54ACTQ244DM [TI]
ACT SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, CDIP20, CERAMIC, DIP-20;
| 型号： | 54ACTQ244DM |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | ACT SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, CDIP20, CERAMIC, DIP-20 驱动 CD 输出元件 逻辑集成电路 |
| 文件： | 总10页 (文件大小：215K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
March 1993
54ACQ/74ACQ244 54ACTQ/74ACTQ244
#
Quiet Series Octal Buffer/Line Driver
with TRI-STATE Outputs
É
General Description
Features
Y
CC
I
and I
reduced by 50%
OZ
The ’ACQ/’ACTQ244 is an octal buffer and line driver de-
signed to be employed as a memory address driver, clock
driver and bus oriented transmitter or receiver which pro-
vides improved PC board density. The ACQ/ACTQ utilizes
NSC Quiet Series technology to guarantee quiet output
switching and improved dynamic threshold performance.
FACT Quiet SeriesTM features GTOTM output control and
undershoot corrector in addition to a split ground bus for
superior performance.
Y
Guaranteed simultaneous switching noise level and
dynamic threshold performance
Y
Y
Y
Guaranteed pin-to-pin skew AC performance
Improved latch-up immunity
TRI-STATE outputs drive bus lines or buffer memory
É
address registers
Y
Y
Y
Y
Outputs source/sink 24 mA
Faster prop delays than the standard ’AC/’ACT244
4 kV minimum ESD immunity
Standard Military Drawing (SMD)
Ð ’ACTQ244: 5962-8776003
Ð ’ACQ244: 5962-92176
Logic Symbol
Connection Diagrams
IEE/IEC
Pin Assignment
for DIP, Flatpak, QSOP and SOIC
Pin Assignment
for LCC
TL/F/10235–3
TL/F/10235–2
TL/F/10235–1
Truth Tables
Pin Names
Description
Inputs
Outputs
(Pins 12, 14, 16, 18)
OE , OE
1
TRI-STATE Output Enable Inputs
OE
1
I
n
2
I –I
0
Inputs
7
L
L
L
L
H
Z
O –O
0
Outputs
7
H
X
H
Inputs
Outputs
(Pins 3, 5, 7, 9)
OE
2
I
n
L
L
L
L
H
Z
H
X
H
TRI-STATEÉ is a registered trademark of National Semiconductor Corporation.
e
e
e
e
H
L
HIGH Voltage Level
LOW Voltage Level
X
Z
Immaterial
High Impedance
FACTTM, FACT Quiet SeriesTM, and GTOTM are trademarks of National Semiconductor
Corporation.
C
1995 National Semiconductor Corporation
TL/F/10235
RRD-B30M75/Printed in U. S. A.
Absolute Maximum Rating (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Recommended Operating
Conditions
Supply Voltage (V
’ACQ
’ACTQ
)
CC
2.0V to 6.0V
4.5V to 5.5V
b
a
0.5V to 7.0V
Supply Voltage (V
)
CC
DC Input Diode Current (I
)
IK
Input Voltage (V )
I
0V to V
0V to V
CC
e b
b
a
V
I
V
I
0.5V
a
20 mA
20 mA
Output Voltage (V
)
O
CC
e
V
CC
0.5V
Operating Temperature (T )
A
74ACQ/ACTQ
54ACQ/ACTQ
b
b
a
0.5V
DC Input Voltage (V )
I
0.5V to V
0.5V to V
CC
b
b
a
40 C to 85 C
§
55 C to 125 C
§
§
DC Output Diode Current (I
)
a
OK
§
e b
b
a
V
V
0.5V
a
20 mA
20 mA
O
O
Minimum Input Edge Rate DV/Dt
’ACQ Devices
e
V
CC
0.5V
a
DC Output Voltage (V
DC Output Source
)
O
0.5V
50 mA
50 mA
CC
V
V
from 30% to 70% of V
@
IN
CC
3.0V, 4.5V, 5.5V
125 mV/ns
CC
g
g
or Sink Current (I
)
O
Minimum Input Edge Rate DV/Dt
’ACTQ Devices
DC V
or Ground Current
CC
per Output Pin (I or I
CC
)
V
V
from 0.8V to 2.0V
@
GND
)
IN
4.5V, 5.5V
125 mV/ns
b
a
65 C to 150 C
CC
Storage Temperature (T
§
§
STG
Note: All commercial packaging is not recommended for applications requir-
a
ing greater than 2000 temperature cycles from 40 C to 125 C.
DC Latch-Up Source or
Sink Current
b
§
§
g
300 mA
Junction Temperature (T )
J
CDIP
PDIP
175 C
§
140 C
§
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT circuits outside databook specifications.
DC Electrical Characteristics for ’ACQ Family Devices
54ACQ
74ACQ
74ACQ
e
e
T
A
V
CC
(V)
T
55 C to 125 C
A
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
a
b a
40 C to 85 C
§
§
Guaranteed Limits
§
§
Typ
e
0.1V
V
V
V
Minimum High Level
Input Voltage
3.0
4.5
5.5
1.5
2.25
2.75
2.1
3.15
3.85
2.1
3.15
3.85
2.1
3.15
3.85
V
IH
OUT
b
V
V
V
or V
CC
0.1V
e
Maximum Low Level
Input Voltage
3.0
4.5
5.5
1.5
2.25
2.75
0.9
1.35
1.65
0.9
1.35
1.65
0.9
1.35
1.65
V
OUT
or V
0.1V
0.1V
IL
b
CC
e b
OUT
Minimum High Level
Output Voltage
3.0
4.5
5.5
2.99
4.49
5.49
2.9
4.4
5.4
2.9
4.4
5.4
2.9
4.4
5.4
I
50 mA
OH
e
*V
IN
V
IL
or V
IH
b
b
b
3.0
4.5
5.5
2.56
3.86
4.86
2.4
3.7
4.7
2.46
3.76
4.76
12 mA
24 mA
24 mA
V
V
I
OH
e
e
V
OL
Maximum Low Level
Output Voltage
3.0
4.5
5.5
0.002
0.001
0.001
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
I
50 mA
OUT
*V
IN
V or V
IL IH
3.0
4.5
5.5
0.36
0.36
0.36
0.50
0.50
0.50
0.44
0.44
0.44
12 mA
24 mA
24 mA
V
I
OL
e
(Note 1)
I
Maximum Input
Leakage Current
V
V
, GND
IN
I
CC
g
g
g
5.5
0.1
1.0
1.0
mA
e
²
Minimum Dynamic
Output Current
I
I
I
5.5
5.5
50
75
mA
mA
V
V
V
1.65V Max
3.85V Min
OLD
OHD
CC
OLD
b
b
e
50
75
OHD
e
Maximum Quiescent
Supply Current
V
CC
IN
5.5
4.0
80.0
40.0
mA
or GND (Note 1)
*All outputs loaded thresholds on input associated with output under test.
²
Maximum test duration 2.0 ms, one output loaded at a time.
2
DC Electrical Characteristics for ’ACQ Family Devices (Continued)
74ACQ
54ACQ
74ACQ
e
e
T
A
V
CC
(V)
T
A
55 C to 125 C
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
a
b a
40 C to 85 C
§
§
Guaranteed Limits
§
§
Typ
e
I
Maximum TRI-STATE
Leakage Current
V (OE)
I
V
, V
OZ
IL IH
e
g
g
g
2.5
5.5
0.25
5.0
mA
V
V
V
, GND
CC
, GND
I
e
V
CC
O
V
OLP
V
OLV
V
IHD
V
ILD
Quiet Output
Maximum Dynamic V
Figures 2-12,13
(Notes 2, 3)
5.0
5.0
5.0
5.0
1.1
1.5
V
V
V
V
OL
OL
Quiet Output
Figures 2-12,13
(Notes 2, 3)
b
b
0.6
3.1
1.9
1.2
3.5
1.5
Minimum Dynamic V
Minimum High Level
Dynamic Input Voltage
(Notes 2, 4)
Maximum Low Level
Dynamic Input Voltage
(Notes 2, 4)
@
@
Note 1: I and I
IN
3.0V are guaranteed to be less than or equal to the respective limit 5.5V V
.
CC
CC
@ @
for 54ACQ 25 C is identical to 74ACQ 25 C.
§ §
I
CC
Note 2: Plastic DIP package.
Note 3: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V. One output GND.
@
b
Note 4: Max number of Data Inputs (n) switching. (n
e
1) Inputs switching 0V to 5V (’ACQ). Input-under-test switching: 5V to threshold (V ), 0V to threshold
ILD
(V ), f
IHD
1 MHz.
DC Electrical Characteristics for ’ACTQ Family Devices
54ACTQ
74ACTQ
74ACTQ
e
e
T
A
V
CC
(V)
T
A
55 C to 125 C
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
a
b a
40 C to 85 C
§
§
Guaranteed Limits
§
§
Typ
e
0.1V
V
V
V
Minimum High Level
Input Voltage
4.5
5.5
1.5
1.5
2.0
2.0
2.0
2.0
2.0
2.0
V
IH
OUT
V
V
V
b
or V
CC
0.1V
e
Maximum Low Level
Input Voltage
4.5
5.5
1.5
1.5
0.8
0.8
0.8
0.8
0.8
0.8
V
OUT
or V
0.1V
0.1V
IL
b
CC
e b
OUT
Minimum High Level
Output Voltage
4.5
5.5
4.49
5.49
4.4
5.4
4.4
5.4
4.4
5.4
I
50 mA
OH
e
*V
IN
OH
V
IL
or V
IH
b
b
4.5
5.5
3.86
4.86
3.70
4.70
3.76
4.76
I
24 mA
24 mA
V
V
e
e
V
OL
Maximum Low Level
Output Voltage
4.5 0.001
5.5 0.001
0.1
0.1
0.1
0.1
0.1
0.1
I
50 mA
OUT
*V
V or V
IL IH
IN
4.5
5.5
0.36
0.36
0.50
0.50
0.44
0.44
I
24 mA
24 mA
OL
V
e
e
I
I
Maximum Input
Leakage Current
V
V
, GND
CC
IN
I
I
g
g
g
g
g
5.5
5.5
0.1
1.0
5.0
1.0
2.5
mA
mA
Maximum TRI-STATE
Leakage Current
V
V
V , V
IL IH
OZ
g
0.25
e
V
, GND
CC
O
e
b
2.1V
I
I
I
I
Maximum I /Input
CC
5.5
5.5
5.5
0.6
1.1
1.6
50
1.5
75
mA
mA
mA
V
V
V
V
V
CC
CCT
OLD
OHD
CC
I
e
²
Minimum Dynamic
Output Current
1.65V Max
e
3.85V Min
OLD
OHD
b
b
50
75
e
Maximum Quiescent
Supply Current
V
CC
IN
5.5
5.0
5.0
4.0
1.5
80.0
40.0
mA
V
or GND (Note 1)
V
Quiet Output
Maximum Dynamic V
Figures 2-12,13
(Notes 2, 3)
OLP
OLV
OL
V
Quiet Output
Minimum Dynamic V
Figures 2-12,13
(Notes 2, 3)
b
b
1.2
0.6
V
OL
*All outputs loaded thresholds on input associated with output under test.
²
Maximum test duration 2.0 ms, one output loaded at a time.
3
DC Electrical Characteristics for ’ACTQ Family Devices (Continued)
74ACTQ
54ACTQ
74ACTQ
e
e
T
A
V
T
CC
A
e a
Symbol
Parameter
T
A
25 C
§
Units
Conditions
b
a
55 C to 125 C
b a
40 C to 85 C
(V)
§
§
§
§
Typ
Guaranteed Limits
V
V
Minimum High Level
(Notes 2, 4)
(Notes 2, 4)
IHD
5.0
5.0
1.9
2.2
0.8
V
V
Dynamic Input Voltage
Maximum Low Level
ILD
1.2
Dynamic Input Voltage
@
@
for 54ACTQ 25 C is identical to 74ACTQ 25 C.
Note 1: I
§
§
CC
Note 2: Plastic DIP package.
@
Note 3: Max number of outputs defined as (n). Data Inputs are driven 0V to 3V. One output GND.
b
Note 4: Max number of Data Inputs (n) switching. (n 1) Inputs switching 0V to 3V (’ACTQ). Input-under-test switching: 3V to threshold (V ), 0V to threshold
ILD
e
(V ), f
IHD
1 MHz.
AC Electrical Characteristics
74ACQ
54ACQ
e b
74ACQ
e b
40 C
T
55 C
T
§
to 125 C
§
A
A
e a
A
V *
CC
(V)
T
25 C
§
50 pF
a
e
a
e
Symbol
Parameter
to 85 C
Units
§
50 pF
§
50 pF
e
C
L
C
C
L
L
Min
Typ
Max
Min
Max
Min
Max
t
t
t
, t
PHL PLH
Propagation Delay
Data to Output
3.3
5.0
2.0
1.5
7.0
5.0
9.0
6.0
1.0
1.0
12.5
9.0
2.0
1.5
9.5
6.5
ns
ns
ns
ns
, t
PZL PZH
Output Enable Time
3.3
5.0
2.5
1.5
8.0
6.5
12.0
8.0
1.0
1.0
12.0
10.0
2.5
1.5
12.5
8.5
, t
PHZ PLZ
Output Disable Time
3.3
5.0
1.0
1.0
9.0
7.5
13.5
9.0
1.0
1.0
11.5
10.0
1.0
1.0
14.0
9.5
t
t
Output to Output
3.3
5.0
1.0
0.5
1.5
1.0
1.5
1.0
OSHL,
Skew** Data to Output
OSLH
g
*Voltage Range 5.0 is 5.0V 0.5V.
g
Voltage Range 3.3 is 3.3V 0.3V.
**Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification
applies to any outputs switching in the same direction, either HIGH to LOW (t
) or LOW to HIGH (t
). Parameter guaranteed by design.
OSLH
OSHL
AC Electrical Characteristics
74ACTQ
54ACTQ
e b
74ACTQ
e b
40 C
T
55 C
T
A
§
to 125 C
§
A
e a
A
V *
CC
(V)
T
25 C
§
50 pF
a
e
a
e
Symbol
Parameter
to 85 C
Units
§
50 pF
§
50 pF
e
C
L
C
C
L
L
Min
Typ
Max
Min
Max
Min
Max
t , t
PHL PLH
Propagation Delay
Data to Output
5.0
1.5
5.5
6.5
1.5
9.0
1.5
7.0
ns
t
, t
PZL PZH
Output Enable Time
Output Disable Time
5.0
5.0
1.5
1.0
7.0
8.0
8.5
9.5
1.5
1.5
10.5
10.5
1.5
1.0
9.0
ns
ns
t , t
PHZ PLZ
10.0
t
t
Output to Output
OSHL,
5.0
0.5
1.0
1.0
ns
Skew** Data to Output
OSLH
g
*Voltage Range 5.0 is 5.0V 0.5V.
**Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification
applies to any outputs switching in the same direction, either HIGH to LOW (t
) or LOW to HIGH (t
). Parameter guaranteed by design.
OSLH
OSHL
4
Capacitance
Symbol
Parameter
Typ
Units
Conditions
e
e
C
C
Input Capacitance
4.5
pF
V
V
OPEN
5.0V
IN
CC
Power Dissipation
Capacitance
PD
CC
70
pF
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the noise
characteristics of FACT.
V
/V
OLP OLV
and V
/V :
OHP OHV
Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50X coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
#
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Measure V
and V
OLV
on the quiet output during the
and V on the quiet out-
#
#
OLP
HL transition. Measure V
OHP
put during the LH transition.
OHV
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF, 500X.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
2. Deskew the word generator so that no two channels have
greater than 150 ps skew between them. This requires
that the oscilloscope be deskewed first. Swap out the
channels that have more than 150 ps of skew until all
channels being used are within 150 ps. It is important to
deskew the word generator channels before testing. This
will ensure that the outputs switch simultaneously.
V
and V
:
IHD
ILD
Monitor one of the switching outputs using a 50X coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
#
3. Terminate all inputs and outputs to ensure proper loading
of the outputs and that the input levels are at the correct
voltage.
First increase the input LOW voltage level, V , until the
IL
output begins to oscillate. Oscillation is defined as noise
#
#
#
on the output LOW level that exceeds V limits, or on
IL
output HIGH levels that exceed V limits. The input
IH
LOW voltage level at which oscillation occurs is defined
4. Set V
to 5.0V.
CC
5. Set the word generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and affect the results of the measurement.
as V
.
ILD
Next increase the input HIGH voltage level on the word
generator, V until the output begins to oscillate. Oscilla-
IH
tion is defined as noise on the output LOW level that
6. Set the word generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for AC
devices. Verify levels with a digital volt meter.
exceeds V limits, or on output HIGH levels that exceed
IL
V
limits. The input HIGH voltage level at which oscilla-
.
IH
tion occurs is defined as V
IHD
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
TL/F/10235–4
FIGURE 1. Quiet Output Noise Voltage Waveforms
Note A. V
and V
are measured with respect to ground reference.
OLP
OHV
k
150 ps.
e
e
e
3 ns, t 3 ns, skew
f
Note B. Input pulses have the following characteristics: f
1 MHz, t
r
5
TL/F/10235–5
FIGURE 2. Simultaneous Switching Test Circuit
Ordering Information
The device number is used to form part of a simplified purchasing code where the package type and temperature range are
defined as follows:
74ACTQ 244
P
C
QR
Temperature Range Family
Special Variations
e
e
e
e
74ACQ
54ACQ
Commercial
Military
Commercial TTL-Compatible
Military TTL-Compatible
X
QR
Devices shipped in 13 reels
×
Commercial grade device with
burn-in
e
e
74ACTQ
54ACTQ
e
QB
Military grade device with
environmental and burn-in
processing shipped in tubes
Device Type
Package Code
Temperature Range
e
e
e
e
e
e
e
P
D
F
L
S
QS
Plastic DIP
Ceramic DIP
Flatpak
Leadless Chip Carrier (LCC)
Small Outline Package (SOIC)
Quarter Size Outline Package (QSOP)
b a
C
Commercial ( 40 C to 85 C)
§
§
e
b a
Military ( 55 C to 125 C)
M
§
§
6
Physical Dimensions inches (millimeters)
20-Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
20-Lead Ceramic Dual-In-Line Package (D)
NS Package Number J20A
7
Physical Dimensions inches (millimeters) (Continued)
20-Lead Small Outline Integrated Circuit (S)
NS Package Number M20B
20-Lead Quarter Size Outline Package (QS)
NS Package Number MQA20
8
Physical Dimensions inches (millimeters) (Continued)
20-Lead Plastic Dual-In-Line Package (P)
NS Package Number N20B
20-Lead Plastic Chip Carrier (Q)
NS Package Number V20A
9
Ý
Lit. 114674
Physical Dimensions inches (millimeters) (Continued)
20-Lead Ceramic Flatpak (F)
NS Package Number W20A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and whose
failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
National Semiconductor
Corporation
2900 Semiconductor Drive
P.O. Box 58090
Santa Clara, CA 95052-8090
Tel: 1(800) 272-9959
TWX: (910) 339-9240
National Semiconductor
GmbH
Livry-Gargan-Str. 10
D-82256 Furstenfeldbruck
Germany
Tel: (81-41) 35-0
Telex: 527649
Fax: (81-41) 35-1
National Semiconductor National Semiconductor
National Semiconductores
Do Brazil Ltda.
Rue Deputado Lacorda Franco
120-3A
Sao Paulo-SP
Brazil 05418-000
Tel: (55-11) 212-5066
Telex: 391-1131931 NSBR BR
Fax: (55-11) 212-1181
National Semiconductor
(Australia) Pty, Ltd.
Building 16
Business Park Drive
Monash Business Park
Nottinghill, Melbourne
Victoria 3168 Australia
Tel: (3) 558-9999
Japan Ltd.
Hong Kong Ltd.
Sumitomo Chemical
Engineering Center
Bldg. 7F
13th Floor, Straight Block,
Ocean Centre, 5 Canton Rd.
Tsimshatsui, Kowloon
1-7-1, Nakase, Mihama-Ku Hong Kong
Chiba-City,
Tel: (852) 2737-1600
Fax: (852) 2736-9960
Ciba Prefecture 261
Tel: (043) 299-2300
Fax: (043) 299-2500
Fax: (3) 558-9998
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
相关型号：
54ACTQ244DMQB-R
IC ACT SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, CDIP20, CERAMIC, DIP-20, Bus Driver/Transceiver
NSC
54ACTQ244FMQB-R
IC ACT SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, CDFP20, CERAMIC, DFP-20, Bus Driver/Transceiver
NSC
©2020 ICPDF网 联系我们和版权申明