HFU2N60S [SEMIHOW]

600V N-Channel MOSFET; 600V N沟道MOSFET
HFU2N60S
型号: HFU2N60S
厂家: SEMIHOW CO.,LTD.    SEMIHOW CO.,LTD.
描述:

600V N-Channel MOSFET
600V N沟道MOSFET

文件: 总8页 (文件大小:870K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Nov 2007  
BVDSS = 600 V  
DS(on) typ = 4.2 Ω  
R
HFD2N60S / HFU2N60S  
600V N-Channel MOSFET  
ID = 1.9 A  
D-PAK  
I-PAK  
2
FEATURES  
1
1
3
2
3
Originative New Design  
HFD2N60S  
HFU2N60S  
Superior Avalanche Rugged Technology  
Robust Gate Oxide Technology  
Very Low Intrinsic Capacitances  
Excellent Switching Characteristics  
Unrivalled Gate Charge : 6.0 nC (Typ.)  
Extended Safe Operating Area  
Lower RDS(ON) : 4.2 Ω (Typ.) @VGS=10V  
100% Avalanche Tested  
1.Gate 2. Drain 3. Source  
Absolute Maximum Ratings  
TC=25unless otherwise specified  
Symbol  
Parameter  
Value  
Units  
V
VDSS  
Drain-Source Voltage  
Drain Current  
600  
1.9  
ID  
– Continuous (TC = 25)  
– Continuous (TC = 100)  
A
Drain Current  
1.14  
7.6  
A
IDM  
VGS  
EAS  
IAR  
Drain Current  
– Pulsed  
(Note 1)  
A
Gate-Source Voltage  
±30  
120  
1.9  
V
Single Pulsed Avalanche Energy  
Avalanche Current  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
mJ  
A
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
4.4  
mJ  
V/ns  
4.5  
Power Dissipation (TA = 25) *  
Power Dissipation (TC = 25)  
2.5  
44  
W
W
- Derate above 25℃  
0.35  
W/℃  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
Maximum lead temperature for soldering purposes,  
1/8” from case for 5 seconds  
300  
Thermal Resistance Characteristics  
Symbol  
Parameter  
Typ.  
Max.  
Units  
RθJC  
RθJA  
Junction-to-Case  
--  
--  
--  
2.87  
Junction-to-Ambient*  
Junction-to-Ambient  
50  
℃/W  
110  
RθJA  
* When mounted on the minimum pad size recommended (PCB Mount)  
SEMIHOW REV.A0,Nov 2007  
Electrical Characteristics TC=25 °C unless otherwise specified  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max Units  
On Characteristics  
VGS  
--  
Gate Threshold Voltage  
VDS = VGS, ID = 250 ㎂  
2.0  
--  
4.0  
5.0  
V
RDS(ON) Static Drain-Source  
On-Resistance  
4.2  
V
GS = 10 V, ID = 0.95 A  
Off Characteristics  
BVDSS  
Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 ㎂  
600  
--  
--  
--  
--  
V
ΔBVDSS Breakdown Voltage Temperature  
ID = 250 ㎂, Referenced to 25℃  
DS = 600 V, VGS = 0 V  
0.6  
V/℃  
/ΔTJ  
Coefficient  
IDSS  
--  
--  
--  
--  
1
V
Zero Gate Voltage Drain Current  
VDS = 480 V, TC = 125℃  
10  
IGSSF  
IGSSR  
Gate-Body Leakage Current,  
Forward  
VGS = 30 V, VDS = 0 V  
--  
--  
--  
--  
100  
Gate-Body Leakage Current,  
Reverse  
VGS = -30 V, VDS = 0 V  
-100  
Dynamic Characteristics  
Ciss  
Input Capacitance  
--  
--  
--  
280  
37  
365  
48  
VDS = 25 V, VGS = 0 V,  
f = 1.0 MHz  
Coss  
Crss  
Output Capacitance  
Reverse Transfer Capacitance  
6.0  
8.0  
Switching Characteristics  
td(on)  
Turn-On Time  
--  
--  
--  
--  
--  
--  
--  
9
28  
60  
58  
66  
8.0  
--  
VDS = 300 V, ID = 2.0 A,  
tr  
td(off)  
tf  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
25  
24  
28  
6.0  
1.3  
2.6  
RG = 25 Ω  
(Note 4,5)  
Qg  
nC  
nC  
nC  
VDS = 480V, ID = 2.0 A,  
Qgs  
Qgd  
VGS = 10 V  
(Note 4,5)  
--  
Source-Drain Diode Maximum Ratings and Characteristics  
IS  
Continuous Source-Drain Diode Forward Current  
Pulsed Source-Drain Diode Forward Current  
--  
--  
--  
--  
--  
--  
--  
1.9  
7.6  
1.4  
--  
A
ISM  
VSD  
trr  
Source-Drain Diode Forward Voltage IS = 1.9 A, VGS = 0 V  
--  
V
Reverse Recovery Time  
Reverse Recovery Charge  
230  
1.0  
μC  
IS = 2.0 A, VGS = 0 V  
diF/dt = 100 A/μs (Note 4)  
--  
Qrr  
Notes ;  
1. Repetitive Rating : Pulse width limited by maximum junction temperature  
2. L=56mH, IAS=2.0A, VDD=50V, RG=25, Starting TJ =25°C  
3. ISD≤1.9A, di/dt≤200A/μs, VDD≤BVDSS , Starting TJ =25 °C  
4. Pulse Test : Pulse Width ≤ 300μs, Duty Cycle ≤ 2%  
5. Essentially Independent of Operating Temperature  
SEMIHOW REV.A0,Nov 2007  
Typical Characteristics  
VGS, Gate-Source Voltage [V]  
VDS, Drain-Source Voltage [V]  
Figure 1. On Region Characteristics  
Figure 2. Transfer Characteristics  
12  
9
VGS = 10V  
6
VGS = 20V  
3
* Note : TJ = 25oC  
0
0
1
2
3
4
5
ID, Drain Current[A]  
VSD, Source-Drain Voltage [V]  
Figure 4. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature  
Figure 3. On Resistance Variation vs  
Drain Current and Gate Voltage  
12  
10  
8
V
DS = 120V  
DS = 300V  
VDS = 480V  
V
6
4
2
* Note : ID = 2.0A  
6
0
0
2
4
8
QG, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
SEMIHOW REV.A0,Nov 2007  
Typical Characteristics (continued)  
1.2  
1.1  
1.0  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
* Note :  
1. VGS = 0 V  
0.9  
Note :  
1. VGS = 10 V  
2. ID = 250 µA  
2. ID = 0.95 A  
0.8  
-100  
-100  
-50  
0
50  
100  
150  
200  
-50  
0
50  
100  
150  
200  
TJ, Junction Temperature [oC]  
TJ, Junction Temperature [oC]  
Figure 8. On-Resistance Variation  
vs Temperature  
Figure 7. Breakdown Voltage Variation  
vs Temperature  
2.0  
1.5  
1.0  
0.5  
0.0  
Operation in This Area  
is Limited by R DS(on)  
101  
100 µs  
1 ms  
10 ms  
100 ms  
DC  
100  
* Notes :  
1. TC = 25 o  
C
2. TJ = 150 o  
C
3. Single Pulse  
-1  
10  
100  
101  
102  
103  
25  
50  
75  
100  
125  
150  
TC, Case Temperature [oC]  
VDS, Drain-Source Voltage [V]  
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs Case Temperature  
D=0.5  
100  
* Notes :  
0.2  
1. ZθJC(t) = 2.87 oC/W Max.  
2. Duty Factor, D=t1/t2  
3. TJM - TC = PDM * ZθJC(t)  
0.1  
0.05  
-1  
0.02  
10  
0.01  
PDM  
single pulse  
t1  
t2  
-2  
10  
100  
101  
-5  
10  
-4  
10  
-3  
10  
-2  
10  
-1  
10  
t1, Square Wave Pulse Duration [sec]  
Figure 11. Transient Thermal Response Curve  
SEMIHOW REV.A0,Nov 2007  
Fig 12. Gate Charge Test Circuit & Waveform  
VGS  
Same Type  
50KΩ  
as DUT  
Qg  
12V  
200nF  
10V  
300nF  
VDS  
VGS  
Qgs  
Qgd  
DUT  
3mA  
Charge  
Fig 13. Resistive Switching Test Circuit & Waveforms  
RL  
VDS  
90%  
VDS  
VDD  
( 0.5 rated VDS  
)
RG  
10%  
Vin  
DUT  
10V  
td(on)  
tr  
td(off)  
tf  
ton  
toff  
Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms  
BVDSS  
--------------------  
BVDSS -- VDD  
L
1
2
2
----  
EAS  
=
LL IAS  
VDS  
VDD  
BVDSS  
IAS  
ID  
RG  
ID (t)  
VDD  
VDS (t)  
DUT  
10V  
t p  
Time  
SEMIHOW REV.A0,Nov 2007  
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms  
DUT  
+
VDS  
_
IS  
L
Driver  
RG  
Same Type  
as DUT  
VDD  
VGS  
• dv/dt controlled by RG  
• IS controlled by pulse period  
Gate Pulse Width  
--------------------------  
VGS  
D =  
Gate Pulse Period  
10V  
( Driver )  
IFM , Body Diode Forward Current  
IS  
di/dt  
( DUT )  
IRM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
Vf  
VDS  
( DUT )  
VDD  
Body Diode  
Forward Voltage Drop  
SEMIHOW REV.A0,Nov 2007  
Package Dimension  
TO-252  
±0.2  
6.6  
±0.1  
2.3  
±0.15  
5.35  
±0.05  
0.5  
±0.3  
1.2  
+0.1  
-0.05  
0.05  
±0.2  
±0.2  
0.8  
+0.1  
-0.05  
0.5  
0.6  
2.3typ  
2.3typ  
SEMIHOW REV.A0,Nov 2007  
Package Dimension  
TO-251  
±0.2  
±0.1  
6.6  
2.3  
±0.15  
±0.05  
5.35  
0.5  
±0.15  
±0.15  
0.75  
0.8  
+0.1  
-0.05  
0.5  
±0.1  
0.6  
2.3typ  
2.3typ  
±0.3  
1.2  
SEMIHOW REV.A0,Nov 2007  

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