W25P80-VSSI [WINBOND]

8MX1 FLASH 2.7V PROM, PDSO8, 0.208 INCH, PLASTIC, SOIC-8;
W25P80-VSSI
型号: W25P80-VSSI
厂家: WINBOND    WINBOND
描述:

8MX1 FLASH 2.7V PROM, PDSO8, 0.208 INCH, PLASTIC, SOIC-8

可编程只读存储器 时钟 光电二极管 内存集成电路
文件: 总43页 (文件大小:918K)
中文:  中文翻译
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W25P80 / W25P16 / W25P32  
8M-BIT, 16M-BIT AND 32M-BIT  
SERIAL FLASH MEMORY  
Formally NexFlash NX25P80, NX25P16 and NX25P32  
The Winbond W25P80/16/32 are fully compatible with the previous NexFlash  
NX25P80/16/32 Serial Flash memories.  
Publication Release Date: December 11, 2005  
Revision J  
- 1 -  
W25P80 / W25P16 / W25P32  
Table of Contents-  
1.  
2.  
3.  
4.  
5.  
6.  
GENERAL DESCRIPTION ......................................................................................................... 4  
FEATURES................................................................................................................................. 4  
PIN CONFIGURATION 208-MIL................................................................................................. 5  
PIN DESCRIPTION 208-MIL ...................................................................................................... 5  
PIN CONFIGURATION 300-MIL................................................................................................. 6  
PIN DESCRIPTION 300-MIL ...................................................................................................... 6  
6.1  
6.2  
6.3  
6.4  
6.5  
6.6  
6.7  
Package Types............................................................................................................... 7  
Chip Select (/CS)............................................................................................................ 7  
Serial Data Output (DO) ................................................................................................. 7  
Write Protect (/WP)......................................................................................................... 7  
HOLD (/HOLD) ............................................................................................................... 7  
Serial Clock (CLK) .......................................................................................................... 7  
Serial Data Input (DI)...................................................................................................... 7  
7.  
8.  
BLOCK DIAGRAM ...................................................................................................................... 8  
FUNCTIONAL DESCRIPTION ................................................................................................... 9  
8.1  
SPI OPERATIONS ......................................................................................................... 9  
8.1.1 SPI Modes........................................................................................................................9  
8.1.2 HOLD Function.................................................................................................................9  
8.2  
WRITE PROTECTION.................................................................................................... 9  
8.2.1 Write Protect Features......................................................................................................9  
9.  
CONTROL AND STATUS REGISTERS................................................................................... 10  
9.1  
STATUS REGISTER .................................................................................................... 10  
9.1.1 BUSY..............................................................................................................................10  
9.1.2 Write Enable Latch (WEL)..............................................................................................10  
9.1.3 Block Protect Bits (BP2, BP1, BP0)................................................................................11  
9.1.4 Reserved Bits .................................................................................................................11  
9.1.5 Status Register Protect (SRP)........................................................................................11  
9.1.6 Status Register Memory Protection................................................................................12  
9.2  
INSTRUCTIONS........................................................................................................... 13  
9.2.1 Manufacturer and Device Identification...........................................................................13  
9.2.2 Instruction Set (1).............................................................................................................14  
9.2.3 Write Disable (04h).........................................................................................................15  
9.2.4 Write Enable (06h)..........................................................................................................15  
9.2.5 Read Status Register (05h) ............................................................................................16  
9.2.6 Write Status Register (01h) ............................................................................................17  
9.2.7 Read Data (03h).............................................................................................................18  
- 2 -  
W25P80 / W25P16 / W25P32  
9.2.8 Fast Read (0Bh) .............................................................................................................19  
9.2.9 Page Program (02h).......................................................................................................20  
9.2.10 Sector Erase (D8h).......................................................................................................21  
9.2.11 Chip Erase (C7h)..........................................................................................................22  
9.2.12 Power-down (B9h)........................................................................................................23  
9.2.13 Release Power-down / Device ID (ABh).......................................................................23  
9.2.14 Read Manufacturer / Device ID (90h)...........................................................................25  
9.2.15 JEDEC ID (9Fh)............................................................................................................26  
9.2.16 Read Parameter Page (53h).........................................................................................27  
9.2.17 Fast Read Parameter Page (5Bh) ................................................................................28  
9.2.18 Program Parameter Page (52h) ...................................................................................29  
9.2.19 Erase Parameter Page (D5h) .......................................................................................31  
10.  
ELECTRICAL CHARACTERISTICS......................................................................................... 32  
(1)  
10.1 Absolute Maximum Ratings  
.................................................................................... 32  
10.2 Operating Ranges......................................................................................................... 32  
10.3 Power-up Timing and Write Inhibit Threshold .............................................................. 33  
(1)  
10.4 DC Electrical Characteristics (Preliminary) .............................................................. 34  
10.5 AC Measurement Conditions........................................................................................ 35  
10.6 AC Electrical Characteristics ........................................................................................ 36  
10.7 Serial Output Timing..................................................................................................... 38  
10.8 Input Timing .................................................................................................................. 38  
10.9 Hold Timing................................................................................................................... 38  
PACKAGE SPECIFICATION.................................................................................................... 39  
11.1 8-Pin SOIC 208-mil (Winbond Package Code SS) (NexFlash Package Code S)........ 39  
11.2 16-Pin SOIC 300-mil (Winbond Package Code SF)(NexFlash Package Code F)....... 40  
ORDERING INFORMATION .................................................................................................... 41  
REVISION HISTORY................................................................................................................ 42  
11.  
12.  
13.  
Publication Release Date: December 11, 2005  
- 3 -  
Revision J  
W25P80 / W25P16 / W25P32  
1. GENERAL DESCRIPTION  
The W25P80 (8M-bit), W25P16 (16M-bit) and W25P32 (32M-bit) Serial Flash memories provide a  
storage solution for systems with limited space, pins and power. They are ideal for code download  
applications as well as storing voice, text and data. The devices operate on a single 2.7V to 3.6V  
power supply with current consumption as low as 4mA active and 1µA for power-down. Devices are  
offered in space-saving SOIC packages. As part of a family of Serial Flash products, Winbond also  
offers compatible devices in 1M/2M/4M-bit densities.  
The W25P80/16/32 array is organized into 4,096/8,192/16,384 programmable pages of 256-bytes  
each. Up to 256 bytes can be programmed at a time using the Page Program instruction. Pages are  
grouped into 16/32/64 erasable sectors of 256 pages (64K-byte) each as shown in figure 2. Both  
Sector Erase and Chip (full chip) Erase instructions are supported. Additionally, a 256-byte Parameter  
Page is provided for user data that is typically stored in EEPROMs such as ID or revision numbers  
and configuration parameters. The parameter page is separate from the main array allowing for much  
faster erase times.  
The Serial Peripheral Interface (SPI) consists of four pins (Serial Clock, Chip Select, Serial Data In  
and Serial Data Out) that support high speed serial data transfers up to 50MHz. A Hold pin, Write  
Protect pin and programmable write protect features provide further control flexibility. Additionally, the  
device can be queried for manufacturer and device type.  
The Winbond W25P80/16/32 are fully compatible with the previous NexFlash NX25P80/16/32 Serial  
Flash memories.  
2. FEATUR ES  
8M / 16M / 32M-bit Serial Flash Memories  
Programming Features  
– Page program up to 256 bytes in 3.5ms  
– Sector Erase (64K-byte) 0.6 seconds  
– 100,000 erase/write cycles  
Family of Serial Flash Memories  
– W25P80: 8M-bit/1M-byte (1,048,576)  
– W25P16: 16M-bit/2M-byte (2,097,152)  
– W25P32: 32M-bit/4M-byte (4,194,304)  
– 256-bytes per programmable page  
– Compatible 1M/2M/4M-bit devices  
– Twenty-year data retention  
Software and Hardware Write Protection  
– Write-Protect all or portion of memory  
– Enable/Disable protection with /WP pin  
4-pin SPI Serial Interface  
– Clock, Chip Select, Data In, Data Out  
– Easily interfaces to popular microcontrollers  
– Compatible with SPI Modes 0 and 3  
– Optional Hold function for SPI flexibility  
Parameter Page  
– 256 Byte page for ID# revision# or  
configuration data  
– Separate from array, erase time <200ms  
Low Power Consumption, Wide  
Temperature Range  
Space Saving Packaging  
– 8-pin SOIC (W25P80 and W25P16)  
– 16-pin SOIC (W25P16 and W25P32)  
– Single 2.7 to 3.6V supply  
– 4mA active current, 1µA Power-down (typ)  
– -40° to +85°C operating range  
Ideal for systems with limited pins, space,  
and power  
– Controller-based serial code-download  
– µC systems storing data, text or voice  
– Battery-operated and portable products  
Fast and Flexible Serial Data Access  
– Clock operation to 50MHz  
– Auto-increment Read capability  
– Manufacturer and device type ID  
- 4 -  
W25P80 / W25P16 / W25P32  
3. PIN CONFIGURATION 208-MIL  
Figure 1a. W25P80/16 Pin Assignments, 8-pin SOIC 208-mi  
4. PIN DESCRIPTION 208-MIL  
PIN NO.  
PIN NAME  
I/O  
FUNCTION  
Chip Select Input  
Data Output  
Write Protect Input  
Ground  
Data Input  
Serial Clock Input  
Hold Input  
1
2
3
4
5
6
7
8
/CS  
DO  
/WP  
GND  
DI  
CLK  
/HOLD  
VCC  
I
O
I
I
I
I
Power Supply  
Publication Release Date: December 11, 2005  
- 5 -  
Revision J  
W25P80 / W25P16 / W25P32  
5. PIN CONFIGURATION 300-MIL  
Figure 1b. W25P16/32 Pin Assignments, 16-pin SOIC 300-mil  
6. PIN DESCRIPTION 300-MIL  
PAD NO.  
PAD NAME  
/HOLD  
VCC  
N/C  
I/O  
I
FUNCTION  
Hold Input  
Power Supply  
No Connect  
1
2
3
4
N/C  
No Connect  
5
N/C  
No Connect  
6
N/C  
No Connect  
7
8
9
10  
11  
12  
13  
14  
15  
16  
/CS  
DO  
/WP  
GND  
N/C  
N/C  
N/C  
N/C  
DI  
I
O
I
Chip Select Input  
Data Output  
Write Protect Input  
Ground  
No Connect  
No Connect  
No Connect  
No Connect  
Data Input  
Serial Clock Input  
I
I
CLK  
- 6 -  
W25P80 / W25P16 / W25P32  
6.1 Package Types  
The W25P80/16/32 are primarily offered in SOIC packages. The W25P80 and W25P16 use an 8-pin  
plastic 208-mil width SOIC (Winbond package code SS) (NexFlash package code S) and the W25P16  
and W25P32 use a 16-pin plastic 300-mil width SOIC (Winbond package code SF) (NexFlash  
package code F) as shown in figures 1A and 1B respectively. Package diagrams and dimensions are  
illustrated at the end of this data sheet. Optional 8-contact MLP packages may be available. Please  
contact Winbond for further MLP package information.  
6.2 Chip Select (/CS)  
The SPI Chip Select (/CS) pin enables and disables device operation. When /CS is high the device is  
deselected and the Serial Data Output (DO) pin is at high impedance. When deselected, the devices  
power consumption will be at standby levels unless an internal erase, program or status register cycle  
is in progress. When /CS is brought low the device will be selected, power consumption will increase  
to active levels and instructions can be written to and data read from the device. After power-up, /CS  
must transition from high to low before a new instruction will be accepted. The /CS input must track  
the VCC supply level at power-up (see “Write Protection” and figure 16). If needed a pull-up resister  
on /CS can be used to accomplish this.  
6.3 Serial Data Output (DO)  
The SPI Serial Data Output (DO) pin provides a means for data and status to be serially read from  
(shifted out of) the device. Data is shifted out on the falling edge of the Serial Clock (CLK) input pin.  
6.4 Write Protect (/WP)  
The Write Protect (/WP) pin can be used to prevent the Status Register from being written. Used in  
conjunction with the Status Register’s Block Protect (BP2, BP1, and BP0) bits and Status Register  
Protect (SRP) bits, a portion or the entire memory array can be hardware protected. The /WP pin is  
active low.  
6.5 HOLD (/HOLD)  
The /HOLD pin allows the device to be paused while it is actively selected. When /HOLD is brought  
low, while /CS is low, the DO pin will be at high impedance and signals on the DI and CLK pins will be  
ignored (don’t care). When /HOLD is brought high, device operation can resume. The /HOLD function  
can be useful when multiple devices are sharing the same SPI signals. (“See Hold function”)  
6.6 Serial Clock (CLK)  
The SPI Serial Clock Input (CLK) pin provides the timing for serial input and output operations. ("See  
SPI "Operations")  
6.7 Serial Data Input (DI)  
The SPI Serial Data Input (DI) pin provides a means for instructions, addresses and data to be serially  
written to (shifted into) the device. Data is latched on the rising edge of the Serial Clock (CLK) input  
pin.  
Publication Release Date: December 11, 2005  
- 7 -  
Revision J  
W25P80 / W25P16 / W25P32  
7. BLOCK DIAGRAM  
Figure 2. W25P80, W25P16 and W25P32 Block Diagram  
- 8 -  
W25P80 / W25P16 / W25P32  
8. FUNCTIONAL DESCRIPTION  
8.1 SPI OPERATIONS  
8.1.1 SPI Modes  
The W25P80/16/32 is accessed through an SPI compatible bus consisting of four signals: Serial Clock  
(CLK), Chip Select (/CS), Serial Data Input (DI) and Serial Data Output (DO). Both SPI bus operation  
Modes 0 (0,0) and 3 (1,1) are supported. The primary difference between Mode 0 and Mode 3  
concerns the normal state of the CLK signal when the SPI bus master is in standby and data is not  
being transferred to the Serial Flash. For Mode 0 the CLK signal is normally low. For Mode 3 the CLK  
signal is normally high. In either case data input on the DI pin is sampled on the rising edge of the  
CLK. Data output on the DO pin is clocked out on the falling edge of CLK.  
8.1.2 HOLD Function  
The /HOLD signal allows the W25P80/16/32 operation to be paused while it is actively selected (when  
/CS is low). The /HOLD function may be useful in cases where the SPI data and clock signals are  
shared with other devices. For example, consider if the page buffer was only partially written when a  
priority interrupt requires use of the SPI bus. In this case the /HOLD function can save the state of the  
instruction and the data in the buffer so programming can resume where it left off once the bus is  
available again.  
To initiate a /HOLD condition, the device must be selected with /CS low. A /HOLD condition will  
activate on the falling edge of the /HOLD signal if the CLK signal is already low. If the CLK is not  
already low the /HOLD condition will activate after the next falling edge of CLK. The /HOLD condition  
will terminate on the rising edge of the /HOLD signal if the CLK signal is already low. If the CLK is not  
already low the /HOLD condition will terminate after the next falling edge of CLK.  
During a /HOLD condition, the Serial Data Output (DO) is high impedance, and Serial Data Input (DI)  
and Serial Clock (CLK) are ignored. The Chip Select (/CS) signal should be kept active (low) for the  
full duration of the /HOLD operation to avoid resetting the internal logic state of the device.  
8.2 WRITE PROTECTION  
Applications that use non-volatile memory must take into consideration the possibility of noise and  
other adverse system conditions that may compromise data integrity. To address this concern the  
W25P80/16/32 provides several means to protect data from inadvertent writes.  
8.2.1 Write Protect Features  
Device resets when VCC is below threshold.  
Time delay write disable after Power-up.  
Write enable/disable instructions.  
Automatic write disable after program and erase.  
Software write protection using Status Register.  
Hardware write protection using Status Register and /WP pin.  
Write Protection using Power-down instruction.  
Publication Release Date: December 11, 2005  
Revision J  
- 9 -  
W25P80 / W25P16 / W25P32  
Upon power-up or at power-down the W25P80/16/32 will maintain a reset condition while VCC is  
below the threshold value of VWI, (See Power-up Timing and Voltage Levels and Figure 17). While  
reset, all operations are disabled and no instructions are recognized. During power-up and after the  
VCC voltage exceeds VWI, all program and erase related instructions are further disabled for a time  
delay of tPUW. This includes the Write Enable, Page Program, Sector Erase, Chip Erase and the Write  
Status Register instructions. Note that the chip select pin (/CS) must track the VCC supply level at  
power-up until the VCC-min level and tVSL time delay is reached. If needed a pull-up resister on /CS  
can be used to accomplish this.  
After power-up the device is automatically placed in a write-disabled state with the Status Register  
Write Enable Latch (WEL) set to a 0. A Write Enable instruction must be issued before a Page  
Program, Sector Erase, Chip Erase or Write Status Register instruction will be accepted. After  
completing a program, erase or write instruction the Write Enable Latch (WEL) is automatically  
cleared to a write-disabled state of 0.  
Software controlled write protection is facilitated using the Write Status Register instruction and setting  
the Status Register Protect (SRP) and Block Protect (BP2, BP1, and BP0) bits. These Status Register  
bits allow a portion or all of the memory to be configured as read only. Used in conjunction with the  
Write Protect (/WP) pin, changes to the Status Register can be enabled or disabled under hardware  
control. See Status Register for further information.  
Additionally, the Power-down instruction offers an extra level of write protection as all instructions are  
ignored except for the Release Power-down instruction.  
9. CONTROL AND STATUS REGISTERS  
The Read Status Register instruction can be used to provide status on the availability of the Flash  
memory array, if the device is write enabled or disabled, and the state of write protection. The Write  
Status Register instruction can be used to configure the devices write protection features. See Figure  
3.  
9.1 STATUS REGISTER  
9.1.1 BUSY  
BUSY is a read only bit in the status register (S0) that is set to a 1 state when the device is executing  
a Page Program, Sector Erase, Chip Erase or Write Status Register instruction. During this time the  
device will ignore further instructions except for the Read Status Register instruction (see tW, tPP, tSE  
and tCE in AC Characteristics). When the program, erase or write status register instruction has  
completed, the BUSY bit will be cleared to a 0 state indicating the device is ready for further  
instructions.  
9.1.2 Write Enable Latch (WEL)  
Write Enable Latch (WEL) is a read only bit in the status register (S1) that is set to a 1 after executing  
a Write Enable Instruction. The WEL status bit is cleared to a 0 when the device is write disabled. A  
write disable state occurs upon power-up or after any of the following instructions: Write Disable, Page  
Program, Sector Erase, Chip Erase and Write Status Register.  
- 10 -  
W25P80 / W25P16 / W25P32  
9.1.3 Block Protect Bits (BP2, BP1, BP0)  
The Block Protect Bits (BP2, BP1, BP0) are non-volatile read/write bits in the status register (S4, S3,  
S2) that provide Write Protection control and status. Block Protect bits can be set using the Write  
Status Register Instruction (see tW in AC characteristics). All, none or a portion of the memory array  
can be protected from Program and Erase instructions (see Status Register Memory Protection table).  
The factory default setting for the Block Protection Bits is 0, none of the array protected. The Block  
Protect bits can not be written to if the Status Register Protect (SRP) bit is set to 1 and the Write  
Protect (/WP) pin is low.  
9.1.4 Reserved Bits  
Status register bit locations 5 and 6 are reserved for future use. Current devices will read 0 for these  
bit locations. It is recommended to mask out the reserved bit when testing the Status Register. Doing  
this will ensure compatibility with future devices.  
9.1.5 Status Register Protect (SRP)  
The Status Register Protect (SRP) bit is a non-volatile  
read/write bit in the status register (S7) that can be used in conjunction with the Write Protect (/WP)  
pin to disable writes to the status register. When the SRP bit is set to a 0 state (factory default) the  
/WP pin has no control over the status register. When the SRP pin is set to a 1, the Write Status  
Register instruction is locked out while the /WP pin is low. When the /WP pin is high the Write Status  
Register instruction is allowed.  
Figure 3. Status Register Bit Locations  
Publication Release Date: December 11, 2005  
- 11 -  
Revision J  
W25P80 / W25P16 / W25P32  
9.1.6 Status Register Memory Protection  
STATUS  
W25P32 (32M-BIT) MEMORY PROTECTION  
REGISTER(1)  
BP2  
0
0
0
0
1
1
1
1
BP1  
0
0
1
1
0
0
1
1
BP0  
SECTOR(S)  
NONE  
ADDRESSES  
NONE  
DENSITY (KB)  
NONE  
PORTION  
NONE  
0
1
0
1
0
1
0
1
63  
3F0000h - 3FFFFFh  
3E0000h - 3FFFFFh  
3C0000h - 3FFFFFh  
380000h - 3FFFFFh  
300000h - 3FFFFFh  
200000h - 3FFFFFh  
000000h - 3FFFFFh  
512K-bit  
1M-bit  
2M-bit  
4M-bit  
8M-bit  
Upper 1/64  
Upper 1/32  
Upper 1/16  
Upper 1/8  
Upper 1/4  
Upper 1/2  
62 and 63  
60 thru 63  
56 thru 63  
48 thru 63  
32 thru 63  
ALL  
16M-bit  
All memory plus Parameter Page  
STATUS  
W25P16 (16M-BIT) MEMORY PROTECTION  
REGISTER(1)  
BP2  
0
BP1  
0
BP0  
0
SECTOR(S)  
NONE  
ADDRESSES  
NONE  
DENSITY (KB)  
NONE  
PORTION  
NONE  
0
0
0
1
1
1
0
1
1
0
0
1
1
0
1
0
1
x
31  
1F0000h - 1FFFFFh  
1E0000h - 1FFFFFh  
1C0000h - 1FFFFFh  
180000h - 1FFFFFh  
100000h - 1FFFFFh  
000000h - 1FFFFFh  
512K-bit  
1M-bit  
2M-bit  
4M-bit  
8M-bit  
Upper 1/32  
Upper 1/16  
Upper 1/8  
Upper 1/4  
Upper 1/2  
30 and 31  
28 thru 31  
24 thru 31  
16 thru 31  
ALL  
All memory plus Parameter Page  
STATUS  
W25P80 (8M-BIT) MEMORY PROTECTION  
REGISTER(1)  
BP2  
0
0
0
0
1
1
1
BP1  
0
0
1
1
0
0
1
BP0  
SECTOR(S)  
NONE  
ADDRESSES  
NONE  
DENSITY (KB)  
NONE  
PORTION  
NONE  
Upper 1/16  
Upper 1/8  
Upper 1/4  
Upper 1/2  
0
1
0
1
0
1
x
15  
0F0000h - 0FFFFFh  
0E0000h - 0FFFFFh  
0C0000h - 0FFFFFh  
080000h - 0FFFFFh  
000000h - 0FFFFFh  
000000h - 0FFFFFh  
512K-bit  
1M-bit  
2M-bit  
14 and 15  
12 thru 15  
8 thru 15  
ALL  
4M-bit  
All memory plus Parameter Page  
ALL  
Note:  
1. x = don’t care  
- 12 -  
W25P80 / W25P16 / W25P32  
9.2 INSTRUCTIONS  
The instruction set of the W25P80/16/32 consists of thirteen basic instructions that are fully controlled  
through the SPI bus (see Instruction Set table). Instructions are initiated with the falling edge of Chip  
Select (/CS). The first byte of data clocked into the DI input provides the instruction code. Data on the  
DI input is sampled on the rising edge of clock with most significant bit (MSB) first.  
Instructions vary in length from a single byte to several bytes and may be followed by address bytes,  
data bytes, dummy bytes (don’t care), and in some cases, a combination. Instructions are completed  
with the rising edge of edge /CS. Clock relative timing diagrams for each instruction are included in  
figures 4 through 21. All read instructions can be completed after any clocked bit. However, all  
instructions that Write, Program or Erase must complete on a byte boundary (/CS driven high after a  
full 8-bits have been clocked) otherwise the instruction will be terminated. This feature further protects  
the device from inadvertent writes. Additionally, while the memory is being programmed or erased, or  
when the Status Register is being written, all instructions except for Read Status Register will be  
ignored until the program or erase cycle has completed.  
9.2.1 Manufacturer and Device Identification  
MANUFACTURER ID  
(M7-M0)  
Winbond Serial Flash  
EFh  
Device ID  
Instruction  
W25P80  
W25P16  
W25P32  
(ID7-ID0)  
ABH, 90h  
13h  
14h  
15h  
(ID15-ID0)  
9Fh  
2014h  
2015h  
2016h  
Publication Release Date: December 11, 2005  
Revision J  
- 13 -  
W25P80 / W25P16 / W25P32  
9.2.2 Instruction Set (1)  
INSTRUCTION  
BYTE 1  
BYTE 2 (5)  
BYTE 3  
BYTE 4 BYTE 5  
BYTE 6  
N-BYTES  
NAME  
CODE  
Write Enable  
06h  
Write Disable  
Read Status  
Register  
04h  
(2)  
05h  
(S7–S0)(1)  
Write Status  
Register  
Read Data  
01h  
03h  
0Bh  
S7–S0  
A23–A16  
A23–A16  
A15–A8  
A15–A8  
A7–A0  
A7–A0  
(D7–D0) (Next byte) continuous  
(Next Byte)  
Fast Read  
dummy  
(D7–D0)  
continuous  
Up to 256  
bytes  
Page Program  
02h  
A23–A16  
A23–A16  
A15–A8  
A15–A8  
A7–A0(3)  
A7–A0  
(D7–D0) (Next byte)  
(128 Words)  
(3)  
Sector Erase  
Chip Erase  
Power-down  
Read Parameter  
Page  
D8h  
C7h  
B9h  
53h  
5Bh  
Don’t care  
Don’t care  
Don’t care A7–A0  
Don’t care A7–A0  
D7-D0  
Next Byte  
D7-D0  
Next Byte  
Next Byte  
Fast Read  
Parameter Page  
dummy  
Up to 256  
bytes  
(128 Words)  
Program  
Parameter Page  
52h  
Don’t care  
Don’t care A7–A0(3)  
D7-D0  
D15-D8  
Erase Parameter  
Page  
Release Power-  
down / Device ID (4)  
Manufacturer/  
Device ID (4)  
D5h  
ABh  
90h  
(5)  
dummy  
dummy  
dummy  
dummy  
dummy  
00h  
(ID7-ID0)  
(M7-M0) (ID7-ID0)  
(ID15-ID8)  
Memory  
Type  
(M7-M0)  
Manufacturer  
(ID7-ID0)  
Capacity  
JEDEC ID  
9Fh  
Notes:  
1. Data bytes are shifted with Most Significant Bit first. Byte fields with data in parenthesis “( )” indicate data being  
read from the device on the DO pin.  
2. The Status Register contents will repeat continuously until //CS terminates the instruction.  
3. The Page Program instruction programs in increments of one word (two bytes) at a time. The Program  
address A23-A16 must be an “Even” Address (A0 must equal 0).  
4. See Manufacturer and Device Identification table for Device ID information  
5. The Device ID will repeat continuously until //CS terminates the instruction.  
- 14 -  
W25P80 / W25P16 / W25P32  
Write Disable (04h)  
The Write Enable instruction (Figure 4) sets the Write Enable Latch (WEL) bit in the Status Register to  
a 1. The WEL bit must be set prior to every Page Program, Sector Erase, Chip Erase and Write Status  
Register instruction. The Write Enable instruction is entered by driving /CS low, shifting the instruction  
code “06h” into the Data Input (DI) pin on the rising edge of CLK, and then driving /CS high.  
Figure 4. Write Disable Instruction Sequence Diagram  
9.2.3 Write Enable (06h)  
The Write Disable instruction (Figure 5) resets the Write Enable Latch (WEL) bit in the Status Register  
to a 0. The Write Disable instruction is entered by driving /CS low, shifting the instruction code “04h”  
into the DI pin and then driving /CS high. Note that the WEL bit is automatically reset after Power-up  
and upon completion of the Write Status Register, Page Program, Sector Erase, and Chip Erase  
instructions.  
Figure 5. Write Enable Instruction Sequence Diagram  
Publication Release Date: December 11, 2005  
- 15 -  
Revision J  
W25P80 / W25P16 / W25P32  
9.2.4 Read Status Register (05h)  
The Read Status Register instruction allows the 8-bit Status Register to be read. The instruction is  
entered by driving /CS low and shifting the instruction code “05h” into the DI pin on the rising edge of  
CLK. The status register bits are then shifted out on the DO pin at the falling edge of CLK with most  
significant bit (MSB) first as shown in figure 6. The Status Register bits are shown in figure 3 and  
include the BUSY, WEL, BP2-BP0, and SRP bits (see description of the Status Register earlier in this  
data sheet).  
The Status Register instruction may be used at any time, even while a Program, Erase or Write Status  
Register cycle is in progress. This allows the BUSY status bit to be checked to determine when the  
cycle is complete and if the device can accept another instruction. The Status Register can be read  
continuously, as shown in figure 6. The instruction is completed by driving /CS high.  
Figure 6. Read Status Register Instruction Sequence Diagram  
- 16 -  
W25P80 / W25P16 / W25P32  
9.2.5 Write Status Register (01h)  
The Write Status Register instruction allows the Status Register to be written. A Write Enable  
instruction must previously have been executed for the device to accept the Write Status Register  
Instruction (Status Register bit WEL must equal 1). Once write enabled, the instruction is entered by  
driving /CS low, sending the instruction code “01h”, and then writing the status register data byte as  
illustrated in figure 7. The Status Register bits are shown in figure 3 and described earlier in this data  
sheet.  
Only non-volatile Status Register bits SRP, BP2, BP1 and BP0 (bits 7, 4, 3 and 2) can be written to.  
All other Status Register bit locations are read-only and will not be affected by the Write Status  
Register instruction.  
The /CS pin must be driven high after the eighth bit of the last byte has been latched. If this is not  
done the Write Status Register instruction will not be executed. After /CS is driven high, the self-timed  
Write Status Register cycle will commence for a time duration of tW (See AC Characteristics). While  
the Write Status Register cycle is in progress, the Read Status Register instruction may still accessed  
to check the status of the BUSY bit. The BUSY bit is a 1 during the Write Status Register cycle and a  
0 when the cycle is finished and ready to accept other instructions again. After the Write Register  
cycle has finished the Write Enable Latch (WEL) bit in the Status Register will be cleared to 0.  
The Write Status Register instruction allows the Block Protect bits (BP2, BP1 and BP0) to be set for  
protecting all, a portion, or none of the memory from erase and program instructions. Protected areas  
become read-only (see Status Register Memory Protection table). The Write Status Register  
instruction also allows the Status Register Protect bit (SRP) to be set. This bit is used in conjunction  
with the Write Protect (/WP) pin to disable writes to the status register. When the SRP bit is set to a 0  
state (factory default) the /WP pin has no control over the status register. When the SRP pin is set to a  
1, the Write Status Register instruction is locked out while the /WP pin is low. When the /WP pin is  
high the Write Status Register instruction is allowed.  
Figure 7. Write Status Register Instruction Sequence Diagram  
Publication Release Date: December 11, 2005  
- 17 -  
Revision J  
W25P80 / W25P16 / W25P32  
9.2.6 Read Data (03h)  
The Read Data instruction allows one more data bytes to be sequentially read from the memory. The  
instruction is initiated by driving the /CS pin low and then shifting the instruction code “03h” followed  
by a 24-bit address (A23-A0) into the DI pin. The code and address bits are latched on the rising edge  
of the CLK pin. After the address is received, the data byte of the addressed memory location will be  
shifted out on the DO pin at the falling edge of CLK with most significant bit (MSB) first. The address is  
automatically incremented to the next higher address after each byte of data is shifted out allowing for  
a continuous stream of data. This means that the entire memory can be accessed with a single  
instruction as long as the clock continues. The instruction is completed by driving /CS high. The Read  
Data instruction sequence is shown in figure 8. If a Read Data instruction is issued while an Erase,  
Program or Write cycle is in process (BUSY=1) the instruction is ignored and will not have any effects  
on the current cycle. The Read Data instruction allows clock rates from D.C. to a maximum of fR ( see  
AC Electrical Characteristics).  
Figure 8. Read Data Instruction Sequence Diagram  
- 18 -  
W25P80 / W25P16 / W25P32  
9.2.7 Fast Read (0Bh)  
The Fast Read instruction is similar to the Read Data instruction except that it can operate at the  
highest possible frequency of FR (see AC Electrical Characteristics). This is accomplished by adding a  
“dummy” byte after the 24-bit address as shown in figure 9. The dummy byte allows the devices  
internal circuits additional time for setting up the initial address. The dummy byte data value on the DI  
pin is a “don’t care”.  
Figure 9. Fast Read Instruction Sequence Diagram  
Publication Release Date: December 11, 2005  
- 19 -  
Revision J  
W25P80 / W25P16 / W25P32  
9.2.8 Page Program (02h)  
The Page Program instruction allows up to 256 bytes of data to be programmed at previously erased  
to all 1s (FFh) memory locations. A Write Enable instruction must be executed before the device will  
accept the Page Program Instruction (Status Register bit WEL must equal 1). The instruction is  
initiated by driving the /CS pin low then shifting the instruction code “02h” followed by a 24-bit address  
(A23-A0) and at least two data bytes, into the DI pin. Because the W25P80/16/32 programs in  
increments of one word (two bytes) at a time the 24-bit address (A23-A0) must be an even address  
(A0 must equal 0). The /CS pin must be held low for the entire length of the instruction while data is  
being sent to the device. The Page Program instruction sequence is shown in figure 10.  
If an entire 256 byte page is to be programmed, the last address byte (the 8 least significant address  
bits) should be set to 0. If the last address byte is not zero, and the number of clocks exceed the  
remaining page length, the addressing will wrap to the beginning of the page. Less than 256 bytes can  
be programmed without having any effect on other bytes within the same page. If more than 256 bytes  
are sent to the device the addressing will wrap to the beginning of the page and overwrite previously  
sent data.  
As with the write and erase instructions, the /CS pin must be driven high after the eighth bit of the last  
byte has been latched. If this is not done the Page Program instruction will not be executed. After /CS  
is driven high, the self-timed Page Program instruction will commence for a time duration of tpp (See  
AC Characteristics). While the Page Program cycle is in progress, the Read Status Register  
instruction may still be accessed for checking the status of the BUSY bit. The BUSY bit is a 1 during  
the Page Program cycle and becomes a 0 when the cycle is finished and the device is ready to accept  
other instructions again. After the Page Program cycle has finished the Write Enable Latch (WEL) bit  
in the Status Register is cleared to 0. The Page Program instruction will not be executed if the  
addressed page is protected by the Block Protect (BP2, BP1, BP0) bits (see Status Register Memory  
Protection table).  
Figure 10. Page Program Instruction Sequence Diagram  
- 20 -  
W25P80 / W25P16 / W25P32  
9.2.9 Sector Erase (D8h)  
The Sector Erase instruction sets all memory within a specified sector to the erased state of all 1s  
(FFh). A Write Enable instruction must be executed before the device will accept the Erase Sector  
Instruction (Status Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin  
low and shifting the instruction code “D8h” followed a 24-bit sector address (A23-A0) (see Figure 2).  
The Sector Erase instruction sequence is shown in figure 11.  
The /CS pin must be driven high after the eighth bit of the last byte has been latched. If this is not  
done the Sector Erase instruction will not be executed. After /CS is driven high, the self-timed Sector  
Erase instruction will commence for a time duration of tSE (See AC Characteristics). While the Sector  
Erase cycle is in progress, the Read Status Register instruction may still be accessed for checking the  
status of the BUSY bit. The BUSY bit is a 1 during the Sector Erase cycle and becomes a 0 when the  
cycle is finished and the device is ready to accept other instructions again. After the Sector Erase  
cycle has finished the Write Enable Latch (WEL) bit in the Status Register is cleared to 0. The Sector  
Erase instruction will not be executed if the addressed page is protected by the Block Protect (BP2,  
BP1, BP0) bits (see Status Register Memory Protection table).  
Figure 11. Sector Erase Instruction Sequence Diagram  
Publication Release Date: December 11, 2005  
- 21 -  
Revision J  
W25P80 / W25P16 / W25P32  
9.2.10 Chip Erase (C7h)  
The Chip Erase instruction sets all memory within the device to the erased state of all 1s (FFh). A  
Write Enable instruction must be executed before the device will accept the Chip Erase Instruction  
(Status Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low and  
shifting the instruction code “C7h”. The Chip Erase instruction sequence is shown in figure 12.  
The /CS pin must be driven high after the eighth bit has been latched. If this is not done the Chip  
Erase instruction will not be executed. After /CS is driven high, the self-timed Chip Erase instruction  
will commence for a time duration of tCE (See AC Characteristics). While the Chip Erase cycle is in  
progress, the Read Status Register instruction may still be accessed to check the status of the BUSY  
bit. The BUSY bit is a 1 during the Chip Erase cycle and becomes a 0 when finished and the device is  
ready to accept other instructions again. After the Chip Erase cycle has finished the Write Enable  
Latch (WEL) bit in the Status Register is cleared to 0. The Chip Erase instruction will not be executed  
if any page is protected by the Block Protect (BP2, BP1, BP0) bits (see Status Register Memory  
Protection table).  
Figure 12. Chip Erase Instruction Sequence Diagram  
- 22 -  
W25P80 / W25P16 / W25P32  
9.2.11 Power-down (B9h)  
Although the standby current during normal operation is relatively low, standby current can be further  
reduced with the Power-down instruction. The lower power consumption makes the Power-down  
instruction especially useful for battery powered applications (See ICC1 and ICC2 in AC  
Characteristics). The instruction is initiated by driving the /CS pin low and shifting the instruction code  
“B9h” as shown in figure 13.  
The /CS pin must be driven high after the eighth bit has been latched. If this is not done the Power-  
down instruction will not be executed. After /CS is driven high, the power-down state will entered  
within the time duration of tDP (See AC Characteristics). While in the power-down state only the  
Release from Power-down / Device ID instruction, which restores the device to normal operation, will  
be recognized. All other instructions are ignored. This includes the Read Status Register instruction,  
which is always available during normal operation. Ignoring all but one instruction makes the Power  
Down state a useful condition for securing maximum write protection. The device always powers-up in  
the normal operation with the standby current of ICC1.  
Figure 13. Deep Power-down Instruction Sequence Diagram  
9.2.12 Release Power-down / Device ID (ABh)  
The Release from Power-down / Device ID instruction is a multi-purpose instruction. It can be used to  
release the device from the power-down state, obtain the devices electronic identification (ID) number  
or do both.  
When used only to release the device from the power-down state, the instruction is issued by driving  
the /CS pin low, shifting the instruction code “ABh” and driving /CS high as shown in figure 14. After  
the time duration of tRES1 (See AC Characteristics) the device will resume normal operation and other  
instructions will be accepted. The /CS pin must remain high during the tRES1 time duration.  
When used only to obtain the Device ID while not in the power-down state, the instruction is initiated  
by driving the /CS pin low and shifting the instruction code “ABh” followed by 3-dummy bytes. The  
Device ID bits are then shifted out on the falling edge of CLK with most significant bit (MSB) first as  
shown in figure 15. The Device ID values for the W25P80, W25P16 and W25P32 are listed in  
Manufacturer and Device Identification table. The Device ID can be read continuously. The instruction  
is completed by driving /CS high.  
Publication Release Date: December 11, 2005  
- 23 -  
Revision J  
W25P80 / W25P16 / W25P32  
When used to release the device from the power-down state and obtain the Device ID, the instruction  
is the same as previously described, and shown in figure 13, except that after /CS is driven high it  
must remain high for a time duration of tRES2 (See AC Characteristics). After this time duration the  
device will resume normal operation and other instructions will be accepted.  
If the Release from Power-down / Device ID instruction is issued while an Erase, Program or Write  
cycle is in process (when BUSY equals 1) the instruction is ignored and will not have any effects on  
the current cycle.  
Figure 14. Release Power-down Instruction Sequence  
Figure 15. Release Power-down / Device ID Instruction Sequence Diagram  
- 24 -  
W25P80 / W25P16 / W25P32  
9.2.13 Read Manufacturer / Device ID (90h)  
The Read Manufacturer/Device ID instruction is an alternative to the Release from Power-down /  
Device ID instruction that provides both the JEDEC assigned manufacturer ID and the specific device  
ID.  
The Read Manufacturer/Device ID instruction is very similar to the Release from Power-down / Device  
ID instruction. The instruction is initiated by driving the /CS pin low and shifting the instruction code  
“90h” followed by a 24-bit address (A23-A0) of 000000h. After which, the Manufacturer ID for Winbond  
(EFh) and the Device ID are shifted out on the falling edge of CLK with most significant bit (MSB) first  
as shown in figure 16. The Device ID values for the W25P80, W25P16 and W25P32 are listed in  
Manufacturer and Device Identification table. If the 24-bit address is initially set to 000001h the Device  
ID will be read first and then followed by the Manufacturer ID. The Manufacturer and Device IDs can  
be read continuously, alternating from one to the other. The instruction is completed by driving /CS  
high.  
Figure 16. Read Manufacturer / Device ID Diagram  
Publication Release Date: December 11, 2005  
- 25 -  
Revision J  
W25P80 / W25P16 / W25P32  
9.2.14 JEDEC ID (9Fh)  
For compatibility reasons, the W25P80/16/32 provides several instructions to electronically determine  
the identity of the device. The Read JEDEC ID instruction is compatible with the JEDEC standard for  
SPI compatible serial memories that was adopted in 2003.  
The instruction is initiated by driving the /CS pin low and shifting the instruction code “9Fh”. The  
JEDEC assigned Manufacturer ID byte for Winbond (EFh) and two Device ID bytes, Memory Type  
(ID15-ID8) and Capacity (ID7-ID0) are then shifted out on the falling edge of CLK with most significant  
bit (MSB) first as shown in figure 17. For the W25P80, the Memory Type is 20h and the Capacity is  
14h. For the W25P16, the Memory type is also 20h and the Capacity is 15h. For the W25P32, the  
Memory type is also 20h and the Capacity is 16h.  
Figure 17. Read JEDEC ID  
- 26 -  
W25P80 / W25P16 / W25P32  
9.2.15 Read Parameter Page (53h)  
The Parameter Page is a 256-byte page of Flash memory that can be used for storing serial numbers,  
revision information and configuration data that might typically be stored in an additional Serial  
EEPROM memory. Because the Parameter Page is relatively small and separate from the array, the  
erase time is significantly shorter than that of a sector erase (see tPE in AC Electrical Characteristics).  
This makes it convenient for more frequent updates.  
The Read Parameter Page instruction allows one or more bytes of the Parameter page to be read.  
The instruction is initiated by driving the /CS pin low and then shifting the instruction code “53h”  
followed by a 24-bit address (A23-A0) into the DI pin. Only the lower 8 address bits (A7-A0) are used,  
the 16 upper most address bits (A23-A8) are ignored (don’t care). The code and address bits are  
latched on the rising edge of the CLK pin. After the address is received, the data byte of the  
addressed memory location will be shifted out on the DO pin at the falling edge of CLK with most  
significant bit (MSB) first. The address is automatically incremented to the next higher address after  
each byte of data is shifted out allowing for a continuous stream of data. When the end of the  
Parameter page is reached the address will wrap to the beginning. The Read Parameter Page  
instruction is shown in figure 18. If the Read Parameter Page instruction is issued while an Erase,  
Program or Write cycle is in process (BUSY=1) the instruction is ignored and will not have any effects  
on the current cycle. The Read Parameter Page instruction allows clock rates from D.C. to a  
maximum of fR (see AC Electrical Characteristics).  
Figure 18. Read Parameter Page Instruction Sequence Diagram  
Publication Release Date: December 11, 2005  
- 27 -  
Revision J  
W25P80 / W25P16 / W25P32  
9.2.16 Fast Read Parameter Page (5Bh)  
The Fast Read Parameter Page instruction is basically the same as the Read Parameter Page  
instruction except that it allows for a faster clock rate to be used. The Fast Read Parameter Page  
instruction can opperate at clock rates from D.C. to a maximum of FR (see AC Electrical  
Characteristics). This is accomplished by adding a “dummy” byte after the 24-bit address, as shown in  
figure 19. The dummy byte allows the devices internal circuits additional time for setting up the initial  
address. The dummy byte data value on the DI pin is a “don’t care”.  
Figure 19. Fast Read Parameter Page Instruction Sequence Diagram  
- 28 -  
W25P80 / W25P16 / W25P32  
9.2.17 Program Parameter Page (52h)  
The Program Parameter Page instruction allows up to 256 bytes (128 words) to be programmed at  
memory word locations that have been previously erased to all 1s “FFFFh” (see Erase Parameter  
Page instruction). A Write Enable instruction must be executed before the device will accept the  
Program Parameter Page instruction (Status Register bit WEL must equal 1). The instruction is  
initiated by driving the /CS pin low then shifting the instruction code “52h” followed by a 24-bit address  
(A23-A0) and the full 256 data bytes, into the DI pin. Only the lower 8 address bits (A7-A0) are used,  
the 16 upper most address bit (A23-A8) are ignored (don’t care). Because the W25P80/16/32  
programs in increments of one word (two bytes) at a time, the address must be an even address (A0  
must equal 0). The /CS pin must be held low for the entire length of the instruction while data is being  
sent to the device. The Program Parameter Page instruction sequence is shown in figure 20.  
The start address of the needs to be set to 00h on the Parameter Page. If more than 256 bytes are  
sent to the device the addressing will wrap to the beginning of the page. If previously written data  
bytes are over-written the data will not be valid.  
In most applications it is best to read the full 256-byte contents of the page into a temporary RAM.  
Data can then be modified as needed and the entire 256 bytes can then be reprogrammed into the  
Parameter Page at one time.  
As with the write and erase instructions, the /CS pin must be driven high after the eighth bit of the last  
byte has been latched. If this is not done the Parameter Page Program instruction will not be  
executed. After /CS is driven high, the self-timed Page Program instruction will commence for a time  
duration of tPP (See AC Characteristics). While the Page Program cycle is in progress, the Read  
Status Register instruction may still be accessed for checking the status of the BUSY bit. The BUSY  
bit is a 1 during the program cycle and becomes a 0 when the cycle is finished and the device is ready  
to accept other instructions again. After the program cycle has finished the Write Enable Latch (WEL)  
bit in the Status Register is cleared to 0. The Program Parameter Page instruction will not be executed  
if the addressed page is protected by the Block Protect (BP2, BP1, BP0) bits (see Status Register  
Memory Protection table).  
Publication Release Date: December 11, 2005  
- 29 -  
Revision J  
W25P80 / W25P16 / W25P32  
Figure 20. Parameter Page Program Instruction Sequence Diagram  
- 30 -  
W25P80 / W25P16 / W25P32  
9.2.18 Erase Parameter Page (D5h)  
The Erase Parameter Page instruction sets all 256 bytes of memory in the Parameter Page to the  
erased state of all 1s (FFh). A Write Enable instruction must be executed before the device will accept  
the Erase Parameter Page instruction (Status Register bit WEL must equal 1). The instruction is  
initiated by driving the /CS pin low and shifting the instruction code “D5h”. The Erase Parameter Page  
instruction sequence is shown in figure 21.  
The /CS pin must be driven high after the eighth bit has been latched. If this is not done the Erase  
Parameter Page instruction will not be executed. After /CS is driven high, the self-timed Erase  
Parameter Page instruction will commence for a time duration of tPE (See AC Characteristics). While  
the Erase Parameter Page cycle is in progress, the Read Status Register instruction may still be  
accessed to check the status of the BUSY bit. The BUSY bit is a 1 during the Erase Parameter Page  
cycle and becomes a 0 when finished and the device is ready to accept other instructions again. After  
the Erase Parameter Page cycle has finished the Write Enable Latch (WEL) bit in the Status Register  
is cleared to 0. The Erase Parameter Page instruction will not be executed if any page is protected by  
the Block Protect (BP2, BP1, BP0) bits (see Status Register Memory Protection table).  
Figure 21. Parameter Page Erase Instruction Sequence Diagram  
Publication Release Date: December 11, 2005  
- 31 -  
Revision J  
W25P80 / W25P16 / W25P32  
10. ELECTRICAL CHARACTERISTICS  
(1)  
10.1 Absolute Maximum Ratings  
PARAMETERS  
Supply Voltage  
SYMBOL  
VCC  
CONDITIONS  
RANGE  
–0.6 to +4.0  
UNIT  
V
Voltage Applied to Any Pin  
Storage Temperature  
Lead Temperature  
VIO  
Relative to Ground  
–0.6 to VCC +0.4  
–65 to +150  
See Note 2  
V
TSTG  
°C  
°C  
V
TLEAD  
VESD  
Electrostatic Discharge Voltage  
Human Body Model(3)  
–2000 to +2000  
Notes:  
1. This device has been designed and tested for the specified operation ranges. Proper operation outside of these levels is not  
guaranteed. Exposure beyond absolute maximum ratings (listed above) may cause permanent damage.  
2. Compliant with JEDEC Standard J-STD-20C for small body Sn-Pb or Pb-free (Green) assembly and the European directive  
on restrictions on hazardous substances (RoHS) 2002/95/EU.  
3. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 ohms, R2=500 ohms).  
10.2 Operating Ranges  
SPEC  
PARAMETER  
SYMBOL  
CONDITIONS  
UNIT  
MIN  
2.7  
3.0  
MAX  
3.6  
FR = 33MHz, fR = 25MHz  
FR = 50MHz, fR = 25MHz  
V
V
Supply Voltage(1)  
VCC  
TA  
3.6  
Ambient Temperature,  
Operating  
Industrial  
–40  
+85  
°C  
Note:  
1. VCC voltage during Read can operate across the min and max range but should not exceed ±10% of the programming  
(erase/write) voltage.  
- 32 -  
W25P80 / W25P16 / W25P32  
10.3 Power-up Timing and Write Inhibit Threshold  
SPEC  
PARAMETER  
SYMBOL  
UNIT  
MIN  
10  
1
MAX  
VCC (min) to /CS Low  
Time Delay Before Write Instruction  
Write Inhibit Threshold Voltage  
tVSL(1)  
tPUW(1)  
VWI(1)  
µs  
ms  
V
10  
2
1
Note:  
1. These parameters are characterized only.  
Figure 22. Power-up Timing and Voltage Levels  
Publication Release Date: December 11, 2005  
Revision J  
- 33 -  
W25P80 / W25P16 / W25P32  
(1)  
10.4 DC Electrical Characteristics (Preliminary)  
SPEC  
TYP  
PARAMETER  
SYMBOL  
CONDITIONS  
UNIT  
MIN  
MAX  
6
8
(2)  
Input Capacitance  
Output Capacitance Cout  
CIN(2)  
VIN = 0V  
pf  
pf  
(2)  
(2)  
VOUT = 0V  
Input Leakage  
I/O Leakage  
ILI  
±2  
±2  
µA  
µA  
ILO  
/CS = VCC,  
Standby Current  
ICC1  
25  
<1  
4
75  
5
µA  
µA  
VIN = GND or VCC  
/CS = VCC,  
Power-down Current ICC2  
Current Read Data  
VIN = GND or VCC  
C = 0.1 VCC / 0.9 VCC  
DO = Open  
C = 0.1 VCC / 0.9 VCC  
DO = Open  
C = 0.1 VCC / 0.9 VCC  
DO = Open  
ICC3  
8
mA  
mA  
mA  
mA  
mA  
(3)  
1MHz  
Current Read Data  
8
15  
20  
25  
32  
(3)  
20MHz  
Current Read Data  
9
(3)  
33MHz  
Current Page  
ICC4  
/CS = VCC  
/CS = VCC  
16  
25  
Program  
Current Write Status  
ICC5  
Register  
Current Sector Erase ICC6  
/CS = VCC  
/CS = VCC  
20  
20  
25  
25  
VCC x0.3  
VCC +0.4  
0.4  
mA  
mA  
V
V
V
Current Chip Erase  
Input Low Voltage  
Input High Voltage  
Output Low Voltage  
ICC7  
VIL  
–0.5  
VCC x0.7  
VIH  
VOL  
IOL = 1.6 mA  
Output High Voltage VOH  
IOH = –100 µA  
VCC –0.2  
V
Notes:  
1 .See Preliminary Designation.  
2. Tested on sample basis and specified through design and characterization data. TA=25° C, VCC 3V  
3. Checker Board Pattern.  
- 34 -  
W25P80 / W25P16 / W25P32  
10.5 AC Measurement Conditions  
SPEC  
PARAMETER  
SYMBOL  
CL  
TR, TF  
VIN  
UNIT  
MIN  
30  
MAX  
30  
5
0.8 VCC  
0.7 VCC  
Load Capacitance  
Input Rise and Fall Times  
Input Pulse Voltages  
pF  
ns  
V
0.2 VCC to  
0.3 VCC to  
Output Timing Reference Voltages  
OUT  
V
Note:  
1. Output Hi-Z is defined as the point where data out is no longer driven.  
Figure 23. AC Measurement I/O Waveform  
Publication Release Date: December 11, 2005  
Revision J  
- 35 -  
W25P80 / W25P16 / W25P32  
10.6 AC Electrical Characteristics  
SPEC  
MIN TYP MAX  
DESCRIPTION  
SYMBOL ALT  
UNIT  
Clock frequency, for Fast Read (0Bh) and all  
other instructions except Read Data (03h)  
2.7V-3.6V VCC  
FR  
fC  
D.C.  
D.C.  
33  
50  
MHz  
MHz  
3.0V-3.6V VCC  
Clock freq. Read Data instruction 03h  
fR  
D.C.  
9
25  
MHz  
ns  
Clock High, Low Time, for Fast Read (0Bh) and  
all other instructions except Read Data (03h)  
tCLH,  
(1)  
tCLL  
tCRLH,  
Clock High, Low Time for Read Data instruction  
9
ns  
(1)  
tCRLL  
(2)  
Clock Rise Time peak to peak  
Clock Fall Time peak to peak  
/CS Active Setup Time relative to CLK  
/CS Not Active Hold Time relative to CLK  
Data In Setup Time  
tCLCH  
0.1  
0.1  
5
V/ns  
V/ns  
ns  
(2)  
tCHCL  
tSLCH  
tCHSL  
tDVCH  
tCHDX  
tCSS  
5
ns  
tDSU  
tDH  
2
ns  
Data In Hold Time  
5
ns  
/CS Active Hold Time relative to CLK  
(2.7V-3.6V / 3.0V-3.6V)  
tCHSH  
10/8  
5
ns  
/CS Not Active Setup Time relative to CLK  
/CS Deselect Time  
tSHCH  
tSHSL  
ns  
ns  
ns  
tCSH 100  
tDIS  
(2)  
Output Disable Time  
tSHQZ  
12/10  
12/8  
Clock Low to Output Valid  
tCLQV  
tCLQX  
tHLCH  
tchhh  
tV  
ns  
ns  
ns  
ns  
(2.7V-3.6V / 3.0V-3.6V)  
Output Hold Time  
tHO  
0
5
5
/HOLD Active Setup Time relative to CLK  
(2.7V-3.6V / 3.0V-3.6V)  
/HOLD Active Hold Time relative to CLK  
- 36 -  
W25P80 / W25P16 / W25P32  
AC Electrical Characteristics, continued  
SPEC  
MIN TYP MAX  
DESCRIPTION  
SYMBOL ALT  
UNIT  
/HOLD Not Active Setup Time relative to CLK  
/HOLD Not Active Hold Time relative to CLK  
/HOLD to Output Low-Z  
tHHCH  
5
5
ns  
ns  
ns  
ns  
ns  
ns  
µs  
tCHHL  
(2)  
tHHQX  
tLZ  
9
(2)  
/HOLD to Output High-Z  
tHLQZ  
tWHSL  
tSHWL  
tHZ  
9
(4)  
(4)  
Write Protect Setup Time Before /CS Low  
Write Protect Hold Time After /CS High  
/CS High to Power-down Mode  
20  
100  
3
(2)  
tDP  
/CS High to Standby Mode without Electronic  
Signature Read  
tRES1(2)  
30  
30  
µs  
/CS High to Standby Mode with Electronic  
Signature Read  
tRES2(2)  
tW  
µs  
Write Status Register Cycle Time  
17  
30  
ms  
Page Program Cycle Time (5)  
3.0V-3.6V VCC  
tPP  
tSE  
tCE  
tPE  
3.5  
4
7
8
ms  
ms  
2.7V-3.6V VCC  
Sector Erase Cycle Time  
0.6  
1.5  
s
Chip Erase Cycle Time W25P80  
Chip Erase Cycle Time W25P16  
Chip Erase Cycle Time W25P32  
7
20  
40  
80  
s
s
s
12  
25  
Parameter Page Erase Cycle Time  
100  
200  
ms  
Notes:  
1. Clock high + Clock low must be less than or equal to 1/fC.  
2. Value guaranteed by design and/or characterization, not 100% tested in production.  
3. Expressed as a slew-rate.  
4. Only applicable as a constraint for a Write Status Register instruction when Sector Protect Bit is set at 1.  
5. Maximum Tpp uses worse-case user pattern at 85°C.  
Publication Release Date: December 11, 2005  
Revision J  
- 37 -  
W25P80 / W25P16 / W25P32  
10.7 Serial Output Timing  
10.8 Input Timing  
10.9 Hold Timing  
- 38 -  
W25P80 / W25P16 / W25P32  
11. PACKAGE SPECIFICATION  
11.1 8-Pin SOIC 208-mil (Winbond Package Code SS)  
MILLIMETERS  
INCHES  
SYMBOL  
MIN  
MAX  
MIN  
MAX  
A
A1  
A2  
b
1.75  
0.05  
1.70  
0.35  
0.19  
5.18  
7.70  
5.18  
2.16  
0.25  
1.91  
0.48  
0.25  
5.38  
8.10  
5.38  
0.069  
0.002  
0.067  
0.014  
0.007  
0.204  
0.303  
0.204  
0.085  
0.010  
0.075  
0.019  
0.010  
0.212  
0.319  
0.212  
C
D
E
E1  
e
1.27 BSC  
0.050 BSC  
L
θ
y
0.50  
0.80  
0.020  
0.031  
o
o
o
o
0
8
0
8
---  
0.10  
---  
0.004  
Notes:  
1. Controlling dimensions: inches, unless otherwise specified.  
2. BSC = Basic lead spacing between centers.  
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package.  
Publication Release Date: December 11, 2005  
- 39 -  
Revision J  
W25P80 / W25P16 / W25P32  
11.2 16-Pin SOIC 300-mil (Winbond Package Code SF)  
MILLIMETERS  
INCHES  
MIN  
SYMBOL  
MIN  
2.36  
0.10  
0.33  
0.18  
10.08  
10.01  
7.39  
MAX  
2.64  
0.30  
0.51  
0.28  
10.49  
10.64  
7.59  
MAX  
0.104  
0.012  
0.020  
0.011  
0.413  
0.419  
0.299  
A
A1  
b
0.093  
0.004  
0.013  
0.007  
0.397  
0.394  
0.291  
C
D(3)  
E
E1(3)  
e(2)  
L
1.27 BSC  
0.050 BSC  
0.39  
0
1.27  
8
0.015  
0
0.050  
o
o
o
o
8
θ
y
---  
0.076  
---  
0.003  
Notes:  
1. Controlling dimensions: inches, unless otherwise specified.  
2. BSC = Basic lead spacing between centers.  
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package.  
- 40 -  
W25P80 / W25P16 / W25P32  
12. ORDERING INFORMATION  
Publication Release Date: December 11, 2005  
- 41 -  
Revision J  
W25P80 / W25P16 / W25P32  
13. REVISION HISTORY  
VERSION  
DATE  
PAGE  
DESCRIPTION  
A
03/05/04  
New Create  
MLP metal die pad notification; Under "Package  
Types," figure 1 and packaging information.  
Corrected timing diagrams for figure 16 (Read  
Manufacturer / Device ID Diagram) and figure 17  
(Read JEDEC ID). Added 8x6mm MLP Package for  
W25P16/32.  
Corrected dimensions in Packaging Information  
section for 6x5mm and 8x6mm MLP.  
Changed 200-mil SOIC reference to 208-mil SOIC.  
Updated dimensional table for the 208milSOIC in the  
packaging information. Added 208milSOIC and  
removed 5x6mm MLP for W25P16.  
B
C
D
E
03/24/04  
04/19/04  
05/06/04  
06/28/04  
Added Parameter Page data to Features, Block  
Diagram (Figure 2), Status Register Memory  
Protection, Instruction Set and Manufacturer and  
Device Identification. Added Parameter Page timing  
diagrams (Figures 20, 21, 22 and 23). Updated FR,  
tCH AND tPE data in AC Electrical Characteristics  
F
10/07/04  
Updated AC and DC parameters and package type  
descriptions. Removed 8-contact 6x5 and 8x6 MLP  
packages from document. Corrected data in  
Instruction Set. Updated package dimension symbols  
for compliance.  
G
04/22/05  
H
I
06/14/05  
06/28/05  
Updated Important Notice  
Changed NexFlash part numbers to Winbond part  
numbers and updated ordering and contact  
information  
Updated data sheet to comply with Winbond  
standard.  
Updated FR and fR values in Operating Ranges  
Table and AC Characteristics Table. Updated Read  
Data (fR) values in Operating Range and AC  
Characteristics Tables from 33MHz to 25MHz.  
J
12/11/05  
ALL  
Corrected the pin assignment on table of pin  
description of page 5.  
- 42 -  
W25P80 / W25P16 / W25P32  
Preliminary Designation  
The “Preliminary” designation on a Winbond data sheet indicates that the product is not fully  
characterized. The specifications are subject to change and are not guaranteed. Winbond or an  
authorized sales representative should be consulted for current information before using this product.  
Trademarks  
Winbond and spiFlash are trademarks of Winbond  
Electronics Corporation All other marks are the property of their respective owner.  
Important Notice  
Winbond products are not designed, intended, authorized or warranted for use as components  
in systems or equipment intended for surgical implantation, atomic energy control  
instruments, airplane or spaceship instruments, transportation instruments, traffic signal  
instruments, combustion control instruments, or for other applications intended to support or  
sustain life. Further more, Winbond products are not intended for applications wherein failure  
of Winbond products could result or lead to a situation wherein personal injury, death or  
severe property or environmental damage could occur.  
Winbond customers using or selling these products for use in such applications do so at their  
own risk and agree to fully indemnify Winbond for any damages resulting from such improper  
use or sales.  
The Winbond W25P80/16/32 are fully compatible with the previous NexFlash NX25P80/16/32 Serial  
Flash memories.  
Publication Release Date: December 11, 2005  
- 43 -  
Revision J  

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