SN54HC125_15 [TI]

Quadruple Bus Buffer Gates;
SN54HC125_15
型号: SN54HC125_15
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

Quadruple Bus Buffer Gates

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SN54HC125, SN74HC125  
QUADRUPLE BUS BUFFER GATES  
WITH 3-STATE OUTPUTS  
SCLS104B – MARCH 1984 – REVISED MAY 1997  
SN54HC125 . . . J OR W PACKAGE  
SN74HC125 . . . D, DB, OR N PACKAGE  
(TOP VIEW)  
High-Current 3-State Outputs Interface  
Directly With System Bus or Can Drive up  
to 15 LSTTL Loads  
Package Options Include Plastic  
1OE  
1A  
V
CC  
4OE  
4A  
1
2
3
4
5
6
7
14  
13  
12  
11  
Small-Outline (D), Shrink Small-Outline  
(DB), and Ceramic Flat (W) Packages,  
Ceramic Chip Carriers (FK), and Standard  
Plastic (N) and Ceramic (J) 300-mil DIPs  
1Y  
2OE  
2A  
4Y  
10 3OE  
9
8
2Y  
3A  
3Y  
description  
GND  
These quadruple bus buffer gates feature  
independent line drivers with 3-state outputs.  
Each output is disabled when the associated  
output-enable (OE) input is high.  
SN54HC125 . . . FK PACKAGE  
(TOP VIEW)  
The SN54HC125 is characterized for operation  
over the full military temperature range of –55°C  
to 125°C. The SN74HC125 is characterized for  
operation from –40°C to 85°C.  
3
2
1
20 19  
18  
4A  
NC  
4Y  
1Y  
NC  
4
5
6
7
8
17  
16  
2OE  
NC  
FUNCTION TABLE  
(each buffer)  
15 NC  
14  
9 10 11 12 13  
3OE  
2A  
INPUTS  
OUTPUT  
Y
OE  
A
H
L
L
L
H
L
NC – No internal connection  
H
X
Z
logic symbol  
1
EN  
1OE  
2
3
1Y  
1A  
4
2OE  
5
6
2Y  
2A  
10  
8
3OE  
3A  
4OE  
4A  
3Y  
9
13  
12  
11  
4Y  
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.  
Pin numbers shown are for the D, DB, J, N, and W packages.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 1997, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC125, SN74HC125  
QUADRUPLE BUS BUFFER GATES  
WITH 3-STATE OUTPUTS  
SCLS104B – MARCH 1984 – REVISED MAY 1997  
logic diagram (positive logic)  
1
10  
9
1OE  
3OE  
3A  
2
3
6
8
1A  
1Y  
2Y  
3Y  
4Y  
4
13  
12  
2OE  
4OE  
4A  
5
11  
2A  
Pin numbers shown are for the D, DB, J, N, and W packages.  
absolute maximum ratings over operating free-air temperature range  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V  
CC  
I
Input clamp current, I (V < 0 or V > V ) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
IK  
I
CC  
Output clamp current, I  
(V < 0 or V > V ) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
OK  
O O CC  
Continuous output current, I (V = 0 to V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±35 mA  
Continuous current through V  
Package thermal impedance, θ (see Note 2): D package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127°C/W  
O
O
CC  
CC  
or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±70 mA  
JA  
DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 158°C/W  
N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78°C/W  
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace  
length of zero.  
recommended operating conditions  
SN54HC125  
MIN NOM  
SN74HC125  
MIN NOM  
UNIT  
MAX  
MAX  
V
V
Supply voltage  
2
1.5  
3.15  
4.2  
0
5
6
2
1.5  
3.15  
4.2  
0
5
6
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 2 V  
High-level input voltage  
= 4.5 V  
= 6 V  
V
V
IH  
= 2 V  
0.5  
1.35  
1.8  
0.5  
1.35  
1.8  
V
IL  
Low-level input voltage  
= 4.5 V  
= 6 V  
0
0
0
0
V
V
Input voltage  
0
V
V
0
V
V
V
V
I
CC  
CC  
Output voltage  
0
0
O
CC  
CC  
V
CC  
V
CC  
V
CC  
= 2 V  
0
1000  
500  
400  
125  
0
1000  
500  
400  
85  
t
Input transition (rise and fall) time  
Operating free-air temperature  
= 4.5 V  
= 6 V  
0
0
ns  
t
0
0
T
–55  
–40  
°C  
A
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC125, SN74HC125  
QUADRUPLE BUS BUFFER GATES  
WITH 3-STATE OUTPUTS  
SCLS104B – MARCH 1984 – REVISED MAY 1997  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
T
= 25°C  
SN54HC125  
SN74HC125  
A
PARAMETER  
TEST CONDITIONS  
V
UNIT  
CC  
MIN  
TYP  
MAX  
MIN  
1.9  
4.4  
5.9  
3.7  
5.2  
MAX  
MIN  
1.9  
MAX  
2 V  
4.5 V  
6 V  
1.9 1.998  
4.4 4.499  
5.9 5.999  
I
= –20 µA  
4.4  
OH  
V
V = V or V  
IH  
5.9  
V
OH  
OL  
I
IL  
IL  
I
I
= –6 mA  
4.5 V  
6 V  
3.98  
5.48  
4.3  
5.8  
3.84  
5.34  
OH  
= –7.8 mA  
OH  
2 V  
0.002  
0.001  
0.001  
0.17  
0.1  
0.1  
0.1  
0.1  
0.1  
0.1  
I
= 20 µA  
4.5 V  
6 V  
OL  
V
V = V or V  
0.1  
0.1  
0.1  
V
I
IH  
I
I
= 6 mA  
4.5 V  
6 V  
0.26  
0.26  
±100  
±0.5  
8
0.4  
0.33  
0.33  
±1000  
±5  
OL  
= 7.8 mA  
0.15  
0.4  
OL  
I
I
I
V = V  
I
or 0  
6 V  
±0.1  
±1000  
±10  
160  
10  
nA  
µA  
µA  
pF  
I
CC  
CC  
V
O
= V  
or 0  
6 V  
±0.01  
OZ  
CC  
CC  
V = V  
I
or 0,  
I
O
= 0  
6 V  
80  
C
2 V to 6 V  
3
10  
10  
i
switching characteristics over recommended operating free-air temperature range, C = 50 pF  
L
(unless otherwise noted) (see Figure 1)  
T
A
= 25°C  
TYP  
48  
14  
11  
SN54HC125  
SN74HC125  
FROM  
(INPUT)  
TO  
(OUTPUT)  
PARAMETER  
V
UNIT  
CC  
MIN  
MAX  
120  
24  
MIN  
MAX  
150  
36  
MIN  
MAX  
150  
30  
2 V  
4.5 V  
6 V  
t
t
t
t
A
Y
Y
ns  
pd  
en  
dis  
t
20  
25  
26  
2 V  
53  
14  
11  
120  
24  
180  
36  
150  
30  
OE  
OE  
4.5 V  
6 V  
ns  
ns  
ns  
20  
31  
26  
2 V  
30  
15  
14  
28  
8
120  
24  
180  
36  
150  
30  
Y
4.5 V  
6 V  
20  
31  
26  
2 V  
60  
90  
75  
Any  
4.5 V  
6 V  
12  
18  
15  
6
10  
15  
13  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC125, SN74HC125  
QUADRUPLE BUS BUFFER GATES  
WITH 3-STATE OUTPUTS  
SCLS104B – MARCH 1984 – REVISED MAY 1997  
switching characteristics over recommended operating free-air temperature range, C = 150 pF  
L
(unless otherwise noted) (see Figure 1)  
T
A
= 25°C  
TYP  
67  
SN54HC125  
SN74HC125  
FROM  
(INPUT)  
TO  
(OUTPUT)  
PARAMETER  
V
UNIT  
CC  
MIN  
MAX  
150  
30  
MIN  
MAX  
225  
45  
MIN  
MAX  
190  
38  
2 V  
4.5 V  
6 V  
t
pd  
t
en  
t
t
A
Y
Y
19  
ns  
15  
25  
39  
32  
2 V  
100  
20  
135  
27  
200  
40  
170  
34  
OE  
4.5 V  
6 V  
ns  
ns  
17  
23  
34  
29  
2 V  
45  
210  
42  
315  
63  
265  
53  
Any  
4.5 V  
6 V  
17  
13  
36  
53  
45  
operating characteristics, T = 25°C  
A
PARAMETER  
Power dissipation capacitance per gate  
TEST CONDITIONS  
TYP  
UNIT  
C
No load  
45  
pF  
pd  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54HC125, SN74HC125  
QUADRUPLE BUS BUFFER GATES  
WITH 3-STATE OUTPUTS  
SCLS104B – MARCH 1984 – REVISED MAY 1997  
PARAMETER MEASUREMENT INFORMATION  
V
CC  
PARAMETER  
R
C
L
S1  
S2  
L
50 pF  
or  
150 pF  
S1  
S2  
t
t
Open  
Closed  
Closed  
Open  
PZH  
Test  
Point  
t
t
1 kΩ  
1 kΩ  
en  
R
L
From Output  
Under Test  
PZL  
t
t
Open  
Closed  
Open  
PHZ  
PLZ  
50 pF  
C
dis  
L
Closed  
(see Note A)  
50 pF  
or  
150 pF  
t
or t  
––  
Open  
Open  
pd  
t
LOAD CIRCUIT  
V
CC  
Input  
50%  
50%  
0 V  
t
t
PLH  
PHL  
90%  
V
V
OH  
In-Phase  
Output  
90%  
50%  
10%  
50%  
10%  
OL  
t
Output  
Control  
(Low-Level  
Enabling)  
t
r
f
f
V
CC  
t
t
PLH  
PHL  
90%  
50%  
50%  
V
V
OH  
90%  
t
0 V  
Out-of-Phase  
Output  
50%  
10%  
50%  
10%  
t
t
PLZ  
PZL  
OL  
t
V  
V  
r
Output  
Waveform 1  
(See Note B)  
CC  
CC  
50%  
VOLTAGE WAVEFORMS  
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES  
10%  
90%  
V
OL  
t
PZH  
V
CC  
V
Output  
Waveform 2  
(See Note B)  
OH  
90%  
t
90%  
Input  
50%  
10%  
50%  
10%  
50%  
0 V  
0 V  
t
PHZ  
t
r
f
VOLTAGE WAVEFORM  
INPUT RISE AND FALL TIMES  
VOLTAGE WAVEFORMS  
ENABLE AND DISABLE TIMES FOR 3-STATE OUTPUTS  
NOTES: A.  
C includes probe and test-fixture capacitance.  
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following  
characteristics: PRR 1 MHz, Z = 50 , t = 6 ns, t = 6 ns.  
O
r
f
D. The outputs are measured one at a time with one input transition per measurement.  
E.  
F.  
G.  
t
t
t
and t  
and t  
and t  
are the same as t  
are the same as t  
are the same as t  
.
dis  
en  
.
pd  
PLZ  
PZL  
PLH  
PHZ  
PZH  
PHL  
.
Figure 1. Load Circuit and Voltage Waveforms  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1998, Texas Instruments Incorporated  

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