K6T4016C3C-RF550 [SAMSUNG]

Standard SRAM, 256KX16, 55ns, CMOS, PDSO44, 0.400 INCH, REVERSE, TSOP2-44;
K6T4016C3C-RF550
型号: K6T4016C3C-RF550
厂家: SAMSUNG    SAMSUNG
描述:

Standard SRAM, 256KX16, 55ns, CMOS, PDSO44, 0.400 INCH, REVERSE, TSOP2-44

静态存储器 光电二极管 内存集成电路
文件: 总9页 (文件大小:145K)
中文:  中文翻译
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CMOS SRAM  
K6T4016C3C Family  
Document Title  
256Kx16 bit Low Power CMOS Static RAM  
Revision History  
Revision No.  
History  
Draft Data  
Remark  
0.0  
Initial draft  
December 17, 1998  
April 17, 1999  
Preliminary  
Finalize  
1.0  
Finalize  
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and  
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.  
Revision 1.0  
April 1999  
1
CMOS SRAM  
K6T4016C3C Family  
256Kx16 bit Low Power CMOS Static RAM  
FEATURES  
GENERAL DESCRIPTION  
· Process Technology: TFT  
The K6T4016C3C families are fabricated by SAMSUNG¢s  
advanced CMOS process technology. The families support  
various operating temperature ranges and small package  
types for user flexibility of system design. The families also  
support low data retention voltage for battery back-up opera-  
tion with low data retention current.  
· Organization: 256Kx16  
· Power Supply Voltage : 4.5~5.5V  
· Low Data Retention Voltage: 2V(Min)  
· Three state output and TTL Compatible  
· Package Type: 44-TSOP2-400F/R  
PRODUCT FAMILY  
Power Dissipation  
Product Family  
Operating Temperature Vcc Range  
Speed(ns)  
PKG Type  
Standby  
(ISB1, Max)  
Operating  
(ICC2, Max)  
K6T4016C3C-B  
K6T4016C3C-F  
Commercial(0~70°C)  
Industrial(-40~85°C)  
20mA  
50mA  
4.5~5.5V  
551)/70  
90mA  
44-TSOP2-F/R  
1. The parameter is measured with 50pF test load.  
FUNCTIONAL BLOCK DIAGRAM  
PIN DESCRIPTION  
A4  
A3  
A2  
A1  
A0  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
A4  
A3  
A2  
A1  
A0  
CS  
A5  
A6  
A7  
OE  
UB  
LB  
I/O16  
I/O15  
I/O14  
I/O13  
Vss  
Vcc  
I/O12  
I/O11  
I/O10  
I/O9  
N.C  
A8  
A5  
A6  
A7  
OE  
UB  
Clk gen.  
Precharge circuit.  
A13  
A14  
A0  
Vcc  
Vss  
CS  
LB  
I/OI  
I/O2  
I/O3  
I/O4  
Vcc  
Vss  
I/O5  
I/O6  
I/O7  
I/O8  
WE  
A17  
A16  
A15  
A14  
A13  
I/OI  
I/O2  
I/O3  
I/O4  
Vcc  
Vss  
I/O5  
I/O6  
I/O7  
I/O8  
WE  
A17  
A16  
A15  
A14  
A13  
I/O16  
I/O15  
I/O14  
I/O13  
Vss  
A1  
9
Memory array  
1024 rows  
256´ 16 columns  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
A15  
A16  
A17  
A2  
Row  
select  
44-TSOP2  
Forward  
44-TSOP2  
Reverse  
Vcc  
I/O12  
I/O11  
I/O10  
I/O9  
N.C  
A8  
A9  
A10  
A11  
A3  
A4  
A9  
Data  
cont  
I/O Circuit  
Column select  
I/O1~I/O8  
A10  
A11  
A12  
A12  
Data  
cont  
I/O9~I/O16  
Data  
cont  
Name  
CS  
Function  
Chip Select Input  
Output Enable Input  
Write Enable Input  
Address Inputs  
Name  
Vcc  
Vss  
UB  
Function  
Power  
A8 A9 A10 A5 A6 A7 A4 A12  
OE  
Ground  
WE  
Upper Byte(I/O9~16)  
Lower Byte (I/O1~8)  
No Connection  
A0~A17  
LB  
WE  
OE  
UB  
LB  
Control  
logic  
I/O1~I/O16 Data Inputs/Outputs  
N.C  
CS  
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.  
Revision 1.0  
April 1999  
2
CMOS SRAM  
K6T4016C3C Family  
PRODUCT LIST  
Commercial Temperature Product(0~70°C)  
Industrial Temperature Products(-40~85°C)  
Part Name  
Function  
Part Name  
Function  
K6T4016C3C-TB55  
K6T4016C3C-TB70  
K6T4016C3C-RB55  
K6T4016C3C-RB55  
44-TSOP2-F, 55ns, LL-pwr  
44-TSOP2-F, 70ns, LL-pwr  
44-TSOP2-R, 55ns, LL-pwr  
44-TSOP2-R, 70ns, LL-pwr  
K6T4016C3C-TF55  
K6T4016C3C-TF70  
K6T4016C3C-RF55  
K6T4016C3C-RF70  
44-TSOP2-F, 55ns, LL-pwr  
44-TSOP2-F, 70ns, LL-pwr  
44-TSOP2-R, 55ns, LL-pwr  
44-TSOP2-R, 70ns, LL-pwr  
FUNCTIONAL DESCRIPTION  
CS  
H
L
OE  
X1)  
H
WE  
X1)  
H
LB  
X1)  
X1)  
H
UB  
X1)  
X1)  
H
I/O1~8  
High-Z  
High-Z  
High-Z  
Dout  
I/O9~16  
High-Z  
High-Z  
High-Z  
High-Z  
Dout  
Mode  
Power  
Deselected  
Standby  
Active  
Active  
Active  
Active  
Active  
Active  
Active  
Active  
Output Disabled  
Output Disabled  
Lower Byte Read  
Upper Byte Read  
Word Read  
X1)  
L
X1)  
H
L
L
L
H
L
L
H
H
L
High-Z  
Dout  
L
L
H
L
L
Dout  
X1)  
X1)  
X1)  
L
L
L
H
Din  
High-Z  
Din  
Lower Byte Write  
Upper Byte Write  
Word Write  
L
L
H
L
High-Z  
Din  
L
L
L
L
Din  
1. X means don¢t care. (Must be in low or high state)  
ABSOLUTE MAXIMUM RATINGS1)  
Item  
Symbol  
Ratings  
-0.5 to 7.0  
-0.5 to7.0  
1.0  
Unit  
V
Remark  
Voltage on any pin relative to Vss  
Voltage on Vcc supply relative to Vss  
Power Dissipation  
VIN,VOUT  
VCC  
-
V
-
PD  
W
-
Storage temperature  
TSTG  
-65 to 150  
0 to 70  
°C  
°C  
°C  
-
K6T4016C3C-B  
K6T4016C3C-F  
Operating Temperature  
TA  
-40 to 85  
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be  
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.  
Revision 1.0  
April 1999  
3
CMOS SRAM  
K6T4016C3C Family  
RECOMMENDED DC OPERATING CONDITIONS1)  
Item  
Symbol  
Vcc  
Min  
4.5  
0
Typ  
Max  
Unit  
V
Supply voltage  
Ground  
5.0  
5.5  
0
Vss  
0
-
V
Vcc+0.52)  
0.8  
Input high voltage  
Input low voltage  
VIH  
2.2  
-0.53)  
V
VIL  
-
V
Note:  
1. Commercial Product : TA=0 to 70°C, otherwise specified  
Industrial Product : TA=-40 to 85°C, otherwise specified  
2. Overshoot : VCC+3.0V in case of pulse width £ 30ns  
3. Undershoot : -3.0V in case of pulse width £ 30ns  
4. Overshoot and undershoot are sampled, not 100% tested.  
CAPACITANCE1) (f=1MHz, TA=25°C)  
Item  
Input capacitance  
Symbol  
CIN  
Test Condition  
VIN=0V  
Min  
Max  
8
Unit  
pF  
-
-
Input/Output capacitance  
CIO  
VIO=0V  
10  
pF  
1. Capacitance is sampled, not 100% tested  
DC AND OPERATING CHARACTERISTICS  
Symbol  
ILI  
Min  
-1  
-1  
-
Typ  
Max Unit  
Item  
Test Conditions  
Input leakage current  
Output leakage current  
Operating power supply  
VIN=Vss to Vcc  
-
-
-
1
1
mA  
mA  
ILO  
CS=VIH or OE=VIH or WE=VIL, VIO=Vss to Vcc  
IIO=0mA, CS=VIL, VIN=VIL or VIH, Read  
ICC  
10  
mA  
Cycle time=1ms, 100% duty, IIO=0mA, CS£0.2V, VIN£0.2V  
or VIN³ Vcc-0.2V  
ICC1  
-
-
15  
mA  
Average operating current  
Cycle time=Min, 100% duty, IIO=0mA, CS=VIL, VIN=VIH or VIL  
IOL=2.1mA  
ICC2  
VOL  
VOH  
ISB  
-
-
-
-
-
-
90  
0.4  
-
mA  
V
Output low voltage  
-
2.4  
-
Output high voltage  
Standby Current (TTL)  
Standby Current(CMOS)  
IOH=-1.0mA  
V
CS=VIH, Other inputs=VIL or VIH  
CS³ Vcc-0.2V, Other inputs=0~Vcc  
3
mA  
mA  
201)  
ISB1  
-
1. Industrial Product = 50mA  
Revision 1.0  
April 1999  
4
CMOS SRAM  
K6T4016C3C Family  
AC OPERATING CONDITIONS  
TEST CONDITIONS (Test Load and Test Input/Output Reference)  
Input pulse level : 0.8 to 2.4V  
Input rising and falling time : 5ns  
Input and output reference voltage : 1.5V  
Output load (See right) : CL=100pF+1TTL  
50pF+1TTL1)  
1)  
CL  
1. Including scope and jig capacitance  
1. for 55ns product  
AC CHARACTERISTICS(K6T4016C3C Family : Vcc=4.5~5.5V, Commercial product : TA=0 to 70°C, Industrial product : TA=-40 to 85°C)  
Speed Bins  
Parameter List  
Symbol  
Units  
55ns  
70ns  
Min  
55  
-
Max  
Min  
70  
-
Max  
Read cycle time  
tRC  
tAA  
-
55  
55  
25  
-
-
70  
70  
35  
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address access time  
Chip select to output  
tCO  
tOE  
-
-
Output enable to valid output  
Chip select to low-Z output  
Output enable to low-Z output  
LB, UB enable to low-Z output  
Chip disable to high-Z output  
OE disable to high-Z output  
Output hold from address change  
LB, UB valid to data output  
UB, LB disable to high-Z output  
Write cycle time  
-
-
tLZ  
10  
5
10  
5
tOLZ  
tBLZ  
tHZ  
-
-
Read  
5
-
5
-
0
20  
20  
-
0
25  
25  
-
tOHZ  
tOH  
tBA  
0
0
10  
-
10  
-
25  
20  
-
35  
25  
-
tBHZ  
tWC  
tCW  
tAS  
0
0
55  
45  
0
70  
60  
0
Chip select to end of write  
Address set-up time  
-
-
-
-
Address valid to end of write  
Write pulse width  
tAW  
tWP  
tWR  
tWHZ  
tDW  
tDH  
45  
45  
0
-
60  
55  
0
-
-
-
Write  
Write recovery time  
-
-
Write to output high-Z  
0
20  
-
0
25  
-
Data to write time overlap  
Data hold from write time  
End write to output low-Z  
LB, UB valid to end of write  
25  
0
30  
0
-
-
tOW  
tBW  
5
-
5
-
45  
-
60  
-
DATA RETENTION CHARACTERISTICS  
Item  
Vcc for data retention  
Data retention current  
Data retention set-up time  
Recovery time  
Symbol  
VDR  
Test Condition  
CS³ Vcc-0.2V  
Min  
Typ  
Max  
Unit  
V
2.0  
-
-
-
-
-
5.5  
151)  
-
IDR  
Vcc=3.0V  
mA  
tSDR  
0
See data retention waveform  
ms  
tRDR  
5
-
1. Industrial Product : 20mA  
Revision 1.0  
April 1999  
5
CMOS SRAM  
K6T4016C3C Family  
TIMMING DIAGRAMS  
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH, UB or/and LB=VIL)  
tRC  
Address  
tAA  
tOH  
Data Valid  
Data Out  
Previous Data Valid  
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)  
tRC  
Address  
tOH  
tAA  
tCO  
CS  
tHZ  
tBA  
UB, LB  
OE  
tBHZ  
tOHZ  
tOE  
tOLZ  
tBLZ  
tLZ  
Data out  
High-Z  
Data Valid  
NOTES (READ CYCLE)  
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage  
levels.  
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device  
interconnection.  
Revision 1.0  
April 1999  
6
CMOS SRAM  
K6T4016C3C Family  
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)  
tWC  
Address  
CS  
tCW(2)  
tWR(4)  
tAW  
tBW  
UB, LB  
tWP(1)  
WE  
tAS(3)  
tDW  
tDH  
High-Z  
High-Z  
Data in  
Data Valid  
tWHZ  
tOW  
Data Undefined  
Data out  
TIMING WAVEFORM OF WRITE CYCLE(2) (CS Controlled)  
tWC  
Address  
tAS(3)  
tCW(2)  
tWR(4)  
CS  
tAW  
tBW  
UB, LB  
tWP(1)  
WE  
tDW  
tDH  
Data Valid  
Data in  
Data out  
High-Z  
High-Z  
Revision 1.0  
April 1999  
7
CMOS SRAM  
K6T4016C3C Family  
TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled)  
tWC  
Address  
CS  
tCW(2)  
tWR(4)  
tAW  
tBW  
UB, LB  
WE  
tAS(3)  
tWP(1)  
tDH  
tDW  
Data Valid  
Data in  
High-Z  
Data out  
High-Z  
NOTES (WRITE CYCLE)  
1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB  
or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi-  
tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write.  
2. tCW is measured from the CS going low to end of write.  
3. tAS is measured from the address valid to the beginning of write.  
4. tWR is measured from the end or write to the address change. tWR applied in case a write ends as CS or WE going high.  
DATA RETENTION WAVE FORM  
CS controlled  
Data Retention Mode  
tSDR  
tRDR  
VCC  
4.5V  
2.2V  
VDR  
CS³ VCC - 0.2V  
CS  
GND  
Revision 1.0  
April 1999  
8
CMOS SRAM  
K6T4016C3C Family  
Units: millimeter(inch)  
PACKAGE DIMENSIONS  
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400F)  
0~8°  
0.25  
0.010  
(
)
#44  
#23  
0.45 ~0.75  
0.018 ~ 0.030  
11.76±0.20  
0.463±0.008  
0.50  
0.020  
(
)
#1  
#22  
1.00±0.10  
0.039±0.004  
18.81  
0.741  
1.20  
0.047  
MAX.  
MAX.  
18.41±0.10  
0.725±0.004  
0.10  
0.004  
MAX  
0.35±0.10  
0.014±0.004  
0.80  
0.0315  
0.805  
0.032  
(
)
0~8°  
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400R)  
0.25  
0.010  
(
)
#1  
#22  
0.45 ~0.75  
0.018 ~ 0.030  
11.76±0.20  
0.463±0.008  
0.50  
)
(
0.020  
#44  
#23  
1.00±0.10  
0.039±0.004  
18.81  
0.741  
1.20  
0.047  
MAX.  
MAX.  
18.41±0.10  
0.725±0.004  
0.10  
0.004  
MAX  
0.35±0.10  
0.014±0.004  
0.80  
0.0315  
0.805  
0.032  
(
)
Revision 1.0  
April 1999  
9

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