TLE2027-EP [TI]

Excalibur™ LOW-NOISE HIGH-SPEED PRECISION OPERATIONAL AMPLIFIER; Excaliburâ ?? ¢低噪声高速精密运算放大器
TLE2027-EP
型号: TLE2027-EP
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

Excalibur™ LOW-NOISE HIGH-SPEED PRECISION OPERATIONAL AMPLIFIER
Excaliburâ ?? ¢低噪声高速精密运算放大器

运算放大器
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TLE2027-EP  
Excalibur™ LOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
FEATURES  
VIO . . . 100 μV Max  
Controlled Baseline  
AVD . . . 45 V/μV Typ With RL = 2 k,  
19 V/μV Typ With RL = 600 Ω  
One Assembly/Test Site, One Fabrication  
Site  
Available in Standard-Pinout Small-Outline  
Package  
Extended Temperature Performance of  
–55°C to 125°C  
Output Features Saturation Recovery Circuitry  
Macromodels and Statistical information  
Enhanced Diminishing Manufacturing Sources  
(DMS) Support  
D PACKAGE  
(TOP VIEW)  
Enhanced Product-Change Notification  
Qualification Pedigree(1)  
OFFSET N1  
1
2
3
4
8
7
6
5
OFFSET N2  
VCC+  
Outstanding Combination of DC Precision and  
AC Performance:  
IN-  
IN+  
OUT  
Unity-Gain Bandwidth . . . 13 MHz Typ  
VCC-  
NC  
Vn . . . 3.3 nV/Hz at f = 10 Hz Typ,  
2.5 nV/Hz at f = 1 kHz Typ  
(1)  
Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
DESCRIPTION  
The TLE2027 contains innovative circuit design expertise and high-quality process control techniques to produce  
a level of ac performance and dc precision previously unavailable in single operational amplifiers. Manufactured  
using TI's state-of-the-art Excalibur process, these devices allow upgrades to systems that use lower-precision  
devices.  
In the area of dc precision, the TLE2027 offers maximum offset voltages of 100 μV, common-mode rejection  
ratio of 131 dB (typ), supply voltage rejection ratio of 144 dB (typ), and dc gain of 45 V/μV (typ).  
The ac performance of the TLE2027 is highlighted by a typical unity-gain bandwidth specification of 15 MHz, 55°  
of phase margin, and noise voltage specifications of 3.3 nV/Hz and 2.5 nV/Hz at frequencies of 10 Hz and  
1 kHz, respectively.  
The TLE2027 is available in a wide variety of packages, including the industry-standard 8-pin small-outline  
version for high-density system applications. The device is characterized for operation over the full military  
temperature range of –55°C to 125°C.  
ORDERING INFORMATION(1)  
PACKAGED DEVICES  
SMALL OUTLINE(2) (D)  
TLE2027MDREP  
VIOmax AT  
TA  
25°C  
–55°C to 125°C  
100 μV  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
website at www.ti.com.  
(2) The D package is available taped and reeled with 2500 units/reel.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
TLE2027-EP  
ExcaliburLOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
SYMBOL  
OFFSET N1  
IN+  
+
-
OUT  
IN-  
OFFSET N2  
2
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TLE2027-EP  
Excalibur™ LOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
TLE202XY CHIP INFORMATION  
This chip, when properly assembled, displays characteristics similar to the TLE202xC. Thermal compression or  
ultrasonic bonding may be used on the doped-aluminum bonding pads. The chip may be mounted with  
conductive epoxy or a gold-silicon preform.  
BONDING PAD ASSIGNMENTS  
(1)  
(3)  
VCC+  
(7)  
(6)  
OFFSET N1  
IN +  
(4)  
+
-
(6)  
OUT  
(2)  
(8)  
IN-  
(4)  
VCC-  
OFFSET N2  
90  
(3)  
(7)  
Chip Thickness: 15 MiIs Typical  
(2)  
Bonding Pads: 4 ´ 4 Mils Minimum  
TJmax = 150°C  
Tolerances Are ±10%.  
All Dimensions Are in Mils.  
(8)  
Pin (4) is Internally Connected  
to Backside of Chip.  
(1)  
73  
3
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TLE2027-EP  
ExcaliburLOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
EQUIVALENT SCHEMATIC  
* N I  
+ N I  
4
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TLE2027-EP  
Excalibur™ LOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
Absolute Maximum Ratings(1)  
over operating free-air temperature range (unless otherwise noted)  
MIN  
MAX UNIT  
VCC+  
VCC–  
VID  
VI  
Supply voltage(2)  
19  
–19  
±1.2  
VCC±  
±1  
V
V
V
Supply voltage  
Differential input voltage(3)  
Input voltage range (any input)  
Input current (each input)  
Output current  
II  
mA  
mA  
mA  
mA  
IO  
±50  
50  
Total current into VCC+  
Total current out of VCC–  
Duration of short-circuit current at (or below) 25°C(4)  
50  
Unlimited  
See Dissipation  
Rating Table  
Continuous total power dissipation  
TA  
Operating free-air temperature range  
Storage temperature range(5)  
–55  
–65  
125  
°C  
°C  
°C  
Tstg  
150  
260  
Lead temperature 1,6 mm (1/16 in) from case for 10 s  
D package  
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating  
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) All voltage values, except differential voltages, are with respect to the midpoint between VCC+ and VCC–  
.
(3) Differential voltages are at IN+ with respect to IN–. Excessive current flows if a differential input voltage in excess of approximately  
±1.2 V is applied between the inputs, unless some limiting resistance is used.  
(4) The output may be shorted to either supply. Temperature and/or supply voltages must be limited to ensure that the maximum dissipation  
rating is not exceeded.  
(5) Long-term high-temperature storage and/or extended use at maximum recommended operating conditions may result in a reduction of  
overall device life. See http://www.ti.com/ep_quality for additional information on enhanced product packaging.  
Dissipation Rating Table  
T
A 25°C  
DERATING FACTOR  
ABOVE TA = 25°C  
TA = 70°C  
POWER RATING  
TA = 105°C  
POWER RATING  
TA = 125°C  
POWER RATING  
PACKAGE  
POWER RATING  
D
725 mW  
5.8 mW/°C  
464 mW  
261 mW  
145 mW  
Recommended Operating Conditions  
MIN  
MAX  
±19  
11  
UNIT  
VCC±  
VIC  
Supply voltage  
±4  
–11  
V
TA = 25°C  
TA = Full range(1)  
Common-mode input voltage  
Operating free-air temperature  
V
–10.3  
–55  
10.3  
125  
TA  
°C  
(1) Full range is –55°C to 125°C.  
5
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TLE2027-EP  
ExcaliburLOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
Electrical Characteristics  
at specified free-air temperature, VCC± = ±15 V (unless otherwise noted)  
(1)  
PARAMETER  
TEST CONDITIONS  
TA  
MIN  
TYP  
MAX UNIT  
25°C  
Full range  
Full range  
25°C  
20  
100  
μV  
VIO  
Input offset voltage  
VIC = 0, RS = 50 Ω  
200  
αVIO  
Temperature coefficient of input offset voltage  
Input offset voltage long-term drift(2)  
VIC = 0, RS = 50 Ω  
VIC = 0, RS = 50 Ω  
0.4  
0.006  
6
μV/°C  
μV/mo  
25°C  
90  
nA  
IIO  
Input offset current  
Input bias current  
VIC = 0, RS = 50 Ω  
VIC = 0, RS = 50 Ω  
Full range  
25°C  
150  
15  
90  
nA  
IIB  
Full range  
150  
–11  
to  
–13  
to  
25°C  
11  
13  
VICR  
Common-mode input voltage range  
RS = 50 Ω  
V
–10.3  
to  
Full range  
10.3  
25°C  
Full range  
25°C  
10.5  
10  
12.9  
13.2  
–13  
–13.5  
45  
RL = 600 Ω  
RL = 2 kΩ  
RL = 600 Ω  
RL = 2 kΩ  
VOM+  
Maximum positive peak output voltage swing  
Maximum negative peak output voltage swing  
V
V
12  
Full range  
25°C  
11  
–10.5  
–10  
–12  
–11  
5
Full range  
25°C  
VOM–  
Full range  
25°C  
VO = ±11 V, RL = 2 kΩ  
VO = ±10 V, RL = 2 kΩ  
Full range  
25°C  
2.5  
3.5  
1.8  
2
AVD  
Large-signal differential voltage amplification  
38  
V/μV  
VO = ±10 V, RL = 1 kΩ  
VO = ±10 V, RL = 600 Ω  
Full range  
25°C  
19  
8
Ci  
zo  
Input capacitance  
25°C  
pF  
Open-loop output impedance  
IO = 0  
25°C  
50  
25°C  
100  
96  
131  
VIC = VICRmin,  
RS = 50 Ω  
CMRR Common-mode rejection ratio  
dB  
dB  
Full range  
VCC± = ±4 V to ±18 V,  
RS = 50 Ω  
25°C  
94  
90  
144  
3.8  
kSVR  
Supply-voltage rejection ratio (ΔVCC±/ΔVIO)  
VCC± = ±4 V to ±18 V,  
RS = 50 Ω  
Full range  
25°C  
5.3  
mA  
5.6  
ICC  
Supply current  
VO = 0, No load  
Full range  
(1) Full range is –55°C to 125°C.  
(2) Typical values are based on the input offset voltage shift observed through 168 hours of operating life test at TA = 150°C extrapolated to  
TA = 25°C using the Arrhenius equation and assuming an activation energy of 0.96 eV.  
6
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TLE2027-EP  
Excalibur™ LOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
Operating Characteristics  
at specified free-air temperature, VCC± = ±15 V, TA = 25°C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
RL = 2 k, CL = 100 pF,  
See Figure 1  
1.7  
2.8  
SR  
Slew rate at unity gain  
V/μs  
RL = 2 k, CL = 100 pF,  
TA = –55°C to 125°C,  
See Figure 1  
1
f = 10 Hz  
3.3  
2.5  
Vn  
Equivalent input noise voltage (see Figure 2) RS = 20 Ω  
nV/Hz  
nV  
f = 1 kHz  
f = 0.1 Hz to 10 Hz  
VN(PP)  
In  
Peak-to-peak equivalent input noise voltage  
Equivalent input noise current  
50  
f = 10 Hz  
f = 1 kHz  
1.5  
pA/Hz  
0.4  
THD  
B1  
Total harmonic distortion  
VO = 10 V, AVD = 1(1)  
RL = 2 k, CL = 100 pF  
RL = 2 kΩ  
<0.002%  
13  
Unity-gain bandwidth (see Figure 3)  
Maximum output-swing bandwidth  
Phase margin at unity gain (see Figure 3)  
MHz  
kHz  
BOM  
φm  
30  
RL = 2 k, CL = 100 pF  
55°  
(1) Measured distortion of the source used in the analysis was 0.002%.  
7
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TLE2027-EP  
ExcaliburLOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
PARAMETER MEASUREMENT INFORMATION  
Rf  
2 kW  
15 V  
15 V  
-
-
VO  
RI  
VO  
+
+
VI  
-15 V  
CL  
100 pF  
(see Note A)  
=
RL = 2 k W  
-15 V  
20 W  
20 W  
NOTE A: CL includes fixture capacitance.  
Figure 1. Slew-Rate Test Circuit  
10 kW  
Figure 2. Noise-Voltage Test Circuit  
Rf  
15 V  
15 V  
100 W  
-
-
VI  
RI  
VO  
VO  
+
+
VI  
CL  
100 pF  
(see Note A)  
=
2 kW  
2 kW  
-15 V  
CL  
100 pF  
(see Note A)  
=
-15 V  
NOTE A: CL includes fixture capacitance.  
NOTE A: CL includes fixture capacitance.  
Figure 4. Small-Signal Pulse-Response Test Circuit  
Figure 3. Unity-Gain Bandwidth and  
Phase-Margin Test Circuit  
8
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Excalibur™ LOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
DEVICE INFORMATION  
Typical Values  
Typical values presented in this data sheet represent the median (50% point) of device parametric performance.  
Initial Estimates of Parameter Distributions  
In the ongoing program of improving data sheets and supplying more information to our customers, Texas  
Instruments has added an estimate of not only the typical values but also the spread around these values.  
These are in the form of distribution bars that show the 95% (upper) points and the 5% (lower) points from the  
characterization of the initial wafer lots of this new device type (see Figure 5). The distribution bars are shown at  
the points where data was actually collected. The 95% and 5% points are used instead of ±3 sigma since some  
of the distributions are not true Gaussian distributions.  
The number of units tested and the number of different wafer lots used are on all of the graphs where  
distribution bars are shown. As noted in Figure 5, there were a total of 835 units from two wafer lots. In this  
case, there is a good estimate for the within-lot variability and a possibly poor estimate of the lot-to-lot variability.  
This is always the case on newly released products since there can only be data available from a few wafer lots.  
The distribution bars are not intended to replace the minimum and maximum limits in the electrical tables. Each  
distribution bar represents 90% of the total units tested at a specific temperature. While 10% of the units tested  
fell outside any given distribution bar, this should not be interpreted to mean that the same individual devices fell  
outside every distribution bar.  
SUPPLY CURRENT  
vs  
FREE-AIR TEMPERATURE  
5
95% point on the distribution bar  
(5% of the devices fell above this point)  
V
V
= ±15 V  
CC  
±
= 0  
O
No Load  
Sample Size = 835 Units  
From 2 Water Lots  
4.5  
4
90% of the devices were within the upper  
and lower points on the distribution bar.  
5% point on the distribution bar  
(5% of the devices fell below this point)  
3.5  
3
2.5  
−75 −50 −25  
0
25 50 75 100 125 150  
T
A
− Free-Air Temperature − °C  
Figure 5. Sample Graph With Distribution Bars  
9
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TLE2027-EP  
ExcaliburLOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
www.ti.com  
SLOS511JUNE 2007  
TYPICAL CHARACTERISTICS  
Table of Graphs  
FIGURE  
6,  
VIO  
ΔVIO  
IIO  
Input offset voltage  
Distribution  
Input offset voltage change  
Input offset current  
vs Time after power on  
7, 8  
9
vs Free-air temperature  
vs Free-air temperature  
vs Common-mode input voltage  
vs Differential input voltage  
vs Frequency  
10  
IIB  
Input bias current  
11  
II  
Input current  
12  
VO(PP)  
Maximum peak-to-peak output voltage  
13, 14  
15, 16  
17, 18  
19  
vs Load resistance  
vs Free-air temperature  
vs Supply voltage  
vs Load resistance  
vs Frequency  
VOM  
Maximum (positive/negative) peak output voltage  
Large-signal differential voltage amplification  
20  
AVD  
21, 22  
23  
vs Free-air temperature  
vs Frequency  
zo  
Output impedance  
24  
CMRR  
kSVR  
Common-mode rejection ratio  
Supply-voltage rejection ratio  
vs Frequency  
25  
vs Frequency  
26  
vs Supply voltage  
vs Elapsed time  
27, 28  
29, 30  
31, 32  
33  
IOS  
Short-circuit output current  
vs Free-air temperature  
vs Supply voltage  
vs Free-air temperature  
Small signal  
ICC  
Supply current  
34  
35  
Voltage-follower pulse response  
Large signal  
36  
Vn  
Equivalent input noise voltage  
Noise voltage (referred to input)  
vs Frequency  
37  
Over 10-s interval  
38  
vs Supply voltage  
vs Load capacitance  
vs Free-air temperature  
vs Supply voltage  
vs Loadcapacitance  
vs Free-air temperature  
39  
B1  
Unity-gain bandwidth  
Slew rate  
40  
SR  
41  
42  
φm  
Phase margin  
43  
44  
10  
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Excalibur™ LOW-NOISE HIGH-SPEED  
PRECISION OPERATIONAL AMPLIFIER  
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SLOS511JUNE 2007  
TYPICAL CHARACTERISTICS  
DISTRIBUTION  
INPUT OFFSET VOLTAGE CHANGE  
vs  
INPUT OFFSET VOLTAGE  
TIME AFTER POWER ON  
16  
14  
12  
10  
8
12  
10  
8
1568 Amplifiers Tested From 2 Wafer Lots  
V
T
= +15 V  
= 25°C  
CC  
+
A
D Package  
6
6
4
50 Amplifiers Tested From 2 Wafer Lots  
4
V
T
A
= ±15 V  
2
CC  
= 25°C  
±
2
D Package  
0
0
10 20  
30  
40  
50  
60  
0
− 120 − 90 − 60 − 30  
0
30  
60  
90  
120  
t − Time After Power On − s  
V
IO  
− Input Offset Voltage − µV  
Figure 6.  
Figure 7.  
INPUT OFFSET VOLTAGE CHANGE  
INPUT OFFSET CURRENT  
vs  
vs  
TIME AFTER POWER ON  
FREE-AIR TEMPERATURE  
6
5
4
3
2
1
0
30  
25  
20  
15  
10  
5
V
V
= ±15 V  
CC  
±
= 0  
IC  
Sample Size = 833 Units  
From 2 Wafer Lots  
50 Amplifiers Tested From 2 Wafer Lots  
V
T
A
= ±15 V  
CC  
= 25°C  
±
P Package  
0
0
20 40 60 80 100 120 140 160 180  
t − Time After Power On − s  
− 75 − 50 − 25  
0
25 50 75 100 125 150  
T
A
− Free-Air Temperature − °C  
NOTE A: Data at high and low temperatures are  
applicable only within the rated operating  
free-air temperature ranges of the various  
devices.  
Figure 8.  
Figure 9.  
11  
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SLOS511JUNE 2007  
TYPICAL CHARACTERISTICS (continued)  
INPUT BIAS CURRENT  
vs  
INPUT BIAS CURRENT  
vs  
FREE-AIR TEMPERATURE  
COMMON-MODE INPUT VOLTAGE  
40  
35  
30  
25  
20  
15  
10  
5
60  
50  
V
T
= ±15 V  
= 25°C  
CC  
V
V
= ±15 V  
±
CC  
±
= 0  
A
IC  
Sample Size = 836 Units  
From 2 Wafer Lots  
40  
30  
20  
10  
0
−10  
−20  
0
−12  
− 8  
− 4  
0
4
8
12  
−75 −50 −25  
0
25 50 75 100 125 150  
V
IC  
− Common-Mode Input Voltage − V  
T
A
− Free-Air Temperature − °C  
NOTE A: Data at high and low temperatures are applicable  
only within the rated operating free-air  
temperatureranges of the various devices.  
Figure 10.  
Figure 11.  
INPUT CURRENT  
vs  
DIFFERENTIAL INPUT VOLTAGE  
MAXIMUM PEAK-TO-PEAK  
OUTPUT VOLTAGE  
vs  
1
FREQUENCY  
30  
V
V
T
= ±15 V  
CC  
±
0.8  
0.6  
V
= ±15 V  
±
CC  
= 0  
IC  
R = 2 kΩ  
L
= 25°C  
A
25  
20  
15  
10  
5
0.4  
0.2  
0
−0.2  
−0.4  
−0.6  
−0.8  
−1  
T
= 125°C  
A
T
A
= −55°C  
−1.8  
−1.2  
V
−0.6  
0
0.6  
1.2 1.8  
− Differential Input Voltage − V  
0
ID  
10 k  
100 k  
1 M  
10 M  
f − Frequency − Hz  
NOTE A: Data at high and low temperatures are applicable only  
within the rated operating free-air temperature ranges of  
the various devices.  
Figure 12.  
Figure 13.  
12  
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TYPICAL CHARACTERISTICS (continued)  
TLE2037  
MAXIMUM PEAK-TO-PEAK  
OUTPUT VOLTAGE  
vs  
MAXIMUM POSITIVE PEAK  
OUTPUT VOLTAGE  
vs  
LOAD RESISTANCE  
FREQUENCY  
14  
12  
10  
8
30  
25  
20  
15  
10  
5
V
CC  
= ±15 V  
±
R
L
= 2 kΩ  
6
T
A
= 125°C  
4
V
= ±15 V  
CC  
±
= 25°C  
T
A
= −55°C  
2
0
T
A
100  
1 k  
10 k  
0
10 k  
R
L
− Load Resistance − Ω  
100 k  
1 M  
10 M  
100 M  
f − Frequency − Hz  
NOTE A: Data at high and low temperatures are applicable  
only within the rated operating free-air temperature  
ranges of the various devices.  
Figure 14.  
Figure 15.  
MAXIMUM NEGATIVE PEAK  
OUTPUT VOLTAGE  
vs  
MAXIMUM POSITIVE PEAK  
OUTPUT VOLTAGE  
vs  
LOAD RESISTANCE  
FREE-AIR TEMPERATURE  
13.5  
13.4  
13.3  
13.2  
13.1  
−14  
−12  
−10  
−8  
V
R
= ±15 V  
CC  
±
= 2 kΩ  
L
Sample Size = 832 Units  
From 2 Wafer Lots  
−6  
−4  
13  
V
= ±15 V  
= 25°C  
CC  
±
−2  
0
T
A
12.9  
−75 −50 −25  
0
25 50 75 100 125 150  
100  
1 k  
10 k  
R
L
− Load Resistance − Ω  
T
A
− Free-Air Temperature − °C  
NOTE A: Data at high and low temperatures are applicable  
only within the rated operating free-air  
temperatureranges of the various devices.  
Figure 16.  
Figure 17.  
13  
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TYPICAL CHARACTERISTICS (continued)  
MAXIMUM NEGATIVE PEAK  
OUTPUT VOLTAGE  
vs  
LARGE-SIGNAL DIFFERENTIAL  
VOLTAGE AMPLIFICATION  
vs  
FREE-AIR TEMPERATURE  
SUPPLY VOLTAGE  
50  
40  
30  
20  
10  
0
−13  
−13.2  
−13.4  
−13.6  
T
A
= 25°C  
V
= ±15 V  
= 2 kΩ  
CC  
±
R
R
= 2 kΩ  
= 1 kΩ  
L
L
L
Sample Size = 831 Units  
From 2 Wafer Lots  
R
R
L
= 600 Ω  
−13.8  
−14  
−75 −50 −25  
0
25 50 75 100 125 150  
0
4
8
12  
16  
20  
T
A
− Free-Air Temperature − °C  
V
CC  
− Supply Voltage − V  
±
NOTE A: Data at high and low temperatures are applicable  
only within the rated operating free-air temperature  
ranges of the various devices.  
Figure 18.  
Figure 19.  
LARGE-SIGNAL DIFFERENTIAL VOLTAGE  
LARGE-SIGNAL DIFFERENTIAL  
AMPLIFICATION AND PHASE SHIFT  
VOLTAGE AMPLIFICATION  
vs  
LOAD RESISTANCE  
50  
vs  
FREQUENCY  
160  
140  
120  
100  
80  
75°  
V
CC  
= ±15 V  
±
Phase Shift  
100°  
125°  
150°  
175°  
200°  
225°  
250°  
275°  
T
A
= 25°C  
40  
30  
20  
10  
0
A
VD  
60  
40  
V
= ±15 V  
= 2 kΩ  
= 100 pF  
= 25°C  
±
CC  
R
C
T
L
L
20  
A
0
0.1  
100  
100 k  
100 M  
f − Frequency − Hz  
100  
200  
400  
1 k  
2 k  
4 k  
10 k  
R
L
− Load Resistance − Ω  
Figure 20.  
Figure 21.  
14  
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TYPICAL CHARACTERISTICS (continued)  
LARGE-SIGNAL DIFFERENTIAL VOLTAGE  
LARGE-SIGNAL DIFFERENTIAL  
VOLTAGE AMPLIFICATION  
vs  
AMPLIFICATION AND PHASE SHIFT  
vs  
FREE-AIR TEMPERATURE  
FREQUENCY  
6
3
100°  
125°  
150°  
175°  
200°  
225°  
250°  
275°  
300°  
60  
50  
40  
30  
V
= ±15 V  
±
CC  
0
−3  
−6  
−9  
−12  
−15  
−18  
R
= 2 kΩ  
= 1 kΩ  
L
A
VD  
Phase Shift  
R
L
V
= ±15 V  
= 2 kΩ  
= 100 pF  
= 25°C  
±
CC  
R
C
T
L
L
A
10  
20  
40  
70  
100  
f − Frequency − MHz  
−75 −50 −25  
0
25 50 75 100 125 150  
T
A
− Free-Air Temperature − °C  
NOTE A: Data at high and low temperatures are applicable only  
within the rated operating free-air temperature ranges  
of the various devices.  
Figure 22.  
Figure 23.  
OUTPUT IMPEDANCE  
vs  
COMMON-MODE REJECTION RATIO  
vs  
FREQUENCY  
FREQUENCY  
140  
100  
10  
1
V
T
= ±15 V  
V
T
= ±15 V  
±
±
CC  
CC  
= 25°C  
= 25°C  
A
120  
100  
80  
60  
40  
20  
0
A
A
VD  
= 100  
See Note A  
A
VD  
= 10  
−10  
−100  
10  
100  
1 k  
10 k 100 k 1 M 10 M 100 M  
10  
100  
1 k  
10 k 100 k 1 M 10 M 100 M  
f − Frequency − Hz  
f − Frequency − Hz  
NOTE A: For this curve, A = 1  
VD  
Figure 24.  
Figure 25.  
15  
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TYPICAL CHARACTERISTICS (continued)  
SUPPLY-VOLTAGE REJECTION RATIO  
SHORT-CIRCUIT OUTPUT CURRENT  
vs  
vs  
FREQUENCY  
SUPPLY VOLTAGE  
140  
120  
100  
80  
−42  
−40  
−38  
−36  
−34  
−32  
−30  
V
= ±15 V  
±
CC  
V
V
T
A
= 100 mV  
= 0  
= 25°C  
ID  
T
A
= 25°C  
O
P Package  
k
SVR−  
60  
k
SVR+  
40  
20  
0
10  
0
2
4
6
8
10 12 14 16 18 20  
100  
1 k  
10 k 100 k 1 M 10 M 100 M  
V
CC  
− Supply Voltage − V  
f − Frequency − Hz  
±
Figure 26.  
Figure 27.  
SHORT-CIRCUIT OUTPUT CURRENT  
SHORT-CIRCUIT OUTPUT CURRENT  
vs  
vs  
ELAPSED TIME  
SUPPLY VOLTAGE  
−45  
−43  
−41  
−39  
−37  
−35  
44  
42  
40  
38  
36  
34  
32  
30  
V
= ±15 V  
±
CC  
V
V
T
A
= −100 mV  
= 0  
= 25°C  
ID  
V
V
= 100 mV  
= 0  
= 25°C  
ID  
O
O
T
A
P Package  
P Package  
0
2
4
6
8
10 12 14 16 18 20  
0
30  
60  
90  
120  
150  
180  
V
CC  
− Supply Voltage − V  
±
t − Elapsed Time − s  
Figure 28.  
Figure 29.  
16  
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TYPICAL CHARACTERISTICS (continued)  
SHORT-CIRCUIT OUTPUT CURRENT  
SHORT-CIRCUIT OUTPUT CURRENT  
vs  
vs  
ELAPSED TIME  
FREE-AIR TEMPERATURE  
−48  
−44  
−40  
−36  
−32  
−28  
−24  
44  
V
= ±15 V  
±
CC  
V
V
V
= ±15 V  
±
CC  
V
V
= 100 mV  
= 0  
= 25°C  
ID  
= 100 mV  
= 0  
ID  
O
O
42  
40  
38  
36  
34  
T
A
P Package  
P Package  
−75 −50 −25  
0
25 50 75 100 125 150  
0
30  
60  
90  
120  
150  
180  
T
A
− Free-Air Temperature − °C  
t − Elapsed Time − s  
NOTE A: Data at high and low temperatures are applicable only  
within the rated operating free-air temperature ranges  
of the various devices.  
Figure 30.  
Figure 31.  
SHORT-CIRCUIT OUTPUT CURRENT  
SUPPLY CURRENT  
vs  
vs  
FREE-AIR TEMPERATURE  
SUPPLY VOLTAGE  
46  
42  
38  
34  
30  
26  
6
V
= 0  
O
V
= ±15 V  
±
CC  
No Load  
V
ID  
V
O
= 100 mV  
= 0  
5
4
3
2
1
0
T
= 125°C  
A
P Package  
T
A
= 25°C  
T
A
= −55°C  
−75 −50 −25  
0
25 50 75 100 125 150  
0
2
4
6
8
10 12 14 16 18 20  
V
CC  
− Supply Voltage − V  
T
A
− Free-Air Temperature − °C  
±
NOTE A: Data at high and low temperatures are applicable  
only within the rated operating free-air temperature  
ranges of the various devices.  
NOTE A: Data at high and low temperatures are applicable only  
within the rated operating free-air temperature ranges  
of the various devices.  
Figure 32.  
Figure 33.  
17  
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TYPICAL CHARACTERISTICS (continued)  
VOLTAGE-FOLLOWER  
SMALL-SIGNAL  
PULSE RESPONSE  
SUPPLY CURRENT  
vs  
FREE-AIR TEMPERATURE  
5
4.5  
4
100  
50  
V
R
= ±15 V  
= 2 kΩ  
= 100 pF  
= 25°C  
V
V
= ±15 V  
±
CC  
±
CC  
= 0  
L
L
O
C
T
No Load  
Sample Size = 836 Units  
From 2 Wafer Lots  
A
See Figure 4  
0
3.5  
3
−50  
−100  
2.5  
−50 −25  
0
25 50 75 100 125 150  
−75  
0
200  
400  
600 800  
1000  
T
− Free-Air Temperature − °C  
A
t − Time − ns  
NOTE A: Data at high and low temperatures are applicable  
only within the rated operating free-air temperature  
ranges of the various devices.  
Figure 34.  
Figure 35.  
EQUIVALENT INPUT NOISE VOLTAGE  
VOLTAGE-FOLLOWER  
LARGE-SIGNAL  
PULSE RESPONSE  
vs  
FREQUENCY  
10  
8
15  
V
= ±15 V  
±
CC  
V
= ±15 V  
= 2 kΩ  
= 100 pF  
= 25°C  
±
CC  
R
= 20 Ω  
= 25°C  
R
C
T
S
L
L
T
A
10  
5
See Figure 2  
Sample Size = 100 Units  
From 2 Wafer Lots  
A
See Figure 1  
6
0
4
−5  
−10  
−15  
2
0
1
10  
100  
1 k  
10 k  
100 k  
0
5
10  
15  
20  
25  
f − Frequency − Hz  
t − Time − µs  
Figure 36.  
Figure 37.  
18  
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TYPICAL CHARACTERISTICS (continued)  
NOISE VOLTAGE  
(REFERRED TO INPUT)  
OVER A 10-S INTERVAL  
UNITY-GAIN BANDWIDTH  
vs  
SUPPLY VOLTAGE  
20  
18  
16  
14  
12  
10  
50  
R
C
T
= 2 kΩ  
= 100 pF  
= 25°C  
L
L
V
= ±15 V  
±
CC  
40  
30  
f = 0.1 to 10 Hz  
T
A
A
= 25°C  
See Figure 3  
20  
10  
0
−10  
−20  
−30  
−40  
−50  
0
2
4
6
8
10  
0
2
4
6
8
10 12 14 16 18 20 22  
t − Time − s  
| V  
CC  
| − Supply Voltage − V  
±
Figure 38.  
Figure 39.  
SLEW RATE  
vs  
UNITY-GAIN BANDWIDTH  
vs  
FREE-AIR TEMPERATURE  
LOAD CAPACITANCE  
16  
3
2.8  
2.6  
2.4  
2.2  
2
V
= ±15 V  
= 2 kΩ  
= 25°C  
±
CC  
R
T
L
A
See Figure 3  
12  
8
V
CC  
= ±15 V  
±
4
A
R
C
= 1  
= 2 kΩ  
= 100 pF  
VD  
L
L
See Figure 1  
0
− 75 − 50 − 25  
0
25  
50  
75 100 125 150  
100  
1000  
10000  
C
L
− Load Capacitance − pF  
T
A
− Free-Air Temperature − °C  
NOTE A: Data at high and low temperatures are applicable only  
within the rated operating free-air temperature ranges  
of the various devices.  
Figure 40.  
Figure 41.  
19  
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TYPICAL CHARACTERISTICS (continued)  
PHASE MARGIN  
vs  
PHASE MARGIN  
vs  
LOAD CAPACITANCE  
SUPPLY VOLTAGE  
60°  
50°  
58°  
56°  
54°  
52°  
50°  
48°  
46°  
44°  
42°  
V
= ±15 V  
= 2 kΩ  
= 25°C  
R
C
T
= 2 kΩ  
= 100 pF  
= 25°C  
±
CC  
L
L
R
T
L
A
A
See Figure 3  
See Figure 3  
40°  
30°  
20°  
10°  
0°  
0
2
4
6
8
10 12 14 16 18 20 22  
100  
1000  
C
L
− Load Capacitance − pF  
| V  
CC  
| − Supply Voltage − V  
±
Figure 42.  
Figure 43.  
PHASE MARGIN  
vs  
FREE-AIR TEMPERATURE  
65°  
60°  
55°  
50°  
45°  
40°  
35°  
V
= ±15 V  
= 2 kΩ  
= 25°C  
±
CC  
R
T
L
A
See Figure 3  
−75 −50 −25  
0
25  
50  
75 100 125 150  
T
A
− Free-Air Temperature − °C  
NOTE A: Data at high and low temperatures are applicable only  
within the rated operating free-air temperature ranges  
of the various devices.  
Figure 44.  
20  
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APPLICATION INFORMATION  
Input Offset Voltage Nulling  
The TLE2027 series offers external null pins that can be used to further reduce the input offset voltage. The  
circuits of Figure 45 can be connected as shown if the feature is desired. If external nulling is not needed, the  
null pins may be left disconnected.  
1 kW  
VCC+  
10 kW  
4.7 kW  
VCC+  
4.7 kW  
IN-  
IN-  
-
-
OUT  
OUT  
IN+  
+
IN +  
+
VCC-  
(a) STANDARD ADJUSTMENT  
VCC-  
(b) ADJUSTMENT WITH IMPROVED SENSITIVITY  
Figure 45. Input Offset Voltage Nulling Circuits  
Voltage-Follower Applications  
The TLE2027 circuitry includes input-protection diodes to limit the voltage across the input transistors; however,  
no provision is made in the circuit to limit the current if these diodes are forward biased. This condition can occur  
when the device is operated in the voltage-follower configuration and driven with a fast, large-signal pulse. It is  
recommended that a feedback resistor be used to limit the current to a maximum of 1 mA to prevent degradation  
of the device. Also, this feedback resistor forms a pole with the input capacitance of the device. For feedback  
resistor values greater than 10 k, this pole degrades the amplifier phase margin. This problem can be  
alleviated by adding a capacitor (20 pF to 50 pF) in parallel with the feedback resistor (see Figure 46).  
CF = 20 to 50 pF  
IF £ 1 mA  
RF  
VCC  
-
VO  
VI  
+
VCC-  
Figure 46. Voltage Follower  
21  
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TLE2027-EP  
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APPLICATION INFORMATION (continued)  
Macromodel Information  
Macromodel information provided was derived using Microsim Parts™, the model generation software used with  
Microsim PSpice™. The Boyle macromodel (see Note and Figure 47) and subcircuit (see Figure 48) were  
generated using the TLE202x7 typical electrical and operating characteristics at 25°C. Using this information,  
output simulations of the following key parameters can be generated to a tolerance of 20% (in most cases):  
Maximum positive output voltage swing  
Maximum negative output voltage swing  
Slew rate  
Quiescent power dissipation  
Input bias current  
Gain-bandwidth product  
Common-mode rejection ratio  
Phase margin  
DC output resistance  
AC output resistance  
Open-loop voltage amplification  
Short-circuit output current limit  
NOTE:  
G. R. Boyle, B. M. Cohn, D. O. Pederson, and J. E. Solomon, "Macromodeling of  
Integrated Circuit Operational Amplifiers", IEEE Journal of Solid-State Circuits, SC-9,  
353 (1974).  
99  
3
+
dln  
91  
VCC+  
egnd  
9
92  
fb  
rc1  
11  
rc2  
12  
-
c1  
+
-
ro2 90  
hlim  
rp  
+
-
+ dip  
vb  
1
vip  
IN+  
IN-  
vin  
+
-
-
-
+
vc  
53  
dc  
Q1  
Q2  
r2  
C2  
6
7
2
dp  
13  
+
14  
ree  
cee  
vlim  
ga  
gcm  
re1  
re2  
-
8
10  
ro1  
5
lee  
de  
54  
VCC-  
-
+
4
ve  
OUT  
Figure 47. Boyle Macromodel  
q2  
r2  
12  
6
1
9
14 qx  
.subckt TLE2027 1 2 3 4 5  
*
100.0E3  
530.5  
530.5  
−393.2  
−393.2  
3.571E6  
25  
rc1  
rc2  
re1  
re2  
ree  
ro1  
ro2  
rp  
3
11  
12  
10  
10  
99  
5
c1  
11  
6
12  
7
4.003E-12  
3
c2  
20.00E-12  
13  
14  
10  
8
dc  
5
53  
5
dz  
de  
54  
90  
92  
4
dz  
dlp  
dln  
dp  
91  
90  
3
dz  
dx  
7
99  
4
25  
dz  
3
8.013E3  
egnd  
99  
0
poly(2) (3,0)  
vb  
9
0
dc  
0
(4,0) 0 5 .5  
vc  
3
53  
4
dc 2.400  
dc 2.100  
fb  
7
99  
poly(5) vb vc ve  
ve  
54  
7
vlp vln 0 954.8E6 −1E9 1E9 1E9 −1E9  
vlim  
vlp  
vln  
8
dc  
0
ga  
6
0
0
6
11 12  
10 99  
91  
0
0
dc 40  
dc 40  
2.062E-3  
gcm  
92  
.modeldx D(Is=800.0E-18)  
.modelqx NPN(Is=800.0E-18  
Bf=7.000E3)  
531.3E-12  
iee  
10  
90  
11  
4
0
2
dc 56.01E-6  
vlim 1K  
hlim  
.ends  
q1  
13 qx  
Figure 48. TLE2027 Macromodel Subcircuit  
22  
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PACKAGE OPTION ADDENDUM  
www.ti.com  
18-Sep-2008  
PACKAGING INFORMATION  
Orderable Device  
TLE2027MDREP  
V62/06674-01XE  
Status (1)  
ACTIVE  
ACTIVE  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
Drawing  
SOIC  
D
8
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
SOIC  
D
8
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in  
a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2)  
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check  
http://www.ti.com/productcontent for the latest availability information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements  
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered  
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and  
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS  
compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame  
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)  
(3)  
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder  
temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is  
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the  
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take  
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on  
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited  
information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI  
to Customer on an annual basis.  
OTHER QUALIFIED VERSIONS OF TLE2027-EP :  
Catalog: TLE2027  
Military: TLE2027M  
NOTE: Qualified Version Definitions:  
Catalog - TI's standard catalog product  
Military - QML certified for Military and Defense Applications  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Jul-2012  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TLE2027MDREP  
SOIC  
D
8
2500  
330.0  
12.4  
6.4  
5.2  
2.1  
8.0  
12.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Jul-2012  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SOIC  
SPQ  
Length (mm) Width (mm) Height (mm)  
367.0 367.0 35.0  
TLE2027MDREP  
D
8
2500  
Pack Materials-Page 2  
IMPORTANT NOTICE  
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