STF2HNK60Z [STMICROELECTRONICS]

N-CHANNEL 600V - 4.4ヘ - 2.0A TO-92/TO-220FP/IPAK Zener-Protected SuperMESH MOSFET; N沟道600V - 4.4ヘ - 2.0A TO- 92 / TO- 220FP / IPAK齐纳保护的超网MOSFET
STF2HNK60Z
型号: STF2HNK60Z
厂家: ST    ST
描述:

N-CHANNEL 600V - 4.4ヘ - 2.0A TO-92/TO-220FP/IPAK Zener-Protected SuperMESH MOSFET
N沟道600V - 4.4ヘ - 2.0A TO- 92 / TO- 220FP / IPAK齐纳保护的超网MOSFET

晶体 晶体管 功率场效应晶体管 开关 脉冲 局域网
文件: 总12页 (文件大小:410K)
中文:  中文翻译
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STQ2HNK60ZR-AP  
STF2HNK60Z - STD2HNK60Z-1  
N-CHANNEL 600V - 4.4- 2.0A TO-92/TO-220FP/IPAK  
Zener-Protected SuperMESH™ MOSFET  
TYPE  
V
DSS  
R
I
D
P
W
DS(on)  
STQ2HNK60ZR-AP 600 V  
< 4.8 0.5 A  
3 W  
STD2HNK60Z-1  
STF2HNK60Z  
600 V  
600 V  
< 4.8 2.0 A 45 W  
< 4.8 2.0 A 20 W  
3
2
TYPICAL R (on) = 4.4Ω  
DS  
1
EXTREMELY HIGH dv/dt CAPABILITY  
ESD IMPROVED CAPABILITY  
100% AVALANCHE TESTED  
TO-92 (Ammopack)  
TO-220FP  
NEW HIGH VOLTAGE BENCHMARK  
GATE CHARGE MINIMIZED  
3
2
1
IPAK  
DESCRIPTION  
INTERNAL SCHEMATIC DIAGRAM  
The SuperMESH™ series is obtained through an  
extreme optimization of ST’s well established strip-  
based PowerMESH™ layout. In addition to pushing  
on-resistance significantly down, special care is tak-  
en to ensure a very good dv/dt capability for the  
most demanding applications. Such series comple-  
ments ST full range of high voltage MOSFETs in-  
cluding revolutionary MDmesh™ products.  
APPLICATIONS  
AC ADAPTORS AND BATTERY CHARGERS  
SWITH MODE POWER SUPPLIES (SMPS)  
ORDER CODES  
PART NUMBER  
STD2HNK60Z-1  
STQ2HNK60ZR-AP  
STF2HNK60Z  
MARKING  
D2HNK60Z  
Q2HNK60ZR  
F2HNK60Z  
PACKAGE  
IPAK  
PACKAGING  
TUBE  
TO-92  
AMMOPAK  
TUBE  
TO-220FP  
April 2004  
1/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
ABSOLUTE MAXIMUM RATINGS  
Symbol  
Parameter  
Value  
TO-220FP  
600  
Unit  
IPAK  
TO-92  
V
DS  
Drain-source Voltage (V = 0)  
V
V
GS  
V
DGR  
Drain-gate Voltage (R = 20 k)  
600  
GS  
V
Gate- source Voltage  
± 30  
V
GS  
I
Drain Current (continuous) at T = 25°C  
2.0  
1.26  
8
2.0 (*)  
1.26 (*)  
8 (*)  
0.5  
0.32  
2
A
D
C
I
D
Drain Current (continuous) at T = 100°C  
A
C
I
( )  
Drain Current (pulsed)  
A
DM  
P
TOT  
Total Dissipation at T = 25°C  
45  
20  
3
W
C
Derating Factor  
0.36  
0.16  
0.025  
W/°C  
V
V
Gate source ESD(HBM-C=100pF, R=1.5KΩ)  
Peak Diode Recovery voltage slope  
Insulation Withstand Voltage (DC)  
2000  
4.5  
ESD(G-S)  
dv/dt (1)  
V/ns  
V
V
ISO  
--  
2500  
--  
T
T
stg  
Operating Junction Temperature  
Storage Temperature  
j
-55 to 150  
°C  
( ) Pulse width limited by safe operating area  
(1) I 2 A, di/dt 200 A/µs, V V  
, T T  
(BR)DSS j JMAX.  
SD  
DD  
(*) Current Limited by package  
THERMAL DATA  
IPAK  
2.77  
100  
--  
TO-220FP  
6.25  
TO-92  
--  
Rthj-case Thermal Resistance Junction-case Max  
Rthj-amb Thermal Resistance Junction-ambient Max  
Rthj-lead Thermal Resistance Junction-lead Max  
°C/W  
°C/W  
°C/W  
°C  
62.5  
120  
40  
--  
T
l
Maximum Lead Temperature For Soldering  
Purpose  
300  
300  
260  
AVALANCHE CHARACTERISTICS  
Symbol  
Parameter  
Max Value  
Unit  
I
Avalanche Current, Repetitive or Not-Repetitive  
2
A
AR  
(pulse width limited by T max)  
j
E
AS  
Single Pulse Avalanche Energy  
120  
mJ  
(starting T = 25 °C, I = I , V = 50 V)  
j
D
AR  
DD  
GATE-SOURCE ZENER DIODE  
Symbol  
BV  
Parameter  
Test Conditions  
Igs=± 1mA (Open Drain)  
Min.  
30  
Typ.  
Max.  
Unit  
Gate-Source Breakdown  
Voltage  
V
GSO  
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES  
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the devices  
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be  
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and  
cost-effective intervention to protect the devices integrity. These integrated Zener diodes thus avoid the  
usage of external components.  
2/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
ELECTRICAL CHARACTERISTICS (T  
=25°C UNLESS OTHERWISE SPECIFIED)  
CASE  
ON/OFF  
Symbol  
Parameter  
Drain-source  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
V
I
= 1 mA, V = 0  
600  
V
(BR)DSS  
D
GS  
Breakdown Voltage  
I
Zero Gate Voltage  
V
V
= Max Rating  
= Max Rating, T = 125 °C  
1
50  
µA  
µA  
DSS  
DS  
DS  
Drain Current (V = 0)  
GS  
C
I
Gate-body Leakage  
V
= ± 20V  
±10  
µA  
GSS  
GS  
Current (V = 0)  
DS  
V
V
V
= V , I = 50 µA  
Gate Threshold Voltage  
3
3.75  
4.4  
4.5  
4.8  
V
GS(th)  
DS  
GS  
GS  
D
R
DS(on)  
Static Drain-source On  
Resistance  
= 10V, I = 1.0 A  
D
DYNAMIC  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
g
(1)  
Forward Transconductance  
V
V
= 15 V I = 1.0 A  
1.5  
S
fs  
DS  
, D  
C
C
C
Input Capacitance  
Output Capacitance  
Reverse Transfer  
Capacitance  
V
= 25V, f = 1 MHz, V = 0  
280  
38  
7
pF  
pF  
pF  
iss  
DS  
GS  
oss  
rss  
C
(3) Equivalent Output  
Capacitance  
= 0V, V = 0V to 480V  
30  
pF  
oss eq.  
GS  
DD  
DS  
t
Turn-on Delay Time  
Rise Time  
Turn-off Delay Time  
Fall Time  
V
R
= 300 V, I = 1.0 A  
10  
30  
23  
50  
ns  
ns  
ns  
ns  
d(on)  
D
t
= 4.7V = 10 V  
GS  
r
G
t
(Resistive Load see, Figure 3)  
d(off)  
t
f
Q
V
V
= 480V, I = 2.0 A,  
= 10V  
15  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
11  
2.25  
6
nC  
nC  
nC  
g
DD  
GS  
D
Q
gs  
Q
gd  
SOURCE DRAIN DIODE  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
I
2.0  
8.0  
A
A
Source-drain Current  
Source-drain Current (pulsed)  
SD  
(2)  
I
SDM  
V
(1)  
I
= 2.0 A, V = 0  
Forward On Voltage  
1.6  
V
SD  
SD  
GS  
t
Q
I
V
= 2.0 A, di/dt = 100 A/µs  
SD  
Reverse Recovery Time  
Reverse Recovery Charge  
Reverse Recovery Current  
178  
445  
5
ns  
nC  
A
rr  
= 20 V, T = 25°C  
rr  
DD  
j
I
(see test circuit, Figure 5)  
RRM  
t
Q
I
V
= 13 A, di/dt = 100 A/µs  
SD  
Reverse Recovery Time  
Reverse Recovery Charge  
Reverse Recovery Current  
200  
500  
5
ns  
nC  
A
rr  
= 20 V, T = 150°C  
rr  
DD  
j
I
(see test circuit, Figure 5)  
RRM  
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.  
2. Pulse width limited by safe operating area.  
3. C  
V
is defined as a constant equivalent capacitance giving the same charging time as C  
when V increases from 0 to 80%  
oss DS  
oss eq.  
.
DSS  
3/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
Safe Operating Area for TO-92  
Thermal Impedance for TO-92  
Safe Operating Area for TO-220FP  
Thermal Impedance for TO-220FP  
Safe Operating Area for IPAK  
Thermal Impedance for IPAK  
4/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
Transfer Characteristics  
Output Characteristics  
Transconductance  
Static Drain-source On Resistance  
Gate Charge vs Gate-source Voltage  
Capacitance Variations  
5/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
Normalized Gate Thereshold Voltage vs Temp.  
Normalized On Resistance vs Temperature  
Normalized BVDSS vs Temperature  
Source-drain Diode Forward Characteristics  
Maximum Avalanche Energy vs Temperature  
6/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
Fig. 1: Unclamped Inductive Load Test Circuit  
Fig. 2: Unclamped Inductive Waveform  
Fig. 3: Switching Times Test Circuit For  
Fig. 4: Gate Charge test Circuit  
Resistive Load  
Fig. 5: Test Circuit For Inductive Load Switching  
And Diode Recovery Times  
7/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
TO-92 MECHANICAL DATA  
mm.  
inch  
TYP.  
DIM.  
MIN.  
4.32  
0.36  
4.45  
3.30  
2.41  
1.14  
12.70  
2.16  
0.92  
0.41  
TYP  
MAX.  
4.95  
0.51  
4.95  
3.94  
2.67  
1.40  
15.49  
2.41  
1.52  
0.56  
MIN.  
0.170  
0.014  
0.175  
0.130  
0.094  
0.044  
0.50  
MAX.  
0.194  
0.020  
0.194  
0.155  
0.105  
0.055  
0.610  
0.094  
0.060  
0.022  
A
b
D
E
e
e1  
L
R
S1  
W
V
0.085  
0.036  
0.016  
5°  
5°  
8/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
TO-92 AMMOPACK  
mm.  
TYP  
inch  
DIM.  
MIN.  
4.45  
3.30  
MAX.  
4.95  
3.94  
1.6  
MIN.  
0.170  
0.130  
TYP.  
MAX.  
0.194  
0.155  
0.06  
0.09  
0.022  
0.51  
0.27  
0.11  
0.08  
0.74  
0.24  
0.36  
0.02  
0.80  
0.65  
0.98  
0.16  
0.035  
0.43  
A1  
T
T1  
T2  
2.3  
d
0.41  
12.5  
5.65  
2.44  
-2  
0.56  
12.9  
7.05  
2.94  
2
0.016  
0.49  
0.22  
0.09  
-0.08  
0.69  
0.22  
0.33  
P0  
12.7  
6.35  
2.54  
0.5  
0.25  
0.1  
P2  
F1, F2  
delta H  
W
17.5  
5.7  
18  
6
19  
0.71  
0.23  
0.35  
W0  
W1  
W2  
H
6.3  
8.5  
9
9.25  
0.5  
18.5  
15.5  
20.5  
16.5  
25  
0.72  
0.61  
H0  
H1  
D0  
t
16  
4
0.63  
3.8  
4.2  
0.15  
0.157  
0.9  
L
11  
l1  
3
0.11  
delta P  
-1  
1
-0.04  
0.04  
9/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
TO-220FP MECHANICAL DATA  
mm.  
TYP  
inch  
TYP.  
DIM.  
MIN.  
4.4  
MAX.  
4.6  
2.7  
2.75  
0.7  
1
MIN.  
0.173  
0.098  
0.098  
0.017  
0.030  
0.045  
0.045  
0.195  
0.094  
0.393  
MAX.  
0.181  
0.106  
0.108  
0.027  
0.039  
0.067  
0.067  
0.204  
0.106  
0.409  
A
B
2.5  
D
2.5  
E
0.45  
0.75  
1.15  
1.15  
4.95  
2.4  
F
F1  
F2  
G
1.7  
1.7  
5.2  
2.7  
10.4  
G1  
H
10  
L2  
L3  
L4  
L5  
L6  
L7  
Ø
16  
0.630  
28.6  
9.8  
2.9  
15.9  
9
30.6  
10.6  
3.6  
1.126  
.0385  
0.114  
0.626  
0.354  
0.118  
1.204  
0.417  
0.141  
0.645  
0.366  
0.126  
16.4  
9.3  
3
3.2  
L3  
L6  
L7  
1 2  
L4  
3
L5  
L2  
10/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
TO-251 (IPAK) MECHANICAL DATA  
mm  
inch  
TYP.  
DIM.  
MIN.  
2.2  
TYP.  
MAX.  
2.4  
MIN.  
0.086  
0.035  
0.027  
0.025  
0.204  
MAX.  
0.094  
0.043  
0.051  
0.031  
0.212  
0.033  
A
A1  
A3  
B
0.9  
1.1  
0.7  
1.3  
0.64  
5.2  
0.9  
B2  
B3  
B5  
B6  
C
5.4  
0.85  
0.3  
0.012  
0.95  
0.6  
0.6  
6.2  
6.6  
4.6  
16.3  
9.4  
1.2  
1
0.037  
0.023  
0.023  
0.244  
0.260  
0.181  
0.641  
0.370  
0.047  
0.039  
0.45  
0.48  
6
0.017  
0.019  
0.236  
0.252  
0.173  
0.626  
0.354  
0.031  
C2  
D
E
6.4  
4.4  
15.9  
9
G
H
L
L1  
L2  
0.8  
0.8  
0.031  
H
L
D
L2  
L1  
0068771-E  
11/12  
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the  
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from  
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications  
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information  
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or  
systems without express written approval of STMicroelectronics.  
The ST logo is a registered trademark of STMicroelectronics  
All other names are the property of their respective owners  
© 2004 STMicroelectronics - All Rights Reserved  
STMicroelectronics GROUP OF COMPANIES  
Australia - Belgium - Brazil - Canada - China - Czech Republic - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan -  
Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States.  
http://www.st.com  
12/12  

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