LM74801QDRRRQ1 [TI]
用于驱动背对背 NFET 的 3V 至 65V、汽车理想二极管控制器 | DRR | 12 | -40 to 125;型号: | LM74801QDRRRQ1 |
厂家: | TEXAS INSTRUMENTS |
描述: | 用于驱动背对背 NFET 的 3V 至 65V、汽车理想二极管控制器 | DRR | 12 | -40 to 125 驱动 控制器 二极管 |
文件: | 总46页 (文件大小:9794K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
LM7480-Q1
ZHCSL09C – APRIL 2020 – REVISED DECEMBER 2020
具有负载突降保护功能的 LM7480-Q1 理想二极管控制器
1 特性
3 说明
•
符合面向汽车应用的 AEC-Q100 标准
LM7480x-Q1 理想二极管控制器可驱动和控制外部背
对背 N 沟道 MOSFET,从而模拟具有电源路径开/关控
制和过压保护的理想二极管整流器。3V 至 65V 的宽输
入电源电压可保护和控制 12V 和 24V 汽车类电池供电
的 ECU。该器件可以承受并保护负载免受低至 –65V
的 负 电 源 电 压 的 影 响 。 集 成 的 理 想 二 极 管 控 制 器
(DGATE) 可驱动第一个 MOSFET 来代替肖特基二极
管,以实现反向输入保护和输出电压保持。在电源路径
中使用了第二个 MOSFET 的情况下,该器件允许负载
断开(开/关控制)并使用 HGATE 控制提供过压保
护。该器件具有可调节过压切断保护功能。LM7480-
Q1 有两种型号:LM74800-Q1 和 LM74801-Q1。
LM74800-Q1 使用线性稳压和比较器方案来实现反向
电流阻断功能,而 LM74801-Q1 支持基于比较器的方
案。通过功率 MOSFET 的共漏极配置,可以使用另一
个理想二极管将中点用于 OR-ing 设计。LM7480x-Q1
的最大额定电压为 65V。通过在共源极拓扑中为器件
配置外部 MOSFET,可以保护负载免受过压瞬态(例
如 24V 电池系统中未抑制的 200V 负载突降)的影
响。
– 器件温度等级 1:
–40°C 至 +125°C 环境工作温度范围
– 器件 HBM ESD 分类等级 2
– 器件 CDM ESD 分类等级 C4B
• 3V 至 65V 输入范围
•
•
反向输入保护低至 –65V
在共漏极和共源极配置下,可驱动外部背对背 N 沟
道 MOSFET
• 10.5mV 阳极至阴极正向压降调节下,理想二极管
正常运行 (LM74800-Q1)
•
低反向检测阈值 (–4.5mV),能够快速响应 (0.5µs)
• 20mA 峰值栅极 (DGATE) 导通电流
• 2.6A 峰值 DGATE 关断电流
•
可调节过压保护
• 2.87µA 低关断电流(EN/UVLO = 低电平)
•
•
采用合适的 TVS 二极管,符合汽车 ISO7637 瞬态
要求
采用节省空间的 12 引脚 WSON 封装
器件信息
封装(1)
2 应用
封装尺寸(标称值)
器件型号
•
汽车电池保护
LM74800-Q1、
LM74801-Q1
WSON (12)
3.0mm x 3.0mm
– ADAS 域控制器
– 摄像头 ECU
(1) 如需了解所有可用封装,请参阅数据表末尾的可订购产品附
录。
– 音响主机
– USB 集线器
•
用于冗余电源的有源 ORing
VOUT2
(Always ON)
VBATT:
12V/24V
with 200V Load Dump
60V
200V
Q2
Q1
VOUT
Q1
Q2
VBATT
12 V
VOUT1
(VBATT Switched)
R1
10kΩ
C
HGATE
VS
OUT
A
DGATE
DGATE CAP VS
C
D1
SMBJ36CA
HGATE
A
C1
OUT
VSNS
SW
D1
CAP
1µF
60V
LM7480x-Q1
VSNS
R1
BATT_MON
LM7480x-Q1
GND
SW
OV
R1
R2
R2
EN/UVLO
ON OFF
EN/UVLO
ON OFF
GND
OV
R3
具有 200V 负载突降保护的理想二极管
具有开关输出的理想二极管
本文档旨在为方便起见,提供有关 TI 产品中文版本的信息,以确认产品的概要。有关适用的官方英文版本的最新信息,请访问
www.ti.com,其内容始终优先。TI 不保证翻译的准确性和有效性。在实际设计之前,请务必参考最新版本的英文版本。
English Data Sheet: SNOSD95
LM7480-Q1
ZHCSL09C – APRIL 2020 – REVISED DECEMBER 2020
www.ti.com.cn
Table of Contents
10.1 Application Information........................................... 19
10.2 Typical 12-V Reverse Battery Protection
Application...................................................................19
10.3 200-V Unsuppressed Load Dump Protection
1 特性................................................................................... 1
2 应用................................................................................... 1
3 说明................................................................................... 1
4 Revision History.............................................................. 2
5 Device Comparison Table...............................................3
6 Pin Configuration and Functions...................................3
7 Specifications.................................................................. 4
7.1 Absolute Maximum Ratings ....................................... 4
7.2 ESD Ratings .............................................................. 4
7.3 Recommended Operating Conditions ........................4
7.4 Thermal Information ...................................................5
7.5 Electrical Characteristics ............................................5
7.6 Switching Characteristics ...........................................6
7.7 Typical Characteristics................................................8
8 Parameter Measurement Information.......................... 11
9 Detailed Description......................................................12
9.1 Overview...................................................................12
9.2 Functional Block Diagram.........................................13
9.3 Feature Description...................................................13
9.4 Device Functional Modes..........................................16
9.5 Application Examples................................................17
10 Applications and Implementation..............................19
Application...................................................................29
10.4 Do's and Don'ts.......................................................32
11 Power Supply Recommendations..............................33
11.1 Transient Protection................................................ 33
11.2 TVS Selection for 12-V Battery Systems................ 34
11.3 TVS Selection for 24-V Battery Systems................ 34
12 Layout...........................................................................35
12.1 Layout Guidelines................................................... 35
12.2 Layout Example...................................................... 35
13 Device and Documentation Support..........................37
13.1 Receiving Notification of Documentation Updates..37
13.2 Support Resources................................................. 37
13.3 Trademarks.............................................................37
13.4 Electrostatic Discharge Caution..............................37
13.5 Glossary..................................................................37
14 Mechanical, Packaging, and Orderable
Information.................................................................... 37
4 Revision History
注:以前版本的页码可能与当前版本的页码不同
Changes from Revision B (October 2020) to Revision C (December 2020)
Page
•
将 LM74800-Q1 的状态从“预发布”更改为“正在供货”................................................................................ 1
• Updated Functional Block Diagram ................................................................................................................. 13
• Changed "VAC(REV)" to "V(AC_REV)"....................................................................................................................14
Changes from Revision A (May 2020) to Revision B (October 2020)
Page
•
将状态从“预告信息”更改为“量产数据”....................................................................................................... 1
Changes from Revision * (April 2020) to Revision *2 (May 2020)
Page
• Changed second paragraph of Application Information ...................................................................................19
DATE
REVISION
A is APL/AI
*
NOTES
May 2020
April 2020
2nd Advance Information release.
Advance Information release.
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5 Device Comparison Table
LM74800-Q1
V(A-C) linear regulation and comparator
LM74801-Q1
Reverse Current Blocking
V(A-C) comparator only
6 Pin Configuration and Functions
12
11
10
1
2
3
4
DGATE
A
C
CAP
VSNS
VS
DRR
9
8
7
OUT
SW
OV
Exposed
Thermal
Pad
HGATE
GND
5
6
EN/UVLO
图 6-1. WSON 12-Pin DRR Transparent Top View
表 6-1. Pin Functions
PIN
LM7480x-Q1
TYPE
DESCRIPTION
NAME
DRR-12 (WSON)
Diode Controller Gate Drive Output. Connect to the GATE of the external
MOSFET.
DGATE
1
O
A
2
3
I
I
Anode of the ideal diode. Connect to the source of the external MOSFET.
Voltage sensing input.
VSNS
Voltage sensing disconnect switch terminal. VSNS and SW are internally
connected through a switch. Use SW as the top connection of the battery
sensing or OV resistor ladder network. When EN/UVLO is pulled low, the switch
is OFF disconnecting the resistor ladder from the battery line thereby cutting off
the leakage current. If the internal disconnect switch between VSNS and SW is
not used then short them together and connect to VS pin.
SW
4
I
Adjustable overvoltage threshold input. Connect a resistor ladder across SW to
OV terminal. When the voltage at OVP exceeds the overvoltage cut-off threshold
then the HGATE is pulled low turning OFF the HSFET. HGATE turns ON when
the sense voltage goes below the OVP falling threshold.
OV
5
6
I
I
EN/UVLO Input. Connect to VS pin for always ON operation. Can be driven
externally from a micro controller I/O. Pulling it low below V(ENF) makes the
device enter into low Iq shutdown mode. For UVLO, connect an external resistor
ladder to EN/UVLO to GND.
EN/UVLO
GND
7
8
9
G
O
I
Connect to the system ground plane.
HGATE
OUT
GATE driver output for the HSFET. Connect to the GATE of the external FET.
Connect to the output rail (external MOSFET source).
Input power supply to the IC. Connect VS to middle point of the common drain
back to back MOSFET configuration. Connect a 100nF capacitor across VS and
GND pins.
VS
10
I
CAP
C
11
12
O
I
Charge pump output. Connect a 100-nF capacitor across CAP and VS pins.
Cathode of the ideal diode. Connect to the drain of the external MOSFET.
Leave exposed pad floating. Do Not connect to GND plane.
RTN
Thermal Pad
—
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7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
–65
MAX
70
UNIT
A to GND
VS to GND
70
–1
VSNS, SW, EN/UVLO, C, OV, OUT to GND, V(A) > 0 V
70
V
–0.3
V(A)
(70 + V(A)
)
VSNS, SW, EN/UVLO, C, OV, OUT to GND, V(A) ≤ 0 V
Input Pins
RTN to GND
0.3
10
–65
IVSNS, ISW
mA
mA
–1
IEN/UVLO, IOV, V(A) > 0 V
–1
Internally limited
–65
IEN/UVLO, IOV,
OUT to VS
CAP to VS
CAP to A
V(A) ≤ 0 V
Output Pins
16.5
15
V
V
–0.3
–0.3
–0.3
–0.3
–5
85
Output Pins
DGATE to A
15
HGATE to OUT
15
Output to Input Pins
C to A
85
(2)
Operating junction temperature, Tj
Storage temperature, Tstg
150
150
–40
°C
–40
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(2) High junction temperatures degrade operating lifetimes. Operating lifetime is de-rated for junction temperatures greater than 125°C.
7.2 ESD Ratings
VALUE UNIT
Human body model (HBM), per AEC Q100-002(1)
±2000
±750
±500
V(ESD) Electrostatic discharge
Corner pins (DGATE, OV, and C)
Other pins
V
Charged device model (CDM), per
AEC Q100-011
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)(1)
MIN
–60
0
NOM
MAX
65
UNIT
A to GND
V
V
V
Input Pins
External
VS to GND
65
EN/UVLO to GND
0
65
Capacitanc CAP to A, VS to GND, A to GND
e
0.1
15
µF
V
External
MOSFET
DGATE to A and HGATE to OUT
max VGS
rating
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7.3 Recommended Operating Conditions (continued)
over operating free-air temperature range (unless otherwise noted)(1)
MIN
NOM
MAX
UNIT
Tj
Operating Junction temperature(2)
150
°C
–40
(1) Recommended Operating Conditions are conditions under which the device is intended to be functional. For specifications and test
conditions, see Electrical Characteristics.
(2) High junction temperatures degrade operating lifetimes. Operating lifetime is de-rated for junction temperatures greater than 125°C.
7.4 Thermal Information
LM7480x-Q1
THERMAL METRIC(1)
DRR (WSON)
UNIT
12 PINS
60.9
48
RθJA
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RθJC(top)
RθJB
31.5
1.2
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
ΨJT
31.4
7.1
ΨJB
RθJC(bot)
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
7.5 Electrical Characteristics
TJ = –40°C to +125°C; typical values at TJ = 25°C, V(A) = V(OUT) = V(VS) = V(VSNS) = 12 V, V(AC) = 20 mV, C(VCAP) = 0.1 µF,
V(EN/UVLO) = 2 V, over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
SUPPLY VOLTAGE
V(VS)
Operating input voltage
VS POR threshold, rising
VS POR threshold, falling
SHDN current, I(GND)
3
2.4
1.9
65
2.85
2.3
5
V
V
V(VS_PORR)
V(VS_PORF)
I(SHDN)
2.6
2.1
V
V(EN/UVLO) = 0 V
2.87
397
413
µA
µA
µA
V(EN/UVLO) = 2 V
I(Q)
Total System Quiescent current, I(GND)
V(A) = V(VS) = 24 V, V(EN/UVLO) = 2 V
495
112
I(A) leakage current during Reverse
Polarity,
19
µA
µA
I(REV)
0 V ≤ V(A) ≤ – 65 V
I(OUT) leakage current during Reverse
Polarity
1
ENABLE AND UNDERVOLTAGE LOCKOUT (EN/UVLO) INPUT
V(UVLOR)
V(UVLOF)
EN/UVLO threshold voltage, rising
EN/UVLO threshold voltage, falling
1.195
1.091
1.231
1.132
1.267
1.159
V
V
Enable threshold voltage for low Iq
shutdown, falling
V(ENF)
0.3
37
0.67
0.93
V
V(EN_Hys)
I(EN/UVLO)
Enable Hysteresis
72
52
95
mV
nA
200
0 V ≤ V(EN/UVLO) ≤ 65 V
OVERVOLTAGE PROTECTION AND BATTERY SENSING (VSNS, SW, OV) INPUT
Battery sensing disconnect switch
resistance
R(SW)
10
19.5
46
3 V ≤ V(SNS) ≤ 65 V
Ω
V(OVR)
V(OVF)
Overvoltage threshold input, rising
Overvoltage threshold input, falling
1.195
1.091
1.231
1.13
1.267
1.159
V
V
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7.5 Electrical Characteristics (continued)
TJ = –40°C to +125°C; typical values at TJ = 25°C, V(A) = V(OUT) = V(VS) = V(VSNS) = 12 V, V(AC) = 20 mV, C(VCAP) = 0.1 µF,
V(EN/UVLO) = 2 V, over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
I(OV)
OV Input leakage current
53
200
nA
0 V ≤ V(OV) ≤ 65 V
CHARGE PUMP (CAP)
Charge Pump source current (Charge
pump on)
V
V
(CAP) – V(A) = 7 V, 6 V ≤ V(S) ≤ 65
I(CAP)
1.3
2.7
mA
Charge Pump Turn ON voltage
Charge Pump Turnoff voltage
11
12.2
13.2
13.2
14.1
V
V
VCAP – VS
11.9
Charge Pump UVLO voltage
threshold, rising
5.4
4.4
6.6
5.5
7.9
6.6
V
V
V(CAP UVLO)
Charge Pump UVLO voltage
threshold, falling
IDEAL DIODE (A, C, DGATE)
V(A_PORR) V(A) POR threshold, rising
V(A_PORF)
2.2
2
2.35
2.2
2.6
2.4
V
V
V(A) POR threshold, falling
Regulated Forward V(A)–V(C)
Threshold
V(AC_REG)
V(AC_REV)
V(AC_FWD)
For LM74800-Q1 Only
6.8
–6.4
150
10.5
–4.5
177
13.4
–1.3
200
mV
mV
mV
V
(A)–V(C) Threshold for Fast Reverse
Current Blocking
V
(A)–V(C) Threshold for Reverse to
Forward transition
3 V < V(S) < 5 V
5 V < V(S) < 65 V
7
V
V
Gate Drive Voltage
V
(DGATE) – V(A)
10
11.5
20
13
V(A) – V(C) = 100 mV, V(DGATE) – V(A)
Peak Gate Source current
Peak Gate Sink current
Regulation sink current
mA
mA
µA
µA
µA
= 1 V
V
(A) – V(C) = –12 mV, V(DGATE) –
I(DGATE)
2670
12.3
2.84
8.77
V(A) = 11 V
V(A) – V(C) = 0 V, V(DGATE) – V(A) = 11
8.4
0.1
4
V, LM74800-Q1 Only
V(A) = –14 V, V(C) = 12 V, LM74801-
Q1
15
32
I(C)
Cathode leakage Current
V(A) = –14 V, V(C) = 12 V, LM74800-
Q1
HIGH SIDE CONTROLLER (HGATE, OUT, SNS, SW, OV)
3 V < V(S) < 5 V
5 V < V(S) < 65 V
7
10
V
V
Gate Drive Voltage
(HGATE) – V(OUT)
V
11.1
55
14.5
75
Source Current
Sink Current
39
µA
mA
I(HGATE)
V(OV) > V(OVR)
168
260
7.6 Switching Characteristics
TJ = –40°C to +125°C; typical values at TJ = 25°C, V(A) = V(C) = V(OUT) = V(VS) = 12V, V(AC) = 20 mV, C(VCAP) = 0.1 µF,
V(EN/UVLO) = 2 V, over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
V
(A) – V(C) = +30 mV to –100 mV
DGATE Turnoff Delay during reverse
voltage detection
tDGATE_OFF(dly)
0.5
0.875
3.8
µs
µs
to V(DGATE–A) < 1 V, C(DGATE–A) = 10
nF
V
(A) – V(C) = –20 mV to +700
DGATE Turnon Delay during forward
voltage detection
tDGATE_ON(dly)
2.8
mV to V(DGATE-A) > 5 V, C(DGATE-A) = 10
nF
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TJ = –40°C to +125°C; typical values at TJ = 25°C, V(A) = V(C) = V(OUT) = V(VS) = 12V, V(AC) = 20 mV, C(VCAP) = 0.1 µF,
V(EN/UVLO) = 2 V, over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
DGATE Turnon Delay during EN/
UVLO
EN/UVLO ↑ to V(DGATE-A) > 5V,
C(DGATE-A) = 10 nF
tEN(dly)_DGATE
98
175
270
µs
µs
µs
µs
DGATE Turnoff Deglitch during EN/
UVLO
tEN_OFF(deg)_DGATE
8.1
4.6
EN/UVLO ↓ to DGATE ↓
EN/UVLO ↓ to HGATE ↓
HGATE Turnoff Deglitch during EN/
UVLO
tEN_OFF(deg)_HGATE
3
6
5.4
4.7
OV ↑ to HGATE ↓, For LM74800-Q1
only
3.98
tOVP_OFF(deg)_HGAT
HGATE Turnoff Deglitch during OV
E
OV ↑ to HGATE ↓, For LM74801-Q1
only
3.2
µs
µs
tOVP_ON(deg)_HGATE HGATE Turnon Deglitch during OV
2.95
OV ↓ to HGATE ↑
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7.7 Typical Characteristics
8000
7500
7000
6500
6000
5500
5000
4500
4000
3500
3000
2500
2000
1500
1000
500
500
450
400
350
300
-40èC
25èC
85èC
125èC
150èC
-40èC
25èC
85èC
125èC
150èC
0
0
5
10 15 20 25 30 35 40 45 50 55 60 65
VS (V)
10 15 20 25 30 35 40 45 50 55 60 65
VS (V)
IQ
IQ_V
图 7-1. Operating Quiescent Current vs Supply Voltage
图 7-2. Operating Quiescent Current vs Supply Voltage (> 10 V)
4
3.5
3
5.5
-40èC
25èC
5
4.5
4
85èC
125èC
150èC
2.5
2
3.5
3
1.5
2.5
2
-40èC
1
25èC
85èC
0.5
125èC
1.5
1
150èC
0
3
4
5
6
7
8
9
10
11
12
0
2
4
6
8
10
12
VS (V)
VCAP - VS (V)
D025
D013
图 7-3. Charge Pump Current vs Supply Voltage at CAP = 6 V
图 7-4. Charge Pump V-I Characteristics at VS > = 12 V
12.25
12
12
11.75
11.5
11.25
11
11.75
11.5
11.25
11
10.75
10.5
10.25
10
10.75
10.5
10.25
10
9.75
-40èC
25èC
-40èC
9.75
9.5
25èC
9.5
9.25
9
85èC
85èC
125èC
150èC
9.25
9
125èC
150èC
8.75
8.75
0
5
10 15 20 25 30 35 40 45 50 55 60 65
VS (V)
0
5
10 15 20 25 30 35 40 45 50 55 60 65
VS (V)
D024
D024
图 7-5. DGATE Drive Voltage vs Supply Voltage
图 7-6. HGATE Drive Voltage vs Supply Voltage
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7.7 Typical Characteristics (continued)
-9
-12
-15
-18
-21
-24
-27
-30
-33
-36
-39
-42
-45
-48
-51
-54
1.4
1.3
1.2
1.1
1
-40èC
25èC
85èC
125èC
150èC
-65 -60 -55 -50 -45 -40 -35 -30 -25 -20 -15 -10 -5
VA (V)
0
-50
0
50
100
150
200
Temperature (èC)
D024
D024
图 7-7. ANODE Leakage Current vs Reverse ANODE Voltage
图 7-8. UVLO Thresholds vs Temperature
1.4
7.5
6
1.3
1.2
1.1
1
4.5
3
1.5
(VCAP-VS) UVLOR
(VCAP-VS) UVLOF
0
-50
0
50
100
150
200
-50
0
50
100
150
200
Temperature (èC)
Temperature (èC)
D024
D024
图 7-9. OVP Thresholds vs Temperature
图 7-10. Charge Pump UVLO Threshold vs Temperature
3
3
2.5
2
2.4
1.8
1.2
0.6
0
1.5
1
0.5
VA PORR
VA PORF
VS PORR
VS PORF
0
-50
-50
0
50
100
150
200
0
50
100
150 200
Temperature (èC)
Temperature (èC)
D024
D024
图 7-11. VA POR Threshold vs Temperature
图 7-12. VS POR Threshold vs Temperature
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7.7 Typical Characteristics (continued)
3
57.2
57
56.8
56.6
56.4
56.2
56
2.8
2.6
2.4
2.2
2
55.8
55.6
55.4
55.2
0
5
10 15 20 25 30 35 40 45 50 55 60 65
VS (V)
-50
0
50
100
150
200
Temperature (èC)
D024
HGAT
图 7-14. HGATE Current (IHGATE) vs Supply Voltage
图 7-13. HGATE Turn OFF Delay during OV
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8 Parameter Measurement Information
30 mV
VA > VC
0 mV
VC > VA
-100 mV
VDGATE
1V
0 V
ttDGATE_OFF(DLY)
t
700 mV
VA > VC
0 mV
VC > VA
-20 mV
VDGATE
5V
0 V
ttDGATE_ON(DLY)
t
VOVR + 0.1V
0V
VHGATE
0 V
ttOVP_OFF(deg)HGATE
t
图 8-1. Timing Waveforms
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9 Detailed Description
9.1 Overview
The LM7480x-Q1 ideal diode controller drives and controls external back to back N-Channel MOSFETs to
emulate an ideal diode rectifier with power path ON/OFF control, inrush current limiting and overvoltage
protection. The wide input supply of 3 V to 65 V allows protection and control of 12-V and 24-V automotive
battery powered ECUs. The device can withstand and protect the loads from negative supply voltages down to
–65 V. An integrated ideal diode controller (DGATE) drives the first MOSFET to replace a Schottky diode for
reverse input protection and output voltage holdup. A strong charge pump with 20-mA peak GATE source
current driver stage and short turn ON and turn OFF delay times ensures fast transient response ensuring robust
performance during automotive testing such as ISO16750 or LV124 where an ECU is subjected to AC
superimpose input signals. With a second MOSFET in the power path the device allows load disconnect
(ON/OFF control) and overvoltage protection using HGATE control. The device features an adjustable
overvoltage cut-off protection feature using a programming resistor across SW and OVP terminal.
The LM7480x-Q1 controller can drive the external MOSFETs in Common Drain and Common Source
configurations. With Common Drain configuration of the power MOSFETs, the mid-point can be utilized for OR-
ing designs using an another ideal diode. The LM7480x-Q1 has a maximum voltage rating of 65 V. The loads
can be protected from extended overvoltage transients like 200-V Unsuppressed Load Dumps in 24-V Battery
systems by configuring the device with external MOSFETs in Common Source topology.
The LM74800-Q1 controls the DGATE of the MOSFET to regulate the forward voltage drop at 10.5 mV. The
linear regulation scheme in these devices enables graceful control of the GATE voltage and turns off of the
MOSFET during a reverse current event and ensures zero DC reverse current flow. The LM74801-Q1 features a
comparator based scheme to turn ON/OFF the MOSFET GATE.
The device features enable control. With the enable pin low during the standby mode, both the external
MOSFETs and controller is off and draws a very low 2.87 μA of current. The high voltage rating of LM7480x-Q1
helps to simplify the system designs for automotive ISO7637 protection. The LM74800-Q1 is also suitable for
ORing applications
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9.2 Functional Block Diagram
Q1
Q2
VBATT
VOUT
HGATE
OUT
C
VS
CAP
OUT+12V
55µA
A
DGATE
CP
VSNS
SW
EN
2.7mA
Reverse Current
Protection controller and
Gate Driver
Gate
Driver
R1
BATT_MON
A+12V
VCAP
R2
R3
OV
VCAP
+
OV
EN
Charge
Pump
Enable
Logic
1.23 V
1.13
œ
EN
VS
+
EN/UVLO
1 V
A+12V
VCAP
œ
0.3 V
OUT+12V
VA
Bias Rails
+
VOUT
Internal Rails
UVLO
A
1.23 V
1.13
œ
Reverse
Protection Logic
VS
GND
LM7480x-Q1
9.3 Feature Description
9.3.1 Charge Pump
The charge pump supplies the voltage necessary to drive the external N-channel MOSFET. An external charge
pump capacitor is placed between CAP and VS pins to provide energy to turn on the external MOSFET. In order
for the charge pump to supply current to the external capacitor, the EN/UVLO pin voltage must be above the
specified input high threshold, V(ENR). When enabled the charge pump sources a charging current of 2.7-mA
typical. If EN/UVLO pin is pulled low, then the charge pump remains disabled. To ensure that the external
MOSFET can be driven above its specified threshold voltage, the CAP to VS voltage must be above the
undervoltage lockout threshold, typically 6.6 V, before the internal gate driver is enabled. Use 方程式 1 to
calculate the initial gate driver enable delay.
V
(CAP _UVLOR)
T DRV _EN = 175ms + C(CAP)
x
(
)
2.7mA
(1)
where
• C(CAP) is the charge pump capacitance connected across VS and CAP pins
• V(CAP_UVLOR) = 6.6 V (typical)
To remove any chatter on the gate drive approximately 1 V of hysteresis is added to the VCAP undervoltage
lockout. The charge pump remains enabled until the CAP to VS voltage reaches 13.2 V, typically, at which point
the charge pump is disabled decreasing the current draw on the VS pin. The charge pump remains disabled until
the CAP to VS voltage is below to 12.2 V typically at which point the charge pump is enabled. The voltage
between CAP and VS continue to charge and discharge between 12.2 V and 13.2 V as shown in 图 9-1. By
enabling and disabling the charge pump, the operating quiescent current of the LM7480x-Q1 is reduced. When
the charge pump is disabled it sinks 15 µA.
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TON
TDRV_EN
TOFF
VIN
VA=Vs
0V
VEN/UVLO
13.2 V
12.2 V
VCAP-VS
6.6 V
V(VCAP UVLOR)
GATE DRIVER
ENABLE
图 9-1. Charge Pump Operation
9.3.2 Dual Gate Control (DGATE, HGATE)
The LM7480x-Q1 feature two separate gate control and driver outputs i.e DGATE and HGATE to drive back to
back N-channel MOSFETs.
9.3.2.1 Reverse Battery Protection (A, C, DGATE)
A, C, DGATE comprises of Ideal Diode stage. Connect the Source of the external MOSFET to A, Drain to C and
Gate to DGATE. The LM7480x-Q1 has integrated reverse input protection down to –65 V.
Before the DGATE driver is enabled, following conditions must be achieved:
• The EN/UVLO pin voltage must be greater than the specified input high voltage.
• The CAP to VS voltage must be greater than the undervoltage lockout voltage.
• Voltage at A pin must be greater than VA POR Rising threshold.
• Voltage at Vs pin must be greater than Vs POR Rising thershold.
If the above conditions are not achieved, then the DGATE pin is internally connected to the A pin, assuring that
the external MOSFET is disabled.
In LM74800-Q1 the voltage drop across the MOSFET is continuously monitored between the A and C pins, and
the DGATE to A voltage is adjusted as needed to regulate the forward voltage drop at 10.5 mV (typ). This closed
loop regulation scheme enables graceful turn off of the MOSFET during a reverse current event and ensures
zero DC reverse current flow. This scheme ensures robust performance during slow input voltage ramp down
tests. Along with the linear regulation amplifier scheme, the LM74800-Q1 also integrates a fast reverse voltage
comparator. When the voltage drop across A and C reaches V(AC_REV) threshold then the DGATE goes low
within 0.5-µs (typ). This fast reverse voltage comparator scheme ensures robust performance during fast input
voltage ramp down tests such as input micro-shorts. The external MOSFET is turned ON back when the voltage
across A and C hits V(AC_FWD) threshold within 2.8 µs (typ).
In LM74801-Q1, reverse current blocking is by fast reverse voltage comparator only. When the voltage drop
across A and C reaches V(AC_REV) threshold then the DGATE goes low within 0.5 µs (typ). This fast reverse
voltage comparator scheme ensures robust performance during fast input voltage ramp down tests such as input
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micro-shorts. The external MOSFET is turned ON back when the voltage across A and C hits V(AC_FWD)
threshold within 2.8 µs (typ).
For Ideal Diode only designs, connect LM7480x-Q1 as shown in 图 9-2
Q1
VBATT
12 V
VOUT
DGATE CAP VS C
D1
SMBJ36CA
HGATE
OUT
A
VSNS
SW
R1
BATT_MON
R2
LM7480x-Q1
GND
EN/UVLO
ON OFF
OV
图 9-2. Configuring LM7480x-Q1 for Ideal Diode Only
表 9-1. Performance with 'C' Terminal Left Floating
Feature
LM74800-Q1
LM74801-Q1
DGATE gets pulled to A. MOSFET Q1 turned
OFF.
DGATE to A fully enhanced. MOSFET Q1
turned ON.
DGATE drive
Reverse Polarity Protection
Reverse Current Blocking
Yes.
Yes.
Yes.
No. Allows bi-directional current flow.
9.3.2.2 Load Disconnect Switch Control (HGATE, OUT)
HGATE and OUT comprises of Load disconnect switch control stage. Connect the Source of the external
MOSFET to OUT and Gate to HGATE.
Before the HGATE driver is enabled, following conditions must be achieved:
• The EN/UVLO pin voltage must be greater than the specified input high voltage.
• The CAP to VS voltage must be greater than the undervoltage lockout voltage.
• Voltage at Vs pin must be greater than Vs POR Rising thershold.
If the above conditions are not achieved, then the HGATE pin is internally connected to the OUT pin, assuring
that the external MOSFET is disabled.
For Inrush Current limiting, connect CdVdT capacitor and R1 as shown in 图 9-3.
Q1
R1
CdVdT
HGATE OUT
LM7480x-Q1
图 9-3. Inrush Current Limiting
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The CdVdT capacitor is required for slowing down the HGATE voltage ramp during power up for inrush current
limiting. Use 方程式 2 to calculate CdVdT capacitance value .
IHGATE _ DRV
CdVdT
=
xCOUT
IINRUSH
(2)
where IHATE_DRV is 55 μA (typ), IINRUSH is the inrush current and COUT is the output load capacitance. An extra
resistor, R1, in series with the CdVdT capacitor improves the turn off time.
9.3.3 Overvoltage Protection and Battery Voltage Sensing (VSNS, SW, OV)
Connect a resistor ladder as shown in 图 9-4 for overvoltage threshold programming.
VBATT
A
SNS
EN
SW
R1
LM7480x-Q1
BATT_MON
R2
OV
+
HGATE_OFF
R3
1.23 V
1.13 V
œ
图 9-4. Programming Overvoltage Threshold and Battery Sensing
A disconnect switch is integrated between VSNS and SW pins. This switch is turned OFF when EN/UVLO pin is
pulled low. This helps to reduce the leakage current through the resistor divider network during system shutdown
state (IGN_OFF state).
9.3.4 Low Iq Shutdown and Under Voltage Lockout (EN/UVLO)
The enable pin allows for the gate driver to be either enabled or disabled by an external signal. If the EN/UVLO
pin voltage is greater than the rising threshold, the gate driver and charge pump operates as described in
Charge Pump section. If EN/UVLO pin voltage is less than the input low threshold, V(ENF), the charge pump and
both the gate drivers (DGATE and HGATE) are disabled placing the LM7480x-Q1 in shutdown mode. If V(ENF)
<
V(EN/UVLO) < V(UVLOF) then only HGATE is disabled disconnecting the load from the supply, DGATE remains ON.
The EN/UVLO pin can withstand a maximum voltage of 65 V. For always ON operation connect EN/UVLO pin to
VS.
9.4 Device Functional Modes
Shutdown Mode
The LM7480x-Q1 enters shutdown mode when the EN/UVLO pin voltage is below the specified input low
threshold V(ENF). Both the gate drivers and the charge pump are disabled in shutdown mode. During shutdown
mode the LM7480x-Q1 enters low IQ operation with a total input quiescent consumption of 2.87 µA (typ). When
the LM7480x-Q1 is in shutdown mode, forward current flow to always ON loads connected to the common drain
point of the back to back MOSFETs is not interrupted but is conducted through the MOSFET's body diode.
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9.5 Application Examples
9.5.1 Redundant Supply OR-ing with Inrush Current Limiting, Overvoltage Protection and ON/OFF
Control
Q1
VIN1
D1
SMBJ36CA
CATHODE
GATE
ANODE
VCAP
LM74700-Q1
GND
EN
Q1
ON OFF
VOUT2
Q2
VIN2
VOUT1
VS
DGATE CAP VS C
D2
SMBJ36CA
HGATE
A
OUT
VSNS
SW
VS
R1
LM74800-Q1
BATT_MON
R2
EN/UVLO
ON OFF
GND
OV
R3
图 9-5. Redundant Supply OR-ing with Overvoltage Protection and ON/OFF Control
图 9-5 shows the implementation of Dual OR-ing with Inrush Current Limiting, overvoltage Protection and power
path ON/OFF control. The input side SMBJ36CA TVS across the ideal diodes is required for ISO7637 Pulse 1
transient suppression to limit the input voltage within the device max voltage rating of –65V.
R1 and R2 are the programming resistors for over voltage protection (OVP) threshold. When the voltage at OV
pin exceeds OV cut-off reference threshold then the HGATE driver turns OFF the FET Q3, disconnecting the
power path and protecting the downstream load. HGATE goes high once the OVP pin voltage goes below the
OVP falling hysteresis threshold. Use 0.1-μF to 1-μF capacitor across VS to CAP pins of the LM7480x-Q1.
This is the charge pump capacitor and acts as the supply for both the DGATE and HGATE driver stages. The
DGATE driver of the LM7480x-Q1 is equipped with 20-mA peak source current and 2.6-A peak sink current
capability resulting in fast and efficient transient responses during the ISO16750 or LV124 short interruptions as
well as AC superimpose testing.
Pull EN low during the sleep/standby mode. With EN low, both the DGATE and HGATE drivers are pulled low
turning OFF both the power FETs. VOUT1 gets disconnected from the input supply rail reducing the system IQ.
VOUT2 is gets power through the body diode of the MOSFET Q2 and this supply can be utilized for always ON
loads. The LM7480x-Q1 draws a 2.87-μA (typ) current during this mode.
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9.5.2 Ideal Diode with Unsuppressed Load Dump Protection
An extended overvoltage protection support above 65 V can be achieved by configuring the device with external
back to back MOSFETs in common source topology as shown in 图 9-6. Place a resistor R1 and a zener clamp
across VS pin to GND to limit the voltage below 65 V. The load gets protected from overvoltages transients like
un-suppressed load dumps with the help of overvoltage protection feature. Use R2 and R3 for setting the
overvoltage protection threshold. When voltage at OV pin exceeds the set OV threshold then the HGATE turns
OFF. This results in power path disconnection between input and output.
VBATT:
12V/24V
with 200V Load Dump
60V
200V
Q2
Q1
VOUT
R1
10kΩ
C
HGATE OUT A DGATE
VS
C1
1µF
D1
60V
CAP
LM74800-Q1
VSNS
SW
OV
R1
R2
EN/UVLO
ON OFF
GND
图 9-6. Ideal Diode with 200-V Unsupressed Load Dump Protection
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10 Applications and Implementation
Note
Information in the following applications sections is not part of the TI component specification, and TI
does not warrant its accuracy or completeness. TI’s customers are responsible for determining
suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
10.1 Application Information
LM7480x-Q1 controls two N-channel power MOSFETs with DGATE used to control diode MOSFET to emulate
an ideal diode and HGATE controlling second MOSFET for power path cut-off when disabled or during an
overvoltage protection. HGATE controlled MOSFET can be used to clamp the output during overvoltage or load
dump conditions. LM7480x-Q1 can be placed into low quiescent current mode using EN/UVLO, where both
DGATE and HGATE are turned OFF.
The device has a separate supply input pin (Vs). The charge pump is derived from this supply input. With the
separate supply input provision and separate GATE control architecture, the LM7480x-Q1 device offers flexibility
in system design architectures and enables circuit design with various power path control topologies like
common drain, common source, ORing and Power MUXing. With these various topologies, the system
designers can design the front-end power system to meet various system design requirements. For more
information, see the Six System Architectures With Robust Reverse Battery Protection Using an Ideal Diode
Controller Application Report.
10.2 Typical 12-V Reverse Battery Protection Application
A typical application circuit of LM74800-Q1 configured in common-drain topology to provide reverse battery
protection with overvoltage protection is shown in 图 10-1.
图 10-1. Typical Application Circuit - 12-V Reverse Battery Protection and Overvoltage Protection
10.2.1 Design Requirements for 12-V Battery Protection
The system design requirements are listed in 表 10-1.
表 10-1. Design Parameters - 12-V Reverse Battery Protection and Overvoltage Protection
DESIGN PARAMETER
EXAMPLE VALUE
12-V battery, 12-V nominal with 3.2-V Cold Crank and 35-V Load
Dump
Operating Input Voltage Range
Output Power
Output Current Range
Input Capacitance
50 W
4-A Nominal, 5-A maximum
0.1-µF minimum
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表 10-1. Design Parameters - 12-V Reverse Battery Protection and Overvoltage Protection (continued)
DESIGN PARAMETER
EXAMPLE VALUE
0.1-µF minimum, (optional 220 µF for E-10 functional class A
performance)
Output Capacitance
Overvoltage Cut-off
AC Super Imposed Test
37.0 V, output cut-off > 37.0 V
2-V Peak-Peak 30 KHz, extendable to 6-V Peak-Peak 30 KHz
ISO 7637-2, ISO 16750-2 and LV124
8:1
Automotive Transient Immunity Compliance
Battery Monitor Ratio
10.2.2 Automotive Reverse Battery Protection
The LM7480x-Q1 feature two separate gate control and driver outputs i.e DGATE and HGATE to drive back to
back N-channel MOSFETs. This enables LM7480x-Q1 to provide comprehensive immunity with robust system
protection during various automotive transient tests as per ISO 7637-2 and ISO 16750-2 standard as well as
other automotive OEM standards. For more information, see the Automotive EMC-compliant reverse-battery
protection with ideal-diode controllers article.
LM7480x-Q1 gate drive output DGATE controls MOSFET Q1 to provide reverse battery protection and true
reverse current blocking functionality. HGATE controls MOSFET Q2 to turn off the power path during input
overvoltage condition. Resistor network R1, R2 and R3 connected to OV and SW can be configured for
overvoltage protection and also for battery monitoring under normal operating conditions as well as reverse
battery conditions. Bi-directional TVS D1 clamps the automotive transient input voltages on the 12-V battery,
both positive and negative transients, to voltage levels safe for MOSFET Q1 and LM7480x-Q1.
Fast reverse current blocking response and quick reverse recovery enables LM7480x-Q1 to turn ON/OFF
MOSFET Q1 during AC super imposed input specified by ISO 16750-2 and LV124 E-06 and provide active
rectification of the AC input superimposed on DC battery voltage. Fast reverse current blocking response of
LM7480x-Q1 helps to turn off MOSFET Q1 during negative transients inputs such as –150-V 2-ms Pulse 1
specified in ISO 7637-2 and input micro short conditions such as LV124 E-10 test.
10.2.2.1 Input Transient Protection: ISO 7637-2 Pulse 1
ISO 7637-2 Pulse 1 specifies negative transient immunity of electronic modules connected in parallel with an
inductive load when the battery is disconnected. A typical pulse 1 specified in ISO 7637-2 starts with battery
disconnection where supply voltage collapses to 0 V followed by –150 V 2 ms applied with a source impedance
of 10 Ω at a slew rate of 1 µs on the supply input. LM7480x-Q1 blocks reverse current and prevents the output
voltage from swinging negative, protecting the rest of the electronic circuits from damage due to negative
transient voltage. MOSFET Q1 is quickly turned off within 0.5 µs by fast reverse comparator of LM7480x-Q1. A
single bi-directional TVS is required at the input to clamp the negative transient pulse within the operating
maximum voltage across cathode to anode of 85 V and does not violate the MOSFET Q1 drain-source
breakdown voltage rating.
ISO 7637-2 Pulse 1 performance of LM74800-Q1 is shown in 图 10-2.
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图 10-2. ISO 7637-2 Pulse 1
10.2.2.2 AC Super Imposed Input Rectification: ISO 16750-2 and LV124 E-06
Alternators are used to power the automotive electrical system and charge the battery during normal runtime of
the vehicle. Rectified alternator output contains residual AC ripple voltage superimposed on the DC battery
voltage due to various reasons which includes engine speed variation, regulator duty cycle with field switching
ON/OFF and electrical load variations. On a 12-V battery supply, alternator output voltage is regulated by a
voltage regulator between 14.5 V to 12.5 V by controlling the field current of alternator's rotor. All electronic
modules are tested for proper operation with superimposed AC ripple on the DC battery voltage. AC super
imposed test specified in ISO 16750-2 and LV124 E-06 requires AC ripple of 2-V Peak-Peak on a 13.5-V DC
battery voltage, swept from 15 Hz to 30 KHz. LM7480x-Q1 rectifies the AC superimposed voltage by turning the
MOSFET Q1 OFF quickly to cut-off reverse current and turning the MOSFET Q1 ON quickly during forward
conduction. Active rectification of 2-V peak-peak 5-KHz AC input by LM7480x-Q1 is shown in 图 10-3. Fast turn
off and quick turn ON of the MOSFET reduces power dissipation in the MOSFET Q1 and active rectification
reduces power dissipation in the output hold-up capacitor's ESR by half. Active rectification of 2-V peak-peak 30-
KHz AC input is shown in 图 10-4.
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图 10-3. AC Super Imposed Test - 2-V Peak-Peak 5 图 10-4. AC Super Imposed Test - 2-V Peak-Peak 30
KHz
KHz
10.2.2.3 Input Micro-Short Protection: LV124 E-10
E-10 test specified in LV124 standard checks for immunity of electronic modules to short interruptions in power
supply input due to contact issues or relay bounce. During this test (case 2), micro-short is applied on the input
for a duration as low as 10 µs to several ms. For a functional pass status A, electronic modules are required to
run uninterrupted during the E-10 test (case 2) with 100-µs duration. Dual-Gate drive architecture of LM7480x-
Q1 - DGATE and HGATE - enables to achieve a functional pass status A with optimum hold up capacitance on
the output when compared to a single gate drive controller. When input micro-short is applied for 100 µs,
LM7480x-Q1 quickly turns off MOSFET Q1 by shorting DGATE to ANODE (source of MOSFET) within 0.5µs to
prevent the output from discharging and the HGATE remains ON keeping MOSFET Q2 ON, enabling fast
recovery after the input short is removed.
Performance of LM74800-Q1 during E10 input power supply interruption test case 2 is shown in 图 10-5. After
the input short is removed, input voltage recovers and MOSFET Q1 is turned back ON within 130 µs. Note that
dual-gate drive topology allows MOSFET Q2 to remain ON during the test and helps in restoring the input power
faster. Output voltage remains unperturbed during the entire duration, achieving functional status A.
图 10-5. Input Micro-Short - LV124 E10 TC 2 100 µs 图 10-6. Input Micro-Short - LV124 E10 TC 2 100 µs
with HGATE
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10.2.3 Detailed Design Procedure
10.2.3.1 Design Considerations
表 10-1 summarizes the design parameters that must be known for designing an automotive reverse battery
protection circuit with overvoltage cut-off. During power up, inrush current through MOSFET Q2 needs to be
limited so that the MOSFET operates well within its SOA. Maximum load current, maximum ambient temperature
and thermal properties of the PCB determine the RDSON of the MOSFET Q2 and maximum operating voltage
determines the voltage rating of the MOSFET Q2. Selection of MOSFET Q2 is determined mainly by the
maximum operating load current, maximum ambient temperature, maximum frequency of AC super imposed
voltage ripple and ISO 7637-2 pulse 1 requirements. overvoltage threshold is decided based on the rating of
downstream DC/DC converter or other components after the reverse battery protection circuit. A single bi-
directional TVS or two back-back uni-directional TVS are required to clamp input transients to a safe operating
level for the MOSFETs Q1, Q2 and LM7480x-Q1.
10.2.3.2 Charge Pump Capacitance VCAP
Minimum required capacitance for charge pump VCAP is based on input capacitance of the MOSFET Q1,
CISS(MOSFET_Q1)and input capactiance of Q2 CISS(MOSFET)
.
Charge Pump VCAP: Minimum 0.1 µF is required; recommended value of VCAP (µF) ≥ 10 x ( CISS(MOSFET_Q1)
+ CISS(MOSFET_Q2) ) (µF)
10.2.3.3 Input and Output Capacitance
A minimum input capacitance CIN of 0.1 µF and output capacitance COUT of 0.1 µF is recommended.
10.2.3.4 Hold-Up Capacitance
Usually bulk capacitors are placed on the output due to various reasons such as uninterrupted operation during
power interruption or micro-short at the input, hold-up requirements for doing a memory dump before turning of
the module and filtering requirements as well. This design considers minimum bulk capacitors requirements for
meeting functional status "A" during LV124 E10 test case 2 100-µs input interruption. To achieve functional pass
status A, acceptable voltage droop in the output of LM7480x-Q1 is based on the UVLO settings of downstream
DC-DC converters. For this design, 2.5-V drop in output voltage for 100 µs is considered and the minimum hold-
up capacitance required is calculated by
(3)
Minimum hold-up capacitance required for 2.5-V drop in 100 µs is 200 µF. Note that the typical application circuit
shows the hold-up capacitor as optional because not all designs require hold-up capacitance.
10.2.3.5 Overvoltage Protection and Battery Monitor
Resistors R1, R2 and R3 connected in series are used to program the overvoltage threshold and battery monitor
ratio. The resistor values required for setting the overvoltage threshold VOV to 37.0 V and battery monitor ratio
VBATT_MON : VBATT to 1:8 are calculated by solving Equation 3 and Equation 4.
(4)
(5)
For minimizing the input current drawn from the battery through resistors R1, R2 and R3, it recommended to use
higher value of resistance. Using high value resistors will add error in the calculations because the current
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through the resistors at higher value will become comparable to the leakage current into the OV pin. Maximum
leakage current into the OV pin is 1 µA and choosing (R1 + R2 + R3) < 120 kΩ ensures current through resistors
is 100 times greater than leakage through OV pin.
Based on the device electrical characteristics, VOVR is 1.23 V and battery monitor ratio (VBATT_MON / VBATT) is
designed for a ratio of 1/8. To limit (R1 + R2 + R3) < 120 kΩ, select (R1 + R2) = 100 kΩ. Solving Equation 3 gives
R3 = 3.45 kΩ. Solving Equation 4 for R2 using (R1 + R2) = 100 kΩ and R3 = 3.45 kΩ, gives R2 = 9.48 kΩ and
R1 = 90.52 kΩ.
Standard 1% resistor values closest to the calculated resistor values are R1 = 90.9 kΩ, R2 = 9.09 kΩ and R3 =
3.48 kΩ.
10.2.4 MOSFET Selection: Blocking MOSFET Q1
For selecting the blocking MOSFET Q1, important electrical parameters are the maximum continuous drain
current ID, the maximum drain-to-source voltage VDS(MAX), the maximum drain-to-source voltage VGS(MAX), the
maximum source current through body diode and the drain-to-source ON resistance RDSON
.
The maximum continuous drain current, ID, rating must exceed the maximum continuous load current.
The maximum drain-to-source voltage, VDS(MAX), must be high enough to withstand the highest differential
voltage seen in the application. This would include all the automotive transient events and any anticipated fault
conditions. It is recommended to use MOSFETs with VDS voltage rating of 60 V along with a single bidirectional
TVS or a VDS rating 40-V maximum rating along with two unidirectional TVS connected back-back at the input.
The maximum VGS LM7480x-Q1 can drive is 14 V, so a MOSFET with 15-V minimum VGS rating should be
selected. If a MOSFET with < 15-V VGS rating is selected, a zener diode can be used to clamp VGS to safe level,
but this would result in increased IQ current.
To reduce the MOSFET conduction losses, lowest possible RDS(ON) is preferred, but selecting a MOSFET based
on low RDS(ON) may not be beneficial always. Higher RDS(ON) will provide increased voltage information to
LM7480x-Q1's reverse comparator at a lower reverse current. Reverse current detection is better with increased
RDS(ON). Choosing a MOSFET with < 50-mV forward voltage drop at maximum current is a good starting point.
For active rectification of AC super imposed ripple on the battery supply voltage, gate-source charge QGS of Q1
must be selected to meet the required AC ripple frequency. Maximum gate-source charge QGS (at 4.5-V VGS) for
active rectification every cycle is
1.3mA
QGS_MAX
=
FAC_RIPPLE
(6)
Where 1.3 mA is minimum charge pump current at 7-V VDGATE-VA, FAC_RIPPLE is frequency of the AC ripple
superimposed on the battery and QGS_MAX is the QGS value specified in manufacturer datasheet at 6-V VGS. For
active rectification at FAC_RIPPLE = 30 KHz, QGS_MAX = 43 nC.
Based on the design requirements, BUK7Y4R8-60E MOSFET is selected and its ratings are:
• 60-V VDS(MAX) and ±20-V VGS(MAX)
• RDS(ON) 5.0-mΩ typical at 5-V VGS and 2.9-mΩ rated at 10-V VGS
• MOSFET QGS 17.4 nC
Thermal resistance of the MOSFET should be considered against the expected maximum power dissipation in
the MOSFET to ensure that the junction temperature (TJ) is well controlled.
10.2.5 MOSFET Selection: Hot-Swap MOSFET Q2
The VDS rating of the MOSFET Q2 should be sufficient to handle the maximum system voltage along with the
input transient voltage. For this 12-V design, transient overvoltage events are during suppressed load dump 35
V 400 ms and ISO 7637-2 pulse 2 A 50 V for 50 µs. Further, ISO 7637-2 Pulse 3B is a very fast repetitive pulse
of 100 V 100 ns that is usually absorbed by the input and output ceramic capacitors and the maximum voltage
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on the 12-V battery can be limited to < 40 V the minimum recommended input capacitance of 0.1 µF. The 50-V
SO 7637-2 Pulse 2 A can also be absorbed by input and output capacitors and its amplitude could be reduced to
40-V peak by placing sufficient amount of capacitance at input and output. However for this 12-V design,
maximum system voltage is 50 V and a 60-V VDS rated MOSFET is selected.
The VGS rating of the MOSFET Q2 should be higher than that maximum HGATE-OUT voltage 15 V.
Inrush current through the MOSFET during input hot-plug into the 12-V battery is determined by output
capacitance. External capacitor on HGATE, CDVDT is used to limit the inrush current during input hot-plug or
startup. The value of inrush current determined by 方程式 2 need to be selected to ensure that the MOSFET Q2
is operating well within its safe operating area (SOA). To limit inrush current to 250 mA, value of CDVDT is 10.43
nF, closest standard value of 10.0 nF is chosen.
Duration of inrush current is calculated by
(7)
Calculated inrush current duration is 2.36 ms with 250-mA inrush current.
MOSFET BUK7Y4R8-60E having 60-V VDS and ±20-V VGS rating is selected for Q2. Power dissipation during
inrush is well within the MOSFET's safe operating area (SOA).
10.2.6 TVS Selection
A 600-W SMBJ TVS such as SMBJ33CA is recommended for input transient clamping and protection. For
detailed explanation on TVS selection for 12-V battery systems, refer to TVS Selection for 12-V Battery Systems.
10.2.7 Application Curves
图 10-7. Startup 12 V with EN Pulled to VIN
图 10-8. Startup 12 V showing Charge Pump VCAP
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图 10-9. Reverse Input Voltage –14 V
图 10-11. Inrush Current with no Load at Output
图 10-13. Hot-Plug into 12 V
图 10-10. Reverse Input Voltage –14 V for 60 s
图 10-12. Inrush Current with 60-Ω Load
图 10-14. Output Turn ON with Enable
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图 10-15. DGATE Turn ON with Enable
图 10-16. Turn ON with VCAP ON - EN rising from
0.8 V
图 10-17. Turn OFF with Enable Control
图 10-18. Overvoltage Protection
图 10-19. Overvoltage Recovery
图 10-20. Turn ON delay - HGATE
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图 10-21. Turn OFF Delay - DGATE
图 10-22. Turn OFF Delay - HGATE
图 10-23. Load Transient 100 mA to 5 A
图 10-24. Startup 1-A Load 1 ms After Output
Powers Up
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10.3 200-V Unsuppressed Load Dump Protection Application
Independent gate drive topology of LM74800-Q1 enables to configure the LM74800-Q1 in to provide
unsuppressed load dump or surge protection along with reverse battery protection. LM74800-Q1 configured in
common-source topology to provide 200-V unsuppressed load dump protection with reverse battery protection
is 图 10-25.
Q2
60V
Q1
200V
VBATT (200V Load Dump)
VOUT
CA
1µF
D3
SMBJ150A
CIN
R1
10kΩ
D2
85V
VOUT
CLOAD
47 µF
D1
60V
0.1µF
HGATE
DGATE
A
C
OUT
VS
D4
SMBJ33CA
CVS
1µF
CCAP
0.1µF
CAP
VSNS
SW
LM74800-Q1
OV Cut-Off
VOUT
Output Clamp
R2
R3
100 kΩ
EN/UVLO
ON OFF
OV
GND
3.48 kΩ
图 10-25. Typical Application Circuit - 200-V Unsuppressed Load Dump Protection with Reverse Battery
Protection
10.3.1 Design Requirements for 200-V Unsuppressed Load Dump Protection
表 10-2. Design Parameters - 24-V Unsuppressed Load Dump Protection
DESIGN PARAMETER
Operating Input Voltage Range
Output Voltage
EXAMPLE VALUE
24-V battery, 6 V during cold crank 200-V unsuppressed load lump
6 V during cold crank and 37.0 V during load dump
25 W
Output Power
Output Current Range
Input Capacitance
2-A Nominal, 2.5-A Peak
0.1-µF minimum
Output Capacitance
Overvoltage Cut-Off Threshold
Overvoltage Clamp
0.1-µF minimum, 220-µF typical hold-up capacitance
37.0 V
Output clamped between 34.5 V and 37.5 V
ISO 7637-2 and ISO 16750-2 including 200-V unsuppressed load
Automotive Transient Immunity Compliance
dump Pulse 5 A and –600-V 50-Ω ISO-7637 Pulse 1
10.3.2 Design Procedure
Load dump transients occurs on loads connected to the alternator when a discharged battery is disconnected
from alternator while it is still generating charging current. Load dump amplitude and duration depends on
alternator speed and field current into the rotor. The pulse shape and parameter are specified in ISO 7637-2 5A
where a 200-V pulse lasts maximum 350 ms on 24-V battery system. Circuit topology and MOSFET ratings are
important when designing a 200-V unsuppressed load dump protection circuit using LM74800-Q1. Dual gate
drive enables LM74800-Q1 to be configured in common source topology in 图 10-25 where MOSFET Q1 is used
to turn off or clamp output voltage to acceptable safe level and protect the MOSFET Q2 and LM74800-Q1 from
200 V. Note that only the VS pin is exposed to 200 V through a 10-kΩ resistor. A 60-V rated zener diode is used
to clamp and protect the VS pin. Rest of the circuit is not exposed to higher voltage as the MOSFET Q1 can
either be turned off completely or output voltage clamped to safe level. MOSFET Q1 selection, input TVS
selection and MOSFET Q2 selection for ISO 7637-2 and ISO 16750-2 compliance are discussed in this section.
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10.3.2.1 Charge Pump Capacitance VCAP
Minimum required capacitance for charge pump VCAP is based on input capacitance of the MOSFET Q1,
CISS(MOSFET_Q1)and input capactiance of Q2 CISS(MOSFET_Q2)
.
Charge Pump VCAP: Minimum 0.1 µF is required; recommended value of VCAP (µF) ≥ 10 x ( CISS(MOSFET_Q1)
+ CISS(MOSFET_Q2) ) (µF)
10.3.2.2 Input and output capacitance
A minimum input capacitance CIN of 0.1 µF and output capacitance COUT of 0.1 µF is recommended.
10.3.2.3 VS Capacitance, Resistor and Zener Clamp
Minimum of 1-µF CVS capacitance is required. During 200-V load dump, resistor R1 and zener diode D1 are used
to protect VS pin from exceeding the maximum ratings by clamping VVS to 60 V. Choosing R1 = 10 kΩ, the peak
power dissipated in zener diode D1 = 60 V * (200 V - 60 V) / 10 kΩ = 0.840 W of peak power dissipation. SMA
package diode such as BZG03B62-M can handle 840mW peak power dissipation. Peak power dissipated in R1
= (200 V - 60 V)2 / 10 kΩ = 1.96 W. One 10-kΩ resistor in 1210 package with 0.5-W DC power rating and 200-V
rating can withstand 200 Load Dump for 350 ms.
10.3.2.4 Overvoltage Protection and Output Clamp
Resistors R2 and R3 connected in series is used to program the overvoltage threshold. Connecting R2 to VBATT
provides overvoltage cut-off and switching the connection to VOUT provides overvoltage clamp. The resistor
values required for setting the overvoltage threshold VOV to 37.0 V is calculated by solving Equation 7.
(8)
For minimizing the input current drawn from the battery through resistors R2 and R3, it recommended to use
higher value of resistance. Using high value resistors will add error in the calculations because the current
through the resistors at higher value will become comparable to the leakage current into the OV pin. Maximum
leakage current into the OV pin is 1 µA and choosing (R2 + R3) < 120 kΩ ensures current through resistors is
100 times greater than leakage through OV pin.
Based on the device electrical characteristics, VOVR is 1.233V V. To limit (R2 + R3) < 120 kΩ, select (R2) = 100
kΩ. Solving Equation 7 gives R3 = 3.45 kΩ.
Closest standard 1% resistor values are R2 = 100 kΩ and R3 = 3.48 kΩ.
10.3.2.5 MOSFET Q1 Selection
The VDS rating of the MOSFET Q1 should be minimum 200 V for a output cutoff design where output can reach
0 V while the load dump transient is present and should be a minimum of 164.5 V when output is clamped to 37
V (±1.5 V). The VGS rating is based on HGATE-OUT maximum voltage of 15 V. A 20-V VGS rated MOSFET is
recommended.
Power dissipation on MOSFET Q1 on a design where output is clamped is critical and SOA characteristics of the
MOSFET need to be considered with sufficient design margin for reliable operation.
10.3.2.6 Input TVS Selection
Two TVS diodes D3 and D4 are required at the input. The breakdown voltage of TVS in the positive side should
be higher than the maximum system voltage 200 V. On the negative side clamping, diode D4 is used to clamp
ISO 7637-2 pulse 1 and its selection is similar to procedure in TVS selection for 24-V Battery Systems.
SMBJ150A for D3 and SMBJ33CA for D4 are recommended.
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10.3.2.7 MOSFET Q2 Selection
Design requirements for selecting Q2 is similar to MOSFET Q1 selection in 表 10-1 and hence the procedure for
selecting MOSFET Q2 is same as outlined in MOSFET Selection: Blocking MOSFET Q1. MOSFET
BUK7Y4R8-60E is selected based on the design requirements.
10.3.3 Application Curves
图 10-26. Unsuppressed Load Dump 200 V - Output 图 10-27. Unsuppressed Load Dump 200 V - Output
Clamp
Cut-off
图 10-28. ISO 7637-2 Pulse 1 –600 V 50 Ω
图 10-29. ISO 7637-2 Pulse 1 –600 V 50 Ω
图 10-30. Power up 12 V - HGATE and Output
图 10-31. Power up 12 V - DGATE and A
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图 10-32. Power up 12 V - Charge Pump VCAP
图 10-33. Power up 12 V - DGATE and HGATE
10.4 Do's and Don'ts
Leave exposed pad (RTN) of the IC floating. Do not connect it to the GND plane. Connecting RTN to GND
disables the Reverse Polarity protection feature.
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11 Power Supply Recommendations
11.1 Transient Protection
When the external MOSFETs turn OFF during the conditions such as overvoltage cut-off, reverse current
blocking, EN/UVLO causing an interruption of the current flow, the input line inductance generates a positive
voltage spike on the input and output inductance generates a negative voltage spike on the output. The peak
amplitude of voltage spikes (transients) depends on the value of inductance in series to the input or output of the
device. These transients can exceed the Absolute Maximum Ratings of the device if steps are not taken to
address the issue.
Typical methods for addressing transients include:
• Minimizing lead length and inductance into and out of the device.
• Using large PCB GND plane.
• Use of a Schottky diode across the output and GND to absorb negative spikes.
• A low value ceramic capacitor (C(IN) to approximately 0.1 μF) to absorb the energy and dampen the
transients.
The approximate value of input capacitance can be estimated with Equation 8.
L IN
( )
Vspike Absolute = V IN + I Load
( ) )
´
(
)
(
C IN
( )
(9)
where
• V(IN) is the nominal supply voltage
• I(LOAD) is the load current
• L(IN) equals the effective inductance seen looking into the source
• C(IN) is the capacitance present at the input
Some applications may require additional Transient Voltage Suppressor (TVS) to prevent transients from
exceeding the Absolute Maximum Ratings of the device. These transients can occur during EMC testing such as
automotive ISO7637 pulses.
The circuit implementation with optional protection components (a ceramic capacitor, TVS and schottky diode) is
shown in 图 11-1
Q1
Q2
VOUT
VIN
CVS
CVCAP
*
*
COUT
CIN
D2
D1
HGATE OUT
DGATE
A
C
VS CAP
VSNS
SW
R1
BATT_MON
R2
LM7480x-Q1
GND
EN/UVLO
ON OFF
OV
R3
* Optional components needed for suppression of transients
图 11-1. Circuit Implementation with Optional Protection Components for LM7480x-Q1
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11.2 TVS Selection for 12-V Battery Systems
In selecting the TVS, important specifications are breakdown voltage and clamping voltage. The breakdown
voltage of the TVS+ should be higher than 24-V jump start voltage and 35-V suppressed load dump voltage and
less than the maximum ratings of LM7480x-Q1 (65 V). The breakdown voltage of TVS- should be beyond than
maximum reverse battery voltage –16 V, so that the TVS- is not damaged due to long time exposure to reverse
connected battery.
Clamping voltage is the voltage the TVS diode clamps in high current pulse situations and this voltage is much
higher than the breakdown voltage. In the case of an ISO 7637-2 pulse 1, the input voltage goes up to –150 V
with a generator impedance of 10 Ω. This translates to 15 A flowing through the TVS - and the voltage across
the TVS would be close to its clamping voltage.
The next criterion is that the absolute maximum rating of cathode to anode voltage of the LM7480x-Q1 (85 V)
and the maximum VDS rating MOSFET are not exceeded. In the design example, 60-V rated MOSFET is chosen
and maximum limit on the cathode to anode voltage is 60 V.
During ISO 7637-2 pulse 1, the anode of LM7480x-Q1 is pulled down by the ISO pulse, clamped by TVS- and
the MOSFET Q1 is turned off quickly to prevent reverse current from discharging the bulk output capacitors.
When the MOSFET turns off, the cathode to anode voltage seen is equal to (TVS Clamping voltage + Output
capacitor voltage). If the maximum voltage on output capacitor is 16 V (maximum battery voltage), then the
clamping voltage of the TVS- should not exceed, (60 V – 16) V = –44 V.
The SMBJ33CA TVS diode can be used for 12-V battery protection application. The breakdown voltage of 36.7
V meets the jump start, load dump requirements on the positive side and 16-V reverse battery connection on the
negative side. During ISO 7637-2 pulse 1 test, the SMBJ33CA clamps at –44 V with 12 A of peak surge current
as shown in and it meets the clamping voltage ≤ 44 V.
SMBJ series of TVS' are rated up to 600-W peak pulse power levels and are sufficient for ISO 7637-2 pulses.
11.3 TVS Selection for 24-V Battery Systems
For 24-V battery protection application, the TVS and MOSFET in 图 10-1 needs to be changed to suit 24-V
battery requirements.
The breakdown voltage of the TVS+ should be higher than 48-V jump start voltage, less than the absolute
maximum ratings of anode and enable pin of LM7480x-Q1 (70 V) and should withstand 65-V suppressed load
dump. The breakdown voltage of TVS- should be lower than maximum reverse battery voltage –32 V, so that
the TVS- is not damaged due to long time exposure to reverse connected battery.
During ISO 7637-2 pulse 1, the input voltage goes up to –600 V with a generator impedance of 50 Ω. This
translates to 12-A flowing through the TVS-. The clamping voltage of the TVS- cannot be same as that of 12-V
battery protection circuit. Because during the ISO 7637-2 pulse, the Anode to Cathode voltage seen is equal to
(- TVS Clamping voltage + Output capacitor voltage). For 24-V battery application, the maximum battery voltage
is 32 V, then the clamping voltage of the TVS- should not exceed, 85 V – 32 V = 53 V.
Single bi-directional TVS cannot be used for 24-V battery protection because breakdown voltage for TVS+ ≥
65V, maximum clamping voltage is ≤ 53 V and the clamping voltage cannot be less than the breakdown
voltage. Two un-directional TVS connected back-back needs to be used at the input. For positive side TVS+,
SMBJ58A with the breakdown voltage of 64.4 V (minimum), 67.8 (typical) is recommended. For the negative
side TVS-, SMBJ28A with breakdown voltage close to 32 V (to withstand maximum reverse battery voltage –32
V) and maximum clamping voltage of 42.1 V is recommended.
For 24-V battery protection, a 75-V rated MOSFET is recommended to be used along with SMBJ28A and
SMBJ58A connected back-back at the input.
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12 Layout
12.1 Layout Guidelines
• For the ideal diode stage, connect A, DGATE and C pins of LM7480x-Q1 close to the MOSFET's SOURCE,
GATE and DRAIN pins.
• For the load disconnect stage, connect HGATE and OUT pins of LM7480x-Q1 close to the MOSFET's GATE
and SOURCE pins.
• The high current path of for this solution is through the MOSFET, therefore it is important to use thick and
short traces for source and drain of the MOSFET to minimize resistive losses.
• The DGATE pin of the LM7480x-Q1 must be connected to the MOSFET GATE with short trace.
• Place transient suppression components close to LM7480x-Q1.
• Place the decopuling capacitor, CVS close to VS pin and chip GND.
• The charge pump capacitor across CAP and VS pins must be kept away from the MOSFET to lower the
thermal effects on the capacitance value.
• Obtaining acceptable performance with alternate layout schemes is possible, however the layout shown in
the Layout Example is intended as a guideline and to produce good results.
12.2 Layout Example
S
D
D
D
D
S
Q1
Q2
S
G
VIN PLANE
DGTE
C
CAP
VS
A
CCAP
VOUT PLANE
VSNS
OUT
HGATE
GND
SW
OV
CVS
D1
COUT
EN/
UVLO
GND PLANE
图 12-1. PCB Layout Example for Common Drain Configuration
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D
D
D
D
G
Q2
Q1
VOUT PLANE
VIN PLANE
S
DGAT
E
C
CAP
VS
A
CCAP
VSNS
OUT
HGATE
GND
SW
D1
CVS
COUT
OV
EN/
UVLO
GND PLANE
图 12-2. PCB Layout Example for Common Source Configuration
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Product Folder Links: LM7480-Q1
LM7480-Q1
ZHCSL09C – APRIL 2020 – REVISED DECEMBER 2020
www.ti.com.cn
13 Device and Documentation Support
13.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
13.2 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
13.3 Trademarks
TI E2E™ is a trademark of Texas Instruments.
所有商标均为其各自所有者的财产。
13.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
13.5 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
14 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
Copyright © 2021 Texas Instruments Incorporated
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37
Product Folder Links: LM7480-Q1
PACKAGE OPTION ADDENDUM
www.ti.com
25-Jan-2021
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
LM74800QDRRRQ1
LM74801QDRRRQ1
ACTIVE
ACTIVE
WSON
WSON
DRR
DRR
12
12
3000 RoHS & Green
3000 RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
Level-2-260C-1 YEAR
-40 to 125
-40 to 125
L74800
L74801
NIPDAU
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
25-Jan-2021
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
3-Jun-2022
TAPE AND REEL INFORMATION
REEL DIMENSIONS
TAPE DIMENSIONS
K0
P1
W
B0
Reel
Diameter
Cavity
A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
Overall width of the carrier tape
W
P1 Pitch between successive cavity centers
Reel Width (W1)
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE
Sprocket Holes
Q1 Q2
Q3 Q4
Q1 Q2
Q3 Q4
User Direction of Feed
Pocket Quadrants
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
LM74800QDRRRQ1
LM74801QDRRRQ1
WSON
WSON
DRR
DRR
12
12
3000
3000
330.0
330.0
12.4
12.4
3.3
3.3
3.3
3.3
1.1
1.1
8.0
8.0
12.0
12.0
Q2
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
3-Jun-2022
TAPE AND REEL BOX DIMENSIONS
Width (mm)
H
W
L
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SPQ
Length (mm) Width (mm) Height (mm)
LM74800QDRRRQ1
LM74801QDRRRQ1
WSON
WSON
DRR
DRR
12
12
3000
3000
367.0
367.0
367.0
367.0
35.0
35.0
Pack Materials-Page 2
PACKAGE OUTLINE
WSON - 0.8 mm max height
PLASTIC QUAD FLAT PACK- NO LEAD
DRR0012E
3.1
2.9
A
B
3.1
2.9
PIN 1 INDEX AREA
0.100 MIN
(0.130)
SECTION A-A
TYPICAL
0.8
0.7
C
SEATING PLANE
0.08 C
0.05
0.00
1.4
1.2
SYMM
(0.2) TYP
(0.43) TYP
6
10X 0.5
7
A
A
SYMM
2X
2.6
2.4
2.5
13
1
12
0.3
0.2
12X
PIN 1 ID
(OPTIONAL)
0.52
0.32
12X
0.1
C A B
C
0.05
4224874/B 03/2019
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for optimal thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
WSON - 0.8 mm max height
DRR0012E
PLASTIC QUAD FLAT PACK- NO LEAD
2X (2.78)
(1.3)
12X (0.62)
12X (0.25)
1
12
10X (0.5)
SYMM
(2.5)
13
2X
(2.5)
2X
(1)
(R0.05)
TYP
7
6
SYMM
(Ø0.2) VIA
TYP
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE: 20X
0.07 MAX
0.07 MIN
ALL AROUND
ALL AROUND
METAL UNDER
SOLDER MASK
METAL
EXPOSED
METAL
EXPOSED
METAL
SOLDER MASK
OPENING
SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK DETAILS
4224874/B 03/2019
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
www.ti.com
EXAMPLE STENCIL DESIGN
WSON - 0.8 mm max height
DRR0012E
PLASTIC QUAD FLAT PACK- NO LEAD
2X (2.78)
12X (0.62)
12X (0.25)
2X (1.21)
13
1
12
2X
(1.1)
10X (0.5)
SYMM
2X
(2.5)
(R0.05)
TYP
2X
(0.65)
7
6
SYMM
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
EXPOSED PAD
82% PRINTED COVERAGE BY AREA
SCALE: 20X
4224874/B 03/2019
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
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