5962-9172501MLA [TI]

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES; 八进制D类锁存器扫描测试设备
5962-9172501MLA
元器件型号: 5962-9172501MLA
生产厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述和应用:

SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
八进制D类锁存器扫描测试设备

锁存器 逻辑集成电路 测试 信息通信管理 驱动
PDF文件: 总26页 (文件大小:469K)
下载文档:  下载PDF数据表文档文件
型号参数:5962-9172501MLA参数

5962-9172501MLX

8-Bit D-Type Latch

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5 ETC

5962-9172601M3A

SCAN TEST DEVICES WITH OCTAL BUFFERS

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16 TI

5962-9172601M3A

SCAN TEST DEVICES WITH OCTAL BUFFERS

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27 TI

5962-9172601M3X

Dual 4-Bit Non-Inverting Buffer/Driver

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4 ETC

5962-9172601MLA

SCAN TEST DEVICES WITH OCTAL BUFFERS

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20 TI

5962-9172601MLA

SCAN TEST DEVICES WITH OCTAL BUFFERS

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25 TI

5962-9172601MLX

Dual 4-Bit Non-Inverting Buffer/Driver

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8 ETC

5962-9172701M3X

Octal D-Type Flip-Flop

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5 ETC

5962-9172701MLX

Octal D-Type Flip-Flop

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8 ETC

5962-9172701Q3A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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15 TI

5962-9172701Q3A

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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20 TI

5962-9172701Q3X

Octal D-Type Flip-Flop

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2 ETC

5962-9172701QLA

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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22 TI

5962-9172701QLA

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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21 TI

5962-9172701QLX

Octal D-Type Flip-Flop

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7 ETC