CD4025CJ [TI]
4000/14000/40000 SERIES, TRIPLE 3-INPUT NOR GATE, CDIP14, CERAMIC, DIP-14;型号: | CD4025CJ |
厂家: | TEXAS INSTRUMENTS |
描述: | 4000/14000/40000 SERIES, TRIPLE 3-INPUT NOR GATE, CDIP14, CERAMIC, DIP-14 CD 输入元件 |
文件: | 总6页 (文件大小:112K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
February 1988
CD4023M/CD4023C Triple 3-Input NAND Gate
CD4025M/CD4025C Triple 3-Input NOR Gate
General Description
These triple gates are monolithic complementary MOS
(CMOS) integrated circuits constructed with N- and P-chan-
nel enhancement mode transistors. All inputs are protected
Features
Y
Wide supply voltage range
3.0V to 15V
0.45 V (typ.)
Y
High noise immunity
DD
Y
5V–10V parametric ratings
against static discharge with diodes to V
and V
.
SS
Y
DD
Low power
Connection Diagrams
Dual-In-Line Packages
CD4023M/CD4023C
CD4025M/CD4025C
TL/F/5955–1
TL/F/5955–2
Top View
Top View
Order Number CD4023 or CD4025
C
1995 National Semiconductor Corporation
TL/F/5955
RRD-B30M105/Printed in U. S. A.
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
b
a
65 C to 150 C
Storage Temperature Range
§
§
Power Dissipation (P )
D
Dual-In-Line
Small Outline
700 mW
500 mW
b
a
0.3V
Voltage at Any Pin
V
SS
to V
DD
a
a
Operating Temperature Range
CD4023M, CD4025M
CD4023C, CD4025C
Operating V Range
DD
V
SS
3.0V to V
SS
15V
b
b
a
a
55 C to 125 C
§
§
40 C to 85 C
Lead Temperature
(Soldering, 10 seconds)
§
§
260 C
§
DC Electrical Characteristics CD4023M, CD4025M
Limits
b
a
a
Symbol
Parameter
Conditions
55 C
§
25 C
§
125 C
§
Units
Min Max Min
Typ Max
Min
Max
e
e
I
Quiescent Device
Current
V
V
5.0V
0.05
0.1
0.001 0.05
0.001 0.1
3.0
6.0
mA
mA
L
DD
10V
DD
e
e
P
V
V
V
V
Quiescent Device
V
V
5.0V
10V
0.25
1.0
0.005 0.25
0.01 1.0
15
60
mW
mW
D
DD
Dissipation/Package
DD
e
e
e
e
e
e
Output Voltage
Low Level
V
V
5.0V, V
V
, I
0A
0A
0.05
0.05
0
0
0.05
0.05
0.05
0.05
V
V
OL
OH
NL
NH
DD
I
DD
O
O
10V, V
V , I
DD
DD
I
O
e
e
e
e
e
e
Output Voltage
High Level
V
V
5.0V, V
V
SS
, I
0A
0A
4.95
9.95
4.95
9.95
5.0
10
4.95
9.95
V
V
DD
I
10V, V
V , I
SS
DD
I
O
e
e
e
e
e
0A
O
Noise Immunity
(All Inputs)
V
V
5.0V, V
3.6V, I
1.5
3.0
1.5
3.0
2.25
4.5
1.4
2.9
V
V
DD
O
O
O
O
O
O
e
0A
10V, V
7.2V, I
DD
O
O
e
e
e
e
e
Noise Immunity
(All Inputs)
V
V
5.0V, V
0.95V, I
0A
1.4
2.9
1.5
3.0
2.25
4.5
1.5
3.0
V
V
DD
O
e
10V, V
2.9V, I
O
0A
DD
O
e
e
e
e
e
I N
D
Output Drive Current
V
V
5.0V, V
0.4V, V
V
DD
0.5
1.1
0.40
0.9
1.0
2.5
0.28
0.65
mA
mA
DD
I
e
N-Channel (4025) (Note 2)
10V, V
0.5V, V
V
V
V
V
DD
O
I
DD
e
e
e
e
e
e
b
b
b
b
b
b
b
b
I P
D
Output Drive Current
V
V
5.0V, V
2.5V, V
V
SS
0.62
0.62
0.5
0.5
2.0
1.0
0.35
0.35
mA
mA
DD
I
I
I
P-Channel (4025) (Note 2)
10V, V
9.5V, V
DD
O
I
SS
e
e
e
e
e
e
I N
D
Output Drive Current
V
V
5.0V, V
0.4V, V
V
DD
0.31
0.63
0.25
0.5
0.5
0.6
0.175
0.35
mA
mA
DD
N-Channel (4023) (Note 2)
10V, V
0.5V, V
DD
O
I
DD
e
e
e
e
b
b
b
b
b
b
0.175
b
0.4
I P
D
Output Drive Current
V
V
5.0V, V
2.5V, V
V
SS
0.31
0.75
0.25
0.5
1.2
mA
mA
DD
e
e
b
P-Channel (4023) (Note 2)
10V, V
9.5V, V
0.6
DD
O
I
SS
I
Input Current
10
pA
I
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices
should be operated at these limits. The tables of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteristics’’ provide conditions for actual device
operation.
Note 2: I N and I P are tested one output at a time.
D
D
2
DC Electrical Characteristics CD4023C, CD4025C
Limits
b
a
a
85 C
Symbol
Parameter
Conditions
40 C
§
25 C
§
Units
§
Min
Max Min
Typ Max
Min
Max
e
e
I
Quiescent Device
Current
V
V
5.0V
0.05
5.0
0.005 0.5
0.005 5.0
15
30
mA
mA
L
DD
10V
DD
e
e
P
V
V
Quiescent Device
V
V
5.0V
10V
2.5
50
0.025 2.5
0.05 50
75
mW
D
DD
Dissipation/Package
300 mW
DD
e
e
e
e
e
e
Output Voltage
Low Level
V
V
5.0V, V
V
, I
0A
0A
0.01
0.01
0
0
0.01
0.01
0.05
0.05
V
V
OL
OH
DD
I
DD
O
O
10V, V
V
DD
, I
O
DD
I
e
e
e
e
e
e
Output Voltage
High Level
V
V
5.0V, V
V
SS
, I
0A
0A
4.99
9.99
4.99
9.99
5.0
10
4.95
9.95
V
V
DD
I
10V, V
V , I
SS
DD
I
O
I
Input Current
10
pA
I
e
e
e
e
e
0A
O
V
Noise Immunity
(All Inputs)
V
V
5.0V, V
3.6V, I
1.5
3.0
1.5
3.0
2.25
4.5
1.4
2.9
V
V
NL
DD
O
O
O
O
O
O
e
0A
10V, V
7.2V, I
DD
O
O
e
e
e
e
e
V
NH
Noise Immunity
(All Inputs)
V
V
5.0V, V
0.95V, I
0A
1.4
2.9
1.5
3.0
2.25
4.5
1.5
3.0
V
V
DD
O
e
10V, V
2.9V, I
O
0A
DD
O
e
e
e
e
e
I N
D
Output Drive Current
V
V
5.0V, V
0.4V, V
V
DD
0.35
0.72
0.3
0.6
1.0
2.5
0.24
0.48
mA
mA
DD
I
e
N-Channel (4025) (Note 2)
10V, V
0.5V, V
V
V
V
V
DD
O
I
DD
e
e
e
e
e
e
b
b
b
b
b
0.24
b
0.2
I P
D
Output Drive Current
V
V
5.0V, V
2.5V, V
V
SS
0.35
0.3
2.0
1.0
mA
mA
DD
I
I
I
b
b
P-Channel (4025) (Note 2)
10V, V
9.5V, V
0.3
0.25
0.12
0.25
DD
O
I
SS
e
e
e
e
e
e
I N
D
Output Drive Current
V
V
5.0V, V
0.4V, V
V
DD
0.145
0.3
0.5
0.6
0.095
0.2
mA
mA
DD
N-Channel (4023) (Note 2)
10V, V
0.5V, V
DD
O
I
DD
e
e
e
e
e
e
b
b
b
b
b
0.095
b
0.24
I P
D
Output Drive Current
V
V
5.0V, V
2.5V, V
V
SS
0.145
0.12
0.5
1.2
mA
mA
DD
b
b
P-Channel (4023) (Note 2)
10V, V
9.5V, V
0.35
0.3
DD
O
I
SS
I
Input Current
10
pA
I
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices
should be operated at these limits. The tables of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteristics’’ provide conditions for actual device
operation.
Note 2: I N and I P are tested one output at a time.
D
D
3
e
0.3%/ C
e
25 C, C
§
L
e
15 pF, and input rise and fall times 20 ns. Typical
AC Electrical Characteristics* T
A
e
temperature coefficient for all values of V
DD
§
Symbol
Parameter
Conditions
Min
Typ
Max
Units
CD4025M
e
e
t
t
t
t
Propagation Delay Time
High to Low Level
V
V
5.0V
10V
35
25
50
40
ns
ns
PHL
PLH
THL
TLH
DD
DD
e
e
Propagation Delay Time
Low to High Level
V
V
5.0V
10V
35
25
40
70
ns
ns
DD
DD
e
e
Transition Time
V
V
5.0V
10V
65
35
125
70
ns
ns
DD
High to Low Level
DD
e
e
Transition Time
V
V
5.0V
10V
65
35
175
75
ns
ns
DD
Low to High Level
DD
C
I
Input Capacitance
Any Input
5.0
pF
CD4025C
e
e
t
t
t
t
Propagation Delay Time
High to Low Level
V
V
5.0V
10V
35
25
80
55
ns
ns
PHL
PLH
THL
TLH
DD
DD
e
e
Propagation Delay Time
Low to High Level
V
V
5.0V
10V
35
25
120
65
ns
ns
DD
DD
e
e
Transition Time
V
V
5.0V
10V
65
35
200
115
ns
ns
DD
High to Low Level
DD
e
e
Transition Time
V
V
5.0V
10V
65
35
300
125
ns
ns
DD
Low to High Level
DD
C
I
Input Capacitance
Any Input
5.0
pF
CD4023M
e
e
t
t
t
t
Propagation Delay Time
High to Low Level
V
V
5.0V
10V
50
25
75
40
ns
ns
PHL
PLH
THL
TLH
DD
DD
e
e
Propagation Delay Time
Low to High Level
V
V
5.0V
10V
50
25
75
40
ns
ns
DD
DD
e
e
Transition Time
V
V
5.0V
10V
75
50
125
75
ns
ns
DD
High to Low Level
DD
e
e
Transition Time
V
V
5.0V
10V
75
40
100
60
ns
ns
DD
Low to High Level
DD
C
I
Input Capacitance
Any Input
5.0
pF
CD4023C
e
e
t
t
t
t
Propagation Delay Time
High to Low Level
V
V
5.0V
10V
50
25
100
50
ns
ns
PHL
PLH
THL
TLH
DD
DD
e
e
Propagation Delay Time
Low to High Level
V
V
5.0V
10V
50
25
100
50
ns
ns
DD
DD
e
e
Transition Time
V
V
5.0V
10V
75
50
150
100
ns
ns
DD
High to Low Level
DD
e
e
Transition Time
V
V
5.0V
10V
75
40
125
75
ns
ns
DD
Low to High Level
DD
C
I
Input Capacitance
Any Input
5.0
pF
*AC Parameters are guaranteed by DC correlated testing.
4
Physical Dimensions inches (millimeters)
Ceramic Dual-In-Line Package (J)
Order Number CD4023MJ, CD4023CJ, CD4025MJ or CD4025CJ
NS Package Number J14A
5
Physical Dimensions inches (millimeters) (Continued)
Molded Dual-In-Line Package (N)
Order Number CD4023MN, CD4023CN, CD4025MN or CD4025CN
NS Package Number N14A
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
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systems which, (a) are intended for surgical implant
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failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
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