K6T4016C3C-RF550 [SAMSUNG]
Standard SRAM, 256KX16, 55ns, CMOS, PDSO44, 0.400 INCH, REVERSE, TSOP2-44;型号: | K6T4016C3C-RF550 |
厂家: | SAMSUNG |
描述: | Standard SRAM, 256KX16, 55ns, CMOS, PDSO44, 0.400 INCH, REVERSE, TSOP2-44 静态存储器 光电二极管 内存集成电路 |
文件: | 总9页 (文件大小:145K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
CMOS SRAM
K6T4016C3C Family
Document Title
256Kx16 bit Low Power CMOS Static RAM
Revision History
Revision No.
History
Draft Data
Remark
0.0
Initial draft
December 17, 1998
April 17, 1999
Preliminary
Finalize
1.0
Finalize
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.
Revision 1.0
April 1999
1
CMOS SRAM
K6T4016C3C Family
256Kx16 bit Low Power CMOS Static RAM
FEATURES
GENERAL DESCRIPTION
· Process Technology: TFT
The K6T4016C3C families are fabricated by SAMSUNG¢s
advanced CMOS process technology. The families support
various operating temperature ranges and small package
types for user flexibility of system design. The families also
support low data retention voltage for battery back-up opera-
tion with low data retention current.
· Organization: 256Kx16
· Power Supply Voltage : 4.5~5.5V
· Low Data Retention Voltage: 2V(Min)
· Three state output and TTL Compatible
· Package Type: 44-TSOP2-400F/R
PRODUCT FAMILY
Power Dissipation
Product Family
Operating Temperature Vcc Range
Speed(ns)
PKG Type
Standby
(ISB1, Max)
Operating
(ICC2, Max)
K6T4016C3C-B
K6T4016C3C-F
Commercial(0~70°C)
Industrial(-40~85°C)
20mA
50mA
4.5~5.5V
551)/70
90mA
44-TSOP2-F/R
1. The parameter is measured with 50pF test load.
FUNCTIONAL BLOCK DIAGRAM
PIN DESCRIPTION
A4
A3
A2
A1
A0
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
A4
A3
A2
A1
A0
CS
A5
A6
A7
OE
UB
LB
I/O16
I/O15
I/O14
I/O13
Vss
Vcc
I/O12
I/O11
I/O10
I/O9
N.C
A8
A5
A6
A7
OE
UB
Clk gen.
Precharge circuit.
A13
A14
A0
Vcc
Vss
CS
LB
I/OI
I/O2
I/O3
I/O4
Vcc
Vss
I/O5
I/O6
I/O7
I/O8
WE
A17
A16
A15
A14
A13
I/OI
I/O2
I/O3
I/O4
Vcc
Vss
I/O5
I/O6
I/O7
I/O8
WE
A17
A16
A15
A14
A13
I/O16
I/O15
I/O14
I/O13
Vss
A1
9
Memory array
1024 rows
256´ 16 columns
10
11
12
13
14
15
16
17
18
19
20
21
22
A15
A16
A17
A2
Row
select
44-TSOP2
Forward
44-TSOP2
Reverse
Vcc
I/O12
I/O11
I/O10
I/O9
N.C
A8
A9
A10
A11
A3
A4
A9
Data
cont
I/O Circuit
Column select
I/O1~I/O8
A10
A11
A12
A12
Data
cont
I/O9~I/O16
Data
cont
Name
CS
Function
Chip Select Input
Output Enable Input
Write Enable Input
Address Inputs
Name
Vcc
Vss
UB
Function
Power
A8 A9 A10 A5 A6 A7 A4 A12
OE
Ground
WE
Upper Byte(I/O9~16)
Lower Byte (I/O1~8)
No Connection
A0~A17
LB
WE
OE
UB
LB
Control
logic
I/O1~I/O16 Data Inputs/Outputs
N.C
CS
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
Revision 1.0
April 1999
2
CMOS SRAM
K6T4016C3C Family
PRODUCT LIST
Commercial Temperature Product(0~70°C)
Industrial Temperature Products(-40~85°C)
Part Name
Function
Part Name
Function
K6T4016C3C-TB55
K6T4016C3C-TB70
K6T4016C3C-RB55
K6T4016C3C-RB55
44-TSOP2-F, 55ns, LL-pwr
44-TSOP2-F, 70ns, LL-pwr
44-TSOP2-R, 55ns, LL-pwr
44-TSOP2-R, 70ns, LL-pwr
K6T4016C3C-TF55
K6T4016C3C-TF70
K6T4016C3C-RF55
K6T4016C3C-RF70
44-TSOP2-F, 55ns, LL-pwr
44-TSOP2-F, 70ns, LL-pwr
44-TSOP2-R, 55ns, LL-pwr
44-TSOP2-R, 70ns, LL-pwr
FUNCTIONAL DESCRIPTION
CS
H
L
OE
X1)
H
WE
X1)
H
LB
X1)
X1)
H
UB
X1)
X1)
H
I/O1~8
High-Z
High-Z
High-Z
Dout
I/O9~16
High-Z
High-Z
High-Z
High-Z
Dout
Mode
Power
Deselected
Standby
Active
Active
Active
Active
Active
Active
Active
Active
Output Disabled
Output Disabled
Lower Byte Read
Upper Byte Read
Word Read
X1)
L
X1)
H
L
L
L
H
L
L
H
H
L
High-Z
Dout
L
L
H
L
L
Dout
X1)
X1)
X1)
L
L
L
H
Din
High-Z
Din
Lower Byte Write
Upper Byte Write
Word Write
L
L
H
L
High-Z
Din
L
L
L
L
Din
1. X means don¢t care. (Must be in low or high state)
ABSOLUTE MAXIMUM RATINGS1)
Item
Symbol
Ratings
-0.5 to 7.0
-0.5 to7.0
1.0
Unit
V
Remark
Voltage on any pin relative to Vss
Voltage on Vcc supply relative to Vss
Power Dissipation
VIN,VOUT
VCC
-
V
-
PD
W
-
Storage temperature
TSTG
-65 to 150
0 to 70
°C
°C
°C
-
K6T4016C3C-B
K6T4016C3C-F
Operating Temperature
TA
-40 to 85
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Revision 1.0
April 1999
3
CMOS SRAM
K6T4016C3C Family
RECOMMENDED DC OPERATING CONDITIONS1)
Item
Symbol
Vcc
Min
4.5
0
Typ
Max
Unit
V
Supply voltage
Ground
5.0
5.5
0
Vss
0
-
V
Vcc+0.52)
0.8
Input high voltage
Input low voltage
VIH
2.2
-0.53)
V
VIL
-
V
Note:
1. Commercial Product : TA=0 to 70°C, otherwise specified
Industrial Product : TA=-40 to 85°C, otherwise specified
2. Overshoot : VCC+3.0V in case of pulse width £ 30ns
3. Undershoot : -3.0V in case of pulse width £ 30ns
4. Overshoot and undershoot are sampled, not 100% tested.
CAPACITANCE1) (f=1MHz, TA=25°C)
Item
Input capacitance
Symbol
CIN
Test Condition
VIN=0V
Min
Max
8
Unit
pF
-
-
Input/Output capacitance
CIO
VIO=0V
10
pF
1. Capacitance is sampled, not 100% tested
DC AND OPERATING CHARACTERISTICS
Symbol
ILI
Min
-1
-1
-
Typ
Max Unit
Item
Test Conditions
Input leakage current
Output leakage current
Operating power supply
VIN=Vss to Vcc
-
-
-
1
1
mA
mA
ILO
CS=VIH or OE=VIH or WE=VIL, VIO=Vss to Vcc
IIO=0mA, CS=VIL, VIN=VIL or VIH, Read
ICC
10
mA
Cycle time=1ms, 100% duty, IIO=0mA, CS£0.2V, VIN£0.2V
or VIN³ Vcc-0.2V
ICC1
-
-
15
mA
Average operating current
Cycle time=Min, 100% duty, IIO=0mA, CS=VIL, VIN=VIH or VIL
IOL=2.1mA
ICC2
VOL
VOH
ISB
-
-
-
-
-
-
90
0.4
-
mA
V
Output low voltage
-
2.4
-
Output high voltage
Standby Current (TTL)
Standby Current(CMOS)
IOH=-1.0mA
V
CS=VIH, Other inputs=VIL or VIH
CS³ Vcc-0.2V, Other inputs=0~Vcc
3
mA
mA
201)
ISB1
-
1. Industrial Product = 50mA
Revision 1.0
April 1999
4
CMOS SRAM
K6T4016C3C Family
AC OPERATING CONDITIONS
TEST CONDITIONS (Test Load and Test Input/Output Reference)
Input pulse level : 0.8 to 2.4V
Input rising and falling time : 5ns
Input and output reference voltage : 1.5V
Output load (See right) : CL=100pF+1TTL
50pF+1TTL1)
1)
CL
1. Including scope and jig capacitance
1. for 55ns product
AC CHARACTERISTICS(K6T4016C3C Family : Vcc=4.5~5.5V, Commercial product : TA=0 to 70°C, Industrial product : TA=-40 to 85°C)
Speed Bins
Parameter List
Symbol
Units
55ns
70ns
Min
55
-
Max
Min
70
-
Max
Read cycle time
tRC
tAA
-
55
55
25
-
-
70
70
35
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Address access time
Chip select to output
tCO
tOE
-
-
Output enable to valid output
Chip select to low-Z output
Output enable to low-Z output
LB, UB enable to low-Z output
Chip disable to high-Z output
OE disable to high-Z output
Output hold from address change
LB, UB valid to data output
UB, LB disable to high-Z output
Write cycle time
-
-
tLZ
10
5
10
5
tOLZ
tBLZ
tHZ
-
-
Read
5
-
5
-
0
20
20
-
0
25
25
-
tOHZ
tOH
tBA
0
0
10
-
10
-
25
20
-
35
25
-
tBHZ
tWC
tCW
tAS
0
0
55
45
0
70
60
0
Chip select to end of write
Address set-up time
-
-
-
-
Address valid to end of write
Write pulse width
tAW
tWP
tWR
tWHZ
tDW
tDH
45
45
0
-
60
55
0
-
-
-
Write
Write recovery time
-
-
Write to output high-Z
0
20
-
0
25
-
Data to write time overlap
Data hold from write time
End write to output low-Z
LB, UB valid to end of write
25
0
30
0
-
-
tOW
tBW
5
-
5
-
45
-
60
-
DATA RETENTION CHARACTERISTICS
Item
Vcc for data retention
Data retention current
Data retention set-up time
Recovery time
Symbol
VDR
Test Condition
CS³ Vcc-0.2V
Min
Typ
Max
Unit
V
2.0
-
-
-
-
-
5.5
151)
-
IDR
Vcc=3.0V
mA
tSDR
0
See data retention waveform
ms
tRDR
5
-
1. Industrial Product : 20mA
Revision 1.0
April 1999
5
CMOS SRAM
K6T4016C3C Family
TIMMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH, UB or/and LB=VIL)
tRC
Address
tAA
tOH
Data Valid
Data Out
Previous Data Valid
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)
tRC
Address
tOH
tAA
tCO
CS
tHZ
tBA
UB, LB
OE
tBHZ
tOHZ
tOE
tOLZ
tBLZ
tLZ
Data out
High-Z
Data Valid
NOTES (READ CYCLE)
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage
levels.
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device
interconnection.
Revision 1.0
April 1999
6
CMOS SRAM
K6T4016C3C Family
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)
tWC
Address
CS
tCW(2)
tWR(4)
tAW
tBW
UB, LB
tWP(1)
WE
tAS(3)
tDW
tDH
High-Z
High-Z
Data in
Data Valid
tWHZ
tOW
Data Undefined
Data out
TIMING WAVEFORM OF WRITE CYCLE(2) (CS Controlled)
tWC
Address
tAS(3)
tCW(2)
tWR(4)
CS
tAW
tBW
UB, LB
tWP(1)
WE
tDW
tDH
Data Valid
Data in
Data out
High-Z
High-Z
Revision 1.0
April 1999
7
CMOS SRAM
K6T4016C3C Family
TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled)
tWC
Address
CS
tCW(2)
tWR(4)
tAW
tBW
UB, LB
WE
tAS(3)
tWP(1)
tDH
tDW
Data Valid
Data in
High-Z
Data out
High-Z
NOTES (WRITE CYCLE)
1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB
or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi-
tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write.
2. tCW is measured from the CS going low to end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end or write to the address change. tWR applied in case a write ends as CS or WE going high.
DATA RETENTION WAVE FORM
CS controlled
Data Retention Mode
tSDR
tRDR
VCC
4.5V
2.2V
VDR
CS³ VCC - 0.2V
CS
GND
Revision 1.0
April 1999
8
CMOS SRAM
K6T4016C3C Family
Units: millimeter(inch)
PACKAGE DIMENSIONS
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400F)
0~8°
0.25
0.010
(
)
#44
#23
0.45 ~0.75
0.018 ~ 0.030
11.76±0.20
0.463±0.008
0.50
0.020
(
)
#1
#22
1.00±0.10
0.039±0.004
18.81
0.741
1.20
0.047
MAX.
MAX.
18.41±0.10
0.725±0.004
0.10
0.004
MAX
0.35±0.10
0.014±0.004
0.80
0.0315
0.805
0.032
(
)
0~8°
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400R)
0.25
0.010
(
)
#1
#22
0.45 ~0.75
0.018 ~ 0.030
11.76±0.20
0.463±0.008
0.50
)
(
0.020
#44
#23
1.00±0.10
0.039±0.004
18.81
0.741
1.20
0.047
MAX.
MAX.
18.41±0.10
0.725±0.004
0.10
0.004
MAX
0.35±0.10
0.014±0.004
0.80
0.0315
0.805
0.032
(
)
Revision 1.0
April 1999
9
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