STN2NF06L [STMICROELECTRONICS]
N-CHANNEL 60V - 0.1 ohm - 2A SOT-223 STripFET⑩ II POWER MOSFET; N沟道60V - 0.1欧姆 - 2A SOT- 223 STripFET⑩ II功率MOSFET型号: | STN2NF06L |
厂家: | ST |
描述: | N-CHANNEL 60V - 0.1 ohm - 2A SOT-223 STripFET⑩ II POWER MOSFET |
文件: | 总8页 (文件大小:293K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
STN2NF06L
N-CHANNEL 60V - 0.1 Ω - 2A SOT-223
STripFET™ II POWER MOSFET
V
R
I
TYPE
DSS
DS(on)
D
STN2NF06L
60 V
<0.12 Ω
2 A
■
■
■
■
■
TYPICAL R (on) = 0.1 Ω
DS
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
2
AVALANCHE RUGGED TECHNOLOGY
LOW THRESHOLD DRIVE
3
2
1
DESCRIPTION
SOT-223
This Power MOSFET is the latest development of
STMicroelectronis unique "Single Feature Size™"
strip-based process. The resulting transistor
shows extremely high packing density for low on-
resistance, rugged avalanche characteristics and
less critical alignment steps therefore a remark-
able manufacturing reproducibility.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■
■
■
DC MOTOR CONTROL (DISK DRIVES, etc.)
DC-DC & DC-AC CONVERTERS
SYNCHRONOUS RECTIFICATION
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
60
60
± 16
2
Unit
V
V
DS
Drain-source Voltage (V = 0)
GS
V
Drain-gate Voltage (R
Gate- source Voltage
= 20 kΩ)
GS
V
DGR
V
GS
V
I
D
Drain Current (continuous) at T = 25°C
A
C
I
Drain Current (continuous) at T = 100°C
1.2
8
A
D
C
I
(•)
Drain Current (pulsed)
A
DM
P
(1)
Total Dissipation at T = 25°C
3
W
tot
C
Derating Factor
8
W/°C
V/ns
mJ
°C
°C
(2)
(3)
Peak Diode Recovery voltage slope
Single Pulse Avalanche Energy
Storage Temperature
6
dv/dt
E
200
AS
T
stg
-55 to 150
T
Max. Operating Junction Temperature
j
(•) Pulse width limited by safe operating area.
(2) I
≤2A, di/dt ≤100A/µs, V
≤ V
DD
, T ≤ T
JMAX
SD
DD
(BR)DSS
= 30V
j
(1)
o
Related to Rthj -l
(3) Starting T = 25 C, I = 2A, V
j
D
November 2002
1/8
.
STN2NF06L
THERMAL DATA
2
Rthj-pcb
Rthj-pcb
50
90
260
°C/W
°C/W
°C
Thermal Resistance Junction-PCB(1 inch copper board)
Thermal Resistance Junction-PCB (min. footprint)
Maximum Lead Temperature For Soldering Purpose
T
l
ELECTRICAL CHARACTERISTICS (T
= 25 °C unless otherwise specified)
case
OFF
Symbol
Parameter
Drain-source
Test Conditions
= 250 µA, V = 0
Min.
Typ.
Max.
Unit
I
V
60
V
D
GS
(BR)DSS
Breakdown Voltage
V
= Max Rating
= Max Rating T = 125°C
Zero Gate Voltage
I
1
10
µA
µA
DS
DSS
Drain Current (V
= 0)
V
GS
DS
C
Gate-body Leakage
V
GS
= ± 16 V
I
±100
nA
GSS
Current (V
= 0)
DS
(*)
ON
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
V
GS(th)
V
= V
GS
I
D
= 250 µA
Gate Threshold Voltage
1
V
DS
V
V
= 10 V
I
I
= 1 A
= 1 A
R
Static Drain-source On
Resistance
0.1
0.12
0.12
0.14
Ω
Ω
GS
D
DS(on)
=
5 V
GS
D
DYNAMIC
Symbol
Parameter
Test Conditions
= 15 V = 1 A
Min.
Typ.
Max.
Unit
(*)
V
DS
I
D
g
Forward Transconductance
3
S
fs
C
V
= 25V f = 1 MHz V = 0
GS
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
360
55
25
pF
pF
pF
iss
DS
C
oss
C
rss
2/8
STN2NF06L
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
Parameter
Test Conditions
= 30 V = 1 A
Min.
Typ.
Max.
Unit
V
R
I
D
t
Turn-on Time
Rise Time
10
20
ns
ns
DD
= 4.7 Ω
d(on)
V
= 4.5 V
t
r
G
GS
(Resistive Load, Figure 3)
Q
g
V
= 48 V I = 2 A V = 5 V
GS
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
5.6
1.2
2.6
7.6
nC
nC
nC
DD
D
Q
gs
Q
gd
SWITCHING OFF
Symbol
Parameter
Test Conditions
= 30 V = 1 A
Min.
Min.
Typ.
Max.
Unit
V
R
I
t
Turn-off Delay Time
Fall Time
17
6
ns
ns
DD
= 4.7Ω,
D
d(off)
V
GS
= 4.5 V
t
f
G
(Resistive Load, Figure 3)
SOURCE DRAIN DIODE
Symbol
Parameter
Test Conditions
Typ.
Max.
Unit
I
SD
Source-drain Current
Source-drain Current (pulsed)
2
8
A
A
( )
•
I
SDM
(*)
I
I
= 2 A
V
= 0
V
Forward On Voltage
1.3
V
SD
SD
GS
SD
t
rr
= 2 A
di/dt = 100A/µs
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
28
31
2.2
ns
nC
A
Q
V
= 20 V
T = 150°C
rr
DD
j
I
(see test circuit, Figure 5)
RRM
(*)
(
Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
•)Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedance Junction-lead
3/8
STN2NF06L
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/8
STN2NF06L
Normalized Gate Threshold Voltage vs Temperature
Normalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics
Normalized Breakdown Voltage vs Temperature.
.
.
5/8
STN2NF06L
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Fig. 4: Gate Charge test Circuit
Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/8
STN2NF06L
SOT-223 MECHANICAL DATA
mm
mils
TYP.
90.6
181.1
15.7
25.6
63
DIM.
MIN.
2.27
4.57
0.2
TYP.
2.3
MAX.
2.33
4.63
0.6
MIN.
89.4
179.9
7.9
MAX.
91.7
a
b
4.6
182.3
23.6
c
0.4
d
0.63
1.5
0.65
1.6
0.67
1.7
24.8
59.1
26.4
e1
e4
f
66.9
0.32
3.1
12.6
2.9
0.67
6.7
3
114.2
26.4
118.1
27.6
122.1
28.7
g
0.7
7
0.73
7.3
l1
l2
L
263.8
137.8
248
275.6
137.8
255.9
287.4
145.7
263.8
3.5
3.5
6.5
3.7
6.3
6.7
L
l2
d
a
e4
c
b
f
C
C
B
E
g
P008B
7/8
STN2NF06L
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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2002 STMicroelectronics - All Rights Reserved
All other names are the property of their respective owners.
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