SM74102/NOPB [TI]

SM74102/NOPB;
SM74102/NOPB
型号: SM74102/NOPB
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SM74102/NOPB

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Texas Instruments.  
Search http://www.ti.com/ for the latest technical  
information and details on our current products and services.  
December 1, 2008  
LM5104  
High Voltage Half-Bridge Gate Driver with Adaptive Delay  
General Description  
Features  
The LM5104 High Voltage Gate Driver is designed to drive  
both the high side and the low side N-Channel MOSFETs in  
a synchronous buck configuration. The floating high-side driv-  
er is capable of working with supply voltages up to 100V. The  
high side and low side gate drivers are controlled from a single  
input. Each change in state is controlled in an adaptive man-  
ner to prevent shoot-through issues. In addition to the adap-  
tive transition timing, an additional delay time can be added,  
proportional to an external setting resistor. An integrated high  
voltage diode is provided to charge high side gate drive boot-  
strap capacitor. A robust level shifter operates at high speed  
while consuming low power and providing clean level transi-  
tions from the control logic to the high side gate driver. Under-  
voltage lockout is provided on both the low side and the high  
side power rails. This device is available in the standard  
SOIC-8 pin and the LLP-10 pin packages.  
Drives both a high side and low side N-channel MOSFET  
Adaptive rising and falling edges with programmable  
additional delay  
Single input control  
Bootstrap supply voltage range up to 118V DC  
Fast turn-off propagation delay (25 ns typical)  
Drives 1000 pF loads with 15 ns rise and fall times  
Supply rail under-voltage lockout  
Typical Applications  
Current Fed Push-Pull Power Converters  
High Voltage Buck Regulators  
Active Clamp Forward Power Converters  
Half and Full Bridge Converters  
Package  
SOIC-8  
LLP-10 (4 mm x 4 mm)  
Simplified Block Diagram  
20089003  
FIGURE 1.  
© 2008 National Semiconductor Corporation  
200890  
www.national.com  
Connection Diagram  
20089001  
8-Lead SOIC  
See NS Package Number M08A  
20089002  
10-Lead LLP  
See NS Package Number SDC10A  
FIGURE 2.  
Ordering Information  
Ordering Number  
LM5104M  
Package Type  
SOIC-8  
NSC Package Drawing  
M08A  
Supplied As  
Shipped with Anti-Static Rails  
2500 shipped as Tape & Reel  
1000 shipped as Tape & Reel  
4500 shipped as Tape & Reel  
LM5104MX  
LM5104SD  
LM5104SDX  
SOIC-8  
M08A  
LLP-10  
SDC10A  
LLP-10  
SDC10A  
Pin Descriptions  
Pin  
Name  
Description  
Application Information  
SOIC-8  
LLP-10  
1
1
VDD  
HB  
Positive gate drive supply Locally decouple to VSS using low ESR/ESL capacitor, located as close  
to IC as possible.  
2
2
High side gate driver  
bootstrap rail  
Connect the positive terminal of bootstrap capacitor to the HB pin and  
connect negative terminal to HS. The Bootstrap capacitor should be  
placed as close to IC as possible.  
3
4
5
3
4
7
HO  
HS  
RT  
High side gate driver  
output  
Connect to gate of high side MOSFET with short low inductance path.  
High side MOSFET source Connect to bootstrap capacitor negative terminal and source of high side  
connection  
MOSFET.  
Deadtime programming  
pin  
Resistor from RT to ground programs the deadtime between high and  
low side transitions.The resistor should be located close to the IC to  
minimize noise coupling from adjacent traces.  
6
8
IN  
Control input  
Ground return  
Logic 1 equals High Side ON and Low Side OFF. Logic 0 equals High  
Side OFF and Low Side ON.  
7
8
9
VSS  
LO  
All signals are referenced to this ground.  
10  
Low side gate driver output Connect to the gate of the low side MOSFET with a short low inductance  
path.  
Note: For LLP-10 package, it is recommended that the exposed pad on the bottom of the LM5100 / LM5101 be soldered to ground plane on the PC  
board, and the ground plane should extend out from beneath the IC to help dissipate the heat. Pins 5 and 6 have no connection.  
www.national.com  
2
RT to VSS  
–0.3V to 5V  
+150°C  
–55°C to +150°C  
2 kV  
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
Junction Temperature  
Storage Temperature Range  
ESD Rating HBM (Note 2)  
VDD to VSS  
VHB to VHS  
IN to VSS  
–0.3V to +18V  
–0.3V to +18V  
Recommended Operating  
Conditions  
–0.3V to VDD + 0.3V  
–0.3V to VDD + 0.3V  
VHS – 0.3V to VHB + 0.3V  
−1V to +100V  
VDD  
HS  
+9V to +14V  
–1V to 100V  
LO Output  
HO Output  
VHS to VSS  
VHB to VSS  
HB  
VHS + 8V to VHS + 14V  
<50V/ns  
HS Slew Rate  
Junction Temperature  
118V  
–40°C to +125°C  
Electrical Characteristics Specifications in standard typeface are for TJ = +25°C, and those in boldface type  
apply over the full operating junction temperature range. Unless otherwise specified, VDD = VHB = 12V, VSS = VHS = 0V, RT =  
100k. No Load on LO or HO.  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
SUPPLY CURRENTS  
IDD  
VDD Quiescent Current  
VDD Operating Current  
LI = HI = 0V  
0.4  
1.9  
0.6  
3
mA  
mA  
mA  
mA  
µA  
IDDO  
f = 500 kHz  
IHB  
Total HB Quiescent Current  
Total HB Operating Current  
HB to VSS Current, Quiescent  
HB to VSS Current, Operating  
LI = HI = 0V  
f = 500 kHz  
0.06  
1.3  
0.2  
3
IHBO  
IHBS  
VHS = VHB = 100V  
f = 500 kHz  
0.05  
0.08  
10  
IHBSO  
mA  
INPUT PINS  
VIL  
VIH  
RI  
Low Level Input Voltage Threshold  
High Level Input Voltage Threshold  
Input Pulldown Resistance  
0.8  
1.8  
1.8  
V
V
2.2  
100  
200  
500  
kΩ  
TIME DELAY CONTROLS  
VRT  
IRT  
Nominal Voltage at RT  
2.7  
0.75  
58  
3
3.3  
2.25  
130  
270  
V
mA  
ns  
RT Pin Current Limit  
RT = 0V  
1.5  
90  
TD1  
TD2  
Delay Timer, RT = 10 kΩ  
Delay Timer, RT = 100 kΩ  
140  
200  
ns  
UNDER VOLTAGE PROTECTION  
VDDR  
VDDH  
VHBR  
VHBH  
VDD Rising Threshold  
VDD Threshold Hysteresis  
HB Rising Threshold  
6.0  
5.7  
6.9  
0.5  
6.6  
0.4  
7.4  
7.1  
V
V
V
V
HB Threshold Hysteresis  
BOOT STRAP DIODE  
VDL  
VDH  
RD  
Low-Current Forward Voltage  
IVDD-HB = 100 µA  
IVDD-HB = 100 mA  
IVDD-HB = 100 mA  
0.60  
0.85  
0.8  
0.9  
1.1  
1.5  
V
V
High-Current Forward Voltage  
Dynamic Resistance  
LO GATE DRIVER  
VOLL  
VOHL  
Low-Level Output Voltage  
ILO = 100 mA  
0.25  
0.35  
0.4  
V
V
High-Level Output Voltage  
ILO = –100 mA  
0.55  
VOHL = VDD – VLO  
IOHL  
IOLL  
Peak Pullup Current  
VLO = 0V  
1.6  
1.8  
A
A
Peak Pulldown Current  
VLO = 12V  
3
www.national.com  
Symbol  
Parameter  
Conditions  
IHO = 100 mA  
Min  
Typ  
Max  
Units  
HO GATE DRIVER  
VOLH  
VOHH  
Low-Level Output Voltage  
High-Level Output Voltage  
0.25  
0.35  
0.4  
V
V
IHO = –100 mA,  
0.55  
VOHH = VHB – VHO  
IOHH  
IOLH  
Peak Pullup Current  
VHO = 0V  
1.6  
1.8  
A
A
Peak Pulldown Current  
VHO = 12V  
THERMAL RESISTANCE  
Junction to Ambient  
SOIC-8  
170  
40  
°C/W  
θJA  
LLP-10 (Note 3)  
Switching Characteristics Specifications in standard typeface are for TJ = +25°C, and those in boldface  
type apply over the full operating junction temperature range. Unless otherwise specified, VDD = VHB = 12V, VSS = VHS = 0V,  
No Load on LO or HO .  
Symbol  
tLPHL  
Parameter  
Conditions  
Min  
Typ  
Max  
56  
Units  
Lower Turn-Off Propagation Delay (IN Rising  
to LO Falling)  
25  
ns  
tHPHL  
Upper Turn-Off Propagation Delay (IN Falling  
to HO Falling)  
25  
56  
ns  
tRC, tFC  
tR, tF  
Either Output Rise/Fall Time  
CL = 1000 pF  
15  
ns  
µs  
Either Output Rise/Fall Time  
(3V to 9V)  
CL = 0.1 µF  
0.6  
tBS  
Bootstrap Diode Turn-Off Time  
IF = 20 mA, IR = 200 mA  
50  
ns  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the component may occur. Operating Ratings are conditions under which operation  
of the device is guaranteed. Operating Ratings do not imply guaranteed performance limits. For guaranteed performance limits and associated test conditions,  
see the Electrical Characteristics tables.  
Note 2: The human body model is a 100 pF capacitor discharged through a 1.5kresistor into each pin. 2 kV for all pins except Pin 2, Pin 3 and Pin 4 which are  
rated at 500V.  
Note 3: 4 layer board with Cu finished thickness 1.5/1/1/1.5 oz. Maximum die size used. 5x body length of Cu trace on PCB top. 50 x 50mm ground and power  
planes embedded in PCB. See Application Note AN-1187.  
Note 4: Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using Statistical  
Quality Control (SQC) methods. Limits are used to calculate National’s Average Outgoing Quality Level (AOQL).  
Note 5: The θJA is not a given constant for the package and depends on the printed circuit board design and the operating environment.  
www.national.com  
4
Typical Performance Characteristics  
IDD vs Frequency  
Operating Current vs Temperature  
20089010  
20089011  
Quiescent Current vs Supply Voltage  
Quiescent Current vs Temperature  
20089013  
20089012  
IHB vs Frequency  
HO & LO Peak Output Current vs Output Voltage  
20089018  
20089017  
5
www.national.com  
Diode Forward Voltage  
Undervoltage Threshold Hysteresis vs Temperature  
20089019  
20089016  
Undervoltage Rising Threshold vs Temperature  
LO & HO Gate Drive—High Level Output Voltage vs  
Temperature  
20089020  
20089021  
LO & HO Gate Drive—Low Level Output Voltage vs  
Temperature  
Turn Off Propagation Delay vs Temperature  
20089023  
20089022  
www.national.com  
6
Timing vs Temperature RT = 10K  
Timing vs Temperature RT = 100K  
20089015  
20089024  
Turn On Delay vs RT Resistor Value  
20089014  
7
www.national.com  
LM5104 Waveforms  
20089005  
FIGURE 3. Application Timing Waveforms  
disabled until the deadtime expires. The upper gate is en-  
abled after the TIMER delay (tP+TRT) , and the upper MOS-  
FET turns-on. The additional delay of the timer prevents lower  
and upper MOSFETs from conducting simultaneously, there-  
by preventing shoot-through.  
Operational Description  
ADAPTIVE SHOOT-THROUGH PROTECTION  
LM5104 is a high voltage, high speed dual output driver de-  
signed to drive top and bottom MOSFET’s connected in syn-  
chronous buck or half-bridge configuration, from one exter-  
nally provided PWM signal. LM5104 features adaptive delay  
to prevent shoot-through current through top and bottom  
MOSFETs during switching transitions. Referring to the tim-  
ing diagram Figure 3, the rising edge of the PWM input (IN)  
turns off the bottom MOSFET (LO) after a short propagation  
delay (tP). An adaptive circuit in the LM5104 monitors the bot-  
tom gate voltage (LO) and triggers a programmable delay  
generator when the LO pin falls below an internally set thresh-  
old (Vdd/2). The gate drive of the upper MOSFET (HO) is  
A falling transition on the PWM signal (IN) initiates the turn-  
off of the upper MOSFET and turn-on of the lower MOSFET.  
A short propagation delay (tP) is encountered before the up-  
per gate voltage begins to fall. Again, the adaptive shoot-  
through circuitry and the programmable deadtime TIMER  
delays the lower gate turn-on time. The upper MOSFET gate  
voltage is monitored and the deadtime delay generator is trig-  
gered when the upper MOSFET gate voltage with respect to  
ground drops below an internally set threshold (Vdd/2). The  
lower gate drive is momentarily disabled by the timer and  
www.national.com  
8
turns on the lower MOSFET after the deadtime delay expires  
(tP+TRT).  
There are some additional losses in the gate drivers due to  
the internal CMOS stages used to buffer the LO and HO out-  
puts. The following plot shows the measured gate driver  
power dissipation versus frequency and load capacitance. At  
higher frequencies and load capacitance values, the power  
dissipation is dominated by the power losses driving the out-  
put loads and agrees well with the above equation. This plot  
can be used to approximate the power losses due to the gate  
drivers.  
The RT pin is biased at 3V and current limited to 1mA. It is  
designed to accommodate a resistor between 5K and 100K,  
resulting in an effective dead-time proportional to RT and  
ranging from 90ns to 200ns. RT values below 5K will saturate  
the timer and are not recommended.  
Startup and UVLO  
Both top and bottom drivers include under-voltage lockout  
(UVLO) protection circuitry which monitors the supply voltage  
(VDD) and bootstrap capacitor voltage (VHB – VHS) indepen-  
dently. The UVLO circuit inhibits each driver until sufficient  
supply voltage is available to turn-on the external MOSFETs,  
and the built-in hysteresis prevents chattering during supply  
voltage transitions. When the supply voltage is applied to  
VDD pin of LM5104, the top and bottom gates are held low  
until VDD exceeds UVLO threshold, typically about 6.9V. Any  
UVLO condition on the bootstrap capacitor will disable only  
the high side output (HO).  
Gate Driver Power Dissipation (LO + HO)  
VCC = 12V, Neglecting Diode Losses  
LAYOUT CONSIDERATIONS  
The optimum performance of high and low side gate drivers  
cannot be achieved without taking due considerations during  
circuit board layout. Following points are emphasized.  
1. A low ESR/ESL capacitor must be connected close to the  
IC, and between VDD and VSS pins and between HB and  
HS pins to support high peak currents being drawn from  
VDD during turn-on of the external MOSFET.  
20089006  
The bootstrap diode power loss is the sum of the forward bias  
power loss that occurs while charging the bootstrap capacitor  
and the reverse bias power loss that occurs during reverse  
recovery. Since each of these events happens once per cycle,  
the diode power loss is proportional to frequency. Larger ca-  
pacitive loads require more current to recharge the bootstrap  
capacitor resulting in more losses. Higher input voltages  
(VIN) to the half bridge result in higher reverse recovery loss-  
es. The following plot was generated based on calculations  
and lab measurements of the diode recovery time and current  
under several operating conditions. This can be useful for ap-  
proximating the diode power dissipation.  
2. To prevent large voltage transients at the drain of the top  
MOSFET, a low ESR electrolytic capacitor must be  
connected between MOSFET drain and ground (VSS).  
3. In order to avoid large negative transients on the switch  
node (HS) pin, the parasitic inductances in the source of  
top MOSFET and in the drain of the bottom MOSFET  
(synchronous rectifier) must be minimized.  
4. Grounding considerations:  
a) The first priority in designing grounding connections is  
to confine the high peak currents from charging and  
discharging the MOSFET gate in a minimal physical  
area. This will decrease the loop inductance and  
minimize noise issues on the gate terminal of the  
MOSFET. The MOSFETs should be placed as close as  
possible to the gate driver.  
Diode Power Dissipation VIN = 80V  
b) The second high current path includes the bootstrap  
capacitor, the bootstrap diode, the local ground  
referenced bypass capacitor and low side MOSFET body  
diode. The bootstrap capacitor is recharged on the cycle-  
by-cycle basis through the bootstrap diode from the  
ground referenced VDD bypass capacitor. The recharging  
occurs in a short time interval and involves high peak  
current. Minimizing this loop length and area on the  
circuit board is important to ensure reliable operation.  
5. The resistor on the RT pin must be placed very close to  
the IC and seperated from high current paths to avoid  
noise coupling to the time delay generator which could  
disrupt timer operation.  
POWER DISSIPATION CONSIDERATIONS  
The total IC power dissipation is the sum of the gate driver  
losses and the bootstrap diode losses. The gate driver losses  
are related to the switching frequency (f), output load capac-  
itance on LO and HO (CL), and supply voltage (VDD) and can  
be roughly calculated as:  
20089007  
2
PDGATES = 2 • f • CL • VDD  
9
www.national.com  
Diode Power Dissipation VIN = 40V  
The total IC power dissipation can be estimated from the  
above plots by summing the gate drive losses with the boot-  
strap diode losses for the intended application. Because the  
diode losses can be significant, an external diode placed in  
parallel with the internal bootstrap diode (refer to Figure 4)  
can be helpful in removing power from the IC. For this to be  
effective, the external diode must be placed close to the IC to  
minimize series inductance and have a significantly lower for-  
ward voltage drop than the internal diode.  
20089008  
20089009  
FIGURE 4. LM5104 Driving MOSFETs Connected in Synchronous Buck Configuration  
www.national.com  
10  
Physical Dimensions inches (millimeters) unless otherwise noted  
Notes: Unless otherwise specified  
Standard lead finish to be 200 microinches/5.00 micrometers minimum tin/lead (solder) on copper.  
1.  
Pin 1 identification to have half of full circle option.  
2.  
No JEDEC registration as of Feb. 2000.  
3.  
LLP-10 Outline Drawing  
NS Package Number SDC10A  
11  
www.national.com  
Notes: Unless otherwise specified  
For solder thickness and composition, see “Solder Information” in the packaging section of the National Semiconductor web page (www.national.com).  
1.  
Maximum allowable metal burr on lead tips at the package edges is 76 microns.  
2.  
No JEDEC registration as of May 2003.  
3.  
SOIC-8 Outline Drawing  
NS Package Number M08A  
www.national.com  
12  
Notes  
13  
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