K7J160882B-FC300 [SAMSUNG]
DDR SRAM, 2MX8, 0.45ns, CMOS, PBGA165, 13 X 15 MM, 1 MM PITCH, FBGA-165;型号: | K7J160882B-FC300 |
厂家: | SAMSUNG |
描述: | DDR SRAM, 2MX8, 0.45ns, CMOS, PBGA165, 13 X 15 MM, 1 MM PITCH, FBGA-165 双倍数据速率 静态存储器 内存集成电路 |
文件: | 总18页 (文件大小:178K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
Document Title
512Kx36-bit, 1Mx18-bit, 2Mx8-bit DDR II SIO b2 SRAM
Revision History
Draft Date
Remark
Rev. No.
History
Advance
Dec. 16, 2002
Dec. 26, 2002
Jan. 27, 2003
Mar. 20, 2003
0.0
1. Initial document.
Preliminary
Preliminary
Preliminary
0.1
1. Change the JTAG Block diagram
1. Add the speed bin (-25)
0.2
0.3
1. Correct the JTAG ID register definition
2. Correct the AC timing parameter (delete the tKHKH Max value)
Preliminary
Preliminary
April. 4, 2003
0.4
0.5
1. Change the Maximum Clock cycle time.
2. Correct the 165FBGA package ball size.
June. 20, 2003
1. Add the power up/down sequencing comment.
2. Update the DC current parameter (Icc and Isb).
3. Change the Max. speed bin from -33 to -30.
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.
June. 2003
Rev 0.5
- 1 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
512Kx36-bit, 1Mx18-bit, 2Mx8-bit DDR II SIO b2 SRAM
FEATURES
• 1.8V+0.1V/-0.1V Power Supply.
Part
Cycle Access
Organization
Unit
• DLL circuitry for wide output data valid window and future
freguency scaling.
Number
Time
Time
K7J163682B-FC30
K7J163682B-FC25
K7J163682B-FC20
K7J163682B-FC16
K7J161882B-FC30
K7J161882B-FC25
K7J161882B-FC20
K7J161882B-FC16
K7J160882B-FC30
K7J160882B-FC25
K7J160882B-FC20
K7J160882B-FC16
3.3
4.0
5.0
6.0
3.3
4.0
5.0
6.0
3.3
4.0
5.0
6.0
0.45
0.45
0.45
0.50
0.45
0.45
0.45
0.50
0.45
0.45
0.45
0.50
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
• I/O Supply Voltage 1.5V+0.1V/-0.1V for 1.5V I/O,
1.8V+0.1V/-0.1V for 1.8V I/O.
• Separate independent read and write data ports
• HSTL I/O
X36
X18
• Synchronous pipeline read with self timed late write.
• Registered address, control and data input/output.
• Full data coherency, providing most current data.
• DDR(Double Data Rate) Interface on read and write ports.
• Fixed 2-bit burst for both read and write operation.
• Clock-stop supports to reduce current.
• Two input clocks(K and K) for accurate DDR timing at clock
rising edges only.
• Two input clocks for output data(C and C) to minimize
clock-skew and flight-time mismatches.
• Two echo clocks (CQ and CQ) to enhance output data
traceability.
X8
• Single address bus.
• Byte write (x18, x36) and nybble(x8) write function.
• Simple depth expansion with no data contention.
• Programmable output impedance.
• JTAG 1149.1 compatible test access port.
• 165FBGA(11x15 ball aray FBGA) with body size of 13x15mm
FUNCTIONAL BLOCK DIAGRAM
36 (or 18)
18 (or 19)
DATA
REG
D(Data in)
ADDRESS
36 (or 18)
WRITE DRIVER
18
(or 19)
ADD
REG
36
(or 18)
36
72
(or 36)
512kx36
(1Mx18)
MEMORY
ARRAY
(or 18)
R/W
LD
CTRL
LOGIC
Q(Data Out)
4(or 2)
BWX
CQ, CQ
(Echo Clock out)
K
K
CLK
GEN
C
C
SELECT OUTPUT CONTROL
Notes: 1. Numbers in ( ) are for x18 device, x8 device also the same with appropriate adjustments of depth and width.
DDR II SRAM and Double Data Rate II comprise a new family of products developed by Cypress, Hitachi, IDT, Micron, NEC and Samsun g technology.
June. 2003
Rev 0.5
- 2 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
PIN CONFIGURATIONS(TOP VIEW) K7J163682B(512Kx36)
1
2
VSS/SA*
Q18
Q28
D20
D29
Q21
D22
VREF
Q31
D32
Q24
Q34
D26
D35
TCK
3
NC/SA*
D18
D19
Q19
Q20
D21
Q22
VDDQ
D23
Q23
D24
D25
Q25
Q26
SA
4
5
6
7
8
9
NC/SA*
D17
D16
Q16
Q15
D14
Q13
VDDQ
D12
Q12
D11
D10
Q10
Q9
10
VSS/SA*
Q17
Q7
11
CQ
Q8
D8
A
B
C
D
E
F
CQ
R/W
SA
BW2
BW3
SA
K
BW1
BW0
SA
LD
Q27
D27
D28
Q29
Q30
D30
Doff
D31
Q32
Q33
D33
D34
Q35
TDO
K
SA
VSS
VSS
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VSS
VSS
SA
SA
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
SA
C
VSS
VSS
VSS
VDD
VDD
VDD
VDD
VDD
VSS
VSS
SA
VSS
VSS
VDD
VDD
VDD
VDD
VDD
VSS
VSS
SA
VSS
D15
D6
D7
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VSS
Q6
Q5
D5
Q14
D13
VREF
Q4
G
H
J
ZQ
D4
K
L
D3
Q3
Q2
D2
Q11
Q1
M
N
P
R
VSS
D9
D1
SA
SA
SA
D0
Q0
TDI
SA
SA
C
SA
SA
SA
TMS
Notes : 1. * Checked No Connect(NC) pins are reserved for higher density address, i.e. 3A for 72Mb, 9A for 36Mb, 10A for 144Mb and 2A for 288Mb.
2. BW0 controls write to D0:D8, BW1 controls write to D9:D17, BW2 controls write to D18:D26 and BW3 controls write to D27:D35.
PIN NAME
SYMBOL
K, K
PIN NUMBERS
DESCRIPTION
Input Clock
NOTE
6B, 6A
C, C
6P, 6R
Input Clock for Output Data
Output Echo Clock
DLL Disable when low
Address Inputs
1
CQ, CQ
Doff
11A, 1A
1H
SA
4B,8B,5C-7C,5N-7N,4P,5P,7P,8P,3R-5R,7R-9R
10P,11N,11M,10K,11J,11G,10E,11D,11C,10N,9M,9L
9J,10G,9F,10D,9C,9B,3B,3C,2D,3F,2G,3J,3L,3M,2N
1C,1D,2E,1G,1J,2K,1M,1N,2P
D0-35
Q0-35
Data Inputs
11P,10M,11L,11K,10J,11F,11E,10C,11B,9P,9N,10L
9K,9G,10F,9E,9D,10B,2B,3D,3E,2F,3G,3K,2L,3N
3P,1B,2C,1E,1F,2J,1K,1L,2M,1P
Data Outputs
Read, Write Control Pin, Read active
when high
R/W
LD
4A
8A
Synchronous Load Pin, bus Cycle
sequence is to be defined when low
BW0, BW1,BW2, BW3
7B,7A,5A,5B
Block Write Control Pin,active when low
Input Reference Voltage
VREF
ZQ
2H,10H
11H
Output Driver Impedance Control Input
Power Supply ( 1.8 V )
2
VDD
5F,7F,5G,7G,5H,7H,5J,7J,5K,7K
4E,8E,4F,8F,4G,8G,3H,4H,8H,9H,4J,8J,4K,8K,4L,8L
VDDQ
Output Power Supply ( 1.5V or 1.8V )
2A,10A,4C,8C,4D-8D,5E-7E,6F,6G,6H,6J,6K,5L-7L,4M,
8M,4N,8N
VSS
Ground
TMS
TDI
10R
11R
2R
JTAG Test Mode Select
JTAG Test Data Input
JTAG Test Clock
TCK
TDO
NC
1R
JTAG Test Data Output
No Connect
3A, 9A
3
Notes: 1. C, C, K or K cannot be set to VREF voltage.
2. When ZQ pin is directly connected to VDD output impedance is set to minimum value and it cannot be connected to ground or left unconnected.
3. Not connected to chip pad internally.
June. 2003
Rev 0.5
- 3 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
PIN CONFIGURATIONS(TOP VIEW) K7J161882B(1Mx18)
1
CQ
NC
NC
NC
NC
NC
NC
Doff
NC
NC
NC
NC
NC
NC
TDO
2
VSS/SA*
Q9
3
NC/SA*
D9
4
5
6
7
8
9
SA
NC
NC
NC
NC
NC
NC
VDDQ
NC
NC
NC
NC
NC
NC
SA
10
VSS/SA*
NC
11
CQ
Q8
D8
A
B
C
D
E
F
R/W
SA
BW1
NC
SA
K
NC
BW0
SA
LD
K
SA
NC
D10
Q10
Q11
D12
Q13
VDDQ
D14
Q14
D15
D16
Q16
Q17
SA
VSS
VSS
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VSS
VSS
SA
SA
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
SA
C
VSS
Q7
D11
NC
VSS
VSS
VDD
VDD
VDD
VDD
VDD
VSS
VSS
SA
VSS
VSS
VDD
VDD
VDD
VDD
VDD
VSS
VSS
SA
VSS
NC
D7
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VSS
D6
Q6
Q5
D5
Q12
D13
VREF
NC
NC
G
H
J
NC
VREF
Q4
ZQ
D4
K
L
NC
D3
Q3
Q2
D2
Q15
NC
NC
M
N
P
R
Q1
D17
NC
VSS
NC
D1
SA
SA
SA
D0
Q0
TDI
TCK
SA
SA
C
SA
SA
TMS
Notes: 1. * Checked No Connect(NC) pins are reserved for higher density address, i.e. 3A for 36Mb, 10A for 72Mb and 2A for 144Mb.
2. BW0 controls write to D0:D8 and BW1 controls write to D9:D17.
PIN NAME
SYMBOL
K, K
PIN NUMBERS
DESCRIPTION
Input Clock
NOTE
6B, 6A
C, C
6P, 6R
Input Clock for Output Data
Output Echo Clock
DLL Disable when low
Address Inputs
1
CQ, CQ
Doff
11A, 1A
1H
SA
9A,4B,8B,5C-7C,5N-7N,4P,5P,7P,8P,3R-5R,7R-9R
10P,11N,11M,10K,11J,11G,10E,11D,11C,3B,3C,2D,
3F,2G,3J,3L,3M,2N
D0-17
Q0-17
R/W
Data Inputs
11P,10M,11L,11K,10J,11F,11E,10C,11B,2B,3D,3E,
2F,3G,3K,2L,3N,3P
Data Outputs
Read, Write Control Pin, Read active
when high
4A
8A
Synchronous Load Pin, bus Cycle
sequence is to be defined when low
LD
BW0, BW1
VREF
7B, 5A
Block Write Control Pin,active when low
Input Reference Voltage
2H,10H
11H
ZQ
Output Driver Impedance Control Input
Power Supply ( 1.8 V )
2
VDD
5F,7F,5G,7G,5H,7H,5J,7J,5K,7K
VDDQ
4E,8E,4F,8F,4G,8G,3H,4H,8H,9H,4J,8J,4K,8K,4L,8L
Output Power Supply ( 1.5V or 1.8V )
VSS
TMS
TDI
2A,10A,4C,8C,4D-8D,5E-7E,6F,6G,6H,6J,6K,5L-7L,4M-8M,4N,8N
Ground
10R
11R
2R
JTAG Test Mode Select
JTAG Test Data Input
JTAG Test Clock
TCK
TDO
1R
JTAG Test Data Output
3A,7A,1B,5B,9B,10B,1C,2C,9C,1D,9D,10D,1E,2E,9E,1F,9F,
10F,1G,9G,10G,1J,2J,9J,1K,2K,9K,1L,9L,10L,1M,2M,
9M,1N,9N,10N,1P,2P,9P
NC
No Connect
3
Notes: 1. C, C, K or K cannot be set to VREF voltage.
2. When ZQ pin is directly connected to VDD output impedance is set to minimum value and it cannot be connected to ground or left unconnected.
3. Not connected to chip pad internally.
June. 2003
Rev 0.5
- 4 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
PIN CONFIGURATIONS(TOP VIEW) K7J160882B(2Mx8)
1
CQ
NC
NC
NC
NC
NC
NC
Doff
NC
NC
NC
NC
NC
NC
TDO
2
VSS/SA*
NC
3
SA
4
5
6
7
8
9
SA
NC
NC
NC
NC
NC
NC
VDDQ
NC
NC
NC
NC
NC
NC
SA
10
Vss/SA*
NC
11
CQ
Q3
D3
A
B
C
D
E
F
R/W
SA
NW1
NC
SA
K
NC
NW 0
SA
LD
NC
NC
NC
Q4
K
SA
NC
VSS
VSS
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VSS
VSS
SA
SA
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
SA
C
VSS
NC
D4
VSS
VSS
VDD
VDD
VDD
VDD
VDD
VSS
VSS
SA
VSS
VSS
VDD
VDD
VDD
VDD
VDD
VSS
VSS
SA
VSS
NC
NC
Q2
NC
NC
ZQ
D1
NC
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VSS
D2
NC
NC
Q5
NC
G
H
J
D5
NC
VREF
NC
VDDQ
NC
NC
D6
VREF
Q1
K
L
NC
NC
NC
Q0
D0
Q6
NC
M
N
P
R
NC
NC
NC
Q7
NC
D7
VSS
NC
NC
NC
TDI
NC
SA
SA
SA
NC
TCK
SA
SA
SA
C
SA
SA
TMS
Notes: 1. * Checked No Connect(NC) pin is reserved for higher density address, i.e. 2A for 72Mb, 10A for 36Mb.
2. NW 0 controls write to D0:D3 and NW1 controls write to D4:D7.
PIN NAME
SYMBOL
K, K
PIN NUMBERS
DESCRIPTION
NOTE
6B, 6A
Input Clock
C, C
6P, 6R
Input Clock for Output Data
Output Echo Clock
DLL Disable when low
Address Inputs
1
CQ, CQ
Doff
11A, 1A
1H
SA
3A,9A,4B,8B,5C-7C,5N-7N,4P,5P,7P,8P,3R-5R,7R-9R
11M,11J,10E,11C,2D,2G,3L,2N
11L,10J,11E,11B,3E,3G,2L,3P
D0-7
Q0-7
Data Inputs
Data Outputs
Read, Write Control Pin, Read active
when high
R/W
LD
4A
8A
Synchronous Load Pin, bus Cycle
sequence is to be defined when low
NW0, NW1
VREF
ZQ
7B, 5A
Nybble Write Control Pin,active when low
Input Reference Voltage
Output Driver Impedance Control Input
Power Supply ( 1.8 V )
2H,10H
11H
2
VDD
5F,7F,5G,7G,5H,7H,5J,7J,5K,7K
VDDQ
VSS
4E,8E,4F,8F,4G,8G,3H,4H,8H,9H,4J,8J,4K,8K,4L,8L
Output Power Supply ( 1.5V or 1.8V )
Ground
2A,10A,4C,8C,4D-8D,5E-7E,6F,6G,6H,6J,6K,5L-7L,4M-8M,4N,8N
TMS
TDI
10R
11R
2R
JTAG Test Mode Select
JTAG Test Data Input
TCK
TDO
JTAG Test Clock
1R
JTAG Test Data Output
7A,1B,2B,3B,5B,9B,10B,1C,2C,3C,9C,10C,1D,3D,9D,10D,11D
1E,2E,9E,1F,2F,3F,9F,10F,11F,1G,9G,10G,11G,1J,2J,3J,9J
1K,2K,3K,10K,11K,9K,1L,9L,10L,1M,2M,3M,9M,10M,1N,3N,9N
10N,11N,1P,2P,9P,10P,11P
NC
No Connect
3
Notes: 1. C, C, K or K cannot be set to VREF voltage.
2. When ZQ pin is directly connected to VDD output impedance is set to minimum value and it cannot be connected to ground or left unconnected.
3. Not connected to chip pad internally.
June. 2003
Rev 0.5
- 5 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
GENERAL DESCRIPTION
The K7J163682B,K7J161882B and K7J160882B are 18,874,368-bits DDR Separate I/O
Synchronous Pipelined Burst SRAMs.
They are organized as 524,288 words by 36bits for K7J163682B, 1,048,576 words by 18 bits for K7J161882B and
2,097,152 words by 8bits for K7J160882B.
The DDR SIO operation is possible by supporting DDR read and write operations through separate data output and input ports.
Memory bandwidth is higher than DDR sram without separate input output as separate read and write ports
eliminate bus turn around cycle.
Address, data inputs, and all control signals are synchronized to the input clock ( K or K ).
Normally data outputs are synchronized to output clocks ( C and C ), but when C and C are tied high,
the data outputs are synchronized to the input clocks ( K and K ).
Read data are referenced to echo clock ( CQ or CQ ) outputs.
Read address and write address are registered on rising edges of the input K clocks.
Common address bus is used to access address both for read and write operations.
The internal burst counter is fiexd to 2-bit sequential for both read and write operations.
Synchronous pipeline read and late write enable high speed operations.
Simple depth expansion is accomplished by using LD for port selection.
Byte write operation is supported with BW0 and BW1 ( BW2 and BW3) pins for x18 ( x36 ) device.
Nybble write operation is supported with NW 0 and NW1 pins for x8 device.
IEEE 1149.1 serial boundary scan (JTAG) simplifies monitoriing package pads attachment status with system.
The K7J163682B,K7J161882B and K7J160882B are implemented with SAMSUNG's high performance 6T CMOS technology
and is available in 165pin FBGA packages. Multiple power and ground pins minimize ground bounce.
Read Operations
Read cycles are initiated by initiating R/W as high at the rising edge of the positive input clock K.
Address is presented and stored in the read address register synchronized with K clock.
For 2-bit burst DDR operation, it will access two 36-bit or 18-bit or 8-bit data words with each read command.
The first pipelined data is transfered out of the device triggered by C clock following next K clock rising edge.
Next burst data is triggered by the rising edge of following C clock rising edge.
Continuous read operations are initated with K clock rising edge.
And pipelined data are transferred out of device on every rising edge of both C and C clocks.
In case C and C tied to high, output data are triggered by K and K insted of C and C.
When the LD is disabled after a read operation, the K7J163682B,K7J161882B and K7J160882B will first complete
burst read operation before entering into deselect mode at the next K clock rising edge.
Then output drivers disabled automatically to high impedance state.
Echo clock operation
To assure the output tracibility, the SRAM provides the output Echo clock, pair of compliment clock CQ and CQ,
which are synchronized with internal data output.
Echo clocks run free during normal operation.
The Echo clock is triggered by internal output clock signal, and transfered to external through same structures
as output driver.
Power-Up/Power-Down Supply Voltage Sequencing
The following power-up supply voltage application is recommended: VSS, VDD, VDDQ, VREF, then VIN. VDD and VDDQ can be applied
simultaneously, as long as VDDQ does not exceed VDD by more than 0.5V during power-up. The following power-down supply voltage
removal sequence is recommended: VIN, VREF, VDDQ, VDD, VSS. VDD and VDDQ can be removed simultaneously, as long as VDDQ
does not exceed VDD by more than 0.5V during power-down.
June. 2003
Rev 0.5
- 6 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
Write Operations
Write cycles are initiated by activating R/W as low at the rising edge of the positive input clock K.
Address is presented and stored in the write address register synchronized with next K clock.
For 2-bit burst DDR operation, it will write two 36-bit or 18-bit or 8-bit data words with each write command.
The first "late writed" data is transfered and registered in to the device synchronous with next K clock rising edge.
Next burst data is transfered and registered synchronous with following K clock rising edge.
Continuous write operations are initated with K rising edge.
And "late writed" data is presented to the device on every rising edge of both K and K clocks.
When the LD is disabled, the K7J163682B,K7J161882B and K7J160882B will enter into deselect mode.
The device disregards input data presented on the same cycle W disabled.
The K7J163682B and K7J161882B support byte write operations.
With activating BW0 or BW1 ( BW2 or BW3 ) in write cycle, only one byte of input data is presented.
In K7J161882B, BW0 controls write operation to D0:D8, BW1 controls write operation to D9:D17.
And in K7J163682B BW2 controls write operation to D18:D26, BW3 controls write operation to D27:D35.
The the K7J160882B support nybble write operations.
In K7J160882B, NW 0 controls write operation to D0:D3, NW1 controls write operation to D4:D7.
Programmable Impedance Output Buffer Operation
The designer can program the SRAM's output buffer impedance by terminating the ZQ pin to VSS through a precision resistor(RQ).
The value of RQ (within 15%) is five times the output impedance desired.
For example, 250W resistor will give an output impedance of 50W.
Impedance updates occur early in cycles that do not activate the outputs, such as deselect cycles.
In all cases impedance updates are transparent to the user and do not produce access time "push-outs" or other anomalous behav-
ior in the SRAM.
There are no power up requirements for the SRAM. However, to guarantee optimum output driver impedance after power up, the
SRAM needs 1024 non-read cycles.
Clock Consideration
K7J163682B,K7J161882B and K7J160882B utlizes internal DLL(Delay-Locked Loops) for maximum output data valid window.
It can be placed into a stopped-clock state to minimize power with a modest restart time of 1024 clock cycles.
Circuitry automatically resets the DLL when absence of input clock is detected.
Single Clock Mode
K7J163682B,K7J161882B and K7J160882B can be operated with the single clock pair K and K,
insted of C or C for output clocks.
To operate these devices in single clock mode, C and C must be tied high during power up and must be maintained high
during operation.
After power up, this device can¢t change to or from single clock mode.
System flight time and clock skew could not be compensated in this mode.
Depth Expansion
Separate input and output ports enables easy depth expansion.
Each port can be selected and deselected independently with R/W be shared among all SRAMs and provide a new LD signal
for each bank.
Before chip deselected, all read and write pending operations are completed.
June. 2003
Rev 0.5
- 7 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
STATE DIAGRAM
POWER-UP
LOAD
NOP
LOAD
LOAD NEW ADDRESS
LOAD
LOAD
READ
WRITE
LOAD
LOAD
DDR READ
DDR WRITE
Notes: 1. Internal burst counter is fixed as 2-bit linear, i.e. when first address is A0+0, next internal burst address is A0+1.
2. "LOAD" refers to read new address active status with LD=Low, "LOAD" refers to read new address inactive status with LD=High.
3. "READ" refers to read active read status with R/W=High, "WRITE" refers to write active status with R/W=Low
June. 2003
Rev 0.5
- 8 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
TRUTH TABLES
SYNCHRONOUS TRUTH TABLE
D
Q
K
LD
R/W
OPERATION
D(A0)
Previous state
X
D(A1)
Previous state
X
Q(A0)
Previous state
High-Z
Q(A1)
Previous state
High-Z
Stopped
X
H
X
X
Clock Stop
•
No Operation
•
•
H
L
X
X
DOUT at C(t+1)
High-Z
DOUT at C(t+2)
High-Z
Read
Write
L
L
Din at K(t+1)
Din at K(t+1)
Notes: 1. X means "Don¢t Care".
2. The rising edge of clock is symbolized by ( • ).
3. Before enter into clock stop status, all pending read and write operations will be completed.
WRITE TRUTH TABLE(x18)
K
K
BW0
L
BW1
L
OPERATION
•
WRITE ALL BYTEs ( K• )
WRITE ALL BYTEs ( K• )
WRITE BYTE 0 ( K• )
WRITE BYTE 0 ( K• )
WRITE BYTE 1 ( K• )
WRITE BYTE 1 ( K• )
WRITE NOTHING ( K• )
WRITE NOTHING ( K• )
•
L
L
•
•
•
L
H
•
L
H
H
L
•
H
L
H
H
•
H
H
Notes: 1. X means "Don¢t Care".
2. All inputs in this table must meet setup and hold time around the rising edge of input clock K or K ( • ).
3. Assumes a WRITE cycle was initiated.
4. This table illustates operation for x18 devices. x8 device operation is similar except that NW0 controls D0:D3 and NW 0 controls D4:D7.
WRITE TRUTH TABLE(x36)
K
K
BW0
L
BW 1
L
BW2
L
BW 3
L
OPERATION
WRITE ALL BYTEs ( K • )
WRITE ALL BYTEs ( K• )
WRITE BYTE 0 ( K• )
•
•
L
L
L
L
•
•
•
•
L
H
H
H
H
H
L
H
•
L
H
H
WRITE BYTE 0 ( K• )
H
H
H
H
H
H
L
H
WRITE BYTE 1 ( K• )
•
L
H
WRITE BYTE 1 ( K• )
H
L
WRITE BYTE 2 and BYTE 3 ( K• )
WRITE BYTE 2 and BYTE 3 ( K• )
WRITE NOTHING ( K• )
WRITE NOTHING ( K• )
•
H
L
L
H
H
H
H
•
H
H
Notes: 1. X means "Don¢t Care".
2. All inputs in this table must meet setup and hold time around the rising edge of input clock K or K ( • ).
3. Assumes a WRITE cycle was initiated.
June. 2003
Rev 0.5
- 9 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
ABSOLUTE MAXIMUM RATINGS*
PARAMETER
Voltage on VDD Supply Relative to VSS
Voltage on VDDQ Supply Relative to VSS
Voltage on Input Pin Relative to VSS
Storage Temperature
SYMBOL
VDD
RATING
-0.5 to 2.9
-0.5 to VDD
-0.5 to VDD+0.3
-65 to 150
0 to 70
UNIT
V
VDDQ
VIN
V
V
TSTG
°C
°C
°C
Operating Temperature
TOPR
TBIAS
Storage Temperature Range Under Bias
-10 to 85
*Note: 1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. VDDQ must not exceed VDD during normal operation.
DC ELECTRICAL CHARACTERISTICS(VDD=1.8V ±0.1V, TA=0°C to +70°C)
PARAMETER
Input Leakage Current
Output Leakage Current
SYMBOL
TEST CONDITIONS
VDD=Max ; VIN=VSS to VDDQ
Output Disabled,
MIN
MAX
+2
UNIT NOTE
IIL
-2
-2
-
mA
mA
IOL
+2
-30
-25
-20
-16
-30
-25
-20
-16
-30
-25
-20
-16
-30
-25
-20
-16
600
-
550
VDD=Max , IOUT=0mA
Operating Current
(x36) : DDR
ICC
ICC
ICC
ISB1
mA
mA
mA
mA
1,5
1,5
1,5
1,6
Cycle Time ³ tKHKH Min
-
500
450
-
-
-
500
450
VDD=Max , IOUT=0mA
Operating Current
(x18) : DDR
Cycle Time ³ tKHKH Min
400
350
-
-
-
480
430
VDD=Max , IOUT=0mA
Operating Current
(x8) : DDR
Cycle Time ³ tKHKH Min
380
330
-
200
Device deselected,
-
180
IOUT=0mA, f=Max,
Standby Current(NOP): DDR
-
160
All Inputs£0.2V or ³ V DD-0.2V
-
140
Output High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Input Low Voltage
Input High Voltage
VOH1
VOL1
VOH2
VOL2
VIL
VDDQ /2-0.12
VDDQ /2-0.12
VDDQ-0.2
VSS
VDDQ/2+0.12
VDDQ/2+0.12
VDDQ
0.2
V
V
V
V
V
V
2,7
3,7
4
IOH=-1.0mA
IOL=1.0mA
4
-0.3
VREF-0.1
VDDQ +0.3
8,9
8,10
VIH
VREF+0.1
Notes: 1. Minimum cycle. IOUT=0mA.
2. |IOH|=(VDDQ/2)/(RQ/5)±15% for 175W £ RQ £ 350W.
3. |IOL|=(VDDQ/2)/(RQ/5)±15% for 175W £ RQ £ 350W.
4. Minimum Impedance Mode when ZQ pin is connected to VDDQ .
5. Operating current is calculated with 50% read cycles and 50% write cycles.
6. Standby Current is only after all pending read and write burst opeactions are completed.
7. Programmable Impedance Mode.
8. These are DC test criteria. DC design criteria is VREF±50mV. The AC VIH/VIL levels are defined separately for measuring
timing parameters.
9. VIL (Min)DC=-0.3V, VIL (Min)AC=-1.5V(pulse width £ 3ns).
10. VIH (Max)DC=VDDQ +0.3, VIH (Max)AC=VDDQ +0.85V(pulse width £ 3ns).
June. 2003
Rev 0.5
- 10 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
AC ELECTRICAL CHARACTERISTICS (VDD=1.8V ±0.1V, TA=0°C to +70°C)
PARAMETER
Input High Voltage
Input Low Voltage
MAX
UNIT
NOTES
1,2
SYMBOL
VIH (AC)
VIL (AC)
MIN
VREF + 0.2
-
-
V
V
VREF - 0.2
1,2
Notes: 1. This condition is for AC function test only, not for AC parameter test.
2. To maintain a valid level, the transitioning edge of the input must :
a) Sustain a constant slew rate from the current AC level through the target AC level, VIL(AC) or VIH(AC)
b) Reach at least the target AC level
c) After the AC target level is reached, continue to maintain at least the target DC level, VIL(DC) or VIH(DC)
Overershoot Timing
Undershoot Timing
20% tKHKH(MIN)
VIH
VDDQ+0.5V
VDDQ+0.25V
VDDQ
VSS
VSS-0.25V
VSS-0.5V
20% tKHKH(MIN)
VIL
Note: For power-up, VIH £ VDDQ+0.3V and VDD £ 1.7V and VDDQ £ 1.4V t £ 200ms
OPERATING CONDITIONS (0°C £ TA £ 70°C)
PARAMETER
SYMBOL
MIN
1.7
1.4
0.68
0
MAX
1.9
1.9
0.95
0
UNIT
VDD
V
V
V
V
Supply Voltage
VDDQ
VREF
VSS
Reference Voltage
Ground
AC TEST CONDITIONS
Parameter
Symbol
VDD
Value
1.7~1.9
1.4~1.9
1.25/0.25
0.75
Unit
V
AC TEST OUTPUT LOAD
Core Power Supply Voltage
Output Power Supply Voltage
Input High/Low Level
VDDQ
VIH/VIL
VREF
V
0.75V
VREF
VDDQ/2
V
Input Reference Level
V
50W
SRAM
Zo=50W
Input Rise/Fall Time
TR/TF
0.3/0.3
VDDQ/2
ns
V
Output Timing Reference Level
250W
ZQ
Note: Parameters are tested with RQ=250W
June. 2003
Rev 0.5
- 11 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
AC TIMING CHARACTERISTICS(VDD=1.8V±0.1V, TA=0°C to +70°C)
-30
-25
-20
-16
PARAMETER
SYMBOL
UNIT NOTE
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
Clock
Clock Cycle Time (K, K, C, C)
Clock Phase Jitter (K, K, C, C)
Clock High Time (K, K, C, C)
Clock Low Time (K, K, C, C)
Clock toClock (K• ® K• , C• ® C• )
Clock to data clock (K• ® C• , K• ® C• )
DLL Lock Time (K, C)
tKHKH
tKC var
tKHKL
3.30
5.25
0.20
4.00
6.30
0.20
5.00
7.88
0.20
6.00
8.40
0.20
ns
ns
ns
5
6
1.32
1.32
1.49
0.00
1024
30
1.60
1.60
1.80
0.00
1024
30
2.00
2.00
2.20
0.00
1024
30
2.40
2.40
2.70
0.00
1024
30
tKLKH
ns
tKHKH
tKHCH
tKC lock
tKC reset
ns
1.45
1.80
2.30
2.80
ns
cycle
ns
K Static to DLL reset
Output Times
C, C High to Output Valid
C, C High to Output Hold
C, C High to Echo Clock Valid
C, C High to Echo Clock Hold
CQ, CQ High to Output Valid
CQ, CQ High to Output Hold
C, High to Output High-Z
C, High to Output Low-Z
Setup Times
tCHQV
tCHQX
0.45
0.45
0.27
0.45
0.45
0.45
0.30
0.45
0.45
0.45
0.35
0.45
0.50
0.50
0.40
0.50
ns
ns
ns
ns
ns
ns
ns
ns
3
3
-0.45
-0.45
-0.27
-0.45
-0.45
-0.45
-0.30
-0.45
-0.45
-0.45
-0.35
-0.45
-0.50
-0.50
-0.40
-0.50
tCHCQV
tCHCQX
tCQHQV
tCQHQX
tCHQZ
7
7
3
3
tCHQX1
Address valid to K rising edge
Control inputs valid to K rising edge
Data-in valid to K, K rising edge
Hold Times
tAVKH
tIVKH
tDVKH
0.40
0.40
0.30
0.50
0.50
0.35
0.60
0.60
0.40
0.70
0.70
0.50
ns
ns
ns
2
K rising edge to address hold
K rising edge to control inputs hold
K, K rising edge to data-in hold
tKHAX
tKHIX
0.40
0.40
0.30
0.50
0.50
0.35
0.60
0.60
0.40
0.70
0.70
0.50
ns
ns
ns
tKHDX
Notes: 1. All address inputs must meet the specified setup and hold times for all latching clock edges.
2. Control singles are R, W,BW0,BW1 and (NW0, NW1, for x8) and (BW2, BW3, also for x36)
3. If C,C are tied high, K,K become the references for C,C timing parameters.
4. To avoid bus contention, at a given voltage and temperature tCHQX1 is bigger than tCHQZ.
The specs as shown do not imply bus contention beacuse tCHQX1 is a MIN parameter that is worst case at totally different test conditions
(0°C, 1.9V) than tCHQZ, which is a MAX parameter(worst case at 70°C, 1.7V)
It is not possible for two SRAMs on the same board to be at such different voltage and temperature.
5. Clock phase jitter is the variance from clock rising edge to the next expected clock rising edge.
6. Vdd slew rate must be less than 0.1V DC per 50 ns for DLL lock retention. DLL lock time begins once Vdd and input clock are stable.
7. Echo clock is very tightly controlled to data valid/data hold. By design, there is a ± 0.1ns variation from echo clock to data.
The data sheet parameters reflect tester guardbands and test setup variations.
June. 2003
Rev 0.5
- 12 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
PIN CAPACITANCE
PRMETER
Address Control Input Capacitance
Input and Output Capacitance
Clock Capacitance
SYMBOL
CIN
TESTCONDITION
Typ
4
MAX
Unit
pF
NOTES
VIN=0V
VOUT=0V
-
5
7
6
COUT
6
pF
CCLK
5
pF
Note: 1. Parameters are tested with RQ=250Wand VDDQ=1.5V.
2. Periodically sampled and not 100% tested.
THERMAL RESISTANCE
PRMETER
Junction to Ambient
SYMBOL
TYP
TBD
TBD
TBD
Unit
NOTES
qJA
qJC
qJB
°C/W
°C/W
°C/W
Junction to Case
Junction to Pins
Note: Junction temperature is a function of on-chip power dissipation, package thermal impedance, mounting site temperature and mounting site
thermal impedance. TJ=TA + PD x qJA
APPLICATION INRORMATION
2Mx18
SRAM#1
SRAM#4
R=250W
R=250W
ZQ
ZQ
Vt
Q0-17
Q0-17
D0-17
SA
D0-17
SA
R/W LD0BW0 BW1C C K K
R/WLD3BW0BW1 C C K K
R
Data In 0-71
Data Out 0-71
Address 0-65
R/W
Vt
Vt
R
LD0-3
BW0-7
MEMORY
CONTROLLER
Return CLK
Vt
Vt
Source CLK
Return CLK
Source CLK
R=50W Vt=VREF
June. 2003
Rev 0.5
- 13 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
TIMING WAVE FORMS OF READ,WRITE AND NOP
NOP
READ
(burst of 2)
READ
(burst of 2)
WRITE
(burst of 2)
WRITE
(burst of 2)
READ
(burst of 2)
NOP
NOP
1
2
3
4
5
6
7
8
K
tKHKL tKLKH
tKHKH
tKHKH
K
LD
R/W
A
tIVKH
tKHIX
A1
A2
A3
A4
A5
tAVKH
tKHAX
tKHDX
tDVKH
tKHDX
tDVKH
D3-1 D3-2 D4-1 D4-2
D
Qxx
Q1-1 Q1-2
Q2-1 Q2-2
Q5-1 Q5-2
Q
tKHCH
tCHQV
tCHQV
tCQ HQV
tCHQX
tCHQZ
tKHCH
tCHQX1
tCHQX
C
tKHKL tKLKH
tKHKH
tKHKH
C
tCHCQV
tCHCQX
CQ
CQ
tCHCQV
tCHCQX
Note: 1. Q1-1 refers to output from address A1+0, Q1-2 refers to output from address A1+1 i.e. the next internal burst address following A1+0.
2. Outputs are disabled one cycle after a NOP.
3. D3-1 refers to input to address A3+0, D3-2 refers to input to address A3+1, i.e the next internal burst address following A3+0.
4. If address A4=A5, data Q5-1=D4-1, data Q5-2=D4-2.
Write data is forwarded immediately as read results.
June. 2003
Rev 0.5
- 14 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
IEEE 1149.1 TEST ACCESS PORT AND BOUNDARY SCAN-JTAG
This part contains an IEEE standard 1149.1 Compatible Test Access Port(TAP). The package pads are monitored by the Serial Scan
circuitry when in test mode. This is to support connectivity testing during manufacturing and system diagnostics. Internal data is not
driven out of the SRAM under JTAG control. In conformance with IEEE 1149.1, the SRAM contains a TAP controller, Instruction Reg-
ister, Bypass Register and ID register. The TAP controller has a standard 16-state machine that resets internally upon power-up,
therefore, TRST signal is not required. It is possible to use this device without utilizing the TAP. To disable the TAP controller without
interfacing with normal operation of the SRAM, TCK must be tied to VSS to preclude mid level input. TMS and TDI are designed so an
undriven input will produce a response identical to the application of a logic 1, and may be left unconnected. But they may also be
tied to VDD through a resistor. TDO should be left unconnected.
JTAG Block Diagram
JTAG Instruction Coding
IR2 IR1 IR0 Instruction
TDO Output
Notes
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
EXTEST
Boundary Scan Register
Identification Register
Boundary Scan Register
1
3
2
6
5
6
6
4
IDCODE
SAMPLE-Z
RESERVED Do Not Use
A,D
K,K
C,C
SAMPLE
Boundary Scan Register
RESERVED Do Not Use
RESERVED Do Not Use
SRAM
CORE
Q
CQ
BYPASS
Bypass Register
CQ
NOTE :
1. Places DQs in Hi-Z in order to sample all input data regardless of other
SRAM inputs. This instruction is not IEEE 1149.1 compliant.
TDI
BYPASS Reg.
TDO
2. Places DQs in Hi-Z in order to sample all input data regardless of other
SRAM inputs.
Identification Reg.
Instruction Reg.
3. TDI is sampled as an input to the first ID register to allow for the serial shift
of the external TDI data.
4. Bypass register is initiated to VSS when BYPASS instruction is invoked. The
Bypass Register also holds serially loaded TDI when exiting the Shift DR
states.
Control Signals
TAP Controller
TMS
TCK
5. SAMPLE instruction dose not places DQs in Hi-Z.
6. This instruction is reserved for future use.
TAP Controller State Diagram
1
0
Test Logic Reset
0
1
1
0
1
Run Test Idle
Select DR
0
Select IR
0
1
1
1
1
Capture DR
0
Capture IR
0
0
Shift DR
1
Shift IR
1
Exit1 DR
0
Exit1 IR
0
0
0
0
0
Pause DR
1
Pause IR
1
Exit2 DR
1
Exit2 IR
1
1
0
Update DR
0
Update IR
1
June. 2003
Rev 0.5
- 15 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
SCAN REGISTER DEFINITION
Part
512Kx36
1Mx18
2Mx8
Instruction Register
Bypass Register
ID Register
32 bits
Boundary Scan
107 bits
3 bits
3 bits
3 bits
1 bit
1 bit
1 bit
32 bits
107 bits
32 bits
107 bits
ID REGISTER DEFINITION
Revision Number
Part Configuration
(28:12)
Samsung JEDEC Code
(11: 1)
Part
Start Bit(0)
(31:29)
512Kx36
1Mx18
000
00def0wx0t0q0b0s0
00def0wx0t0q0b0s0
00def0wx0t0q0b0s0
00001001110
00001001110
00001001110
1
1
1
000
2Mx8
000
Note : Part Configuration
/def=001 for 18Mb, /wx=11 for x36, 10 for x18, 01 for x8
/t=1 for DLL Ver., 0 for non-DLL Ver. /q=1 for QDR, 0 for DDR /b=1 for 4Bit Burst, 0 for 2Bit Burst /s=1 for Separate I/O, 0 for Common I/O
BOUNDARY SCAN EXIT ORDER
ORDER
PIN ID
ORDER
PIN ID
ORDER
73
PIN ID
2C
3E
2D
2E
1E
2F
3F
1G
1F
3G
2G
1J
1
6R
6P
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
10D
9E
74
2
75
3
6N
10C
11D
9C
76
4
7P
77
5
7N
78
6
7R
9D
79
7
8R
11B
11C
9B
80
8
8P
81
9
9R
82
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
11P
10P
10N
9P
10B
11A
Internal
9A
83
84
85
2J
86
3K
3J
10M
11N
9M
8B
87
7C
88
2K
1K
2L
6C
89
9N
8A
90
11L
11M
9L
7A
91
3L
7B
92
1M
1L
6B
93
10L
11K
10K
9J
6A
94
3N
3M
1N
2M
3P
2N
2P
1P
3R
4R
4P
5P
5N
5R
5B
95
5A
96
4A
97
9K
5C
98
10J
11J
11H
10G
9G
4B
99
3A
100
101
102
103
104
105
106
107
1H
1A
2B
11F
11G
9F
3B
1C
1B
10F
11E
10E
3D
3C
1D
Note: 1. NC pins are read as "X" ( i.e. don¢t care.)
June. 2003
Rev 0.5
- 16 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
JTAG DC OPERATING CONDITIONS
Parameter
Power Supply Voltage
Symbol
Min
1.7
Typ
Max
1.9
Unit
V
Note
VDD
VIH
VIL
1.8
Input High Level
1.3
-
-
-
-
VDD+0.3
0.5
V
Input Low Level
-0.3
1.4
V
Output High Voltage(IOH=-2mA)
Output Low Voltage(IOL=2mA)
VOH
VOL
VDD
V
VSS
0.4
V
Note: 1. The input level of SRAM pin is to follow the SRAM DC specification.
JTAG AC TEST CONDITIONS
Parameter
Input High/Low Level
Symbol
VIH/VIL
TR/TF
Min
1.3/0.5
1.0/1.0
0.9
Unit
V
Note
Input Rise/Fall Time
ns
V
Input and Output Timing Reference Level
Note: 1. See SRAM AC test output load on page 11.
1
JTAG AC Characteristics
Parameter
TCK Cycle Time
Symbol
Min
50
20
20
5
Max
Unit
Note
tCHCH
tCHCL
tCLCH
tMVCH
tCHMX
tDVCH
tCHDX
tSVCH
tCHSX
tCLQV
-
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
TCK High Pulse Width
TCK Low Pulse Width
TMS Input Setup Time
TMS Input Hold Time
TDI Input Setup Time
TDI Input Hold Time
-
-
5
-
5
-
5
-
SRAM Input Setup Time
SRAM Input Hold Time
Clock Low to Output Valid
5
-
5
-
0
10
JTAG TIMING DIAGRAM
TCK
tCHCH
tCHCL
tCLCH
tMVCH
tCHMX
TMS
TDI
tDVCH
tSVCH
tCHDX
tCHSX
PI
(SRAM)
tCLQV
TDO
June. 2003
Rev 0.5
- 17 -
K7J163682B
K7J161882B
K7J160882B
Preliminary
512Kx36 & 1Mx18 & 2Mx8 DDR II SIO b2 SRAM
165 FBGA PACKAGE DIMENSIONS
13mm x 15mm Body, 1.0mm Bump Pitch, 11x15 Ball Array
B
Top View
A
C
Side View
D
A
G
E
B
F
Bottom View
H Æ
E
Symbol
Value
13 ± 0.1
15 ± 0.1
1.3 ± 0.1
0.35 ± 0.05
Units
Note
Symbol
Value
1.0
Units
mm
Note
A
B
C
D
mm
mm
mm
mm
E
F
14.0
mm
G
H
10.0
mm
0.5 ± 0.05
mm
June. 2003
Rev 0.5
- 18 -
相关型号:
K7J161882B-EC160
DDR SRAM, 1MX18, 0.5ns, CMOS, PBGA165, 13 X 15 MM, 1 MM PITCH, ROHS COMPLIANT, FBGA-165
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