STC53K30O17VFA [SUNTSU]
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO;![STC53K30O17VFA](http://pdffile.icpdf.com/pdf2/p00353/img/icpdf/STC53K25Q27_2172573_icpdf.jpg)
型号: | STC53K30O17VFA |
厂家: | ![]() |
描述: | Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO 石英晶振 温度补偿晶振 |
文件: | 总4页 (文件大小:837K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO
STC53K Series
5.0mm x 3.2mm
Features
• ± ±10ppm (Frequency Stability) Available
• Clipped Sinewave
Applications
• Base Stations
• IP Networking
• (VC)TCXO
• Cellular and Cordless Phones
• Tape and Reel
Part Numbering Guide
STC 53 K 33 R 48 V E A - 19.440M
SUNTSU TCXO
FREQUENCY
MHz
COMPENSATION
BLANK : Digital
5.0mm x 3.2mm
A : Analog
PULLABILITY
BLANK : TCXO
E : ± ±2100ppm
F : ± 810ppm
CLIPPED SINEWAVE
TCXO/VCTCXO
BLANK : TCXO
V : VCTCXO
OPERATING
TEMPERATURE
RANGE
07 : 0°C - +70°C
±6 : -±0°C - +60°C
±7 : -±0°C - +70°C
27 : -20°C - +70°C
38 : -30°C - +85°C
48 : -40°C - +85°C
SUPPLY VOLTAGE
25 : 215V± 5%
FREQUENCY STABILITY
G : ± 510ppm
27 : 217V± 5%
30 : 310V± 5%
33 : 313V± 5%
N : ± 510ppm
O : ± 215ppm
P : ± 210ppm
Q : ± ±15ppm
R : ± ±10ppm
COMPLIANT
Cage Code: 4GUT4
To customize your parameters contact a Suntsu representative1
Electrical Parameters
Units
Minimum
Typical
Maximum
Remarks
Frequency Range
MHz
6
40
Frequency Tolerance at +25ºC
Freq1 Stability vs1 Op Temp1
Freq1 Stability vs1 Supply Voltage
Freq1 Stability vs1 Load
ppm
ppm
ppm
ppm
-±15
-±10
-013
-012
+±15
+±10
+013
+012
± Hour after reflow
See part numbering guide for options1
VDD± 5% change1
± 5% change
Freq1 Stability vs1 Aging
Operating Temperature
Storage Temperature
Supply Voltage (VDD)
Current (IDD)
ppm
°C
-±10
-40
-55
+±10
+85
+±25
31465
2
± Year, ± 31±ppm for ±0 Years
See part numbering guide for options1
°C
V
31±35
313
See part numbering guide for options1
mA
V
Control Current (VC, VCTCXO)
0
VDD
Center Voltage : VDD*50%
Pullability (VCTCXO)
ppm
%
± 510
± ±210
±0
See part numbering guide for options1
Linearity (VCTCXO)
Output Load (Clipped Sinewave)
Output Logic Levels
kΩ//pF
VP-P
±0//±0
018
40
Symmetry (Duty Cycle)
%
50
60
3
ms
Start-Up Time
VC Input Impedance (VCTCXO)
Phase Noise (Typical) ±0Hz Offset
Phase Noise (Typical) ±00Hz Offset
Phase Noise (Typical) ±KHz Offset
Phase Noise (Typical) ±0KHz Offset
Phase Noise (Typical) ±00KHz Offset
kΩ
±00
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
-85
-±±5
-±35
-±45
-±50
Suntsu Electronics, Inc.
142 TECHNOLOGY DR., SUITE 150
IRVINE, CA 92618
www.suntsu.com
Specifications are subject
to change without notice.
Call: +1-949-783-7300 | Fax: +1-949-783-7301
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO
STC53K Series
5.0mm x 3.2mm
Outline Drawing
All dimensions are in millimeters (mm) unless otherwise noted1 Drawings are not to scale1
Test Circuit (Clipped Sinewave)
Waveform (Clipped Sinewave)
Typical Phase Noise (Measured By Agilent E5052A)
Frequency - 19.440MHz
Frequency - 40.000MHz
Suntsu Electronics, Inc.
142 TECHNOLOGY DR., SUITE 150
IRVINE, CA 92618
www.suntsu.com
Specifications are subject
to change without notice.
Call: +1-949-783-7300 | Fax: +1-949-783-7301
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO
STC53K Series
5.0mm x 3.2mm
Jitter Performance (Measured By Agilent E5052A)
Frequency - 19.440MHz
Frequency - 40.000MHz
Tape And Reel Dimensions
All dimensions are in millimeters (mm) unless otherwise noted1 Drawings are not to scale1
3,000pcs/Reel
Reflow Profile & Part Marking
Tp (Time At 260°C. 20-40 Sec)
260
Rup (Ramp Up, 3°C/Sec Max)
217
200
TI (Time Above 217°C.
60-150Sec)
150
Rdn (Ramp Down,
6°C/Sec Max)
Ts (Preheat Time.
60-180Sec)
T 25°C to Peak (480Sec Max)
Time (sec)
Suntsu Electronics, Inc.
142 TECHNOLOGY DR., SUITE 150
IRVINE, CA 92618
www.suntsu.com
Specifications are subject
to change without notice.
Call: +1-949-783-7300 | Fax: +1-949-783-7301
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO
STC53K Series
5.0mm x 3.2mm
Environmental Specifications
Mechanical Specifications
Temperature Cycling
MIL-STD-883, Method ±0±0, Condition B
Mechanical Shock
MIL-STD-202, Method 2±3, Condition B
MIL-STD-883, Method 2007, Condition A
MIL-STD-883, Method ±004
Fine Leak Test
MIL-STD-883, Method ±0±4, Condition A
MIL-STD-883, Method ±0±4, Condition C
Vibration
Gross Leak Test
Moisture Resistance
Solderability
MIL-STD-883, Method 2003
J-STD-020, MSL ±
Resistance to Solvents
MIL-STD-202, Method 2±5
Moisture Sensitivity
Resistance to Soldering Heat
MIL-STD-202, Method 2±0, Condition K
Suntsu Electronics, Inc.
142 TECHNOLOGY DR., SUITE 150
IRVINE, CA 92618
www.suntsu.com
Specifications are subject
to change without notice.
Call: +1-949-783-7300 | Fax: +1-949-783-7301
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