54ACQ245FMQB [TI]
AC SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, CDFP20, CERAMIC, FP-20;
| 型号： | 54ACQ245FMQB |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | AC SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, CDFP20, CERAMIC, FP-20 CD 输出元件 |
| 文件： | 总8页 (文件大小：146K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
September 1998
54ACQ245 • 54ACTQ245
Quiet Series Octal Bidirectional Transceiver with
TRI-STATE® Inputs/Outputs
General Description
Features
n ICC and IOZ reduced by 50%
The ’ACQ/’ACTQ245 contains eight non-inverting bidirec-
tional buffers with TRI-STATE outputs and is intended for
bus-oriented applications. Current sinking capability is
24 mA at both the A and B ports. The Transmit/Receive (T/R)
input determines the direction of data flow through the bidi-
rectional transceiver. Transmit (active-HIGH) enables data
from A ports to B ports; Receive (active-LOW) enables data
from B ports to A ports. The Output Enable input, when
HIGH, disables both A and B ports by placing them in a HIGH
Z condition.
n Guaranteed simultaneous switching noise level and
dynamic threshold performance
n Improved latch-up immunity
n TRI-STATE outputs drive bus lines or buffer memory
address registers
n Outputs source/sink 24 mA
n Faster prop delays than the standard ’ACT245
n 4 kV minimum ESD immunity (’ACQ)
n Standard Military Drawing (SMD)
— ’ACTQ245: 5962-92187
The ’ACQ/’ACTQ utilizes NSC Quiet Series technology to
guarantee quiet output switching and improve dynamic
threshold performance. FACT Quiet Series
— ’ACQ245: 5962-92177
™
features
™
GTO output control and undershoot corrector in addition to
a split ground bus for superior performance.
Logic Symbols
IEEE/IEC
DS100237-1
DS100237-2
Pin
Description
Names
OE
Output Enable Input
T/R
Transmit/Receive Input
A0–A7
B0–B7
Side A TRI-STATE Inputs or TRI-STATE Outputs
Side B TRI-STATE Inputs or TRI-STATE Outputs
™
GTO is a trademark of National Semiconductor Corporation.
TRI-STATE® is a registered trademark of National Semiconductor Corporation.
FACT® is a registered trademark of Fairchild Semiconductor Corporation.
™
FACT Quiet Series is a trademark of Fairchild Semiconductor Corporation.
© 1998 National Semiconductor Corporation
DS100237
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Connection Diagrams
Pin Assignment for
DIP and Flatpak
Pin Assignment
for LCC
DS100237-4
DS100237-3
Truth Table
Inputs
Outputs
OE
L
T/R
L
Bus B Data to Bus A
Bus A Data to Bus B
HIGH-Z State
L
H
H
X
=
=
=
H
L
X
HIGH Voltage Level
LOW Voltage Level
Immaterial
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2
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Supply Voltage (VCC
)
’ACQ
2.0V to 6.0V
4.5V to 5.5V
0V to VCC
Supply Voltage (VCC
)
−0.5V to +7.0V
’ACTQ
DC Input Diode Current (IIK
)
Input Voltage (VI)
=
VI −0.5V
−20 mA
+20 mA
Output Voltage (VO
)
0V to VCC
=
VI VCC + 0.5V
Operating Temperature (TA)
54ACQ/ACTQ
DC Input Voltage (VI)
−0.5V to VCC + 0.5V
−55˚C to +125˚C
DC Output Diode Current (IOK
)
Minimum Input Edge Rate ∆V/∆t
’ACQ Devices
=
VO −0.5V
−20 mA
+20 mA
=
VO VCC + 0.5V
% to 70% of V
VIN from 30
CC
DC Output Voltage (VO
DC Output Source
)
−0.5V to VCC + 0.5V
@
VCC 3.0V, 4.5V, 5.5V
125 mV/ ns
125 mV/ns
Minimum Input Edge Rate ∆V/∆t
±
±
or Sink Current (IO
)
50 mA
’ACTQ Devices
VIN from 0.8V to 2.0V
DC VCC or Ground Current
per Output Pin (ICC or IGND
@
VCC 4.5V, 5.5V
)
50 mA
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT® circuits outside databook specifications.
Storage Temperature (TSTG
DC Latch-Up Source or
Sink Current
)
−65˚C to +150˚C
±
300 mA
175˚C
Junction Temperature (TJ)
CDIP
DC Characteristics for ’ACQ Family Devices
54ACQ
=
Symbol
Parameter
VCC
(V)
TA
Units
Conditions
−55˚C to +125˚C
Guaranteed Limits
=
VIH
Minimum High
Level Input
Voltage
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
2.1
3.15
3.85
0.9
VOUT 0.1V
V
V
V
or VCC − 0.1V
=
VIL
Maximum Low
Level Input
Voltage
VOUT 0.1V
1.35
1.65
2.9
or VCC − 0.1V
=
VOH
Minimum High
Level Output
Voltage
IOUT −50 µA
4.4
5.4
(Note 2)
=
VIN VIL or VIH
3.0
4.5
5.5
3.0
4.5
5.5
2.4
3.7
4.7
0.1
0.1
0.1
−12 mA
V
V
IOH
−24 mA
−24 mA
=
IOUT 50 µA
VOL
Maximum Low
Level Output
Voltage
(Note 2)
=
VIN VIL or VIH
3.0
4.5
5.5
5.5
0.50
0.50
0.50
12 mA
V
IOL
24 mA
24 mA
=
±
IIN
Maximum Input
Leakage Current
1.0
µA
VI VCC, GND
(Note 4)
3
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DC Characteristics for ’ACQ Family Devices (Continued)
54ACQ
=
Symbol
Parameter
VCC
(V)
TA
Units
Conditions
−55˚C to +125˚C
Guaranteed Limits
50
=
VOLD 1.65V Max
IOLD
IOHD
ICC
(Note 3) Minimum
Dynamic Output
Current
5.5
5.5
5.5
mA
mA
µA
=
VOHD 3.85V Min
−50
=
Maximum Quiescent
Supply Current
Maximum I/O
80.0
VIN VCC
or GND (Note 4)
=
IOZT
VI(OE) VIL, VIH
=
±
Leakage Current
5.5
5.0
5.5
µA
V
VI VCC, GND
=
VO VCC, GND
VOLP
Quiet Output
1.5
Maximum Dynamic
VOL
(Note 5)
(Note 5)
VOLV
Quiet Output
5.0
−1.2
V
Minimum Dynamic
VOL
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
@
@
Note 4:
I
and I
CC
3.0V are guaranteed to be less than or equal to the respective limit 5.5V V .
IN
CC
@
Note 5: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V; one output GND.
DC Characteristics for ’ACTQ Family Devices
54ACTQ
=
Symbol
Parameter
VCC
(V)
TA
Units
Conditions
−55˚C to +125˚C
Guaranteed Limits
=
VIH
VIL
Minimum High Level
Input Voltage
4.5
5.5
4.5
5.5
4.5
5.5
2.0
2.0
0.8
0.8
4.4
5.4
V
V
V
VOUT 0.1V
or VCC − 0.1V
=
Maximum Low Level
Input Voltage
VOUT 0.1V
or VCC − 0.1V
=
VOH
Minimum High Level
Output Voltage
IOUT −50 µA
(Note 6)
=
VIN VIL or VIH
IOH −24 mA
−24 mA
4.5
5.5
4.5
5.5
3.70
4.70
0.1
V
V
=
VOL
Maximum Low Level
Output Voltage
IOUT 50 µA
0.1
(Note 6)
=
VIN VIL or VIH
IOL 24 mA
24 mA
4.5
5.5
5.5
0.50
0.50
V
=
±
IIN
Maximum Input
1.0
µA
µA
VI VCC, GND
Leakage Current
Maximum TRI-STATE
Leakage Current
=
±
IOZT
5.5
5.0
VI VIL, VIH
=
VO VCC, GND
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4
DC Characteristics for ’ACTQ Family Devices (Continued)
54ACTQ
=
Symbol
Parameter
VCC
(V)
TA
Units
Conditions
−55˚C to +125˚C
Guaranteed Limits
1.6
=
VI VCC − 2.1V
ICCT
Maximum
CC/Input
5.5
mA
I
=
VOLD 1.65V Max
IOLD
IOHD
ICC
(Note 7) Minimum
Dynamic Output
Current
5.5
5.5
5.5
50
mA
mA
µA
=
VOHD 3.85V Min
−50
80.0
=
Maximum Quiescent
Supply Current
Quiet Output
VIN VCC
or GND
VOLP
5.0
5.0
1.65
−1.2
V
V
Maximum Dynamic
VOL
(Note 8)
VOLV
Quiet Output
Minimum Dynamic
VOL
(Note 8)
Note 6: All outputs loaded; thresholds on input associated with output under test.
Note 7: Maximum test duration 2.0 ms, one output loaded at a time.
@
Note 8: Max number of outputs defined as (n). n−1 Data Inputs are driven 0V to 3V; one output GND.
AC Electrical Characteristics for ’ACQ Devices
54ACQ
=
VCC
(V)
TA −55˚C
Fig.
No.
Symbol
Parameter
to +125˚C
Units
=
CL 50 pF
(Note 9)
Min
1.5
1.5
1.5
1.5
1.5
1.5
Max
t
t
t
PHL, tPLH
PZL, tPZH
PHZ, tPLZ
Propagation Delay
Data to Output
3.0
4.5
3.0
4.5
3.0
4.5
11.5
10.0
13.0
10.0
13.0
10.0
ns
ns
ns
Output Enable Time
Output Disable Time
±
Note 9: Voltage Range 5.0 is 5.0V 0.5V
±
Voltage Range 3.3 is 3.3V 0.3V
5
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AC Electrical Characteristics for ’ACTQ Devices
54ACTQ
=
VCC
(V)
TA −55˚C
Fig.
No.
Symbol
Parameter
to +125˚C
Units
=
CL 50 pF
(Note 10)
Min
Max
t
PHL, tPLH
Propagation Delay
Data to Output
5.0
1.5
9.0
ns
t
t
PZL, tPZH
PHZ, tPLZ
Output Enable Time
Output Disable Time
5.0
5.0
1.5
1.5
12.0
11.5
ns
ns
±
Note 10: Voltage Range 5.0 is 5.0V 0.5V
Capacitance
Symbol
Parameter
Input Capacitance
Input/Output
Typ
4.5
15
Units
Conditions
=
VCC OPEN
CIN
pF
pF
=
VCC 5.0V
CI/O
CPD
Capacitance
=
VCC 5.0V
Power Dissipation
Capacitance
80.0
pF
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6
Physical Dimensions inches (millimeters) unless otherwise noted
20-Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
20-Lead Ceramic Dual-In-Line Package (D)
NS Package Number J20A
7
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Ceramic Flatpak (F)
NS Package Number W20A
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ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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