STF2HNK60Z [STMICROELECTRONICS]
N-CHANNEL 600V - 4.4ヘ - 2.0A TO-92/TO-220FP/IPAK Zener-Protected SuperMESH MOSFET; N沟道600V - 4.4ヘ - 2.0A TO- 92 / TO- 220FP / IPAK齐纳保护的超网MOSFET型号: | STF2HNK60Z |
厂家: | ST |
描述: | N-CHANNEL 600V - 4.4ヘ - 2.0A TO-92/TO-220FP/IPAK Zener-Protected SuperMESH MOSFET |
文件: | 总12页 (文件大小:410K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
STQ2HNK60ZR-AP
STF2HNK60Z - STD2HNK60Z-1
N-CHANNEL 600V - 4.4Ω - 2.0A TO-92/TO-220FP/IPAK
Zener-Protected SuperMESH™ MOSFET
TYPE
V
DSS
R
I
D
P
W
DS(on)
STQ2HNK60ZR-AP 600 V
< 4.8 Ω 0.5 A
3 W
STD2HNK60Z-1
STF2HNK60Z
600 V
600 V
< 4.8 Ω 2.0 A 45 W
< 4.8 Ω 2.0 A 20 W
3
2
TYPICAL R (on) = 4.4Ω
DS
1
EXTREMELY HIGH dv/dt CAPABILITY
ESD IMPROVED CAPABILITY
100% AVALANCHE TESTED
TO-92 (Ammopack)
TO-220FP
NEW HIGH VOLTAGE BENCHMARK
GATE CHARGE MINIMIZED
3
2
1
IPAK
DESCRIPTION
INTERNAL SCHEMATIC DIAGRAM
The SuperMESH™ series is obtained through an
extreme optimization of ST’s well established strip-
based PowerMESH™ layout. In addition to pushing
on-resistance significantly down, special care is tak-
en to ensure a very good dv/dt capability for the
most demanding applications. Such series comple-
ments ST full range of high voltage MOSFETs in-
cluding revolutionary MDmesh™ products.
APPLICATIONS
AC ADAPTORS AND BATTERY CHARGERS
SWITH MODE POWER SUPPLIES (SMPS)
ORDER CODES
PART NUMBER
STD2HNK60Z-1
STQ2HNK60ZR-AP
STF2HNK60Z
MARKING
D2HNK60Z
Q2HNK60ZR
F2HNK60Z
PACKAGE
IPAK
PACKAGING
TUBE
TO-92
AMMOPAK
TUBE
TO-220FP
April 2004
1/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
TO-220FP
600
Unit
IPAK
TO-92
V
DS
Drain-source Voltage (V = 0)
V
V
GS
V
DGR
Drain-gate Voltage (R = 20 kΩ)
600
GS
V
Gate- source Voltage
± 30
V
GS
I
Drain Current (continuous) at T = 25°C
2.0
1.26
8
2.0 (*)
1.26 (*)
8 (*)
0.5
0.32
2
A
D
C
I
D
Drain Current (continuous) at T = 100°C
A
C
I
( )
Drain Current (pulsed)
A
DM
P
TOT
Total Dissipation at T = 25°C
45
20
3
W
C
Derating Factor
0.36
0.16
0.025
W/°C
V
V
Gate source ESD(HBM-C=100pF, R=1.5KΩ)
Peak Diode Recovery voltage slope
Insulation Withstand Voltage (DC)
2000
4.5
ESD(G-S)
dv/dt (1)
V/ns
V
V
ISO
--
2500
--
T
T
stg
Operating Junction Temperature
Storage Temperature
j
-55 to 150
°C
( ) Pulse width limited by safe operating area
(1) I ≤ 2 A, di/dt ≤ 200 A/µs, V ≤ V
, T ≤ T
(BR)DSS j JMAX.
SD
DD
(*) Current Limited by package
THERMAL DATA
IPAK
2.77
100
--
TO-220FP
6.25
TO-92
--
Rthj-case Thermal Resistance Junction-case Max
Rthj-amb Thermal Resistance Junction-ambient Max
Rthj-lead Thermal Resistance Junction-lead Max
°C/W
°C/W
°C/W
°C
62.5
120
40
--
T
l
Maximum Lead Temperature For Soldering
Purpose
300
300
260
AVALANCHE CHARACTERISTICS
Symbol
Parameter
Max Value
Unit
I
Avalanche Current, Repetitive or Not-Repetitive
2
A
AR
(pulse width limited by T max)
j
E
AS
Single Pulse Avalanche Energy
120
mJ
(starting T = 25 °C, I = I , V = 50 V)
j
D
AR
DD
GATE-SOURCE ZENER DIODE
Symbol
BV
Parameter
Test Conditions
Igs=± 1mA (Open Drain)
Min.
30
Typ.
Max.
Unit
Gate-Source Breakdown
Voltage
V
GSO
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
2/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
ELECTRICAL CHARACTERISTICS (T
=25°C UNLESS OTHERWISE SPECIFIED)
CASE
ON/OFF
Symbol
Parameter
Drain-source
Test Conditions
Min.
Typ.
Max.
Unit
V
I
= 1 mA, V = 0
600
V
(BR)DSS
D
GS
Breakdown Voltage
I
Zero Gate Voltage
V
V
= Max Rating
= Max Rating, T = 125 °C
1
50
µA
µA
DSS
DS
DS
Drain Current (V = 0)
GS
C
I
Gate-body Leakage
V
= ± 20V
±10
µA
GSS
GS
Current (V = 0)
DS
V
V
V
= V , I = 50 µA
Gate Threshold Voltage
3
3.75
4.4
4.5
4.8
V
GS(th)
DS
GS
GS
D
R
DS(on)
Static Drain-source On
Resistance
= 10V, I = 1.0 A
Ω
D
DYNAMIC
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
g
(1)
Forward Transconductance
V
V
= 15 V I = 1.0 A
1.5
S
fs
DS
, D
C
C
C
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V
= 25V, f = 1 MHz, V = 0
280
38
7
pF
pF
pF
iss
DS
GS
oss
rss
C
(3) Equivalent Output
Capacitance
= 0V, V = 0V to 480V
30
pF
oss eq.
GS
DD
DS
t
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
V
R
= 300 V, I = 1.0 A
10
30
23
50
ns
ns
ns
ns
d(on)
D
t
= 4.7Ω V = 10 V
GS
r
G
t
(Resistive Load see, Figure 3)
d(off)
t
f
Q
V
V
= 480V, I = 2.0 A,
= 10V
15
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
11
2.25
6
nC
nC
nC
g
DD
GS
D
Q
gs
Q
gd
SOURCE DRAIN DIODE
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
I
2.0
8.0
A
A
Source-drain Current
Source-drain Current (pulsed)
SD
(2)
I
SDM
V
(1)
I
= 2.0 A, V = 0
Forward On Voltage
1.6
V
SD
SD
GS
t
Q
I
V
= 2.0 A, di/dt = 100 A/µs
SD
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
178
445
5
ns
nC
A
rr
= 20 V, T = 25°C
rr
DD
j
I
(see test circuit, Figure 5)
RRM
t
Q
I
V
= 13 A, di/dt = 100 A/µs
SD
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
200
500
5
ns
nC
A
rr
= 20 V, T = 150°C
rr
DD
j
I
(see test circuit, Figure 5)
RRM
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3. C
V
is defined as a constant equivalent capacitance giving the same charging time as C
when V increases from 0 to 80%
oss DS
oss eq.
.
DSS
3/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
Safe Operating Area for TO-92
Thermal Impedance for TO-92
Safe Operating Area for TO-220FP
Thermal Impedance for TO-220FP
Safe Operating Area for IPAK
Thermal Impedance for IPAK
4/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
Transfer Characteristics
Output Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
5/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
Normalized Gate Thereshold Voltage vs Temp.
Normalized On Resistance vs Temperature
Normalized BVDSS vs Temperature
Source-drain Diode Forward Characteristics
Maximum Avalanche Energy vs Temperature
6/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Fig. 4: Gate Charge test Circuit
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
7/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
TO-92 MECHANICAL DATA
mm.
inch
TYP.
DIM.
MIN.
4.32
0.36
4.45
3.30
2.41
1.14
12.70
2.16
0.92
0.41
TYP
MAX.
4.95
0.51
4.95
3.94
2.67
1.40
15.49
2.41
1.52
0.56
MIN.
0.170
0.014
0.175
0.130
0.094
0.044
0.50
MAX.
0.194
0.020
0.194
0.155
0.105
0.055
0.610
0.094
0.060
0.022
A
b
D
E
e
e1
L
R
S1
W
V
0.085
0.036
0.016
5°
5°
8/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
TO-92 AMMOPACK
mm.
TYP
inch
DIM.
MIN.
4.45
3.30
MAX.
4.95
3.94
1.6
MIN.
0.170
0.130
TYP.
MAX.
0.194
0.155
0.06
0.09
0.022
0.51
0.27
0.11
0.08
0.74
0.24
0.36
0.02
0.80
0.65
0.98
0.16
0.035
0.43
A1
T
T1
T2
2.3
d
0.41
12.5
5.65
2.44
-2
0.56
12.9
7.05
2.94
2
0.016
0.49
0.22
0.09
-0.08
0.69
0.22
0.33
P0
12.7
6.35
2.54
0.5
0.25
0.1
P2
F1, F2
delta H
W
17.5
5.7
18
6
19
0.71
0.23
0.35
W0
W1
W2
H
6.3
8.5
9
9.25
0.5
18.5
15.5
20.5
16.5
25
0.72
0.61
H0
H1
D0
t
16
4
0.63
3.8
4.2
0.15
0.157
0.9
L
11
l1
3
0.11
delta P
-1
1
-0.04
0.04
9/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
TO-220FP MECHANICAL DATA
mm.
TYP
inch
TYP.
DIM.
MIN.
4.4
MAX.
4.6
2.7
2.75
0.7
1
MIN.
0.173
0.098
0.098
0.017
0.030
0.045
0.045
0.195
0.094
0.393
MAX.
0.181
0.106
0.108
0.027
0.039
0.067
0.067
0.204
0.106
0.409
A
B
2.5
D
2.5
E
0.45
0.75
1.15
1.15
4.95
2.4
F
F1
F2
G
1.7
1.7
5.2
2.7
10.4
G1
H
10
L2
L3
L4
L5
L6
L7
Ø
16
0.630
28.6
9.8
2.9
15.9
9
30.6
10.6
3.6
1.126
.0385
0.114
0.626
0.354
0.118
1.204
0.417
0.141
0.645
0.366
0.126
16.4
9.3
3
3.2
L3
L6
L7
1 2
L4
3
L5
L2
10/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
TO-251 (IPAK) MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
2.2
TYP.
MAX.
2.4
MIN.
0.086
0.035
0.027
0.025
0.204
MAX.
0.094
0.043
0.051
0.031
0.212
0.033
A
A1
A3
B
0.9
1.1
0.7
1.3
0.64
5.2
0.9
B2
B3
B5
B6
C
5.4
0.85
0.3
0.012
0.95
0.6
0.6
6.2
6.6
4.6
16.3
9.4
1.2
1
0.037
0.023
0.023
0.244
0.260
0.181
0.641
0.370
0.047
0.039
0.45
0.48
6
0.017
0.019
0.236
0.252
0.173
0.626
0.354
0.031
C2
D
E
6.4
4.4
15.9
9
G
H
L
L1
L2
0.8
0.8
0.031
H
L
D
L2
L1
0068771-E
11/12
STQ2HNK60ZR-AP - STF2HNK60Z - STD2HNK60Z-1
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics
All other names are the property of their respective owners
© 2004 STMicroelectronics - All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
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http://www.st.com
12/12
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