SN75LBC172DWG4 [TI]
Quadruple Low-Power Differential Line Driver 20-SOIC 0 to 70;型号: | SN75LBC172DWG4 |
厂家: | TEXAS INSTRUMENTS |
描述: | Quadruple Low-Power Differential Line Driver 20-SOIC 0 to 70 驱动 信息通信管理 光电二极管 接口集成电路 驱动器 |
文件: | 总17页 (文件大小:870K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
ꢀꢁ ꢂꢃ ꢄ ꢅꢆꢇ ꢈ ꢉ ꢊ ꢀꢁ ꢈꢃ ꢄꢅ ꢆꢇ ꢈꢉ
ꢋ ꢌꢍꢎꢏ ꢌꢐꢄ ꢑ ꢄ ꢒꢓꢔꢐꢒ ꢓ ꢑꢏ ꢎꢕ ꢖꢖ ꢑꢏ ꢑꢁꢗ ꢕꢍ ꢄ ꢄ ꢕꢁ ꢑ ꢎ ꢏꢕ ꢘ ꢑꢏ
SLLS163E − JULY 1993 − REVISED APRIL 2006
N PACKAGE
(TOP VIEW)
D
D
Meets or Exceeds EIA Standard RS-485
Designed for High-Speed Multipoint
Transmission on Long Bus Lines in Noisy
Environments
V
1A
1Y
1Z
G
1
2
3
4
5
6
7
8
16
15
14
CC
4A
4Y
D
D
Support Data Rates up to and Exceeding
Ten Million Transfers Per Second
13 4Z
Common-Mode Output Voltage Range of
−7 V to 12 V
12
11
10
9
G
2Z
2Y
2A
3Z
3Y
3A
D
Positive- and Negative-Current Limiting
GND
D
Low Power Consumption . . . 1.5 mA Max
(Output Disabled)
DW PACKAGE
(TOP VIEW)
D
Functionally Interchangeable With SN75172
description
1
2
3
4
5
6
7
8
9
20
19
18
17
16
15
14
13
12
11
1A
1Y
NC
1Z
G
2Z
NC
2Y
2A
V
CC
4A
4Y
NC
4Z
G
3Z
NC
3Y
3A
The SN65LBC172 and SN75LBC172 are
monolithic quadruple differential line drivers with
3-state outputs. Both devices are designed to
meet the requirements of EIA Standard RS-485.
These devices are optimized for balanced
multipoint bus transmission at data rates up to and
exceeding 10 million bits per second. Each driver
features wide positive and negative common-
mode output voltage ranges, current limiting, and
thermal-shutdown circuitry making it suitable for
party-line applications in noisy environments.
Both devices are designed using LinBiCMOS,
facilitating ultra-low power consumption and
inherent robustness.
10
GND
NC − No internal connection
FUNCTION TABLE
(each driver)
INPUT
A
ENABLES
OUTPUTS
G
G
Y
Z
Both the SN65LBC172 and SN75LBC172 provide
positive- and negative-current limiting and
thermal shutdown for protection from line fault
conditions on the transmission bus line. These
devices offer optimum performance when
used with the SN75LBC173 or SN75LBC175
quadruple line receivers. The SN65LBC172 and
SN75LBC172 are available in the 16-pin DIP
package (N) and the 20-pin wide-body small-
outline inline-circuit (SOIC) package (DW).
H
L
H
L
X
H
H
X
X
L
X
X
L
L
H
H
L
H
L
H
L
H
Z
L
Z
H = high level, L = low level,
X = irrelevant, Z = high impedance (off)
The SN75LBC172 is characterized for operation
over the commercial temperature range of 0°C to
70°C. The SN65LBC172 is characterized over the
industrial temperature range of −40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LinBiCMOS is a trademark of Texas Instruments Incorporated.
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Copyright 2001−2006, Texas Instruments Incorporated
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1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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SLLS163E − JULY 1993 − REVISED APRIL 2006
†
logic symbol
logic diagram (positive logic)
4
G
≥1
12
4
G
G
G
EN
12
2
3
1Y
1Z
1
1A
2
3
1Y
1Z
2Y
2Z
3Y
3Z
4Y
4Z
1
1A
2A
3A
4A
6
5
6
2Y
2Z
7
7
2A
5
10
11
14
13
9
10
11
3Y
3Z
9
3A
15
14
13
4Y
4Z
15
†
4A
This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
Pin numbers shown are for the N package.
schematic diagrams of inputs and outputs
ALL INPUTS
Y OR Z OUTPUT
V
CC
V
CC
50 µA
200 Ω
Output
Input
Driver
2
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SLLS163E − JULY 1993 − REVISED APRIL 2006
†
absolute maximum ratings
Supply voltage range, V
Output voltage range, V
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to 7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −10 V to 15 V
CC
O
Voltage range at A, G, G . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to V
Continuous power dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Internally limited
+ 0.5 V
CC
‡
Storage temperature range, T
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C
stg
†
‡
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The maximum operating junction temperature is internally limited. Use the dissipation rating table to operate below this temperature.
NOTE 1: All voltage values are with respect to GND.
recommended operating conditions
MIN NOM
MAX
UNIT
Supply voltage, V
CC
4.75
2
5
5.25
V
V
V
High-level input voltage, V
IH
Low-level input voltage, V
IL
0.8
12
Voltage at any bus terminal (separately or common mode), V
Y or Z
V
O
−7
High-level output current, I
Y or Z
Y or Z
−60
60
mA
mA
OH
Low-level output current, I
OL
Continuous total power dissipation
Junction temperature, T
See Dissipation Rating Table
140
85
70
°C
J
SN65LBC172
SN75LBC172
−40
0
Operating free-air temperature, T
°C
A
DISSIPATION RATING TABLE
THERMAL
MODEL
T
< 25°C
DERATING FACTOR
T
= 70°C
T = 85°C
A
A
A
PACKAGE
ABOVE T = 25°C
POWER RATING POWER RATING
POWER RATING
A
†
Low K
1094 mW
10.4 mW/°C
15.9 mW/°C
9.2 mW/°C
625 mW
954 mW
736 mW
469 mW
715 mW
598 mW
DW
N
‡
High K
1669 mW
1150 mW
†
‡
In accordance with the low effective thermal conductivity metric definitions of EIA/JESD 51−3.
In accordance with the high effective thermal conductivity metric definitions of EIA/JESD 51−7.
3
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SLLS163E − JULY 1993 − REVISED APRIL 2006
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
†
PARAMETER
Input clamp voltage
TEST CONDITIONS
MIN TYP
MAX
−1.5
5
UNIT
V
IK
I = −18 mA
V
I
SN65LBC172
SN75LBC172
SN65LBC172
SN75LBC172
1.1
1.5
1.1
1.5
1.8
1.8
1.7
1.7
R
= 54 Ω,
See Figure 1
L
5
‡
Differential output voltage
|V
|
V
OD
5
R
= 60 Ω,
See Figure 2
L
5
§
§
∆|V
|
|
0.2
V
V
Change in magnitude of common-mode output voltage
OD
3
− 1
V
OC
Common-mode output voltage
R
= 54 Ω,
See Figure 1
L
∆|V
0.2
100
100
−100
−100
250
7
V
Change in magnitude of common-mode output voltage
Output current with power off
OC
I
I
I
I
I
V
V
= 0,
V = − 7 V to 12 V
O
µA
µA
µA
µA
mA
O
CC
High-impedance-state output current
High-level input current
= − 7 V to 12 V
O
OZ
IH
V = 2.4 V
I
Low-level input current
V = 0.4 V
I
IL
Short-circuit output current
V
O
= −7 V to 12 V
OS
Outputs enabled
Outputs disabled
I
Supply current (all drivers)
No load
mA
CC
1.5
†
‡
All typical values are at V
CC
= 5 V and T = 25°C.
A
The minimum V
specification does not fully comply with EIA-485 at operating temperatures below 0°C. The lower output signal should be used
OD
to determine the maximum signal-transmission distance.
∆|V | and ∆|V | are the changes in magnitude of V and V , respectively, that occur when the input changes from a high level to a low
OD OC
§
OD
level.
OC
switching characteristics, V
= 5 V, T = 25°C
A
CC
PARAMETER
Differential output delay time
TEST CONDITIONS
MIN
2
TYP
11
MAX
20
UNIT
t
t
t
t
t
t
d(OD)
t(OD)
PZH
PZL
R
= 54 Ω,
See Figure 3
ns
L
Differential output transition time
Output enable time to high level
Output enable time to low level
Output disable time from high level
Output disable time from low level
10
15
20
21
48
21
25
R
R
R
R
= 110 Ω,
= 110 Ω,
= 110 Ω,
= 110 Ω,
See Figure 4
See Figure 5
See Figure 4
See Figure 5
30
ns
ns
ns
ns
L
L
L
L
30
70
PHZ
PLZ
30
4
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SLLS163E − JULY 1993 − REVISED APRIL 2006
PARAMETER MEASUREMENT INFORMATION
R
L
2
V
OD2
R
L
V
OC
2
Figure 1. Differential and Common-Mode Output Voltages
V
test
R1 = 375 Ω
Y
Z
A
R
= 60 Ω
0 V or 3 V
L
V
OD
G at 5 V
or
R2 = 375 Ω
G at 0 V
−7 V < V
< 12 V
test
V
test
NOTES: A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 1 MHz, duty cycle = 50%, t ≤ 5 ns,
r
t ≤ 5 ns, Z = 50 Ω.
f
O
B.
C
includes probe and stray capacitance.
L
Figure 2. Driver V
Test Circuit
OD
3 V
Input
1.5 V
1.5 V
Input
50 Ω
0 V
R
= 54 Ω
L
Output
C
= 50 pF
L
Generator
(see Note A)
t
t
d(OD)
d(OD)
(see Note B)
≈ 2.5 V
90%
10%
50%
t(OD)
50%
Output
≈ − 2.5 V
3 V
t
t
t(OD)
VOLTAGE WAVEFORMS
NOTES: A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 1 MHz, duty cycle = 50%, t ≤ 5 ns,
TEST CIRCUIT
r
t ≤ 5 ns, Z = 50 Ω.
L
f
O
B.
C
includes probe and stray capacitance.
Figure 3. Driver Differential-Output Test Circuit and Delay and Transition-Time Waveforms
5
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SLLS163E − JULY 1993 − REVISED APRIL 2006
PARAMETER MEASUREMENT INFORMATION
3 V
0 V
Input
1.5 V
S1
1.5 V
Output
0 V or 3 V
Input
0.5 V
t
PZH
R
= 110 Ω
L
Generator
(see Note A)
V
OH
C
= 50 pF
L
50 Ω
(see Note B)
Output
2.3 V
V
off
≈ 0 V
t
PHZ
VOLTAGE WAVEFORMS
NOTES: A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 1 MHz, duty cycle = 50%, t ≤ 5 ns,
TEST CIRCUIT
r
t ≤ 5 ns, Z = 50 Ω.
f
O
B.
C
includes probe and stray capacitance.
L
Figure 4. t
and t
Test Circuit and Voltage Waveforms
PZH
PHZ
5 V
R
= 110 Ω
L
3 V
0 V
S1
Input
Output
1.5 V
1.5 V
0 V or 3 V
t
PZL
C
= 50 pF
Input
L
Generator
(see Note A)
t
PLZ
5 V
0.5 V
(see Note B)
50 Ω
2.3 V
Output
V
OL
3 V
(see Note C)
TEST CIRCUIT
VOLTAGE WAVEFORMS
NOTES: A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 1 MHz, duty cycle = 50%, t ≤ 5 ns,
r
t ≤ 5 ns, Z = 50 Ω.
f
O
B.
C
includes probe and stray capacitance
L
C. To test the active-low enable G, ground G and apply an inverted waveform to G..
Figure 5. t
and t
Test Circuit and Waveforms
PZL
PLZ
6
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SLLS163E − JULY 1993 − REVISED APRIL 2006
TYPICAL CHARACTERISTICS
OUTPUT CURRENT
LOW-LEVEL OUTPUT VOLTAGE
vs
vs
OUTPUT VOLTAGE
LOW-LEVEL OUTPUT CURRENT
50
40
5
Output Disabled
= 25°C
V
T
= 5 V
= 25°C
CC
A
4.5
4
T
A
30
20
3.5
3
10
0
2.5
2
−10
−20
−30
−40
−50
V
= 0 V
CC
1.5
1
V
= 5 V
CC
0.5
0
−25 −20 −15 −10 −5
0
5
10 15 20 25
−20
0
20
40
60
80
100 120
V
O
− Output Voltage − V
I
− Low-Level Output Current − mA
OL
Figure 6
Figure 7
DIFFERENTIAL OUTPUT VOLTAGE
HIGH-LEVEL OUTPUT VOLTAGE
vs
HIGH-LEVEL OUTPUT CURRENT
vs
FREE-AIR TEMPERATURE
3
2.5
2
5
R
= 54 Ω
= 5 V
L
V
T
A
= 5 V
= 25°C
CC
V
CC
4.5
4
3.5
3
1.5
1
2.5
2
0.5
0
1.5
−60 −40 −20
0
20
40
60
80 100
20
0
−20
−40 −60
−80
−100 −120
T
A
− Free-Air Temperature − °C
I
− High-Level Output Current − mA
OH
Figure 8
Figure 9
7
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SLLS163E − JULY 1993 − REVISED APRIL 2006
TYPICAL CHARACTERISTICS
PROPAGATION DELAY TIME,
DIFFERENTIAL OUTPUT
vs
DIFFERENTIAL OUTPUT VOLTAGE
vs
OUTPUT CURRENT
FREE-AIR TEMPERATURE
3
2.5
2
14
V
T
A
= 5 V
CC
= 25°C
R
C
V
= 54 Ω
= 50 pF
L
L
13
12
= 5 V
CC
11
10
9
1.5
1
8
7
6
0.5
0
5
4
0
10 20 30 40 50 60 70 80 90 100
−60 −40 −20
0
20
40
60
80 100
I
O
− Output Current − mA
T
A
− Free-Air Temperature − °C
Figure 10
Figure 11
THERMAL CHARACTERISTICS − DW PACKAGE
TEST CONDITIONS
PARAMETER
Junction−to−ambient thermal reisistance, θ
MIN
TYP
96
MAX
UNIT
Low-K board, no air flow
†
JA
High-K board, no air flow
62.9
39.6
29.1
°C/W
Junction−to−board thermal reisistance, θ
JB
High-K board, no air flow
Junction−to−case thermal reisistance, θ
JC
All four channels maximum loading,
maximum signaling rate, R = 54 Ω, input to
D is 10 Mbps 50% duty cycle square wave,
L
Average power dissipation, P
(AVG)
1100
mW
V
CC
= 5.25 V, T = 130 °C.
J
JEDEC high-K board model
JEDEC high-K board model
−40
−40
85
64
Ambient free−air temperature, T
A
°C
Thermal shutdown junction temperature, T
SD
165
†
See TI application note literature number SZZA003, Package Thermal Characterization Methodologies, for an explanation of this parameter.
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
ꢀꢁ ꢂꢃ ꢄ ꢅꢆꢇ ꢈ ꢉ ꢊ ꢀꢁ ꢈꢃ ꢄꢅ ꢆꢇ ꢈꢉ
ꢋ ꢌꢍꢎꢏ ꢌꢐꢄ ꢑ ꢄ ꢒꢓꢔꢐꢒ ꢓ ꢑꢏ ꢎꢕ ꢖꢖ ꢑꢏ ꢑꢁꢗ ꢕꢍ ꢄ ꢄ ꢕꢁ ꢑ ꢎ ꢏꢕ ꢘ ꢑꢏ
SLLS163E − JULY 1993 − REVISED APRIL 2006
THERMAL CHARACTERISTICS OF IC PACKAGES
Θ
JA (Junction-to-Ambient Thermal Resistance) is defined as the difference in junction temperature to ambient temperature
divided by the operating power
Θ
D
D
D
Θ
JA is NOT a constant and is a strong function of
the PCB design (50% variation)
altitude (20% variation)
device power (5% variation)
JA can be used to compare the thermal performance of packages if the specific test conditions are defined and used.
Standardized testing includes specification of PCB construction, test chamber volume, sensor locations, and the thermal
characteristics of holding fixtures.
installations.
is often misused when it is used to calculate junction temperatures for other
Θ
JA
TI uses two test PCBs as defined by JEDEC specifications. The low-k board gives average in-use condition thermal
performance and consists of a single trace layer 25 mm long and 2-oz thick copper. The high-k board givesbest case in−use
condition and consists of two 1-oz buried power planes with a single trace layer 25 mm long with 2-oz thick copper. A 4%
to 50% difference in ΘJA can be measured between these two test cards
ΘJC (Junction-to-Case Thermal Resistance) is defined as difference in junction temperature to case divided by the
operating power. It is measured by putting the mounted package up against a copper block cold plate to force heat to flow
from die, through the mold compound into the copper block.
Θ
JC is a useful thermal characteristic when a heatsink is applied to package. It is NOT a useful characteristic to predict
junction temperature as it provides pessimistic numbers if the case temperature is measured in a non-standard system and
junction temperatures are backed out. It can be used with ΘJB in 1-dimensional thermal simulation of a package system.
ΘJB (Junction-to-Board Thermal Resistance) is defined to be the difference in the junction temperature and the PCB
temperature at the center of the package (closest to the die) when the PCB is clamped in a cold−plate structure. ΘJB is only
defined for the high-k test card.
Θ
JB provides an overall thermal resistance between the die and the PCB. It includes a bit of the PCB thermal resistance
(especially for BGA’s with thermal balls) and can be used for simple 1-dimensional network analysis of package system
(see Figure 12).
Ambient Node
q
Calculated
CA
Surface Node
Calculated/Measured
q
JC
Junction
Calculated/Measured
q
JB
PC Board
Figure 12. Thermal Resistance
9
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PACKAGE OPTION ADDENDUM
www.ti.com
10-Jun-2014
PACKAGING INFORMATION
Orderable Device
SN65LBC172DW
SN65LBC172DWG4
SN65LBC172N
Status Package Type Package Pins Package
Eco Plan
Lead/Ball Finish
MSL Peak Temp
Op Temp (°C)
-40 to 85
-40 to 85
-40 to 85
-40 to 85
0 to 70
Device Marking
Samples
Drawing
Qty
(1)
(2)
(6)
(3)
(4/5)
ACTIVE
SOIC
SOIC
PDIP
PDIP
SOIC
SOIC
SOIC
PDIP
DW
20
20
16
16
20
20
20
16
25
Green (RoHS
& no Sb/Br)
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
Level-1-260C-UNLIM
Level-1-260C-UNLIM
N / A for Pkg Type
N / A for Pkg Type
Level-1-260C-UNLIM
Level-1-260C-UNLIM
Level-1-260C-UNLIM
N / A for Pkg Type
SN65LBC172
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
DW
N
25
25
Green (RoHS
& no Sb/Br)
SN65LBC172
SN65LBC172N
SN65LBC172N
SN75LBC172
SN75LBC172
SN75LBC172
SN75LBC172N
Pb-Free
(RoHS)
SN65LBC172NE4
SN75LBC172DW
SN75LBC172DWG4
SN75LBC172DWR
SN75LBC172N
N
25
Pb-Free
(RoHS)
DW
DW
DW
N
25
Green (RoHS
& no Sb/Br)
25
Green (RoHS
& no Sb/Br)
0 to 70
2000
25
Green (RoHS
& no Sb/Br)
0 to 70
Pb-Free
(RoHS)
0 to 70
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
10-Jun-2014
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF SN75LBC172 :
Military: SN55LBC172
•
NOTE: Qualified Version Definitions:
Military - QML certified for Military and Defense Applications
•
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
4-Jan-2013
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
SN75LBC172DWR
SN75LBC172DWR
SOIC
SOIC
DW
DW
20
20
2000
2000
330.0
330.0
24.4
24.4
10.8
10.8
13.0
13.3
2.7
2.7
12.0
12.0
24.0
24.0
Q1
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
4-Jan-2013
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SPQ
Length (mm) Width (mm) Height (mm)
SN75LBC172DWR
SN75LBC172DWR
SOIC
SOIC
DW
DW
20
20
2000
2000
367.0
367.0
367.0
367.0
45.0
45.0
Pack Materials-Page 2
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