STD1HNC60-1 [STMICROELECTRONICS]
N-CHANNEL 600V 4 OHM 2A DPAK/IPAK POWERMESH II MOSFET ; N沟道600V 4 OHM 2A DPAK / IPAK的PowerMESH II MOSFET\n型号: | STD1HNC60-1 |
厂家: | ST |
描述: | N-CHANNEL 600V 4 OHM 2A DPAK/IPAK POWERMESH II MOSFET
|
文件: | 总9页 (文件大小:271K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
STD1HNC60
N-CHANNEL 600V - 4Ω - 2A - IPAK/DPAK
PowerMesh™II MOSFET
TYPE
V
DSS
R
I
D
DS(on)
STD1HNC60
600 V
< 5 Ω
2 A
■
■
■
■
■
TYPICAL R (on) = 4 Ω
DS
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
NEW HIGH VOLTAGE BENCHMARK
GATE CHARGE MINIMIZED
3
3
2
1
1
DPAK
TO-252
IPAK
DESCRIPTION
TO-251
The PowerMESH™II is the evolution of the first
generation of MESH OVERLAY™. The layout re-
finements introduced greatly improve the Ron*area
figure of merit while keeping the device at the lead-
ing edge for what concerns swithing speed, gate
charge and ruggedness.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■
■
■
HIGH CURRENT, HIGH SPEED SWITCHING
SWITH MODE POWER SUPPLIES (SMPS)
DC-AC CONVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE
POWER SUPPLIES AND MOTOR DRIVER
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
600
600
±30
2
Unit
V
V
DS
Drain-source Voltage (V = 0)
GS
V
Drain-gate Voltage (R = 20 kΩ)
V
DGR
GS
V
GS
Gate- source Voltage
V
I
D
Drain Current (continuos) at T = 25°C
A
C
I
Drain Current (continuos) at T = 100°C
1.3
A
D
C
(1)
Drain Current (pulsed)
8
A
I
DM
P
TOT
Total Dissipation at T = 25°C
50
W
C
Derating Factor
0.4
3.5
W/°C
V/ns
°C
dv/dt
Peak Diode Recovery voltage slope
Storage Temperature
T
stg
–65 to 150
150
T
Max. Operating Junction Temperature
°C
j
(•)Pulse width limited by safe operating area
(1)I ≤ 2A, di/dt ≤100A/µs, V ≤ V
, T ≤ T
(BR)DSS j JMAX
SD
DD
.
February 2001
1/9
STD1HNC60
THERMAL DATA
Rthj-case
Rthj-amb
Rthj-sink
Thermal Resistance Junction-case Max
2.5
100
1.5
°C/W
°C/W
°C/W
°C
Thermal Resistance Junction-ambient Max
Thermal Resistance case-sink Typ
T
Maximum Lead Temperature For Soldering Purpose
275
l
AVALANCHE CHARACTERISTICS
Symbol
Parameter
Max Value
Unit
I
Avalanche Current, Repetitive or Not-Repetitive
2
A
AR
(pulse width limited by T max)
j
E
Single Pulse Avalanche Energy
120
mJ
AS
(starting T = 25 °C, I = I , V = 50 V)
j
D
AR
DD
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
Parameter
Drain-source
Breakdown Voltage
Test Conditions
Min.
Typ.
Max.
Unit
V
I
D
= 250 µA, V = 0
600
(BR)DSS
GS
V
I
Zero Gate Voltage
V
V
V
= Max Rating
1
µA
µA
nA
DSS
DS
Drain Current (V = 0)
GS
= Max Rating, T = 125 °C
50
DS
GS
C
I
Gate-body Leakage
= ±30V
±100
GSS
Current (V = 0)
DS
ON (1)
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
V
V
GS(th)
V
V
= V , I = 250µA
Gate Threshold Voltage
2
3
4
4
5
DS
GS
D
R
Static Drain-source On
Resistance
= 10V, I = 1 A
D
Ω
DS(on)
GS
I
On State Drain Current
V
V
> I
= 10V
x R
DS(on)max,
2
A
D(on)
DS
D(on)
GS
DYNAMIC
Symbol
Parameter
Test Conditions
x R
DS(on)max,
Min.
Typ.
Max.
Unit
g
fs
(1)
Forward Transconductance
V
DS
> I
2
S
D(on)
I
D
= 1A
C
C
V = 25V, f = 1 MHz, V = 0
DS GS
Input Capacitance
Output Capacitance
228
40
pF
pF
iss
oss
Reverse Transfer
Capacitance
C
rss
6
pF
2/9
STD1HNC60
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
t
V
R
= 300V, I = 1 A
= 4.7Ω V = 10V
GS
9
8.5
ns
ns
Turn-on Delay Time
Rise Time
d(on)
DD
D
t
r
G
(see test circuit, Figure 3)
Q
Q
Q
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V
V
= 480V, I = 2 A,
= 10V
15.5
nC
nC
nC
11.3
2.8
5
g
DD
D
gs
gd
GS
SWITCHING OFF
Symbol
Parameter
Test Conditions
Min.
Min.
Typ.
Max.
Unit
t
V
R
= 480V, I = 2 A,
Off-voltage Rise Time
Fall Time
Cross-over Time
18
9
27
ns
ns
ns
r(Voff)
DD
D
t
f
= 4.7Ω, V = 10V
GS
(see test circuit, Figure 5)
G
t
c
SOURCE DRAIN DIODE
Symbol
Parameter
Test Conditions
Typ.
Max.
2
Unit
A
I
Source-drain Current
SD
I
(2)
(1)
Source-drain Current (pulsed)
Forward On Voltage
8
A
SDM
V
I
I
= 2 A, V = 0
1.6
V
SD
SD
GS
t
rr
= 2A, di/dt = 100A/µs, V
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
480
1032
4.3
ns
nC
A
SD
DD
= 100V, Tj = 150°C
(see test circuit, Figure 5)
Q
rr
I
RRM
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedence
3/9
STD1HNC60
Transfer Characteristics
Output Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/9
STD1HNC60
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
5/9
STD1HNC60
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Fig. 4: Gate Charge test Circuit
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/9
STD1HNC60
TO-252 (DPAK) MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
2.20
0.90
0.03
0.64
5.20
0.45
0.48
6.00
6.40
4.40
9.35
TYP.
MAX.
2.40
1.10
0.23
0.90
5.40
0.60
0.60
6.20
6.60
4.60
10.10
MIN.
0.087
0.035
0.001
0.025
0.204
0.018
0.019
0.236
0.252
0.173
0.368
MAX.
0.094
0.043
0.009
0.035
0.213
0.024
0.024
0.244
0.260
0.181
0.398
A
A1
A2
B
B2
C
C2
D
E
G
H
L2
L4
V2
0.8
0.031
0.60
0o
1.00
8o
0.024
0o
0.039
0o
P032P_B
7/9
STD1HNC60
TO-251 (IPAK) MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
2.2
TYP.
MAX.
2.4
MIN.
0.086
0.035
0.027
0.025
0.204
MAX.
0.094
0.043
0.051
0.031
0.212
0.033
A
A1
A3
B
0.9
1.1
0.7
1.3
0.64
5.2
0.9
B2
B3
B5
B6
C
5.4
0.85
0.3
0.012
0.95
0.6
0.6
6.2
6.6
4.6
16.3
9.4
1.2
1
0.037
0.023
0.023
0.244
0.260
0.181
0.641
0.370
0.047
0.039
0.45
0.48
6
0.017
0.019
0.236
0.252
0.173
0.626
0.354
0.031
C2
D
E
6.4
4.4
15.9
9
G
H
L
L1
L2
0.8
0.8
0.031
H
L
D
L2
L1
0068771-E
8/9
STD1HNC60
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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9/9
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