M368L3324BTM-CB3
更新时间:2024-09-18 02:20:02
品牌:SAMSUNG
描述:DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II
M368L3324BTM-CB3 概述
DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II 基于512Mb的DDR SDRAM的无缓冲模块184PIN无缓冲模块B -死亡64 /72-位非ECC / ECC 66 TSOP -II DRAM
M368L3324BTM-CB3 规格参数
是否Rohs认证: | 不符合 | 生命周期: | Obsolete |
零件包装代码: | DIMM | 包装说明: | DIMM, DIMM184 |
针数: | 184 | Reach Compliance Code: | unknown |
ECCN代码: | EAR99 | HTS代码: | 8542.32.00.36 |
风险等级: | 5.92 | Is Samacsys: | N |
访问模式: | FOUR BANK PAGE BURST | 最长访问时间: | 0.7 ns |
其他特性: | AUTO/SELF REFRESH | 最大时钟频率 (fCLK): | 166 MHz |
I/O 类型: | COMMON | JESD-30 代码: | R-XDMA-N184 |
内存密度: | 2147483648 bit | 内存集成电路类型: | DDR DRAM MODULE |
内存宽度: | 64 | 湿度敏感等级: | 1 |
功能数量: | 1 | 端口数量: | 1 |
端子数量: | 184 | 字数: | 33554432 words |
字数代码: | 32000000 | 工作模式: | SYNCHRONOUS |
最高工作温度: | 70 °C | 最低工作温度: | |
组织: | 32MX64 | 输出特性: | 3-STATE |
封装主体材料: | UNSPECIFIED | 封装代码: | DIMM |
封装等效代码: | DIMM184 | 封装形状: | RECTANGULAR |
封装形式: | MICROELECTRONIC ASSEMBLY | 峰值回流温度(摄氏度): | 225 |
电源: | 2.5 V | 认证状态: | Not Qualified |
刷新周期: | 8192 | 自我刷新: | YES |
子类别: | DRAMs | 最大压摆率: | 1.62 mA |
最大供电电压 (Vsup): | 2.7 V | 最小供电电压 (Vsup): | 2.3 V |
标称供电电压 (Vsup): | 2.5 V | 表面贴装: | NO |
技术: | CMOS | 温度等级: | COMMERCIAL |
端子形式: | NO LEAD | 端子节距: | 1.27 mm |
端子位置: | DUAL | 处于峰值回流温度下的最长时间: | NOT SPECIFIED |
Base Number Matches: | 1 |
M368L3324BTM-CB3 数据手册
通过下载M368L3324BTM-CB3数据手册来全面了解它。这个PDF文档包含了所有必要的细节,如产品概述、功能特性、引脚定义、引脚排列图等信息。
PDF下载256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
DDR SDRAM Unbuffered Module
184pin Unbuffered Module based on 512Mb B-die
with 64/72-bit Non ECC/ECC
66 TSOP-II
INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS,
AND IS SUBJECT TO CHANGE WITHOUT NOTICE.
NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE,
EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE,
TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY. ALL
INFORMATION IN THIS DOCUMENT IS PROVIDED
ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND.
1. For updates or additional information about Samsung products, contact your nearest Samsung office.
2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar
applications where Product failure could result in loss of life or personal or physical harm, or any military or
defense application, or any governmental procurement to which special terms or provisions may apply.
* Samsung Electronics reserves the right to change products or specification without notice.
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
Table of Contents
1.0 Ordering Information................................................................................................................... 4
2.0 Operating Frequencies................................................................................................................ 4
3.0 Feature.......................................................................................................................................... 4
4.0 Pin Configuration (Front side/back side) ................................................................................. 5
5.0 Pin Description ............................................................................................................................ 5
6.0 Functional Block Diagram .......................................................................................................... 6
6.1 256MB, 32M x 64 Non ECC Module (M368L3324BT(U)).....................................................................................6
6.2 512MB, 64M x 64 Non ECC Module (M368L6523BT(U))....................................................................................7
6.3 512MB, 64M x 72 ECC Module (M381L6523B(U)) ..............................................................................................8
6.4 1GB, 128M x 64 Non ECC Module (M368L2923BT(U)) .......................................................................................9
6.5 1GB, 128M x 72 ECC Module (M381L2923BT(U)) ........................................................................................... 10
7.0 Absolute Maximum Ratings...................................................................................................... 11
8.0 DC Operating Conditions.......................................................................................................... 11
9.0 DDR SDRAM IDD spec table..................................................................................................... 12
9.1 M368L3324BT(U) [ (32M x 16) * 4, 256MB Non ECC Module ]............................................................................... 12
9.2 M368L6523BT(U) [ (64M x 8) * 8, 512MB Non ECC Module ]................................................................................. 12
9.3 M381L6523BT(U) [ (64M x 8) * 9, 512MB ECC Module ].......................................................................................... 13
9.4 M368L2923BT(U) [ (64M x 8) * 16, 1GB Non ECC Module ].................................................................................... 13
9.5 M381L2923BT(U) [ (64M x 8) * 18, 1GB ECC Module ] ............................................................................................ 14
10.0 AC Operating Conditions........................................................................................................ 15
11.0 Input/Output Capacitance....................................................................................................... 15
12.0 AC Timming Parameters & Specifications............................................................................ 16
13.0 System Characteristics for DDR SDRAM .............................................................................. 17
14.0 Component Notes.................................................................................................................... 18
15.0 System Notes........................................................................................................................... 19
16.0 Command Truth Table............................................................................................................. 20
17.0 Physical Dimensions............................................................................................................... 21
17.1 32M x 64 (M368L3324BT(U)) ..................................................................................................... 21
17.2 64Mx64 (M368L6523BT(U))....................................................................................................... 22
17.3 64Mx72 (M381L6523BT(U))....................................................................................................... 23
17.4 128Mx64 (M368L2923BT(U)) ..................................................................................................... 24
17.5 128Mx72 (M381L2923BT(U)) ..................................................................................................... 25
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
Revision History
Revision
Month
February
August
June
Year
2003
2003
2005
History
0.0
- First version for internal review
- Revision 1.0 spec release.
1.0
1.1
- Deleted “B0, AA, A2” speed and changed master format.
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
184Pin Unbuffered DIMM based on 512Mb B-die (x8, x16)
1.0 Ordering Information
Part Number
Density
Organization
Component Composition
Height
M368L3324BT(U)M-C(L)CC/B3
M368L6523BT(U)M-C(L)CC
M368L6523BT(U)N-C(L)B3
M381L6523BT(U)M-C(L)CC/B3
M368L2923BT(U)M-C(L)CC
M368L2923BT(U)N-C(L)B3
M381L2923BT(U)M-C(L)CC/B3
256MB
32M x 64
32Mx16 (K4H511638B) * 4EA
64Mx8 (K4H510838B) * 8EA
64Mx8 (K4H510838B) * 9EA
64Mx8 (K4H510838B) * 16EA
64Mx8 (K4H510838B) * 18EA
1,250mil
512MB
512MB
1GB
64M x 64
64M x 72
128M x 64
128M x 72
1,250mil
1,250mil
1,250mil
1,250mil
1GB
Note : Leaded and Lead-free(Pb-free) can be discriminated by PKG P/N (T : 66 TSOP with Leaded, U : 66 TSOP with Lead-free)
2.0 Operating Frequencies
CC(DDR400@CL=3)
B3(DDR333@CL=2.5)
Speed @CL2
Speed @CL2.5
Speed @CL3
CL-tRCD-tRP
-
133MHz
166MHz
-
166MHz
200MHz
3-3-3
2.5-3-3
3.0 Feature
• VDD : 2.5V ± 0.2V, VDDQ : 2.5V ± 0.2V for DDR333
• VDD : 2.6V ± 0.1V, VDDQ : 2.6V ± 0.1V for DDR400
• Double-data-rate architecture; two data transfers per clock cycle
• Bidirectional data strobe [DQ] (x4,x8) & [L(U)DQS] (x16)
• Differential clock inputs(CK and CK)
• DLL aligns DQ and DQS transition with CK transition
• Programmable Read latency : DDR333(2.5 Clock), DDR400(3 Clock)
• Programmable Burst length (2, 4, 8)
• Programmable Burst type (sequential & interleave)
• Edge aligned data output, center aligned data input
• Auto & Self refresh, 7.8us refresh interval(8K/64ms refresh)
• Serial presence detect with EEPROM
• PCB : Height 1,250 (mil) & single (256, 512MB), double (1GB) sided
• SSTL_2 Interface
• 66pin TSOP II (Leaded & Pb-Free(RoHS compliant)) package
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
4.0 Pin Configuration (Front side/back side)
Pin
Front
VREF
DQ0
VSS
Pin
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
Front
Pin
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
Front
VDDQ
WE
Pin
Back
VSS
Pin
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
Back
VSS
A6
Pin
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
181
182
183
184
Back
RAS
1
A5
93
2
DQ24
VSS
DQ25
DQS3
A4
94
DQ4
DQ5
VDDQ
DM0
DQ6
DQ7
VSS
DQ45
VDDQ
CS0
3
DQ41
CAS
95
DQ28
DQ29
VDDQ
DM3
A3
4
DQ1
DQS0
DQ2
VDD
DQ3
NC
96
5
VSS
97
CS1
6
DQS5
DQ42
DQ43
VDD
98
DM5
7
VDD
DQ26
DQ27
A2
99
VSS
8
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
DQ30
VSS
DQ31
CB4
DQ46
DQ47
*CS3
VDDQ
DQ52
DQ53
*A13
9
NC
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
NC
*CS2
DQ48
DQ49
VSS
NC
VSS
VSS
A1
NC
DQ8
DQ9
DQS1
VDDQ
CK1
VDDQ
DQ12
DQ13
DM1
VDD
DQ14
DQ15
CKE1
VDDQ
*BA2
DQ20
A12
CB5
CB0
CB1
VDD
DQS8
A0
VDDQ
CK0
*CK2
*CK2
VDDQ
DQS6
DQ50
DQ51
VSS
CK0
VDD
VSS
DM8
A10
DM6
CK1
DQ54
DQ55
VDDQ
NC
VSS
CB2
VSS
CB3
BA1
DQ10
DQ11
CKE0
VDDQ
DQ16
DQ17
DQS2
VSS
CB6
VDDQ
CB7
VDDID
DQ56
DQ57
VDD
DQ60
DQ61
VSS
KEY
KEY
53
54
55
56
57
58
59
60
61
DQ32
VDDQ
DQ33
DQS4
DQ34
VSS
145
146
147
148
149
150
151
152
153
VSS
DQ36
DQ37
VDD
VSS
DM7
DQS7
DQ58
DQ59
VSS
DQ21
A11
DQ62
DQ63
VDDQ
SA0
A9
DM2
VDD
DQ22
A8
DM4
DQ18
A7
DQ38
DQ39
VSS
BA0
NC
SA1
VDDQ
DQ19
DQ35
DQ40
SDA
SA2
SCL
DQ23
DQ44
VDDSPD
Note :
1. * : These pins are not used in this module.
2. Pins 44, 45, 47, 49, 51, 134, 135, 140, 142, 144 are used on x72 module ( M381~ ), and are not used on x64 module.
3. Pins 111, 158 are NC for 1row modules & used for 2row modules[ M368(81)L2923B ].
4. Pins 137, 138 are NC for x16 1Row module (M368L3324B).
5.0 Pin Description
Pin Name
Function
Pin Name
Function
A0 ~ A12
Address input (Multiplexed)
DM0 ~7,8(for ECC) Data - in mask
Power supply
VDD
BA0 ~ BA1A
DQ0 ~ DQ63
Bank Select Address
Data input/output
(2.5V for DDR333, 2.6V for DDR400)
Power Supply for DQS
VDDQ
(2.5V for DDR333, 2.6V for DDR400)
DQS0 ~ DQS8
Data Strobe input/output
Clock input
VSS
VREF
VDDSPD
SDA
Ground
CK0,CK0 ~ CK2, CK2
Power supply for reference
CKE0, CKE1(for double banks) Clock enable input
Serial EEPROM Power/Supply ( 2.3V to 3.6V )
Serial data I/O
CS0, CS1(for double banks)
Chip select input
RAS
Row address strobe
Column address strobe
Write enable
SCL
Serial clock
CAS
SA0 ~ 2
VDDID
NC
Address in EEPROM
VDD, VDDQ level detection
No connection
WE
CB0 ~ CB7(for x72 module)
Check bit(Data-in/data-out)
Note : VDDID defines relationship of VDD and VDDQ, and the default status of it is open (VDD=VDDQ)
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
6.0 Functional Block Diagram
6.1 256MB, 32M x 64 Non ECC Module (M368L3324BT(U))
(Populated as 1 bank of x16 DDR SDRAM Module)
CS0
LDQS
LDM
LDQS
LDM
DQS1
DM1
DQS5
DM5
CS
CS
DQ13
DQ14
DQ12
DQ15
DQ9
DQ10
DQ8
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
DQ41
DQ42
DQ45
DQ43
DQ44
DQ46
DQ40
DQ47
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
D0
D2
DQ11
DQS0
DM0
DQS0
DM0
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
UDM
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
DQ0
DQ3
DQ4
DQ7
DQ5
DQ2
DQ1
DQ6
DQ32
DQ35
DQ36
DQ39
DQ33
DQ38
DQ37
DQ34
LDQS
LDQS
DQS3
DM3
CS
DQS3
DM3
CS
LDM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
LDM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
UDQS
DQ57
DQ62
DQ56
DQ58
DQ61
DQ63
DQ60
DQ59
DQ29
DQ26
DQ25
DQ30
DQ28
DQ27
DQ24
DQ31
D1
D3
DQS0
DM0
DQS0
DM0
UDM
UDM
I/O 8
I/O 9
DQ20
DQ23
DQ16
DQ19
DQ17
DQ22
DQ21
DQ18
DQ48
DQ51
DQ52
DQ50
DQ49
DQ55
DQ53
DQ54
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
BA0-BA1: DDR SDRAMs D0 - D3
A0-A12: DDR SDRAMs D0 - D3
BA0 - BA1
A0 - A12
RAS
RAS: DDR SDRAMs D0 - D3
CAS: DDR SDRAMs D0 - D3
Clock Wiring
CAS
Clock
CKE: DDR SDRAMs D0 - D3
Input
CKE0
DDR SDRAMs
NC
WE
WE: DDR SDRAMs D0 - D3
CK0/CK0
CK1/CK1
CK2/CK2
2 DDR SDRAMs
2 DDR SDRAMs
V
DDSPD
SPD
Notes:
Serial PD
V
/V
DD DDQ
D0 - D3
1. DQ-to-I/O wiring is shown as recomended but
may be changed.
2. DQ/DQS/DM/CKE/CS relationships must be
maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.
4. BAx, Ax, RAS, CAS, WE resistors: 7.5 Ohms
+ 5%
SCL
WP
D0 - D3
SDA
VREF
A0
A1
A2
D0 - D3
D0 - D3
V
SS
SA0 SA1 SA2
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
6.2 512MB, 64M x 64 Non ECC Module (M368L6523BT(U))
(Populated as 1 bank of x8 DDR SDRAM Module)
CS0
DQS0
DM0
DQS4
DM4
DM/
CS DQS
DM/
CS DQS
Serial PD
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
I/O 6
I/O 4
I/O 2
I/O 0
I/O 7
I/O 5
I/O 3
I/O 1
I/O 7
SCL
WP
I/O 4
I/O 1
I/O 3
I/O 6
I/O 5
I/O 0
I/O 2
D0
D4
SDA
A0
A1
A2
SA0 SA1
SA2
DQS1
DM1
DQS5
DM5
DM/
CS DQS
DM/
CS DQS
V
V
SPD
DDSPD
DQ8
DQ9
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
I/O 7
I/O 5
I/O 1
I/O 0
I/O 6
I/O 4
I/O 3
I/O 2
I/O 6
I/O 4
I/O 3
I/O 1
I/O 7
I/O 5
I/O 2
I/O 0
D0 - D7
D0 - D7
/V
D1
D5
DD DDQ
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
D0 - D7
D0 - D7
VREF
V
SS
DQS2
DM2
DQS6
DM6
D3/D0/D5
DM/
CS DQS
DM/
CS DQS
Cap/Cap/Cap
Cap/D1/D6
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
I/O 6
I/O 5
I/O 3
I/O 0
I/O 7
I/O 4
I/O 2
I/O 1
I/O 7
I/O 5
I/O 1
I/O 0
I/O 6
I/O 4
I/O 3
I/O 2
D2
D6
R=120Ω
CK0/1/2
Card
Edge
CK0/1/2
Cap/Cap/Cap
D4/D2/C7
DQS3
DM3
DQS7
DM7
Cap
Cap/Cap/Cap
DM/
CS DQS
DM/
CS DQS
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
I/O 7
I/O 4
I/O 2
I/O 1
I/O 6
I/O 5
I/O 3
I/O 0
I/O 5
I/O 4
I/O 1
I/O 0
I/O 7
I/O 6
I/O 3
I/O 2
D3
D7
Notes :
1. DQ-to-I/O wiring is shown as recommended
but may be changed.
2. DQ/DQS/DM/CKE/CS relationships must be
maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.
4. BAx, Ax, RAS, CAS, WE resistors: 5.1 Ohms +
5%
* Clock Wiring
DDR SDRAMs
BA0 - BA1
A0 - A12
RAS
BA0-BA1 : DDR SDRAMs D0 - D7
Clock
Input
A0-A12 : DDR SDRAMs D0 - D7
RAS : DDR SDRAMs D0 - D7
CAS : DDR SDRAMs D0 - D7
CKE : DDR SDRAMs D0 - D7
WE : DDR SDRAMs D0 - D7
*CK0/CK0 2 DDR SDRAMs
*CK1/CK1 3 DDR SDRAMs
*CK2/CK2 3 DDR SDRAMs
CAS
CKE0
WE
*Clock Net Wiring
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
6.3 512MB, 64M x 72 ECC Module (M381L6523BT(U))
(Populated as 1 bank of x8 DDR SDRAM Module)
CS0
DQS0
DM0
DQS4
DM4
DM/
CS DQS
DM/
CS DQS
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
I/O 6
I/O 4
I/O 2
I/O 0
I/O 7
I/O 5
I/O 3
I/O 1
I/O 7
Serial PD
I/O 4
I/O 3
I/O 0
I/O 6
I/O 5
I/O 2
I/O 1
D0
D4
SCL
WP
SDA
SPD
A0
A1
A2
SA0 SA1 SA2
DQS1
DM1
DQS5
DM5
DM/
CS DQS
DM/
CS DQS
V
DDSPD
DQ8
DQ9
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
I/O 7
I/O 5
I/O 1
I/O 0
I/O 6
I/O 4
I/O 3
I/O 2
I/O 6
I/O 4
I/O 3
I/O 2
I/O 7
I/O 5
I/O 1
I/O 0
D0 - D8
D0 - D8
V
/V
DD DDQ
D1
D5
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
D0 - D8
D0 - D8
VREF
V
SS
DQS2
DM2
DQS6
DM6
D3/D0/D6
DM/
CS DQS
DM/
CS DQS
Cap/Cap/Cap
D4/D1/D7
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
I/O 6
I/O 5
I/O 3
I/O 0
I/O 7
I/O 4
I/O 2
I/O 1
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
D2
D6
R=120Ω
CK0/1/2
CK0/1/2
Card
Edge
Cap/Cap/Cap
D5/D2/D8
DQS3
DM3
DQS7
DM7
Cap/Cap/Cap
DM/
CS DQS
DM/
CS DQS
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
I/O 7
I/O 4
I/O 3
I/O 1
I/O 6
I/O 5
I/O 2
I/O 0
I/O 5
I/O 4
I/O 1
I/O 0
I/O 7
I/O 6
I/O 3
I/O 2
D3
D7
DQS8
DM8
DM/
CS DQS
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
I/O 5
I/O 4
I/O 3
I/O 1
I/O 7
I/O 6
I/O 2
I/O 0
D8
BA0 - BA1
A0 - A12
RAS
BA0-BA1 : DDR SDRAMs D0 - D8
A0-A12 : DDR SDRAMs D0 - D8
RAS : DDR SDRAMs D0 - D8
CAS : DDR SDRAMs D0 - D8
CKE : DDR SDRAMs D0 - D8
WE : DDR SDRAMs D0 - D8
Notes :
1. DQ-to-I/O wiring is shown as recommended
but may be changed.
2. DQ/DQS/DM/CKE/CS relationships must be
maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.
4. BAx, Ax, RAS, CAS, WE resistors: 5.1 Ohms +
5%
* Clock Wiring
DDR SDRAMs
Clock
Input
CAS
*CK0/CK0 3 DDR SDRAMs
*CK1/CK1 3 DDR SDRAMs
*CK2/CK2 3 DDR SDRAMs
CKE0
WE
*Clock Net Wiring
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
6.4 1GB, 128M x 64 Non ECC Module (M368L2923BT(U))
(Populated as 2 bank of x8 DDR SDRAM Module)
CS1
CS0
DQS0
DM0
DQS4
DM4
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
I/O 7
I/O 0
I/O 1
I/O 6
I/O 5
I/O 2
I/O 3
I/O 4
I/O 7
I/O 6
I/O 1
I/O 2
I/O 5
I/O 4
I/O 3
I/O 0
D8
D4
D12
D0
DQS1
DM1
DQS5
DM5
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DQ8
DQ9
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
I/O 5
I/O 6
I/O 1
I/O 0
I/O 7
I/O 4
I/O 3
I/O 2
I/O 2
I/O 1
I/O 6
I/O 7
I/O 0
I/O 3
I/O 4
I/O 5
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D1
D9
D5
D13
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQS2
DM2
DQS6
DM6
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
I/O 5
I/O 4
I/O 1
I/O 0
I/O 7
I/O 6
I/O 3
I/O 2
I/O 7
I/O 6
I/O 1
I/O 2
I/O 5
I/O 4
I/O 3
I/O 0
I/O 2
I/O 3
I/O 6
I/O 7
I/O 0
I/O 1
I/O 4
I/O 5
I/O 0
I/O 1
I/O 6
I/O 5
I/O 2
I/O 3
I/O 4
I/O 7
D2
D10
D6
D14
DQS3
DM3
DQS7
DM7
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
I/O 5
I/O 6
I/O 1
I/O 0
I/O 7
I/O 4
I/O 3
I/O 2
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 2
I/O 1
I/O 6
I/O 7
I/O 0
I/O 3
I/O 4
I/O 5
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D3
D7
D11
D15
D3/D0/D5
V
V
SPD
DDSPD
D11/D8/D13
Serial PD
D0 - D15
D0 - D15
/V
DD DDQ
R=120Ω
SCL
WP
*
Cap/D1/D6
CK0/1/2
CK0/1/2
SDA
D0 - D15
D0 - D15
VREF
A0
A1
A2
Card
Edge
*
Cap/D9/D14
V
SA0 SA1
SA2
SS
D4/D2/D7
D12/D10/D15
BA0 - BA1
A0 - A12
RAS
BA0-BA1 : DDR SDRAMs D0 - D15
A0-A12: DDR SDRAMs D0 - D15
RAS : DDR SDRAMs D0 - D15
Notes :
1. DQ-to-I/O wiring is shown as recommended
but may be changed.
2. DQ/DQS/DM/CKE/CS relationships must be
maintained as shown.
* Clock Wiring
DDR SDRAMs
Clock
Input
CAS
CKE 0/1
WE
CAS : DDR SDRAMs D0 - D15
CKE : DDR SDRAMs D0 - D15
WE : DDR SDRAMs D0 - D15
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.
4. BAx, Ax, RAS, CAS, WE resistors: 3 Ohms +
5%
*CK0/CK0 4 DDR SDRAMs
*CK1/CK1 6 DDR SDRAMs
*CK2/CK2 6 DDR SDRAMs
*Clock Net Wiring
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
6.5 1GB, 128M x 72 ECC Module (M381L2923BT(U))
(Populated as 2 bank of x8 DDR SDRAM Module)
CS1
CS0
DQS0
DM0
DQS4
DM4
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
I/O 7
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
D9
D4
D13
D0
DQS1
DM1
DQS5
DM5
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DQ8
DQ9
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D1
D10
D5
D14
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQS2
DM2
DQS6
DM6
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D2
D11
D15
D6
DQS3
DM3
DQS7
DM7
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DM/
CS DQS
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D3
D7
D12
D16
DQS8
DM8
DM/
CS DQS
DM/
CS DQS
I/O 7
I/O 6
I/O 1
I/O 0
I/O 5
I/O 4
I/O 3
I/O 2
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
I/O 0
I/O 1
I/O 6
I/O 7
I/O 2
I/O 3
I/O 4
I/O 5
D8
D17
D3/D0/D5
D12/D9/D14
R=120Ω
D8/D1/D6
V
V
SPD
DDSPD
Serial PD
CK0/1/2
SCL
WP
Card
Edge
D0 - D17
D0 - D17
/V
DD DDQ
D17/D10/D15
D4/D2/D7
SDA
A0
A1
A2
D0 - D17
D0 - D17
VREF
SA0 SA1
SA2
V
D13/D11/D16
SS
Notes :
BA0 - BA1
A0 - A12
RAS
BA0-BA1 : DDR SDRAMs D0 - D17
A0-A12 : DDR SDRAMs D0 - D17
RAS : DDR SDRAMs D0 - D17
1. DQ-to-I/O wiring is shown as recommended
but may be changed.
2. DQ/DQS/DM/CKE/CS relationships must be
maintained as shown.
3. DQ, DQS, DM/DQS resistors: 22 Ohms + 5%.
4. BAx, Ax, RAS, CAS, WE resistors:3 Ohms +
5%
* Clock Wiring
DDR SDRAMs
Clock
Input
CAS
CKE0/1
WE
CAS : DDR SDRAMs D0 - D17
CKE : DDR SDRAMs D0 - D17
WE : DDR SDRAMs D0 - D17
*CK0/CK0 6 DDR SDRAMs
*CK1/CK1 6 DDR SDRAMs
*CK2/CK2 6 DDR SDRAMs
*Clock Net Wiring
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
7.0 Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Voltage on any pin relative to VSS
VIN,VOUT
-0.5 ~ 3.6
V
Voltage on VDD & VDDQ supply relative to VSS
Storage temperature
Power dissipation
VDD,VDDQ
TSTG
PD
-1.0 ~ 3.6
V
-55 ~ +150
°C
1.5 * # of component
50
W
Short circuit current
IOS
mA
Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
8.0 DC Operating Conditions
Recommended operating conditions(Voltage referenced to VSS=0V, TA=0 to 70°C)
Parameter
Symbol
Min
Max
Unit Note
Supply voltage(for device with a nominal VDD of 2.5V for DDR333)
VDD
2.3
2.7
V
Supply voltage(for device with a nominal VDD of 2.6V for DDR400)
VDD
2.5
2.7
2.7
V
V
V
I/O Supply voltage(for device with a nominal VDD of 2.5V for DDR333)
I/O Supply voltage(for device with a nominal VDD of 2.6V for DDR400)
I/O Reference voltage
VDDQ
VDDQ
VREF
VTT
2.3
2.5
2.7
0.49*VDDQ
VREF-0.04
0.51*VDDQ
VREF+0.04
V
V
1
2
I/O Termination voltage(system)
Input logic high voltage
VIH(DC)
VIL(DC)
VIN(DC)
VID(DC)
VI(Ratio)
II
VREF+0.15
-0.3
VDDQ+0.3
VREF-0.15
VDDQ+0.3
VDDQ+0.6
1.4
V
Input logic low voltage
V
Input Voltage Level, CK and CK inputs
Input Differential Voltage, CK and CK inputs
V-I Matching: Pullup to Pulldown Current Ratio
Input leakage current
-0.3
V
0.36
0.71
-2
V
3
4
-
2
uA
uA
mA
Output leakage current
IOZ
-5
5
Output High Current(Normal strengh driver) ;VOUT = VTT + 0.84V
IOH
-16.8
Output High Current(Normal strengh driver) ;VOUT = VTT - 0.84V
Output High Current(Half strengh driver) ;VOUT = VTT + 0.45V
Output High Current(Half strengh driver) ;VOUT = VTT - 0.45V
Note :
IOL
IOH
IOL
16.8
-9
mA
mA
mA
9
1. VREF is expected to be equal to 0.5*VDDQ of the transmitting device, and to track variations in the dc level of same. Peak-to peak noise on VREF may
not exceed +/-2% of the dc value.
2. VTT is not applied directly to the device. VTT is a system supply for signal termination resistors, is expected to be set equal to VREF, and must track
variations in the DC level of VREF
.
3. VID is the magnitude of the difference between the input level on CK and the input level on CK.
4. The ratio of the pullup current to the pulldown current is specified for the same temperature and voltage, over the entire temperature and voltage range,
for device drain to source voltages from 0.25V to 1.0V. For a given output, it represents the maximum difference between pullup and pulldown drivers
due to process variation. The full variation in the ratio of the maximum to minimum pullup and pulldown current will not exceed 1.7 for device drain to
source voltages from 0.1 to 1.0.
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
9.0 DDR SDRAM IDD spec table
9.1 M368L3324BT(U) [ (32M x 16) * 4, 256MB Non ECC Module ]
(VDD=2.7V, T = 10°C)
Symbol
IDD0
CC(DDR400@CL=3)
B3(DDR333@CL=2.5)
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
Notes
660
760
20
500
620
20
IDD1
IDD2P
IDD2F
IDD2Q
IDD3P
IDD3N
IDD4R
IDD4W
IDD5
120
100
220
400
920
1,120
1,060
20
120
100
120
200
780
860
1,000
20
Normal
Low power
IDD7A
IDD6
12
12
Optional
1,800
1,620
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
9.2 M368L6523BT(U) [ (64M x 8) * 8, 512MB Non ECC Module ]
(VDD=2.7V, T = 10°C)
Symbol
IDD0
CC(DDR400@CL=3)
B3(DDR333@CL=2.5)
Unit
Notes
1,320
1,480
40
1,000
1,200
40
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
IDD1
IDD2P
IDD2F
IDD2Q
IDD3P
IDD3N
IDD4R
IDD4W
IDD5
240
240
200
200
440
240
760
400
1,600
1,920
2,120
40
1,320
1,520
2,000
40
Normal
Low power
IDD7A
IDD6
24
24
Optional
3,440
3,200
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
9.3 M381L6523BT(U) [ (64M x 8) * 9, 512MB ECC Module ]
(VDD=2.7V, T = 10°C)
Symbol
IDD0
CC(DDR400@CL=3)
B0(DDR333@CL=2.5)
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
Notes
1,485
1,665
45
1,130
1,350
45
IDD1
IDD2P
IDD2F
IDD2Q
IDD3P
IDD3N
IDD4R
IDD4W
IDD5
270
270
225
230
500
270
855
450
1,800
2,160
2,385
45
1,490
1,710
2,250
45
Normal
Low power
IDD7A
IDD6
27
27
Optional
3,870
3,600
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
9.4 M368L2923BT(U) [ (64M x 8) * 16, 1GB Non ECC Module ]
(VDD=2.7V, T = 10°C)
Unit Notes
Symbol
IDD0
CC(DDR400@CL=3)
B0(DDR333@CL=2.5)
2,080
2,240
80
1,400
1,600
80
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
IDD1
IDD2P
IDD2F
IDD2Q
IDD3P
IDD3N
IDD4R
IDD4W
IDD5
480
480
400
400
880
480
1,520
2,360
2,680
2,880
80
800
1,720
1,920
2,400
80
Normal
Low power
IDD7A
IDD6
48
48
Optional
4,200
3,600
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
9.5 M381L2923BT(U) [ (64M x 8) * 18, 1GB ECC Module ]
(VDD=2.7V, T = 10°C)
Symbol
IDD0
CC (DDR400@CL=3)
B3 (DDR333@CL=2.5)
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
Notes
2,340
2,520
90
1,580
1,800
90
IDD1
IDD2P
IDD2F
IDD2Q
IDD3P
IDD3N
IDD4R
IDD4W
IDD5
540
540
450
450
990
540
1,710
2,655
3,015
3,240
90
900
1,940
2,160
2,700
90
Normal
Low power
IDD7A
IDD6
54
54
Optional
4,725
4,050
* Module IDD was calculated on the basis of component IDD and can be differently measured according to DQ loading cap.
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
10.0 AC Operating Conditions
Parameter/Condition
Symbol
Min
Max
Unit
V
Note
Input High (Logic 1) Voltage, DQ, DQS and DM signals
Input Low (Logic 0) Voltage, DQ, DQS and DM signals.
Input Differential Voltage, CK and CK inputs
Input Crossing Point Voltage, CK and CK inputs
VIH(AC)
VIL(AC)
VID(AC)
VREF + 0.31
3
3
1
2
VREF - 0.31
VDDQ+0.6
V
0.7
V
VIX(AC) 0.5*VDDQ-0.2 0.5*VDDQ+0.2
V
Note :
1. VID is the magnitude of the difference between the input level on CK and the input on CK.
2. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the DC level of the same.
3. These parameters should be tested at the pim on actual components and may be checked at either the pin or the pad in
simulation. the AC and DC input specificatims are refation to a Vref envelope that has been bandwidth limited 20MHz.
Vtt=0.5*VDDQ
RT=50Ω
Output
Z0=50Ω
VREF
=0.5*VDDQ
CLOAD=30pF
Output Load Circuit (SSTL_2)
11.0 Input/Output Capacitance
(VDD=2.5V, VDDQ=2.5V, TA= 25°C, f=1MHz)
M368L3324BT(U) M368L6523BT(U) M381L6523BT(U)
Symbol Unit
Parameter
Min
41
34
34
25
6
Max
45
38
38
30
7
Min
49
42
42
25
6
Max
57
50
50
30
7
Min
51
44
44
25
6
Max
60
53
53
30
7
Input capacitance(A0 ~ A12, BA0 ~ BA1,RAS,CAS,WE ) CIN1
pF
pF
pF
pF
pF
pF
pF
Input capacitance(CKE0)
CIN2
CIN3
CIN4
CIN5
Cout1
Cout2
Input capacitance( CS0)
Input capacitance( CLK0, CLK1,CLK2)
Input capacitance(DM0~DM7, DM8(for ECC))
Data & DQS input/output capacitance(DQ0~DQ63)
Data input/output capacitance (CB0~CB7)
6
7
6
7
6
7
-
-
-
-
6
7
M368L2923BT(U)
M381L2923BT(U)
Parameter
Symbol
Unit
Min
65
42
42
28
10
10
-
Max
81
50
50
34
12
12
-
Min
69
44
44
28
10
10
10
Max
87
53
53
34
12
12
12
Input capacitance(A0 ~ A12, BA0 ~ BA1,RAS,CAS,WE ) CIN1
pF
pF
pF
pF
pF
pF
pF
Input capacitance(CKE0,CKE1)
CIN2
CIN3
CIN4
CIN5
Cout1
Cout2
Input capacitance( CS0, CS1)
Input capacitance( CLK0, CLK1,CLK2)
Input capacitance(DM0~DM7, DM8(for ECC))
Data & DQS input/output capacitance(DQ0~DQ63)
Data input/output capacitance (CB0~CB7)
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
12.0 AC Timming Parameters & Specifications
CC
(DDR400@CL=3.0)
B3
(DDR333@CL=2.5)
Parameter
Symbol
Unit
Note
Min
55
Max
Min
60
Max
Row cycle time
tRC
tRFC
tRAS
tRCD
tRP
ns
ns
ns
ns
ns
ns
ns
tCK
ns
ns
Refresh row cycle time
Row active time
70
72
40
70K
42
70K
RAS to CAS delay
Row precharge time
15
18
15
18
Row active to Row active delay
Write recovery time
tRRD
tWR
10
12
15
15
Last data in to Read command
tWTR
2
1
CL=2.0
CL=2.5
CL=3.0
-
-
7.5
6
12
12
Clock cycle time
tCK
6
12
5
10
-
-
Clock high level width
tCH
tCL
0.45
0.45
-0.55
-0.65
-
0.55
0.55
+0.55
+0.65
0.4
0.45
0.45
-0.6
-0.7
-
0.55
0.55
+0.6
+0.7
0.45
1.1
tCK
tCK
ns
Clock low level width
DQS-out access time from CK/CK
Output data access time from CK/CK
Data strobe edge to ouput data edge
Read Preamble
tDQSCK
tAC
ns
tDQSQ
tRPRE
tRPST
tDQSS
tWPRES
tWPRE
tDSS
tDSH
tDQSH
tDQSL
tIS
ns
22
13
0.9
0.4
0.72
0
1.1
0.9
0.4
0.75
0
tCK
tCK
tCK
ns
Read Postamble
0.6
0.6
CK to valid DQS-in
1.28
1.25
DQS-in setup time
DQS-in hold time
0.25
0.2
0.2
0.35
0.35
0.6
0.6
0.7
0.7
-0.65
-0.65
10
0.25
0.2
0.2
0.35
0.35
0.75
0.75
0.8
0.8
-0.7
-0.7
12
tCK
tCK
tCK
tCK
tCK
ns
DQS falling edge to CK rising-setup time
DQS falling edge from CK rising-hold time
DQS-in high level width
DQS-in low level width
Address and Control Input setup time(fast)
Address and Control Input hold time(fast)
Address and Control Input setup time(slow)
Address and Control Input hold time(slow)
Data-out high impedence time from CK/CK
Data-out low impedence time from CK/CK
Mode register set cycle time
DQ & DM setup time to DQS
15, 17~19
15, 17~19
16~19
16~19
11
tIH
ns
tIS
ns
tIH
ns
tHZ
+0.65
+0.65
+0.7
+0.7
ns
tLZ
ns
11
tMRD
tDS
ns
0.4
0.45
ns
j, k
j, k
ns
DQ & DM hold time to DQS
tDH
0.4
0.45
Control & Address input pulse width
DQ & DM input pulse width
tIPW
tDIPW
tXSNR
tXSRD
tREFI
2.2
1.75
75
2.2
1.75
75
ns
ns
18
18
Exit self refresh to non-Read command
Exit self refresh to read command
Refresh interval time
ns
200
200
tCK
us
7.8
-
7.8
-
14
21
tHP
-tQHS
tHP
-tQHS
Output DQS valid window
Clock half period
tQH
tHP
ns
ns
tCLmin
or tCHmin
tCLmin
or tCHmin
-
-
20, 21
Data hold skew factor
tQHS
0.5
0.6
0.55
0.6
ns
21
12
DQS write postamble time
tWPST
0.4
15
0.4
18
tCK
Active to Read with Auto precharge
command
tRAP
(tWR/tCK)
+
(tRP/tCK)
(tWR/tCK)
+
(tRP/tCK)
Autoprecharge write recovery +
Precharge time
tDAL
tCK
23
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
13.0 System Characteristics for DDR SDRAM
The following specification parameters are required in systems using DDR333 devices to ensure proper system performance. these
characteristics are for system simulation purposes and are guaranteed by design.
Table 1 : Input Slew Rate for DQ, DQS, and DM
AC CHARACTERISTICS
DDR400
DDR333
PARAMETER
SYMBOL
MIN
TBD
MAX
MIN
TBD
MAX
Units
Notes
DQ/DM/DQS input slew rate measured between
VIH(DC), VIL(DC) and VIL(DC), VIH(DC)
DCSLEW
TBD
TBD
V/ns
a, m
Table 2 : Input Setup & Hold Time Derating for Slew Rate
Input Slew Rate
0.5 V/ns
∆tIS
0
∆tIH
Units
ps
Notes
0
0
0
i
i
i
0.4 V/ns
+50
+100
ps
0.3 V/ns
ps
Table 3 : Input/Output Setup & Hold Time Derating for Slew Rate
Input Slew Rate
0.5 V/ns
∆tDS
0
∆tDH
0
Units
ps
Notes
k
k
k
0.4 V/ns
+75
+150
+75
+150
ps
0.3 V/ns
ps
Table 4 : Input/Output Setup & Hold Derating for Rise/Fall Delta Slew Rate
Delta Slew Rate
+/- 0.0 V/ns
∆tDS
0
∆tDH
0
Units
ps
Notes
j
j
j
+/- 0.25 V/ns
+/- 0.5 V/ns
+50
+100
+50
+100
ps
ps
Table 5 : Output Slew Rate Characteristice (X4, X8 Devices only)
Typical Range
(V/ns)
Minimum
(V/ns)
Maximum
(V/ns)
Slew Rate Characteristic
Notes
Pullup Slew Rate
Pulldown slew
1.2 ~ 2.5
1.2 ~ 2.5
1.0
1.0
4.5
4.5
a,c,d,f,g,h
b,c,d,f,g,h
Table 6 : Output Slew Rate Characteristice (X16 Devices only)
Typical Range
(V/ns)
Minimum
(V/ns)
Maximum
(V/ns)
Slew Rate Characteristic
Notes
Pullup Slew Rate
Pulldown slew
1.2 ~ 2.5
1.2 ~ 2.5
0.7
0.7
5.0
5.0
a,c,d,f,g,h
b,c,d,f,g,h
Table 7 : Output Slew Rate Matching Ratio Characteristics
AC CHARACTERISTICS
DDR400
DDR333
PARAMETER
Output Slew Rate Matching Ratio (Pullup to Pulldown)
MIN
TBD
MAX
MIN
MAX
Notes
e,m
TBD
TBD
TBD
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
14.0 Component Notes
1. All voltages referenced to Vss.
2. Tests for ac timing, IDD, and electrical, ac and dc characteristics, may be conducted at nominal reference/supply voltage levels, but the related speci-
fications and device operation are guaranteed for the full voltage range specified.
3. Figure 1 represents the timing reference load used in defining the relevant timing parameters of the part. It is not intended to be either a precise rep-
resentation of the typical system environment nor a depiction of the actual load presented by a production tester. System designers will use IBIS or
other simulation tools to correlate the timing reference load to a system environment. Manufacturers will correlate to their production test conditions
(generally a coaxial transmission line terminated at the tester electronics).
VDDQ
50Ω
Output
(Vout)
30pF
Figure 1 : Timing Reference Load
4. AC timing and IDD tests may use a VIL to VIH swing of up to 1.5 V in the test environment, but input timing is still referenced to VREF (or to the cross-
ing point for CK/CK), and parameter specifications are guaranteed for the specified ac input levels under normal use conditions. The minimum slew
rate for the input signals is 1 V/ns in the range between VIL(ac) and VIH(ac).
5. The ac and dc input level specifications are as defined in the SSTL_2 Standard (i.e., the receiver will effectively switch as a result of the signal crossing
the ac input level and will remain in that state as long as the signal does not ring back above (below) the dc input LOW (HIGH) level.
6. Inputs are not recognized as valid until VREF stabilizes. Exception: during the period before VREF stabilizes, CKE ≤ 0.2VDDQ is recognized as LOW.
7. Enables on.chip refresh and address counters.
8. IDD specifications are tested after the device is properly initialized.
9. The CK/CK input reference level (for timing referenced to CK/CK) is the point at which CK and CK cross; the input reference level for signals other
than CK/CK, is VREF.
10. The output timing reference voltage level is VTT.
11. tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referenced to a specific voltage
level but specify when the device output is no longer driving (HZ), or begins driving (LZ).
12. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this parameter, but sys tem performance
(bus turnaround) will degrade accordingly.
13. The specific requirement is that DQS be valid (HIGH, LOW, or at some point on a valid transition) on or before this CK edge. A valid transition is
defined as monotonic and meeting the input slew rate specifications of the device. when no writes were previ ously in progress on the bus, DQS will
be tran sitioning from High- Z to logic LOW. If a previous write was in progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this
time, depending on tDQSS.
14. A maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device.
15. For command/address input slew rate ≥ 1.0 V/ns
16. For command/address input slew rate ≥ 0.5 V/ns and < 1.0 V/ns
17. For CK & CK slew rate ≥ 1.0 V/ns
18. These parameters guarantee device timing, but they are not necessarily tested on each device. They may be guaranteed by device design or tester
correlation.
19. Slew Rate is measured between VOH(ac) and VOL(ac).
20. Min (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the device (i.e. this value can be greater
than the minimum specification limits for tCL and tCH).....For example, tCL and tCH are = 50% of the period, less the half period jitter (tJIT(HP)) of the
clock source, and less the half period jitter due to crosstalk (tJIT(crosstalk)) into the clock traces.
21. tQH = tHP - tQHS, where:
tHP = minimum half clock period for any given cycle and is defined by clock high or clock low (tCH, tCL). tQHS accounts for 1) The pulse duration dis-
tortion of on-chip clock circuits; and 2) The worst case push-out of DQS on one tansition followed by the worst case pull-in of DQ on the next transi-
tion, both of which are, separately, due to data pin skew and output pattern effects, and p channel to n-channel variation of the output drivers.
22. tDQSQ - Consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers for any given cycle.
23. tDAL = (tWR/tCK) + (tRP/tCK)
For each of the terms above, if not already an integer, round to the next highest integer. Example: For DDR266B at CL=2.5 and tCK=7.5ns tDAL = (15
ns / 7.5 ns) + (20 ns/ 7.5ns) = (2) + (3) tDAL = 5 clocks
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
15.0 System Notes:
a. Pullup slew rate is characteristized under the test conditions as shown in Figure 2.
Test point
50Ω
Output
VSSQ
Figure 2 : Pullup slew rate test load
b. Pulldown slew rate is measured under the test conditions shown in Figure 3.
VDDQ
50Ω
Output
Test point
Figure 3 : Pulldown slew rate test load
c. Pullup slew rate is measured between (VDDQ/2 - 320 mV +/- 250 mV)
Pulldown slew rate is measured between (VDDQ/2 + 320 mV +/- 250 mV)
Pullup and Pulldown slew rate conditions are to be met for any pattern of data, including all outputs switching and only one output switching.
Example : For typical slew rate, DQ0 is switching
For minmum slew rate, all DQ bits are switching from either high to low, or low to high.
The remaining DQ bits remain the same as for previous state.
d. Evaluation conditions
Typical : 25 °C (T Ambient), VDDQ = 2.5V(for DDR266/333) and 2.6V(for DDR400), typical process
Minimum : 70 °C (T Ambient), VDDQ = 2.3V(for DDR266/333) and 2.5V(for DDR400), slow - slow process
Maximum : 0 °C (T Ambient), VDDQ = 2.7V(for DDR266/333) and 2.7V(for DDR400), fast - fast process
e. The ratio of pullup slew rate to pulldown slew rate is specified for the same temperature and voltage, over the entire temperature and voltage range.
For a given output, it represents the maximum difference between pullup and pulldown drivers due to process variation.
f. Verified under typical conditions for qualification purposes.
g. TSOPII package divices only.
h. Only intended for operation up to 266 Mbps per pin.
i. A derating factor will be used to increase tIS and tIH in the case where the input slew rate is below 0.5V/ns as shown in Table 2. The Input slew rate is
based on the lesser of the slew rates detemined by either VIH(AC) to VIL(AC) or VIH(DC) to VIL(DC), similarly for rising transitions.
j. A derating factor will be used to increase tDS and tDH in the case where DQ, DM, and DQS slew rates differ, as shown in Tables 3 & 4. Input slew rate
is based on the larger of AC-AC delta rise, fall rate and DC-DC delta rise, Input slew rate is based on the lesser of the slew rates determined by either
VIH(AC) to VIL(AC) or VIH(DC) to VIL(DC), similarly for rising transitions. The delta rise/fall rate is calculated as: {1/(Slew Rate1)} - {1/(Slew Rate2)}
For example : If Slew Rate 1 is 0.5 V/ns and slew Rate 2 is 0.4 V/ns, then the delta rise, fall rate is - 0.5ns/V . Using the table given, this
would result in the need for an increase in tDS and tDH of 100 ps.
k. Table 3 is used to increase tDS and tDH in the case where the I/O slew rate is below 0.5 V/ns. The I/O slew rate is based on the lesser on the lesser of
the AC - AC slew rate and the DC- DC slew rate. The inut slew rate is based on the lesser of the slew rates deter mined by either VIH(ac) to VIL(ac) or
VIH(DC) to VIL(DC), and similarly for rising transitions.
m. DQS, DM, and DQ input slew rate is specified to prevent double clocking of data and preserve setup and hold times. Signal transi tions through the
DC region must be monotonic.
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
16.0 Command Truth Table
(V=Valid, X=Don′t Care, H=Logic High, L=Logic Low)
A0 ~ A9
Note
COMMAND
CKEn-1 CKEn CS RAS CAS WE BA0,1 A10/AP
A11, A12
Register
Register
Extended MRS
H
H
X
X
H
L
L
L
L
L
L
L
L
L
OP CODE
OP CODE
1, 2
1, 2
3
Mode Register Set
Auto Refresh
H
L
L
L
H
X
X
Entry
Self
3
Refresh
L
H
X
H
X
H
X
3
Refresh
Exit
L
H
H
H
X
X
H
3
Row Address
(A0~A9, A11,A12)
Bank Active & Row Addr.
L
L
L
H
L
H
H
V
V
Auto Precharge Disable
Auto Precharge Enable
Auto Precharge Disable
Auto Precharge Enable
L
H
L
4
4
Read &
Column Address
Column
Address
H
4
Write &
Column Address
Column
Address
H
H
H
X
X
X
L
L
L
H
H
L
L
H
H
L
L
L
V
H
4, 6
7
Burst Stop
X
Bank Selection
All Banks
V
X
L
Precharge
X
H
5
H
L
X
V
X
X
H
X
V
X
X
H
X
V
X
X
H
X
V
X
V
X
X
H
X
V
Entry
H
L
L
H
L
Active Power Down
X
X
Exit
X
H
L
Entry
H
Precharge Power Down Mode
DM
H
L
Exit
L
H
H
H
X
X
X
8
9
9
H
L
X
H
X
H
No operation (NOP) : Not defined
Note :
1. OP Code : Operand Code. A0 ~ A12 & BA0 ~ BA1 : Program keys. (@EMRS/MRS)
2. EMRS/ MRS can be issued only at all banks precharge state. A new command can be issued 2 clock cycles after EMRS or MRS.
3. Auto refresh functions are same as the CBR refresh of DRAM.
The automatical precharge without row precharge command is meant by "Auto".
Auto/self refresh can be issued only at all banks precharge state.
4. BA0 ~ BA1 : Bank select addresses.
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.
If BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank B is selected.
If BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank C is selected.
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected.
5. If A10/AP is "High" at row precharge, BA0 and BA1 are ignored and all banks are selected.
6. During burst write with auto precharge, new read/write command can not be issued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at tRP after the end of burst.
7. Burst stop command is valid at every burst length.
8. DM sampled at the rising and falling edges of the DQS and Data-in are masked at the both edges (Write DM latency is 0).
9. This combination is not defined for any function, which means "No Operation(NOP)" in DDR SDRAM.
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
17.0 Physical Dimensions
17.1 32M x 64 (M368L3324BT(U))
Units : Inches (Millimeters)
5.25 ± 0.005
(133.350 ± 0.13)
0.118 Min
(3.00 Min)
5.077
(128.950)
1.25 ± 0.006
±0.15)
(31.75
A
B
2.500 +0.1/-0.0
0.10 M
C
B A
1.95
(49.53)
2.55
(64.77)
0.098 Max
(2.47 Max)
0.050 ± 0.0039
(1.270 ± 0.10)
0.118 Min
(3.00 Min)
0.250
(6.350)
0.039 ± 0.002
(1.000 ± 0.050)
0.0787
R (2.00)
0.1496
(3.80)
0.0078 ±0.006
(0.20 ±0.15)
2.175
0.071
(1.80)
0.050
(1.270)
0.1575 ± 0.004
(4.00 ± 0.1)
C
Detail A
0.10
B
AM
M
Detail B
Tolerances : ± 0.005(.13) unless otherwise specified.
The used device is 32Mx16 DDR SDRAM, TSOPII.
DDR SDRAM Part No : K4H511638B
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
17.2 64Mx64 (M368L6523BT(U))
Units : Inches (Millimeters)
5.25 ± 0.005
(133.350 ± 0.13)
0.118 Min
(3.00Min)
5.077
(128.950)
1.25 ± 0.006
±0.15)
(31.75
A
B
2.500 +0.1/-0.0
0.10 M
C
B A
0.07 Max
2.55
1.95
(64.77)
(49.53)
(1.20 Max)
0.050 ± 0.0039
(1.270 ± 0.10)
0.118 Min
(3.00Min)
0.250
(6.350)
0.039 ± 0.002
(1.000 ± 0.050)
0.0787
R (2.00)
0.1496
(3.80)
0.0078 ± 0.006
(0.20 ± 0.15)
2.175
0.071
(1.80)
0.050
(1.270)
0.1575 ± 0.004
(4.00 ± 0.1)
C
Detail A
0.10
B
AM
M
Detail B
Tolerances : ± 0.005(.13) unless otherwise specified.
The used device is 64Mx8 DDR SDRAM, TSOPII.
DDR SDRAM Part No : K4H510838B
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
17.3 64Mx72 (M381L6523BT(U))
Units : Inches (Millimeters)
5.25 ± 0.005
(133.350 ± 0.13)
0.118 Min
(3.00 Min)
5.077
(128.950)
1.25 ± 0.006
±0.15)
(31.75
A
B
2.500 +0.1/-0.0
0.10 M
C
B A
0.07 Max
2.55
1.95
(64.77)
(49.53)
(1.20 Max)
0.050 ± 0.0039
(1.270 ± 0.10)
0.118 Min
(3.00 Min)
0.250
(6.350)
0.039 ± 0.002
(1.000 ± 0.050)
0.0787
R (2.00)
0.1496
(3.80)
0.0078 ± 0.006
(0.20 ± 0.15)
2.175
0.071
(1.80)
0.050
(1.270)
0.1575 ± 0.004
(4.00 ± 0.1)
C
Detail A
0.10
B
AM
M
Detail B
Tolerances : ± 0.005(.13) unless otherwise specified.
The used device is 64Mx8 DDR SDRAM, TSOPII.
DDR SDRAM Part No : K4H510838B
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
17.4 128Mx64 (M368L2923BT(U))
Units : Inches (Millimeters)
5.25 ± 0.005
(133.350 ± 0.13)
0.118 Min
(3.00 Min)
5.077
(128.950)
1.25 ± 0.006
±0.15)
(31.75
A
B
2.500 +0.1/-0.0
0.10 M
C
B A
2.55
(64.77)
0.145 Max
(3.67 Max)
1.95
(49.53)
0.050 ± 0.0039
(1.270 ± 0.10)
0.118 Min
(3.00 Min)
0.250
(6.350)
0.039 ± 0.002
(1.000 ± 0.050)
0.0787
R (2.00)
0.1496
(3.80)
0.0078 ± 0.006
(0.20 ± 0.15)
2.175
0.071
(1.80)
0.050
(1.270)
0.1575 ± 0.004
(4.00 ± 0.1)
C
Detail A
0.10
B
AM
M
Detail B
Tolerances : ± 0.005(.13) unless otherwise specified.
The used device is 64Mx8 DDR SDRAM, TSOPII.
DDR SDRAM Part No : K4H510838B
Rev. 1.1 June 2005
256MB, 512MB, 1GB Unbuffered DIMM
DDR SDRAM
17.5 128Mx72 (M381L2923BT(U))
Units : Inches (Millimeters)
5.25 ± 0.005
(133.350 ± 0.13)
0.118 Min
(3.00 Min)
5.077
(128.950)
1.25 ± 0.006
±0.15)
(31.75
A
B
2.500 +0.1/-0.0
0.10 M
C
B A
2.55
(64.77)
0.145 Max
(3.67 Max)
1.95
(49.53)
0.050 ± 0.0039
(1.270 ± 0.10)
0.118 Min
(3.00 Min)
0.250
(6.350)
0.039 ± 0.002
(1.000 ± 0.050)
0.0787
R (2.00)
0.1496
(3.80)
0.0078 ± 0.006
(0.20 ± 0.15)
2.175
0.071
(1.80)
0.050
(1.270)
0.1575 ± 0.004
(4.00 ± 0.1)
C
AM
B
Detail A
0.10 M
Detail B
Tolerances : ± 0.005(.13) unless otherwise specified.
The used device is 64Mx8 DDR SDRAM, TSOPII.
DDR SDRAM Part No : K4H510838B
Rev. 1.1 June 2005
M368L3324BTM-CB3 相关器件
型号 | 制造商 | 描述 | 价格 | 文档 |
M368L3324BTM-CCC | SAMSUNG | DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II | 获取价格 | |
M368L3324BTM-LA2 | SAMSUNG | DDR DRAM Module, 32MX64, 0.75ns, CMOS, DIMM-184 | 获取价格 | |
M368L3324BTM-LB3 | SAMSUNG | DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II | 获取价格 | |
M368L3324BTM-LCC | SAMSUNG | DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II | 获取价格 | |
M368L3324BUM-CB3 | SAMSUNG | DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II | 获取价格 | |
M368L3324BUM-CC4 | SAMSUNG | DDR DRAM Module, 32MX64, 0.65ns, CMOS, DIMM-184 | 获取价格 | |
M368L3324BUM-CCC | SAMSUNG | DDR SDRAM Unbuffered Module 184pin Unbuffered Module based on 512Mb B-die with 64/72-bit Non ECC/ECC 66 TSOP-II | 获取价格 | |
M368L3324BUM-LA2 | SAMSUNG | DDR DRAM Module, 32MX64, 0.75ns, CMOS, ROHS COMPLIANT, DIMM-184 | 获取价格 | |
M368L3324BUM-LAA | SAMSUNG | DDR DRAM Module, 32MX64, 0.75ns, CMOS, ROHS COMPLIANT, DIMM-184 | 获取价格 | |
M368L3324BUM-LB0 | SAMSUNG | DDR DRAM Module, 32MX64, 0.75ns, CMOS, ROHS COMPLIANT, DIMM-184 | 获取价格 |
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