K6T4016U3C
更新时间:2024-09-18 02:01:02
品牌:SAMSUNG
描述:256Kx16 bit Low Power and Low Voltage CMOS Static RAM
K6T4016U3C 概述
256Kx16 bit Low Power and Low Voltage CMOS Static RAM 256Kx16位低功耗和低电压CMOS静态RAM
K6T4016U3C 数据手册
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PDF下载K6T4016V3C, K6T4016U3C Family
CMOS SRAM
Document Title
256Kx16 bit Low Power and Low Voltage CMOS Static RAM
Revision History
Revision No History
Draft Date
Remark
0.0
Initial draft
January 13, 1998
Advance
0.1
Revise
June 12, 1998
Preliminary
- Speed bin change
Commercial: 70/85ns to 70/85/100ns
Industrial: 85/100ns to 70/85/100ns
- DC Characteristics change
ICC: 5mA at read/write to 4mA at read
ICC1: 5mA to 6mA
ICC2: 50mA to 45mA
ISB: 0.5mA to 0.3mA
ISB1: 10mA to 15mA for commercial parts
0.11
1.0
Errata correction
Finalize
August 13, 1998
November 16, 1998
June 26, 2001
Final
Final
2.0
Revise
- Add K6T4016V3C-TB55 product
2.01
Revise
October 15, 2001
Final
- Improved VOH(output high voltage) from 2.2V to 2.4V.
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.
1
Revision 2.01
October 2001
K6T4016V3C, K6T4016U3C Family
CMOS SRAM
256Kx16 bit Low Power and Low Voltage CMOS Static RAM
FEATURES
GENERAL DESCRIPTION
· Process Technology: TFT
· Organization: 256K x16
The K6T4016V3C and K6T4016U3C families are fabricated by
SAMSUNG¢s advanced CMOS process technology. The fami-
lies support various operating temperature ranges and have
various package types for user flexibility of system design. The
families also support low data retention voltage for battery
back-up operation with low data retention current.
· Power Supply Voltage
K6T4016V3C Family: 3.0~3.6V
K6T4016U3C Family: 2.7~3.3V
· Low Data Retention Voltage: 2V(Min)
· Three State Outputs
· Package Type: 44-TSOP2-400F/R
PRODUCT FAMILY
Power Dissipation
Product Family
Operating Temperature Vcc Range
Speed(ns)
PKG Type
Standby
(ISB1, Max)
Operating
(ICC2, Max)
551)/701)/85/100
701)/85/100
K6T4016V3C-B
K6T4016U3C-B
K6T4016V3C-F
K6T4016U3C-F
3.0~3.6V
2.7~3.3V
3.0~3.6V
2.7~3.3V
Commercial(0~70°C)
Industrial(-40~85°C)
15mA
20mA
45mA
44-TSOP2-400F/R
1. The parameter is measured with 30pF test load.
PIN DESCRIPTION
FUNCTIONAL BLOCK DIAGRAM
A4
A3
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
1
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
1
2
A4
A5
A5
A6
Clk gen.
Precharge circuit.
2
A3
A6
A2
3
3
A2
A7
A7
A1
A0
4
4
A1
OE
OE
A0
Vcc
Vss
5
5
UB
A0
UB
A1
CS
6
6
LB
CS
LB
A2
I/OI
I/O2
I/O3
I/O4
Vcc
Vss
I/O5
I/O6
I/O7
I/O8
WE
A17
A16
A15
A14
A13
7
I/O16
I/O15
I/O14
I/O13
Vss
Vcc
I/O12
I/O11
I/O10
I/O9
NC
7
I/OI
I/O2
I/O3
I/O4
Vcc
Vss
I/O5
I/O6
I/O7
I/O8
WE
A17
A16
A15
A14
A13
I/O16
I/O15
I/O14
I/O13
Vss
8
8
A3
9
9
Memory array
1024 rows
256´ 16 columns
A4
Row
select
10
11
12
13
14
15
16
17
18
19
20
21
22
10
11
A13
A14
A15
A16
A17
44-TSOP2
Forward
44-TSOP2
Reverse
12
13
14
15
16
17
18
19
20
21
22
Vcc
I/O12
I/O11
I/O10
I/O9
NC
A8
A8
I/O Circuit
Column select
Data
cont
I/O1~I/O8
A9
A9
A10
A11
A12
A10
A11
A12
Data
cont
I/O9~I/O16
Data
cont
Name
CS
Function
Chip Select Input
Name Function
A5 A6 A7 A8 A9 A10A11A12
Vcc Power
OE
Output Enable Input Vss Ground
WE
Write Enable Input
Address Inputs
LB
UB
NC
Lower Byte (I/O1~8)
Upper Byte (I/O9~16)
No Connection
WE
OE
UB
LB
A0~A17
Control
logic
I/O1~I/O16 Data Input/Output
CS
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
2
Revision 2.01
October 2001
K6T4016V3C, K6T4016U3C Family
CMOS SRAM
PRODUCT LIST
Commercial Temperature Product(0~70°C)
Industrial Temperature Products(-40~85°C)
Part Name
Function
Part Name
Function
K6T4016V3C-TB55
K6T4016V3C-TB70
K6T4016V3C-TB85
K6T4016V3C-TB10
K6T4016V3C-RB70
K6T4016V3C-RB85
K6T4016V3C-RB10
44-TSOP2-F, 55ns, 3.3V, LL
44-TSOP2-F, 70ns, 3.3V, LL
44-TSOP2-F, 85ns, 3.3V, LL
44-TSOP2-F, 100ns, 3.3V, LL
44-TSOP2-R, 70ns, 3.3V, LL
44-TSOP2-R, 85ns, 3.3V, LL
44-TSOP2-R, 100ns, 3.3V, LL
K6T4016V3C-TF70
K6T4016V3C-TF85
K6T4016V3C-TF10
K6T4016V3C-RF70
K6T4016V3C-RF85
K6T4016V3C-RF10
44-TSOP2-F, 70ns, 3.3V, LL
44-TSOP2-F, 85ns, 3.3V, LL
44-TSOP2-F, 100ns, 3.3V, LL
44-TSOP2-R, 70ns, 3.3V, LL
44-TSOP2-R, 85ns, 3.3V, LL
44-TSOP2-R, 100ns, 3.3V, LL
K6T4016U3C-TF70
K6T4016U3C-TF85
K6T4016U3C-TF10
K6T4016U3C-RF70
K6T4016U3C-RF85
K6T4016U3C-RF10
44-TSOP2-F, 70ns, 3.0V, LL
44-TSOP2-F, 85ns, 3.0V, LL
44-TSOP2-F, 100ns, 3.0V, LL
44-TSOP2-R, 70ns, 3.0V, LL
44-TSOP2-R, 85ns, 3.0V, LL
44-TSOP2-R, 100ns, 3.0V, LL
K6T4016U3C-TB70
K6T4016U3C-TB85
K6T4016U3C-TB10
K6T4016U3C-RB70
K6T4016U3C-RB85
K6T4016U3C-RB10
44-TSOP2-F, 70ns, 3.0V, LL
44-TSOP2-F, 85ns, 3.0V, LL
44-TSOP2-F, 100ns, 3.0V, LL
44-TSOP2-R, 70ns, 3.0V, LL
44-TSOP2-R, 85ns, 3.0V, LL
44-TSOP2-R, 100ns, 3.0V, LL
FUNCTIONAL DESCRIPTION
CS
H
L
OE
X1)
H
WE
X1)
H
LB
X1)
X1)
H
UB
X1)
X1)
H
I/O1~8
High-Z
High-Z
High-Z
Dout
I/O9~16
High-Z
High-Z
High-Z
High-Z
Dout
Mode
Power
Standby
Active
Active
Active
Active
Active
Active
Active
Active
Deselected
Output Disabled
Output Disabled
Lower Byte Read
Upper Byte Read
Word Read
X1)
L
X1)
H
L
L
L
H
L
L
H
H
L
High-Z
Dout
L
L
H
L
L
Dout
X1)
X1)
X1)
L
L
L
H
Din
High-Z
Din
Lower Byte Write
Upper Byte Write
Word Write
L
L
H
L
High-Z
Din
L
L
L
L
Din
1. X means don¢t care. (Must be in low or high state)
ABSOLUTE MAXIMUM RATINGS1)
Item
Symbol
VIN,VOUT
VCC
Ratings
Unit
Remark
Voltage on any pin relative to Vss
Voltage on Vcc supply relative to Vss
Power Dissipation
-0.5 to VCC+0.5
-0.3 to 4.6
1.0
V
-
-
-
-
V
PD
W
°C
°C
°C
Storage temperature
TSTG
-65 to 150
0 to 70
K6T4016V3C-B, K6T4016U3C-B
K6T4016V3C-F, K6T4016U3C-F
Operating Temperature
TA
-40 to 85
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
3
Revision 2.01
October 2001
K6T4016V3C, K6T4016U3C Family
CMOS SRAM
RECOMMENDED DC OPERATING CONDITIONS1)
Item
Symbol
Product
Min
Typ
Max
Unit
K6T4016V3C Family
K6T4016U3C Family
3.0
2.7
3.3
3.0
3.6
3.3
Supply voltage
Vcc
V
Ground
Vss
VIH
VIL
All Family
0
0
-
0
V
V
V
Vcc+0.32)
0.6
Input high voltage
Input low voltage
Note:
K6T4016V3C, K6T4016U3C Family
K6T4016V3C, K6T4016U3C Family
2.2
-0.33)
-
1. Commercial Product: TA=0 to 70°C, otherwise specified
Industrial Product: TA=-40 to 85°C, otherwise specified
2. Overshoot: VCC+2.0V in case of pulse width £ 30ns
3. Undershoot: -2.0V in case of pulse width £ 30ns
4. Overshoot and undershoot are sampled, not 100% tested.
CAPACITANCE1) (f=1MHz, TA=25°C)
Item
Input capacitance
Symbol
CIN
Test Condition
VIN=0V
Min
Max
Unit
-
-
8
pF
pF
Input/Output capacitance
CIO
VIO=0V
10
1. Capacitance is sampled, not 100% tested
DC AND OPERATING CHARACTERISTICS
Item
Symbol
ILI
Test Conditions
Min Typ Max Unit
Input leakage current
VIL=Vss to Vcc
-1
-1
-
-
-
-
1
1
4
mA
mA
Output leakage current
Operating power supply current
ILO
CS=VIH or OE=VIH or WE=VIL VIO=Vss to Vcc
IIO=0mA, CS=VIL, VIN=VIL or VIH, Read
ICC
mA
Cycle time=1ms, 100% duty, IIO=0mA CS£0.2V,
VIN£0.2V or VIN³ Vcc-0.2V
ICC1
ICC2
-
-
-
-
6
mA
mA
Average operating current
Cycle time=Min2), 100% duty, IIO=0mA, CS=VIL,
VIN=VIH or VIL
45
Output low voltage
VOL
VOH
ISB
IOL=2.1mA
-
2.4
-
-
-
-
-
0.4
-
V
V
Output high voltage
Standby Current(TTL)
Standby Current(CMOS)
IOH=-1.0mA
CS=VIH, Other inputs=VIL or VIH
CS³ Vcc-0.2V, Other inputs=0~Vcc
0.3
151)
mA
mA
ISB1
-
1. Industrial product = 20mA
2. Cycle time = 70ns
4
Revision 2.01
October 2001
K6T4016V3C, K6T4016U3C Family
CMOS SRAM
AC OPERATING CONDITIONS
TEST CONDITIONS( Test Load and Input/Output Reference)
Input pulse level: 0.4 to 2.2V
Input rising and falling time: 5ns
)
1
Input and output reference voltage: 1.5V
Output load(see right): CL=100pF+1TTL
CL=30pF+1TTL
CL
1.Including scope and jig capacitance
AC CHARACTERISTICS (K6T4016V3C Family: Vcc=3.0~3.6V, K6T4016U3C Family: Vcc=2.7~3.3V
Commercial product: TA=0 to 70°C, Industrial product: TA=-40 to 85°C)
Speed Bins
Parameter List
Symbol
Units
55ns
70ns
85ns
100ns
Min
Max
Min
Max
Min
Max
Min
Max
Read cycle time
tRC
tAA
55
-
-
55
55
25
25
-
70
-
-
70
70
35
35
-
85
-
-
85
85
40
40
-
100
-
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Address access time
100
Chip select to output
tCO
tOE
-
-
-
-
100
Output enable to valid output
LB, UB valid to data output
Chip select to low-Z output
Output enable to low-Z output
LB, UB enable to low-Z output
Output hold from address change
Chip disable to high-Z output
OE disable to high-Z output
LB, UB disable to high-Z output
Write cycle time
-
-
-
-
50
50
-
tBA
-
-
-
-
tLZ
10
5
10
5
10
5
10
5
Read
tOLZ
tBLZ
tOH
tHZ
-
-
-
-
5
-
5
-
5
-
5
-
10
0
-
10
0
-
10
0
-
15
0
-
20
20
20
-
25
25
25
-
25
25
25
-
30
30
30
-
tOHZ
tBHZ
tWC
tCW
tAS
0
0
0
0
0
0
0
0
55
45
0
70
60
0
85
70
0
100
80
0
Chip select to end of write
Address set-up time
-
-
-
-
-
-
-
-
Address valid to end of write
Write pulse width
tAW
tWP
tWR
tWHZ
tDW
tDH
45
40
0
-
60
55
0
-
70
60
0
-
80
70
0
-
-
-
-
-
Write
Write recovery time
-
-
-
-
Write to output high-Z
0
20
-
0
25
-
0
25
-
0
30
-
Data to write time overlap
Data hold from write time
End write to output low-Z
LB, UB valid to end of write
25
0
30
0
35
0
40
0
-
-
-
-
tOW
tBW
5
-
5
-
5
-
5
-
45
-
60
-
70
-
80
-
DATA RETENTION CHARACTERISTICS
Item
Symbol
Test Condition
CS³ Vcc-0.2V
Vcc=3.0V, CS³ Vcc-0.2V
Min
2.0
-
Typ
Max
Unit
V
Vcc for data retention
Data retention current
Data retention set-up time
VDR
-
0.5
-
3.6
151)
IDR
mA
tSDR
0
-
-
See data retention waveform
ms
Recovery time
tRDR
5
-
1. Industrial product = 20mA
5
Revision 2.01
October 2001
K6T4016V3C, K6T4016U3C Family
CMOS SRAM
TIMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH, UB or/and LB=VIL)
tRC
Address
tAA
tOH
Data Valid
Data Out
Previous Data Valid
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)
tRC
Address
tOH
tAA
tCO
CS
tHZ
tBA
UB, LB
OE
tBHZ
tOHZ
tOE
tOLZ
tBLZ
tLZ
Data out
High-Z
Data Valid
NOTES (READ CYCLE)
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage
levels.
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device
interconnection.
6
Revision 2.01
October 2001
K6T4016V3C, K6T4016U3C Family
CMOS SRAM
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)
tWC
Address
CS
tWR(4)
tCW(2)
tAW
tBW
UB, LB
tWP(1)
WE
tAS(3)
tDW
tDH
High-Z
High-Z
Data in
Data Valid
tWHZ
tOW
Data Undefined
Data out
TIMING WAVEFORM OF WRITE CYCLE(2) (CS Controlled)
tWC
Address
tAS(3)
tCW(2)
tWR(4)
CS
tAW
tBW
UB, LB
WE
tWP(1)
tDW
tDH
Data Valid
Data in
Data out
High-Z
High-Z
7
Revision 2.01
October 2001
K6T4016V3C, K6T4016U3C Family
CMOS SRAM
TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled)
tWC
Address
CS
tCW(2)
tWR(4)
tAW
tBW
UB, LB
WE
tAS(3)
tWP(1)
tDH
tDW
Data in
Data Valid
High-Z
Data out
High-Z
NOTES (WRITE CYCLE)
1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB
or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi-
tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write.
2. tCW is measured from the CS going low to the end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends with CS or WE going high.
DATA RETENTION WAVE FORM
CS controlled
Data Retention Mode
tSDR
tRDR
VCC
3.0/2.7V1)
2.2V
VDR
CS³ VCC - 0.2V
CS
GND
1. 3.0V for K6T4016V3C Family, 2.7V for K6T4016U3C Family
8
Revision 2.01
October 2001
K6T4016V3C, K6T4016U3C Family
CMOS SRAM
Unit: millimeter(inch)
PACKAGE DIMENSIONS
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400F)
0~8°
0.25
0.010
(
)
#44
#23
0.45 ~0.75
0.018 ~ 0.030
11.76±0.20
0.463±0.008
0.50
0.020
(
)
#1
#22
1.00±0.10
0.039±0.004
18.81
0.741
1.20
0.047
MAX.
MAX.
18.41±0.10
0.725±0.004
0.10
0.004
MAX
0.35± 0.10
0.014±0.004
0.80
0.0315
0.805
0.032
(
)
0~8°
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400R)
0.25
0.010
(
)
#1
#22
0.45 ~0.75
0.018 ~ 0.030
11.76±0.20
0.463±0.008
0.50
)
(
0.020
#44
#23
1.00±0.10
0.039±0.004
18.81
0.741
1.20
0.047
MAX.
MAX.
18.41± 0.10
0.725±0.004
0.10
0.004
MAX
0.35±0.10
0.014±0.004
0.80
0.0315
0.805
0.032
(
)
9
Revision 2.01
October 2001
K6T4016U3C 相关器件
型号 | 制造商 | 描述 | 价格 | 文档 |
K6T4016U3C-B | SAMSUNG | 256Kx16 bit Low Power and Low Voltage CMOS Static RAM | 获取价格 | |
K6T4016U3C-F | SAMSUNG | 256Kx16 bit Low Power and Low Voltage CMOS Static RAM | 获取价格 | |
K6T4016U3C-RB10 | SAMSUNG | 256Kx16 bit Low Power and Low Voltage CMOS Static RAM | 获取价格 | |
K6T4016U3C-RB70 | SAMSUNG | 256Kx16 bit Low Power and Low Voltage CMOS Static RAM | 获取价格 | |
K6T4016U3C-RB700 | SAMSUNG | Standard SRAM, 256KX16, 70ns, CMOS, PDSO44, 0.400 INCH, REVERSE, TSOP2-44 | 获取价格 | |
K6T4016U3C-RB70T | SAMSUNG | Standard SRAM, 256KX16, 70ns, CMOS, PDSO44 | 获取价格 | |
K6T4016U3C-RB85 | SAMSUNG | 256Kx16 bit Low Power and Low Voltage CMOS Static RAM | 获取价格 | |
K6T4016U3C-RB850 | SAMSUNG | Standard SRAM, 256KX16, 85ns, CMOS, PDSO44, 0.400 INCH, REVERSE, TSOP2-44 | 获取价格 | |
K6T4016U3C-RB85T | SAMSUNG | Standard SRAM, 256KX16, 85ns, CMOS, PDSO44 | 获取价格 | |
K6T4016U3C-RF10 | SAMSUNG | 256Kx16 bit Low Power and Low Voltage CMOS Static RAM | 获取价格 |
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