TLV2544IPWRG4 [TI]

4-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PDSO16, GREEN, PLASTIC, TSSOP-16;
TLV2544IPWRG4
型号: TLV2544IPWRG4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

4-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PDSO16, GREEN, PLASTIC, TSSOP-16

光电二极管 转换器
文件: 总40页 (文件大小:763K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
D
D
Maximum Throughput 200-KSPS  
D
D
D
D
D
Single Wide Range Supply 2.7 Vdc to  
5.5 Vdc  
Built-In Reference, Conversion Clock and  
8× FIFO  
Differential/Integral Nonlinearity Error:  
1 LSB  
Analog Input Range 0-V to Supply Voltage  
With 500 kHz BW  
D
D
D
D
Hardware Controlled and Programmable  
Sampling Period  
Signal-to-Noise and Distortion Ratio:  
70 dB, f = 12-kHz  
Low Operating Current (1.0-mA at 3.3-V,  
1.1-mA at 5.5-V With External Ref  
i
Spurious Free Dynamic Range: 75 dB,  
f = 12- kHz  
Power Down: Software/Hardware  
Power-Down Mode (1 µA Max, Ext Ref),  
Autopower-Down Mode (1 µA, Ext Ref)  
i
SPI (CPOL = 0, CPHA = 0)/DSP-Compatible  
Serial Interfaces With SCLK up to 20-MHz  
D
Programmable Auto-Channel Sweep  
TLV2548  
DW OR PW PACKAGE  
(TOP VIEW)  
TLV2544  
D OR PW PACKAGE  
(TOP VIEW)  
1
2
3
4
5
6
7
8
9
10  
20 CS  
SDO  
CS  
SDO  
SDI  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
19  
18  
17  
16  
15  
14  
13  
12  
11  
SDI  
REFP  
REFM  
FS  
REFP  
REFM  
FS  
SCLK  
SCLK  
EOC/(INT)  
EOC/(INT)  
V
PWDN  
GND  
V
PWDN  
GND  
CC  
CC  
A0  
A1  
A2  
A0  
A1  
A2  
A3  
A4  
10 CSTART  
A3  
CSTART  
A7  
9
A6  
A5  
description  
The TLV2548 and TLV2544 are a family of high performance, 12-bit low power, 3.86 µs, CMOS analog-to-digital  
converters (ADC) which operate from a single 2.7-V to 5.5-V power supply. These devices have three digital  
inputs and a 3-state output [chip select (CS), serial input-output clock (SCLK), serial data input (SDI), and serial  
data output (SDO)] that provide a direct 4-wire interface to the serial port of most popular host microprocessors  
(SPI interface). When interfaced with a TI DSP, a frame sync (FS) signal is used to indicate the start of a serial  
data frame.  
In addition to a high-speed A/D converter and versatile control capability, these devices have an on-chip analog  
multiplexer that can select any analog inputs or one of three internal self-test voltages. The sample-and-hold  
function is automatically started after the fourth SCLK edge (normal sampling) or can be controlled by a special  
pin, CSTART, to extend the sampling period (extended sampling). The normal sampling period can also be  
programmed as short (12 SCLKs) or as long (24 SCLKs) to accommodate faster SCLK operation popular  
among high-performance signal processors. The TLV2548 and TLV2544 are designed to operate with very low  
power consumption. The power-saving feature is further enhanced with software/hardware/autopower-down  
modes and programmable conversion speeds. The conversion clock (OSC) and reference are built-in. The  
converter can use the external SCLK as the source of the conversion clock to achieve higher (up to 2.8 µs when  
a 20 MHz SCLK is used) conversion speed. Two different internal reference voltages are available. An optional  
external reference can also be used to achieve maximum flexibility.  
The TLV2544C and the TLV2548C are characterized for operation from 0°C to 70°C. The TLV2544I and the  
TLV2548I are characterized for operation from 40°C to 85°C.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 1999 − 2003, Texas Instruments Incorporated  
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1
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ꢚꢀ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
functional block diagram  
V
CC  
4/2 V  
Reference  
REFP  
REFM  
FIFO  
12 Bit × 8  
2548 2544  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A0  
Low Power  
12-BIT  
SAR ADC  
X
A1  
X
A2  
X
S/H  
OSC  
INT  
Command  
Decode  
A3  
X
Conversion  
Clock  
M
U
X
EXT  
SDO  
CFR  
SDI  
CMR (4 MSBs)  
DIV  
SCLK  
CS  
FS  
Control Logic  
EOC/(INT)  
CSTART  
PWDN  
GND  
AVAILABLE OPTIONS  
PACKAGED DEVICES  
T
A
20-TSSOP  
20-SOIC  
(DW)  
16-SOIC  
(D)  
16-TSSOP  
20-CDIP  
(J)  
20-LCCC  
(FK)  
(PW)  
(PW)  
0°C to 70°C  
TLV2548CPW  
TLV2548CDW  
TLV2548IDW  
TLV2544CD  
TLV2544ID  
TLV2544CPW  
TLV2544IPW  
40°C to 85°C TLV2548IPW  
2
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
Terminal Functions  
TERMINAL  
NO.  
TLV2544 TLV2548  
I/O  
DESCRIPTION  
NAME  
A0  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
6
7
8
9
6
7
8
I
Analog signal inputs. The analog inputs are applied to these terminals and are internally  
multiplexed. The driving source impedance should be less than or equal to 1 k.  
A1  
A2  
A3  
For a source impedance greater than 1 k, use the asynchronous conversion start signal CSTART  
(CSTART low time controls the sampling period) or program long sampling period to increase the  
sampling time.  
9
10  
11  
12  
13  
CS  
16  
10  
4
20  
14  
4
I
I
Chip select. A high-to-low transition on the CS input resets the internal 4-bit counter, enables SDI,  
and removes SDO from 3-state within a maximum setup time. SDI is disabled within a setup time  
after the 4-bit counter counts to 16 (clock edges) or a low-to-high transition of CS whichever  
happens first.  
NOTE: CS falling and rising edges need to happen when SCLK is low for a microprocessor interface  
such as SPI.  
CSTART  
This terminal controls the start of sampling of the analog input from a selected multiplex channel.  
Sampling time starts with the falling edge of CSTART and ends with the rising edge of CSTART as  
long as CS is held high. In mode 01, select cycle, CSTART can be issued as soon as CHANNEL  
is selected which means the fifth SCLK during the select cycle, but the effective sampling time is  
not started until CS goes to high. The rising edge of CSTART (when CS = 1) also starts the  
conversion. Tie this terminal to V  
CC  
if not used.  
EOC/(INT)  
O
End of conversion or interrupt to host processor.  
[PROGRAMMED AS EOC]: This output goes from a high-to-low logic level at the end of the  
sampling period and remains low until the conversion is complete and data are ready for transfer.  
EOC is used in conversion mode 00 only.  
[PROGRAMMED AS INT]: This pin can also be programmed as an interrupt output signal to the host  
processor. The falling edge of INT indicates data are ready for output. The following CSor FS  
clears INT.  
FS  
13  
17  
I
DSP frame sync input. Indication of the start of a serial data frame in or out of the device. If FS  
remains low after the falling edge of CS, SDI is not enabled until an active FS is presented. A  
high-to-low transition on the FS input resets the internal 4-bit counter and enables SDI within a  
maximum setup time. SDI is disabled within a setup time after the 4-bit counter counts to 16 (clock  
edges) or a low-to-high transition of CS whichever happens first.  
Tie this terminal to V  
CC  
if not used. See the date code information section, item (1).  
GND  
11  
12  
3
15  
16  
3
I
I
I
Ground return for the internal circuitry. Unless otherwise noted, all voltage measurements are with  
respect to GND.  
PWDN  
SCLK  
Both analog and reference circuits are powered down when this pin is at logic zero. The device can  
be restarted by active CS, FS or CSTART after this pin is pulled back to logic one.  
Input serial clock. This terminal receives the serial SCLK from the host processor. SCLK is used to  
clock the input SDI to the input register. When programmed, it may also be used as the source of  
the conversion clock.  
NOTE: This device supports CPOL (clock polarity) = 0, which is SCLK returns to zero when idling  
for SPI compatible interface.  
SDI  
2
2
I
Serial data input. The input data is presented with the MSB (D15) first. The first 4-bit MSBs,  
D(15−12) are decoded as one of the 16 commands (12 only for the TLV2544). The configure write  
commands require an additional 12 bits of data.  
When FS is not used (FS =1), the first MSB (D15) is expected after the falling edge of CS and is  
latched in on the rising edges of SCLK (after CS).  
When FS is used (typical with an active FS from a DSP) the first MSB (D15) is expected after the  
falling edge of FS and is latched in on the falling edges of SCLK.  
SDI is disabled within a setup time after the 4-bit counter counts to 16 (clock edges) or a low-to-high  
transition of CS whichever happens first.  
3
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ꢚꢀ  
ꢀꢋ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
Terminal Functions (Continued)  
TERMINAL  
NO.  
I/O  
DESCRIPTION  
NAME  
SDO  
TLV2544 TLV2548  
1
1
O
The 3-state serial output for the A/D conversion result. SDO is kept in the high-impedance state  
when CS is high and after the CS falling edge and until the MSB is presented. The output format  
is MSB first.  
When FS is not used (FS = 1 at the falling edge of CS), the MSB is presented to the SDO pin after  
the CS falling edge, and successive data are available at the rising edge of SCLK and changed on  
the falling edge.  
When FS is used (FS = 0 at the falling edge of CS), the MSB is presented to SDO after the falling  
edge of CS and FS = 0 is detected. Successive data are available at the falling edge of SCLK and  
changed on the rising edge. (This is typically used with an active FS from a DSP.)  
For conversion and FIFO read cycles, the first 12 bits are result from previous conversion (data)  
followed by 4 don’t care bits. The first four bits from SDO for CFR read cycles should be ignored.  
The register content is in the last 12 bits. SDO is 3-state (float) after the 16th bit. See the date code  
information section, item (2).  
REFM  
REFP  
14  
15  
18  
19  
I
I
External reference input or internal reference decoupling. Tie this pin to analog ground if internal  
reference is used.  
External reference input or internal reference decoupling. (Shunt capacitors of 10 µF and 0.1 µF  
between REFP and REFM.) The maximum input voltage range is determined by the difference  
between the voltage applied to this terminal and the REFM terminal when an external reference is  
used.  
V
CC  
5
5
I
Positive supply voltage  
detailed description  
analog inputs and internal test voltages  
The 4/8 analog inputs and three internal test inputs are selected by the analog multiplexer depending on the  
command entered. The input multiplexer is a break-before-make type to reduce input-to-input noise injection  
resulting from channel switching.  
converter  
The TLV2544/48 uses a 12-bit successive approximation ADC utilizing a charge redistribution DAC. Figure 1  
shows a simplified version of the ADC.  
The sampling capacitor acquires the signal on Ain during the sampling period. When the conversion process  
starts, the SAR control logic and charge redistribution DAC are used to add and subtract fixed amounts of charge  
from the sampling capacitor to bring the comparator into a balanced condition. When the comparator is  
balanced, the conversion is complete and the ADC output code is generated.  
4
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
detailed description (continued)  
Charge  
Redistribution  
DAC  
_
+
Ain  
Control  
Logic  
ADC Code  
REFM  
Figure 1. Simplified Model of the Successive-Approximation System  
serial interface  
INPUT DATA FORMAT  
MSB  
LSB  
D15−D12  
Command ID[15:12]  
D11−D0  
Configuration data field ID[11:0]  
Input data is binary. All trailing blanks can be filled with zeros.  
OUTPUT DATA FORMAT READ CFR/FIFO READ  
MSB  
LSB  
D15−D12  
D11−D0  
Register content or FIFO content OD[11:0]  
Don’t care  
OUTPUT DATA FORMAT CONVERSION  
MSB  
LSB  
D15−D4  
D3−D0  
Don’t care  
Conversion result OD[11:0]  
The output data format is binary (unipolar straight binary).  
binary  
Zero scale code = 000h, Vcode = VREFM  
Full scale code = FFFh, Vcode = VREFP − 1 LSB  
5
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ꢚꢀ  
ꢀꢋ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
control and timing  
power up and initialization requirements  
D
D
Determine processor type by writing A000h to the TLV2544/48 (CS must be toggled)  
Configure the device (CS must make a high-to-low transition, then can be held low if in DSP mode; i.e.,  
active FS.)  
The first conversion after power up or resuming from power down is not valid.  
start of the cycle:  
D
When FS is not used (FS = 1 at the falling edge of CS), the falling edge of CS is the start of the cycle.  
When FS is used (FS is an active signal from a DSP), the falling edge of FS is the start of the cycle.  
D
first 4-MSBs: the command register (CMR)  
The TLV2544/TLV2548 have a 4-bit command set (see Table 1) plus a 12-bit configuration data field. Most of  
the commands require only the first 4 MSBs, i.e., without the 12-bit data field.  
The valid commands are listed in Table 1.  
Table 1. TLV2544/TLV2548 Command Set  
SDI D(15−12) BINARY  
TLV2548 COMMAND  
Select analog input channel 0  
Select analog input channel 1  
Select analog input channel 2  
Select analog input channel 3  
Select analog input channel 4  
Select analog input channel 5  
Select analog input channel 6  
Select analog input channel 7  
SW power down (analog + reference)  
TLV2544 COMMAND  
0000b  
0001b  
0010b  
0011b  
0100b  
0101b  
0110b  
0111b  
1000b  
1001b  
0h  
1h  
2h  
3h  
4h  
5h  
6h  
7h  
8h  
9h  
Select analog input channel 0  
N/A  
Select analog input channel 1  
N/A  
Select analog input channel 2  
N/A  
Select analog input channel 3  
N/A  
Read CFR register data shown as SDO D(11−0)  
Write CFR followed by 12-bit data, e.g., 0A100h means external reference,  
short sampling, SCLK/4, single shot, INT  
1010b  
Ah plus data  
1011b  
1100b  
1101b  
1110b  
1111b  
Bh  
Ch  
Dh  
Eh  
Select test, voltage = (REFP+REFM)/2  
Select test, voltage = REFM  
Select test, voltage = REFP  
FIFO read, FIFO contents shown as SDO D(15−4), D(3−0) = 0000  
Fh plus data Reserved  
NOTE: The status of the CFR can be read with a read CFR command when the device is programmed  
for one-shot conversion mode (CFR D[6,5] = 00).  
6
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
control and timing (continued)  
configuration  
Configuration data is stored in one 12-bit configuration register (CFR) (see Table 2 for CFR bit definitions). Once  
configured after first power up, the information is retained in the H/W or S/W power down state. When the device  
is being configured, a write CFR cycle is issued by the host processor. This is a 16-bit write. If the SCLK stops  
after the first 8 bits are entered, then the next eight bits can be taken after the SCLK is resumed.  
Table 2. TLV2544/TLV2548 Configuration Register (CFR) Bit Definitions  
BIT  
D11  
DEFINITION  
Reference select  
0: External  
1: Internal (Tie REFM to analog ground if the Internal reference is selected.)  
D10  
D9  
Internal reference voltage select  
0: Internal ref = 4 V  
1: internal ref = 2 V  
Sample period select  
0: Short sampling 12 SCLKs (1x sampling time)  
1: Long sampling 24 SCLKs (2x sampling time)  
D(8,7)  
Conversion clock source select  
00: Conversion clock = internal OSC  
01: Conversion clock = SCLK  
10: Conversion clock = SCLK/4  
11: Conversion clock = SCLK/2  
D(6,5)  
D(4,3)  
Conversion mode select  
00: Single shot mode [FIFO not used, D(1,0) has no effect.]  
01: Repeat mode  
10: Sweep mode  
11: Repeat sweep mode  
TLV2548  
TLV2544  
Sweep auto sequence select  
00: 0−1−2−3−4−5−6−7  
01: 0−2−4−6−0−2−4−6  
10: 0−0−2−2−4−4−6−6  
11: 0−2−0−2−0−2−0−2  
Sweep auto sequence select  
00: N/A  
01: 0−1−2−3−0−1−2−3  
10: 0−0−1−1−2−2−3−3  
11: 0−1−0−1−0−1−0−1  
D2  
EOC/INT − pin function select  
0: Pin used as INT  
1: Pin used as EOC  
D(1,0)  
FIFO trigger level (sweep sequence length)  
00: Full (INT generated after FIFO level 7 filled)  
01: 3/4 (INT generated after FIFO level 5 filled)  
10: 1/2 (INT generated after FIFO level 3 filled)  
11: 1/4 (INT generated after FIFO level 1 filled)  
These bits only take effect in conversion modes 10 and 11.  
sampling  
The sampling period starts after the first 4 input data are shifted in if they are decoded as one of the conversion  
commands. These are select analog input (channel 0 through 7) and select test (channel 1 through 3).  
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normal sampling  
When the converter is using normal sampling, the sampling period is programmable. It can be 12 SCLKs (short  
sampling) or 24 SCLKs (long sampling). Long sampling helps when SCLK is faster than 10 MHz or when input  
source resistance is high.  
extended sampling  
CSTART − An asynchronous (to the SCLK) signal, via dedicated hardware pin, CSTART, can be used in order  
to have total control of the sampling period and the start of a conversion. This extended sampling is user-defined  
and is totally independent of SCLK. While CS is high, the falling edge of CSTART is the start of the sampling  
period and is controlled by the low time of CSTART. The minimum low time for CSTART should be at least equal  
to the minimum t  
. In a select cycle used in mode 01 (REPEAT MODE), CSTART can be started as soon  
(SAMPLE)  
as the channel is selected (after the fifth SCLK). In this case the sampling period is not started until CS has  
become inactive. Therefore the nonoverlapped CSTART low time must meet the minimum sampling time  
requirement. The low-to-high transition of CSTART terminates the sampling period and starts the conversion  
period. The conversion clock can also be configured to use either internal OSC or external SCLK. This function  
is useful for an application that requires:  
D
D
The use of an extended sampling period to accommodate different input source impedance  
The use of a faster I/O clock on the serial port but not enough sampling time is available due to the fixed  
number of SCLKs. This could be due to a high input source impedance or due to higher MUX ON resistance  
at lower supply voltage.  
Once the conversion is complete, the processor can initiate a read cycle by using either the read FIFO command  
to read the conversion result or by simply selecting the next channel number for conversion. Since the device  
has a valid conversion result in the output buffer, the conversion result is simply presented at the serial data  
output. To completely get out of the extended sampling mode, CS must be toggled twice from a high-to-low  
transition while CSTART is high. The read cycle mentioned above followed by another configuration cycle of  
the ADC qualifies this condition and successfully puts the ADC back to its normal sampling mode. This can be  
viewed in Figure 9.  
Table 3. Sample and Convert Conditions  
CONDITIONS SAMPLE  
No sampling clock (SCLK) required. Sampling  
CONVERT  
period is totally controlled by the low time of CSTART.  
The high-to-low transition of CSTART (when CS=1)  
starts the sampling of the analog input signal. The low  
time of CSTART dictates the sampling period. The  
low-to-high transition of CSTART ends sampling  
period and begins the conversion cycle. (Note: this  
trigger only works when internal reference is selected  
for conversion modes 01, 10, and 11.)  
CS = 1  
CSTART (see Figures  
11 and 18)  
1) If the internal clock OSC is selected a maximum  
conversion time of 3.86 µs can be achieved.  
SCLK is required. Sampling period is programmable  
under normal sampling. When programmed to sample  
under short sampling, 12 SCLKs are generated to  
complete sampling period. 24 SCLKs are generated  
when programmed for long sampling. A command set  
to configure the device requires 4 SCLKs thereby ex-  
tending to 16 or 28 SCLKs respectively before conver-  
sion takes place. (Note: Because the ADC only  
bypasses a valid channel select command, the user  
can use select channel 0, 0000b, as the SDI input  
when either CS or FS is used as trigger for conversion.  
The ADC responds to commands such as SW power-  
down, 1000b.)  
2) If external SCLK is selected, conversion time is  
CSTART = 1  
FS = 1  
t
= 14 × DIV/f , where DIV can be 1, 2, or  
(SCLK)  
conv  
4.  
CS  
CSTART = 1  
CS = 0  
FS  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
TLV2544/TLV2548 conversion modes  
The TLV2544 and TLV2548 have four different conversion modes (mode 00, 01, 10, 11). The operation of each  
mode is slightly different, depending on how the converter performs the sampling and which host interface is  
used. The trigger for a conversion can be an active CSTART (extended sampling), CS (normal sampling, SPI  
interface), or FS (normal sampling, TMS320 DSP interface). When FS is used as the trigger, CS can be held  
active, i.e. CS does not need to be toggled through the trigger sequence. SDI can be one of the channel select  
commands, such as SELECT CHANNEL 0. Different types of triggers should not be mixed throughout the repeat  
and sweep operations. When CSTART is used as the trigger, the conversion starts on the rising edge of  
CSTART. The minimum low time for CSTART is equal to t  
. If an active CS or FS is used as the trigger,  
(SAMPLE)  
the conversion is started after the 16th or 28th SCLK edge. Enough time (for conversion) should be allowed  
between consecutive triggers so that no conversion is terminated prematurely.  
one shot mode (mode 00)  
One shot mode (mode 00) does not use the FIFO, and the EOC is generated as the conversion is in progress  
(or INT is generated after the conversion is done).  
repeat mode (mode 01)  
Repeat mode(mode 01) uses the FIFO. This mode setup requires configuration cycle and channel select cycle.  
Once the programmed FIFO threshold is reached, the FIFO must be read, or the data is lost when the sequence  
starts over again with the SELECT cycle and series of triggers. No configuration is required except for  
reselecting the channel unless the operation mode is changed. This allows the host to set up the converter and  
continue monitoring a fixed input and come back to get a set of samples when preferred.  
Triggered by CSTART: The first conversion can be started with a select cycle or CSTART. To do so, the user  
can issue CSTART during the select cycle, immediately after the four-bit channel select command. The first  
sample started as soon as the select cycle is finished (i.e., CS returns to 1). If there is enough time (2 µs) left  
between the SELECT cycle and the following CSTART, a conversion is carried out. In this case, you need one  
less trigger to fill the FIFO. Succeeding samples are triggered by CSTART.  
sweep mode (mode 10)  
Sweep mode (mode 10) also uses the FIFO. Once it is programmed in this mode, all of the channels listed in  
the selected sweep sequence are visited in sequence. The results are converted and stored in the FIFO. This  
sweep sequence may not be completed if the FIFO threshold is reached before the list is completed. This allows  
the system designer to change the sweep sequence length. Once the FIFO has reached its programmed  
threshold, an interrupt (INT) is generated. The host must issue a read FIFO command to read and clear the FIFO  
before the next sweep can start.  
repeat sweep mode (mode 11)  
Repeat sweep mode (mode 11) works the same way as mode 10 except the operation has an option to continue  
even if the FIFO threshold is reached. Once the FIFO has reached its programmed threshold, an interrupt (INT)  
is generated. Then two things may happen:  
1. The host may choose to act on it (read the FIFO) or ignore it. If the next cycle is a read FIFO cycle, all of  
the data stored in the FIFO is retained until it has been read in order.  
2. If the next cycle is not a read FIFO cycle, or another CSTART is generated, all of the content stored in the  
FIFO is cleared before the next conversion result is stored in the FIFO, and the sweep is continued.  
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TLV2544/TLV2548 conversion modes (continued)  
Table 4. TLV2544/TLV2548 Conversion Mode  
CONVERSION  
MODE  
CFR  
D(6,5)  
SAMPLING  
TYPE  
OPERATION  
One shot  
00  
Normal  
Single conversion from a selected channel  
CS or FS to start select/sampling/conversion/read  
One INT or EOC generated after each conversion  
Host must serve INT by selecting channel, and converting and reading the previous output.  
Extended  
Single conversion from a selected channel  
CS to select/read  
CSTART to start sampling and conversion  
One INT or EOC generated after each conversion  
Host must serve INT by selecting next channel and reading the previous output.  
Repeat  
01  
Normal  
Repeated conversions from a selected channel  
CS or FS to start sampling/conversion  
One INT generated after FIFO is filled up to the threshold  
Host must serve INT by either 1) (FIFO read) reading out all of the FIFO contents up to the  
threshold, then repeat conversions from the same selected channel or 2) writing another  
command(s) to change the conversion mode. If the FIFO is not read when INT is served, it is  
cleared.  
Extended  
Normal  
Same as normal sampling except CSTART starts each sampling and conversion when CS is  
high.  
Sweep  
10  
11  
One conversion per channel from a sequence of channels  
CS or FS to start sampling/conversion  
One INT generated after FIFO is filled up to the threshold  
Host must serve INT by (FIFO read) reading out all of the FIFO contents up to the threshold, then  
write another command(s) to change the conversion mode.  
Extended  
Normal  
Same as normal sampling except CSTART starts each sampling and conversion when CS is  
high.  
Repeat sweep  
Repeated conversions from a sequence of channels  
CS or FS to start sampling/conversion  
One INT generated after FIFO is filled up to the threshold  
Host must serve INT by either 1) (FIFO read) reading out all of the FIFO contents up to the  
threshold, then repeat conversions from the same selected channel or 2) writing another  
command(s) to change the conversion mode. If the FIFO is not read when INT is served it is  
cleared.  
Extended  
Same as normal sampling except CSTART starts each sampling and conversion when CS is  
high.  
NOTES: 1. Programming the EOC/INT pin as the EOC signal works for mode 00 only. The other three modes automatically generate an INT  
signal irrespective of how EOC/INT is programmed.  
2. Extended. Sampling mode using CSTART as the trigger only works when internal reference is selected for conversion modes 01,  
10, and 11.  
3. When using CSTART to sample in extended mode, the falling edge of the next CSTART trigger should occur no more than 2.5 µs  
after the falling CS edge (or falling FS edge if FS is active) of the channel select cycle. This is to prevent an ongoing conversion from  
being canceled.  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
timing diagrams  
The timing diagrams can be categorized into two major groups: nonconversion and conversion. The  
nonconversion cycles are read and write (configuration). None of these cycles carry a conversion. Conversion  
cycles are those four modes of conversion.  
read cycle (read FIFO or read CFR)  
read CFR cycle:  
The read command is decoded in the first 4 clocks. SDO outputs the contents of the CFR after the 4th SCLK.  
This command works only when the device is programmed in the single shot mode (mode 00).  
16  
7
12 13  
14 15  
1
2
3
4
5
6
1
SCLK  
CS  
FS  
ID15 ID14 ID13 ID12  
ID15  
SDI  
INT  
EOC  
SDO  
OD11 OD10 OD9  
OD4 OD3 OD2 OD1 OD0  
Figure 2. TLV2544/TLV2548 Read CFR Cycle (FS active)  
16  
7
12 13 14 15  
1
2
3
4
5
6
1
SCLK  
CS  
FS  
ID15  
ID14 ID13 ID12  
ID15 ID14  
SDI  
INT  
EOC  
SDO  
OD11 OD10 OD9  
OD4 OD3 OD2 OD1 OD0  
Figure 3. TLV2544/TLV2548 Read CFR Cycle (FS = 1)  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
read cycle (read FIFO or read CFR) (continued)  
FIFO read cycle  
The first command in the active cycle after INT is generated, if the FIFO is used, is assumed as the FIFO read  
command. The first FIFO content is output immediately before the command is decoded. If this command is  
not a FIFO read, then the output is terminated but the first data in the FIFO is retained until a valid FIFO read  
command is decoded. Use of more layers of the FIFO reduces the time taken to read multiple data. This is  
because the read cycle does not generate EOC or INT, nor does it carry out any conversion.  
16  
7
12 13 14 15  
1
2
3
4
5
6
1
2
SCLK  
CS  
FS  
ID15 ID14 ID13 ID12  
ID15 ID14  
SDI  
INT  
EOC  
SDO  
OD11 OD10 OD9 OD8 OD7 OD6 OD5  
OD0  
OD11 OD10  
These devices can perform continuous FIFO read cycles (FS = 1) controlled by SCLK; SCLK can stop between each 16 SCLKs.  
Figure 4. TLV2544/TLV2548 FIFO Read Cycle (FS = 1)  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
write cycle (write CFR)  
The write cycle is used to write to the configuration register CFR (with 12-bit register content). The write cycle  
does not generate an EOC or INT, nor does it carry out any conversion (see power up and initialization  
requirements).  
16  
7
12 13 14 15  
1
2
3
4
5
6
1
SCLK  
CS  
FS  
ID11 ID10  
ID9  
ID4  
ID3  
ID2  
ID1  
ID0  
ID15 ID14 ID13 ID12  
ID15  
SDI  
INT  
EOC  
SDO  
Figure 5. TLV2544/TLV2548 Write Cycle (FS Active)  
16  
7
12 13 14 15  
1
2
3
4
5
6
1
SCLK  
CS  
FS  
ID11 ID10  
ID9  
ID4  
ID3  
ID2  
ID1  
ID0  
ID15 ID14 ID13 ID12  
ID15 ID14  
SDI  
INT  
EOC  
SDO  
Figure 6. TLV2544/TLV2548 Write Cycle (FS = 1)  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
conversion cycles  
DSP/normal sampling  
16 − Short Sampling  
28 − Long Sampling  
30 − Short Sampling  
42 − Long Sampling  
(If CONV  
CLK = SCLK0  
1
2
3
4
5
6
7
12  
SCLK  
CS  
t
c
(30 or 42 SCLKs)  
FS  
ID15 ID14 ID13 ID12  
ID15  
SDI  
INT  
t
(12 or 24 SCLKs)  
(sample)  
EOC  
SDO  
(SDOZ on SCLK16L Regardless  
of Sampling Time)  
t
(conv)  
MSB-1 MSB-2 MSB-3 MSB-4 MSB-5 MSB-6  
LSB  
MSB  
MSB  
Figure 7. Mode 00 Single Shot/Normal Sampling (FS Signal Used)  
16 − Short Sampling  
28 − Long Sampling  
30 − Short Sampling  
42 − Long Sampling  
(If CONV  
CLK = SCLK0  
1
1
2
3
4
5
6
7
12  
13  
SCLK  
t
c
(30 or 42 SCLKs)  
CS  
FS  
ID15 ID14 ID13 ID12  
ID15  
SDI  
INT  
t
(12 or 24 SCLKs)  
(sample)  
EOC  
SDO  
(SDOZ on SCLK16L Regardless  
of Sampling Time)  
t
(conv)  
MSB-1 MSB-2 MSB-3 MSB-4 MSB-5 MSB-6  
LSB  
MSB  
MSB  
Figure 8. Mode 00 Single Shot/Normal Sampling (FS = 1, FS Signal not Used)  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
conversion cycles (continued)  
Device Get Out  
Extended Sampling  
Mode  
Read  
Device Going Into  
Extended Sampling Mode  
Select/Read  
Cycle  
Select/Read  
Cycle  
Cycle  
CS  
t
(sample )  
Normal  
Cycle  
CSTART  
FS  
t
(conv)  
SDI  
INT  
EOC  
Previous Conversion  
Result  
Previous Conversion  
Result  
Hi-Z  
Hi-Z  
Hi-Z  
SDO  
This is one of the single shot commands. Conversion starts on next rising edge of CSTART.  
Figure 9. Mode 00 Single Shot/Extended Sampling (FS Signal Used, FS Pin Connected to TMS320 DSP)  
modes using the FIFO: modes 01, 10, 11 timing  
Conversion #1  
Configure Select From Channel 2  
Conversion #4  
From Channel 2  
Select  
CS  
FS  
CSTART  
§
§
SDI  
INT  
Hi-Z  
Hi-Z  
SDO  
Read FIFO  
#1  
#2  
#3  
#4  
Top of FIFO  
Command = Configure write for mode 01, FIFO threshold = 1/2  
Command = Read FIFO, first FIFO read  
Command = Select ch2.  
§
Use any channel select command to trigger SDI input.  
Figure 10. TLV2544/TLV2548 Mode 01 DSP Serial Interface (Conversions Triggered by FS)  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
modes using the FIFO: modes 01, 10, 11 timing (continued)  
Conversion #1 From Channel 2  
Configure Select  
Conversion #4 From Channel 2  
Select  
CS  
FS  
(DSP)  
t
t
(sample)  
(sample)  
t
(sample)  
t
(sample)  
CSTART  
§
§
SDI  
INT  
Hi-Z  
Hi-Z  
SDO  
Read FIFO  
#1  
#2  
#3  
#4  
Sample Times MIN t  
(sample)  
(See Operating Characteristics)  
First FIFO Read  
Command = Configure write for mode 01, FIFO threshold = 1/2  
Command = Read FIFO, first FIFO read  
Command = Select ch2.  
Minimum CS low time for select cycle is 6 SCLKs. The same amount of time is required between FS low to CSTART for proper channel decoding.  
The low time of CSTART, not overlapped with CS low time, is the valid sampling time for the select cycle (see Figure 18).  
§
Figure 11. TLV2544/TLV2548 Mode 01 µp/DSP Serial Interface (Conversions Triggered by CSTART)  
Conversion  
Conversion  
Conversion  
Conversion  
From Channel 3  
From Channel 0  
From Channel 3  
Configure  
From Channel 0  
CS  
FS  
(DSP)  
CSTART  
SDI  
§
§
§
§
§
§
§
§
INT  
SDO  
Read FIFO #1  
#2  
#3  
#4  
Read FIFO #1  
Repeat  
Repeat  
Top of FIFO  
First FIFO Read  
Second FIFO Read  
§
Command = Configure write for mode 10 or 11, FIFO threshold = 1/2, sweep seq = 0−1−2−3.  
Command = Read FIFO  
Use any channel select command to trigger SDI input.  
Figure 12. TLV2544/TLV2548 Mode 10/11 DSP Serial Interface (Conversions Triggered by FS)  
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ꢘꢚ  
ꢀꢋ  
ꢀꢖ  
ꢚꢊ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
modes using the FIFO: modes 01, 10, 11 timing (continued)  
Conversion  
Conversion  
Conversion  
Conversion  
From Channel 0  
From Channel 3  
From Channel 3  
From Channel 0  
Configure  
CS  
FS  
(DSP)  
CSTART  
t
(sample)  
t
(sample)  
t
(sample)  
t
(sample)  
SDI  
INT  
SDO  
Read FIFO #1  
#2  
#3  
#4  
Read FIFO  
#1  
Repeat  
Repeat  
Top of FIFO  
Second FIFO Read  
First FIFO Read  
Command = Configure write for mode 10 or 11, FIFO threshold = 1/2, sweep seq = 0−1−2−3.  
Command = Read FIFO  
Figure 13. TLV2544/TLV2548 Mode 10/11 DSP Serial Interface (Conversions Triggered by CSTART)  
Conversion  
Conversion  
Conversion  
Conversion  
From Channel 0  
From Channel 0  
From Channel 3  
From Channel 3  
Configure  
CS  
CSTART  
SDI  
§
§
§
§
§
§
§
§
INT  
SDO  
Read FIFO #1  
#2  
#3  
#4  
Read FIFO  
#1  
Repeat  
Repeat  
Top of FIFO  
First FIFO Read  
Second FIFO Read  
§
Command = Configure write for mode 10 or 11, FIFO threshold = 1/2, sweep seq = 0−1−2−3.  
Command = Read FIFO  
Use any channel select command to trigger SDI input.  
Figure 14. TLV2544/TLV2548 Mode 10/11 µp Serial Interface (Conversions Triggered by CS)  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
FIFO operation  
Serial  
0
SDO  
12-BIT×8  
FIFO  
ADC  
7
6
5
4
3
2
1
FIFO Full  
FIFO 1/2 Full  
FIFO 3/4 Full  
FIFO 1/4 Full  
FIFO Threshold Pointer  
Figure 15. TLV2544/TLV2548 FIFO  
The device has an 8-layer FIFO that can be programmed for different thresholds. An interrupt is sent to the host  
after the preprogrammed threshold is reached. The FIFO can be used to store data from either a fixed channel  
or a series of channels based on a preprogrammed sweep sequence. For example, an application may require  
eight measurements from channel 3. In this case, the FIFO is filled with eight data sequentially taken from  
channel 3. Another application may require data from channel 0, channel 2, channel 4, and channel 6 in an  
orderly manner. Therefore, the threshold is set for 1/2 and the sweep sequence 0−2−4−6−0−2−4−6 is chosen.  
An interrupt is sent to the host as soon as all four data are in the FIFO.  
In single shot mode, the FIFO automatically uses a 1/8 FIFO depth. Therefore the CFR bits (D1,0) controlling  
FIFO depth are don’t care.  
SCLK and conversion speed  
There are two ways to adjust the conversion speed.  
D
The SCLK can be used as the source of the conversion clock to get the highest throughput of the device.  
The minimum onboard OSC is 3.6 MHz and 14 conversion clocks are required to complete a conversion.  
(Corresponding 3.86 µs conversion time) The devices can operate with an SCLK up to 20 MHz for the  
supply voltage range specified. When a more accurate conversion time is desired, the SCLK can be used as  
the source of the conversion clock. The clock divider provides speed options appropriate for an application  
where a high speed SCLK is used for faster I/O. The total conversion time is 14 ×(DIV/f  
) where DIV is 1,  
SCLK  
2, or 4. For example a 20 MHz SCLK with the divide by 4 option produces a {14 × (4/20 M)} = 2.8 µs  
conversion time. When an external serial clock (SCLK) is used as the source of the conversion clock, the  
maximum equivalent conversion clock (f  
/DIV) should not exceed 6 MHz.  
SCLK  
D
Autopower down can be used to slow down the device at a reduced power consumption level. This mode  
is always used by the converter. If the device is not accessed (by CS or CSTART), the converter is powered  
down to save power. The built-in reference is left on in order to quickly resume operation within one half  
SCLK period. This provides unlimited choices to trade speed with power savings.  
reference voltage  
The device has a built-in reference with a programmable level of 2 V or 4 V. If the internal reference is used,  
REFP is set to 2 V or 4 V and REFM should be connected to the analog ground of the converter. An external  
reference can also be used through two reference input pins, REFP and REFM, if the reference source is  
programmed as external. The voltage levels applied to these pins establish the upper and lower limits of the  
analog inputs to produce a full-scale and zero-scale reading respectively. The values of REFP, REFM, and the  
analog input should not exceed the positive supply or be lower than GND consistent with the specified absolute  
maximum ratings. The digital output is at full scale when the input signal is equal to or higher than REFP and  
at zero when the input signal is equal to or lower than REFM.  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
reference block equivalent circuit  
INTERNAL  
REF  
Close = Int Ref Used  
Open = Ext Ref Used  
REFP  
Sample  
Convert  
10 µF  
Internal  
Reference  
Compensation  
Cap  
0.1 µF  
Decoupling  
Cap  
~50 pF  
CDAC  
REFM (See Note A)  
External to the Device  
NOTES: A. If internal reference is used, tie REFM to analog ground and install a 10 µF (or 4.7 µF) internal reference compensation capacitor  
between REFP and REFM to store the charge as shown in the figure above.  
B. If external reference is used, the 10 µF (internal reference compensation) capacitor is optional. REFM can be connected to external  
REFM or AGND.  
C. Internal reference voltage drift, due to temperature variations, is approximately 10 mV about the nominal 2 V (typically) from −10°C  
to 100°C. The nominal value also varies approximately 50 mV across devices.  
D. Internal reference leakage during low ON time: Leakage resistance is on the order of 100 Mor more. This means the time constant  
is about 1000 s with 10 µF compensation capacitance. Since the REF voltage does not vary much, the reference comes up quickly  
after resuming from auto power down. At power up and power down the internal reference sees a glitch of about 500 µV when 2 V  
internal reference is used (1 mV when 4 V internal reference is used). This glitch settles out after about 50 µs.  
power down  
The device has three power-down modes.  
autopower-down mode  
The device enters the autopower-down state at the end of a conversion.  
In autopower-down, the power consumption reduces to about 1 mA when an internal reference is selected. The  
built-in reference is still on to allow the device to resume quickly. The resumption is fast enough (within 0.5  
SCLK) for use between cycles. An active CS, FS, or CSTART resumes the device from power-down state. The  
power current is 1 µA when an external reference is programmed and SCLK stops.  
hardware/software power-down mode  
Writing 8000h to the device puts the device into a software power down state, and the entire chip (including the  
built-in reference) is powered down. For a hardware power-down, the dedicated PWDN pin provides another  
way to power down the device asynchronously. These two power-down modes power down the entire device  
including the built-in reference to save power. The power down current is reduced to about 1 µA is the SCLK  
is stopped.  
An active CS, FS, or CSTART restores the device. There is no time delay when an external reference is selected.  
However, if an internal reference is used, it takes about 20 ms to warm up. Deselect PWDN pin to remove the  
device from the hardware power-down state. This requires about 20 ms to warm up if an internal reference is  
also selected.  
The configuration register is not affected by any of the power down modes but the sweep operation sequence  
has to be started over again. All FIFO contents are cleared by the power-down modes.  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
absolute maximum ratings over operating free-air temperature (unless otherwise noted)  
Supply voltage range, GND to V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to 6.5 V  
CC  
Analog input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to V  
Reference input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V  
Digital input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to V  
+ 0.3 V  
+ 0.3 V  
+ 0.3 V  
CC  
CC  
CC  
Operating virtual junction temperature range, T . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −55°C to 150°C  
J
Operating free-air temperature range, T : TLV2544/48C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
A
TLV2544/48I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 85°C  
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C  
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
DISSIPATION RATING TABLE  
T
25°C  
DERATING FACTOR  
T
= 70°C  
T
= 85°C  
T = 125°C  
A
POWER RATING  
A
A
A
PACKAGE  
POWER RATING  
ABOVE T = 25°C  
POWER RATING  
POWER RATING  
A
D
1110 mW  
8.9 mW/°C  
10.4 mW/°C  
6.7 mW/°C  
7.8 mW/°C  
710 mW  
577 mW  
222 mW  
259 mW  
DW  
1294 mW  
828 mW  
673 mW  
16 PW  
20 PW  
839 mW  
537 mW  
437 mW  
977 mW  
625 mW  
508 mW  
This is the inverse of the traditional junction-to-ambient thermal resistance (R  
given are for informational purposes only.  
). Thermal resistance is not production tested and the values  
ΘJA  
recommended operating conditions  
MIN  
2.7  
0
NOM  
MAX  
UNIT  
Supply voltage, V  
CC  
3.3  
5.5  
V
V
V
V
Analog input voltage (see Note 4)  
High level control input voltage, V  
V
CC  
2.1  
IH  
IL  
Low-level control input voltage, V  
0.6  
Delay time, delay from CS falling edge to FS rising edge, t  
(See Figure 16)  
d(CSL-FSH)  
0.5  
0.5  
20  
SCLKs  
SCLKs  
ns  
Delay time, delay time from 16th SCLK falling edge to CS rising edge (FS = 1), or  
17th rising edge (FS is active) t (See Figures 16, and 19)  
d(SCLK-CSH)  
Setup time, FS rising edge before SCLK falling edge, t  
(See Figure 16)  
su(FSH-SCLKL  
Hold time, FS hold high after SCLK falling edge, t  
h(FSH-SCLKL)  
(See Figure 16)  
30  
100  
0.75  
75  
ns  
ns  
Pulse width, CS high time, t  
wH(CS)  
(See Figures 16 and 19)  
Pulse width, FS high time, t (FS) (See Figure 16)  
wH  
1
SCLKs  
V
V
= 2.7 V to 3.6 V  
= 4.5 V to 5.5V  
10000  
10000  
CC  
SCLK cycle time, t  
c(SCLK)  
(See Figures 16, and 19)  
ns  
50  
CC  
NOTE 4: When binary output format is used, analog input voltages greater than that applied to REFP convert as all ones (111111111111), while  
input voltages less than that applied to REFM convert as all zeros (000000000000). The device is functional with reference down to  
1 V. (VREFP − VREFM − 1); however, the electrical specifications are no longer applicable.  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
recommended operating conditions (continued)  
MIN  
NOM  
MAX  
0.6  
UNIT  
SCLKs  
SCLKs  
Pulse width, SCLK low time, t  
wL(SCLK)  
(See Figures 16 and 19)  
(See Figures 16 and 19)  
0.4  
0.4  
Pulse width, SCLK high time, t  
wH(SCLK)  
0.6  
Setup time, SDI valid before falling edge of SCLK (FS is active) or the rising edge of  
SCLK (FS=1), t (See Figures 16 and 19)  
25  
5
ns  
ns  
su(DI-SCLK  
Hold time, SDI hold valid after falling edge of SCLK (FS is active) or the rising edge  
of SCLK (FS=1), t (See Figure 16)  
h(DI-SCLK)  
Delay time, delay from CS falling edge to SDO valid, t  
(See Figures 16 and 19)  
d(CSL-DOV)  
25  
25  
ns  
ns  
Delay time, delay from FS falling edge to SDO valid, t  
(See Figure 16)  
SDO = 5 pF  
d(FSL-DOV)  
0.5 SCLK  
+ 9  
0.5 SCLK  
0.5 SCLK  
0.5 SCLK  
0.5 SCLK  
V
= 4.5 V  
= 2.7 V  
CC  
Delay time, delay from SCLK falling edge (FS is  
active) or SCLK rising edge (FS=1) to SDO valid,  
0.5 SCLK  
+ 10  
SDO = 25 pF  
SDO = 5 pF  
SDO = 25 pF  
t
. (See Figures 16 and 19).  
ns  
d(SCLK-DOV)  
0.5 SCLK  
+ 18  
For a date code later than xxx, see the date code  
information item (3).  
V
CC  
0.5 SCLK  
+ 19  
Delay time, delay from 17th SCLK rising edge (FS is active) or the 16th falling edge  
(FS=1) to EOC falling edge, t (See Figures 16 and 19)  
45  
ns  
d(SCLK-EOCL)  
Delay time, delay from 16th SCLK falling edge to INT falling edge (FS =1) or from  
the 17th rising edge SCLK to INT falling edge (when FS active), t  
(See Figure 19)  
Min t  
µs  
d(SCLK-INTL)  
(conv)  
Delay time, delay from CS falling edge or FS rising edge to INT rising edge,  
. See Figures 16, 17, 18 and 19)  
1
50  
50  
ns  
ns  
t
t
d(CSL-INTH) or d(FSH-INTH)  
Delay time, delay from CS rising edge to CSTART falling edge, t  
(See Figures 17 and 18)  
d(CSH-CSTARTL)  
100  
Delay time, delay from CSTART rising edge to EOC falling edge, t  
(See Figures 17 and 18)  
d(CSTARTH-EOCL)  
1
ns  
µs  
µs  
Pulse width, CSTART low time, t (CSTART) (See Figures 17 and 18)  
wL  
Min t  
(sample)  
Delay time, delay from CSTART rising edge to CSTART falling edge,  
Max t  
(conv)  
t
(See Figure 18)  
d(CSTARTH-CSTARTL)  
Delay time, delay from CSTART rising edge to INT falling edge, t  
(See Figures 17 and 18)  
d(CSTARTH-INTL)  
Max t  
(conv)  
µs  
°C  
TLV2544C/TLV2548C  
TLV2544I/TLV2548I  
0
70  
85  
Operating free-air temperature, T  
A
−40  
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SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
electrical characteristics over recommended operating free-air temperature range, V  
= V  
= 2.7 V to  
CC  
REFP  
5.5 V, V  
= 0 V, SCLK frequency = 20 MHz at 5 V, 15 MHz at 3 V (unless otherwise noted)  
REFM  
PARAMETER  
TEST CONDITIONS  
MIN  
2.4  
TYP  
MAX  
UNIT  
V
V
V
V
= 5.5 V, I = −0.2 mA at 25 pF load  
OH  
CC  
CC  
CC  
CC  
V
High-level output voltage  
V
OH  
OL  
= 2.7 V, I = -20 µA at 25 pF load  
V
−0.2  
CC  
OH  
= 5.5 V, I = 0.8 mA at 25 pF load  
OL  
0.4  
0.1  
V
I
Low-level output voltage  
V
= 2.7 V, I = 20 µA at 25 pF load  
OL  
Off-state output current  
(high-impedance-state)  
V
V
= V  
CC  
1
2.5  
µA  
µA  
CS = V  
OZ  
O
CC  
CC  
Off-state output current  
(high-impedance-state)  
I
= 0  
O
−2.5  
−1  
CS = V  
OZ  
I
I
High-level input current  
Low-level input current  
V = V  
CC  
0.005  
2.5  
2.5  
1.1  
1
µA  
µA  
IH  
IL  
I
V = 0 V  
I
−0.005  
V
V
V
V
V
V
V
V
= 4.5 V to 5.5 V  
= 2.7 V to 3.3 V  
= 4.5 V to 5.5 V  
= 2.7 V to 3.3 V  
= 4.5 V to 5.5 V  
= 2.7 V to 3.3 V  
= 4.5 V to 5.5 V  
= 2.7 V to 3.3 V  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CS at 0 V, Ext ref  
CS at 0 V, Int ref  
CS at 0 V, Ext ref  
CS at 0 V, Int ref  
mA  
mA  
mA  
mA  
Operating supply current, normal  
short sampling  
2.1  
1.6  
I
CC  
1.1  
1
Operating supply current, extended  
sampling  
2.1  
1.6  
Power down supply current  
for all digital inputs,  
V
V
= 4.5 V to 5.5 V, Ext clock  
= 2.7 V to 3.3 V, Ext clock  
0.1  
0.1  
1
1
CC  
CC  
I
I
µA  
CC(PD)  
0 V 0.3 V or  
I
V V − 0.3 V, SCLK = 0  
I
CC  
Auto power-down current for all  
V
V
= 4.5 V to 5.5 V, Ext clock, Ext ref  
= 2.7 V to 3.3 V, Ext ref, Ext clock  
1
CC  
CC  
digital inputs, 0 V 0.3 V or  
µA  
µA  
µA  
I
CC(AUTOPWDN)  
§
1.0  
V V − 0.3 V, SCLK = 0  
I
CC  
Selected channel at V  
1
1
CC  
Selected channel leakage current  
Selected channel at 0 V  
= V = 5.5 V, V = GND  
REFM  
Maximum static analog reference  
current into REFP (use external  
reference)  
V
1
REFP  
CC  
Analog inputs  
Control Inputs  
45  
5
50  
25  
C
Z
Input capacitance  
pF  
i
V
V
= 4.5 V  
= 2.7 V  
500  
600  
CC  
CC  
Input MUX ON resistance  
i
§
All typical values are at V  
CC  
1.2 mA if internal reference is used, 165 µA if internal clock is used.  
0.8 mA if internal reference is used, 116 µA if internal clock is used.  
= 5 V, T = 25°C.  
A
22  
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ꢑ ꢘꢚ ꢎ ꢖꢁ ꢖꢗ ꢖꢁ ꢋꢛ ꢊꢀꢋ ꢊꢜꢎꢛ ꢎ ꢀꢖꢁ ꢔꢋ ꢗꢂꢘ ꢚꢀ ꢘꢚꢑ ꢙ ꢎꢀ ꢕ ꢖꢝꢀꢋ ꢒꢋ ꢙ ꢘ ꢚꢊ ꢜꢋ ꢙ ꢗ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
electrical characteristics over recommended operating free-air temperature range, V  
= V  
= 2.7 V to  
CC  
REFP  
5.5 V, V  
= 0 V, SCLK frequency = 20 MHz at 5 V, 15 MHz at 3 V (unless otherwise noted) (continued)  
REFM  
ac specifications  
PARAMETER  
TEST CONDITIONS  
f = 12 kHz at 200 KSPS C and I suffix  
MIN  
TYP  
70  
MAX  
−76  
UNIT  
dB  
SINAD  
THD  
Signal-to-noise ratio +distortion  
Total harmonic distortion  
69  
I
f = 12 kHz at 200 KSPS  
I
−82  
11.6  
−84  
dB  
ENOB  
SFDR  
Effective number of bits  
f = 12 kHz at 200 KSPS  
I
Bits  
dB  
Spurious free dynamic range  
f = 12 kHz at 200 KSPS  
I
−75  
Analog input  
Full power-bandwidth, −3 dB  
Full-power bandwidth, −1 dB  
1
MHz  
kHz  
500  
reference specifications(0.1 µF and 10 µF between REFP and REFM pins)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Positive reference input voltage, REFP  
Negative reference input voltage, REFM  
V
V
= 2.7 V to 5.5 V  
2
V
V
V
CC  
CC  
2
= 2.7 V to 5.5 V  
= 5.5 V  
0
CC  
CS = 1, SCLK = 0, (off)  
100  
20  
MΩ  
kΩ  
MΩ  
kΩ  
V
V
CC  
CC  
CS = 0, SCLK = 20 MHz (on)  
CS = 1, SCLK = 0 (off)  
25  
25  
Reference Input impedance  
100  
20  
V
= 2.7 V  
CS = 0, SCLK = 15 MHz (on)  
Reference Input voltage difference, REFP−REFM  
Internal reference voltage, REFP−REFM  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 2.7 V to 5.5 V  
= 5.5 V  
2
V
CC  
VREF SELECT = 4 V  
VREF SELECT = 2 V  
VREF SELECT = 2 V  
3.85  
1.925  
1.925  
4
2
4.15  
2.075  
2.075  
V
= 5.5 V  
V
= 2.7 V  
2
V
Internal reference start-up time  
= 5.5 V, 2.7 V with 10 µF compensation cap  
20  
16  
ms  
PPM/°C  
Internal reference temperature coefficient  
= 2.7 V to 5.5 V  
40  
Specified by design  
23  
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ꢚꢀ  
ꢀꢋ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
operating characteristics over recommended operating free-air temperature range, V  
= V  
= 2.7 V to  
CC  
REFP  
5.5 V, V  
= 0 V, SCLK frequency = 20 MHz at 5 V, 15 MHz at 3 V (unless otherwise noted)  
REFM  
TYP  
PARAMETER  
TEST CONDITIONS  
MIN  
MAX  
UNIT  
LSB  
LSB  
LSB  
LSB  
E
E
E
E
Integral linearity error (INL) (see Note 6)  
Differential linearity error (DNL)  
Offset error (see Note 7)  
1
1
L
See Note 5  
D
See Note 5  
See Note 5  
2.5  
+3.5  
O
FS  
Full scale error (see Note 7)  
−1.6  
800h  
SDI = B000h  
SDI = C000h  
SDI = D000h  
(2048D)  
Self-test output code (see Table 1 and  
Note 8)  
000h (0D)  
FFFh  
(4095D)  
Internal OSC  
2.33  
600  
3.5  
3.86  
(14   DIV)  
t
t
Conversion time  
External SCLK  
µs  
(conv)  
f
SCLK  
With a maximum of 1-kinput source  
Sampling time  
ns  
(sample)  
impedance  
All typical values are at T = 25°C.  
A
NOTES: 5. Analog input voltages greater than that applied to REFP convert as all ones (111111111111), while input voltages less than that  
applied to REFM convert as all zeros (000000000000).  
6. Linear error is the maximum deviation from the best straight line through the A/D transfer characteristics.  
7. Zero error is the difference between 000000000000 and the converted output for zero input voltage: full-scale error is the difference  
between 111111111111 and the converted output for full-scale input voltage.  
8. Both the input data and the output codes are expressed in positive logic.  
24  
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ꢃ ꢈ ꢉ ꢊꢂꢶ ꢀꢋ ꢶꢄ ꢈ ꢄ ꢊꢂꢆꢶ ꢌ ꢃ ꢊꢍꢎꢀꢆꢶ ꢃ ꢏ ꢏ ꢊꢐꢑꢒ ꢑꢆ ꢶꢅ ꢊꢓꢇ ꢊꢔ ꢕꢖꢗꢗꢘ ꢁꢆ ꢶꢁ ꢋ ꢙꢊ ꢒꢋ ꢙꢘ ꢚ  
ꢑ ꢘꢚ ꢎ ꢖꢁꢶꢖꢗ ꢖꢁ ꢋ ꢛꢊꢀꢋ ꢊꢜꢎꢛ ꢎ ꢀꢖꢁꢶꢔ ꢋꢗ ꢂꢘꢚꢀ ꢘ ꢚꢑꢶ ꢙꢎ ꢀ ꢕꢶꢖꢝꢀꢋ ꢒꢋ ꢙ ꢘꢚ ꢊꢜ ꢋ ꢙꢗ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
PARAMETER MEASUREMENT INFORMATION  
25  
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ꢀꢋ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
PARAMETER MEASUREMENT INFORMATION  
SELECT CYCLE  
V
V
IH  
CS  
IL  
t
d(CSH-CSTARTL)  
t
wL(CSTART)  
V
V
IH  
CSTART  
IL  
t
d(CSTARTH-INTL)  
t
(CONV)  
V
OH  
EOC  
INT  
V
OL  
t
d(CSTARTH-EOCL)  
t
d(CSL-INTH)  
V
OH  
V
OL  
CSTART falling edge may come before the rising edge of CS but no sooner than the fifth SCLK of the SELECT CYCLE.  
Figure 17. Critical Timing (Extended Sampling, Single Shot)  
SELECT CYCLE  
V
IH  
CS  
t
V
wL(CSTART)  
IL  
t
t
d(CSTARTH−CSTARTL)  
d(CSH-CSTARTL)  
CSTART  
V
V
IH  
IL  
V
OH  
EOC  
INT  
t
V
d(CSL-INTH)  
OL  
t
d(CSTARTH-EOCL)  
t
d(CSTARTH-INTL)  
V
OH  
V
OL  
CSTART falling edge may come before the rising edge of CS but no sooner than the fifth SCLK of the SELECT CYCLE. In this case, the actual  
sampling time is measured from the rising edge CS to the rising edge of CSTART.  
Figure 18. Critical Timing (Extended Sampling, Repeat/Sweep/Repeat Sweep)  
26  
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ꢃ ꢈ ꢉ ꢊꢂꢶ ꢀꢋ ꢶꢄ ꢈ ꢄ ꢊꢂꢆꢶ ꢌ ꢃ ꢊꢍꢎꢀꢆꢶ ꢃ ꢏ ꢏ ꢊꢐꢑꢒ ꢑꢆ ꢶꢅ ꢊꢓꢇ ꢊꢔ ꢕꢖꢗꢗꢘ ꢁꢆ ꢶꢁ ꢋ ꢙꢊ ꢒꢋ ꢙꢘ ꢚ  
ꢑ ꢘꢚ ꢎ ꢖꢁꢶꢖꢗ ꢖꢁ ꢋ ꢛꢊꢀꢋ ꢊꢜꢎꢛ ꢎ ꢀꢖꢁꢶꢔ ꢋꢗ ꢂꢘꢚꢀ ꢘ ꢚꢑꢶ ꢙꢎ ꢀ ꢕꢶꢖꢝꢀꢋ ꢒꢋ ꢙ ꢘꢚ ꢊꢜ ꢋ ꢙꢗ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
PARAMETER MEASUREMENT INFORMATION  
27  
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ꢚꢀ  
ꢀꢋ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
TYPICAL CHARACTERISTICS  
INTEGRAL NONLINEARITY  
INTEGRAL NONLINEARITY  
vs  
vs  
TEMPERATURE  
TEMPERATURE  
0.53  
0.52  
0.51  
0.6  
0.595  
0.59  
0.585  
0.5  
0.58  
0.575  
0.49  
V
= 2.7 V, Internal Reference = 2 V,  
CC  
Internal Oscillator, Single Shot,  
Short Sample, Mode 00 µP Mode  
0.57  
0.565  
0.56  
V
= 5.5 V, Internal Reference = 2 V,  
CC  
0.48  
0.47  
Internal Oscillator, Single Shot,  
Short Sample, Mode 00 µP Mode  
−23.75  
25  
90  
−40  
−7.5 8.75  
41.25 57.5 73.75  
−23.75  
25  
− Temperature − °C  
90  
−40  
−7.5 8.75  
41.25 57.5 73.75  
T
A
− Temperature − °C  
T
A
Figure 21  
Figure 20  
DIFFERENTIAL NONLINEARITY  
DIFFERENTIAL NONLINEARITY  
vs  
vs  
TEMPERATURE  
TEMPERATURE  
0.496  
0.494  
0.492  
0.49  
0.48  
0.47  
0.46  
0.45  
0.44  
0.43  
0.42  
0.488  
0.486  
0.484  
0.482  
V
= 5.5 V, Internal Reference = 2 V,  
CC  
V
= 2.7 V, Internal Reference = 2 V,  
CC  
Internal Oscillator, Single Shot,  
Internal Oscillator, Single Shot,  
Short Sample, Mode 00 µP Mode  
Short Sample, Mode 00 µP Mode  
0.48  
0.478  
−23.75  
25  
90  
−40  
−7.5 8.75  
41.25 57.5 73.75  
−23.75  
25  
− Temperature − °C  
90  
−40  
−7.5 8.75  
41.25 57.5 73.75  
T
A
− Temperature − °C  
T
A
Figure 22  
Figure 23  
28  
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ꢑ ꢘꢚ ꢎ ꢖꢁ ꢖꢗ ꢖꢁ ꢋꢛ ꢊꢀꢋ ꢊꢜꢎꢛ ꢎ ꢀꢖꢁ ꢔꢋ ꢗꢂꢘ ꢚꢀ ꢘꢚꢑ ꢙ ꢎꢀ ꢕ ꢖꢝꢀꢋ ꢒꢋ ꢙ ꢘ ꢚꢊ ꢜꢋ ꢙ ꢗ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
TYPICAL CHARACTERISTICS  
OFFSET ERROR  
vs  
GAIN ERROR  
vs  
TEMPERATURE  
TEMPERATURE  
1.2  
1
0.5  
0
0.8  
−0.5  
0.6  
0.4  
−1  
−1.5  
V
CC  
= 5 V, Internal Reference = 4 V,  
V
CC  
= 5 V, Internal Reference = 4 V,  
External Oscillator = SCLK/4,  
Single Shot, Long Sample,  
Mode 00 µP Mode  
External Oscillator = SCLK/4,  
Single Shot, Long Sample,  
Mode 00 µP Mode  
0.2  
0
−2  
−2.5  
−23.75  
25  
90  
−23.75  
25  
T − Temperature − °C  
A
90  
−40  
−7.5 8.75  
41.25 57.5 73.75  
−40  
−7.5 8.75  
41.25 57.5 73.75  
T
A
− Temperature − °C  
Figure 24  
Figure 25  
SUPPLY CURRENT  
vs  
POWER DOWN CURRENT  
vs  
TEMPERATURE  
TEMPERATURE  
1.4  
0.4  
0.2  
External Reference = 4 V, Internal Oscillator,  
Single Shot, Short Sample, Mode 00 µP Mode  
Long Sample  
V
CC  
= 5 V  
1.2  
1
0
−0.2  
Short Sample  
−0.4  
−0.6  
V
CC  
= 2.7 V  
0.8  
0.6  
V
CC  
= 5.5 V  
V
= 5 V, External Reference = 4 V,  
CC  
Internal Oscillator, Single Shot,  
Short Sample, Mode 00 µP Mode  
−0.8  
−1  
−23.75  
25  
90  
−40  
−7.5 8.75  
41.25 57.5 73.75  
−23.75  
25  
− Temperature − °C  
90  
−40  
−7.5 8.75  
41.25 57.5 73.75  
T
A
− Temperature − °C  
T
A
Figure 26  
Figure 27  
29  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
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ꢚꢀ  
ꢀꢋ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
TYPICAL CHARACTERISTICS  
INTEGRAL NONLINEARITY  
vs  
SAMPLES  
1.0  
V
= 2.7 V, Internal Reference = 2 V, Internal Oscillator,  
CC  
Single Shot, Short Sample, Mode 00 µP Mode  
0.5  
0.0  
−0.5  
−1.0  
0
0
0
4097  
4097  
4097  
Samples  
Figure 28  
DIFFERENTIAL NONLINEARITY  
vs  
SAMPLES  
1.0  
0.5  
V
= 2.7 V, Internal Reference = 2 V, Internal Oscillator,  
CC  
Single Shot, Short Sample, Mode 00 µP Mode  
0.0  
−0.5  
−1.0  
Samples  
Figure 29  
INTEGRAL NONLINEARITY  
vs  
SAMPLES  
1.0  
0.5  
V
= 5 V, Internal Reference = 2 V, Internal Oscillator,  
CC  
Single Shot, Short Sample, Mode 00 µP Mode  
0.0  
−0.5  
−1.0  
Samples  
Figure 30  
30  
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ꢘꢚ  
ꢀꢋ  
ꢀꢖ  
ꢚꢊ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
TYPICAL CHARACTERISTICS  
DIFFERENTIAL NONLINEARITY  
vs  
SAMPLES  
1.0  
0.5  
V
= 5 V, Internal Reference = 2 V, Internal Oscillator,  
CC  
Single Shot, Short Sample, Mode 00 µP Mode  
0.0  
−0.5  
−1.0  
0
4097  
Samples  
Figure 31  
100%  
160  
150  
140  
130  
120  
110  
100  
90  
V
= 5 V, External Reference = 4 V,  
CC  
Internal Oscillator , Single Shot, Long Sample, Mode 00 µP  
Mode @ 200 KSPS  
80  
70  
60  
50  
40  
30  
20  
10  
0
0
5
10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90 95 100  
f − Frequency − kHz  
Figure 32  
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ꢚꢀ  
ꢀꢋ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
TYPICAL CHARACTERISTICS  
SIGNAL-TO-NOISE + DISTORTION  
vs  
INPUT FREQUENCY  
EFFECTIVE NUMBER OF BITS  
vs  
INPUT FREQUENCY  
11.50  
11.40  
−67  
−67.50  
−68  
11.30  
11.20  
−68.50  
−69  
11.10  
11  
−69.50  
−70  
V
= 5 V,  
CC  
V
= 5 V,  
CC  
External Reference = 4 V,  
Internal Oscillator,  
Single Shot, Long Sample,  
Mode 00 µP Mode  
External Reference = 4 V,  
Internal Oscillator,  
Single Shot, Long Sample,  
Mode 00 µP Mode  
10.90  
10.80  
−70.50  
−71  
0
50  
100  
150  
0
50  
100  
150  
f − Frequency − kHz  
f − Frequency − kHz  
Figure 33  
Figure 34  
TOTAL HARMONIC DISTORTION  
SPURIOUS FREE DYNAMIC RANGE  
vs  
vs  
INPUT FREQUENCY  
INPUT FREQUENCY  
−69  
−70  
−71  
−72  
−73  
−74  
−75  
−76  
−77  
−73  
−74  
−75  
−76  
−77  
−78  
−79  
−80  
V = 5 V,  
CC  
External Reference = 4 V,  
Internal Oscillator,  
V
= 5 V,  
CC  
External Reference = 4 V,  
Internal Oscillator,  
Single Shot, Long Sample,  
Mode 00 µP Mode  
Single Shot, Long Sample,  
Mode 00 µP Mode  
−81  
−82  
−78  
−79  
0
50  
100  
150  
0
50  
100  
150  
f − Frequency − kHz  
f − Frequency − kHz  
Figure 35  
Figure 36  
32  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
ꢀ ꢁꢂꢃ ꢄ ꢅ ꢅ ꢆ ꢀꢁꢂ ꢃꢄ ꢅꢇ  
ꢃ ꢈ ꢉ ꢊꢂ ꢀ ꢋ ꢄ ꢈꢄ ꢊꢂꢆ ꢌ ꢃ ꢊꢍꢎ ꢀꢆ ꢃ ꢏ ꢏ ꢊꢐꢑꢒ ꢑꢆ ꢅ ꢊꢓꢇ ꢊꢔꢕ ꢖꢗꢗꢘ ꢁꢆ ꢁ ꢋꢙꢊ ꢒꢋ ꢙꢘ ꢚ  
ꢘꢚ  
ꢀꢋ  
ꢀꢖ  
ꢚꢊ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
TYPICAL CHARACTERISTICS  
SIGNAL-TO-NOISE RATIO  
vs  
INPUT FREQUENCY  
−70.2  
−70.4  
−70.6  
V
= 5 V,  
CC  
External Reference = 4 V,  
Internal Oscillator,  
Single Shot, Long Sample,  
Mode 00 µP Mode  
−70.8  
−71  
−71.2  
−71.4  
0
50  
100  
150  
f − Frequency − kHz  
Figure 37  
PRINCIPLES OF OPERATION  
v
cc  
10 kΩ  
V
DD  
XF  
CS  
TXD  
RXD  
SDI  
SDO  
A
IN  
CLKR  
CLKX  
SCLK  
TLV2544/  
TLV2548  
TMS320 DSP  
BIO  
INT  
FSR  
FSX  
FS  
GND  
Figure 38. Typical Interface to a TMS320 DSP  
33  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
ꢃꢈ ꢉꢊ ꢂ ꢀꢋ ꢄ ꢈ ꢄꢊꢂꢆ ꢌ ꢃ ꢊꢍꢎ ꢀꢆ ꢃ ꢏ ꢏꢊ ꢐꢑ ꢒꢑ ꢆ ꢅ ꢊꢓ ꢇ ꢊꢔꢕꢖꢗ ꢗꢘꢁ ꢆ ꢁ ꢋꢙꢊꢒꢋ ꢙ ꢘꢚ  
ꢚꢀ  
ꢀꢋ  
SLAS198E − FEBRUARY 1999 − REVISED JUNE 2003  
DATA CODE INFORMATION  
Parts with a date code earlier than 31xxxxx have the following discrepancies:  
1. Earlier devices react to FS input irrespective of the state of the CS signal  
2. The earlier silicon was designed with SDO prereleased half clock ahead. This means in the microcontroller  
mode (FS=1) the SDO is changed on the rising edge of SCLK with a delay; and for DSP serial port (when  
FS is active) the SDO is changed on the falling edge of SCLK with a delay. This helps the setup time for  
processor input data, but may reduce the hold time for processor input data. It is recommended that a  
100 pF capacitance be added to the SDO line of the ADC when interfacing with a slower processor that  
requires longer input data hold time.  
3. For earlier silicon, the delay time is specified as:  
MIN  
16  
NOM  
MAX  
UNIT  
SDO = 0 pF  
V
V
= 4.5 V  
= 2.7 V  
CC  
SDO = 100 pF  
SDO = 0 pF  
20  
Delay time, delay from SCLK falling edge (FS is active) or  
ns  
SCLK rising edge (FS=1) to next SDO valid, t  
.
24  
d(SCLK-DOV)  
CC  
SDO = 100 pF  
30  
This is because the SDO is changed at the rising edge in the up mode with a delay. This is the hold time  
required by the external digital host processor, therefore, a minimum value is specified. The newer silicon  
has been revised with SDO changed at the falling edge in the up mode with a delay. Since at least 0.5 SCLK  
exists as the hold time for the external host processor, the specified maximum value helps with the  
calculation of the setup time requirement of the external digital host processor.  
For an explanation of the DSP mode, reverse the rising/falling edges in item (2) above.  
34  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
PACKAGE OPTION ADDENDUM  
www.ti.com  
24-Feb-2006  
PACKAGING INFORMATION  
Orderable Device  
TLV2544CD  
Status (1)  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
Drawing  
SOIC  
D
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
16  
20  
20  
20  
20  
20  
20  
20  
20  
20  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2544CDG4  
TLV2544CDR  
SOIC  
SOIC  
D
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
D
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2544CDRG4  
TLV2544CPW  
TLV2544CPWG4  
TLV2544CPWR  
TLV2544CPWRG4  
TLV2544ID  
SOIC  
D
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TSSOP  
TSSOP  
TSSOP  
TSSOP  
SOIC  
PW  
PW  
PW  
PW  
D
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2544IDG4  
TLV2544IDR  
SOIC  
D
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
SOIC  
D
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2544IDRG4  
TLV2544IPW  
SOIC  
D
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TSSOP  
TSSOP  
TSSOP  
TSSOP  
SOIC  
PW  
PW  
PW  
PW  
DW  
DW  
DW  
DW  
PW  
PW  
PW  
PW  
DW  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2544IPWG4  
TLV2544IPWR  
TLV2544IPWRG4  
TLV2548CDW  
TLV2548CDWG4  
TLV2548CDWR  
TLV2548CDWRG4  
TLV2548CPW  
TLV2548CPWG4  
TLV2548CPWR  
TLV2548CPWRG4  
TLV2548IDW  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
SOIC  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
SOIC  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
SOIC  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TSSOP  
TSSOP  
TSSOP  
TSSOP  
SOIC  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
24-Feb-2006  
Orderable Device  
TLV2548IDWR  
TLV2548IDWRG4  
TLV2548IPW  
Status (1)  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
Drawing  
SOIC  
DW  
20  
20  
20  
20  
20  
20  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
SOIC  
DW  
PW  
PW  
PW  
PW  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TSSOP  
TSSOP  
TSSOP  
TSSOP  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2548IPWG4  
TLV2548IPWR  
TLV2548IPWRG4  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in  
a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2)  
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check  
http://www.ti.com/productcontent for the latest availability information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements  
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered  
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and  
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS  
compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame  
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)  
(3)  
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder  
temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is  
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the  
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take  
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on  
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited  
information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI  
to Customer on an annual basis.  
Addendum-Page 2  
MECHANICAL DATA  
MTSS001C – JANUARY 1995 – REVISED FEBRUARY 1999  
PW (R-PDSO-G**)  
PLASTIC SMALL-OUTLINE PACKAGE  
14 PINS SHOWN  
0,30  
0,19  
M
0,10  
0,65  
14  
8
0,15 NOM  
4,50  
4,30  
6,60  
6,20  
Gage Plane  
0,25  
1
7
0°8°  
A
0,75  
0,50  
Seating Plane  
0,10  
0,15  
0,05  
1,20 MAX  
PINS **  
8
14  
16  
20  
24  
28  
DIM  
3,10  
2,90  
5,10  
4,90  
5,10  
4,90  
6,60  
6,40  
7,90  
9,80  
9,60  
A MAX  
A MIN  
7,70  
4040064/F 01/97  
NOTES: A. All linear dimensions are in millimeters.  
B. This drawing is subject to change without notice.  
C. Body dimensions do not include mold flash or protrusion not to exceed 0,15.  
D. Falls within JEDEC MO-153  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications,  
enhancements, improvements, and other changes to its products and services at any time and to discontinue  
any product or service without notice. Customers should obtain the latest relevant information before placing  
orders and should verify that such information is current and complete. All products are sold subject to TI’s terms  
and conditions of sale supplied at the time of order acknowledgment.  
TI warrants performance of its hardware products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI  
deems necessary to support this warranty. Except where mandated by government requirements, testing of all  
parameters of each product is not necessarily performed.  
TI assumes no liability for applications assistance or customer product design. Customers are responsible for  
their products and applications using TI components. To minimize the risks associated with customer products  
and applications, customers should provide adequate design and operating safeguards.  
TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right,  
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amplifier.ti.com  
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dataconverter.ti.com  
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dsp.ti.com  
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www.ti.com/broadband  
www.ti.com/digitalcontrol  
www.ti.com/military  
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Logic  
interface.ti.com  
logic.ti.com  
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power.ti.com  
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Copyright 2006, Texas Instruments Incorporated  

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