC.
SIZE
STANDARDIZED
5962-89710
A
MILITARY DRAWING
DEFENSE ELECTRONICS SUPPLY CENTER
REVISION LEVEL
B
SHEET
DAYTON, OHIO 45444
12
DESC FORM 193A
JUL 91
STANDARDIZED MILITARY DRAWING SOURCE APPROVAL BULLETIN
DATE: 92-10-29
Approved sources of supply for SMD 89710 are listed below for immediate acquisition only and shall be added to MIL-BUL-103
during the next revision. MIL-BUL-103 will be revised to include the addition or deletion of sources. The vendors listed below have
agreed to this drawing and a certificate of compliance has been submitted to and accepted by DESC-EC. This bulletin is
superseded by the next dated revision of MIL-BUL-103.
Standardized
military drawing
PIN
Vendor
CAGE
number
Vendor
similar
PIN 1/
5962-8971001XX
5962-89710013X
5962-8971002XX
5962-89710023X
24355 ADG526ATQ/883B
24355
24355
24355
ADG526ATE/883B
ADG527ATQ/883B
ADG527ATE/883B
1/ Caution. Do not use this number for item
acquisition. Items acquired to this number
may not satisfy the performance requirements
of this drawing.
Vendor CAGE
Vendor name
and address
number
24355
Analog Devices
Route 1 Industrial Park
P.O. Box 9106
Norwood, MA 02062
Point of contact: 181 Ballardvale Street
Wilmington, MA 01887-1024
The information contained herein is disseminated for convenience only and
the Government assumes no liability whatsoever for any inaccuracies in this
information bulletin.
相关型号:
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5962-89711013A
IC 1-BIT, DSP-CORRELATOR, CQCC28, HERMETIC SEALED, CERAMIC, LCC-28, DSP Peripheral
RAYTHEON
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