ADC12L063CIVY/NOPB [TI]

12 位、62MSPS 模数转换器 (ADC) | NEY | 32 | -40 to 85;
ADC12L063CIVY/NOPB
型号: ADC12L063CIVY/NOPB
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

12 位、62MSPS 模数转换器 (ADC) | NEY | 32 | -40 to 85

转换器 模数转换器
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ADC12L063  
www.ti.com  
SNAS144E JULY 2001REVISED MARCH 2013  
ADC12L063 12-Bit, 62 MSPS, 354 mW A/D Converter with Internal Sample-and-Hold  
Check for Samples: ADC12L063  
1
FEATURES  
DESCRIPTION  
The ADC12L063 is a monolithic CMOS analog-to-  
digital converter capable of converting analog input  
signals into 12-bit digital words at 62 Megasamples  
per second (MSPS), minimum. This converter uses a  
differential, pipelined architecture with digital error  
correction and an on-chip sample-and-hold circuit to  
minimize die size and power consumption while  
providing excellent dynamic performance. Operating  
on a single 3.3V power supply, this device consumes  
just 354 mW at 62 MSPS, including the reference  
current. The Power Down feature reduces power  
consumption to just 50 mW.  
2
Single Supply Operation  
Low Power Consumption  
Power Down Mode  
On-Chip Reference Buffer  
APPLICATIONS  
Ultrasound and Imaging  
Instrumentation  
Cellular Base Stations/Communications  
Receivers  
The differential inputs provide a full scale input swing  
equal to ±VREF with the possibility of a single-ended  
input. Full use of the differential input is  
recommended for optimum performance. For ease of  
use, the buffered, high impedance, single-ended  
reference input is converted on-chip to a differential  
reference for use by the processing circuitry. Output  
data format is 12-bit offset binary.  
Sonar/Radar  
xDSL  
Wireless Local Loops  
Data Acquisition Systems  
DSP Front Ends  
KEY SPECIFICATIONS  
This device is available in the 32-lead LQFP package  
and will operate over the industrial temperature range  
of 40°C to +85°C.  
Resolution: 12 Bits  
Conversion Rate: 62 MSPS (min)  
Bandwidth: 170 MHz  
DNL: ±0.5 LSB(typ)  
INL: ±1.0 LSB(typ)  
SNR: 66 dB(typ)  
SFDR: 78 dB(typ)  
Data Latency: 6 Clock Cycles  
Supply Voltage: +3.3V ± 300 mV  
Power Consumption, 62 MHz: 354 mW(typ)  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2001–2013, Texas Instruments Incorporated  
ADC12L063  
SNAS144E JULY 2001REVISED MARCH 2013  
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Connection Diagram  
Figure 1. 32-Lead LQFP  
See NEY0032A Package  
2
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Block Diagram  
PIN DESCRIPTIONS AND EQUIVALENT CIRCUITS  
Pin No.  
Symbol  
Equivalent Circuit  
Description  
ANALOG I/O  
Non-Inverting analog signal Input. With a 1.0V reference voltage the  
+
2
VIN  
input signal level is 1.0 VP-P  
.
Inverting analog signal Input. With a 1.0V reference voltage the input  
signal level is 1.0 VP-P. This pin may be connected to VCM for single-  
ended operation, but a differential input signal is required for best  
performance.  
3
VIN  
Reference input. This pin should be bypassed to AGND with a 0.1  
µF monolithic capacitor. VREF is 1.0V nominal and should be  
between 0.8V and 1.2V.  
1
VREF  
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PIN DESCRIPTIONS AND EQUIVALENT CIRCUITS (continued)  
Pin No.  
31  
Symbol  
VRP  
Equivalent Circuit  
Description  
32  
VRM  
These pins are high impedance reference bypass pins only. Connect  
a 0.1 µF capacitor from each of these pins to AGND. DO NOT  
connect anything else to these pins.  
30  
VRN  
DIGITAL I/O  
Digital clock input. The range of frequencies for this input is 1 MHz to  
70 MHz (typical) with specified performance at 62 MHz. The input is  
sampled on the rising edge of this input.  
10  
CLK  
OE  
OE is the output enable pin that, when low, enables the TRI-STATE  
data output pins. When this pin is high, the outputs are in a high  
impedance state.  
11  
8
PD is the Power Down input pin. When high, this input puts the  
converter into the power down mode. When this pin is low, the  
converter is in the active mode.  
PD  
Digital data output pins that make up the 12-bit conversion results.  
D0 is the LSB, while D11 is the MSB of the offset binary output  
word.  
14–19,  
22–27  
D0–D11  
ANALOG POWER  
Positive analog supply pins. These pins should be connected to a  
quiet +3.3V source and bypassed to AGND with 0.1 µF monolithic  
capacitors located within 1 cm of these power pins, and with a 10 µF  
capacitor.  
5, 6, 29  
VA  
4, 7, 28  
AGND  
The ground return for the analog supply.  
DIGITAL POWER  
Positive digital supply pin. This pin should be connected to the same  
quiet +3.3V source as is VA and bypassed to DGND with a 0.1 µF  
monolithic capacitor in parallel with a 10 µF capacitor, both located  
within 1 cm of the power pin. Decouple this pin from the VA pins.  
13  
VD  
9, 12  
DGND  
The ground return for the digital supply.  
4
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Pin No.  
SNAS144E JULY 2001REVISED MARCH 2013  
PIN DESCRIPTIONS AND EQUIVALENT CIRCUITS (continued)  
Symbol  
Equivalent Circuit  
Description  
Positive digital supply pin for the ADC12L063's output drivers. This  
pin should be connected to a voltage source of +2.5V to VD and  
bypassed to DR GND with a 0.1 µF monolithic capacitor. If the  
supply for this pin is different from the supply used for VA and VD, it  
should also be bypassed with a 10 µF tantalum capacitor. The  
voltage at this pin should never exceed the voltage on VD. All bypass  
capacitors should be located within 1 cm of the supply pin.  
21  
20  
VDR  
The ground return for the digital supply for the ADC12L063's output  
drivers. This pin should be connected to the system digital ground,  
but not be connected in close proximity to the ADC12L063's DGND  
or AGND pins. See LAYOUT AND GROUNDING for more details.  
DR GND  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
(1)(2)(3)  
Absolute Maximum Ratings  
VA, VD, VDR  
4.2V  
100 mV  
|VA–VD|  
Voltage on Any Input or Output Pin  
0.3V to VA or VD +0.3V  
±25 mA  
(4)  
Input Current at Any Pin  
(4)  
Package Input Current  
±50 mA  
(5)  
Package Dissipation at TA = 25°C  
ESD Susceptibility  
See  
(6)  
Human Body Model  
2500V  
250V  
(6)  
Machine Model  
(7)  
Soldering Temperature, Infrared, 10 sec.  
Storage Temperature  
235°C  
65°C to +150°C  
(1) All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified.  
(2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for  
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the  
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may  
degrade when the device is not operated under the listed test conditions.  
(3) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and  
specifications.  
(4) When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA, VD or VDR), the current at that pin  
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the  
power supplies with an input current of 25 mA to two.  
(5) The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by  
TJmax, the junction-to-ambient thermal resistance (θJA), and the ambient temperature, (TA), and can be calculated using the formula  
PDMAX = (TJmax - TA )/θJA. In the 32-pin LQFP, θJA is 79°C/W, so PDMAX = 1,582 mW at 25°C and 823 mW at the maximum operating  
ambient temperature of 85°C. Note that the power consumption of this device under normal operation will typically be about 374 mW  
(354 typical power consumption + 20 mW TTL output loading). The values for maximum power dissipation listed above will be reached  
only when the device is operated in a severe fault condition (e.g. when input or output pins are driven beyond the power supply  
voltages, or the power supply polarity is reversed). Obviously, such conditions should always be avoided.  
(6) Human body model is 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is 220 pF discharged through 0.  
(7) The 235°C reflow temperature refers to infrared reflow. For Vapor Phase Reflow (VPR), the following Conditions apply: Maintain the  
temperature at the top of the package body above 183°C for a minimum 60 seconds. The temperature measured on the package body  
must not exceed 220°C. Only one excursion above 183°C is allowed per reflow cycle.  
(1)(2)  
Operating Ratings  
Operating Temperature  
Supply Voltage (VA, VD)  
Output Driver Supply (VDR  
VREF Input  
40°C TA +85°C  
+3.0V to +3.60V  
+2.5V to VD  
)
0.8V to 1.2V  
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for  
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the  
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may  
degrade when the device is not operated under the listed test conditions.  
(2) All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified.  
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Operating Ratings (1)(2) (continued)  
CLK, PD, OE  
0.05V to VD + 0.05V  
0V to (VA 0.5V)  
100mV  
VIN Input  
|AGND–DGND|  
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Converter Electrical Characteristics  
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = VDR = +3.3V, PD  
= 0V, VREF = +1.0V, fCLK = 62 MHz, tr = tf = 2 ns, CL = 20 pF/pin. Boldface limits apply for TA = TJ = TMIN to TMAX: all other  
(1)(2)(3)  
limits TA = TJ = 25°C  
Units  
(Limits)  
(4)  
(4)  
Symbol  
Parameter  
Conditions  
Typical  
Limits  
STATIC CONVERTER CHARACTERISTICS  
Resolution with No Missing Codes  
12  
Bits  
(5)  
INL  
DNL  
GE  
Integral Non Linearity  
Differential Non Linearity  
Gain Error  
±1.0  
±0.5  
0.8  
+0.1  
+0.1  
0
±2.4  
LSB(max)  
LSB(max)  
%FS(max)  
%FS(max)  
%FS(max)  
Positive Error  
Negative Error  
±3  
±0.9  
0
Offset Error (VIN+ = VIN)  
Under Range Output Code  
Over Range Output Code  
4095  
4095  
REFERENCE AND ANALOG INPUT CHARACTERISTICS  
VCM  
Common Mode Input Voltage  
1.0  
8
V
pF  
(CLK LOW)  
(CLK HIGH)  
CIN  
VIN Input Capacitance (each pin to GND) VIN = 1.0 Vdc + 1 VP-P  
7
pF  
0.8  
1.2  
V(min)  
V(max)  
MΩ(min)  
(6)  
VREF  
Reference Voltage  
1.00  
100  
Reference Input Resistance  
(1) The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited  
per Note 4 under the Absolute Maximum Ratings Table. However, errors in the A/D conversion can occur if the input goes above VA or  
below GND by more than 100 mV. As an example, if VA is 3.3V, the full-scale input voltage must be 3.4V to ensure accurate  
conversions. See Figure 2  
(2) To ensure accuracy, it is required that |VA–VD| 100 mV and separate bypass capacitors are used at each power supply pin.  
(3) With the test condition for VREF = +1.0V (2VP-P differential input), the 12-bit LSB is 488 µV.  
(4) Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average  
Outgoing Quality Level).  
(5) Integral Non Linearity is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through  
positive and negative full-scale.  
(6) Optimum dynamic performance will be obtained by keeping the reference input in the 0.8V to 1.2V range. The LM4051CIM3-ADJ or the  
LM4051CIM3-1.2 bandgap voltage reference is recommended for this application.  
DC and Logic Electrical Characteristics  
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD= VDR = +3.3V, PD  
= 0V, VREF = +1.0V, fCLK = 62 MHz, tr = tf = 2 ns, CL = 20 pF/pin. Boldface limits apply for TA = TJ = TMIN to TMAX: all other  
(1)(2)(3)  
limits TA = TJ = 25°C  
Units  
(Limits)  
(4)  
(4)  
Symbol  
Parameter  
Conditions  
Typical  
Limits  
CLK, PD, OE DIGITAL INPUT CHARACTERISTICS  
VIN(1)  
VIN(0)  
IIN(1)  
IIN(0)  
CIN  
Logical “1” Input Voltage  
Logical “0” Input Voltage  
Logical “1” Input Current  
Logical “0” Input Current  
Digital Input Capacitance  
VD = 3.3V  
2.0  
0.8  
V(min)  
V(max)  
µA  
VD = 3.0V  
VIN+, VIN= 3.3V  
VIN+, VIN= 0V  
10  
10  
5
µA  
pF  
D0–D11 DIGITAL OUTPUT CHARACTERISTICS  
(1) The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited  
per Note 4 under the Absolute Maximum Ratings Table. However, errors in the A/D conversion can occur if the input goes above VA or  
below GND by more than 100 mV. As an example, if VA is 3.3V, the full-scale input voltage must be 3.4V to ensure accurate  
conversions. See Figure 2  
(2) To ensure accuracy, it is required that |VA–VD| 100 mV and separate bypass capacitors are used at each power supply pin.  
(3) With the test condition for VREF = +1.0V (2VP-P differential input), the 12-bit LSB is 488 µV.  
(4) Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average  
Outgoing Quality Level).  
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DC and Logic Electrical Characteristics (continued)  
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD= VDR = +3.3V, PD  
= 0V, VREF = +1.0V, fCLK = 62 MHz, tr = tf = 2 ns, CL = 20 pF/pin. Boldface limits apply for TA = TJ = TMIN to TMAX: all other  
limits TA = TJ = 25°C (1)(2)(3)  
Units  
(4)  
(4)  
Symbol  
Parameter  
Conditions  
Typical  
Limits  
(Limits)  
V(min)  
V(max)  
nA  
VOUT(1)  
VOUT(0)  
Logical “1” Output Voltage  
Logical “0” Output Voltage  
IOUT = 0.5 mA  
IOUT = 1.6 mA  
VOUT = 3.3V  
VOUT = 0V  
2.7  
0.4  
100  
100  
20  
20  
IOZ  
TRI-STATE Output Current  
nA  
+ISC  
Output Short Circuit Source Current  
Output Short Circuit Sink Current  
VOUT = 0V  
mA(min)  
mA(min)  
ISC  
VOUT = VDR  
POWER SUPPLY CHARACTERISTICS  
PD Pin = DGND, VREF = 1.0V  
PD Pin = VDR  
102  
4
140  
7
mA(max)  
mA  
IA  
Analog Supply Current  
PD Pin = DGND  
PD Pin = VDR, fCLK = 0  
5.3  
2
mA(max)  
mA  
ID  
Digital Supply Current  
(5)  
PD Pin = DGND,  
<1  
0
mA(max)  
mA  
IDR  
Digital Output Supply Current  
Total Power Consumption  
PD Pin = VDR, fCLK = 0  
(6)  
PD Pin = DGND, CL = 0 pF  
PD Pin = VDR, fCLK = 0  
354  
50  
485  
mW  
mW  
Rejection of Full-Scale Error with  
VA = 3.0V vs 3.6V  
PSRR1 Power Supply Rejection  
58  
dB  
dB  
SNR Degradation w/10 MHz,  
250 mVP-P riding on VA  
PSRR2 Power Supply Rejection  
53  
DYNAMIC CONVERTER CHARACTERISTICS  
BW  
Full Power Bandwidth  
0 dBFS Input, Output at 3 dB  
170  
66  
MHz  
dB  
fIN = 1 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 1 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 1 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 1 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 1 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
SNR  
Signal-to-Noise Ratio  
66  
63.3  
62  
dB(min)  
dB  
65  
SINAD  
ENOB  
THD  
Signal-to-Noise and Distortion  
Effective Number of Bits  
Total Hamonic Distortion  
65  
dB  
10.6  
10.3  
80  
74  
82  
Bits  
10.0  
65  
Bits  
dB  
dB(max)  
dB  
SFDR  
IMD  
Spurious Free Dynamic Range  
Intermodulation Distortion  
78  
dB(min)  
fIN = 9.5 MHz and 10.5 MHz, each = 7  
dBFS  
75  
dBFS  
(5) IDR is the current consumed by the switching of the output drivers and is primarily determined by load capacitance on the output pins,  
the supply voltage, VDR, and the rate at which the outputs are switching (which is signal dependent). IDR=VDR(C0 x f0 + C1 x f1 +....C11  
f11) where VDR is the output driver power supply voltage, Cn is total capacitance on the output pin, and fn is the average frequency at  
which that pin is toggling.  
x
(6) Excludes IDR. See Note 5.  
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AC Electrical Characteristics  
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD, VDR = +3.3V, PD  
= 0V, VREF = +1.0V, fCLK = 62 MHz, tr = tf = 2 ns, CL = 20 pF/pin. Boldface limits apply for TA = TJ = TMIN to TMAX: all other  
(1)(2)(3)(4)  
limits TA = TJ = 25°C  
Units  
(5)  
(5)  
Symbol  
Parameter  
Conditions  
Typical  
Limits  
62  
(Limits)  
MHz(min)  
MHz  
1
fCLK  
Maximum Clock Frequency  
Minimum Clock Frequency  
Recommended Clock Duty Cycle  
70  
1
2
fCLK  
50  
40  
60  
6.5  
6.5  
6
%(min)  
%(max)  
ns(min)  
ns(min)  
Clock Cycles  
ns  
tCH  
Clock High Time  
Clock Low Time  
Conversion Latency  
tCL  
tCONV  
VDR = 2.5V  
VDR = 3.3V  
12  
9
tOD  
Data Output Delay after Rising CLK Edge  
13  
ns(max)  
ns  
tAD  
tAJ  
Aperture Delay  
2
Aperture Jitter  
1.2  
10  
10  
20  
ps rms  
ns  
tDIS  
tEN  
tPD  
Data outputs into TRI-STATE Mode  
Data Outputs Active after TRI-STATE  
Power Down Mode Exit Cycle  
ns  
tCLK  
(1) The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited  
per Note 4 under the Absolute Maximum Ratings Table. However, errors in the A/D conversion can occur if the input goes above VA or  
below GND by more than 100 mV. As an example, if VA is 3.3V, the full-scale input voltage must be 3.4V to ensure accurate  
conversions. See Figure 2  
(2) To ensure accuracy, it is required that |VA–VD| 100 mV and separate bypass capacitors are used at each power supply pin.  
(3) With the test condition for VREF = +1.0V (2VP-P differential input), the 12-bit LSB is 488 µV.  
(4) Timing specifications are tested at TTL logic levels, VIL = 0.4V for a falling edge and VIH = 2.4V for a rising edge.  
(5) Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average  
Outgoing Quality Level).  
Figure 2.  
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Specification Definitions  
APERTURE DELAY is the time after the rising edge of the clock to when the input signal is acquired or held for  
conversion.  
APERTURE JITTER (APERTURE UNCERTAINTY) is the variation in aperture delay from sample to sample.  
Aperture jitter manifests itself as noise in the output.  
COMMON MODE VOLTAGE (VCM) is the d.c. potential present at both signal inputs to the ADC.  
CONVERSION LATENCY See PIPELINE DELAY.  
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1  
LSB  
DUTY CYCLEs the ratio of the time that a repetitive digital waveform is high to the total time of one period. The  
specification here refers to the ADC clock input signal.  
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS)is another method of specifying Signal-to-Noise  
and Distortion or SINAD. ENOB is defined as (SINAD - 1.76) / 6.02 and says that the converter is  
equivalent to a perfect ADC of this (ENOB) number of bits.  
FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental  
drops 3 dB below its low frequency value for a full scale input.  
GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated as:  
Gain Error = Positive Full Scale Error Offset Error  
(1)  
INTEGRAL NON LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from  
negative full scale (½ LSB below the first code transition) through positive full scale (½ LSB above the last  
code transition). The deviation of any given code from this straight line is measured from the center of that  
code value.  
INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two  
sinusoidal frequencies being applied to the ADC input at the same time. It is defined as the ratio of the  
power in the intermodulation products to the total power in the original frequencies. IMD is usually  
expressed in dBFS.  
MISSING CODESare those output codes that will never appear at the ADC outputs. The ADC12L063 is ensured  
not to have any missing codes.  
NEGATIVE FULL SCALE ERRORis the difference between the input voltage (VIN+ VIN) just causing a  
transition from negative full scale to the next code and its ideal value of 0.5 LSB.  
OFFSET ERROR is the difference between the ideal differential input voltage (VIN+– VIN = 0V) and the actual  
input voltage required to cause a transition from an output code 2047 to 2048.  
OUTPUT DELAY is the time delay after the rising edge of the clock before the data update is presented at the  
output pins.  
PIPELINE DELAY (LATENCY) is the number of clock cycles between initiation of conversion and when that  
data is presented to the output driver stage. Data for any given sample is available at the output pins the  
Pipeline Delay plus the Output Delay after the sample is taken. New data is available at every clock cycle,  
but the data lags the conversion by the pipeline delay.  
POSITIVE FULL SCALE ERRORis the difference between the actual last code transition and its ideal value of  
1½ LSB below positive full scale.  
POWER SUPPLY REJECTION RATIO (PSRR) is a measure of how well the ADC rejects a change in the power  
supply voltage. For the ADC12L063, PSRR1 is the ratio of the change in Full-Scale Error that results from  
a change in the dc power supply voltage, expressed in dB. PSRR2 is a measure of how well an a. c.  
signal riding upon the power supply is rejected at the output.  
SIGNAL TO NOISE RATIO (SNR)is the ratio, expressed in dB, of the rms value of the input signal to the rms  
value of the sum of all other spectral components below one-half the sampling frequency, not including  
harmonics or dc.  
SIGNAL TO NOISE PLUS DISTORTION (S/N+D or SINAD) Is the ratio, expressed in dB, of the rms value of  
10  
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the input signal to the rms value of all of the other spectral components below half the clock frequency,  
including harmonics but excluding dc.  
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the  
input signal and the peak spurious signal, where a spurious signal is any signal present in the output  
spectrum that is not present at the input.  
TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dB or dBc, of the rms total of the first nine  
harmonic levels at the output to the rms value of the input frequency at the output. It is calculated as  
where  
f1 is the fundamental (input) frequency  
f2 through f10 are the first 9 harmonic frequencies.  
(2)  
Timing Diagram  
Figure 3. Output Timing  
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Transfer Characteristic  
Figure 4. Transfer Characteristic  
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Typical Performance Characteristics  
VA = VD = VDR = 3.3V, fCLK = 62MHz, fIN = 10 MHz unless otherwise stated  
DNL  
vs.  
VA  
DNL  
vs.  
Clock Duty Cycle  
Figure 5.  
Figure 6.  
DNL  
vs.  
Temperature  
INL  
vs.  
VA  
Figure 7.  
Figure 8.  
INL  
vs.  
INL  
vs.  
Temperature  
Clock Duty Cycle  
Figure 9.  
Figure 10.  
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Typical Performance Characteristics (continued)  
VA = VD = VDR = 3.3V, fCLK = 62MHz, fIN = 10 MHz unless otherwise stated  
SNR  
SNR  
vs.  
fCLK  
vs.  
VA  
Figure 11.  
Figure 12.  
SNR  
vs.  
SNR  
vs.  
VREF  
Clock Duty Clock Cycle  
Figure 13.  
Figure 14.  
SNR  
vs.  
Temperature  
THD  
vs.  
VA  
Figure 15.  
Figure 16.  
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Typical Performance Characteristics (continued)  
VA = VD = VDR = 3.3V, fCLK = 62MHz, fIN = 10 MHz unless otherwise stated  
THD  
THD  
vs.  
Clock Duty Cycle  
vs.  
fCLK  
Figure 17.  
Figure 18.  
THD  
vs.  
VREF  
THD  
vs.  
Temperature  
Figure 19.  
Figure 20.  
SINAD  
vs.  
VA  
SINAD  
vs.  
fCLK  
Figure 21.  
Figure 22.  
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Typical Performance Characteristics (continued)  
VA = VD = VDR = 3.3V, fCLK = 62MHz, fIN = 10 MHz unless otherwise stated  
SINAD  
SINAD  
vs.  
VREF  
vs.  
Duty Cycle  
Figure 23.  
Figure 24.  
SINAD  
vs.  
Temperature  
SFDR  
vs.  
VA  
Figure 25.  
Figure 26.  
SFDR  
vs.  
fCLK  
SFDR  
vs.  
Duty Cycle  
Figure 27.  
Figure 28.  
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Typical Performance Characteristics (continued)  
VA = VD = VDR = 3.3V, fCLK = 62MHz, fIN = 10 MHz unless otherwise stated  
SFDR  
SFDR  
vs.  
Temperature  
vs.  
VREF  
Figure 29.  
Figure 30.  
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FUNCTIONAL DESCRIPTION  
Operating on a single +3.3V supply, the ADC12L063 uses a pipelined architecture and has error correction  
circuitry to help ensure maximum performance.  
Differential analog input signals are digitized to 12 bits. Each analog input signal should have a peak-to-peak  
voltage equal to the input reference voltage, VREF, and be centered around VREF/2. Table 1 and Table 2 indicate  
the input to the output relationship of the ADC12L063. As indicated in Table 2, biasing one input to VREF/2 and  
driving the other input with its full range signal results in a 6 dB reduction of the output range, limiting it to the  
range of ¼ to ¾ of the minimum output range obtainable if both inputs were driven with complimentary signals.  
Signal Inputs explains how to avoid this signal reduction.  
Table 1. Input to Output Relationship—  
Differential Input  
+
VIN  
CM 0.5* VREF  
VIN  
Output  
V
VCM +0.5* VREF  
VCM +0.25* VREF  
VCM  
0000 0000 0000  
0100 0000 0000  
1000 0000 0000  
1100 0000 0000  
1111 1111 1111  
V
CM 0.25* VREF  
VCM  
VCM +0.25* VREF  
VCM +0.5* VREF  
V
CM 0.25* VREF  
V
CM 0.5* VREF  
Table 2. Input to Output Relationship—  
Single-Ended Input  
+
VIN  
VIN  
Output  
V
CM VREF  
VCM  
VCM  
VCM  
VCM  
VCM  
0000 0000 0000  
0100 0000 0000  
1000 0000 0000  
1100 0000 0000  
1111 1111 1111  
V
CM 0.5* VREF  
VCM  
VCM +0.5* VREF  
VCM +VREF  
The output word rate is the same as the clock frequency, which can be between 1 MSPS and 70 MSPS (typical).  
The analog input voltage is acquired at the rising edge of the clock and the digital data for that sample is delayed  
by the pipeline for 6 clock cycles.  
A logic high on the power down (PD) pin reduces the converter power consumption to 50 mW.  
Applications Information  
OPERATING CONDITIONS  
We recommend that the following conditions be observed for operation of the ADC12L063:  
3.0 V VA 3.6V  
VD = VA  
1.5V VDR VD  
1 MHz fCLK 70 MHz  
0.8V VREF 1.2V  
Analog Inputs  
+
The ADC12L063 has two analog signal inputs, VIN and VIN. These two pins form a differential input pair. There  
is one reference input pin, VREF  
.
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Reference Pins  
The ADC12L063 is designed to operate with a 1.0V reference, but performs well with reference voltages in the  
range of 0.8V to 1.2V. Lower reference voltages will decrease the signal-to-noise ratio (SNR) of the ADC12L063.  
Increasing the reference voltage (and the input signal swing) beyond 1.2V will degrade THD for a full-scale input.  
It is very important that all grounds associated with the reference voltage and the input signal make connection to  
the analog ground plane at a single point to minimize the effects of noise currents in the ground path.  
The three Reference Bypass Pins (VRP, VRM and VRN) are made available for bypass purposes only. These pins  
should each be bypassed to ground with a 0.1 µF capacitor. DO NOT LOAD these pins.  
Signal Inputs  
The signal inputs are VIN+ and VIN. The input signal, VIN, is defined as  
VIN = (VIN+) – (VIN  
)
(3)  
Figure 31 shows the expected input signal range.  
Note that the nominal input common mode voltage, VCM, is VREF/2, minimum and the nominal input signals each  
run between the limits of AGND and 1.0V with VREF = 1.0V. If the differential input signal increases above 2 VP-P  
,
the minimum input common mode voltage should increase proportionally. The Peaks of the input signals should  
never exceed the voltage described as  
Peak Input Voltaged = VA 1.0  
(4)  
to maintain dynamic performance.  
Figure 31. Expected Input Signal Range  
The ADC12L063 performs best with a differential input with each input centered around VCM (minimum of 0.5V).  
The peak-to-peak voltage swing at both VIN+ and VINshould not exceed the value of the reference voltage or the  
output data will be clipped. The two input signals should be exactly 180° out of phase from each other and of the  
same amplitude. For single frequency inputs, angular errors result in a reduction of the effective full scale input.  
For a complex waveform, however, angular errors will result in distortion.  
For angular deviations of up to 10 degrees from these two signals being 180 out of phase, the full scale error in  
LSB can be described as approximately  
EFS = dev1.79  
where  
Dev is the angular difference between the two signals having a 180° relative phase relationship to each other  
(see Figure 32) (5)  
Drive the analog inputs with a source impedance less than 100.  
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Figure 32. Angular Errors Between the Two Input Signals Will Reduce the Output Level or Cause  
Distortion  
For differential operation, each analog input signal should have a peak-to-peak voltage equal to the input  
reference voltage, VREF, and be centered around VCM. For single ended operation, one of the analog inputs  
should be connected to the d.c. common mode voltage of the driven input. The peak-to-peak differential input  
signal should be twice the reference voltage to maximize SNR and SINAD performance (Figure 31b). For  
+
example, set VREF to 1.0V, bias VIN to 1.0V and drive VIN with a signal range of 0V to 2.0V. Because very large  
input signal swings can degrade distortion performance, better performance with a single-ended input can be  
obtained by reducing the reference voltage when maintaining a full-range output. Table 1 and Table 2 indicate  
the input to output relationship of the ADC12L063.  
+
The VIN and the VIN inputs of the ADC12L063 consist of an analog switch followed by a switched-capacitor  
amplifier. The capacitance seen at the analog input pins changes with the clock level, appearing as 8 pF when  
the clock is low, and 7 pF when the clock is high. Although this difference is small, a dynamic capacitance is  
more difficult to drive than is a fixed capacitance, so choose the driving amplifier carefully. The LMH6702,  
LMH6628, LMH6622 and LMH6655 are good amplifiers for driving the ADC12L063.  
The internal switching action at the analog inputs causes energy to be output from the input pins. As the driving  
source tries to compensate for this, it adds noise to the signal. To prevent this, use 33series resistors at each  
of the signal inputs with a 10 pF capacitor across the inputs, as can be seen in Figure 34 and Figure 35. These  
components should be placed close to the ADC because the input pins of the ADC is the most sensitive part of  
the system and this is the last opportunity to filter the input. The 10 pF capacitor value is for undersampling  
application and should be replaced with a 68 pF capacitor for Nyquist application.  
DIGITAL INPUTS  
Digital inputs consist of CLK, OE and PD.  
CLK  
The CLK signal controls the timing of the sampling process. Drive the clock input with a stable, low jitter clock  
signal in the range of 1 MHz to 70 MHz with rise and fall times of less than 2 ns. The trace carrying the clock  
signal should be as short as possible and should not cross any other signal line, analog or digital, not even at  
90°.  
The CLK signal also drives an internal state machine. If the CLK is interrupted, or its frequency is too low, the  
charge on internal capacitors can dissipate to the point where the accuracy of the output data will degrade. This  
is what limits the lowest sample rate to 1 MSPS.  
The CLOCK signal also drives an internal state machine. If the clock is interrupted, or its frequency is too low,  
the charge on internal capacitors can dissipate to the point where the accuracy of the output data will degrade.  
The duty cycle of the clock signal can affect the performance of any A/D Converter. Because achieving a precise  
duty cycle is difficult, the ADC12L063 is designed to maintain performance over a range of duty cycles. While it is  
specified and performance is ensured with a 50% clock duty cycle, performance is typically maintained over a  
clock duty cycle range of 35% to 65%.  
The clock line should be series terminated in the characteristic impedance of that line at the clock source. If the  
clock line is longer than  
where  
tr is the clock rise tprop is the propagation rate of the signal along the trace  
(6)  
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The CLOCK pin should be a.c. terminated with a series RC such that the resistor value is equal to the  
characteristic impedance of the clock line and the capacitor value is  
where  
"I" is the line length in inches  
Zo is the characteric impedance of the clock line  
(7)  
This termination should be located as close as possible to, but within one centimeter of, the ADC12L063 clock  
pin as shown in Figure 33. A typical propagation rate on FR4 material is about 150ps/inch, or about 60ps/cm.  
OE  
The OE pin, when high, puts the output pins into a high impedance state. When this pin is low the outputs are in  
the active state. The ADC12L063 will continue to convert whether this pin is high or low, but the output can not  
be read while the OE pin is high.  
PD  
The PD pin, when high, holds the ADC12L063 in a power-down mode to conserve power when the converter is  
not being used. The power consumption in this state is 50 mW. The output data pins are undefined in this mode.  
Power consumption during power-down is not affected by the clock frequency, or by whether there is a clock  
signal present. The data in the pipeline is corrupted while in the power down mode.  
OUTPUTS  
The ADC12L063 has 12 TTL/CMOS compatible Data Output pins. The offset binary data is present at these  
outputs while the OE and PD pins are low. While the tOD time provides information about output timing, a simple  
way to capture a valid output is to latch the data on the rising edge of the conversion clock (pin 10).  
Be very careful when driving a high capacitance bus. The more capacitance the output drivers must charge for  
each conversion, the more instantaneous digital current flows through VDR and DR GND. These large charging  
current spikes can cause on-chip ground noise and couple into the analog circuitry, degrading dynamic  
performance. Adequate bypassing and careful attention to the ground plane will reduce this problem.  
Additionally, bus capacitance beyond the specified 20 pF/pin will cause tOD to increase, making it difficult to  
properly latch the ADC output data. The result could be an apparent reduction in dynamic performance.  
To minimize noise due to output switching, minimize the load currents at the digital outputs. This can be done by  
connecting buffers between the ADC outputs and any other circuitry (74ACQ541, for example). Only one input  
should be connected to each output pin. Additionally, inserting series resistors of 47to 56at the digital  
outputs, close to the ADC pins, will isolate the outputs from trace and other circuit capacitances and limit the  
output currents, which could otherwise result in performance degradation. See Figure 33.  
While the ADC12L063 will operate with VDR voltages down to 2.5V, tOD increases with reduced VDR. Be careful of  
external timing when using reduced VDR  
.
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Figure 33. Simple Application Circuit with Single-Ended to Differential Buffer  
Figure 34. Differential Drive Circuit of Figure 33  
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Figure 35. Driving the Signal Inputs with a Transforme  
POWER SUPPLY CONSIDERATIONS  
The power supply pins should be bypassed with a 10 µF capacitor and with a 0.1 µF ceramic chip capacitor  
within a centimeter of each power pin. Leadless chip capacitors are preferred because they have low series  
inductance.  
As is the case with all high-speed converters, the ADC12L063 is sensitive to power supply noise. Accordingly,  
the noise on the analog supply pin should be kept below 100 mVP-P  
.
No pin should ever have a voltage on it that is in excess of the supply voltages, not even on a transient basis. Be  
especially careful of this during turn on and turn off of power.  
The VDR pin provides power for the output drivers and may be operated from a supply in the range of 2.5V to VD  
(nominal 3.3V). This can simplify interfacing to 3V devices and systems. DO NOT operate the VDR pin at a  
voltage higher than VD.  
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LAYOUT AND GROUNDING  
Proper grounding and proper routing of all signals are essential to ensure accurate conversion. Maintaining  
separate analog and digital areas of the board, with the ADC12L063 between these areas, is required to achieve  
specified performance.  
The ground return for the data outputs (DR GND) carries the ground current for the output drivers. The output  
current can exhibit high transients that could add noise to the conversion process. To prevent this from  
happening, the DR GND pins should NOT be connected to system ground in close proximity to any of the  
ADC12L063's other ground pins.  
Capacitive coupling between the typically noisy digital circuitry and the sensitive analog circuitry can lead to poor  
performance. The solution is to keep the analog circuitry separated from the digital circuitry, and to keep the  
clock line as short as possible.  
Digital circuits create substantial supply and ground current transients. The logic noise thus generated could  
have significant impact upon system noise performance. The best logic family to use in systems with A/D  
converters is one which employs non-saturating transistor designs, or has low noise characteristics, such as the  
74LS, 74HC(T) and 74AC(T)Q families. The worst noise generators are logic families that draw the largest  
supply current transients during clock or signal edges, like the 74F and the 74AC(T) families.  
The effects of the noise generated from the ADC output switching can be minimized through the use of 47to  
56resistors in series with each data output line. Locate these resistors as close to the ADC output pins as  
possible.  
Since digital switching transients are composed largely of high frequency components, total ground plane copper  
weight will have little effect upon the logic-generated noise. This is because of the skin effect. Total surface area  
is more important than is total ground plane volume.  
Figure 36. Example of a Suitable Layout  
Generally, analog and digital lines should cross each other at 90° to avoid crosstalk. To maximize accuracy in  
high speed, high resolution systems, however, avoid crossing analog and digital lines altogether. It is important to  
keep clock lines as short as possible and isolated from ALL other lines, including other digital lines. Even the  
generally accepted 90° crossing should be avoided with the clock line as even a little coupling can cause  
problems at high frequencies. This is because other lines can introduce jitter into the clock line, which can lead to  
degradation of SNR. Also, the high speed clock can introduce noise into the analog chain.  
Best performance at high frequencies and at high resolution is obtained with a straight signal path. That is, the  
signal path through all components should form a straight line wherever possible.  
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Be especially careful with the layout of inductors. Mutual inductance can change the characteristics of the circuit  
in which they are used. Inductors should not be placed side by side, even with just a small part of their bodies  
beside each other.  
The analog input should be isolated from noisy signal traces to avoid coupling of spurious signals into the input.  
Any external component (e.g., a filter capacitor) connected between the converter's input pins and ground or to  
the reference input pin and ground should be connected to a very clean point in the analog ground plane.  
Figure 36 gives an example of a suitable layout. All analog circuitry (input amplifiers, filters, reference  
components, etc.) should be placed over the analog ground plane. All digital circuitry and I/O lines should be  
placed over the digital ground plane. Furthermore, all components in the reference circuitry and the input signal  
chain that are connected to ground should be connected together with short traces and enter the analog ground  
plane at a single point. All ground connections should have a low inductance path to ground.  
DYNAMIC PERFORMANCE  
To achieve the best dynamic performance, the clock source driving the CLK input must be free of jitter. Isolate  
the ADC clock from any digital circuitry with buffers, as with the clock tree shown in Figure 37.  
As mentioned in LAYOUT AND GROUNDING, it is good practice to keep the ADC clock line as short as possible  
and to keep it well away from any other signals. Other signals can introduce jitter into the clock signal, which can  
lead to reduced SNR performance, and the clock can introduce noise into other lines. Even lines with 90°  
crossings have capacitive coupling, so try to avoid even these 90° crossings of the clock line.  
Figure 37. Isolating the ADC Clock from other Circuitry with a Clock Tree  
COMMON APPLICATION PITFALLS  
Driving the inputs (analog or digital) beyond the power supply rails. For proper operation, all inputs should  
not go more than 100 mV beyond the supply rails (more than 100 mV below the ground pins or 100 mV above  
the supply pins). Exceeding these limits on even a transient basis may cause faulty or erratic operation. It is not  
uncommon for high speed digital components (e.g., 74F and 74AC devices) to exhibit overshoot or undershoot  
that goes above the power supply or below ground. A resistor of about 50to 100in series with any offending  
digital input, close to the signal source, will eliminate the problem.  
Do not allow input voltages to exceed the supply voltage, even on a transient basis. Not even during power up or  
power down.  
Be careful not to overdrive the inputs of the ADC12L063 with a device that is powered from supplies outside the  
range of the ADC12L063 supply. Such practice may lead to conversion inaccuracies and even to device  
damage.  
Attempting to drive a high capacitance digital data bus. The more capacitance the output drivers must  
charge for each conversion, the more instantaneous digital current flows through VDR and DR GND. These large  
charging current spikes can couple into the analog circuitry, degrading dynamic performance. Adequate  
bypassing and maintaining separate analog and digital areas on the pc board will reduce this problem.  
Additionally, bus capacitance beyond the specified 20 pF/pin will cause tOD to increase, making it difficult to  
properly latch the ADC output data. The result could, again, be an apparent reduction in dynamic performance.  
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The digital data outputs should be buffered (with 74ACQ541, for example). Dynamic performance can also be  
improved by adding series resistors at each digital output, close to the ADC12L063, which reduces the energy  
coupled back into the converter output pins by limiting the output current. A reasonable value for these resistors  
is 47to 56.  
Using an inadequate amplifier to drive the analog input. As explained in Signal Inputs, the capacitance seen  
at the input alternates between 8 pF and 7 pF, depending upon the phase of the clock. This dynamic load is  
more difficult to drive than is a fixed capacitance.  
If the amplifier exhibits overshoot, ringing, or any evidence of instability, even at a very low level, it will degrade  
performance. A small series resistor at each amplifier output and a capacitor across the analog inputs (as shown  
in Figure 34 and Figure 35) will improve performance. The LMH6702, LMH6622 and LMH6628 have been  
successfully used to drive the analog inputs of the ADC12L063.  
Also, it is important that the signals at the two inputs have exactly the same amplitude and be exactly 180º out of  
phase with each other. Board layout, especially equality of the length of the two traces to the input pins, will  
affect the effective phase between these two signals. Remember that an operational amplifier operated in the  
non-inverting configuration will exhibit more time delay than will the same device operating in the inverting  
configuration.  
Operating with the reference pins outside of the specified range. As mentioned in Reference Pins, VREF  
should be in the range of  
0.8V VREF 1.2V  
(8)  
Operating outside of these limits could lead to performance degradation.  
Using a clock source with excessive jitter, using excessively long clock signal trace, or having other  
signals coupled to the clock signal trace. This will cause the sampling interval to vary, causing excessive  
output noise and a reduction in SNR and SINAD performance.  
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REVISION HISTORY  
Changes from Revision D (March 2013) to Revision E  
Page  
Changed layout of National Data Sheet to TI format .......................................................................................................... 26  
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PACKAGE OPTION ADDENDUM  
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10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
ADC12L063CIVY/NOPB  
ACTIVE  
LQFP  
NEY  
32  
250  
RoHS & Green  
SN  
Level-3-260C-168 HR  
-40 to 85  
ADC12L0  
63CIVY  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
23-Jun-2023  
TRAY  
L - Outer tray length without tabs  
KO -  
Outer  
tray  
height  
W -  
Outer  
tray  
width  
Text  
P1 - Tray unit pocket pitch  
CW - Measurement for tray edge (Y direction) to corner pocket center  
CL - Measurement for tray edge (X direction) to corner pocket center  
Chamfer on Tray corner indicates Pin 1 orientation of packed units.  
*All dimensions are nominal  
Device  
Package Package Pins SPQ Unit array  
Max  
matrix temperature  
(°C)  
L (mm)  
W
K0  
P1  
CL  
CW  
Name  
Type  
(mm) (µm) (mm) (mm) (mm)  
ADC12L063CIVY/NOPB  
NEY  
LQFP  
32  
250  
9 X 24  
150  
322.6 135.9 7620 12.2  
11.1 11.25  
Pack Materials-Page 1  
PACKAGE OUTLINE  
NEY0032A  
LQFP - 1.6 mm max height  
SCALE 1.800  
PLASTIC QUAD FLATPACK  
7.1  
6.9  
B
32  
25  
PIN 1 ID  
24  
1
7.1  
6.9  
9.4  
TYP  
8.6  
17  
8
A
9
16  
0.27  
0.17  
OPTIONAL:  
SHARP CORNERS EXCEPT  
PIN 1 ID CORNER  
28X 0.8  
4X 5.6  
32X  
0.2  
C A B  
SEE DETAIL A  
1.6 MAX  
C
SEATING PLANE  
0.09-0.20  
TYP  
0.25  
GAGE PLANE  
(1.4)  
0.1  
0.15  
0.05  
0.75  
0.45  
0 -7  
DETAIL  
A
S
C
A
L
E
:
1
2
DETAIL A  
TYPICAL  
4219901/A 10/2016  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. Reference JEDEC registration MS-026.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
NEY0032A  
LQFP - 1.6 mm max height  
PLASTIC QUAD FLATPACK  
SYMM  
25  
32  
32X (1.6)  
1
24  
32X (0.4)  
SYMM  
(8.5)  
28X (0.8)  
8
17  
(R0.05) TYP  
9
16  
(8.5)  
LAND PATTERN EXAMPLE  
SCALE:8X  
0.07 MAX  
ALL AROUND  
0.07 MIN  
ALL AROUND  
METAL  
METAL UNDER  
SOLDER MASK  
SOLDER MASK  
SOLDER MASK  
OPENING  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4219901/A 10/2016  
NOTES: (continued)  
4. Publication IPC-7351 may have alternate designs.  
5. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
NEY0032A  
LQFP - 1.6 mm max height  
PLASTIC QUAD FLATPACK  
SYMM  
25  
32  
32X (1.6)  
1
24  
32X (0.4)  
SYMM  
(8.5)  
28X (0.8)  
8
17  
(R0.05) TYP  
16  
9
(8.5)  
SOLDER PASTE EXAMPLE  
SCALE 8X  
4219901/A 10/2016  
NOTES: (continued)  
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
7. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
IMPORTANT NOTICE AND DISCLAIMER  
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATA SHEETS), DESIGN RESOURCES (INCLUDING REFERENCE  
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”  
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY  
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD  
PARTY INTELLECTUAL PROPERTY RIGHTS.  
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate  
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable  
standards, and any other safety, security, regulatory or other requirements.  
These resources are subject to change without notice. TI grants you permission to use these resources only for development of an  
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TI’s products are provided subject to TI’s Terms of Sale or other applicable terms available either on ti.com or provided in conjunction with  
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