M48T212V-70MH1TR [STMICROELECTRONICS]

5V/3.3V TIMEKEEPER[ CONTROLLER; 5V / 3.3V TIMEKEEPER [控制器
M48T212V-70MH1TR
型号: M48T212V-70MH1TR
厂家: ST    ST
描述:

5V/3.3V TIMEKEEPER[ CONTROLLER
5V / 3.3V TIMEKEEPER [控制器

计时器或实时时钟 微控制器和处理器 外围集成电路 光电二极管 双倍数据速率
文件: 总23页 (文件大小:151K)
中文:  中文翻译
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M48T212Y  
M48T212V  
5V/3.3V TIMEKEEPER CONTROLLER  
CONVERTS LOW POWER SRAM into  
SNAPHAT (SH)  
Battery  
NVRAMs  
YEAR 2000 COMPLIANT (4-Digit Year)  
BATTERY LOW FLAG  
INTEGRATED REAL TIME CLOCK,  
POWER-FAIL CONTROL CIRCUIT, BATTERY  
and CRYSTAL  
AUTOMATIC POWER-FAIL CHIP DESELECT  
and WRITE PROTECTION  
44  
WATCHDOG TIMER  
1
CHOICE of WRITE PROTECT VOLTAGES  
(V  
= Power-fail Deselect Voltage):  
PFD  
SOH44 (MH)  
– M48T212Y: 4.2V V  
– M48T212V: 2.7V V  
4.5V  
3.0V  
PFD  
PFD  
Figure 1. Logic Diagram  
MICROPROCESSOR POWER-ON RESET  
PROGRAMMABLE ALARM OUTPUT ACTIVE  
in the BATTERY BACKED-UP MODE  
V
V
CCSW  
PACKAGING INCLUDES a44-LEAD SOIC and  
CC  
SNAPHAT TOP (to be Ordered Separately)  
4
8
DESCRIPTION  
The M48T212Y/V are self-contained devices that  
include a real time clock (RTC), programmable  
alarms, a watchdog timer, and two external chip  
enable outputs which provide control of up to four  
(two in parallel) external low-power static RAMs.  
Access to all TIMEKEEPER functions and the  
external RAM is the same as conventional byte-  
wide SRAM. The 16 TIMEKEEPER Registers offer  
Century, Year, Month, Date, Day, Hour, Minute,  
Second, Calibration, Alarm, Watchdog, and Flags.  
Externally attached static RAMs are controlled by  
A0-A3  
DQ0-DQ7  
A
E
IRQ/FT  
RST  
EX  
M48T212Y  
M48T212V  
W
E1  
E2  
CON  
CON  
G
WDI  
RSTIN1  
RSTIN2  
the M48T212Y/V via the E1  
nals (see Table 4).  
and E2  
sig-  
CON  
CON  
V
OUT  
The 44 pin 330mil SOIC provides sockets with  
gold plated contacts at both ends for direct con-  
nection to a separate SNAPHAT housing contain-  
ing the battery and crystal. The unique design  
allows the SNAPHAT battery package to be  
mounted on top of the SOIC package after the  
completion of the surface mount process.  
V
SS  
AI03019  
April 2000  
1/23  
M48T212Y, M48T212V  
Figure 2. SOIC Connections  
Table 1. Signal Names  
A0-A3  
DQ0-DQ7  
RSTIN1  
RSTIN2  
RST  
WDI  
A
Address Inputs  
RSTIN1  
RSTIN2  
RST  
NC  
1
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
V
V
V
CC  
Data Inputs/Outputs  
Reset 1 Input  
2
OUT  
3
CCSW  
Reset 2 Input  
4
IRQ/FT  
EX  
NC  
NC  
NC  
NC  
NC  
G
NC  
5
Reset Output (Open Drain)  
Watchdog Input  
NC  
6
NC  
7
Bank Select Input  
NC  
8
A
9
E
Chip Enable Input  
NC  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
EX  
External Chip Enable Input  
Output Enable Input  
Write Enable Input  
M48T212Y  
M48T212V  
NC  
G
NC  
W
A3  
NC  
NC  
E
W
A2  
E1  
RAM Chip Enable 1 Output  
RAM Chip Enable 2 Output  
Int/Freq Test Output (Open Drain)  
CON  
A1  
E2  
CON  
A0  
E1  
CON  
WDI  
DQ7  
DQ6  
DQ5  
DQ4  
DQ3  
NC  
IRQ/FT  
Vccsw  
E2  
CON  
DQ0  
V
Switch Output  
CC  
V
OUT  
Supply Voltage Output  
Supply Voltage  
DQ1  
DQ2  
V
CC  
V
SS  
V
Ground  
SS  
AI03020  
NC  
Not Connected internally  
Insertion of the SNAPHAT housing after reflow  
prevents potential battery and crystal damage due  
to the high temperatures required for device sur-  
face-mounting. The SNAPHAT housing is keyed  
to prevent reverse insertion.  
adjusted for months with less than 31 days and  
corrects for leap years. The internal watchdog tim-  
er provides programmable alarm windows.  
The nine clock bytes (Fh - 9h and 1h) are not the  
actual clock counters, they are memory locations  
TM  
The SOIC and battery/crystal packages are  
shipped separately in plastic anti-static tubes or in  
Tape & Reel form. For the 44 lead SOIC, the bat-  
tery/crystal package (i.e. SNAPHAT) part number  
is ”M4TXX-BR12SH” (see Table 15).  
Caution: Do not place the SNAPHAT battery/crys-  
tal top in conductive foam, as this will drain the lith-  
ium button-cell battery.  
consisting of BiPORT  
read/write memory cells  
within the static RAM array. Clock circuitry up-  
dates the clock bytes with current information once  
per second. The information can be accessed by  
the user in the same manner as any other location  
in the static memory array.  
Byte 8h is the clock control register. This byte con-  
trols user access to the clock information and also  
stores the clock calibration setting. Byte 7h con-  
tains the watchdog timer setting. The watchdog  
timer can generate either a reset or an interrupt,  
depending on the state of the Watchdog Steering  
bit (WDS). Bytes 6h-2h include bits that, when pro-  
grammed, provide for clock alarm functionality.  
Automatic backup and write protection for an ex-  
ternal SRAM is provided through V  
, E1  
OUT  
CON  
and E2  
pins. (Users are urged to insure that  
CON  
voltage specifications, for both the controller chip  
and external SRAM chosen, are similar). The  
SNAPHAT containing the lithium energy source  
used to permanently power the real time clock is  
also used to retain RAM data in the absence of  
Alarms are activated when the register content  
matches the month, date, hours, minutes, and  
seconds of the clock registers. Byte 1h contains  
century information. Byte 0h contains additional  
flag information pertaining to the watchdog timer,  
alarm and battery status.  
V
power through the V  
pin.  
CC  
OUT  
The chip enable outputs to RAM (E1  
and  
CON  
E2  
) are controlled during power transients to  
CON  
prevent data corruption. The date is automatically  
2/23  
M48T212Y, M48T212V  
(1)  
Table 2. Absolute Maximum Ratings  
Symbol  
Parameter  
Value  
Unit  
T
A
Ambient Operating Temperature  
0 to 70  
°C  
Storage Temperature (V Off, Oscillator Off) SNAPHAT  
–40 to 85  
–55 to 125  
CC  
T
°C  
STG  
SOIC  
Lead Solder Temperature for 10 sec  
Input or Output Voltages  
(2)  
260  
°C  
T
SLD  
V
–0.3 to V  
+0.3  
V
IO  
CC  
Supply Voltage  
M48T212Y  
M48T212V  
–0.3 to 7  
–0.3 to 4.6  
V
V
CC  
I
Output Current  
20  
1
mA  
W
O
P
Power Dissipation  
D
Note: 1. Stresses greater than those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress  
rating only and functional operation of the device at these or any other conditions above those indicated in the operational section  
of this specification is not implied. Exposure to the absolute maximum rating conditions for extended periods of time may affect  
reliability.  
2. Soldering temperature not to exceed 260°C for 10 seconds (total thermal budget not to exceed 150°C for longer than 30 seconds).  
CAUTION: Negative undershoots below –0.3V are not allowed on any pin while in the Battery Back-up mode.  
CAUTION: Do NOT wave solder SOIC to avoid damaging SNAPHAT sockets.  
(1)  
Table 3. Operating Modes  
V
Mode  
Deselect  
Write  
E
G
X
X
W
DQ7-DQ0  
Power  
Standby  
Active  
CC  
V
X
High-Z  
IH  
4.5V to 5.5V  
or  
3.0V to 3.6V  
V
V
V
V
D
IL  
IL  
IL  
IL  
IH  
IH  
IN  
V
V
V
D
OUT  
Read  
Active  
IL  
V
Read  
High-Z  
High-Z  
High-Z  
Active  
IH  
(2)  
Deselect  
Deselect  
X
X
X
CMOS Standby  
Battery Back-Up  
V
to V  
(min)  
PFD  
SO  
(2)  
X
X
X
V  
SO  
Note: 1. X = V or V  
.
IL  
IH  
2. V = Battery Back-up Switchover Voltage. (See Tables 7A and 7B for details).  
SO  
(1)  
Table 4. Truth Table for SRAM Bank Select  
Mode  
V
EX  
Low  
Low  
High  
A
Low  
High  
X
E1  
E2  
CON  
Power  
Active  
CC  
CON  
Low  
High  
4.5V to 5.5V  
or  
3.0V to 3.6V  
Select  
High  
High  
Low  
Active  
Deselect  
Deselect  
High  
Standby  
(2)  
X
X
X
X
High  
High  
High  
High  
CMOS Standby  
Battery Back-Up  
V
to V  
(min)  
PFD  
SO  
(2)  
Deselect  
V  
SO  
Note: 1. X = V or V  
.
IL  
IH  
2. V = Battery Back-up Switchover Voltage. (See Tables 7A and 7B for details).  
SO  
3/23  
M48T212Y, M48T212V  
Figure 3. Hardware Hookup  
A0-A18  
MOTOROLA  
MTD20P06HDL  
5V/3.3V  
A0-A3  
V
CCSW  
V
CC  
A0-Axx  
0.1µF  
1N5817 (1)  
V
V
OUT  
CC  
A
E
0.1µF  
CMOS  
SRAM  
E
EX  
W
E1  
CON  
Note 2  
G
E2  
CON  
WDI  
RSTIN1  
RSTIN2  
A0-Axx  
RST  
V
CC  
DQ0-DQ7  
IRQ/FT  
CMOS  
SRAM  
V
E
SS  
M48T212Y/V  
AI03046  
Note: 1. See description in Power Supply Decoupling and Undershoot Protection.  
2. Traces connecting E1 and E2 to external SRAM should be as short as possible.  
CON  
CON  
Figure 4. AC Testing Load Circuit  
Table 5. AC Measurement Conditions  
Input Rise and Fall Times  
5ns  
0 to 3V  
1.5V  
Input Pulse Voltages  
645Ω  
DEVICE  
UNDER  
TEST  
Input and Output Timing Ref. Voltages  
Note that Output Hi-Z is defined as the point where data  
is no longer driven.  
C
C
= 100pF or 5pF (1)  
= 30 pF (2)  
1.75V  
L
L
C
includes JIG capacitance  
L
AI03239  
Note: 1. DQ0-DQ7  
2. E1 and E2  
CON  
CON  
4/23  
M48T212Y, M48T212V  
(1)  
Table 6. Capacitance  
A
(T = 25 °C, f = 1 MHz)  
Symbol  
Parameter  
Input Capacitance  
Test Condition  
Min  
Max  
Unit  
C
V
= 0V  
= 0V  
10  
pF  
IN  
IN  
(2)  
V
Input/Output Capacitance  
10  
pF  
C
OUT  
OUT  
Note: 1. Sampled only, not 100% tested.  
2. Outputs deselected.  
Table 7A. DC Characteristics for M48T212V  
(T = 0 to 70°C; V = 3V to 3.6V)  
A
CC  
Symbol  
Parameter  
Test Condition  
0V V V  
Min  
Typ  
Max  
Unit  
(1,2)  
Input Leakage Current  
Output Leakage Current  
±1  
±1  
µA  
µA  
I
LI  
IN  
CC  
(1)  
0V V  
V  
CC  
I
OUT  
LO  
I
Supply Current  
Outputs open  
4
10  
3
mA  
mA  
mA  
nA  
nA  
V
CC  
I
E = V  
Supply Current (Standby) TTL  
Supply Current (Standby) CMOS  
Battery Current OSC ON  
Battery Current OSC OFF  
Input Low Voltage  
CC1  
IH  
I
E = V –0.2  
2
CC2  
CC  
575  
800  
100  
0.8  
I
BAT  
V
V
–0.3  
2.0  
IL  
V
+ 0.3  
CC  
Input High Voltage  
V
IH  
Output Low Voltage  
I
= 2.1mA  
= 10mA  
0.4  
0.4  
V
OL  
V
OL  
(3)  
I
V
V
V
OL  
Output Low Voltage (open drain)  
Output High Voltage  
V
I
= –1.0mA  
= –1.0µA  
2.4  
2.0  
OH  
OH  
(4)  
(5)  
V
Battery Back-up  
Current (Active)  
I
OUT2  
3.6  
V
I
OH  
OHB  
V
OUT  
V
> V –0.3  
70  
100  
3.0  
mA  
µA  
V
OUT1 CC  
OUT1  
I
V
OUT  
Current (Battery Back-up)  
V
> V  
–0.3  
BAT  
OUT2  
OUT2  
V
Power-fail Deselect Voltage  
2.7  
2.9  
PFD  
V
V
–100mV  
PFD  
Battery Back-up Switchover Voltage  
Battery Voltage  
V
SO  
V
3.0  
V
BAT  
Note: 1. Outputs deselected.  
2. RSTIN1 and RSTIN2 internally pulled-up to V through 100Kresistor. WDI internally pulled-down to V through 100Kresistor.  
CC  
SS  
3. For IRQ/FT & RST pins (Open Drain).  
4. Conditioned outputs (E1 - E2 ) can only sustain CMOS leakage currents in the battery back-up mode. Higher leakage cur-  
CON  
CON  
rents will reduce battery life.  
5. External SRAM must match TIMEKEEPER Controller chip V specification.  
CC  
5/23  
M48T212Y, M48T212V  
Table 7B. DC Characteristics for M48T212Y  
(T = 0 to 70°C; V = 4.5V to 5.5V)  
A
CC  
Symbol  
Parameter  
Test Condition  
Min  
Typ  
Max  
Unit  
(1,2)  
0V V V  
Input Leakage Current  
Output Leakage Current  
±1  
µA  
I
IN  
CC  
LI  
(1)  
0V V  
V  
CC  
±1  
µA  
I
OUT  
LO  
I
Supply Current  
Outputs open  
8
15  
5
mA  
mA  
mA  
nA  
nA  
V
CC  
I
E = V  
Supply Current (Standby) TTL  
Supply Current (Standby) CMOS  
Battery Current OSC ON  
Battery Current OSC OFF  
Input Low Voltage  
CC1  
IH  
I
E = V –0.2  
3
CC2  
CC  
575  
800  
100  
0.8  
I
BAT  
V
–0.3  
2.2  
IL  
V
V
+ 0.3  
CC  
Input High Voltage  
V
IH  
I
= 2.1mA  
= 10mA  
OL  
Output Low Voltage  
0.4  
0.4  
V
OL  
V
OL  
(3)  
I
V
V
V
Output Low Voltage (open drain)  
Output High Voltage  
V
I
= –1.0mA  
OH  
2.4  
2.0  
OH  
(4)  
(5)  
V
Battery Back-up  
Current (Active)  
I = –1.0µA  
OUT2  
3.6  
V
OH  
OHB  
V
V
V
> V –0.3  
100  
100  
4.5  
mA  
µA  
V
I
OUT  
OUT1  
CC  
OUT1  
I
Current (Battery Back-up)  
V
> V  
–0.3  
BAT  
OUT2  
OUT  
OUT2  
V
Power-fail Deselect Voltage  
4.2  
4.35  
3.0  
PFD  
V
Battery Back-up Switchover Voltage  
Battery Voltage  
V
SO  
V
3.0  
V
BAT  
Note: 1. Outputs deselected.  
2. RSTIN1 and RSTIN2 internally pulled-up to V through 100Kresistor. WDI internally pulled-down to V through 100Kresistor.  
CC  
SS  
3. For IRQ/FT & RST pins (Open Drain).  
4. Conditioned outputs (E1 - E2 ) can only sustain CMOS leakage currents in the battery back-up mode. Higher leakage cur-  
CON  
CON  
rents will reduce battery life.  
5. External SRAM must match TIMEKEEPER Controller chip V specification.  
CC  
The M48T212Y/V also has its own Power-Fail De-  
tect circuit. This control circuitry constantly moni-  
tors the supply voltage for an out of tolerance  
Address Decoding  
The M48T212Y/V accommodates 4 address lines  
(A3-A0) which allow access to the sixteen bytes of  
the TIMEKEEPER clock registers. All TIMEKEEP-  
ER registers reside in the controller chip itself. All  
TIMEKEEPER registers are accessed by enabling  
E (Chip Enable).  
condition. When V is out of tolerance, the circuit  
CC  
write protects the TIMEKEEPER register data and  
external SRAM, providing data security in the  
midst of unpredictable system operation. As V  
CC  
falls, the control circuitry automatically switches to  
the battery, maintaining data and clock operation  
until valid power is restored.  
6/23  
M48T212Y, M48T212V  
Figure 5. Power Down/Up AC Waveform  
V
CC  
V
V
V
(max)  
(min)  
PFD  
PFD  
SO  
tF  
tR  
tFB  
tRB  
tREC  
INPUTS  
VALID  
DON’T CARE  
VALID  
VALID  
HIGH-Z  
OUTPUTS  
VALID  
RST  
V
CCSW  
AI02638  
Table 8. Power Down/Up AC Characteristics  
(T = 0 to 70°C)  
A
Symbol  
Parameter  
Min  
Max  
Unit  
V
(max) to V  
(min) V Fall Time  
300  
µs  
t
PFD  
PFD  
PFD  
CC  
F
M48T212Y  
M48T212V  
10  
150  
10  
40  
1
µs  
µs  
µs  
ms  
µs  
t
FB  
V
(min) to V  
(min) to V  
V
Fall Time  
SS CC  
t
V
V
V
(max) V  
Rise Time  
CC  
R
PFD  
PFD  
PFD  
t
(max) to RST High  
to V (min) V Rise Time  
200  
REC  
t
RB  
SS  
PFD  
CC  
7/23  
M48T212Y, M48T212V  
Figure 6. Chip Enable Control and Bank Select Timing  
EX  
tEXPD  
tAPD  
A
tEXPD  
E1  
CON  
E2  
CON  
AI02639  
Table 9. Chip Enable Control and Bank Select Characteristics  
(T = 0 to 70°C)  
A
M48T212Y  
-70  
M48T212V  
-85  
Symbol  
Parameter  
Unit  
Min  
Max  
Min  
Max  
t
EX to E1  
or E2  
(Low or High)  
10  
10  
15  
15  
ns  
ns  
EXPD  
CON  
CON  
t
A to E1  
or E2  
(Low or High)  
APD  
CON  
CON  
8/23  
M48T212Y, M48T212V  
READ MODE  
viding that the E and G access times are also sat-  
isfied.If they are not, then data access must be  
measured from the latter occurring signal (E or G)  
The M48T212Y/V executes a read cycle whenev-  
er W (Write Enable) is high and E (Chip Enable) is  
low. The unique address specified by the address  
inputs (A3-A0) defines which one of the on-chip  
TIMEKEEPER registers is to be accessed. When  
the address presented to the M48T212Y/V is in  
the range of 0h-Fh, one of the on-board TIME-  
KEEPER registers is accessed and valid data will  
be available to the eight data output drivers within  
and the limiting parameter is either t  
GLQV  
for E or  
ELQV  
t
for G rather than the address access time.  
When EX input is low, an external SRAM location  
will be selected.  
Note: Care should be taken to avoid taking both E  
and EX low simultaneously to avoid bus conten-  
tion.  
t
after the address input signal is stable, pro-  
AVQV  
Figure 7. Read Cycle Timing: RTC Control Signals  
READ  
tAVAV  
READ  
tAVAV  
WRITE  
tAVAV  
ADDRESS  
tELQV  
tELQX  
tAVQV  
tAVWL  
tWHAX  
E
tGLQV  
G
tWLWH  
W
tGLQX  
tAXQX  
tGHQZ  
DATA OUT  
VALID  
DATA OUT  
VALID  
DATA IN  
VALID  
DQ7-DQ0  
AI02640  
Table 10. Read Mode Characteristics  
(T = 0 to 70°C)  
A
M48T212Y  
-70  
M48T212V  
-85  
Symbol  
Parameter  
Unit  
Min  
Max  
Min  
Max  
t
Read Cycle Time  
70  
85  
ns  
ns  
ns  
ns  
ns  
AVAV  
t
Address Valid to Output Valid  
70  
70  
25  
85  
85  
35  
AVQV  
t
Chip Enable Low to Output Valid  
Output Enable Low to Output Valid  
Chip Enable Low to Output Transition  
ELQV  
GLQV  
t
(1)  
(1)  
(1)  
(1)  
5
0
5
0
t
ELQX  
GLQX  
EHQZ  
Output Enable Low to Output Transition  
Chip Enable High to Output Hi-Z  
ns  
ns  
ns  
ns  
t
t
20  
20  
25  
25  
Output Enable High to Output Hi-Z  
Address Transition to Output Transition  
t
GHQZ  
t
5
5
AXQX  
Note: 1. C = 5pF  
L
9/23  
M48T212Y, M48T212V  
WRITE MODE  
The M48T212Y/V is in the Write Mode whenever  
W (Write Enable) and E (Chip Enable) are in a low  
state after the address inputs are stable. The start  
of a write is referenced from the latter occurring  
falling edge of W or E. A write is terminated by the  
earlier rising edge of W or E. The addresses must  
be heldvalid throughout the cycle. E or W must re-  
G should be kept high during write cycles to avoid  
bus contention; although, if the output bus has  
been activated by a low on E and G alow on W will  
disable the outputs t  
after W falls.  
WLQZ  
When E is low during the write, one of the on-  
board TIMEKEEPER registers will be selected and  
data will be written into the device. When EX is low  
(and E is high) an external SRAM location is se-  
lected.  
Note: Care should be taken to avoid taking both E  
and EX low simultaneously to avoid bus conten-  
tion.  
turn high for a minimum of t  
from Chip Enable  
EHAX  
or t  
from Write Enable prior to the initiation of  
WHAX  
another read or write cycle. Data-in must be valid  
t
t
prior to the end of write and remain valid for  
afterward.  
DVWH  
WHDX  
Figure 8. Write Cycle Timing: RTC Control Signals  
WRITE  
tAVAV  
WRITE  
tAVAV  
READ  
tAVAV  
ADDRESS  
tAVEH  
tELEH  
tAVWH  
tEHAX tWHAX  
tAVEL  
tAVQV  
E
tGLQV  
G
tEHDX  
tAVWL  
tWLWH  
tWHQX  
tWLQZ  
W
tEHQZ  
tDVEH tDVWH  
tWHDX  
DATA OUT  
VALID  
DATA IN  
VALID  
DATA IN  
VALID  
DATA OUT  
VALID  
DQ0-DQ7  
AI02641  
10/23  
M48T212Y, M48T212V  
Table 11. Write Mode AC Characteristics  
(T = 0 to 70°C)  
A
M48T212Y  
-70  
M48T212V  
Symbol  
Parameter  
-85  
Unit  
Min  
Max  
Min  
85  
0
Max  
t
Write Cycle Time  
70  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
AVAV  
t
Address Valid to Write Enable Low  
Address Valid to Chip Enable Low  
Write Enable Pulse Width  
AVWL  
t
0
0
AVEL  
t
t
t
t
45  
50  
0
55  
60  
0
WLWH  
t
Chip Enable Low to Chip Enable High  
Write Enable High to Address Transition  
Chip Enable High to Address Transition  
Input Valid to Write Enable High  
Input Valid to Chip Enable High  
ELEH  
WHAX  
t
0
0
EHAX  
DVWH  
25  
25  
0
30  
30  
0
t
DVEH  
WHDX  
Write Enable High to Input Transition  
Chip Enable High to Input Transition  
t
0
0
EHDX  
(1,2)  
Write Enable Low to Output High-Z  
Address Valid to Write Enable High  
Address Valid to Chip Enable High  
Write Enable High to Output Transition  
20  
25  
ns  
ns  
ns  
ns  
t
WLQZ  
t
55  
55  
5
65  
65  
5
AVWH  
t
AVEH  
(1,2)  
t
WHQX  
Note: 1. C = 5pF.  
L
2. If E goes low simultaneously with W going low, the outputs remain in the high impedance state.  
DATA RETENTION MODE  
With valid V applied, the M48T212Y/V can be  
accessed as described above with read or write  
cycles. Should the supply voltage decay, the  
M48T212Y/V will automatically deselect, write  
protecting itself (and any external SRAM) when  
pedance. The V  
pin is capable of supplying  
OUT  
100µA of current to the attached memory with less  
CC  
than 0.3V drop under this condition. On power up,  
when V returns to a nominal value, write protec-  
CC  
tion continues for 200ms (max) by inhibiting  
E1  
or E2  
.
CON  
CON  
V
falls between V  
(max) and V (min).  
The RST signal also remains active during this  
time (see Figure 5).  
CC  
PFD  
PFD  
This is accomplished by internally inhibiting ac-  
cess to the clock registers via the E signal. At this  
time, the Reset pin (RST) is driven active and will  
Note: Most low power SRAMs on the market to-  
day can be used with the M48T212Y/V TIME-  
KEEPER Controller. There are, however some  
criteria which should be used in making the final  
choice of an SRAM to use. The SRAM must be de-  
signed in a way where the chip enable input dis-  
ables all other inputs to the SRAM. This allows  
inputs to the M48T212Y/V and SRAMs to be Don’t  
remain active until V returns to nominal levels.  
CC  
External RAM access is inhibited in a similar man-  
ner by forcing E1  
This level is within 0.2 volts of the V  
and E2  
to a high level.  
CON  
CON  
. E1  
BAT CON  
and E2  
will remain at this level as long as V  
CON  
CC  
remains at an out-of tolerance condition.  
Care once V falls below V  
(min). The SRAM  
CC  
PFD  
When V falls below the level of the battery  
CC  
should also guarantee data retention down to  
= 2.0V. The chip enable access time must be  
(V  
), power input is switched from the V pin  
BAT  
CC  
V
CC  
to the SNAPHAT battery and the clock registers  
and external SRAM are maintained from the at-  
tached battery supply. All outputs become high im-  
sufficient to meet the system needs with the chip  
enable output propagation delays included.  
11/23  
M48T212Y, M48T212V  
Figure 9. Alarm Interrupt Reset Waveforms  
A0-A3  
1h  
ADDRESS 0h  
Fh  
ACTIVE FLAG BIT  
IRQ/FT  
HIGH-Z  
AI03021  
Table 12. Alarm Repeat Modes  
RPT5  
RPT4  
RPT3  
RPT2  
RPT1  
Alarm Setting  
Once per Second  
Once per Minute  
Once per Hour  
Once per Day  
1
1
1
1
1
0
1
1
1
1
0
0
1
1
1
0
0
0
1
1
0
0
0
0
1
0
0
0
0
0
Once per Month  
Once per Year  
If the SRAM includes a second chip enable pin  
(E2), this pin should be tied to V  
The data retention current value of the SRAMs can  
then be added to the I value of the M48T212Y/  
V to determine the total current requirements for  
data retention. The available battery capacity for  
the SNAPHAT of your choice can then be divided  
by this current to determine the amount of data re-  
tention available (see Table 15).  
.
OUT  
BAT  
If data retention lifetime is a critical parameter for  
the system, it is important to review the data reten-  
tion current specifications for the particular  
SRAMs being evaluated. Most SRAMs specify a  
data retention current at 3.0V. Manufacturers gen-  
erally specify a typical condition for room temper-  
ature along with a worst case condition (generally  
at elevated temperatures). The system level re-  
quirements will determine the choice of which val-  
ue to use.  
For afurther more detailed review of lifetime calcu-  
lations, please see Application Note AN1012.  
12/23  
M48T212Y, M48T212V  
Figure 10. Back-Up Mode Alarm Waveforms  
tREC  
V
CC  
V
V
(max)  
(min)  
PFD  
PFD  
AFE bit/ABE bit  
AF bit in Flags Register  
IRQ/FT  
HIGH-Z  
HIGH-Z  
AI03622  
TIMEKEEPER REGISTERS  
current at the moment the halt command was is-  
sued.  
The M48T212Y/V offers 16 internal registers  
which contain TIMEKEEPER, Alarm, Watchdog,  
Flag, and Control data. These registers are mem-  
ory locations which contain external (user accessi-  
ble) and internal copies of the data (usually  
All of the TIMEKEEPER registers are updated si-  
multaneously. A halt will not interrupt an update in  
progress. Updating occurs 1 second after the  
READ bit is reset to a 0’.  
TM  
referred to as BiPORT TIMEKEEPER cells).  
Setting the Clock  
The external copies are independent of internal  
functions except that they are updated periodically  
by the simultaneous transfer of the incremented  
internal copy. TIMEKEEPER and Alarm Registers  
store data in BCD. Control, Watchdog and Flags  
Registers store data in Binary Format.  
Bit D7 of the Control Register (8h) is the WRITE  
bit. Setting the WRITE bit to a 1’, like the READ  
bit, halts updates to the TIMEKEEPER registers.  
The user can then load them with the correct day,  
date, and time data in 24 hour BCD format (see  
Table 13).  
Resetting the WRITE bit to a ‘0’ then transfers the  
values of all time registers (Fh-9h, 1h) to the actual  
TIMEKEEPER counters and allows normal opera-  
tion to resume. After the WRITE bit is reset, the  
next clock update will occur one second later.  
CLOCK OPERATIONS  
Reading the Clock  
Updates to the TIMEKEEPER registers should be  
halted before clock data is read to prevent reading  
data in transition. Because the BiPORT TIME-  
KEEPER cells in the RAM array are only data reg-  
isters, and not the actual clock counters, updating  
the registers can be halted without disturbing the  
clock itself.  
Note: Upon power-up following a power failure,  
the READ bit will automatically be set to a ‘1’. This  
will prevent the clock from updating the TIME-  
KEEPER registers, and will allow the user to read  
the exact time of the power-down event.  
Updating is halted when a 1’ is written to the  
READ bit, D6 in the Control Register (8h). As long  
as a ‘1’ remains in that position, updating is halted.  
After a halt is issued, the registers reflect the  
count; that is, the day, date, and time that were  
Resetting the READ Bitto a ‘0’ will allow the clock  
to update these registers with the current time.  
The WRITE Bit will be reset to a 0’ upon power-  
up.  
13/23  
M48T212Y, M48T212V  
Stopping and Starting the Oscillator  
WATCHDOG TIMER  
The oscillator may be stopped at any time. If the  
device is going to spend a significant amount of  
time on the shelf, the oscillator can be turned off to  
minimize current drain on the battery. The STOP  
bit is located at Bit D7 within the Seconds Register  
(9h). Setting it to a ‘1’ stops the oscillator. Whenre-  
set to a ‘0’, the M48T212Y/V oscillator starts within  
one second.  
The watchdog timer can be used to detect an out-  
of-control microprocessor. The user programs the  
watchdog timer by setting the desired amount of  
time-out into the Watchdog Register, address 7h.  
Bits BMB4-BMB0 store a binary multiplier and the  
two lower order bits RB1-RB0 select the resolu-  
tion, where 00=1/16 second, 01=1/4 second, 10=1  
second, and 11=4 seconds. The amount of time-  
out is then determined to be the multiplication of  
the five bit multiplier value with the resolution. (For  
example: writing 00001110 in the Watchdog Reg-  
ister = 3*1 or 3 seconds).  
Note: It is not necessary to set the WRITE bit  
when setting or resetting the FREQUENCY TEST  
bit (FT) or the STOP bit (ST).  
SETTING ALARM CLOCK  
Note: Accuracy of timer is within ± the selected  
Address locations 6h-2h contain the alarm set-  
tings. The alarm can be configured to go off at a  
prescribed time on a specific month, date, hour,  
minute, or second or repeat every year, month,  
day, hour, minute, or second. It can also be pro-  
grammed to go off while the M48T212Y/V is in the  
battery back-up to serve as a system wake-up call.  
Bits RPT5-RPT1 put the alarm in the repeat mode  
of operation. Table 12 shows the possible config-  
urations. Codes not listed in the table default to the  
once per second mode to quickly alert the user of  
an incorrect alarm setting.  
resolution.  
If the processor does not reset the timer within the  
specified period, the M48T212Y/V sets the WDF  
(Watchdog Flag) and generates a watchdog inter-  
rupt or a microprocessor reset. WDF is reset by  
reading the Flags Register (Address 0h).  
The most significant bit of the Watchdog Register  
is the Watchdog Steering Bit (WDS). When set to  
a 0’, the watchdog will activate the IRQ/FT pin  
when timed-out. When WDS is set to a 1’, the  
watchdog will output a negative pulse on the RST  
pin for 40 to 200 ms. The Watchdog register and  
the FT bit will reset to a ‘0’ at the end of a Watch-  
dog time-out when the WDS bit is set to a 1’.  
Note: User must transition address (or toggle chip  
enable) to see Flag bit change.  
When the clock information matches the alarm  
clock settings based on the match criteria defined  
by RPT5-RPT1, the AF (Alarm Flag) is set.  
The watchdog timer can be reset by two methods:  
1. a transition (high-to-low or low-to-high) can be  
applied to the Watchdog Input pin (WDI) or  
If AFE (Alarm Flag Enable) is also set, the alarm  
condition activates the IRQ/FT pin. To disable  
alarm, write ’0’ to the Alarm Date registers and  
RPT1-4. The IRQ/FT output is cleared by a read to  
the Flags register as shown in Figure 9. A subse-  
quent read of the Flags register will reset the  
Alarm Flag (D6; Register 0h).  
2. the microprocessor can perform a write of the  
Watchdog Register.  
The time-out period then starts over. The WDI pin  
should be tied to V if not used. The watchdog  
SS  
will be reset on each transition (edge) seen by the  
WDI pin. In the order to perform a software reset  
of the watchdog timer, the original time-out period  
can be written into the Watchdog Register, effec-  
tively restarting the count-down cycle.  
Should the watchdog timer time-out, and the WDS  
bit is programmed to output an interrupt, a value of  
00h needs to be written to the Watchdog Register  
in order to clear the IRQ/FT pin. This will also dis-  
able the watchdog function until it is again pro-  
grammed correctly. A read of the Flags Register  
will reset the Watchdog Flag (Bit D7; Register 0h).  
The watchdog function is automatically disabled  
upon power-down and the Watchdog Register is  
cleared. If the watchdog function is set to output to  
the IRQ/FT pin and the frequency test function is  
activated, the watchdog or alarm function prevails  
and the frequency test function is denied.  
The IRQ/FT pin can also be activated in the bat-  
tery back-up mode. The IRQ/FT will go low if an  
alarm occurs and both ABE (Alarm in Battery  
Back-up Mode Enable) and AFE are set. The ABE  
and AFE bits are reset during power-up, therefore  
an alarm generated during power-up will only set  
AF. The user can read the Flag Register at system  
boot-up to determine if an alarm was generated  
while the M48T212Y/V was in the deselect mode  
during power-up. Figure 10 illustrates the back-up  
mode alarm timing.  
14/23  
M48T212Y, M48T212V  
Table 13. TIMEKEEPER Register Map  
Address  
Function/Range  
BCD Format  
D7  
D6  
D5  
D4  
10M  
0
D3  
D2  
D1  
D0  
Fh  
Eh  
Dh  
Ch  
Bh  
Ah  
9h  
8h  
7h  
6h  
5h  
4h  
3h  
2h  
1h  
0h  
10 Years  
Year  
Year  
Month  
Date  
00-99  
01-12  
01-31  
01-7  
0
0
0
0
0
Month  
10 Date  
Date: Day of Month  
Day of Week  
0
FT  
0
0
0
Day  
0
10 Hours  
Hours (24 Hour Format)  
Minutes  
Hour  
00-23  
00-59  
00-59  
0
10 Minutes  
10 Seconds  
S
Min  
ST  
Seconds  
Sec  
W
R
BMB4  
0
Calibration  
Control  
Watchdog  
A Month  
A Date  
A Hour  
A Min  
A Sec  
Century  
Flag  
WDS  
AFE  
RPT4  
RPT3  
RPT2  
RPT1  
BMB3  
BMB2  
BMB1  
BMB0  
RB1  
RB0  
ABE  
Al 10M  
Alarm Month  
Alarm Date  
01-12  
01-31  
00-23  
00-59  
00-59  
00-99  
RPT5  
0
AI 10 Date  
AI 10 Hour  
Alarm Hour  
Alarm 10 Minutes  
Alarm 10 Seconds  
1000 Year  
Alarm Minutes  
Alarm Seconds  
100 Year  
WDF  
AF  
Y
BL  
Y
Y
Y
Y
Keys: S = Sign Bit  
FT = Frequency Test Bit  
AFE = Alarm Flag Enable Flag  
RB0-RB1 = Watchdog Resolution Bits  
WDS = Watchdog Steering Bit  
R = Read Bit  
W = Write Bit  
ST = Stop Bit  
0 = Must be set to zero  
BL = Battery Low Flag  
ABE = Alarm in Battery Back-Up Mode Enable Bit  
RPT1-RPT5 = Alarm Repeat Mode Bits  
WDF = Watchdog flag  
AF = Alarm flag  
BMB0-BMB4 = Watchdog Multiplier Bits  
Y = ‘1’ or ‘0’  
V
SWITCH OUTPUT  
The RST pin is an open drain output and an appro-  
CC  
priate pull-up resistor to V should be chosen to  
CC  
Vccsw output goes low when V  
switches to  
OUT  
control rise time.  
V
turning on a customer supplied P-Channel  
CC  
MOSFET (see Figure 3). The Motorola  
Note: If the RST output is fed back into either of  
the RSTIN inputs (for a microprocessor with a bi-  
directional reset) then a 1k(max) pull-up resistor  
is recommended.  
MTD20P06HDL is recommended. This MOSFET  
in turn connects V  
the current requirement is greater than I  
to a separate supply when  
OUT  
(see  
OUT1  
Tables 7A and 7B). This output may also be used  
simply to indicate the status of the internal battery  
switchover comparator, which controls the source  
Reset Inputs (RSTIN1 & RSTIN2)  
The M48T212Y/V provides two independent in-  
puts which can generate an output reset. The du-  
ration and function of these resets is identical to a  
reset generated by a power cycle. Table 14 and  
Figure 12 illustrate the AC reset characteristics of  
this function. During the time RST is enabled  
(V or battery) of the V  
output.  
CC  
OUT  
POWER-ON RESET  
The M48T212Y/V continuously monitors V  
.
CC  
When V  
falls to the power fail detect trip point,  
CC  
(t  
& t  
), the Reset Inputs are ignored.  
R1HRH  
R2HRH  
the RST pulls low (open drain) and remains low on  
Note: RSTIN1 and RSTIN2 are each internally  
pulled up to V through a 100Kresistor.  
power-up for 40 to 200ms after V passes V  
.
PFD  
CC  
CC  
15/23  
M48T212Y, M48T212V  
Figure 11. Calibration Waveform  
NORMAL  
POSITIVE  
CALIBRATION  
NEGATIVE  
CALIBRATION  
AI00594B  
Calibrating the Clock  
represent +10.7 or –5.35 seconds per month  
which corresponds to a total range of +5.5 or –2.75  
minutes per month.  
The M48T212Y/V is driven by a quartz controlled  
oscillator with a nominal frequency of 32,768 Hz.  
The devices are tested not to exceed ±35 PPM  
(parts per million) oscillator frequency error at  
25°C, which equates to about ±1.53 minutes per  
month. When the Calibration circuit is properly em-  
ployed, accuracy improves to better than +1/–2  
PPM at 25°C.  
The oscillation rate of crystals changes with tem-  
perature. The M48T212Y/V design employs peri-  
odic counter correction. The calibration circuit  
adds or subtracts counts from the oscillator divider  
circuit at the divide by 256 stage, as shown in Fig-  
ure 11. The number of times pulses which are  
blanked (subtracted, negative calibration) or split  
(added, positive calibration) depends upon the  
value loaded into the five Calibration bits found in  
the Control Register. Adding counts speeds the  
clock up, subtracting counts slows the clock down.  
The Calibration bits occupy the five lower order  
bits (D4-D0) in the Control Register 8h. These bits  
can be set to represent any value between 0 and  
31 in binary form. Bit D5 is a Sign bit; ‘1’ indicates  
positive calibration, ‘0’ indicates negative calibra-  
tion. Calibration occurs within a 64 minute cycle.  
The first 62 minutes in the cycle may, once per  
minute, have one second either shortened by 128  
or lengthened by 256 oscillator cycles.  
Two methods are available for ascertaining how  
much calibration a given M48T212Y/V may re-  
quire. The first involves setting the clock, letting it  
run for a month and comparing it to a known accu-  
rate reference and recording deviation over a fixed  
period of time. Calibration values, including the  
number of seconds lost or gained in a given peri-  
od, can be found in Application Note AN934:  
TIMEKEEPER Calibration.  
This allows the designer to give the end user the  
ability to calibrate the clock as the environment re-  
quires, even if the final product is packaged in a  
non-user serviceable enclosure. The designer  
could provide a simple utility that accesses the  
Calibration byte.  
The second approach is better suited to a manu-  
facturing environment, and involves the use of the  
IRQ/FT pin. The pin will toggle at 512Hz, when the  
Stop bit (ST, D7 of 9h) is 0’,the Frequency Test bit  
(FT, D6 of Ch) is 1’, the Alarm Flag Enable bit  
(AFE, D7 of 6h) is 0’, and the Watchdog Steering  
bit (WDS, D7 of 7h) is ‘1’ or the Watchdog Register  
(7h=0) is reset.  
Any deviation from 512 Hz indicates the degree  
and direction of oscillator frequency shift at the test  
temperature. For example,  
a
reading of  
If a binary ‘1’ is loaded into the register, only the  
first 2 minutes in the 64 minute cycle will be modi-  
fied; if a binary 6 is loaded, the first 12 will be af-  
fected, and so on.  
Therefore, each calibration step has the effect of  
adding 512 or subtracting 256 oscillator cycles for  
every 125,829,120 actual oscillator cycles, that is  
+4.068 or –2.034 PPM of adjustment per calibra-  
tion step in the calibration register. Assuming that  
the oscillator is running at exactly 32,768 Hz, each  
of the 31 increments in the Calibration byte would  
512.010124 Hz would indicate a +20 PPM oscilla-  
tor frequency error, requiring a –10 (WR001010)  
to be loaded into the Calibration Byte for correc-  
tion. Note that setting or changing the Calibration  
Byte does not affect the Frequency test output fre-  
quency.  
The IRQ/FT pin is an open drain output which re-  
quires a pull-up resistor to V for proper opera-  
CC  
tion. A 500-10kresistor is recommended in order  
to control the rise time. The FT bit is cleared on  
power-up.  
16/23  
M48T212Y, M48T212V  
Table 14. Reset AC Characteristics  
(T = 0 to 70°C; V = 3V to 3.6V or V = 4.5V to 5.5V)  
A
CC  
CC  
Symbol  
Parameter  
Min  
Max  
Unit  
(1)  
RSTIN1 Low to RSTIN1 High  
RSTIN2 Low to RSTIN2 High  
RSTIN1 High to RST High  
RSTIN2 High to RST High  
200  
ns  
t
t
R1  
R2  
(2)  
100  
40  
ms  
ms  
ms  
(3)  
(3)  
200  
200  
t
t
R1HRH  
R2HRH  
40  
Note: 1. Pulse width less than 50ns will result in no RESET(for noise immunity).  
2. Pulse width less than 20ms will result in no RESET (for noise immunity).  
3. C = 5pF (see Figure 4).  
L
Table 15. SNAPHAT Battery Table  
Part Number  
Description  
Package  
M4T28-BR12SH  
M4T32-BR12SH  
Lithium Battery (48mAh) SNAPHAT  
Lithium Battery (120mAh) SNAPHAT  
SH  
SH  
Figure 12. RSTIN1 & RSTIN2 Timing Waveforms  
RSTIN1  
tR1  
RSTIN2  
tR2  
(1)  
RST  
tR1HRH  
tR2HRH  
AI02642  
BATTERY LOW WARNING  
tery is near end of life. However, data is not com-  
promised due to the fact that a nominal Vcc is  
supplied. In order to insure data integrity during  
subsequent periods of battery back-up mode, the  
battery should be replaced. The SNAPHAT bat-  
The M48T212Y/V automatically performs battery  
voltage monitoring upon power-up and at factory-  
programmed time intervals of approximately 24  
hours. The Battery Low (BL) bit, Bit D4 of Flags  
Register 0h, will be asserted if the battery voltage  
is found to be less than approximately 2.5V. The  
BL bit will remain asserted until completion of bat-  
tery replacement and subsequent battery low  
monitoring tests, either during the next power-up  
sequence or the next scheduled 24-hour interval.  
If a battery lowis generated during a power-up se-  
quence, this indicates that the battery is below ap-  
proximately 2.5 volts and may not be able to  
maintain data integrity in the SRAM. Data should  
be considered suspect and verified as correct. A  
fresh battery should be installed.  
tery/crystal top should be replaced with V pow-  
CC  
ering the device to avoid data loss.  
Note: this will cause the clock to lose time during  
the time interval the battery crystal is removed.  
The M48T212Y/V only monitors the battery when  
a nominal Vcc is applied to the device. Thus appli-  
cations which require extensive durations in the  
battery back-up mode should be powered-up peri-  
odically (at least once every few months) in order  
for this technique to be beneficial.  
Additionally, if a battery low is indicated, data in-  
tegrity should be verified upon power-up via a  
checksum or other technique.  
If a battery low indication is generated during the  
24-hour interval check, this indicates that the bat-  
17/23  
M48T212Y, M48T212V  
INITIAL POWER-ON DEFAULTS  
Figure 13. Supply Voltage Protection  
Upon application of power to the device, the fol-  
lowing register bits are set to a ‘0’ state: WDS,  
BMB0-BMB4, RB0-RB1, AFE, ABE, W and FT.  
(See Table 16)  
V
CC  
POWER SUPPLY DECOUPLING  
AND UNDERSHOOT PROTECTION  
V
CC  
Note: I transients, including those produced by  
CC  
output switching, can produce voltage fluctua-  
0.1µF  
DEVICE  
tions, resulting in spikes on the V  
bus. These  
CC  
transients can be reduced if capacitors are used to  
store energy, which stabilizes the V bus. The  
energy stored in the bypass capacitors will be re-  
leased as low going spikes are generated or ener-  
gy will be absorbed when overshoots occur.  
CC  
V
SS  
AI02169  
A ceramic bypass capacitor value of 0.1µF is rec-  
ommended in order to provide the needed filtering.  
In addition to transients that are caused by normal  
SRAM operation, power cycling can generate neg-  
ative voltage spikes on V that drive it to values  
CC  
V
SS  
(cathode connected to V , anode to V ).  
CC SS  
below V by as much as one volt. These negative  
SS  
(Schottky diode 1N5817 is recommended for  
through hole and MBRS120T3 is recommended  
for surface mount).  
spikes can cause data corruption in the SRAM  
while in battery backup mode.  
To protect from these voltage spikes, ST recom-  
mends connecting a schottky diode from V  
to  
CC  
Table 16. Default Values  
WATCHDOG  
Condition  
W
R
FT  
AFE  
ABE  
(1)  
Register  
Initial Power-up  
(Battery Attach for SNAPHAT)  
0
0
0
0
0
0
(2)  
(3)  
0
0
0
0
0
0
0
1
0
1
0
0
Subsequent Power-up / RESET  
(4)  
Power-down  
Note: 1. WDS, BMB0-BMB4, RB0, RB1.  
2. State of other control bits undefined.  
3. State of other control bits remains unchanged.  
4. Assuming these bits set to ‘1’ prior to power-down.  
18/23  
M48T212Y, M48T212V  
Table 17. Ordering Information Scheme  
Example:  
M48T212Y  
-70 MH  
1
TR  
Device Type  
M48T  
Supply Voltage and Write Protect Voltage  
212Y = V = 4.5V to 5.5V; V  
= 4.2V to 4.5V  
= 2.7V to 3.0V  
CC  
PFD  
PFD  
212V = V = 3.0V to 3.6V; V  
CC  
Speed  
-70 = 70ns (for M48T212Y)  
-85 = 85ns (for M48T212V)  
Package  
(1)  
MH  
= SOH44  
Temperature Range  
1 = 0 to 70 °C  
6 = –40 to 85 °C  
Shipping Method for SOIC  
blank = Tubes  
TR = Tape & Reel  
Note: 1. The SOIC package (SOH44) requires the battery package (SNAPHAT) which is ordered separately under the part number  
“M4Txx-BR12SH1” in plastic tube or ”M4Txx-BR12SH1TR” in Tape & Reel form.  
Caution: Do not place the SNAPHAT battery package ”M4Txx-BR12SH1” in conductive foam since will drain the lithium button-cell battery.  
For a list of available options (Speed, Package, etc...) or for further information on any aspect of this de-  
vice, please contact the STMicroelectronics Sales Office nearest to you.  
Table 18. Revision History  
Date  
Revision Details  
October 1999  
First Issue  
Document Layout changed  
Default Values table added (Table 16)  
03/01/00  
04/21/00  
From Preliminary Data to Data Sheet  
19/23  
M48T212Y, M48T212V  
Table 19. SOH44 - 44 lead Plastic Small Outline, SNAPHAT, Package Mechanical Data  
mm  
Min  
inches  
Min  
Symb  
Typ  
Max  
3.05  
0.36  
2.69  
0.46  
0.32  
18.49  
8.89  
Typ  
Max  
0.120  
0.014  
0.106  
0.018  
0.012  
0.728  
0.350  
A
A1  
A2  
B
0.05  
2.34  
0.36  
0.15  
17.71  
8.23  
0.002  
0.092  
0.014  
0.006  
0.697  
0.324  
C
D
E
e
0.81  
0.032  
eB  
H
3.20  
11.51  
0.41  
0°  
3.61  
12.70  
1.27  
8°  
0.126  
0.453  
0.016  
0°  
0.142  
0.500  
0.050  
8°  
L
α
N
44  
44  
CP  
0.10  
0.004  
Figure 14. SOH44 - 44 lead Plastic Small Outline, SNAPHAT, Package Outline  
A2  
A
C
eB  
B
e
CP  
D
N
E
H
A1  
α
L
1
SOH-A  
Drawing is not to scale.  
20/23  
M48T212Y, M48T212V  
Table 20. M4T28-BR12SH SNAPHAT Housing for 48 mAh Battery & Crystal, Package Mechanical Data  
mm  
Min  
inches  
Min  
Symb  
Typ  
Max  
9.78  
7.24  
6.99  
0.38  
0.56  
21.84  
14.99  
15.95  
3.61  
2.29  
Typ  
Max  
A
A1  
A2  
A3  
B
0.385  
0.285  
0.275  
0.015  
0.022  
0.860  
0.590  
0.628  
0.142  
0.090  
6.73  
6.48  
0.265  
0.255  
0.46  
21.21  
14.22  
15.55  
3.20  
0.018  
0.835  
0.560  
0.612  
0.126  
0.080  
D
E
eA  
eB  
L
2.03  
Figure 15. M4T28-BR12SH SNAPHAT Housing for 48 mAh Battery & Crystal, Package Outline  
A2  
A1  
A
A3  
L
eA  
D
B
eB  
E
SHTK-A  
Drawing is not to scale.  
21/23  
M48T212Y, M48T212V  
Table 21. M4T32-BR12SH SNAPHAT Housing for 120 mAh Battery & Crystal, Package Mechanical Data  
mm  
Min  
inches  
Min  
Symb  
Typ  
Max  
10.54  
8.51  
Typ  
Max  
A
A1  
A2  
A3  
B
0.415  
.0335  
0.315  
0.015  
0.022  
0.860  
.0710  
0.628  
0.142  
0.090  
8.00  
7.24  
0.315  
0.285  
8.00  
0.38  
0.46  
21.21  
17.27  
15.55  
3.20  
0.56  
0.018  
0.835  
0.680  
0.612  
0.126  
0.080  
D
21.84  
18.03  
15.95  
3.61  
E
eA  
eB  
L
2.03  
2.29  
Figure 16. M4T32-BR12SH SNAPHAT Housing for 120 mAh Battery & Crystal, Package Outline  
A2  
A1  
A
A3  
L
eA  
D
B
eB  
E
SHTK-A  
Drawing is not to scale.  
22/23  
M48T212Y, M48T212V  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted  
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject  
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not  
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.  
The ST logo is registered trademark of STMicroelectronics  
2000 STMicroelectronics - All Rights Reserved  
All other names are the property of their respective owners.  
STMicroelectronics GROUP OF COMPANIES  
Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco -  
Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A.  
http://www.st.com  
23/23  

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