HAL2455UT [TDK]
线性霍尔传感器;型号: | HAL2455UT |
厂家: | TDK ELECTRONICS |
描述: | 线性霍尔传感器 传感器 |
文件: | 总38页 (文件大小:619K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Hardware
Documentation
Data Sheet
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HAL® 2455
High-Precision Programmable Linear
Hall-Effect Sensor with PWM Output
Edition May 20, 2021
June 12426, 201254
DSH000173_003EN
TPSD000000020141__0000012EE1NN
DATA SHEET
HAL 2455
Copyright, Warranty, and Limitation of Liability
The information and data contained in this document are believed to be accurate and reli-
able. The software and proprietary information contained therein may be protected by
copyright, patent, trademark and/or other intellectual property rights of TDK-Micronas. All
rights not expressly granted remain reserved by TDK-Micronas.
TDK-Micronas assumes no liability for errors and gives no warranty representation or
guarantee regarding the suitability of its products for any particular purpose due to
these specifications.
By this publication, TDK-Micronas does not assume responsibility for patent infringements
or other rights of third parties which may result from its use. Commercial conditions, prod-
uct availability and delivery are exclusively subject to the respective order confirmation.
Any information and data which may be provided in the document can and do vary in
different applications, and actual performance may vary over time.
All operating parameters must be validated for each customer application by customers’
technical experts. Any mention of target applications for our products is made without a
claim for fit for purpose as this has to be checked at system level.
Any new issue of this document invalidates previous issues. TDK-Micronas reserves
the right to review this document and to make changes to the document’s content at any
time without obligation to notify any person or entity of such revision or changes. For
further advice please contact us directly.
Do not use our products in life-supporting systems, military, aviation, or aerospace
applications! Unless explicitly agreed to otherwise in writing between the parties,
TDK-Micronas’ products are not designed, intended or authorized for use as compo-
nents in systems intended for surgical implants into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the
product could create a situation where personal injury or death could occur.
No part of this publication may be reproduced, photocopied, stored on a retrieval sys-
tem or transmitted without the express written consent of TDK-Micronas.
TDK-Micronas Trademarks
– HAL
Third-Party Trademarks
All other brand and product names or company names may be trademarks of their
respective companies.
TDK-Micronas GmbH
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DATA SHEET
HAL 2455
Contents
Page
Section
Title
4
5
5
1.
1.1.
1.2.
Introduction
Major Applications
Features
6
2.
Ordering Information
6
2.1.
Device-Specific Ordering Codes
7
7
3.
3.1.
Functional Description
General Function
9
9
9
3.2.
Signal Path and Register Definition
Signal Path
Register Definition
3.2.1.
3.2.2.
3.2.2.1.
3.2.2.2.
3.2.2.3.
3.2.2.4.
3.3.
10
13
17
18
19
20
RAM registers
EEPROM Registers
NVRAM Registers
Setpoint Linearization Accuracy
On-Board Diagnostic Features
Calibration of the Sensor
3.4.
21
21
27
27
27
27
28
29
29
30
31
31
32
4.
Specifications
Outline Dimensions
Soldering, Welding and Assembly
Pin Connections and Short Descriptions
Sensitive Area
4.1.
4.2.
4.3.
4.4.
4.4.1.
4.5.
4.5.1.
4.6.
4.7.
4.8.
4.9.
4.9.1.
Dimensions
Absolute Maximum Ratings
Storage and Shelf Life
Recommended Operating Conditions
Characteristics
Overvoltage and Undervoltage Detection
Magnetic Characteristics
Definition of Sensitivity Error ES
33
33
33
34
34
34
5.
Application Notes
Application Circuit
Measurement of a PWM Output Signal of HAL 2455
Use of two HAL 2455 in Parallel
Ambient Temperature
5.1.
5.2.
5.3.
5.4.
5.5.
EMC and ESD
35
35
37
37
6.
Programming of the Sensor
Programming Interface
Programming Environment and Tools
Programming Information
6.1.
6.2.
6.3.
38
7.
Document History
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DATA SHEET
HAL 2455
High-Precision Programmable Linear Hall-Effect Sensor with PWM Output
Release Note: Revision bars indicate significant changes to the previous edition.
1. Introduction
The HAL 2455 is a member of the HAL 24xy family of programmable linear Hall-effect
sensors from TDK-Micronas.
The device is a universal magnetic-field sensor based on the Hall effect featuring a
PWM output. Major characteristics like magnetic-field range, and sensitivity are pro-
grammable in a non-volatile memory. The sensor offers wire-break detection.
The HAL 2455 offers 16 setpoints to change the output characteristics from linear to
arbitrary or vice versa.
The HAL 2455 features a temperature-compensated Hall plate with spinning-current
offset compensation, an A/D converter, digital signal processing, a PWM output mod-
ule, an EEPROM with redundancy and lock function for calibration data, a serial inter-
face for programming the EEPROM, and protection devices at all pins. The internal dig-
ital signal processing prevents the signal being influenced by analog offsets,
temperature shifts, and mechanical stress.
The easy programmability allows a 2-point calibration by adjusting the output signal
directly to the input signal (like mechanical angle, distance, or current). Individual
adjustment of each sensor during the final manufacturing process is possible. With this
calibration procedure, the tolerances of the sensor, the magnet and the mechanical
positioning can be compensated in the final assembly.
In addition, the temperature compensation of the Hall IC can be fit to all common mag-
netic materials by programming first- and second-order temperature coefficients of the
Hall sensor sensitivity.
It is also possible to compensate offset drift over temperature generated by the cus-
tomer application with a first-order temperature coefficient for the sensor’s offset. This
enables operation over the full temperature range with high accuracy.
The calculation of the individual sensor characteristics and the programming of the
EEPROM can easily be done with a PC and the application kit from TDK-Micronas.
The sensor is designed for stringent industrial and automotive applications and is
AECQ100 qualified. It operates with typically 5 V supply voltage in the junction tem-
perature range from 40 °C up to 170 °C. The HAL 2455 is available in the 3-pin
package TO92UT-1/-2 and SOIC8 SMD packages.
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DATA SHEET
HAL 2455
1.1. Major Applications
Due to the sensor’s versatile programming characteristics and low temperature drifts,
the HAL 2455 is the optimal system solution for applications such as:
– Contactless potentiometers,
– Angle sensors (e.g. for transmission applications)
– Distance and linear movement measurements
1.2. Features
– High-precision linear Hall-effect sensor with 12-bit accuracy and PWM output up to
2 kHz
– 16 setpoints for various output signal shapes
– 16 bit digital signal processing
– Multiple customer-programmable magnetic characteristics in a non-volatile memory
with redundancy and lock function
– Programmable temperature compensation for sensitivity and offset
– Magnetic field measurements in the range up to 200 mT
– Active open-circuit (ground and supply line break detection) with 5 k pull-up and
pull-down resistor, overvoltage and undervoltage detection
– Programmable clamping function
– Digital readout of temperature and magnetic field information in calibration mode
– Programming and operation of multiple sensors at the same supply line
– High immunity against mechanical stress, ESD, and EMC
– Operates from TJ=40 °C up to 170 °C
– Operates from 4.5 V up to 5.5 V supply voltage in specification and functions up to
8.5 V
– Operates with static magnetic fields and dynamic magnetic fields up to 2 kHz
– Overvoltage and reverse-voltage protection at all pins
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DATA SHEET
HAL 2455
2. Ordering Information
A Micronas device is available in a variety of delivery forms. They are distinguished by a
specific ordering code:
XXXNNNNPA-T-C-P-Q-SP
Further Code Elements
Temperature Range
Package
Product Type
Product Group
Fig. 2–1: Ordering Code Principle
For a detailed information, please refer to the brochure: “Micronas Sensors and Control-
lers: Ordering Codes, Packaging, Handling”.
2.1. Device-Specific Ordering Codes
HAL 2455 is available in the following package and temperature variants.
Table 2–1: Available packages
Package Code (PA)
Package Type
TO92UT-1/-2
SOIC8-1
UT
DJ
Table 2–2: Available temperature range
Temperature Code (T)
Temperature Range
T = 40 °C to +170 °C
A
J
The relationship between ambient temperature (TA) and junction temperature (TJ) is
explained in Section 5.4. on page 34.
For available variants for Configuration (C), Packaging (P), Quantity (Q), and Special
Procedure (SP) please contact TDK-Micronas.
Table 2–3: Available ordering codes and corresponding package marking
Available Ordering Codes
HAL2455UT-A-[C-P-Q-SP]
HAL2455DJ-A-[C-P-Q-SP]
Package Marking
2455A
2455A
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DATA SHEET
HAL 2455
3. Functional Description
3.1. General Function
The HAL 2455 is an integrated circuit which provides a PWM output signal proportional
to the magnetic flux through the Hall plate.
The external magnetic field component perpendicular to the branded side of the pack-
age generates a Hall voltage. The Hall IC is sensitive to magnetic north and south polar-
ity. This voltage is converted to a digital value, processed in the Digital Signal Process-
ing Unit (DSP) according to the settings of the EEPROM registers, and output as PWM
signal.
The setting of a LOCK bit disables the programming of the EEPROM memory for all
time. This bit cannot be reset by the customer.
As long as the LOCK bit is not set, the output characteristic can be adjusted by pro-
gramming the EEPROM registers. The IC is addressed by modulating the output voltage.
In the supply voltage range from 4.5 V up to 5.5 V, the sensor generates a PWM signal.
After detecting a command, the sensor reads or writes the memory and answers with a
digital signal on the output pin. Several sensors in parallel to the same supply and
ground line can be programmed individually. The selection of each sensor is done via
its output pin. See “Programming Guide HAL 24xy and HAR 24xy”.
The open-circuit detection provides a defined output voltage if the VSUP or GND line is
broken.
Internal temperature compensation circuitry and the spinning-current offset compensa-
tion enable operation over the full temperature range with minimal changes in accuracy
and high offset stability. The circuitry also reduces offset shifts due to mechanical stress
from the package. In addition, the sensor IC is equipped with devices for overvoltage
and reverse-voltage protection at all pins.
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DATA SHEET
HAL 2455
VSUP
Internally
Open-circuit,
Overvoltage,
Undervoltage
Detection
Temperature
Dependent
Bias
Stabilized
Supply and
Protection
Devices
Protection
Devices
Oscillator
Digital
Signal
Processing
OUT
Linearization
16 Setpoints
PWM
Output
Switched
Hall Plate
A/D
Converter
EEPROM Memory
Lock Control
Programming
Interface
Temperature
Sensor
A/D
Converter
GND
Fig. 3–1: HAL 2455 block diagram
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DATA SHEET
HAL 2455
3.2. Signal Path and Register Definition
3.2.1. Signal Path
CFX
SETPT_IN
MIC_COMP
SETPT
CUST_COMP
Hall-Plate
Micronas
Customer
Offset & Gain
Trimming
Gain & Offset
Scaling block
DAC Gain
& Offset
Scaling
Setpoint
Linearization
A
Offset & Gain
Trimming
D
TEMP_ADJ
Micronas
Temp-Sensor
Trimming
Output
Clamping
PWM
Modulator
- C -
Temp-Sensor
OUT
GAINOFF
DAC
Fig. 3–2: Signal path of HAL 2455
3.2.2. Register Definition
The DSP is the major part of this sensor and performs the signal conditioning. The
parameters for the DSP are stored in the EEPROM registers. The details are shown in
Fig. 3–2 and Fig. 3–3.
Terminology:
GAIN: Name of the register or register value
Gain: Name of the parameter
The sensors signal path contains two kinds of registers. Registers that are readout only
(RAM) and programmable registers (EEPROM & NVRAM). The RAM registers contain
measurement data at certain positions of the signal path and the EEPROM registers
have influence on the sensors signal processing.
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DATA SHEET
HAL 2455
3.2.2.1. RAM registers
TEMP_ADJ
The TEMP_ADJ register contains the calibrated temperature sensor information.
TEMP_ADJ can be used for the sensor calibration over temperature. This register has a
length of 16 bit and it is two’s-complement coded. Therefore the register value can vary
between 32768...32767.
CFX
The CFX register is representing the magnetic field information directly after A/D con-
version, decimation filter and magnetic range (barrel shifter) selection. The register con-
tent is not temperature compensated. The temperature variation of this register is spec-
ified in Section 4.9. on page 31 by the parameter RANGEABS
.
Note
During application design, it must be taken into consideration that CFX
should never overflow in the operational range of the specific application
and especially over the full temperature range. In case of a potential over-
flow the barrel shifter should be switched to the next higher range.
This register has a length of 16 bit and it is two’s-complement coded. Therefore, the
register value can vary between 32768...32767. CFX register values will increase for
positive magnetic fields (south pole) on the branded side of the package (positive CFX
values) and it will decrease with negative magnetic field polarity.
MIC_COMP
The MIC_COMP register is representing the magnetic field information directly after the
Micronas temperature trimming. The register content is temperature compensated and
has a typical gain drift over temperature of 0 ppm/k. Also the offset and its drift over
temperature is typically zero. The register has a length of 16 bit and it is two’s-comple-
ment coded. Therefore the register value can vary between 32768...32767.
CUST_COMP
The CUST_COMP register is representing the magnetic field information after the cus-
tomer temperature trimming. For HAL 2455 it is possible to set a customer specific gain
of second order over temperature as well as a customer specific offset of first order over
temperature. The customer gain and offset can be set with the EEPROM registers
TCCO0, TCCO1 for offset and TCCG0...TCCG2 for gain. Details of these registers are
described on the following pages.
The register has a length of 16 bit and it is two’s-complement coded. Therefore the reg-
ister value can vary between 32768...32767.
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DATA SHEET
HAL 2455
SETPT_IN
The SETPT_IN register offers the possibility to read the magnetic field information after
the scaling of the input signal to the input range of the linearization block. For further
details see the description of the EEPROM registers SCALE_GAIN and
SCALE_OFFSET that are described in the next chapter.
The register has a length of 16 bit and it is two’s-complement coded. Therefor the regis-
ter value can vary between 32768...32767.
SETPT
The SETPT register offers the possibility to read the magnetic field information after the
linearization of the magnetic field information with 16 setpoints. This information is also
required for the correct setting of the sensors DAC GAIN and OFFSET in the following
block.
The register has a length of 16 bit and it is two’s-complement coded. Therefore the reg-
ister value can vary between 32768...32767.
GAINOFF
The GAINOFF register offers the possibility to read the magnetic field information after
the DAC GAIN and OFFSET scaling.
This register has a length of 16 bit and it is two’s-complement coded. Therefore the reg-
ister value can vary between 32768...32767.
MIC_ID1 and MIC_ID2
The two registers MIC_ID1 and MIC_ID2 are used by TDK-Micronas to store production
information like, wafer number, die position on wafer, production lot, etc. Both registers
have a length of 16 bit each and are readout only.
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DATA SHEET
HAL 2455
PWM Frequency
The PWM frequency is selectable by 2 bits, which are part of the CUSTOMER SETUP register (bits
11:10). The CUSTOMER SETUP register is described on the following pages. The following four dif-
ferent frequencies can be used:
Table 3–1: Selectable PWM frequencies
PWM_FREQ
Frequency
Resolution
Bit 11
Bit 10
1
0
0
1
1
0
1
0
2 kHz
11 bit
12 bit
12 bit
12 bit
1 kHz
500 Hz
250 Hz
DIAGNOSIS
The DIAGNOSIS register enables the customer to identify certain failures detected by
the sensor. HAL 2455 performs certain self tests during power-up of the sensor and
also during normal operation. The result of these self tests is stored in the DIAGNOSIS
register. DIAGNOSIS register is a 16 bit register.
Bit No.
15:6
5
Function
Description
None
Reserved
State Machine (DSP)
Self test
This bit is set to 1 in case that the statema-
chine self test fails.
(continuously running)
4
EEPROM Self test
ROM Check
This bit is set to 1 in case that the EEPROM
self test fails.
(Performed during power-up only)
3
This bit is set to 1 in case that ROM parity
check fails.
(continuously running)
2
AD converter overflow
None
This bit is set to 1 in case the input signal is
too high, indicating a problem with the mag-
netic range.
1:0
Reserved
Details on the sensor self tests can be found in Section 3.3. on page 19.
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DATA SHEET
HAL 2455
PROG_DIAGNOSIS
The PROG_DIAGNOSIS register enables the customer to identify errors occurring dur-
ing programming and writing of the EEPROM or NVRAM memory. The customer must
either check the status of this register after each write or program command or alterna-
tively the second acknowledge. Please check the Programming Guide for HAL 24xy.
The PROG_DIAGNOSIS register is a 16 bit register. The following table shows the dif-
ferent bits indicating certain errors possibilities.
Bit no.
15:11
10
Function
Description
None
Reserved
Charge Pump Error
This bit is set to 1 in case that the internal
programming voltage was to low
9
Voltage Error during
Program/Erase
This bit is set to 1 in case that the internal
supply voltage was to low during program or
erase
8
NVRAM Error
Programming
This bit is set to 1 in case that the program-
ming of the NVRAM failed
7:0
For further information please refer to the
Programming Guide for HAL 24xy
3.2.2.2. EEPROM Registers
EEPROM
SCALE_GAIN
SCALE_OFFSET
SETPOINTx
TCCOx
TCCGx
DAC_GAIN
DAC_OFFSET
CUSTOMER SETUP
Hall-Plate
Micronas
Offset & Gain
Trimming
Customer
Offset & Gain
Trimming
DAC Gain
& Offset
Scaling
Offset & Gain
Scaling
Setpoint
Linearization
A
D
Digital Signal Processing
Temp-Sensor
Micronas
Output
Clamping
Temp-Sensor
Trimming
-
C
-
PWM
Out
DAC_CMPLO
DAC_CMPHI
Fig. 3–3: Details of EEPROM and Digital Signal Processing
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DATA SHEET
HAL 2455
CUST_ID1 and CUST_ID2
The two registers CUST_ID1 and CUST_ID2 can be used to store customer informa-
tion. Both registers have a length of 16 bit each.
Barrel Shifter (Magnetic Ranges)
The signal path of HAL 2455 contains a Barrel Shifter to emulate magnetic ranges. The
customer can select between different magnetic ranges by changing the Barrel shifter
setting. After decimation filter the signal path has a word length of 22 bit. The Barrel
Shifter selects 16 bit out of the available 22 bit.
Table 3–2: Relation between Barrel Shifter setting and emulated magnetic range
BARREL SHIFTER
Used bits
22...7
Typ. magnetic range
not used
0
1
2
3
4
5
6
21...6
20...5
19...4
18...3
17...2
16...1
200 mT
100 mT
50 mT
25 mT
12 mT
6 mT
The Barrel Shifter bits are part of the CUSTOMER SETUP register (bits 14...12). The
CUSTOMER SETUP register is described on the following pages.
Note
In case that the external field exceeds the magnetic field range, the CFX
register will be clamped either to 32768 or 32767 depending on the sign
of the magnetic field.
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DATA SHEET
HAL 2455
Magnetic Sensitivity TCCG
The TCCG (Sensitivity) registers (TCCG0...TCCG2) contain the customer setting tem-
perature dependant gain factor. The multiplication factor is a second order polynomial
of the temperature.
All three polynomial coefficients have a bit length of 16 bit and they are two’s-comple-
ment coded. Therefore the register values can vary between 32768...32767. In case
that the target polynomial is based on normalized values, then each coefficient can
vary between 4 ... +4. To store each coefficient into the EEPROM it is necessary to
multiply the normalized coefficients with 32768.
Example:
– Tccg0 = 0.5102 => TCCG0 = 16719
– Tccg1 = 0.0163 => TCCG1 = 536
– Tccg2 = 0.0144 => TCCG2 = 471
In case that the polynomial was calculated based on not normalized values of
TEMP_ADJ and MIC_COMP, then it is not necessary to multiply the polynomial coeffi-
cients with a factor of 32768.
Magnetic Offset TCCO
The TCCO (Offset) registers (TCCO0 and TCCO1) contain the parameters for tempera-
ture dependant offset correction. The offset value is a first order polynomial of the tem-
perature.
Both polynomial coefficients have a bit length of 16 bit and they are two’s-complement
coded. Therefore the register values can vary between 32768...32767.
In case that the target polynomial is based on normalized values, then each coefficient
can vary between 4 ... +4. To store each coefficient into the EEPROM it is necessary
to multiply the normalized coefficients with 32768.
In case that the polynomial was calculated based on not normalized values of
TEMP_ADJ and MIC_COMP, then it is not necessary to multiply the polynomial coeffi-
cients.
SETPOINTS
HAL 2455 features a linearization function based on 16 setpoints. The setpoint linear-
ization in general allows to linearize a given output characteristic by applying the
inverse compensation curve.
Each of the 16 setpoints (SETPT) registers has a length of 16 bit. The setpoints have to
be computed and stored in a differential way. This means that if all setpoints are set
to 0, then the linearization is set to neutral and a linear curve is used.
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DATA SHEET
HAL 2455
Sensitivity and Offset Scaling before Setpoint Linearization SCALE_GAIN/
SCALE_OFFSET
The setpoint linearization uses the full 16 bit number range 0...32767 (only positive val-
ues possible). So the signal path should be properly scaled for optimal usage of all
16 setpoints.
For optimum usage of the number range an additional scaling stage is added in front of
the set point algorithm. The setpoint algorithm allows positive input numbers only.
The input scaling for the linearization stage is done with the EEPROM registers
SCALE_GAIN and SCALE_OFFSET. The register content is calculated based on the
calibration angles. Both registers have a bit length of 16 bit and are two’s-comple-
mented coded.
Output Signal Scaling with DAC_GAIN/DAC_OFFSET
The required output duty cycle of the output is defined by the registers DAC_GAIN
(Gain of the output) and DAC_OFFSET (Offset of the output signal). Both register val-
ues can be calculated based on the angular range and the required output PWM duty
cycle range. They have a bit length of 16 bit and are two’s-complemented coded.
Clamping Levels DAC_CMPHI/DAC_CMPLO
The clamping levels DAC_CMPHI and DAC_CMPLO define the duty cycle of the output
and define the diagnosis band for the sensor output. Both registers have a bit length of
16 bit and are two’s-complemented coded. Both clamping levels can have values
between 0% and 100% of full scale.
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DATA SHEET
HAL 2455
3.2.2.3. NVRAM Registers
Customer Setup
The CUST_SETUP register is a 16 bit register that enables the customer to activate
various functions of the sensor like customer burn-in mode, diagnosis modes, function-
ality mode, customer lock, etc.
Bit OP configures the PWM output polarity: a PWM period starts either with a high pulse
(OP = 0) or with a low pulse (OP = 1). Please note that OP set to 1 is only effective after
the device had been locked (LC=1)
Table 3–3: Functions in CUST_SETUP register
Bit No.
15
Function
None
Description
Reserved
14:12
Barrel Shifter
Magnetic Range
(see Section Table 3–2: on page 14)
11:10
PWM frequency setting
PWM frequency selection
(see Table 3–1 on page 12)
9:8
7
None
Reserved
PWM Output Polarity (OP)
0: PWM period starts with a high pulse
1: PWM period starts with a low pulse (effective
after LC=1)
6
5
4
None
Reserved
1: Normal
Functionality Mode
Communication Mode (POUT)
Communication via output pin
0: Disabled
1: Enabled
3
2
Overvoltage Detection
Diagnosis Latch
0: Overvoltage detection active
1: Overvoltage detection disabled
Latching of diagnosis bits
0: No latching
1: Latched till next POR (power-on reset)
1
0
Diagnosis
0: Diagnosis errors force the PWM output into
error mode (see Table 3–4)
1: Diagnosis errors do not force the PWM output
into error mode
Customer Lock (LC)
Bit must be set to 1 to lock the sensor memory
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DATA SHEET
HAL 2455
3.2.2.4. Setpoint Linearization Accuracy
The set point linearization in general allows to linearize a given output characteristic by
applying the inverse compensation curve.
For this purpose the compensation curve will be divided into 16 segments with equal
distance. Each segment is defined by two setpoints, which are stored in EEPROM.
Within the interval, the output is calculated by linear interpolation according to the posi-
tion within the interval.
4
x 10
4
3
2
1
0
-1
-2
Linearized
Distorted
Compensation
-3
-4
-4
-3
-2
-1
0
1
2
3
4
4
x 10
Fig. 3–4: Linearization - Principle
ysn+1
yl
ysn
xnl: non linear distorted input value
yl: linearized value
remaining error
xsn xnl
xsn+1
input
Fig. 3–5: Linearization - Detail
The constraint of the linearization is that the input characteristic has to be a monotonic
function. In addition to that it is recommended that the input does not have a saddle
point or inflection point, i.e. regions where the input is nearly constant. This would
require a high density of setpoints.
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DATA SHEET
HAL 2455
3.3. On-Board Diagnostic Features
The HAL 2455 features two groups of diagnostic functions. The first group contains
basic functions that are always active. The second group can be activated by the cus-
tomer and contains supervision and self-tests related to the signal path and sensor
memory.
Diagnostic Features that are Always Active:
– Wire break detection for supply and ground line
– Undervoltage detection
– Thermal supervision of output stage: overcurrent, short circuit, etc.
Diagnostic Features that can be Activated by Customer:
– Overvoltage detection
– EEPROM self-test at power-on
– Continuous ROM parity check
– Continuous state machine self-test
– Adder overflow
Failure Indication
The HAL 2455 indicates a failure by changing the PWM frequency. The different errors
are then coded in different duty-cycles.
Table 3–4: Failure indication for HAL 2455
Failure Mode
Frequency Duty-Cycle
EEPROM and state
machine self-test
50%
95%
Adder overflow
Overvoltage
50%
50%
50%
85%
75%
100%
Undervoltage
Note
In case of an error, the sensor changes the selected PWM frequency.
Example:
During normal operation, the PWM frequency is 1 kHz, in case of an error
500 Hz.
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
19
DATA SHEET
HAL 2455
3.4. Calibration of the Sensor
For calibration in the system environment, the application kit from TDK-Micronas is rec-
ommended. It contains the hardware for the generation of the serial telegram for pro-
gramming and the corresponding LabViewTM based programming environment for the
input of the register values (see Section 6.2. on page 37).
For the individual calibration of each sensor in the customer application, a two point cal-
ibration is recommended.
A detailed description of the calibration software example provided by TDK-Micronas,
calibration algorithm, programming sequences and register value calculation can be
found in the Application Note “HAL 24xy Programming Guide”.
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
20
DATA SHEET
HAL 2455
4. Specifications
4.1. Outline Dimensions
Product
related to center of package
HAL24xy
0
ꢀ0.1
4.9
X
Y
D
related to center of package
-0.13
0.3
A
D
X
2
0.48
A
weight
0.076 g
4
3
1
PIN 1 INDEX
+Y
B ( 20 : 1 )
Y
2
.
-X
0
ꢀ
+X
6
gauge plane
D
ꢁ
center of
sensitive area
-Y
5
2
.
0
5
8
6
7
ꢀ0.18
0.6
B
1.27
0.42
0,25ꢂ
C
A-B
D
ꢁ
1
1
.
Y
0.38x45°
0
ꢀ
5
6
.
A
0
5
d
0
.
1
e
.
0
t
0
a
ꢀ
l
ꢀ
2
p
2
2
4
.
n
.
0
S
1
5
7
0
.
0
B
ꢀ0.18
ꢀ
0.6
5
C
seating plane
0.1
7
1
.
0
ꢃ
C
seating plane
0
2.5
5 mm
scale
TOP VIEW
All dimensions are in mm.
Physical dimensions do not include moldflash.
Sn-thickness might be reduced by mechanical handling.
BOTTOM VIEW
JEDEC STANDARD
SPECIFICATION
TYPE
ISSUE DATE
REVISION DATE
PACKAGE
SOIC8-1
ANSI
REV.NO.
3
DRAWING-NO.
CSOIC0083011.1
(YY-MM-DD)
(YY-MM-DD)
ITEM NO. ISSUE
MS-012
NO.
20-07-09
20-11-19
F
ZG
2115_Ver.03
c
Copyright 2018 TDK-Micronas GmbH, all rights reserved
Fig. 4–1:
SOIC8-1: Plastic Small Outline IC package, 8 leads, gullwing bent, 150 mil
Ordering code: DJ
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
21
DATA SHEET
HAL 2455
user direction of feed
18.2 max
Devices per Reel: 3500
12 min
IEC STANDARD
ISSUE DATE
YY-MM-DD
ANSI
DRAWING-NO.
06836.0001.4
ZG-NO.
ISSUE
4th
ITEM NO.
60286-3
ZG002036_001_01
12-01-31
© Copyright 2012 Micronas GmbH, all rights reserved
Fig. 4–2:
SOIC8: Tape and Reel Finishing
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
22
DATA SHEET
HAL 2455
Product
HAL 242x/HAL 245x
short lead
14.7ꢀ0.2
1.55
0.295ꢀ0.09
0.2
standard
L
o
Y
gate remain
A
D
weight
0.12 g
ꢀ0.05
1.5
ꢀ0.05
4.06
D
1+0.2
ꢁ
connected to PIN 2
0.7
center of
sensitive area
connected to PIN 2
Y
.
5
x
0
.
a
0
ꢀ
m
5
A
2
.
0
.
4
4
r
o
2
.
0
1
2
3
ꢀ
1
dambar cut,
not Sn plated (6x)
0.51 +- 0.1
0.08
a
e
r
a
g
L
n
i
d
l
e
ꢀ0.05
Sn plated
0.36
w
r
o
r
e
d
l
o
s
5
,
0
-
0
ꢀ0.05
0.43
Sn plated
ꢀ0.4
ꢀ0.4
1.27
1.27
lead length,
not Sn plated (3x)
0
2.5
5 mm
scale
All dimensions are in mm.
Physical dimensions do not include moldflash.
FRONT VIEW
BACK VIEW
SPECIFICATION
Sn-thickness might be reduced by mechanical handling.
JEDEC STANDARD
ISSUE DATE
REVISION DATE
PACKAGE
TO92UT-2
ANSI
REV.NO.
2
DRAWING-NO.
CUTI00032507.1
(YY-MM-DD)
(YY-MM-DD)
ITEM NO. ISSUE
TYPE
NO.
18-02-22
19-12-05
ZG
2090_Ver.02
c
Copyright 2018 TDK-Micronas GmbH, all rights reserved
Fig. 4–3:
TO92UT-2 Plastic Transistor Standard UT package, 3 leads, non-spread
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
23
DATA SHEET
HAL 2455
a
n
gate remain
Product
HAL 242x/HAL 245x
L
short lead
14.7ꢀ0.2 standard
Y
1.55
A
0.295ꢀ0.09
0.2
D
weight
0.12 g
ꢀ0.05
4.06
ꢀ0.05
1.5
0.7
1+0.2
connected to PIN 2
connected to PIN 2
D
ꢁ
center of
sensitive area
Y
5
0
.
.
0
x
ꢀ
a
5
m
0
.
2
4
.
A
4
2
.
0.51 +- 0.1
0.08
0
1
2
3
ꢀ
1
dambar cut,
not Sn plated (6x)
4
-
2
a
e
r
a
g
L
n
i
d
l
e
w
r
o
r
e
d
l
o
s
ꢀ0.05
Sn plated
0.36
5
,
1
-
0
ꢀ0.05
Sn plated
0.43
ꢀ0.4
ꢀ0.4
2.54
2.54
lead length cut
not Sn plated (3x)
0
2.5
scale
5 mm
All dimensions are in mm.
Physical dimensions do not include moldflash.
Sn-thickness might be reduced by mechanical handling.
BACK VIEW
FRONT VIEW
JEDEC STANDARD
SPECIFICATION
ISSUE DATE
REVISION DATE
PACKAGE
TO92UT-1
ANSI
REV.NO.
2
DRAWING-NO.
(YY-MM-DD)
(YY-MM-DD)
ITEM NO. ISSUE
TYPE
NO.
18-02-22
19-12-06
CUTS00032506.1
ZG
2089_Ver.02
c Copyright 2018 TDK-Micronas GmbH, all rights reserved
Fig. 4–4:
TO92UT-1 TO92UT-1 Plastic Transistor Standard UT package, 3 leads, spread
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
24
DATA SHEET
HAL 2455
Δp
Δp
Δh
Δh
B
A
D0
F2
P2
F1
feed direction
P0
view A-B
H
H1
all dimensions in mm
TO92UA TO92UT
other dimensions see drawing of bulk
max. allowed tolerance over 20 hole spacings 1.0
Short leads 18 - 20 21 - 23.1
22 - 24.1
Long leads 24 - 26
27 - 29.1
28 - 30.1
Δp
UNIT
D0
4.0
F1
F2
Δh
L
P0
P2
T
T1
W
W0
W1
W2
1.47
1.07
1.47
1.07
11.0
max
13.2
12.2
7.05
5.65
mm
1.0
1.0
0.5
0.9
18.0
6.0
9.0
0.3
STANDARD
ISSUE DATE
YY-MM-DD
ANSI
DRAWING-NO.
ZG-NO.
ISSUE
-
ITEM NO.
ZG001031_Ver.05
IEC 60286-2
16-07-18
06631.0001.4
© Copyright 2007 Micronas GmbH, all rights reserved
Fig. 4–5:
TO92UA/UT: Dimensions ammopack inline, not spread
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
25
DATA SHEET
HAL 2455
Δp
Δp
Δh
Δh
B
A
D0
F2
P2
F1
feed direction
P0
view A-B
H
H1
all dimensions in mm
TO92UA TO92UT
21 - 23.1 22 - 24.1
other dimensions see drawing of bulk
max. allowed tolerance over 20 hole spacings 1.0
Short leads
Long leads
18 - 20
24 - 26
28 - 30.1
27 - 29.1
Δp
UNIT
mm
D0
4.0
F1
F2
Δh
L
P0
P2
T
T1
W
W0
6.0
W1
9.0
W2
0.3
2.74
2.34
2.74
2.34
11.0
max
13.2
12.2
7.05
5.65
1.0
1.0
0.5
0.9
18.0
JEDEC STANDARD
ISSUE DATE
YY-MM-DD
ANSI
DRAWING-NO.
06632.0001.4
ZG-NO.
ISSUE
-
ITEM NO.
ICE 60286-2
ZG001032_Ver.06
16-07-18
© Copyright 2007 Micronas GmbH, all rights reserved
Fig. 4–6:
TO92UA/UT: Dimensions ammopack inline, spread
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
26
DATA SHEET
HAL 2455
4.2. Soldering, Welding and Assembly
Information related to solderability, welding, assembly, and second-level packaging is
included in the document “Guidelines for the Assembly of Micronas Packages”.
It is available on the TDK-Micronas website (http://www.micronas.com/en/service-cen-
ter/downloads) or on the service portal (http://service.micronas.com).
4.3. Pin Connections and Short Descriptions
Table 4–1: SOIC8 package
Pin No
Pin
Type
Short Description
Name
1
2
4
VSUP
GND
OUT
SUPPLY Supply Voltage
GND
I/O
Ground
Output and Program-
ming Pin
All remaining pins (3, 5, 6, 7, 8) must be connected to ground
Table 4–2: TO92UT package
Pin No
Pin
Type
Short Description
Name
1
2
3
VSUP
GND
OUT
SUPPLY Supply Voltage
GND
I/O
Ground
Output and Program-
ming Pin
1
VSUP
1
VSUP
OUT
OUT
Pin 3
4
2
GND
2
GND
(3, 5, 6, 7, 8)
SOIC8 package
TO92UT package
Fig. 4–7: Pin configuration in SOIC8 and TO92UT package
4.4. Sensitive Area
4.4.1. Dimensions
250 µm x 250 µm
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
27
DATA SHEET
HAL 2455
4.5. Absolute Maximum Ratings
Stresses beyond those listed in the “Absolute Maximum Ratings” may cause permanent
damage to the device. This is a stress rating only. Functional operation of the device at
these conditions is not implied. Exposure to absolute maximum rating conditions for
extended periods will affect device reliability.
This device contains circuitry to protect the inputs and outputs against damage due to
high static voltages or electric fields; however, it is advised that normal precautions
must be taken to avoid application of any voltage higher than absolute maximum-rated
voltages to this circuit.
All voltages listed are referenced to ground (GND).
Symbol
Parameter
Pin
Min.
Max.
Unit Condition
VSUP
Supply Voltage
VSUP
8.5
18
10
18
V
V
t < 96 h4)
t < 1 h4)
VOUT
Output Voltage
OUT
61)
18
2
V
V
t < 1 h4)
VOUT VSUP Excess of Output
Voltage over Supply
Voltage
VSUP,
OUT
TJ
Junction Tempera-
ture under Bias
50
50
1902) °C
Tstorage
150
°C
Transportation/Short-
Term Storage
Device only without
packing material
Temperature
VESD_SOIC8
ESD Protection for
SOIC8 package3)
All Pins
2
8
2
8
kV
kV
HBM
AEC-Q-100-002
(100 pF / 1.5 k)
VSUP
vs. GND
OUT
vs. GND
8
8
8
8
8
8
kV
kV
kV
VSUP
vs. OUT
VESD_TO92
ESD Protection for
TO92UT package3)
All Pins
HBM
AEC-Q-100-002
(100 pF / 1.5 k)
1)
internal protection resistor = 50
2)
3)
4)
For 96h, please contact TDK-Micronas for other temperature requirements.
For system ESD robustness, pins not used have to be connected to GND.
No cumulated stress
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
28
DATA SHEET
HAL 2455
4.5.1. Storage and Shelf Life
Information related to storage conditions of Micronas sensors is included in the docu-
ment “Guidelines for the Assembly of Micronas Packages”. It gives recommendations
linked to moisture sensitivity level and long-term storage.
It is available on the TDK-Micronas website (http://www.micronas.com/en/service-cen-
ter/downloads) or on the service portal (http://service.micronas.com).
4.6. Recommended Operating Conditions
Functional operation of the device beyond those indicated in the “Recommended Oper-
ating Conditions/Characteristics” is not implied and may result in unpredictable behav-
ior, reduce reliability and lifetime of the device.
All voltages listed are referenced to ground (GND).
Symbol Parameter
VSUP Supply Voltage
Pin
Min. Typ. Max. Unit
Remarks
VSUP 4.5
5.7
5
6
5.5
6.5
V
Normal operation
During program-
ming
IOUT
Continuous Output
Current
OUT
1.2
5
mA
RL
Load Resistor
OUT
OUT
1.0
k
Pull-up resistor only
CL
Load Capacitance
0.18 10
nF
NPRG
Number of Memory
100
cycles 0°C < Tamb < 55°C
Programming Cycles1)
TJ
Junction Temperature2)
40
40
40
125
150
170
°C
for 8000 h3)
for 2000 h3)
for 1000 h3)
1)
In the EEPROM, it is not allowed to program only one single address within a 'bank' in the
memory. In case of programming one single address the complete bank has to be programmed
2)
3)
Depends on the temperature profile of the application. Please contact TDK-Micronas
for life time calculations.
Time values are not cumulative
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
29
DATA SHEET
HAL 2455
4.7. Characteristics
at TJ = 40 °C to +170 °C, VSUP = 4.5 V to 5.5 V, GND = 0 V, after programming and
locking of the sensor, at Recommended Operating Conditions if not otherwise specified
in the column “Conditions”. Typical Characteristics for TJ = 25 °C and VSUP = 5 V.
Limit Values
Min. Typ. Max.
Symbol
Parameter
Pin
Unit
Test Conditions
ISUP
Supply Current
over Temperature Range
VSUP
OUT
7
11
mA
Resolution 1)
12
bit
depends on PWM Period
fPWM = 2 kHz
tr(O)
Response Time of Output 2) OUT
-
-
-
-
1.5
2.5
4.5
8.5
1.8
3
5.4
10.2
ms
f
PWM = 1 kHz
fPWM = 500 Hz
PWM = 250 Hz
f
tVs
Wake-up time2)
OUT
OUT
OUT
1.7
ms
V
CL = 10 nF
VOUTL
Output Low Voltage
0.5
0.05
VSUP = 5 V, IOUT < 5 mA
OUTNOISErms Output Noise RMS 2)
0.1
%
BARREL SHIFTER=3
Overall gain in signal path =1
External circuitry according to
Fig. 5–1 with low-noise supply
Related to 12 bit full scale
Customer programmable
fPWM
PWM Frequency 2)
RMS PWM Jitter 2)
OUT
OUT
1.7
0.85
0.425 0.5
0.213 0.25
2
1
2.3
kHz
1.15
0.575
0.288
JPWM
trise
1
2
LSB12 fPWM = 1 kHz
Rise Time of Digital Output 2) OUT
Fall Time of Digital Output 2) OUT
0.4
0.5
100
µs
µs
RL Pull-up = 1 k, CL = 1 nF
tfall
RL Pull-up = 1 k, CL = 1 nF
ROUT_DIG
On Resistance of Digital
Pull-Up Driver 2)
OUT
200
Includes 25 series pull-up
resistor and 50 pull-down
SOIC8 Package
Thermal Resistance
Junction to Air
Rthja
Rthjc
142
88
K/W
K/W
K/W
K/W
Determined with a 1s0p board
Determined with a 1s1p board
Determined with a 1s0p board
Determined with a 1s1p board
Junction to Case
33
22
TO92UT Package
Thermal Resistance
Rthja
Junction to Air
232
136
40
K/W
K/W
K/W
K/W
Determined with a 1s0p board
Determined with a 2s2p board
Determined with a 1s0p board
Determined with a 2s2p board
Rthjc
Junction to Case
36
1) Guaranteed by Design
2) Characterized on small sample size, not tested.
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
30
DATA SHEET
HAL 2455
4.8. Overvoltage and Undervoltage Detection
at TJ = 40 °C to +170 °C, Typical Characteristics for TJ = 25 °C, after programming
and locking
Symbol
Parameter
Pin
Min.
3.3
Typ.
3.9
Max.
4.3
Unit
V
Test
Conditions
V
V
V
V
Undervoltage Detec-
tion Level
VSUP
VSUP
SUP,UV
Undervoltage Detec-
tion Level Hysteresis
200
6.2
mV
V
SUP,UVhyst
SUP,OV
1)
Overvoltage Detection VSUP
Level
5.6
6.9
Overvoltage Detection VSUP
Level Hysteresis
225
mV
SUP,OVhyst
1)
1)
Characterized on small sample size, not tested
4.9. Magnetic Characteristics
at TJ = 40 °C to +170 °C, VSUP = 4.5 V to 5.5 V, GND = 0 V after programming and
locking, at Recommended Operating Conditions if not otherwise specified in the column
“Conditions”. Typical Characteristics for TJ = 25 °C and VSUP = 5 V.
Symbol
Parameter
Pin
No.
Min. Typ. Max Unit Test Conditions
.
SENS
Magnetic Sensitivity
DC/(2xRANGE
)
%DC Example:
ABS
2)
/mV
For Barrel_shifter=5 and DC =
100%
RANGE
= 12 mT
ABS
Sensitivity=100%/(2x12 mT=
4.2%DC/mT max.
RANGE
Absolute Range of CFX
Register (Magnetic
Range)
6
200 mT
0.4 mT
Programmable:
ABS
See Table 3–2 for relation
between barrel shifter and Mag-
netic Range.
1)
1)
B
Magnetic Offset
OUT
0.4 0
B = 0 mT, I
25 °C,
= 0 mA, T =
OUT J
Offset
unadjusted sensor
B
/T Magnetic Offset Change OUT
5
1
0
0
5
T/K B = 0 mT, I
= 0 mA
Offset
OUT
1)
due to T
BARREL SHIFTER = 3 ( 50 mT)
J
ES
Error in Magnetic Sensi- OUT
tivity
+1
+1.5
%
TO92 package, V
BARREL SHIFTER = 3 ( 50 mT)
= 5 V,
SUP
SOIC8 package, V = 5 V,
BARREL SHIFTER = 3 ( 50 mT)
SUP
1.5 0
1)
2)
Characterized on small sample size, not tested
DC = duty cycle
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
31
DATA SHEET
HAL 2455
4.9.1. Definition of Sensitivity Error ES
ES is the maximum of the absolute value of the quotient of the normalized measured
value1 over the normalized ideal linear value2 minus 1:
meas
ideal
-----------
ES = max abs
– 1
Tmin, Tmax
In the below example, the maximum error occurs at 10 °C:
1.001
0.993
------------
ES =
– 1 = 0.8%
ideal 200 ppm/k
1.03
least-squares method straight line
of normalized measured data
1.02
1.01
1.00
0.99
0.98
measurement example of real
sensor, normalized to achieve a
value of 1 of its least-squares
method straight line at 25 °C
1.001
0.992
-25 -10
150
175
0
25
temperature [°C]
125
-50
50
75 100
Fig. 4–8: ES definition example
1. normalized to achieve a least-squares method straight-line that has a value of 1 at 25 °C
2. normalized to achieve a value of 1 at 25 °C
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
32
DATA SHEET
HAL 2455
5. Application Notes
5.1. Application Circuit
For EMC protection, it is recommended to connect one ceramic 47 nF capacitor
between ground and the supply voltage pin, and a 180 pF capacitor between ground
and the output pin.
V
SUP
OUT
GND
HAL 2455
47 nF
180 pF
Fig. 5–1: Recommended application circuit
5.2. Measurement of a PWM Output Signal of HAL 2455
In case of the PWM output, the magnetic field information is coded in the duty cycle of
the PWM signal. The duty cycle is defined as the ratio between the high time “s” and the
period “d” of the PWM signal (see Fig. 5–2).
Note
The PWM signal is updated with the rising edge. Hence, for signal evalua-
tion, the trigger-level must be the rising edge of the PWM signal.
Out
d
s
V
V
High
Low
time
Update
Fig. 5–2: Definition of PWM signal
TDK-Micronas GmbH
May 20, 2021; DSH000173_003EN
33
DATA SHEET
HAL 2455
5.3. Use of two HAL 2455 in Parallel
Two different HAL 2455 sensors which are operated in parallel to the same supply and
ground line can be programmed individually as the communication with the sensors is
done via their output pins.
V
SUP
OUT A
OUT B
HAL2455
Sensor A
HAL2455
Sensor B
47 nF
180 pF
180 pF
GND
Fig. 5–3: Parallel operation of two HAL 2455
5.4. Ambient Temperature
Due to the internal power dissipation, the temperature on the silicon chip (junction tem-
perature TJ) is higher than the temperature outside the package (ambient temperature TA).
TJ = TA + T
At static conditions and continuous operation, the following equation applies:
T = ISUP * VSUP * RthjX
The X represents junction-to-air or junction-to-case.
In order to estimate the temperature difference T between the junction and the respec-
tive reference (e.g. air, case, or solder point) use the max. parameters for ISUP, RthX,
and the max. value for VSUP from the application.
The following example shows the result for junction-to -air conditions. VSUP = 5.5 V,
Rthja = 250 K/W and ISUP = 10 mA the temperature difference T = 13.75 K.
The junction temperature TJ is specified. The maximum ambient temperature TAmax can
be estimated as:
TAmax = TJmax T
Please contact TDK-Micronas for the detailed investigation reports with the EMC and
ESD results.
5.5. EMC and ESD
Please contact TDK-Micronas for the detailed investigation reports with the EMC and
ESD results.
TDK-Micronas GmbH
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DATA SHEET
HAL 2455
6. Programming of the Sensor
HAL 2455 features two different customer modes. In Application Mode the sensor pro-
vides a PWM output signal. In Programming Mode it is possible to change the register
settings of the sensor.
After power-up the sensor is always operating in the Application Mode. It is switched
to the Programming Mode by a pulse on the sensor output pin.
6.1. Programming Interface
In Programming Mode the sensor is addressed by modulating a serial telegram on the
sensors output pin. The sensor answers with a modulation of the output voltage.
A logical “0” is coded as no level change within the bit time. A logical “1” is coded as a
level change of typically 50% of the bit time. After each bit, a level change occurs (see
Fig. 6–1).
The serial telegram is used to transmit the EEPROM content, error codes and digital
values of the angle information from and to the sensor.
tbittime
tbittime
or
logical 0
tbittime
tbittime
or
logical 1
50%
50%
50%
50%
Fig. 6–1: Definition of logical 0 and 1 bit
A description of the communication protocol and the programming of the sensor is avail-
able in a separate document (Application Note: HAL 24xy Programming Guide).
TDK-Micronas GmbH
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DATA SHEET
HAL 2455
Table 6–1: Telegram parameters (All voltages are referenced to GND.)
Symbol
Parameter
Pin
No.
Limit Values
Unit Test Conditions
Min.
Typ.
Max.
0.2*V
1.0
V
V
V
Voltage for Output Low Level OUT
during Programming through
Sensor Output Pin
0
0
V
OUTL
SUP
V
for V
for V
= 5 V
= 5 V
SUP
Voltage for Output High Level OUT 0.8*V
during Programming through
Sensor Output Pin
V
SUP
V
V
OUTH
SUP
4.0
5.0
6.5
SUP
V
Voltage for EEPROM
1
5.7
6.0
V
Supply voltage
for bidirectional
communication
via output pin.
SUPProgram
SUP
programming (after PROG
and ERASE)
t
Biphase Bit Time
Slew rate
3
3
900
1000
2
1100
µs
bittime
V/
µs
TDK-Micronas GmbH
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DATA SHEET
HAL 2455
6.2. Programming Environment and Tools
For the programming of HAL 2455 it is possible to use the Micronas tool kit
(TDK-MSP V1.x & LabVIEWTM Programming Environment) or the USB kit in order to
ease the product development. The details of programming sequences are also avail-
able at service.micronas.com.
6.3. Programming Information
For reliability in service, it is mandatory to set the LOCK bit to one and the POUT bit to
zero after final adjustment and programming of HAL 2455.
The success of the LOCK process must be checked by reading the status of the LOCK
bit after locking and by a negative communication test after a power on reset.
It is also mandatory to check the acknowledge (first and second) of the sensor or to
read/check the status of the PROG_DIAGNOSIS register after each write and store
sequence to verify if the programming of the sensor was successful. Please check
HAL 242x Programming Guide for further details.
Electrostatic Discharges (ESD) may disturb the programming pulses. Please take pre-
cautions against ESD.
Note
Please check also the “HAL 24xy Programming Guide”. It contains addi-
tional information and instructions about the programming of the devices.
TDK-Micronas GmbH
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DATA SHEET
HAL 2455
7. Document History
1. Preliminary Data Sheet: “HAL 2455 High-Precision Programmable Linear Hall-Effect Sensor with
PWM Output”, July 8, 2014, Pd000215_001EN. First release of the Preliminary Data Sheet.
2. Preliminary Data Sheet: “HAL 2455 High-Precision Programmable Linear Hall-Effect Sensor with
PWM Output”, Sept. 19, 2014, PD000215_002EN. Second release of the Preliminary Data
Sheet.
Major Changes:
– SOIC8 package drawing updated
– Absolute Maximum Ratings – Specification of ESD Protection for SOIC8 package
3. Data Sheet: “HAL 2455 High-Precision Programmable Linear Hall-Effect Sensor with PWM Out-
put”, Jan. 14, 2016, DSH000173_001EN. First release of the Data Sheet.
Major Changes:
– SOIC8 package drawing updated
– Corrected position A4 value for SOIC8 package
– Updated condition (CL=1 nF) for rise time and fall time of digital output
– Characteristics: Supply Current over Temperature Range (ISUP): values updated
– Assembly and storage information changed
4. Data Sheet: “HAL 2455 High-Precision Programmable Linear Hall-Effect Sensor with PWM Out-
put”, Sept. 9, 2020, DSH000173_002EN. Second release of the Data Sheet.
Major changes:
– SOIC8 package drawing updated
– TO92UT package and tape drawings updated
– Maximum Ratings: Tstorage added
– Magnetic Characteristics: new values for parameters SENS and RANGEABS
5. Data Sheet: “HAL 2455 High-Precision Programmable Linear Hall-Effect Sensor with PWM Out-
put”, May 20, 2021, DSH000173_003EN. Third release of the Data Sheet.
Major changes:
– Thermal resistance values for TO92UT package updated
– SOIC8-1 package drawing updated
TDK-Micronas GmbH
Hans-Bunte-Strasse 19 D-79108 Freiburg P.O. Box 840 D-79008 Freiburg, Germany
Tel. +49-761-517-0 Fax +49-761-517-2174 www.micronas.tdk.com
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