TMS27PC020-15JL [TI]

READ-ONLY MEMORIES; 只读存储器
TMS27PC020-15JL
型号: TMS27PC020-15JL
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

READ-ONLY MEMORIES
只读存储器

存储
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TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
J PACKAGE  
(TOP VIEW)  
Organization . . . 262144 by 8 Bits  
Single 5-V Power Supply  
V
V
CC  
Operationally Compatible With Existing  
Megabit EPROMs  
1
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
PP  
A16  
A15  
A12  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
PGM  
A17  
A14  
A13  
A8  
A9  
A11  
G
2
3
Industry Standard 32-Pin Dual-In-line  
Package and 32-Lead Plastic Leaded Chip  
Carrier  
4
5
6
All Inputs/Outputs Fully TTL Compatible  
7
±10% V  
Tolerance  
CC  
8
Max Access/Min Cycle Time  
± 10%  
9
V
A10  
E
10  
11  
12  
13  
14  
15  
16  
CC  
’27C/PC020-10  
’27C/PC020-12  
’27C/PC020-15  
’27C/PC020-20  
’27C/PC020-25  
100 ns  
120 ns  
150 ns  
200 ns  
250 ns  
A0  
DQ7  
DQ6  
DQ5  
DQ4  
DQ3  
DQ0  
DQ1  
DQ2  
GND  
8-Bit Output For Use in  
Microprocessor-Based Systems  
Very High-Speed SNAP! Pulse  
Programming  
TMS27PC020  
FM PACKAGE  
(TOP VIEW)  
Power Saving CMOS Technology  
3-State Output Buffers  
400 mV Minimum DC Noise Immunity With  
Standard TTL Loads  
4
3 2 1 32 31 30  
A7  
A6  
A14  
5
29  
Latchup Immunity of 250 mA on All Input  
and Output Pins  
6
28 A13  
27 A8  
26 A9  
A5  
7
No Pullup Resistors Required  
A4  
8
9
25  
24  
23  
22  
21  
A3  
A11  
G
Low Power Dissipation (V  
= 5.5 V)  
CC  
10  
11  
12  
13  
A2  
– Active . . . 165 mW Worst Case  
– Standby . . . 0.55 mW Worst Case  
(CMOS-Input Levels)  
A1  
A10  
E
A0  
DQ0  
DQ7  
Temperature Range Options  
14 15 16 17 18 19 20  
description  
The TMS27C020 series are 262144 by 8-bit  
(2097152-bit), ultraviolet (UV) light erasable,  
electrically programmable read-only memories  
(EPROMs).  
PIN NOMENCLATURE  
A0A17  
Address Inputs  
DQ0DQ7  
Inputs (programming)/Outputs  
Chip Enable  
E
G
GND  
PGM  
Output Enable  
Ground  
Program  
5-V Power Supply  
13-V Power Supply  
The TMS27PC020 series are one-time program-  
mable (OTP) electrically programmable read-only  
memories (PROMs).  
V
CC  
V
PP  
† Only in program mode  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 1997, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
description (continued)  
These devices are fabricated using power-saving CMOS technology for high speed and simple interface with  
MOS and bipolar circuits. All inputs (including program data inputs) can be driven by Series 74 TTL circuits  
without the use of external pullup resistors. Each output can drive one Series 74 TTL circuit without external  
resistors.  
The TMS27C020 EPROM is offered in a dual-in-line ceramic package (J suffix) designed for insertion in  
mounting hole rows on 15,2-mm (600-mil) centers. The TMS27C020 is also offered with two choices of  
temperature ranges of 0° to 70°C (JL suffix) and – 40°C to 85°C (JE suffix). See Table 1.  
The TMS27PC020 is offered in a 32-lead plastic leaded chip carrier using 1,25 mm (50 mil) lead spacing  
(FM suffix). The TMS27PC020 is offered with two choices of temperature ranges of 0°C to 70°C (FML suffix)  
and – 40°C to 85°C (FME suffix). See Table 1.  
Table 1. Temperature Range Suffixes  
SUFFIX FOR OPERATING  
TEMPERATURE RANGES  
FUNCTION  
0°C TO 70°C  
40 °C TO 85°C  
TMS27C040-XXX  
TMS27PC040-XXX  
JL  
JE  
FML  
FME  
These EPROMs operate from a single 5-V supply (in the read mode), they are ideal for use in  
microprocessor-based systems. One other (13 V) supply is needed for programming. All programming signals  
are TTL level. For programming outside the system, existing EPROM programmers can be used.  
operation  
The seven modes of operation for the TMS27C020 and TMS27PC020 are listed in Table 2. The read mode  
requiresasingle5-Vsupply. AllinputsareTTLlevelexceptforV duringprogramming(13V), andV (12V)on  
PP  
H
A9forthesignaturemode.  
Table 2. Operation Modes  
MODE  
FUNCTION  
OUTPUT  
DISABLE  
PROGRAM  
INHIBIT  
READ  
STANDBY  
PROGRAMMING  
VERIFY  
SIGNATURE MODE  
E
G
V
V
V
V
V
V
V
V
V
V
IL  
IL  
IH  
IL  
IL  
IH  
IL  
V
IH  
X
V
IH  
X
X
IL  
IL  
IL  
PGM  
X
X
X
V
IL  
V
IH  
X
V
X
V
V
V
V
V
V
V
V
V
PP  
CC  
CC  
PP  
PP  
PP  
CC  
V
CC  
V
V
CC  
X
V
CC  
X
V
CC  
X
CC  
X
CC  
X
CC  
X
CC  
A9  
A0  
V ‡  
V ‡  
H
H
X
X
X
X
X
X
V
IL  
V
IH  
CODE  
DQ0DQ7  
Data Out  
Hi-Z  
Hi-Z  
Data In  
Data Out  
Hi-Z  
MFG  
97  
DEVICE  
32  
X can be V or V  
IL  
H
IH  
= 12 V ± 0.5 V  
V
2
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
read/output disable  
When the outputs of two or more TMS27C020s or TMS27PC020s are connected in parallel on the same bus,  
the output of any particular device in the circuit can be read with no interference from competing outputs of the  
other devices. To read the output of a single device, a low level signal is applied to the E and G pins. All other  
devices in the circuit should have their outputs disabled by applying a high level signal to one of these pins.  
latchup immunity  
Latchup immunity on the TMS27C020 and TMS72PC020 is a minimum of 250 mA on all inputs and outputs.  
This feature provides latchup immunity beyond any potential transients at the P.C. board level when the EPROM  
is interfaced to industry standard TTL or MOS logic devices. The input/output layout approach controls latchup  
without compromising performance or packing density.  
power down  
Active I  
supply current can be reduced from 30 mA to 500 µA by applying a high TTL input on E and to  
CC  
100 µA by applying a high CMOS input on E. In this mode all outputs are in the high-impedance state.  
erasure  
Before programming, the TMS27C020 is erased by exposing the chip through the transparent lid to a high  
intensity ultraviolet light (wavelength 2537 Å). The recommended minimum exposure dose  
2
2
(UV intensity × exposure time) is 15-W s/cm . A typical 12-mW/cm , filterless UV lamp erases the device in  
21 minutes. The lamp should be located about 2.5 cm above the chip during erasure. After erasure, all bits are  
in the high state. It should be noted that normal ambient light contains the correct wavelength for erasure.  
Therefore, when using the TMS27C020, the window should be covered with an opaque label. After erasure (all  
bits in logic high state), logic lows are programmed into the desired locations. A programmed low can be erased  
only by ultraviolet light.  
SNAP! Pulse programming  
The TMS27C020 and TMS27PC020 are programmed using the TI SNAP! Pulse programming algorithm,  
illustrated by the flowchart in Figure 1, which programs in a nominal time of twenty-six seconds. Actual  
programming time varies as a function of the programmer used.  
The SNAP! Pulse programming algorithm uses an initial pulse of 100 microseconds (µs) followed by a byte  
verification to determine when the addressed byte has been successfully programmed. Up to ten 100-µs pulses  
per byte are provided before a failure is recognized.  
The programming mode is achieved when V equals 13 V, V  
in parallel (eight bits) on pins DQ0 through DQ7. Once addresses and data are stable, PGM is pulsed low.  
= 6.5 V, E = V , G = V . Data is presented  
IL IH  
PP  
CC  
More than one device can be programmed when the devices are connected in parallel. Locations can be  
programmed in any order. When the SNAP! Pulse programming routine is complete, all bits are verified with  
V
= V = 5 V ± 10%.  
CC  
PP  
program inhibit  
Programming can be inhibited by maintaining a high level input on the E or PGM pins.  
program verify  
Programmed bits can be verified with V equals 13 V when G = V , E = V , and PGM = V .  
PP  
IL  
IL  
IH  
signature mode  
The signature mode provides access to a binary code identifying the manufacturer and type. This mode is  
activated when A9 (pin 26) is forced to 12 V. Two identifier bytes are accessed by toggling A0. All other  
addresses must be held low. The signature code for the TMS27C020 is 9732. A0 low selects the manufacturer’s  
code 97 (Hex), and A0 high selects the device code 32 (Hex), as shown in Table 3.  
3
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
signature mode (continued)  
Table 3. Signature Mode  
PINS  
IDENTIFIER  
A0  
DQ7  
DQ6  
DQ5  
DQ4  
DQ3  
DQ2  
DQ1  
DQ0  
HEX  
97  
MANUFACTURER CODE  
DEVICE CODE  
V
1
0
0
0
0
1
1
1
0
0
1
0
1
1
1
0
IL  
V
IH  
32  
E = G = V , A1A8 = V , A9 = V , A10A17 = V , V  
IL IL IL PP  
= V  
.
CC  
H
4
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
Start  
Address = First Location  
Program  
Mode  
V
CC  
= 6.5 V ± 0.25 V, V = 13 V ± 0.25 V  
PP  
Program One Pulse = t = 100 µs  
Increment Address  
w
No  
Last  
Address?  
Yes  
Address = First Location  
X = 0  
Program One Pulse = t = 100 µs  
w
No  
Fail  
Increment  
Address  
Verify  
One Byte  
X = X + 1  
X = 10?  
Interactive  
Mode  
Pass  
No  
Last  
Address?  
Yes  
Yes  
Device Failed  
V
CC  
= V  
= 5 V ± 0.5 V  
PP  
Compare  
All Bytes  
to Original  
Data  
Fail  
Final  
Verification  
Pass  
Device Passed  
Figure 1. SNAP! Pulse Programming Flowchart  
5
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
logic symbol  
EPROM 262 144 × 8  
12  
11  
10  
9
8
7
0
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
13  
14  
15  
17  
18  
19  
20  
21  
A
A
A
A
A
A
A
A
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
6
5
27  
26  
23  
25  
4
28  
29  
3
0
A
262 143  
A9  
A10  
A11  
A12  
A13  
A14  
A15  
A16  
A17  
2
30  
17  
22  
24  
E
[PWR DOWN]  
&
EN  
G
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers are for the J package.  
6
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
(see Note 1) : . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 V to 7 V  
CC  
PP  
Supply voltage range, V : . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 V to 14 V  
Input voltage range (see Note 1), All inputs except A9 : . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 V to V  
+ 1 V  
CC  
A9 : . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 V to 13.5 V  
Output voltage range, with respect to V (see Note 1) : . . . . . . . . . . . . . . . . . . . . . . . . . . 0.6 V to V + 1 V  
SS  
CC  
Operating free-air temperature range (’27C020-_ _ JL, ’27PC020_ _FML) : . . . . . . . . . . . . . . . . . 0°C to 70°C  
Operating free-air temperature range (’27C020-_ _JE, ’27PC020-_ _FME) : . . . . . . . . . . . . . . . – 40°C to 85°C  
Storage temperature range, T : . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: All voltage values are with respect to GND.  
recommended operating conditions  
MIN  
4.5  
NOM  
MAX  
5.5  
UNIT  
Read mode (see Note 2)  
5
V
V
V
V
V
V
V
V
Supply voltage  
CC  
PP  
IH  
SNAP! Pulse programming algorithm  
6.25  
6.5  
6.75  
Read mode  
V
V
0.6  
V
CC  
13  
V
+0.6  
CC  
CC  
Supply voltage  
SNAP! Pulse programming algorithm  
12.75  
2
13.25  
TTL  
V
V
+0.5  
CC  
High-level dc input voltage  
Low-level dc input voltage  
V
V
CMOS  
TTL  
0.2  
CC  
0.5  
+0.5  
CC  
0.8  
IL  
CMOS  
0.5  
GND+0.2  
’27C020-_ _JL,  
’27PC020-_ _FML  
T
Operating free-air temperature  
Operating free-air temperature  
0
70  
°C  
°C  
A
’27C020-_ _JE,  
’27PC020-_ _FME  
T
A
– 40  
85  
NOTE 2:  
V
must be applied before or at the same time as V  
PP  
and removed after or at the same time as V . The device must not be  
PP  
is applied.  
CC  
CC  
inserted into or removed from the board when V  
or V  
PP  
electrical characteristics over full ranges of operating conditions  
PARAMETER  
TEST CONDITIONS  
= 20 µA  
MIN  
V – 0.2  
MAX  
UNIT  
I
I
I
I
OH  
OH  
OL  
OL  
CC  
2.4  
V
V
High-level dc output voltage  
V
OH  
= – 2 mA  
= 2.1 mA  
= 20 µA  
0.4  
0.1  
±1  
Low-level dc output voltage  
V
OL  
I
I
I
I
Input current (leakage)  
Output current (leakage)  
V = 0 V to 5.5 V  
µA  
µA  
µA  
mA  
I
I
V
V
V
V
V
V
= 0 V to V  
CC  
±1  
O
O
V
V
supply current  
= V  
= 5.5 V  
10  
PP1  
PP2  
PP  
PP  
PP  
CC  
CC  
CC  
= 13 V  
= 5.5 V, . . . E = V  
supply current (during program pulse)  
50  
PP  
TTL-input level  
CMOS-input level  
500  
100  
IH  
CC  
IL  
I
V
supply current (standby)  
supply current (active)  
µA  
CC1  
CC2  
CC  
CC  
= 5.5 V,  
E = V  
± 0.2 V  
= 5.5 V,  
E = V  
CC  
I
V
t
= minimum cycle time,  
30  
mA  
cycle  
outputs open  
Minimum cycle time = maximum access time.  
7
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
capacitance over recommended ranges of supply voltage and operating free-air temperature,  
f = 1 MHz†  
PARAMETER  
TEST CONDITIONS  
V = 0 V, f = 1 MHz  
= 0 V, f = 1 MHz  
MIN NOM  
MAX  
8
UNIT  
pF  
C
C
Input capacitance  
Output capacitance  
4
6
I
I
V
O
10  
pF  
O
Capacitance measurements are made on sample basis only.  
All typical values are at T = 25°C and nominal voltages.  
A
switching characteristics over full ranges of recommended operating conditions (see Notes 3  
and 4)  
’27C020-10  
27PC020-10  
’27C020-12  
27PC020-12  
’27C020-15  
’27PC020-15  
27C020-20  
27PC020-20  
’27C020-25  
’27PC020-25  
TEST  
CONDITIONS  
PARAMETER  
UNIT  
ns  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
Access  
from address  
time  
t
t
t
100  
120  
150  
200  
250  
a(A)  
Access  
from chip en-  
able  
time  
100  
55  
120  
55  
150  
75  
200  
75  
250  
100  
ns  
a(E)  
Output enable  
time from G  
ns  
en(G)  
CL = 100 pF,  
1 Series 74  
TTL load,  
Output disable  
time from G or  
Input t 20 ns,  
r
t
0
0
50  
0
0
50  
0
0
60  
0
0
60  
0
0
80  
ns  
ns  
dis  
E,  
whichever  
Input t 20 ns  
f
occurs first  
Output data  
valid time after  
change of ad-  
dress, E, or G,  
whichever oc-  
t
v(A)  
§
curs first  
§
Value calculated from 0.5-V delta to measured output level. This parameter is sampled and not 100% tested.  
NOTES: 3. For all switching characteristics, the input pulse levels are 0.4 V to 2.4 V. Timing measurements are made at 2 V for logic high  
and 0.8 V for logic low. (See Figure 2).  
4. Common test conditions apply for t  
except during programming.  
dis  
8
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
switching characteristics for programming: V  
(see Note 3)  
= 6.5 V and V = 13 V (SNAP! Pulse), T = 25°C  
PP  
CC  
A
PARAMETER  
MIN  
MAX  
UNIT  
ns  
t
t
Output disable time from G  
Output enable time from G  
0
100  
150  
dis(G)  
ns  
en(G)  
NOTE 3: For all switching characteristics the input pulse levels are 0.4 V to 2.4 V. Timing measurements are made at 2 V for logic high and  
0.8 V for logic low (See Figure 2).  
timing requirements for programming  
MIN  
95  
2
TYP  
MAX  
UNIT  
µs  
t
t
t
t
t
t
t
t
t
Pulse duration, program  
Setup time, address  
Setup time, E  
SNAP! Pulse programming algorithm  
100  
105  
w(PGM)  
µs  
su(A)  
2
µs  
su(E)  
Setup time, G  
2
µs  
su(G)  
su(D)  
Setup time, data  
2
µs  
Setup time, V  
Setup time, V  
2
µs  
su(VPP)  
su(VCC)  
h(A)  
PP  
2
µs  
CC  
Hold time, address  
Hold time, data  
0
µs  
2
µs  
h(D)  
9
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
PARAMETER MEASUREMENT INFORMATION  
2.08 V  
R
= 800 Ω  
L
Output  
Under Test  
C
= 100 pF  
L
(see Note A)  
2.4 V  
0.4 V  
2 V  
0.8 V  
2 V  
0.8 V  
NOTES: A.  
C includes probe and fixture capacitance.  
L
B. The ac testing inputs are driven at 2.4 V for logic high and 0.4 V for logic low. Timing  
measurements are made at 2 V for logic high and 0.8 V for logic low for both inputs  
and outputs.  
Figure 2. The ac Testing Output Load Circuit and Waveform  
V
V
IH  
A0A17  
Addresses Valid  
IL  
t
a(A)  
V
V
IH  
E
IL  
t
a(E)  
V
V
IH  
G
IL  
t
dis  
ten(G)  
t
v(A)  
V
V
IH  
DQ0DQ7  
Hi-Z  
Output Valid  
Hi-Z  
IL  
Figure 3. Read-Cycle Timing  
10  
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TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
PARAMETER MEASUREMENT INFORMATION  
Verify  
Program  
V
V
IH  
Address  
N + 1  
A0A17  
Address Stable  
IL  
t
t
h(A)  
su(A)  
V
/V  
IH OH  
Data-Out  
Valid  
DQ0DQ7  
Data-In Stable  
V /V  
IL OL  
t
t
dis(G)  
su(D)  
V
V
PP  
V
PP  
CC  
t
su(VPP)  
su(VCC)  
V
V
CC  
V
CC  
CC  
t
V
V
IH  
E
IL  
t
h(D)  
t
su(E)  
V
V
IH  
PGM  
G
IL  
t
su(G)  
t
w(PGM)  
t
en(G)  
V
V
IH  
IL  
t
and t  
are characteristics of the device but must be accommodated by the programmer.  
and 6.5-V V for SNAP! Pulse programming.  
dis(G)  
13-V V  
en(G)  
PP  
CC  
Figure 4. Program-Cycle Timing (SNAP! Pulse Programming)  
11  
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PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
FM (R-PQCC-J32)  
PLASTIC J-LEADED CHIP CARRIER  
Seating Plane  
0.004 (0,10)  
0.140 (3,56)  
0.132 (3,35)  
0.495 (12,57)  
0.485 (12,32)  
0.129 (3,28)  
0.123 (3,12)  
0.453 (11,51)  
0.447 (11,35)  
0.049 (1,24)  
0.043 (1,09)  
0.008 (0,20) NOM  
1
30  
4
29  
5
0.020 (0,51)  
0.015 (0,38)  
0.595 (15,11)  
0.585 (14,86)  
0.553 (14,05)  
0.547 (13,89)  
0.030 (0,76)  
TYP  
21  
13  
14  
20  
0.050 (1,27)  
4040201-4/B 03/95  
NOTES: A. All linear dimensions are in inches (millimeters).  
B. This drawing is subject to change without notice.  
C. Falls within JEDEC MS-016  
12  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443  
TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
J (R-CDIP-T**)  
CERAMIC SIDE-BRAZE DUAL-IN-LINE PACKAGE  
24 PIN SHOWN  
B
13  
24  
C
12  
1
Lens Protrusion  
0.010 (0,25) MAX  
0.065 (1,65)  
0.045 (1,14)  
0.090 (2,29)  
0.060 (1,53)  
0.175 (4,45)  
A
0.140 (3,56)  
0.018 (0,46) MIN  
Seating Plane  
0°10°  
0.125 (3,18) MIN  
0.022 (0,56)  
0.014 (0,36)  
0.100 (2,54)  
0.012 (0,30)  
0.008 (0,20)  
PINS**  
DIM  
24  
28  
32  
40  
NARR  
WIDE  
NARR  
WIDE  
NARR  
WIDE  
NARR  
WIDE  
0.624(15,85) 0.624(15,85) 0.624(15,85) 0.624(15,85) 0.624(15,85) 0.624(15,85) 0.624(15,85) 0.624(15,85)  
0.590(14,99) 0.590(14,99) 0.590(14,99) 0.590(14,99) 0.590(14,99) 0.590(14,99) 0.590(14,99) 0.590(14,99)  
1.265(32,13) 1.265(32,13) 1.465(37,21) 1.465(37,21) 1.668(42,37) 1.668(42,37) 2.068(52,53) 2.068(52,53)  
1.235(31,37) 1.235(31,37) 1.435(36,45) 1.435(36,45) 1.632(41,45) 1.632(41,45) 2.032(51,61) 2.032(51,61)  
0.541(13,74) 0.598(15,19) 0.541(13,74) 0.598(15,19) 0.541(13,74) 0.598(15,19) 0.541(13,74) 0.598(15,19)  
0.514(13,06) 0.571(14,50) 0.514(13,06) 0.571(14,50) 0.514(13,06) 0.571(14,50) 0.514(13,06) 0.571(14,50)  
MAX  
A
MIN  
MAX  
B
MIN  
MAX  
C
MIN  
4040084/B 04/95  
NOTES: A. All linear dimensions are in inches (millimeters).  
B. This drawing is subject to change without notice.  
C. This package can be hermetically sealed with a ceramic lid using glass frit.  
D. Index point is provided on cap for terminal identification only on press ceramic glass frit seal only.  
13  
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TMS27C020 262144 BY 8-BIT UV ERASABLE  
TMS27PC020 262144 BY 8-BIT  
PROGRAMMABLE READ-ONLY MEMORIES  
SMLS020C – NOVEMBER 1990 – REVISED SEPTEMBER 1997  
14  
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IMPORTANT NOTICE  
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pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
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In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
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Copyright 1998, Texas Instruments Incorporated  

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