CDCEL824PWR [TI]
具有展频功能的可编程 2-PLL 时钟合成器 | PW | 16 | -40 to 85;型号: | CDCEL824PWR |
厂家: | TEXAS INSTRUMENTS |
描述: | 具有展频功能的可编程 2-PLL 时钟合成器 | PW | 16 | -40 to 85 时钟 |
文件: | 总33页 (文件大小:2205K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
CDCEL824 可编程 2 PLL 时钟合成器
1 特性
2 应用
激光测距应用
1
•
灵活的时钟驱动器
–
3 个用户定义的控制输入 [S0/S1/S2]:例如,开
关频率、输出使能或断电
3 说明
CDCEL824 是一款基于锁相环 (PLL) 的模块化、低成
本、高性能可编程时钟合成器/乘法器/除法器。 该器件
最多可从单输入频率中生成四个输出时钟。 在系统内
最多可使用两个独立可配置 PLL 在任何时钟频率下
(最高可达 201MHz)对各输出进行编程。
–
启用 0-PPM 时钟生成
•
•
系统内可编程性和 EEPROM
–
–
串行可编程易失性寄存器
非易失性 EEPROM 以存储客户设置
灵活的输入计时理念
–
–
外部晶振:20MHz 至 30MHz
CDCEL824 具备一个独立的输出电源引脚 VDDOUT,其
电压为 1.8V。
单端低电压互补金属氧化物半导体 (LVCMOS)
高达 130MHz
此输入接受一个外部晶振或 LVCMOS 时钟信号。 对
于晶振输入,片上负载电容足以满足大多数应用的要
求。 负载电容值可在 0pF 至 20pF 的范围内设定。
•
•
高达 201MHz 的可选输出频率
低噪声 PLL 内核
–
–
集成了 PLL 环路滤波器组件
低周期抖动(典型值为 80ps)
器件信息(1)
•
•
•
1.8V 器件电源
部件号
CDCEL824
封装
封装尺寸(标称值)
TSSOP (16)
5.00mm x 4.40mm
温度范围:–40°C 至 85°C
采用薄型小外形尺寸 (TSSOP) 封装
(1) 要了解所有可用封装,请见数据表末尾的可订购产品附录。
典型电路原理图
Ethernet PHY
CDCEL824
WiFi
25 MHz
USB Controller
FPGA
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
English Data Sheet: SCAS945
CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
www.ti.com.cn
目录
9.2 Functional Block Diagram ......................................... 9
9.3 Feature Description................................................. 10
9.4 Device Functional Modes........................................ 12
9.5 Programming........................................................... 13
9.6 Register Maps......................................................... 15
10 Application and Implementation........................ 22
10.1 Application Information.......................................... 22
10.2 Typical Application ............................................... 22
11 Power Supply Recommendations ..................... 24
12 Layout................................................................... 24
12.1 Layout Guidelines ................................................. 24
12.2 Layout Example .................................................... 25
13 器件和文档支持 ..................................................... 26
13.1 文档支持 ............................................................... 26
13.2 社区资源................................................................ 26
13.3 商标....................................................................... 26
13.4 静电放电警告......................................................... 26
13.5 Glossary................................................................ 26
14 机械、封装和可订购信息....................................... 26
1
2
3
4
5
6
7
特性.......................................................................... 1
应用.......................................................................... 1
说明.......................................................................... 1
修订历史记录 ........................................................... 2
说明(续)............................................................... 2
Pin Configuration and Functions......................... 3
Specifications......................................................... 4
7.1 Absolute Maximum Ratings ...................................... 4
7.2 ESD Ratings.............................................................. 4
7.3 Recommended Operating Conditions....................... 4
7.4 Thermal Information.................................................. 5
7.5 Electrical Characteristics .......................................... 6
7.6 CLK_IN Timing Requirements .................................. 7
7.7 SDA/SCL Timing Requirements .............................. 7
7.8 EEPROM Specification ............................................. 7
7.9 Typical Characteristics.............................................. 7
Parameter Measurement Information .................. 8
Detailed Description .............................................. 9
9.1 Overview ................................................................... 9
8
9
4 修订历史记录
注:之前版本的页码可能与当前版本有所不同。
Changes from Original (June 2015) to Revision A
Page
•
•
•
已更改 “产品定制”至“产品目录数据表”.................................................................................................................................... 1
Changed order of pin function rows to be by number per format rules ................................................................................. 3
Changed Thermal Information table format; move EEPROM Spec table per format rules ................................................... 5
5 说明(续)
例如,深 M/N 分频比可从 27MHz 基准输入频率中生成零 ppm 音频/视频、网络互联(无线局域网 (WLAN)、
Bluetooth、以太网、全球定位系统 (GPS))或接口(通用串行总线 (USB)、IEEE1394、记忆棒)时钟。
该器件会根据 PLL 频率和分频器设置自动调整内部环路滤波器组件,从而使各 PLL 具备较高稳定性和优化的抖动
传输特性。
为了轻松实现器件自定义来满足应用需要,该器件支持使用非易失性 EEPROM 进行编程。 该器件预设为采用默认
出厂配置,允许在安装于印刷电路板 (PCB) 前按照另一种应用配置重新编程,或者通过系统内部编程进行重新编
程。 所有器件设置均可通过串行数据/串行时钟 (SDA/SCL) 总线(一种二线制串行接口)进行编程。
三个可自由编程的控制输入(S0、S1 和 S2)可用于选择不同频率或其他控制功能,包括将输出禁用为低电平、在
高阻抗状态下输出、断电以及 PLL 旁路等。
CDCx824 可在 1.8V 电压的作用下运行,其运行温度范围为 –40°C 至 85°C。
2
Copyright © 2015, Texas Instruments Incorporated
CDCEL824
www.ti.com.cn
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
6 Pin Configuration and Functions
PW Package
20-Pin TSSOP
Top View
Xin/Clk 1
S0 2
16 Xout
15 S1/SDA
14 S2/SCL
13 DNC
12 GND
11 Y1
Vdd 3
Vctr 4
GND 5
Vddout 6
Y3 7
10 Y2
Y4 8
9 Vddout
Pin Functions
PIN
I/O
DESCRIPTION
NUMBER
NAME
Xin/CLK
S0
1
I
Crystal oscillator input or LVCMOS clock Input (selectable via SDA/SCL bus).
2
I
User-programmable control input S0; LVCMOS inputs; internal pullup.
1.8-V power supply for the device
VCXO control voltage (leave open or pull up when not used).
Ground
3
VDD
Power
4
VCtrl
I
5, 12
6, 9
7
GND
VDDOUT
Y3
Ground
Power
1.8-V supply for all outputs
O
O
O
O
O
LVCMOS outputs
8
Y4
LVCMOS outputs
10
11
13
Y2
LVCMOS outputs
Y1
LVCMOS outputs
DNC
Reserved pin, do not connect
SCL: Serial clock input (default configuration), LVCMOS; internal pullup.
S2: User-programmable control input; LVCMOS inputs; internal pullup.
14
SCL/S2
I
SDA: Bidirectional serial data input/output (default configuration), LVCMOS; internal pullup
S1: User-programmable control input; LVCMOS inputs; internal pullup.
15
16
SDA/S1
Xout
I/O or I
O
Crystal oscillator output (leave open or pull up when not used).
Copyright © 2015, Texas Instruments Incorporated
3
CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
www.ti.com.cn
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN
–0.5
–0.5
–0.5
MAX
2.5
UNIT
V
VDD
VI
Supply voltage range
Input voltage range(2) (3)
Output voltage range(2)
Input current (VI < 0, VI > VDD
Continuous output current
VDD + 0.5
VDD + 0.5
20
V
VO
II
V
)
mA
mA
°C
°C
IO
50
TJ
Maximum junction temperature
Storage temperature range
125
Tstg
–65
150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
(3) SDA and SCL can go up to 3.6V as stated in the Recommended Operating Conditions table.
7.2 ESD Ratings
VALUE
UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1)
±2000
V(ESD)
Electrostatic discharge
V
Charged device model (CDM), per JEDEC specification JESD22-C101, all
pins(2)
±1500
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
MIN
1.7
NOM
MAX
1.9
UNIT
VDD
Device supply voltage
1.8
V
V
V
V
V
VDDOUT
VIL
Output Yx supply voltage for CDCEL824
Low-level input voltage LVCMOS
High-level input voltage LVCMOS
Input voltage threshold LVCMOS
Input voltage range S0
1.7
1.9
0.3 VDD
VIH
0.7 VDD
VI(thresh)
0.5 VDD
0
0
0
1.9
3.6
1.9
±8
VI(S)
V
Input voltage range S1, S2, SDA, SCL; V(Ithresh) = 0.5 VDD
Input voltage range CLK
VI(CLK)
IOH /IOL
CL
V
Output current (VDDOUT = 1.8 V)
Output load LVCMOS
mA
pF
°C
15
TA
Operating free-air temperature
–40
10
85
RECOMMENDED CRYSTAL/VCXO SPECIFICATIONS(1)
fXtal
Crystal input frequency range (fundamental mode)
Effective series resistance
Pulling range (0 V ≤ VCtrl ≤ 1.8 V)(2)
30
MHz
Ω
ESR
fPR
100
±120
0
±150
ppm
V
VCtrl
C0/C1
CL
Frequency control voltage
VDD
220
20
Pullability ratio
On-chip load capacitance at Xin and Xout
0
pF
(1) For more information about VCXO configuration, and crystal recommendation, see application report (SCAA085).
(2) Pulling range depends on crystal-type, on-chip crystal load capacitance and PCB stray capacitance; pulling range of min ±120 ppm
applies for crystal listed in the application report (SCAA085).
4
Copyright © 2015, Texas Instruments Incorporated
CDCEL824
www.ti.com.cn
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
7.4 Thermal Information
CDCEL824
AIRFLOW
(lfm)
THERMAL METRIC(1)(2)
PW (TSSOP)
UNIT
30 PINS
101
85
0
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
150
200
250
500
RθJA
Junction-to-ambient thermal resistance
84
82
74
RθJC(top)
RθJB
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
42
58
ψJB
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
64
RθJC(bot)
1.0
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(2) The package thermal impedance is calculated in accordance with JESD 51 and JEDEC2S2P (high-k board).
Copyright © 2015, Texas Instruments Incorporated
5
CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
www.ti.com.cn
7.5 Electrical Characteristics
over recommended operating free-air temperature range (unless otherwise noted)
TEST CONDITIONS
MIN
TYP(1)
MAX
UNIT
OVERALL PARAMETER
All PLLS on
20
9
All outputs off, fCLK = 27 MHz,
fVCO = 135 MHz; fOUT = 27 MHz
IDD
Supply current (see Figure 1)
Supply current (see Figure 2)
mA
Per PLL
No load, all outputs on,
fOUT = 27 MHz
1
IDDOUT
IDDPD
VPUC
VDDOUT = 1.8 V
mA
μA
V
Power-down current. Every circuit
powered down except SDA/SCL
fIN = 0 MHz,
VDD = 1.9 V
30
Supply voltage VDD threshold for power-
up control circuit
0.85
1.45
201
fVCO
fOUT
VCO frequency range of PLL
LVCMOS output frequency
80
MHz
MHz
VDDOUT = 1.8 V
201
LVCMOS PARAMETER
VIK
II
LVCMOS input voltage
VDD = 1.7 V; IS = –18 mA
VI = 0 V or VDD; VDD = 1.9 V
VI = VDD; VDD = 1.9 V
VI = 0 V; VDD = 1.9 V
VIClk = 0 V or VDD
–1.2
±5
5
V
LVCMOS input current
μA
μA
μA
IIH
IIL
LVCMOS input current for S0/S1/S2
LVCMOS Input current for S0/S1/S2
Input capacitance at Xin/Clk
Input capacitance at Xout
–4
6
2
3
CI
VIXout = 0 V or VDD
pF
Input capacitance at S0/S1/S2
VIS = 0 V or VDD
LVCMOS PARAMETER for VDDOUT = 1.8 V – MODE
VDDOUT = 1.7 V, IOH = –0.1 mA
VDDOUT = 1.7 V, IOH = –4 mA
VDDOUT = 1.7 V, IOH = –8 mA
VDDOUT = 1.7 V, IOL = 0.1 mA
VDDOUT = 1.7 V, IOL = 4 mA
VDDOUT = 1.7 V, IOL = 8 mA
All PLL bypass
1.6
1.4
1.1
VOH
LVCMOS high-level output voltage
LVCMOS low-level output voltage
V
V
0.1
0.3
0.6
VOL
tPLH, tPHL Propagation delay
2.6
0.7
80
ns
ns
tr/tf
Rise and fall time
VDDOUT = 1.8 V (20%–80%)
1 PLL switching, Y1-to-Y2
2 PLL switching, Y1-to-Y4
1 PLL switching, Y1-to-Y2
2 PLL switching, Y1-to-Y4
fOUT = 50 MHz; Y1-to-Y2
fOUT = 50 MHz; Y1-to-Y4
fVCO = 100 MHz; Pdiv = 1
110
200
130
220
50
(2) (3)
tjit(cc)
Cycle-to-cycle jitter
ps
ps
ps
130
100
150
(3)
tjit(per)
Peak-to-peak period jitter
tsk(o)
odc
Output skew(4)
110
55%
Output duty cycle(5)
45%
SDA/SCL PARAMETER
VIK
IIH
SCL and SDA input clamp voltage
SCL and SDA input current
SDA/SCL input high voltage(6)
SDA/SCL input low voltage(6)
SDA low-level output voltage
SCL/SDA Input capacitance
VDD = 1.7 V; II = –18 mA
VI = VDD; VDD = 1.9 V
–1.2
±10
V
μA
V
VIH
VIL
VOL
CI
0.7 VDD
0.3 VDD
0.2 VDD
10
V
IOL = 3 mA VDD = 1.7 V
VI = 0 V or VDD
V
3
pF
(1) All typical values are at respective nominal VDD
.
(2) 10,000 cycles
(3) Jitter depends on configuration. Jitter data is for input frequency = 27 MHz, fVCO = 135 MHz, fOUT = 27 MHz. fOUT = 3.072 MHz or input
frequency = 27 MHz, fVCO = 108 MHz, fOUT = 27 MHz. fOUT = 16.384 MHz, fOUT = 25 MHz, fOUT = 74.25 MHz, fOUT = 48 MHz
(4) The tsk(o) specification is only valid for equal loading of each bank of outputs, and the outputs are generated from the same divider,
data sampled on rising edge (tr).
(5) odc depends on output rise- and fall time (tr/tf).
(6) SDA and SCL pins are 3.3-V tolerant.
6
Copyright © 2015, Texas Instruments Incorporated
CDCEL824
www.ti.com.cn
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
7.6 CLK_IN Timing Requirements
over recommended ranges of supply voltage, load, and operating free-air temperature
MIN
0
NOM
MAX
130
130
3
UNIT
MHz
ns
PLL bypass mode
fCLK
LVCMOS clock input frequency
PLL mode
8
tr / tf
Rise and fall time CLK signal (20% to 80%)
Duty cycle CLK at VDD / 2
dutyCLK
40%
60%
7.7 SDA/SCL Timing Requirements
STANDARD MODE
FAST MODE
(SeeFigure 5)
UNIT
MIN
0
MAX
MIN
0
MAX
fSCL
SCL clock frequency
100
400
kHz
μs
μs
μs
μs
μs
ns
ns
ns
μs
μs
tsu(START)
th(START)
tw(SCLL)
tw(SCLH)
th(SDA)
tsu(SDA)
tr
START setup time (SCL high before SDA low)
START hold time (SCL low after SDA low)
SCL low-pulse duration
4.7
4
0.6
0.6
1.3
0.6
0
4.7
4
SCL high-pulse duration
SDA hold time (SDA valid after SCL low)
SDA setup time
0
3.45
0.9
250
100
SCL/SDA input rise time
1000
300
300
300
tf
SCL/SDA input fall time
tsu(STOP)
tBUS
STOP setup time
4
0.6
1.3
Bus free time between a STOP and START condition
4.7
7.8 EEPROM Specification
MIN
100
10
TYP
MAX
UNIT
cycles
years
EEcyc
EEret
Programming cycles of EEPROM
Data retention
1000
7.9 Typical Characteristics
60
50
40
30
20
10
0
6
5
4
3
2
1
0
All PLL Off
1 PLL On
2 PLL On
All Outputs Off
1 Output On
3 Outputs On
10
50
90
130
170
200
10
50
90
130
170
200
f - Frequency (MHz)
fOUT - Output Frequency (MHz)
D001
D002
Figure 1. Supply Current vs PLL Frequency
Figure 2. Output Current vs Output Frequency
Copyright © 2015, Texas Instruments Incorporated
7
CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
www.ti.com.cn
8 Parameter Measurement Information
CDCEL824
1 kW
1 kW
LVCMOS
10 pF
Figure 3. Test Load
CDCEL824
LVCMOS
LVCMOS
Series
Termination
~ 18 W
Line Impedance
Zo = 50 W
Typical Driver
Impedance
~ 32 W
Figure 4. Test Load for 50-Ω Board Environment
8
Copyright © 2015, Texas Instruments Incorporated
CDCEL824
www.ti.com.cn
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
9 Detailed Description
9.1 Overview
The CDCEL824 is a modular PLL-based low-cost, high-performance, programmable clock synthesizer, multiplier,
and divider. It generates up to four output clocks from a single input frequency. Each output can be programmed
in-system for any clock frequency up to 201 MHz, using up to two independent configurable PLLs.
The CDCEL824 has a separate output supply pins, VDDOUT, which are 1.8 V.
The input accepts an external crystal or LVCMOS clock signal. In case of a crystal input, an on-chip load
capacitor is adequate for most applications. The value of the load capacitor is programmable from 0 pF to 20 pF.
The deep M/N divider ratio allows the generation of zero-ppm audio/video, networking (WLAN, Bluetooth,
Ethernet, GPS) or interface (USB, IEEE1394, memory stick) clocks from a 27-MHz reference input frequency, for
example.
Based on the PLL frequency and the divider settings, the internal loop filter components are automatically
adjusted to achieve high stability and optimized jitter transfer characteristic of each PLL.
The device supports nonvolatile EEPROM programming for easy customization of the device in the application. It
is preset to a factory default configuration and can be reprogrammed to a different application configuration
before it goes onto the PCB or reprogrammed by in-system programming. All device settings are programmable
through the SDA/SCL bus, a 2-wire serial interface.
Three, free programmable control inputs, S0, S1, and S2, can be used to select different frequencies, or other
control features like outputs disable to low, outputs in high-impedance state, power down, PLL bypass, and so
forth.
The CDCx824 operates in a 1.8-V environment. It operates in a temperature range of –40°C to 85°C.
9.2 Functional Block Diagram
V
V
GND
DDOUT
DD
Vctr
Xin/CLK
VCXO
XO
LV
CMOS
Pdiv2
7-Bit
Y1
Y2
LVCMOS
PLL 1
Xout
LV
CMOS
Pdiv3
7-Bit
PLL Bypass
EEPROM
Programming
and
SDA/SCL
Register
S0
S1/SDA
S2/SCL
LV
CMOS
Pdiv4
7-Bit
Y3
Y4
PLL 2
LV
CMOS
Pdiv5
7-Bit
PLL Bypass
Copyright © 2015, Texas Instruments Incorporated
9
CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
www.ti.com.cn
9.3 Feature Description
9.3.1 Control Pins Settings
The CDCEL824 has three user-definable control pins (S0, S1, and S2) which allow external control of device
settings. They can be programmed to any of the following settings:
•
•
Frequency selection → switching between any of two user-defined frequencies
Output state selection → output configuration and power-down control
The user can predefine up to eight different control settings. Table 1 and Table 2 explain these settings.
Table 1. Control Pin Definition
EXTERNAL
CONTROL
BITS
PLL1 SETTING
PLL2 SETTING
RSVD SETTING
Control
function
PLL frequency
selection
Output Y1/Y2
selection
PLL frequency
selection
Output Y3/Y4
selection
Reserved
Reserved
Reserved
Table 2. PLL Setting (Can Be Selected for Each PLL Individual)(1)
FREQUENCY SELECTION(2)
FSx
0
FUNCTION
Frequency0
Frequency1
1
OUTPUT SELECTION(3) (Y1 ... Y4)
YxYx
FUNCTION
State0
0
1
State1
(1) Center/down-spread, Frequency0/1 and State0/1 are user-definable in the PLLx configuration register.
(2) Frequency0 and Frequency1 can be any frequency within the specified fVCO range.
(3) State0/1 selection is valid for both outputs of the corresponding PLL module and can be power down,
high-impedance state, low, or active
SDA/S1 and SCL/S2 pins of the CDCEL824 are dual-function pins. In the default configuration, they are
predefined as the SDA/SCL serial programming interface. They can be programmed to control pins (S1/S2) by
setting the relevant bits in the EEPROM. Note that the changes of the bits in the control register (bit [6] of byte
02h) have no effect until they are written into the EEPROM.
Once they are set as control pins, the serial programming interface is no longer available. However, if VDDOUT is
forced to GND, the two control pins, S1 and S2, temporally act as serial programming pins (SDA/SCL).
S0 is not a multi-use pin; it is a control pin only.
10
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CDCEL824
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ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
9.3.2 SDA/SCL Serial Interface
This section describes the SDA/SCL interface of the CDCEL824 device. The CDCEL824 operates as a slave
device of the 2-wire serial SDA/SCL bus, compatible with the popular SMBus or I2C specification. It operates in
the standard-mode transfer (up to 100 kbit/s) and fast-mode transfer (up to 400 kbit/s) and supports 7-bit
addressing.
The SDA/S1 and SCL/S2 pins of the CDCEL824 are dual-function pins. In the default configuration they are used
as SDA/SCL serial programming interface. They can be reprogrammed as general-purpose control pins, S1 and
S2, by changing the corresponding EEPROM setting, byte 02h, bit [6].
Bit 7 (MSB)
Bit 6
Bit 0 (LSB)
P
S
A
P
t
w(SCLL)
t
w(SCLH)
t
r
t
f
V
IH
SCL
V
IL
t
t
t
su(START)
h(START)
su(SDA)
t
h(SDA)
t
su(STOP)
t
f
t
t
r
(BUS)
V
IH
SDA
V
IL
Figure 5. Timing Diagram for SDA/SCL Serial Control Interface
9.3.3 SDA/SCL Hardware Interface
Figure 6 shows how the CDCEL824 clock synthesizer is connected to the SDA/SCL serial interface bus. Multiple
devices can be connected to the bus, but the speed may need to be reduced (400 kHz is the maximum) if many
devices are connected.
Note that the pullup resistors (RP) depend on the supply voltage, bus capacitance, and number of connected
devices. The recommended pullup value is 4.7 kΩ. It must meet the minimum sink current of 3 mA at VOLmax
=
0.4 V for the output stages (for more details see the SMBus or I2C Bus specification).
CDCEL824
R
R
P
P
Master
SDA
Slave
SCL
C
C
BUS
BUS
Figure 6. SDA/SCL Hardware Interface
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9.4 Device Functional Modes
9.4.1 Default Device Setting
The internal EEPROM of CDCEL824 is preconfigured as shown in Figure 7. The input frequency is passed
through the output as a default. This allows the device to operate in default mode without the extra production
step of programming it. The default setting appears after power is supplied or after a power-down/up sequence
until it is reprogrammed by the user to a different application configuration. A new register setting is programmed
via the serial SDA/SCL interface.
V
V
DDOUT
DD
GND
Xin
27-MHz
Crystal
Xtal
LV
CMOS
Y1 = 27 MHz
Y2 = 27 MHz
PLL1
Power Down
Pdiv2 = 1
Pdiv3 = 1
Xout
S0
LV
CMOS
PLL Bypass
EEPROM
1 = Outputs Enabled
Programming
and
SDA/SCL
Register
0 = Outputs Disabled
(High-Impedance)
SDA
SCL
LV
CMOS
Y3 = 27 MHz
PLL2
Programming Bus
Pdiv4 = 1
Pdiv5 = 1
Power Down
LV
CMOS
Y4 = 27 MHz
PLL Bypass
Figure 7. Preconfiguration of CDCEL824 Internal EEPROM
Table 3 shows the factory default setting for the control terminal register (external control pins). Note that even
though eight different register settings are possible, in default configuration, only the first two settings (0 and 1)
can be selected with S0, as S1 and S2 are configured as programming pins in the default mode.
Table 3. Factory Default Settings for Control Terminal Register(1)
PLL1 SETTINGS
PLL2 SETTINGS
FREQUENCY
SELECTION
OUTPUT
SELECTION
FREQUENCY
SELECTION
OUTPUT
SELECTION
EXTERNAL CONTROL PINS
S2
S1
S0
0
FS1
Y1Y2
FS2
Y2Y3
High-impedance
state
High-impedance
state
SDA (I2C)
SDA (I2C)
SCL (I2C)
SCL (I2C)
fVCO1_0
fVCO1_0
fVCO2_0
fVCO2_0
1
Enabled
Enabled
(1) S1 is SDA and S2 is SCL in default mode or when programmed (SPICON bit 6 of register 2 set to 0). They do not have any control-pin
function but they are internally interpreted as if S1 = 0 and S2 = 0. S0, however, is a control pin which in the default mode switches all
outputs ON or OFF (as previously predefined).
12
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9.5 Programming
9.5.1 Data Protocol
The device supports Byte Write and Byte Read and Block Write and Block Read operations.
For Byte Write/Read operations, the system controller can individually access addressed bytes.
For Block Write/Read operations, the bytes are accessed in sequential order from lowest to highest byte (with
most-significant bit first) with the ability to stop after any complete byte has been transferred. The numbers of
bytes read out are defined by byte count in the generic configuration register. At the Block Read instruction, all
bytes defined in the byte count must be read out to finish the read cycle correctly.
Once a byte has been sent, it is written into the internal register and is effective immediately. This applies to
each transferred byte regardless of whether this is a Byte Write or a Block Write sequence.
If the EEPROM write cycle is initiated, the internal SDA registers are written into the EEPROM. During this write
cycle, data is not accepted at the SDA/SCL bus until the write cycle is completed. However, data can be read out
during the programming sequence (Byte Read or Block Read). The programming status can be monitored by
EEPIP, byte 01h–bit 6.
The offset of the indexed byte is encoded in the command code, as described in Table 4.
Table 4. Slave Receiver Address (7 Bits)
DEVICE
A6
1
A5
1
A4
0
A3
0
A2
1
A1(1)
0
A0(1)
0
R/W
1/0
CDCEL824
(1) Address bits A0 and A1 are programmable via the SDA/SCL bus (byte 01, bit [1:0]. This allows addressing up to four devices connected
to the same SDA/SCL bus. The least-significant bit of the address byte designates a write or read operation.
9.5.2 Command Code Definition
Table 5. Command Code Definition
BIT
DESCRIPTION
0 = Block Read or Block Write operation
1 = Byte Read or Byte Write operation
7
(6:0)
Byte offset for Byte Read, Block Read, Byte Write and Block Write operations.
9.5.3 Generic Programming Sequence
1
7
1
1
8
1
1
S
Slave Address
A
Data Byte
A
P
R/W
MSB
LSB
MSB
LSB
S
Start Condition
Sr Repeated Start Condition
1 = Read (Rd) From CDCE9xx Device; 0 = Write (Wr) to CDCE9xxx
Acknowledge (ACK = 0 and NACK =1)
Stop Condition
R/W
A
P
Master-to-Slave Transmission
Slave-to-Master Transmission
Figure 8. Generic Programming Sequence
9.5.4 Byte Write Programming Sequence
1
7
1
1
8
1
8
1
1
S
Slave Address
Wr
A
CommandCode
A
Data Byte
A
P
Figure 9. Byte Write Protocol
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9.5.5 Byte Read Programming Sequence
1
7
1
1
8
1
1
7
1
1
S
Slave Address
Wr
A
CommandCode
A
Sr
Slave Address
Rd
A
8
1
1
Data Byte
A
P
Figure 10. Byte Read Protocol
9.5.6 Block Write Programming Sequence
1
7
1
1
8
1
8
1
S
Slave Address
Wr
A
CommandCode
A
Byte Count = N
A
8
1
8
1
8
1
1
Data Byte 0
A
Data Byte 1
A
…
Data Byte N-1
A
P
(1) Data byte 0 bits [7:0] is reserved for Revision Code and Vendor Identification. Also, it is used for internal test purpose
and should not be overwritten.
Figure 11. Block Write Protocol
9.5.7 Block Read Programming Sequence
1
7
1
1
8
1
1
7
1
1
S
Slave Address
Wr
A
CommandCode
A
Sr
Slave Address
Rd
A
8
1
8
1
8
1
1
Byte Count N
A
Data Byte 0
A
…
Data Byte N-1
A
P
Figure 12. Block Read Protocol
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9.6 Register Maps
9.6.1 SDA/SCL Configuration Registers
The clock input, control pins, PLLs, and output stages are user configurable. The following tables and
explanations describe the programmable functions of the CDCEL824. All settings can be manually written into
the device via the SDA/SCL bus or easily programmed by using the TI Pro-Clock™ software.
Table 6. SDA/SCL Registers
ADDRESS OFFSET
REGISTER DESCRIPTION
Generic configuration register
PLL1 configuration register
PLL2 configuration register
TABLE
Table 8
Table 9
Table 10
00h
10h
20h
The grey-highlighted bits, described in the Configuration Registers tables in the following pages, belong to the
Control Terminal Register. The user can predefine up to eight different control settings. These settings then can
be selected by the external control pins, S0, S1, and S2. Table 7 explains the corresponding bit assignment
between the Control Terminal Register and the Configuration Registers.
Table 7. Configuration Register, External Control Terminals
PLL1 SETTINGS
PLL2 SETTINGS
FREQUENCY
OUTPUT
SELECTION
FREQUENCY
OUTPUT
SELECTION
EXTERNAL CONTROL PINS
SELECTION
FS1
SELECTION
FS2
S2
0
S1
S0
0
Y1Y2
Y3Y4
Y3Y4_0
Y3Y4_1
Y3Y4_2
Reserved
Reserved
Y3Y4_5
Y3Y4_6
Y3Y4_7
25h
0
1
2
3
4
5
6
7
0
FS1_0
FS1_1
FS1_2
FS1_3
FS1_4
FS1_5
FS1_6
FS1_7
13h
Y1Y2_0
Y1Y2_1
Y1Y2_2
Y1Y2_3
Y1Y2_4
Y1Y2_5
Y1Y2_6
Y1Y2_7
15h
FS2_0
0
0
1
FS2_1
0
1
0
FS2_2
0
1
1
FS2_3Reserved
FS2_4Reserved
FS2_5
1
0
0
1
0
1
1
1
0
FS2_6
1
1
1
FS2_7
Address offset(1)
23h
(1) Address offset refers to the byte address in the configuration register in Table 8, Table 9, and Table 10.
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Table 8. Generic Configuration Register
OFFSET(1)
BIT(2)
7
ACRONYM
DEFAULT(3)
DESCRIPTION
E_EL
RID
VID
–
0b
Xb
1h
0b
Device identification (read-only): 0 is CDCEL824 (1.8 V out)
Revision identification number (read-only)
Vendor identification number (read-only)
Reserved – always write 0
00h
6:4
3:0
7
EEPROM programming Status4:(4) (read-only)
0 – EEPROM programming is completed
1 – EEPROM is in programming mode
6
5
EEPIP
0b
0b
Permanently lock EEPROM data(5)
0 – EEPROM is not locked
1 – EEPROM is permanently locked
EELOCK
01h
Device power down (overwrites S0/S1/S2 setting; configuration register settings are unchanged)
Note: PWDN cannot be set to 1 in the EEPROM.
0 – Device active (all PLLs and all outputs are enabled)
4
PWDN
0b
1 – Device power down (all PLLs in power down and all outputs in high-impedance state)
3:2
1:0
7
INCLK
SLAVE_ADR
M1
00b
00b
0b
Input clock selection:
00 – Xtal 01 – VCXO
10 – LVCMOS 1 – Reserved
Address bits A0 and A1 of the slave receiver address
RSVD
0 – Input clock
1 – PLL1 clock
Operation mode selection for pins 14/15(6)
6
SPICON
0b
0 – Serial programming interface SDA (pin 15) and SCL (pin 14)
1 – Control pins S1 (pin 15) and S2 (pin 14)
02h
03h
5:4
3:2
1:0
7:0
7
RSVD
RSVD
01b
01b
RSVD
RSVD
Reserved
Reserved
RSVD
001h
RSVD
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
0b
0b
0b
0b
0b
0b
0b
6
5
04h
4
RSVD
Reserved
3
2
1
(1) Writing data beyond 30h may affect device function.
(2) All data transferred with the MSB first
(3) Unless customer-specific setting
(4) During EEPROM programming, no data is allowed to be sent to the device via the SDA/SCL bus until the programming sequence is completed. Data, however, can be read out during the
programming sequence (Byte Read or Block Read).
(5) If this bit is set to high in the EEPROM, the actual data in the EEPROM is permanently locked. No further programming is possible. Data, however can still be written via the SDA/SCL bus
to the internal register to change device function on the fly. But new data can no longer be saved to the EEPROM. EELOCK is effective only if written into the EEPROM.
(6) Selection of control pins is effective only if written into the EEPROM. Once written into the EEPROM, the serial programming pins are no longer available. However, if VDDOUT is forced to
GND, the two control pins, S1 and S2, temporally act as serial programming pins (SDA/SCL), and the two slave receiver address bits are reset to A0 = 0 and A1 = 0.
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Table 8. Generic Configuration Register (continued)
OFFSET(1)
BIT(2)
ACRONYM
DEFAULT(3)
DESCRIPTION
05h
Crystal load-capacitor selection(7)
00h – 0 pF
01h – 1 pF
02h – 2 pF
:
7:3
XCSEL
0Ah
14h to 1Fh – 20 pF
2:0
7:1
0b
Reserved – do not write other than 0.
06h
7-bit byte count (defines the number of bytes which will be sent from this device at the next Block Read transfer); all bytes must be read out to correctly finish the read
cycle.
BCOUNT
30h
0 – No EEPROM write cycle
Initiate EEPROM write cycle(8)
0
EEWRITE
—
0b
0h
1 – Start EEPROM write cycle (internal registers are saved to the EEPROM)
07h-0Fh
Reserved – do not write other than 0
(7) The internal load capacitor (C1, C2) must be used to achieve the best clock performance. External capacitors should be used only to finely adjust CL by a few picofarads. The value of CL
can be programmed with a resolution of 1 pF for a crystal load range of 0 pF to 20 pF. For CL > 20 pF, use additional external capacitors. Also, the value of the device input capacitance
has to be considered which always adds 1.5 pF (6 pF/2 pF) to the selected CL. For more information about VCXO configuration and crystal recommendation, see application report
SCAA085.
(8) Note: The EEPROM WRITE bit must be sent last. This ensures that the content of all internal registers are stored in the EEPROM. The EEWRITE cycle is initiated with the rising edge of
the EEWRITE bit. A static level-high does not trigger an EEPROM WRITE cycle. The EEWRITE bit must be reset to low after the programming is completed. The programming status can
be monitored by reading out EEPIP. If EELOCK is set to high, no EEPROM programming is possible.
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Table 9. PLL1 Configuration Register
OFFSET(1)
10h
BIT(2)
ACRONYM
Reserved
Reserved
Reserved
FS1_7
DEFAULT(3)
DESCRIPTION
7:0
7:0
7:0
7
00000000b
Reserved
11h
00000000b
Reserved
12h
00000000b
Reserved
FS1_x: PLL1 frequency selection(4)
0b
0b
0b
0b
0b
0b
0b
0b
6
FS1_6
0 – fVCO1_0 (predefined by PLL1_0 – multiplier/divider value)
1 – fVCO1_1 (predefined by PLL1_1 – multiplier/divider value)
5
FS1_5
4
FS1_4
13h
3
FS1_3
2
FS1_2
1
FS1_1
0
FS1_0
0 – PLL1
7
6
MUX1
M2
1b
1b
PLL1 multiplexer:
1 – PLL1 bypass (PLL1 is in power down)
0 – bypass
1 – Pdiv2
Output Y1 multiplexer:
Output Y2 multiplexer:
00 – bypass
01 – Pdiv2-divider
10 – Pdiv3-divider
11 – Reserved
14h
5:4
M3
10b
3:2
1:0
Y1Y2_ST1
Y1Y2_ST0
11b
01b
00 – Y1/Y2 disabled to high-impedance state (PLL1 is in power down)
01 – Y1/Y2 disabled to high-impedance state (PLL1 on)
10 – Y1/Y2 disabled to low (PLL1 on)
Y1, Y2-state0/1definition:
11 – Y1/Y2 enabled (normal operation, PLL1 on)
(1) Writing data beyond 30h may adversely affect device function.
(2) All data is transferred MSB-first.
(3) Unless a custom setting is used
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ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
Table 9. PLL1 Configuration Register (continued)
BIT(2)
ACRONYM
Y1Y2_7
Y1Y2_6
Y1Y2_5
Y1Y2_4
Y1Y2_3
Y1Y2_2
Y1Y2_1
Y1Y2_0
Reserved
DEFAULT(3)
DESCRIPTION
Y1Y2_x output state selection(4)
0 – state0 (predefined by Y1Y2_ST0)
7
6
5
4
3
2
1
0
7
0b
0b
0b
0b
0b
0b
1b
0b
0b
1 – state1 (predefined by Y1Y2_ST1)
15h
RSVD Reserved
16h
17h
7-bit Y1-output-divider Pdiv2:
0 – Reset and in standby
1 to 127 – Divider value
6:0
7
Pdiv2
—
01h
0b
Reserved – do not write others than 0
7-bit Y2-output-divider Pdiv3:
0 – Reset and in standby
1 to 127 – Divider value
6:0
Pdiv3
01h
18h
19h
7:0
7:4
3:0
7:3
2:0
7:5
4:2
PLL1_0N [11:4
PLL1_0N [3:0]
PLL1_0R [8:5]
PLL1_0R[4:0]
PLL1_0Q [5:3]
PLL1_0Q [2:0]
PLL1_0P [2:0]
004h
000h
PLL1_0(4): 30-bit multiplier/divider value for frequency fVCO1_0
(for more information, see the PLL Multiplier/Divider Definition paragraph).
1Ah
10h
010b
1Bh
00 – fVCO1_0 < 125 MHz
01 – 125 MHz ≤ fVCO1_0 < 150 MHz
10 – 150 MHz ≤ fVCO1_0 < 175 MHz
11 – fVCO1_0 ≥ 175 MHz
1:0
VCO1_0_RANGE
00b
fVCO1_0 range selection:
1Ch
1Dh
7:0
7:4
3:0
7:3
2:0
7:5
4:2
PLL1_1N [11:4]
PLL1_1N [3:0]
PLL1_1R [8:5]
PLL1_1R[4:0]
PLL1_1Q [5:3]
PLL1_1Q [2:0]
PLL1_1P [2:0]
PLL1_1(4): 30-bit multiplier/divider value for frequency fVCO1_1
(for more information see the PLL Multiplier/Divider Definition paragraph)
004h
000h
1Eh
10h
010b
1Fh
00 – fVCO1_1 < 125 MHz
01 – 125 MHz ≤ fVCO1_1 < 150 MHz
10 – 150 MHz ≤ fVCO1_1 < 175 MHz
11 – fVCO1_1 ≥ 175 MHz
1:0
VCO1_1_RANGE
00b
fVCO1_1 range selection:
(4) PLL settings limits: 16 ≤ q ≤ 63, 0 ≤ p ≤ 7, 0 ≤ r ≤ 511, 0 < N < 4096
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Table 10. PLL2 Configuration Register
OFFSET(1)
20h
BIT(2)
ACRONYM
Reserved
Reserved
Reserved
FS2_7
DEFAULT(3)
DESCRIPTION
7:0
7:0
7:0
7
0000000b
Reserved
21h
0000000b
Reserved
22h
0000000b
Reserved
FS2_x: PLL2 frequency selection(4)
23h
0b
0b
0b
0b
0b
0b
0b
0b
6
FS2_6
0 – fVCO2_0 (predefined by PLL2_0 – multiplier/divider value)
1 – fVCO2_1 (predefined by PLL2_1 – multiplier/divider value)
5
FS2_5
4
FS2_4
3
FS2_3
2
FS2_2
1
FS2_1
0
FS2_0
24h
PLL2 multiplexer:
0 – PLL2
7
6
MUX2
M4
1b
1b
1 – PLL2 bypass (PLL2 is in power down)
Output Y3 multiplexer:
Output Y4 multiplexer:
0 – Pdiv2
1 – Pdiv4
00 – Pdiv2-divider
01 – Pdiv4-divider
10 – Pdiv5-divider
11 – Reserved
5:4
M5
10b
3:2
1:0
Y3Y4_ST1
Y3Y4_ST0
11b
01b
Y3, Y4-State0/1definition:
00 – Y3/Y4 disabled to high-impedance state (PLL2 is in power down)
01 – Y3/Y4 disabled to high-impedance state (PLL2 on)
10–Y3/Y4 disabled to low (PLL2 on)
11 – Y3/Y4 enabled (normal operation, PLL2 on)
(1) Writing data beyond 30h may adversely affect device function.
(2) All data is transferred MSB-first.
(3) Unless a custom setting is used
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Table 10. PLL2 Configuration Register (continued)
OFFSET(1)
BIT(2)
ACRONYM
Y3Y4_7
Y3Y4_6
Y3Y4_5
Y3Y4_4
Y3Y4_3
Y3Y4_2
Y3Y4_1
Y3Y4_0
DEFAULT(3)
DESCRIPTION
Y3Y4_x output state selection(4)
0 – state0 (predefined by Y3Y4_ST0)
25h
7
6
5
4
3
2
1
0
0b
0b
0b
0b
0b
0b
1b
0b
1 – state1 (predefined by Y3Y4_ST1)
26h
27h
Reserved
0 – Down
1 – Center
7
Reserved
0b
7-Bit Y3-output-divider Pdiv4:
0 – Reset and in standby
1 to 127 – Divider value
6:0
7
Pdiv4
—
01h
0b
Reserved – do not write others than 0
7-bit Y4-output-divider Pdiv5:
0 – Reset and in standby
1 to 127 – Divider value
6:0
Pdiv5
01h
28h
29h
7:0
7:4
3:0
7:3
2:0
7:5
4:2
PLL2_0N [11:4
PLL2_0N [3:0]
PLL2_0R [8:5]
PLL2_0R[4:0]
PLL2_0Q [5:3]
PLL2_0Q [2:0]
PLL2_0P [2:0]
PLL2_0(4): 30-Bit Multiplier/Divider value for frequency fVCO2_0
(for more information see the PLL Multiplier/Divider Definition paragraph)
004h
000h
2Ah
2Bh
10h
010b
fVCO2_0 range selection:
00 – fVCO2_0 < 125 MHz
01 – 125 MHz ≤ fVCO2_0 < 150 MHz
10 – 150 MHz ≤ fVCO2_0 < 175 MHz
11 – fVCO2_0 ≥ 175 MHz
1:0
VCO2_0_RANGE
00b
2Ch
2Dh
7:0
7:4
3:0
7:3
2:0
7:5
4:2
PLL2_1N [11:4]
PLL2_1N [3:0]
PLL2_1R [8:5]
PLL2_1R[4:0]
PLL2_1Q [5:3]
PLL2_1Q [2:0]
PLL2_1P [2:0]
PLL2_1(4): 30-bit multiplier/divider value for frequency fVCO2_1
(for more information see the PLL Multiplier/Divider Definition paragraph)
004h
000h
2Eh
2Fh
10h
010b
fVCO2_1 range selection:
00 – fVCO2_1 < 125 MHz
01 – 125 MHz ≤ fVCO2_1 < 150 MHz
10 – 150 MHz ≤ fVCO2_1 < 175 MHz
11 – fVCO2_1 ≥ 175 MHz
1:0
VCO2_1_RANGE
00b
(4) PLL settings limits: 16 ≤ q ≤ 63, 0 ≤ p ≤ 7, 0 ≤ r ≤ 511, 0 < N < 4096
Copyright © 2015, Texas Instruments Incorporated
21
CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
www.ti.com.cn
10 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
10.1 Application Information
CDCEL824 is an easy to use low-cost, programmable CMOS clock synthesizer. it can be used as a crystal
buffer, clock synthesizer with separate output supply pin. CDCEL824 features on-chip loop filter. Programming
can be done through SPI, pin-mode, or using on-chip EEPROM. This section shows some examples of using
CDCEL824 in various applications.
10.2 Typical Application
CDCEL824 is ideal clock generator for medium-range phase-shift laser distance meter. Having two separate
PLLs allows for achieving as low intermediate frequency as required as well as high maximum modulation
frequency, hence increasing the accuracy of the measurement device. Moreover, a fast settling PLL supports
faster switching between multiple modulation frequencies required by a single measurement. this results in
higher measurement rates for the device. Low power consumption and low cost position CDCEL824 as an ideal
device for commercial laser distance metering equipment.
Figure 13 shows a typical application concept for the CDCEL824, where the outputs of the PLL1, Y1 and Y2 are
used to generate the modulation and the counter frequency respectively. Y3 coming out of the PLL2 is carrying
the shifted modulation frequency for down mixing. all three frequencies are programmable and dynamically
switchable.
Example:
f0 :modulation freq. 200 MHz
fI :intermediate freq. 10 kHz
fC :counter frequency. 2 MHz
Laser
Diode
APD
Mixer
Y1
Y3
fI
f0
CDCEL824
f0-fI
Digital
Processor
fI
Y2
fC
Figure 13. Heterodyne Phase-Shift Laser Distance Meter Concept
22
Copyright © 2015, Texas Instruments Incorporated
CDCEL824
www.ti.com.cn
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
Typical Application (continued)
10.2.1 Design Requirements
For Laser distance meter applications, if heterodyne technique is used as mentioned in Typical Application , it is
shown that:
c
R =
2 f
Maximum Measurement Range equals:
o
(1)
(2)
f
f
c
1
I
Dd =
2
f
And best error achievable in measurement:
o
c
f
f
I
That means lower RF frequency allows for longer range, while lower ratio o ( higher RF frequency and lower IF
frequency) gives lower error.
The values of intermediate, RF, and counter frequency should be chosen according to design targets of the
maximum range and maximum tolerable error. Typically multiple consecutive measurements with multiple RF
frequencies are carried on to resolve the trade-off between the accuracy and the maximum range.
10.2.2 Detailed Design Procedure
10.2.2.1 PLL Multiplier/Divider Definition
At a given input frequency (ƒIN), the output frequency (ƒOUT) of the CDCEL824 can be calculated:
ƒ
IN
N
M
ƒ
+
OUT
Pdiv
where
•
•
M (1 to 511) and N (1 to 4095) are the multiplier/divide values of the PLL
Pdiv (1 to 127) is the output divider.
(3)
(4)
The target VCO frequency (ƒVCO) of each PLL can be calculated:
N
ƒ
+ ƒ
VCO
IN
M
The PLL internally operates as fractional divider and needs the following multiplier/divider settings:
N
NȀ
ǒlog Ǔ[if P t 0 then P + 0]
ǒ Ǔ
2 M
M
NP = 4 – int
Q = int
R = N′ – M × Q
where
N′ = N × 2P
N ≥ M
80 MHz ≤ ƒVCO ≤ 200 MHz
16 ≤ q ≤ 63
0 ≤ p ≤ 4
0 ≤ r ≤ 511
Example:
for ƒIN = 27 MHz; M = 1; N = 4; Pdiv = 2;
→ fOUT = 54 MHz
for ƒIN = 27 MHz; M = 2; N = 11; Pdiv = 2;
→ fOUT = 74.25 MHz
→ fVCO = 108 MHz
→ fVCO = 148.50 MHz
→ P = 4 – int(log24) = 4 – 2 = 2
→ N′’ = 4 × 22 = 16
→ P = 4 – int(log25.5) = 4 – 2 = 2
→ N′’ = 11 × 22 = 44
→ Q = int(16) = 16
→ Q = int(22) = 22
→ R = 16 – 16 = 0
→ R = 44 – 44 = 0
Copyright © 2015, Texas Instruments Incorporated
23
CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
www.ti.com.cn
Typical Application (continued)
The values for P, Q, R, and N’ are automatically calculated when using TI Pro-Clock™ software.
10.2.3 Application Curves
1.625 MHz to 3.25 MHz
1.5 MHz to 2.5 MHz
Figure 15. Phase Noise and RMS Jitter
Figure 14. Phase Noise and RMS Jitter
11 Power Supply Recommendations
There is no restriction on the power-up sequence. In case VDDOUT is applied first, it is recommended to ground
VDD. In case VDDOUT is powered while VDD is floating, there is a risk of high current flowing on the VDDOUT.
The device has a power-up control that is connected to the 1.8-V supply. This keeps the whole device disabled
until the 1.8-V supply reaches a sufficient voltage level. Then the device switches on all internal components,
including the outputs. If there is a VDDOUT available before the VDD supply, the outputs will stay disabled until
the VDD supply has reached a certain level.
12 Layout
12.1 Layout Guidelines
When the CDCEL824 is used as a crystal buffer, any parasitics across the crystal affects the pulling range of the
VCXO. Therefore, care must be taken in placing the crystal units on the board. Crystals should be placed as
close to the device as possible, ensuring that the routing lines from the crystal terminals to XIN and XOUT have the
same length.
If possible, cut out both ground plane and power plane under the area where the crystal and the routing to the
device are placed. In this area, always avoid routing any other signal line, as it could be a source of noise
coupling.
Additional discrete capacitors can be required to meet the load capacitance specification of certain crystal. For
example, a 10.7-pF load capacitor is not fully programmable on the chip, because the internal capacitor can
range from 0 pF to 20 pF with steps of 1 pF. The 0.7-pF capacitor therefore can be discretely added on top of an
internal 10 pF.
To minimize the inductive influence of the trace, it is recommended to place this small capacitor as close to the
device as possible and symmetrically with respect to XIN and XOUT.
Figure 16 shows a conceptual layout detailing recommended placement of power supply bypass capacitors. For
component side mounting, use 0402 body size capacitors to facilitate signal routing. Keep the connections
between the bypass capacitors and the power supply on the device as short as possible. Ground the other side
of the capacitor using a low-impedance connection to the ground plane.
24
Copyright © 2015, Texas Instruments Incorporated
CDCEL824
www.ti.com.cn
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
12.2 Layout Example
Figure 16. Board Layout
版权 © 2015, Texas Instruments Incorporated
25
CDCEL824
ZHCSEA7A –JUNE 2015–REVISED SEPTEMBER 2015
www.ti.com.cn
13 器件和文档支持
13.1 文档支持
13.2 社区资源
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
13.3 商标
Pro-Clock, E2E are trademarks of Texas Instruments.
13.4 静电放电警告
这些装置包含有限的内置 ESD 保护。 存储或装卸时,应将导线一起截短或将装置放置于导电泡棉中,以防止 MOS 门极遭受静电损
伤。
13.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
14 机械、封装和可订购信息
以下页中包括机械、封装和可订购信息。 这些信息是针对指定器件可提供的最新数据。 这些数据会在无通知且不
对本文档进行修订的情况下发生改变。 欲获得该数据表的浏览器版本,请查阅左侧的导航栏。
26
版权 © 2015, Texas Instruments Incorporated
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
CDCEL824PWR
ACTIVE
TSSOP
PW
16
2000 RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
CKEL824
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
24-Feb-2022
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
CDCEL824PWR
TSSOP
PW
16
2000
330.0
12.4
6.9
5.6
1.6
8.0
12.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
24-Feb-2022
*All dimensions are nominal
Device
Package Type Package Drawing Pins
TSSOP PW 16
SPQ
Length (mm) Width (mm) Height (mm)
367.0 367.0 35.0
CDCEL824PWR
2000
Pack Materials-Page 2
PACKAGE OUTLINE
PW0016A
TSSOP - 1.2 mm max height
S
C
A
L
E
2
.
5
0
0
SMALL OUTLINE PACKAGE
SEATING
PLANE
C
6.6
6.2
TYP
A
0.1 C
PIN 1 INDEX AREA
14X 0.65
16
1
2X
5.1
4.9
4.55
NOTE 3
8
9
0.30
16X
4.5
4.3
NOTE 4
1.2 MAX
0.19
B
0.1
C A B
(0.15) TYP
SEE DETAIL A
0.25
GAGE PLANE
0.15
0.05
0.75
0.50
A
20
0 -8
DETAIL A
TYPICAL
4220204/A 02/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-153.
www.ti.com
EXAMPLE BOARD LAYOUT
PW0016A
TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
SYMM
16X (1.5)
(R0.05) TYP
16
1
16X (0.45)
SYMM
14X (0.65)
8
9
(5.8)
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE: 10X
METAL UNDER
SOLDER MASK
SOLDER MASK
OPENING
SOLDER MASK
OPENING
METAL
EXPOSED METAL
EXPOSED METAL
0.05 MAX
ALL AROUND
0.05 MIN
ALL AROUND
NON-SOLDER MASK
DEFINED
SOLDER MASK
DEFINED
15.000
(PREFERRED)
SOLDER MASK DETAILS
4220204/A 02/2017
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
www.ti.com
EXAMPLE STENCIL DESIGN
PW0016A
TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
16X (1.5)
SYMM
(R0.05) TYP
16
1
16X (0.45)
SYMM
14X (0.65)
8
9
(5.8)
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE: 10X
4220204/A 02/2017
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
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