SN74ALS03BD [TI]

QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS WITH OPEN-COLLECTOR OUTPUTS; 与集电极开路输出四路2输入正与非缓冲区
SN74ALS03BD
型号: SN74ALS03BD
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS WITH OPEN-COLLECTOR OUTPUTS
与集电极开路输出四路2输入正与非缓冲区

栅极 触发器 逻辑集成电路 光电二极管 输出元件 输入元件 PC
文件: 总4页 (文件大小:72K)
中文:  中文翻译
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SN54ALS03B, SN74ALS03B  
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS  
WITH OPEN-COLLECTOR OUTPUTS  
SDAS013B – MARCH 1984 – REVISED DECEMBER 1994  
SN54ALS03B . . . J PACKAGE  
SN74ALS03B . . . D OR N PACKAGE  
(TOP VIEW)  
Package Options Include Plastic  
Small-Outline (D) Packages, Ceramic Chip  
Carriers (FK), and Standard Plastic (N) and  
Ceramic (J) 300-mil DIPs  
1A  
1B  
1Y  
2A  
2B  
V
CC  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
4B  
4A  
4Y  
3B  
3A  
3Y  
description  
These devices contain four independent 2-input  
positive-NAND buffers. They perform the Boolean  
functions Y = A B or Y = A + B in positive logic.  
The open-collector outputs require pullup  
resistors to perform correctly. These outputs may  
be connected to other open-collector outputs to  
implement active-low wired-OR or active-high  
wired-AND functions. Open-collector devices are  
2Y  
GND  
8
SN54ALS03B . . . FK PACKAGE  
(TOP VIEW)  
often used to generate high V  
levels.  
OH  
The SN54ALS03B is characterized for operation  
over the full military temperature range of 55°C  
to 125°C. The SN74ALS03B is characterized for  
operation from 0°C to 70°C.  
3
2
1
20 19  
18  
1Y  
NC  
2A  
4
5
6
7
8
4A  
NC  
4Y  
NC  
3B  
17  
16  
15  
14  
NC  
2B  
FUNCTION TABLE  
(each gate)  
9 10 11 12 13  
INPUTS  
OUTPUT  
Y
A
B
H
X
L
H
L
L
H
H
NC – No internal connection  
X
logic symbol  
logic diagram (positive logic)  
1
1A  
2
1
1A  
2
3
6
&
3
6
1Y  
2Y  
3Y  
4Y  
1Y  
2Y  
3Y  
4Y  
1B  
1B  
4
4
2A  
5
2A  
5
2B  
2B  
9
9
3A  
8
3A  
10  
3B  
12  
4A  
13  
4B  
8
10  
3B  
12  
4A  
11  
11  
13  
4B  
This symbol is in accordance with ANSI/IEEE Std 91-1984 and  
IEC Publication 617-12.  
Pin numbers shown are for the D, J, and N packages.  
Copyright 1994, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54ALS03B, SN74ALS03B  
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS  
WITH OPEN-COLLECTOR OUTPUTS  
SDAS013B – MARCH 1984 – REVISED DECEMBER 1994  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V  
CC  
Input voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V  
I
Off-state output voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V  
Operating free-air temperature range, T : SN54ALS03B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55°C to 125°C  
A
SN74ALS03B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
recommended operating conditions  
SN54ALS03B  
MIN NOM MAX  
SN74ALS03B  
MIN NOM MAX  
UNIT  
V
V
V
V
Supply voltage  
4.5  
2
5
5.5  
4.5  
2
5
5.5  
V
V
CC  
High-level input voltage  
Low-level input voltage  
High-level output voltage  
Low-level output current  
Operating free-air temperature  
IH  
0.7  
5.5  
4
0.8  
5.5  
8
V
IL  
V
OH  
I
mA  
°C  
OL  
T
A
55  
125  
0
70  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
SN54ALS03B  
SN74ALS03B  
PARAMETER  
TEST CONDITIONS  
UNIT  
V
MIN TYP  
MAX  
–1.5  
0.4  
MIN TYP  
MAX  
–1.5  
0.4  
V
V
V
V
= 4.5 V,  
= 4.5 V  
I = –18 mA  
I
IK  
CC  
I
I
= 4 mA  
= 8 mA  
0.25  
0.25  
0.35  
OL  
OL  
V
OL  
CC  
0.5  
I
I
I
I
I
I
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 4.5 V,  
= 5.5 V,  
= 5.5 V,  
V = 7 V  
0.1  
20  
0.1  
mA  
µA  
I
I
V = 2.7 V  
I
20  
IH  
V = 0.4 V  
I
0.1  
0.1  
0.85  
3
0.1  
0.1  
mA  
mA  
mA  
mA  
IL  
V
= 5.5 V  
OH  
CCH  
CCL  
OH  
V = 0  
0.43  
1.62  
0.43  
1.62  
0.85  
4
I
V = 4.5 V  
I
All typical values are at V  
= 5 V, T = 25°C.  
A
CC  
switching characteristics (see Figure 1)  
V
C
R
= 4.5 V to 5.5 V,  
= 50 pF,  
CC  
L
L
= 2 k,  
= MIN to MAX  
FROM  
TO  
(OUTPUT)  
§
PARAMETER  
(INPUT)  
UNIT  
T
A
SN54ALS03B SN74ALS03B  
MIN  
20  
3
MAX  
59  
MIN  
20  
3
MAX  
50  
t
t
PLH  
A or B  
Y
ns  
23  
13  
PHL  
§
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54ALS03B, SN74ALS03B  
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS  
WITH OPEN-COLLECTOR OUTPUTS  
SDAS013B – MARCH 1984 – REVISED DECEMBER 1994  
PARAMETER MEASUREMENT INFORMATION  
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES  
7 V  
R
= R1 = R2  
V
CC  
L
S1  
R1  
R
L
Test  
Point  
From Output  
Under Test  
From Output  
Under Test  
Test  
Point  
Test  
Point  
From Output  
Under Test  
C
C
L
R
L
R2  
L
C
L
(see Note A)  
(see Note A)  
(see Note A)  
LOAD CIRCUIT FOR  
BI-STATE  
TOTEM-POLE OUTPUTS  
LOAD CIRCUIT  
FOR OPEN-COLLECTOR OUTPUTS  
LOAD CIRCUIT  
FOR 3-STATE OUTPUTS  
3.5 V  
3.5 V  
Timing  
Input  
High-Level  
1.3 V  
1.3 V  
1.3 V  
Pulse  
0.3 V  
0.3 V  
t
h
t
w
t
su  
3.5 V  
3.5 V  
0.3 V  
Data  
Input  
Low-Level  
1.3 V  
1.3 V  
1.3 V  
1.3 V  
Pulse  
0.3 V  
VOLTAGE WAVEFORMS  
SETUP AND HOLD TIMES  
VOLTAGE WAVEFORMS  
PULSE DURATIONS  
3.5 V  
0.3 V  
Output  
Control  
(low-level  
enabling)  
1.3 V  
1.3 V  
3.5 V  
t
PZL  
Input  
1.3 V  
1.3 V  
t
PLZ  
0.3 V  
PHL  
3.5 V  
t
Waveform 1  
S1 Closed  
(see Note B)  
t
PLH  
1.3 V  
V
OH  
In-Phase  
Output  
1.3 V  
1.3 V  
1.3 V  
V
OL  
0.3 V  
V
OL  
t
PHZ  
t
PLH  
t
PZH  
t
PHL  
V
OH  
V
Waveform 2  
S1 Open  
(see Note B)  
OH  
OL  
Out-of-Phase  
Output  
(see Note C)  
1.3 V  
1.3 V  
0.3 V  
V
0 V  
VOLTAGE WAVEFORMS  
PROPAGATION DELAY TIMES  
VOLTAGE WAVEFORMS  
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS  
NOTES: A.  
C includes probe and jig capacitance.  
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.  
D. All input pulses have the following characteristics: PRR 1 MHz, t = t = 2 ns, duty cycle = 50%.  
r
f
E. The outputs are measured one at a time with one transition per measurement.  
Figure 1. Load Circuits and Voltage Waveforms  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1998, Texas Instruments Incorporated  

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