M36W0R6050T1ZAQF [STMICROELECTRONICS]

64 Mbit (4 Mb 】16, Multiple Bank, Burst) Flash memory and 32 Mbit (2 Mb 】16) PSRAM, multi-chip package; 64兆位( 4兆】 16 ,多银行,连拍),闪存和32兆(2 MB 】 16 ) PSRAM ,多芯片封装
M36W0R6050T1ZAQF
型号: M36W0R6050T1ZAQF
厂家: ST    ST
描述:

64 Mbit (4 Mb 】16, Multiple Bank, Burst) Flash memory and 32 Mbit (2 Mb 】16) PSRAM, multi-chip package
64兆位( 4兆】 16 ,多银行,连拍),闪存和32兆(2 MB 】 16 ) PSRAM ,多芯片封装

闪存 存储 内存集成电路 静态存储器
文件: 总22页 (文件大小:221K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
M36W0R6050T1  
M36W0R6050B1  
64 Mbit (4 Mb ×16, Multiple Bank, Burst) Flash memory  
and 32 Mbit (2 Mb ×16) PSRAM, multi-chip package  
Features  
Multi-Chip Package  
– 1 die of 64 Mbit (4 Mb × 16) Flash memory  
– 1 die of 32 Mbit (2 Mb × 16) Pseudo SRAM  
FBGA  
Supply voltage  
– V  
= V  
= V  
= 1.7 V to 1.95 V  
DDQF  
DDF  
DDP  
Stacked TFBGA88  
(ZA)  
Low power consumption  
Electronic signature  
– Manufacturer Code: 20h  
– Device code (top flash configuration),  
M36W0R6050T1: 8810h  
Block locking  
– Device code (bottom flash configuration),  
M36W0R6050B1: 8811h  
– All blocks locked at Power-up  
– Any combination of blocks can be locked  
Package  
– WP for Block Lock-Down  
F
– ECOPACK®  
Security  
– 128-bit user programmable OTP cells  
– 64-bit unique device number  
Flash memory  
Programming time  
Common Flash Interface (CFI)  
– 8 µs by Word typical for Fast Factory  
Program  
100 000 program/erase cycles per block  
– Double/Quadruple Word Program option  
– Enhanced Factory Program options  
PSRAM  
Access time: 70 ns  
Memory blocks  
Asynchronous Page Read  
– Page size: 8 words  
– Multiple Bank memory array: 4 Mbit Banks  
– Parameter Blocks (Top or Bottom location)  
– First access within page: 70 ns  
– Subsequent read within page: 20 ns  
Synchronous / Asynchronous Read  
– Synchronous Burst Read mode: 66 MHz  
Three Power-down modes  
– Deep Power-Down  
– Asynchronous/ Synchronous Page Read  
mode  
– Random Access: 70 ns  
– Partial Array Refresh of 4 Mbits  
– Partial Array Refresh of 8 Mbits  
Dual operations  
– Program Erase in one Bank while Read in  
others  
– No delay between Read and Write  
operations  
January 2007  
1
1/22  
www.st.com  
1
Contents  
M36W0R6050T1, M36W0R6050B1  
Contents  
1
2
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Signal descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
2.1  
2.2  
2.3  
2.4  
2.5  
2.6  
2.7  
2.8  
2.9  
Address inputs (A0-A21) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Data inputs/outputs (DQ0-DQ15) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Flash Chip Enable (EF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Flash Output Enable (GF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Flash Write Enable (WF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Flash Write Protect (WPF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
Flash Reset (RPF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
Flash Latch Enable (LF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
Flash Clock (KF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
2.10 Flash Wait (WAITF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
2.11 PSRAM Chip Enable (E1P) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10  
2.12 PSRAM Chip Enable (E2P) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
2.13 PSRAM Output Enable (GP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
2.14 PSRAM Write Enable (WP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
2.15 PSRAM Upper Byte Enable (UBP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
2.16 PSRAM Lower Byte Enable (LBP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
2.17  
VDDF supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
2.18 VDDP supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
2.19  
2.20  
V
V
DDQF supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
PPF program supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
2.21 VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15  
DC and ac parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
Package mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
3
4
5
6
2/22  
M36W0R6050T1, M36W0R6050B1  
Contents  
7
8
Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20  
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21  
3/22  
List of tables  
M36W0R6050T1, M36W0R6050B1  
List of tables  
Table 1.  
Table 2.  
Table 3.  
Table 4.  
Table 5.  
Table 6.  
Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
Main operating modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14  
Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15  
Operating and ac measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
Device capacitance. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17  
Stacked TFBGA88 8 × 10 mm - 8 × 10 ball array, 0.8 mm pitch, package  
mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20  
Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21  
Table 7.  
Table 8.  
4/22  
M36W0R6050T1, M36W0R6050B1  
List of figures  
List of figures  
Figure 1.  
Figure 2.  
Figure 3.  
Figure 4.  
Figure 5.  
Figure 6.  
Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
TFBGA connections (top view through package) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Functional block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
AC measurement I/O waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
AC measurement load circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17  
Stacked TFBGA88 8 × 10 mm - 8 × 10 active ball array, 0.8 mm pitch, package outline. . 18  
5/22  
Description  
M36W0R6050T1, M36W0R6050B1  
1
Description  
The M36W0R6050T1 and M36W0R6050B1 combine two memories in a Multi-Chip  
Package:  
a 64-Mbit, Multiple Bank Flash memory, the M58WR064HT/B, and  
a 32-Mbit Pseudo SRAM, the M69KB048BD.  
The purpose of this document is to describe how the two memory components operate with  
respect to each other. It must be read in conjunction with the M58WR064HT/B and  
M69KB048BD datasheets, where all specifications required to operate the Flash memory  
and PSRAM components are fully detailed. These datasheets are available from the ST web  
site: www.st.com.  
Recommended operating conditions do not allow more than one memory to be active at the  
same time.  
The memory is offered in a Stacked TFBGA88 (8 ×10 mm, 8 × 10 ball array, 0.8 mm pitch)  
package. It is supplied with all the bits erased (set to ‘1’).  
Figure 1.  
Logic diagram  
V
V
PPF  
DDQF  
V
V
DDF  
DDP  
22  
16  
DQ0-DQ15  
A0-A21  
E
G
F
F
F
WAIT  
F
W
RP  
F
WP  
F
L
F
M36W0R6050T1  
M36W0R6050B1  
K
F
E1  
P
G
P
W
P
E2  
P
UB  
LB  
P
P
V
SS  
Ai12035  
6/22  
M36W0R6050T1, M36W0R6050B1  
Description  
Table 1.  
Signal names  
A0-A21(1)  
Address Inputs  
DQ0-DQ15  
VDDF  
VDDQF  
VPPF  
VSS  
Common Data Inputs/Outputs  
Flash Memory Power Supply  
Flash memory Power Supply for I/O Buffers  
Common Flash Optional Supply Voltage for Fast Program & Erase  
Ground  
VDDP  
NC  
PSRAM Power Supply  
Not Connected Internally  
DU  
Do Not Use as Internally Connected  
Flash memory control functions  
LF  
Latch Enable input  
EF  
Chip Enable input  
Output Enable input  
Write Enable input  
Reset input  
GF  
WF  
RPF  
WPF  
Write Protect input  
Burst Clock  
KF  
WAITF  
Wait Data in Burst Mode  
PSRAM control functions  
E1P  
GP  
Chip Enable input  
Output Enable input  
Write Enable input  
WP  
E2P  
UBP  
LBP  
Power-down input  
Upper Byte Enable input  
Lower Byte Enable input  
1. A21 is an address input for the Flash memory component only.  
7/22  
Description  
Figure 2.  
M36W0R6050T1, M36W0R6050B1  
TFBGA connections (top view through package)  
1
2
3
4
5
6
7
8
A
DU  
A4  
A5  
A3  
A2  
A1  
A0  
DU  
A21  
NC  
DU  
DU  
A11  
A12  
A13  
A15  
A16  
NC  
B
C
D
E
F
A18  
A19  
NC  
NC  
NC  
V
V
NC  
V
SS  
SS  
DDF  
LB  
P
NC  
K
F
A17  
A7  
V
W
P
E
P
A9  
PPF  
WP  
L
F
A20  
A8  
A10  
A14  
WAIT  
F
A6  
UB  
P
RP  
W
F
F
G
H
J
DQ8  
DQ0  
DQ2  
DQ1  
DQ9  
NC  
DQ10  
DQ3  
DQ11  
NC  
DQ5  
DQ12  
DQ4  
DQ13  
DQ14  
DQ6  
NC  
F
G
P
DQ7  
NC  
NC  
G
F
DQ15  
V
DDQF  
E
F
K
L
NC  
V
V
E2  
P
DDP  
DDQF  
V
V
V
V
V
V
V
V
SS  
SS  
DDQF  
DDF  
SS  
SS  
SS  
SS  
DU  
DU  
M
DU  
DU  
AI12037  
8/22  
M36W0R6050T1, M36W0R6050B1  
Signal descriptions  
2
Signal descriptions  
See Figure 1: Logic diagram and Table 1: Signal names, for a brief overview of the signals  
connected to this device.  
2.1  
Address inputs (A0-A21)  
Addresses A0-A21 are common inputs for the Flash memory and PSRAM components,  
whereas A21 is an address input for the Flash memory component only. The Address Inputs  
select the cells in the memory array to access during Bus Read operations. During Bus  
Write operations they control the commands sent to the Command Interface of the Flash  
memory Program/Erase Controller, and they select the cells to access in the PSRAM.  
2.2  
Data inputs/outputs (DQ0-DQ15)  
For the Flash memory, the Data I/O outputs the data stored at the selected address during a  
Bus Read operation or inputs a command or the data to be programmed during a Write Bus  
operation.  
For the PSRAM, the Upper Byte Data Inputs/Outputs carry the data to or from the upper  
part of the selected address during a Write or Read operation, when Upper Byte Enable  
(UB ) is driven Low.  
P
Likewise, the Lower Byte Data Inputs/Outputs carry the data to or from the lower part of the  
selected address during a Write or Read operation, when Lower Byte Enable (LB ) is driven  
P
Low.  
2.3  
Flash Chip Enable (EF)  
The Chip Enable inputs activate the memory control logics, input buffers, decoders and  
sense amplifiers. When Chip Enable is Low, V , and Reset is High, V , the device is in  
IL  
IH  
active mode. When Chip Enable is at V the Flash memory is deselected, the outputs are  
IH  
high impedance and the power consumption is reduced to the standby level.  
2.4  
2.5  
Flash Output Enable (GF)  
The Output Enable pins control data outputs during Flash memory Bus Read operations.  
Flash Write Enable (WF)  
The Write Enable controls the Bus Write operation of the Flash memories’ Command  
Interface. The data and address inputs are latched on the rising edge of Chip Enable or  
Write Enable whichever occurs first.  
9/22  
Signal descriptions  
M36W0R6050T1, M36W0R6050B1  
2.6  
Flash Write Protect (WPF)  
Write Protect is an input that gives an additional hardware protection for each block. When  
Write Protect is Low, V , Lock-Down is enabled and the protection status of the Locked-  
IL  
Down blocks cannot be changed. When Write Protect is at High, V , Lock-Down is disabled  
IH  
and the Locked-Down blocks can be locked or unlocked. (Refer to Lock Status Table in  
M58WR064HT/B datasheet).  
2.7  
Flash Reset (RPF)  
The Reset input provides a hardware reset of the memory. When Reset is at V , the  
IL  
memory is in Reset mode: the outputs are high impedance and the current consumption is  
reduced to the Reset Supply Current I  
. Refer to the M58WR064HT/B datasheet, for the  
DD2  
value of I  
. After Reset all blocks are in the Locked state and the Configuration Register is  
DD2  
reset. When Reset is at V , the device is in normal operation. Exiting Reset mode the  
IH  
device enters Asynchronous Read mode, but a negative transition of Chip Enable or Latch  
Enable is required to ensure valid data outputs.  
The Reset pin can be interfaced with 3V logic without any additional circuitry. It can be tied  
to V  
(refer to the M58WR064HT/B datasheet).  
RPH  
2.8  
Flash Latch Enable (LF)  
Latch Enable latches the address bits on its rising edge. The address latch is transparent  
when Latch Enable is Low, V , and it is inhibited when Latch Enable is High, V . Latch  
IL  
IH  
Enable can be kept Low (also at board level) when the Latch Enable function is not required  
or supported.  
2.9  
Flash Clock (KF)  
The Clock input synchronizes the Flash memory to the microcontroller during synchronous  
read operations; the address is latched on a Clock edge (rising or falling, according to the  
configuration settings) when Latch Enable is at V . Clock is don't care during Asynchronous  
IL  
Read and in write operations.  
2.10  
2.11  
10/22  
Flash Wait (WAITF)  
WAIT is a Flash output signal used during Synchronous Read to indicate whether the data  
on the output bus are valid. This output is high impedance when Flash Chip Enable is at V  
IH  
or Flash Reset is at V . It can be configured to be active during the wait cycle or one clock  
IL  
cycle in advance. The WAIT signal is not gated by Output Enable.  
F
PSRAM Chip Enable (E1P)  
When asserted (Low), the Chip Enable, E1 , activates the memory state machine, address  
P
buffers and decoders, allowing Read and Write operations to be performed. When de-  
asserted (High), all other pins are ignored, and the device is automatically put in Standby  
mode.  
M36W0R6050T1, M36W0R6050B1  
Signal descriptions  
2.12  
PSRAM Chip Enable (E2P)  
When de-asserted (Low), the Chip Enable input E2 , puts the device in Power-Down mode.  
P
This is the lowest power mode according to the Configuration Register settings (see  
M69KB048BD datasheet).  
2.13  
2.14  
2.15  
2.16  
2.17  
2.18  
2.19  
PSRAM Output Enable (GP)  
The Output Enable, G , provides a high speed tri-state control, allowing fast read/write  
P
cycles to be achieved with the common I/O data bus.  
PSRAM Write Enable (WP)  
The Write Enable, W , controls the Bus Write operation of the memory’s Command  
P
Interface.  
PSRAM Upper Byte Enable (UBP)  
The Upper Byte Enable, UB , gates the data on the Upper Byte Data Inputs/Outputs (DQ8-  
P
DQ15) to or from the upper part of the selected address during a Write or Read operation.  
PSRAM Lower Byte Enable (LBP)  
The Lower Byte Enable, LB , gates the data on the Lower Byte Data Inputs/Outputs (DQ0-  
P
DQ7) to or from the lower part of the selected address during a Write or Read operation.  
VDDF supply voltage  
V
provides the power supply to the internal core of the Flash memory component. It is  
DDF  
the main power supplies for all Flash memory operations (Read, Program and Erase).  
VDDP supply voltage  
The V  
Supply Voltage supplies the power for all operations (Read or Write) and for  
DDP  
driving the refresh logic, even when the device is not being accessed.  
VDDQF supply voltage  
V
provides the power supply for the Flash memory I/O pins. This allows all Outputs to  
DDQF  
be powered independently of the Flash memory core power supply, V  
.
DDF  
11/22  
Signal descriptions  
M36W0R6050T1, M36W0R6050B1  
2.20  
VPPF program supply voltage  
V
is both a Flash Memory control input and a Flash Memory power supply pin. The two  
PPF  
functions are selected by the voltage range applied to the pin.  
If V is kept in a low voltage range (0V to V ) V is seen as a control input. In this  
PPF  
DDQF  
PPF  
case a voltage lower than V  
gives an absolute protection against Program or Erase,  
PPLKF  
while V  
> V  
enables these functions (see the M58WR064HT/B datasheet for the  
PPF  
PP1F  
relevant values). V  
is only sampled at the beginning of a Program or Erase; a change in  
PPF  
its value after the operation has started does not have any effect and Program or Erase  
operations continue.  
If V  
is in the range of V  
it acts as a power supply pin. In this condition V  
must be  
PPF  
PPHF  
PPF  
stable until the Program/Erase algorithm is completed.  
2.21  
VSS ground  
V
is the common ground reference for all voltage measurements in the Flash memory  
SS  
(core and I/O Buffers) and PSRAM components.  
Note:  
Each Flash memory device in a system should have its supply voltages (V  
, V  
) and  
DDF DDQF  
the program supply voltage V  
decoupled with a 0.1µF ceramic capacitor close to the pin  
PPF  
(high frequency, inherently low inductance capacitors should be as close as possible to the  
package). See Figure 5: AC measurement load circuit. The PCB track widths should be  
sufficient to carry the required V  
program and erase currents.  
PPF  
12/22  
M36W0R6050T1, M36W0R6050B1  
Functional description  
3
Functional description  
The Flash memory and PSRAM components have separate power supplies but share the  
same grounds. They are distinguished by three Chip Enable inputs: E for the Flash  
F
memory and E1 and E2 for the PSRAM.  
P
P
Recommended operating conditions do not allow more than one device to be active at a  
time. The most common example is simultaneous read operations on the Flash memory and  
the PSRAM which would result in a data bus contention. Therefore it is recommended to put  
the other devices in the high impedance state when reading the selected device.  
Figure 3.  
Functional block diagram  
V
V
V
DDQF  
DDF  
PPF  
A21  
E
F
64 Mbit  
Flash  
G
F
Memory  
W
WAIT  
F
F
L
F
K
F
RP  
F
WP  
F
A0-A20  
DQ0-DQ15  
V
DDP  
E1  
P
32 Mbit  
PSRAM  
G
P
W
P
E2  
P
UB  
P
LB  
P
V
SS  
AI12.36  
13/22  
Functional description  
M36W0R6050T1, M36W0R6050B1  
Table 2.  
Main operating modes  
EF GP WP LF  
(4)  
Operation  
RPF WAITF  
E1P E2P GP WP UBP LBP DQ15-DQ0  
Flash Data  
Out  
Flash Read  
Flash Write  
VIL VIL VIH VIL(2) VIH  
VIL VIH VIL VIL(2) VIH  
Flash Data In  
PSRAM must be disabled  
Flash Data  
Flash Address  
Latch  
VIL  
X
VIH  
VIL  
X
VIH  
VIH  
Out or Hi-Z  
(3)  
Flash Output  
Disable  
VIL VIH VIH  
Flash Hi-Z  
Any PSRAM mode is allowed  
Flash Hi-Z  
Flash Standby  
Flash Reset  
VIH  
X
X
X
X
X
X
X
VIH  
VIL  
Hi-Z  
Hi-Z  
Flash Hi-Z  
PSRAM data  
PSRAM Read  
PSRAM Write  
VIL VIH VIL VIH VIL VIL  
VIL VIH VIH VIL VIL VIL  
out  
Flash Memory must be disabled  
Any Flash mode is allowed.  
PSRAM data  
in  
Output Disable  
VIL VIH VIH VIH  
X
X
X
X
PSRAM Hi-Z  
PSRAM Hi-Z  
PSRAM Standby  
VIH VIH  
VIL  
X
X
X
X
PSRAM Deep  
Power-Down  
X
X
X
PSRAM Hi-Z  
1. X = Don't care.  
2. LF can be tied to VIH if the valid address has been previously latched.  
3. Depends on GF.  
4. WAIT signal polarity is configured using the Set Configuration Register command. Refer to M58WR064HT/B datasheet for  
details.  
14/22  
M36W0R6050T1, M36W0R6050B1  
Maximum rating  
4
Maximum rating  
Stressing the device above the rating listed in the Absolute Maximum Ratings table may  
cause permanent damage to the device. These are stress ratings only and operation of the  
device at these or any other conditions above those indicated in the Operating sections of  
this specification is not implied. Exposure to Absolute Maximum Rating conditions for  
extended periods may affect device reliability. Refer also to the STMicroelectronics SURE  
Program and other relevant quality documents.  
Table 3.  
Symbol  
Absolute maximum ratings  
Parameter  
Value  
Unit  
Min  
Max  
TA  
TBIAS  
TSTG  
VIO  
Ambient Operating Temperature  
Temperature Under Bias  
–30  
–40  
85  
125  
125  
°C  
°C  
°C  
V
Storage Temperature  
–55  
Input or Output Voltage  
–0.5  
–0.2  
–0.2  
–0.5  
–0.2  
VDDQF+0.6  
2.45  
2.45  
3.6  
VDDF  
VDDQF  
VDDP  
VPPF  
IO  
Flash Memory Core Supply Voltage  
Input/Output Supply Voltage  
PSRAM Supply Voltage  
V
V
V
Flash Memory Program Voltage  
Output Short Circuit Current  
Time for VPPF at VPPFH  
14  
V
100  
mA  
hours  
tVPPFH  
100  
15/22  
DC and ac parameters  
M36W0R6050T1, M36W0R6050B1  
5
DC and ac parameters  
This section summarizes the operating measurement conditions, and the dc and ac  
characteristics of the device. The parameters in the dc and ac characteristics Tables that  
follow, are derived from tests performed under the Measurement Conditions summarized in  
Table 4: Operating and ac measurement conditions. Designers should check that the  
operating conditions in their circuit match the operating conditions when relying on the  
quoted parameters.  
Table 4.  
Operating and ac measurement conditions  
Flash memory  
Parameter  
PSRAM  
Unit  
Min  
Max  
Min  
Max  
VDDF Supply Voltage  
VDDP Supply Voltage  
1.7  
1.95  
1.7  
1.95  
V
V
V
V
VDDQF Supply Voltage  
1.7  
11.4  
1.95  
12.6  
VPPF Supply Voltage (Factory environment)  
VPPF Supply Voltage (Application  
environment)  
–0.4  
–30  
VDDQF +0.4  
85  
V
Ambient Operating Temperature  
Load Capacitance (CL)  
–30  
85  
°C  
pF  
ns  
V
30  
50  
Input Rise and Fall Times  
Input Pulse Voltages  
5
0 to VDDQF  
DDQF/2  
0 to VDDP  
VDDP/2  
Input and Output Timing Ref. Voltages  
V
V
Figure 4.  
AC measurement I/O waveform  
V
DDQF  
0V  
V
/2  
DDQF  
AI12057  
16/22  
M36W0R6050T1, M36W0R6050B1  
DC and ac parameters  
Figure 5.  
AC measurement load circuit  
VDDQF  
VDDF  
VDDQF  
16.7k  
DEVICE  
UNDER  
TEST  
CL  
0.1µF  
16.7kΩ  
0.1µF  
CL includes JIG capacitance  
AI12058  
Table 5.  
Symbol  
Device capacitance  
Parameter  
Test condition  
Min  
Max  
Unit  
CIN  
Input Capacitance  
Output Capacitance  
VIN = 0V  
12  
15  
pF  
pF  
COUT  
VOUT = 0V  
1. Sampled only, not 100% tested.  
Please refer to the M58WR064HT/B and M69KB048BD datasheets for further dc and ac  
characteristics values and illustrations.  
17/22  
Package mechanical  
M36W0R6050T1, M36W0R6050B1  
6
Package mechanical  
In order to meet environmental requirements, ST offers the M36W0R6050T1 and  
M36W0R6050B1 devices in ECOPACK® packages. These packages have a Lead-free  
second-level interconnect. The category of Second-Level Interconnect is marked on the  
package and on the inner box label, in compliance with JEDEC Standard JESD97.  
The maximum ratings related to soldering conditions are also marked on the inner box label.  
ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com.  
Figure 6.  
Stacked TFBGA88 8 × 10 mm - 8 × 10 active ball array, 0.8 mm pitch,  
package outline  
D
D1  
e
SE  
E
E2 E1  
b
BALL "A1"  
ddd  
FE FE1  
FD  
SD  
A
A2  
A1  
BGA-Z42  
1. Drawing is not to scale.  
18/22  
M36W0R6050T1, M36W0R6050B1  
Package mechanical  
Table 6.  
Stacked TFBGA88 8 × 10 mm - 8 × 10 ball array, 0.8 mm pitch, package  
mechanical data  
millimeters  
Min  
inches  
Min  
Symbol  
Typ  
Max  
Typ  
Max  
A
A1  
A2  
b
1.200  
0.0472  
0.200  
0.0079  
0.850  
0.350  
8.000  
5.600  
0.0335  
0.0138  
0.3150  
0.2205  
0.300  
7.900  
0.400  
8.100  
0.0118  
0.3110  
0.0157  
0.3189  
D
D1  
ddd  
E
0.100  
0.0039  
0.3976  
10.000  
7.200  
8.800  
0.800  
1.200  
1.400  
0.600  
0.400  
0.400  
9.900  
10.100  
0.3937  
0.2835  
0.3465  
0.0315  
0.0472  
0.0551  
0.0236  
0.0157  
0.0157  
0.3898  
E1  
E2  
e
FD  
FE  
FE1  
SD  
SE  
19/22  
Part numbering  
M36W0R6050T1, M36W0R6050B1  
7
Part numbering  
Table 7.  
Ordering information scheme  
Example:  
M36 W0 R 6 0 5 0 T 1 ZAQ E  
Device Type  
M36 = Multiple Memory Product (Multiple Flash + RAM)  
Flash 1 Architecture  
W = Multiple Bank, Burst mode  
Flash 2 Architecture  
0 = none present  
Operating Voltage  
R = VDDF = VDDQF = VDDP = 1.7 V to 1.95 V  
Flash 1 Density  
6 = 64 Mbit  
Flash 2 Density  
0 = none present  
RAM 1 Density  
5 = 32 Mbit  
RAM 0 Density  
0 = none present  
Parameter Blocks Location  
T = Top Boot Block Flash  
B = Bottom Boot Block Flash  
Product Version  
1 = 90 nm Flash technology, 70 ns; 0.13 µm RAM, 70 ns speed  
Package  
ZAQ = Stacked TFBGA88 8 × 10 mm - 8 × 10 active ball array, 0.8 mm pitch  
Option  
E = ECOPACK® Package, Standard Packing  
F = ECOPACK® Package, Tape & Reel Packing  
Devices are shipped from the factory with the memory content bits erased to ’1’. For a list of  
available options (Speed, Package, etc.) or for further information on any aspect of this  
device, please contact the STMicroelectronics Sales Office nearest to you.  
20/22  
M36W0R6050T1, M36W0R6050B1  
Revision history  
8
Revision history  
Table 8.  
Date  
Document revision history  
Revision  
Changes  
06-Dec-2005  
12-Jan-2007  
0.1  
Initial release.  
Document status promoted to Full Datasheet. Small text  
changes.  
1
21/22  
M36W0R6050T1, M36W0R6050B1  
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22/22  

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