TLP190B_07 [TOSHIBA]

Photocoupler GaAГAs Ired & Photo−Diode Array; 光电耦合器GaAГAs IRED与光电二极管阵列
TLP190B_07
型号: TLP190B_07
厂家: TOSHIBA    TOSHIBA
描述:

Photocoupler GaAГAs Ired & Photo−Diode Array
光电耦合器GaAГAs IRED与光电二极管阵列

光电 二极管 光电二极管
文件: 总5页 (文件大小:167K)
中文:  中文翻译
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TLP190B  
TOSHIBA Photocoupler GaAAs Ired & PhotoDiode Array  
TLP190B  
Telecommunication  
Unit in mm  
Programmable Controllers  
MOS Gate Driver  
MOS FET Gate Driver  
The TOSHIBA mini flat coupler TLP190B is a small outline coupler,  
suitable for surface mount assembly.  
The TLP190B consists of a GaAAs light emitting diode, optically  
coupled to a series connected photo diode array which is suitable for  
MOS FET gate drive.  
Open voltage: 7.0V (min.)  
Short current: 12.0μA (min.)  
Isolation voltage: 2500Vrms (min.)  
UL recognized: UL1577, file no. E67349  
TOSHIBA  
114C1  
Weight: 0.09 g  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
50  
Unit  
mA  
Pin Configuration (top view)  
Forward current  
I
F
6
1
Forward current  
derating (Ta 25°C)  
ΔI / °C  
F
0.5  
mA / °C  
LED  
Pulse forward current  
(100μs pulse 100pps)  
I
1
A
FP  
3
4
Reverse voltage  
V
3
125  
V
R
Junction temperature  
Forward current  
T
°C  
μA  
V
j
1. Anode  
I
50  
FD  
3. Cathode  
4. Cathode  
6. Anode  
Detector  
Reverse voltage  
V
10  
RD  
Junction temperature  
T
125  
°C  
°C  
°C  
°C  
j
Storage temperature range  
T
55~125  
40~85  
260  
stg  
opr  
Operating temperature range  
Lead soldering temperature (10 s)  
T
T
sol  
BV  
Isolation voltage  
(AC, 1 min., R.H. 60%)  
2500  
Vrms  
S
(Note)  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
(Note) Device considered a two terminal device: Pins 1 and 3 shorted together and pins 4 and 6 shorted together.  
1
2007-10-01  
TLP190B  
Recommended Operating Conditions  
Characteristic  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Forward current  
Operating temperature  
I
20  
25  
85  
mA  
°C  
F
T
opr  
25  
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the  
device. Additionally, each item is an independent guideline respectively. In developing designs using this  
product, please confirm specified characteristics shown in this document.  
Individual Electrical Characteristics (Ta = 25°C)  
Characteristic  
Symbol  
Test Condition  
= 10 mA  
F
Min.  
Typ.  
Max.  
Unit  
Forward voltage  
Reverse current  
Capacitance  
V
I
1.2  
1.4  
30  
7
1.7  
10  
60  
V
μA  
pF  
V
F
I
V = 3 V  
R
R
LED  
C
V = 0, f = 1 MHz  
= 10 μA  
T
Forward voltage  
Reverse current  
V
I
C
FD  
RD  
I
V
= 10 V  
1
nA  
R
Detector  
Capacitance  
(anode to cathode)  
C
TD  
V = 0, f = 1 MHz  
pF  
Coupled Electrical Characteristics (Ta = 25°C)  
Characteristic  
Symbol  
Test Condition  
MIn.  
Typ.  
Max.  
Unit  
Open voltage  
Short current  
V
I
I
= 10 mA  
= 10 mA  
7
8
V
OC  
F
F
I
12  
20  
μA  
SC  
Isolation Characteristics (Ta = 25°C)  
Characteristic  
Symbol  
Test Condition  
Min.  
Typ.  
Max.  
Unit  
Capacitance input to output  
Isolation resistance  
C
R
V
V
= 0, f = 1 MHz  
5×1010  
2500  
0.8  
1014  
pF  
S
S
S
S
= 500 V, R.H. 60%  
AC, 1 minute  
Vrms  
Vdc  
Isolation voltage  
BV  
S
AC, 1 second in oil  
DC, 1 minute in oil  
5000  
5000  
Switching Characteristics (Ta = 25°C)  
Characteristic  
Symbol  
Test Condition  
Min.  
Typ.  
Max.  
Unit  
Turnon time  
Turnoff time  
t
0.2  
1
ms  
ms  
ON  
I
= 20 mA, R  
SH  
L
= 510 kΩ  
F
C = 1000pF  
(Fig. 1)  
t
OFF  
Fig. 1 Switching time test circuit  
I
V
F
OUT  
I
F
C
L
R
SH  
V
5V  
OUT  
1V  
0V  
t
t
ON  
OFF  
R
SH :  
External shunt resistance  
2
2007-10-01  
TLP190B  
I
F
Ta  
ΔV /ΔTa – I  
F
F
100  
4.0  
3.6  
3.2  
2.8  
80  
60  
40  
2.4  
2.0  
1.6  
1.2  
0.8  
20  
0
1
20  
60  
0.1  
0.3  
0.5  
3
30  
10  
0
40  
80  
100  
20  
Ambient temperature Ta (°C)  
Forward current  
I
(mA)  
F
I
– V  
I
– D  
R
F
F
FP  
100  
5000  
3000  
Pulse width 100μs  
Ta = 25 °C  
Ta = 25 °C  
50  
30  
1000  
500  
300  
10  
100  
5
3
50  
30  
10  
1
1.0  
3
2
1
0
1.6  
1.8  
1.4  
2.0  
2.2  
1.2  
3
10  
3
10  
3
10  
3
10  
Forward voltage  
V
F
(V)  
Duty cycle ratio  
D
R
3
2007-10-01  
TLP190B  
t
t
– C  
I
O
– V  
O
ON, OFF L  
100  
Ta = 25 °C  
R
=2.4MΩ  
SH  
t
t
OFF  
ON  
40  
20  
30  
10  
1MΩ  
510kΩ  
300kΩ  
Ta = 25 °C  
I
= 20 mA  
F
3
1
I
=0mA  
F
I
=20mA  
F
V
0
OUT  
5mA  
R
SH  
C
L
10mA  
0.3  
0.1  
20  
I
F
15mA  
20mA  
300kΩ  
510kΩ  
1MΩ  
V
4
OUT  
0V  
5V  
40  
60  
1V  
0.03  
0.01  
25mA  
2.4MΩ  
t
t
OFF  
ON  
2
3
0
6
10  
2
8
4
10  
300  
10  
3000 10  
Load capacitance  
C
L
( F)  
P
Output voltage  
V
O
(V)  
V
– I  
F
I
– I  
F
OC  
SC  
10  
100  
R
SH  
OPEN  
50  
30  
8
6
4
1MΩ  
10  
510kΩ  
3
1
300kΩ  
0.5  
0.3  
2
0
Ta = 25 °C  
Ta = 25 °C  
R
=2.4MΩ  
SH  
0.1  
1
1
100  
3
5
10  
30  
50  
100  
3
5
10  
30  
50  
Forward current  
I
(mA)  
Forward current  
I
(mA)  
F
F
V
Ta  
I
Ta  
SC  
OC  
12  
10  
8
24  
20  
16  
6
4
12  
8
2
0
4
0
I
= 10mA  
I = 10mA  
F
F
20  
40  
120  
20  
40  
120  
20  
60  
80  
100  
20  
60  
80  
100  
0
0
Ambient temperature Ta (°C)  
Ambient temperature Ta (°C)  
4
2007-10-01  
TLP190B  
RESTRICTIONS ON PRODUCT USE  
20070701-EN  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patents or other rights of  
TOSHIBA or the third parties.  
GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break,  
cut, crush or dissolve chemically.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
5
2007-10-01  

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