5962-9165501MXX [TI]

100K SERIES, DUAL 8 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, CDIP24, CERDIP-24;


型号：	5962-9165501MXX
厂家：	TEXAS INSTRUMENTS
描述：	100K SERIES, DUAL 8 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, CDIP24, CERDIP-24 CD 输出元件逻辑集成电路
文件：	总8页 (文件大小：127K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

August 1998

100363

Low Power Dual 8-Input Multiplexer

n 2000V ESD protection

n Pin/function compatible with 100163

n Voltage compensated operating range −4.2V to −5.7V

n Standard Microcircuit Drawing

(SMD) 5962-9165501

General Description

The 100363 is a dual 8-input multiplexer. The Data Select

(S_n) inputs determine which bit (A_nand B_n) will be presented

at the outputs (Z_aand Z_brespectively). The same bit (0–7)

will be selected for both the Z_aand Z _boutput. All inputs have

50 kΩ pulldown resistors.

Features

n 50% power reduction of the 100163

Logic Symbol

Pin Names

S₀–S₂

Description

Data Select Inputs

A₀–A₇

B₀–B₇

Z_a, Z_b

A Data Inputs

B Data Inputs

Data Outputs

DS100310-1

Connection Diagrams

24-Pin Quad Cerpak

24-Pin DIP

DS100310-3

DS100310-2

DS100310

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Logic Diagram

DS100310-5

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Truth Table

Inputs

Outputs

Select

Data

S₂

S₁

S₀

A₇

B₇

A₆

B₆

A₅

B₅

A₄

A₃

B₃

A₂

B₂

A₁

B₁

A₀

B₀

Z_a

Z_b

B₄

HIGH Voltage Level

LOW Voltage Level

Don’t Care

Blank

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Absolute Maximum Ratings (Note 1)

ESD (Note 2)

≥2000V

If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Recommended Operating

Conditions

Case Temperature (T_C)

Military

Above which the useful life may be impared

Storage Temperature (T_STG

)

−65˚C to +150˚C

−55˚C to +125˚C

−5.7V to −4.2V

Maximum Junction Temperature (T_J)

Ceramic

Supply Voltage (V_EE

)

+175˚C

−7.0V to +0.5V

V_EEto + 0.5V

−50 mA

Note 1: Absolute maximum ratings are those values beyond which the de-

vice may be damaged or have its useful life impaired. Functional operation

under these conditions is not implied.

V_EEPin Potential to Ground Pin

Input Voltage (DC)

Note 2: ESD testing conforms to MIL-STD-883, Method 3015.

Output Current (DC Output HIGH)

Military Version

DC Electrical Characteristics

−55˚C to +125˚C

V_EE−4.2V to −5.7V, V_CCV_CCAGND, T

Symbol

Parameter

Min

Max Units

T_C

Conditions

Note

V_OH

Output HIGH Voltage −1025 −870

0˚C to

+125˚C

−55˚C

0˚C to

+125˚C

−55˚C

0˚C to

+125˚C

−55˚C

0˚C to

+125˚C

−55˚C

−55˚C to

−1085 −870

V_INV_IH(Max)

Loading with

(Notes 3, 4, 5)

V_OL

Output LOW Voltage −1830 −1620

or V_IL(Min)

50Ω to −2.0V

−1830 −1555

V_OHC

V_OLC

V_IH

Output HIGH Voltage −1035

−1085

V_INV_IH(Min)

Loading with

(Notes 3, 4, 5)

Output LOW Voltage

Input HIGH Voltage

−1610

or V_IL(Max)

50Ω to −2.0V

−1555

Guaranteed HIGH Signal for All

Inputs

−1165 −870

(Notes 3, 4, 5, 6)

+125˚C

−55˚C to

+125˚C

−55˚C to

+125˚C

V_IL

Input LOW Voltage

Input LOW Current

−1830 −1475

0.50

µA

Guaranteed LOW Signal for All Inputs (Notes 3, 4, 5, 6)

I_IL

V_EE−4.2V

(Notes 3, 4, 5)

V_INV_IL(Min)

I_IH

Input HIGH Current

S_n

A_n, B_n

S_n

265

340

385

490

µA

0˚C to

+125˚C

−55˚C

V_EE−5.7V

(Notes 3, 4, 5)

V_INV_IH(Max)

A_n, B_n

I_EE

Power Supply

Current

−55˚C to

+125˚C

Inputs Open

−87

−30

Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately

without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case

condition at cold temperatures.

Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.

Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.

Note 6: Guaranteed by applying specified input condition and testing V /V

OH OL

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AC Electrical Characteristics

V_EE−4.2V to −5.7V, V_CCV_CCAGND

T_C−55˚C

T_C+25˚C

T_C

+125˚C

Symbol

Parameter

Units

Conditions

Notes

Min

Max

Min

Max

Min

Max

t_PLH

t_PHL

t_PLH

t_PHL

t_TLH

t_THL

Propagation Delay

A₀–A₇, B₀–B₇to Output

Propagation Delay

S₀–S₂to Output

0.50

2.40

0.60

2.30

0.70

0.80

0.30

3.00

(Notes 7, 8, 9)

(Note 10)

0.80

0.30

3.00

1.90

0.90

0.30

2.80

1.80

3.40

2.10

Figure 1 and

Figure 2

Transition Time

20% to 80%, 80% to 20%

Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately

after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.

Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.

Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C, temperatures, Subgroups A10 and A11.

Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).

Test Circuitry

DS100310-6

Notes:

V , V

+2V, V

−2.5V

CCA

L1 and L2 equal length 50Ω impedance lines

50Ω terminator internal to scope

Decoupling 0.1 µF from GND to V and V

All unused outputs are loaded with 50Ω to GND

Fixture and stray capacitance ≤ 3 pF

Pin numbers shown are for flatpak; for DIP see logic symbol

FIGURE 1. AC Test Circuit

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Switching Waveforms

DS100310-7

FIGURE 2. Propagation Delay and Transition Times

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Physical Dimensions inches (millimeters) unless otherwise noted

24-Pin Ceramic Dual-In-Line Package (D)

NS Package Number J24E

24-Pin Quad Cerpak (F)

NS Package Number W24B

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LIFE SUPPORT POLICY

NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE-

VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI-

CONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices or sys-

tems which, (a) are intended for surgical implant into

the body, or (b) support or sustain life, and whose fail-

ure to perform when properly used in accordance

with instructions for use provided in the labeling, can

be reasonably expected to result in a significant injury

to the user.

2. A critical component in any component of a life support

device or system whose failure to perform can be rea-

sonably expected to cause the failure of the life support

device or system, or to affect its safety or effectiveness.

National Semiconductor

Corporation

Americas

Tel: 1-800-272-9959

Fax: 1-800-737-7018

Email: support@nsc.com

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Fax: 65-2504466

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National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.

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